CN107148457B - 钴抛光促进剂 - Google Patents

钴抛光促进剂 Download PDF

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Publication number
CN107148457B
CN107148457B CN201580057492.0A CN201580057492A CN107148457B CN 107148457 B CN107148457 B CN 107148457B CN 201580057492 A CN201580057492 A CN 201580057492A CN 107148457 B CN107148457 B CN 107148457B
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CN
China
Prior art keywords
polishing composition
cobalt
substituted
polishing
substrate
Prior art date
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Active
Application number
CN201580057492.0A
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English (en)
Chinese (zh)
Other versions
CN107148457A (zh
Inventor
S.克拉夫
A.沃尔夫
P.W.卡特
K.海斯
B.佩特罗
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CMC Materials LLC
Original Assignee
Cabot Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Cabot Microelectronics Corp filed Critical Cabot Microelectronics Corp
Publication of CN107148457A publication Critical patent/CN107148457A/zh
Application granted granted Critical
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Classifications

    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09G—POLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00—Polishing compositions
    • C09G1/02—Polishing compositions containing abrasives or grinding agents
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F3/00—Brightening metals by chemical means
    • C23F3/04—Heavy metals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321—After treatment
    • H01L21/32115—Planarisation
    • H01L21/3212—Planarisation by chemical mechanical polishing [CMP]

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Metallurgy (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
CN201580057492.0A 2014-10-21 2015-10-21 钴抛光促进剂 Active CN107148457B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201462066484P 2014-10-21 2014-10-21
US62/066,484 2014-10-21
US201562197992P 2015-07-28 2015-07-28
US62/197,992 2015-07-28
PCT/US2015/056749 WO2016065060A1 (en) 2014-10-21 2015-10-21 Cobalt polishing accelerators

Publications (2)

Publication Number Publication Date
CN107148457A CN107148457A (zh) 2017-09-08
CN107148457B true CN107148457B (zh) 2019-07-09

Family

ID=55761505

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201580057492.0A Active CN107148457B (zh) 2014-10-21 2015-10-21 钴抛光促进剂

Country Status (7)

Country Link
US (2) US9688885B2 (enExample)
EP (1) EP3210238B1 (enExample)
JP (1) JP6646051B2 (enExample)
KR (1) KR102538575B1 (enExample)
CN (1) CN107148457B (enExample)
TW (1) TWI580767B (enExample)
WO (1) WO2016065060A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9528030B1 (en) * 2015-10-21 2016-12-27 Cabot Microelectronics Corporation Cobalt inhibitor combination for improved dishing
TWI660017B (zh) * 2016-07-14 2019-05-21 卡博特微電子公司 用於鈷化學機械拋光(cmp)之替代氧化劑
US10233356B2 (en) 2017-03-06 2019-03-19 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing slurry for cobalt-containing substrate
US10077382B1 (en) 2017-03-06 2018-09-18 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method for polishing cobalt-containing substrate
JP6901297B2 (ja) * 2017-03-22 2021-07-14 株式会社フジミインコーポレーテッド 研磨用組成物
EP3631045A4 (en) 2017-05-25 2021-01-27 Fujifilm Electronic Materials U.S.A., Inc. CHEMICAL-MECHANICAL POLISHING SLUDGE FOR COBALT APPLICATIONS
US10377921B2 (en) 2017-09-21 2019-08-13 Rohm and Haas Electronics Materials CMP Holdings, Inc. Chemical mechanical polishing method for cobalt
US10170335B1 (en) 2017-09-21 2019-01-01 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing method for cobalt
US20200172759A1 (en) * 2018-12-04 2020-06-04 Cabot Microelectronics Corporation Composition and method for cobalt cmp
JP7244642B2 (ja) * 2019-06-20 2023-03-22 富士フイルム株式会社 研磨液、及び、化学的機械的研磨方法
KR20220083728A (ko) 2019-10-15 2022-06-20 후지필름 일렉트로닉 머티리얼스 유.에스.에이., 아이엔씨. 연마 조성물 및 이의 사용 방법
WO2021141741A1 (en) * 2020-01-07 2021-07-15 Cmc Materials, Inc. Derivatized polyamino acids
US20220243094A1 (en) * 2021-02-04 2022-08-04 Cmc Materials, Inc. Silicon carbonitride polishing composition and method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101649164A (zh) * 2008-08-04 2010-02-17 罗门哈斯电子材料Cmp控股股份有限公司 化学机械抛光组合物及其相关方法
CN102304327A (zh) * 2011-07-05 2012-01-04 复旦大学 一种基于金属Co的抛光工艺的抛光液

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4711735A (en) 1986-09-12 1987-12-08 Gulley Harold J Coolant additive with corrosion inhibitive and scale preventative properties
US5230833A (en) 1989-06-09 1993-07-27 Nalco Chemical Company Low sodium, low metals silica polishing slurries
US5196353A (en) 1992-01-03 1993-03-23 Micron Technology, Inc. Method for controlling a semiconductor (CMP) process by measuring a surface temperature and developing a thermal image of the wafer
US5316573A (en) 1992-03-12 1994-05-31 International Business Machines Corporation Corrosion inhibition with CU-BTA
US6614529B1 (en) 1992-12-28 2003-09-02 Applied Materials, Inc. In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization
US5658183A (en) 1993-08-25 1997-08-19 Micron Technology, Inc. System for real-time control of semiconductor wafer polishing including optical monitoring
US5433651A (en) 1993-12-22 1995-07-18 International Business Machines Corporation In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing
JP3270282B2 (ja) 1994-02-21 2002-04-02 株式会社東芝 半導体製造装置及び半導体装置の製造方法
JP3313505B2 (ja) 1994-04-14 2002-08-12 株式会社日立製作所 研磨加工法
JP3329572B2 (ja) 1994-04-15 2002-09-30 福田金属箔粉工業株式会社 印刷回路用銅箔およびその表面処理方法
US5964643A (en) 1995-03-28 1999-10-12 Applied Materials, Inc. Apparatus and method for in-situ monitoring of chemical mechanical polishing operations
US5893796A (en) 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
US5838447A (en) 1995-07-20 1998-11-17 Ebara Corporation Polishing apparatus including thickness or flatness detector
US5872633A (en) 1996-07-26 1999-02-16 Speedfam Corporation Methods and apparatus for detecting removal of thin film layers during planarization
US6585933B1 (en) 1999-05-03 2003-07-01 Betzdearborn, Inc. Method and composition for inhibiting corrosion in aqueous systems
GB9924358D0 (en) 1999-10-14 1999-12-15 Brad Chem Technology Ltd Corrosion inhibiting compositions
JP2002047483A (ja) * 2000-08-04 2002-02-12 Fujimi Inc 研磨用組成物およびそれを用いた研磨方法
KR100479804B1 (ko) * 2002-05-30 2005-03-30 동우 화인켐 주식회사 금속 ｃｍｐ용 연마 슬러리 조성물
JP2004172606A (ja) 2002-11-08 2004-06-17 Sumitomo Chem Co Ltd 金属研磨材組成物及び研磨方法
US7931714B2 (en) 2007-10-08 2011-04-26 Uwiz Technology Co., Ltd. Composition useful to chemical mechanical planarization of metal
US8435421B2 (en) 2007-11-27 2013-05-07 Cabot Microelectronics Corporation Metal-passivating CMP compositions and methods
US8337716B2 (en) * 2008-01-23 2012-12-25 Uwiz Technology Co., Ltd. Sarcosine compound used as corrosion inhibitor
KR101481573B1 (ko) * 2008-02-12 2015-01-14 삼성전자주식회사 화학적 기계적 연마용 슬러리 조성물 및 이를 이용한화학적 기계적 연마 방법
CN101525563B (zh) 2008-03-03 2011-04-13 盟智科技股份有限公司 用于后研磨清洁剂的腐蚀抑制剂
CN101580700B (zh) 2008-05-16 2015-08-19 盟智科技股份有限公司 化学机械研磨的组成物
US8722592B2 (en) 2008-07-25 2014-05-13 Wincom, Inc. Use of triazoles in reducing cobalt leaching from cobalt-containing metal working tools
US8071479B2 (en) 2008-12-11 2011-12-06 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing composition and methods relating thereto
TWI454561B (zh) 2008-12-30 2014-10-01 Uwiz Technology Co Ltd A polishing composition for planarizing the metal layer
JP2011003665A (ja) * 2009-06-17 2011-01-06 Jsr Corp 化学機械研磨用水系分散体およびそれを用いた化学機械研磨方法
JP5858597B2 (ja) * 2010-01-29 2016-02-10 アドバンスド テクノロジー マテリアルズ，インコーポレイテッド タングステン配線半導体用洗浄剤
WO2011094568A2 (en) 2010-01-29 2011-08-04 Advanced Technology Materials, Inc. Cleaning agent for semiconductor provided with metal wiring
US20130261040A1 (en) 2010-11-29 2013-10-03 Wako Pure Chemical Industries, Ltd. Substrate cleaner for copper wiring, and method for cleaning copper wiring semiconductor substrate
KR102039319B1 (ko) 2011-03-22 2019-11-01 바스프 에스이 중합체성 폴리아민을 포함하는 화학적 기계적 폴리싱 (cmp) 조성물
EP2502969A1 (en) 2011-03-22 2012-09-26 Basf Se A chemical mechanical polishing (cmp) composition comprising two types of corrosion inhibitors
US8865013B2 (en) 2011-08-15 2014-10-21 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method for chemical mechanical polishing tungsten
US20130186850A1 (en) * 2012-01-24 2013-07-25 Applied Materials, Inc. Slurry for cobalt applications
TWI456013B (zh) 2012-04-10 2014-10-11 Uwiz Technology Co Ltd 研磨液組成物
US8717710B2 (en) 2012-05-08 2014-05-06 HGST Netherlands, B.V. Corrosion-resistant bit patterned media (BPM) and discrete track media (DTM) and methods of production thereof
JP2014072336A (ja) * 2012-09-28 2014-04-21 Fujimi Inc 研磨用組成物
CN109243976B (zh) * 2013-01-11 2023-05-23 应用材料公司 化学机械抛光设备及方法
WO2014132641A1 (ja) * 2013-02-28 2014-09-04 株式会社フジミインコーポレーテッド コバルト除去のための研磨スラリー
JP6156630B2 (ja) * 2013-05-24 2017-07-05 Jsr株式会社 化学機械研磨用水系分散体および化学機械研磨方法
US10358579B2 (en) 2013-12-03 2019-07-23 Cabot Microelectronics Corporation CMP compositions and methods for polishing nickel phosphorous surfaces
US9735030B2 (en) * 2014-09-05 2017-08-15 Fujifilm Planar Solutions, LLC Polishing compositions and methods for polishing cobalt films

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101649164A (zh) * 2008-08-04 2010-02-17 罗门哈斯电子材料Cmp控股股份有限公司 化学机械抛光组合物及其相关方法
CN102304327A (zh) * 2011-07-05 2012-01-04 复旦大学 一种基于金属Co的抛光工艺的抛光液

Also Published As

Publication number Publication date
KR20170076719A (ko) 2017-07-04
EP3210238B1 (en) 2019-06-26
US9688885B2 (en) 2017-06-27
EP3210238A4 (en) 2018-04-18
US20160115353A1 (en) 2016-04-28
TW201634652A (zh) 2016-10-01
JP2017538285A (ja) 2017-12-21
EP3210238A1 (en) 2017-08-30
CN107148457A (zh) 2017-09-08
KR102538575B1 (ko) 2023-06-01
JP6646051B2 (ja) 2020-02-14
US9850403B2 (en) 2017-12-26
TWI580767B (zh) 2017-05-01
WO2016065060A1 (en) 2016-04-28
US20170260421A1 (en) 2017-09-14

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Address after: Illinois, USA

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Patentee before: Cabot Microelectronics Corp.

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Address after: Illinois, America

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Patentee before: CMC Materials Co.,Ltd.