CN107068027B - Liquid crystal display panel, liquid crystal display panel detection system and method - Google Patents
Liquid crystal display panel, liquid crystal display panel detection system and method Download PDFInfo
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- CN107068027B CN107068027B CN201710389236.2A CN201710389236A CN107068027B CN 107068027 B CN107068027 B CN 107068027B CN 201710389236 A CN201710389236 A CN 201710389236A CN 107068027 B CN107068027 B CN 107068027B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
Abstract
The invention provides a liquid crystal display panel, a liquid crystal display panel detection system and a liquid crystal display panel detection method, wherein the liquid crystal display panel detection system comprises a display area and a non-display area, wherein the non-display area comprises a first test terminal and a second test terminal; the first test terminal is connected with a scanning line in the liquid crystal display panel and used for outputting a received test signal to the scanning line; the second test terminal is connected with the first test terminal and used for receiving the output signal, wherein the output signal is the signal of the test signal after passing through the first test terminal. By carrying out waveform detection on the output signals, the test signals generated by the signal generator can be adjusted in real time, so that the test signals entering the pixel matrix basically keep consistent after RC transmission delay, thereby effectively avoiding the defect of horizontal cross striations caused by inconsistent RC transmission delay of a plurality of groups of test signals when the product is subjected to box-forming lighting test, and greatly improving the yield of the box-forming test.
Description
Technical Field
The invention relates to the field of liquid crystal displays, in particular to a liquid crystal display panel, a liquid crystal display panel detection system and a liquid crystal display panel detection method.
Background
After a Liquid Crystal Display (LCD) is completed in a cell process, some line defects and area defects are detected by lighting the cell. Usually, a plurality of sets of cell test terminals (pads) and test lines are designed to provide scan line and data line signals during lighting, as shown in fig. 1, a schematic diagram of cell lighting detection is shown, wherein CK1, CK2, CK3 and CK4 represent high frequency clock driving signals (CK). Fig. 2 is a schematic diagram of a conventional boxed detection principle, in which a waveform editor (e.g., a waveform editor in a computer) controls an output signal waveform of a PG (short for Pattern Generator, also commonly referred to as a signal Generator), the PG provides a signal to a boxed test terminal (cell test pad), and a scan line signal and a data line signal are input to a panel from the boxed test terminal, so as to light the slice. In the above test method, although the waveform output from the PG to the probe meets the original editing requirement, the parasitic effect of the metal line due to the resistance (R) and the capacitance (C) causes a serious transmission delay (RC-delay), so that the waveform is significantly deformed after the probe contacts the test terminal, and even if the same signal is applied to different test terminals, the signal input into the panel may have a large difference.
As described above, for a Gate Driver On Array (GOA) product that needs multiple sets of high frequency clock driving signals to output scanning signals, different CK signals are likely to appear, and even if the input waveforms are the same, the output scanning signals are different, so that horizontal stripes as shown in fig. 3 appear On the screen during the lighting of the cell. The abnormal picture reduces the yield of the lighting of the cell on one hand; on the other hand, the screen abnormality caused by the horizontal stripes affects the detection of other defects.
Disclosure of Invention
The invention provides a liquid crystal display panel, a liquid crystal display panel detection system and a liquid crystal display panel detection method, which are used for solving the problem that the defect detection is influenced due to horizontal cross striations of a picture caused by different RC delay of CK signals due to different contact impedances of lighting test terminals of a cell.
The invention provides a liquid crystal display panel in a first aspect, which comprises a display area and a non-display area, wherein the non-display area comprises a first test terminal and a second test terminal;
the first test terminal is connected with a scanning line in the liquid crystal display panel and used for outputting a received test signal to the scanning line;
the second test terminal is connected with the first test terminal and used for receiving the output signal, wherein the output signal is the signal of the test signal after passing through the first test terminal.
Furthermore, the test signal comprises a plurality of test sub-signals, the first test terminal comprises a plurality of first test sub-terminals, the number of the first test sub-terminals is multiple of the number of the test sub-signals, and each test sub-signal is output to the scan line through one or more first test sub-terminals;
and each first test sub-terminal is sequentially connected with each numbered scanning line, wherein each scanning line is numbered from large to small according to the time length of the test signal reaching each scanning line.
Further, the second test terminals include a plurality of second test sub-terminals, the number of the second test sub-terminals is the same as that of the first test sub-terminals, and the second test sub-terminals are connected to the first test sub-terminals in a one-to-one correspondence manner so as to receive signals output from the corresponding first test sub-terminals.
Further, the first test sub-terminals are equally divided into a first group and a second group, each first test sub-terminal in the first group is used for connecting with the odd-numbered scan lines, and each first test sub-terminal in the second group is used for connecting with the even-numbered scan lines.
Further, the test sub-signal is a high frequency clock driving signal.
The second aspect of the present invention provides a liquid crystal display panel detection system, which comprises a signal generator, a waveform detector and the liquid crystal display panel;
the signal generator is connected with the first test terminal and used for generating a test signal and sending the test signal to the first test terminal;
the waveform detector is connected to the second test terminal for detecting an output signal output from the second test terminal.
Further, the waveform detector is an oscilloscope.
The third aspect of the present invention provides a liquid crystal display panel detection method applied to the liquid crystal display panel detection system, including:
the signal generator generates a test signal and sends the test signal to the first test terminal;
the first test terminal sends the received test signal to the scanning line and the second test terminal connected with the first test terminal;
the second test terminal receives an output signal, wherein the output signal is a signal which is sent by the signal generator and passes through the first test terminal;
the waveform detector acquires an output signal output from the second test terminal and detects a waveform of the output signal.
Furthermore, the test signal comprises a plurality of test sub-signals, the first test terminal comprises a plurality of first test sub-terminals, the number of the first test sub-terminals is multiple of the number of the test sub-signals, and each test sub-signal is output to the scan line through one or more first test sub-terminals;
each first test sub-terminal is sequentially connected with each numbered scanning line, wherein each scanning line is numbered from large to small according to the time length of the test signal reaching each scanning line;
the second test terminals comprise a plurality of second test sub-terminals, the number of the second test sub-terminals is the same as that of the first test sub-terminals, and the second test sub-terminals are connected with the first test sub-terminals in a one-to-one correspondence mode so as to receive signals output from the corresponding first test sub-terminals.
Further, the waveform detector acquires an output signal output from the second test terminal, and after detecting a waveform of the output signal, the waveform detector further includes:
and if the waveform displayed on the waveform detector is abnormal, adjusting the test signal generated by the signal generator in real time until the waveform displayed on the waveform detector is normal. The invention provides a liquid crystal display panel, a liquid crystal display panel detection system and a liquid crystal display panel detection method, which can adjust generated test signals in real time by carrying out waveform detection on output signals, so that the test signals entering a pixel matrix are basically consistent after RC-delay, thereby effectively avoiding the defect of horizontal cross striations caused by inconsistency of a plurality of groups of test signals RC-delay when a product is subjected to box-forming lighting test, and greatly improving the yield of the box-forming test.
Drawings
The invention will be described in more detail hereinafter on the basis of embodiments and with reference to the accompanying drawings. Wherein:
FIG. 1 is a schematic view of a prior art boxed test terminal;
FIG. 2 is a schematic diagram of the prior art cassette detection principle;
FIG. 3 is a schematic diagram of horizontal stripes occurring during the box-firing process in the prior art;
FIG. 4 is a schematic diagram of a structure of an LCD panel according to an embodiment of the present invention;
fig. 5 is another schematic structural diagram of a liquid crystal display panel according to an embodiment of the invention;
fig. 6 is a schematic diagram illustrating distribution of first test terminals and second test terminals on a panel according to an embodiment of the present invention;
FIG. 7 is a schematic diagram of a test signal waveform according to an embodiment of the present invention;
FIG. 8 is a schematic structural diagram of a system for inspecting a liquid crystal display panel according to an embodiment of the present invention;
fig. 9 is a schematic flow chart of a method for inspecting a liquid crystal display panel according to an embodiment of the invention.
In the drawings, like parts are provided with like reference numerals. The figures are not drawn to scale.
Detailed Description
The invention will be further explained with reference to the drawings.
As shown in fig. 4, an embodiment of the present invention provides a liquid crystal display panel, including a display area 11 and a non-display area 12, where the non-display area 12 includes a first test terminal 121 and a second test terminal 122; the first test terminal 121 is connected to a scan line in the liquid crystal display panel 1, and is configured to output a received test signal to the scan line; the second test terminal 122 is connected to the first test terminal 121, and is configured to receive an output signal, where the output signal is a signal after the test signal passes through the first test terminal 121.
Specifically, after the liquid crystal display panel 1 is completed in the cell forming process, some line defects and surface defects are detected by lighting the cell forming process. The first test terminal 121 is provided at a pixel array drive signal input of the liquid crystal display panel 1, that is, a drive signal (or a test signal) input into the pixel array is input through the first test terminal 121. Since it is necessary to contact the first test terminal 121 through the probe to input the test signal into the first test terminal 121, but the probe contacts the first test terminal 121 to deform the waveform of the test signal, in the inspection apparatus and method of the related art, there is a difference between the signal output from the first test terminal 121 and the test signal. In order to identify such a difference, the present invention provides a second test terminal 122 for acquiring an output signal output from the first test terminal 121. By connecting the second test terminal 122 with the first test terminal 121 to receive the output signal output from the first test terminal 121, the degree of abnormality of the test signal is known by comparing the waveform of the test signal with the waveform of the output signal. And then, the test signals are adjusted in real time according to the output signals, so that the test signals entering the pixel matrix are basically kept consistent after RC-delay, and therefore, horizontal cross striations caused by inconsistent multiple groups of test signals RC-delay during the box-forming lighting test of products are effectively avoided, and the yield of the box-forming test is greatly improved. As shown in fig. 5, in an embodiment of the invention, the test signal includes a plurality of test sub-signals, the first test terminal 121 includes a plurality of first test sub-terminals, the number of the first test sub-terminals is a multiple of the test sub-signals, and each test sub-signal is output to the scan line through one or more first test sub-terminals and is transmitted to the pixel unit through the scan line.
And sequentially connecting the first test sub-terminals with the scanning lines according to the numbers of the scanning lines from small to large, wherein the scanning lines are numbered from large to small according to the time length of the test signal reaching the scanning lines.
In particular, the test signal may include one or more test sub-signals, which are high frequency clock driving signals. Accordingly, the first test terminal 121 may include one or more first test sub-terminals (e.g., the first test sub-terminals 121a-121b shown in fig. 5), and it is only necessary to ensure that the number of the first test sub-terminals is a multiple of the number of the test sub-signals. When the number of the test sub-signals is the same as that of the first test sub-terminals, the first test sub-terminals correspond to the test sub-signals one to one, so that the test sub-signals are output. When the number of the first test sub-terminals is a multiple of the number of the test sub-signals, the first test sub-terminals are equally divided into a plurality of groups, and in each group, the first test sub-terminals and the test sub-signals are in a one-to-one corresponding relationship to output the test sub-signals.
The pixel units in the same row are connected with the same scanning line, and the pixel units in the same column are connected with the same data line. The first test terminal 121 is disposed in a row (which is an approximate position) above the first row of pixel units, and since it takes time for the output signal to be transmitted, the output signal output from the first test terminal 121 will reach the first row of pixel units first (i.e., the row of scan lines connected to the first row of pixels first) and finally reach the last row of pixel units. Based on the above principle, the scan lines are numbered from large to small according to the time length of the test signal reaching each scan line. And according to the number of each scanning line from small to large, each first test sub-terminal is sequentially connected with each scanning line. If there are scan lines G1-G4, a first test sub-terminal T1 and a first test sub-terminal T2, the first test sub-terminal T1 and the first test sub-terminal T2 are sequentially connected to the scan lines G1-G4, i.e., the first test sub-terminal T1 is connected to the scan line G1 and the scan line G3, and the second test sub-terminal T2 is connected to the scan line G2 and the scan line G4.
Further, the second test terminal 122 includes a plurality of second test sub-terminals (e.g., the second test sub-terminals 122a-122d shown in fig. 5), the number of the second test sub-terminals is the same as that of the first test sub-terminals, and the second test sub-terminals are connected to the first test sub-terminals in a one-to-one correspondence to receive the signals output from the corresponding first test sub-terminals.
The second test sub-terminals are connected with the first test sub-terminals in a one-to-one correspondence manner, so that output waveforms corresponding to the first test sub-terminals are obtained, the test sub-signals are adjusted in real time, and horizontal cross striations caused by inconsistency of multiple groups of test signals RC-delay during the box-forming lighting test of products are effectively avoided, so that the yield of the box-forming test is greatly improved. In another embodiment of the present invention, the first test sub-terminals are equally divided into a first group and a second group, each first test sub-terminal in the first group is used for connecting with an odd-numbered scan line in the scan lines, and each first test sub-terminal in the second group is used for connecting with an even-numbered scan line in the scan lines. As shown in fig. 6, if the first test sub-terminals 121a to 121h and the scan lines G1 to G16 (not shown in the figure) divide the first test sub-terminals 121a to 121h into 2 groups on average, the first group includes the first test sub-terminals 121a to 121d, and the second group includes the first test sub-terminals 121e to 121h, the first test sub-terminals 121a to 121d in the first group are sequentially connected to the scan lines G1, G3, G5, …, and G15, and the first test sub-terminals 121e to 121h in the second group are sequentially connected to the scan lines G2, G4, G6, …, and G16.
Further, the second test sub-terminals are equally divided into a third group for receiving the output signals outputted from the first group and a fourth group for receiving the output signals outputted from the second group. As shown in fig. 6, taking the example that the third packet includes the second test sub-terminals 122a-122d, the first test sub-terminal 121a and the second test sub-terminal 122a are connected by a line L1, and similarly, the first test sub-terminal 121b and the second test sub-terminal 122b are connected by a line L2 (not shown in the figure); the first test sub-terminal 121c and the second test sub-terminal 122c are connected by a line L3 (not shown in the figure); the first test sub-terminal 121d and the second test sub-terminal 122d are connected by a line L4 (not shown). Then, output signals are synchronously detected through an oscilloscope, and input signals of a waveform generator are adjusted in real time according to the output signals, so that all test signals entering a pixel matrix are basically consistent after RC delay. The device can effectively avoid horizontal stripes caused by inconsistency of multiple groups of test signal signals RC delay when a Gate Driver on Array (GOA for short) product is subjected to box-forming lighting test, so that the yield of the box-forming test is greatly improved.
Fig. 7 is a waveform diagram of a test signal, and there are 4 test sub-signals in fig. 7.
As shown in fig. 8, an embodiment of the invention further provides a liquid crystal display panel detection system, which includes a signal generator 2, a waveform detector 3, and the liquid crystal display panel 1 in the above embodiment; the signal generator 2 is connected to the first test terminal 121, and configured to generate a test signal and send the test signal to the first test terminal 121; the waveform detector 3 is connected to the second test terminal 122, and detects an output signal output from the second test terminal 122.
In the present embodiment, the signal generator 2 generates a test signal, the waveform detector 3 detects an output signal output from the second test terminal 122, and the waveform of the test signal is compared with the waveform of the output signal to determine the degree of abnormality of the test signal. The signal generator 2 can generate corresponding output signals according to waveforms set in an external waveform editor in a computer, and a specific signal generation method and a specific signal generation device belong to the field of the prior art, and are not described in detail herein. Furthermore, the system can adjust the test signals generated by the signal generator 2 in real time according to the output signals, so that the test signals entering the pixel matrix are basically consistent after RC-delay, thereby effectively avoiding horizontal cross striations caused by inconsistent RC-delay of a plurality of groups of test signals when the product is subjected to box-forming lighting test, and greatly improving the yield of the box-forming test.
The waveform detector 3 is preferably an oscilloscope. As shown in fig. 9, an embodiment of the present invention further provides a method for detecting a liquid crystal display panel 1, which is applied to the detection system for a liquid crystal display panel 1 in the foregoing embodiment, and specifically includes:
In step 102, the first test terminal sends the received test signal to the scan line and the second test terminal connected thereto.
Since the waveform detector needs to be in contact with the first test terminal through the probe to input the generated test signal into the first test terminal, the probe is in contact with the first test terminal to deform the waveform of the test signal, that is, the signal output from the first test terminal is different from the test signal. In order to recognize such a difference, a second test terminal is provided to acquire an output signal output from the first test terminal.
In step 104, the waveform detector acquires the output signal output from the second test terminal and detects the waveform of the output signal.
The second test terminal transmits the output signal to a waveform detector, which preferably is an oscilloscope, and the waveform detector performs waveform reproduction on the received output signal. The abnormal degree of the test signal is obtained by comparing the waveform of the test signal with the waveform of the output signal.
According to the panel box forming detection method, the waveform detection is carried out on the output signals, the test signals generated by the signal generator can be adjusted in real time, and the test signals entering the pixel matrix are basically kept consistent after RC delay, so that horizontal cross striations caused by inconsistency of a plurality of groups of test signals RC delay are effectively avoided when a product is subjected to box forming lighting test, and the yield of the box forming test is greatly improved.
Further, after step 104, the method further includes: and if the waveform displayed on the waveform detector is abnormal, adjusting the test signal generated by the signal generator in real time until the waveform displayed on the waveform detector is normal.
Furthermore, the test signal comprises a plurality of test sub-signals, the first test terminal comprises a plurality of first test sub-terminals, the number of the first test sub-terminals is multiple of the test sub-signals, and each test sub-signal is output to the scan line through one or more first test sub-terminals; and according to the number of each scanning line from small to large, each first test sub-terminal is sequentially connected with each scanning line, wherein each scanning line is numbered from large to small according to the time length of the test signal reaching each scanning line. The part is consistent with the corresponding part of the panel box forming detection device, and specific reference can be made to the corresponding description, and the description is omitted here.
Further, the second test terminals include a plurality of second test sub-terminals, the number of the second test sub-terminals is the same as that of the first test sub-terminals, and the second test sub-terminals are connected to the first test sub-terminals in a one-to-one correspondence manner so as to receive signals output from the corresponding first test sub-terminals. The part is consistent with the corresponding part of the panel box forming detection device, and specific reference can be made to the corresponding description, and the description is omitted here.
Furthermore, the first test sub-terminals are equally divided into a first group and a second group, each first test sub-terminal in the first group is used for being connected with the odd-numbered scanning lines in the scanning lines, and each first test sub-terminal in the second group is used for being connected with the even-numbered scanning lines in the scanning lines. The part is consistent with the corresponding part of the panel box forming detection device, and specific reference can be made to the corresponding description, and the description is omitted here.
While the invention has been described with reference to a preferred embodiment, various modifications may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In particular, the technical features mentioned in the embodiments can be combined in any way as long as there is no structural conflict. It is intended that the invention not be limited to the particular embodiments disclosed, but that the invention will include all embodiments falling within the scope of the appended claims.
Claims (10)
1. The liquid crystal display panel is characterized by comprising a display area and a non-display area, wherein the non-display area comprises a first test terminal and a second test terminal;
the first test terminal is connected with a scanning line in the liquid crystal display panel and used for outputting a test signal which is received from a signal generator and is generated by the signal generator to the scanning line;
the second test terminal is connected with the first test terminal and used for receiving an output signal, wherein the output signal is a signal obtained after the test signal passes through the first test terminal;
the second test terminal is further configured to output the output signal to a waveform detector, so that the waveform detector detects a waveform of the output signal.
2. The lcd panel of claim 1, wherein the test signal comprises a plurality of test sub-signals, the first test terminal comprises a plurality of first test sub-terminals, the number of the first test sub-terminals is a multiple of the number of the test sub-signals, and each of the test sub-signals is output to the scan lines through one or more of the first test sub-terminals;
and each first test sub-terminal is sequentially connected with each numbered scanning line, wherein each scanning line is numbered from large to small according to the time length of the test signal reaching each scanning line.
3. The liquid crystal display panel according to claim 2, wherein the second test terminals include a plurality of second test sub-terminals, the number of the second test sub-terminals is the same as that of the first test sub-terminals, and the second test sub-terminals are connected in one-to-one correspondence with the first test sub-terminals to receive signals output from the corresponding first test sub-terminals.
4. The liquid crystal display panel according to claim 3, wherein the first test sub-terminals are equally divided into a first group and a second group, each of the first test sub-terminals in the first group is for connecting with odd-numbered scan lines, and each of the first test sub-terminals in the second group is for connecting with even-numbered scan lines.
5. The LCD panel of any of claims 2-4, wherein the test sub-signal is a high frequency clock driving signal.
6. A liquid crystal display panel inspection system comprising a signal generator, a waveform detector and a liquid crystal display panel according to any one of claims 1 to 5;
the signal generator is connected with a first test terminal and used for generating a test signal and sending the test signal to the first test terminal, and the first test terminal is used for sending the received test signal to a scan line and a second test terminal which are connected with the first test terminal;
the waveform detector is connected to the second test terminal, and is configured to detect a waveform of an output signal output from the second test terminal, where the output signal is a signal of the test signal sent from the signal generator after passing through the first test terminal.
7. The liquid crystal display panel inspection system of claim 6, wherein the waveform detector is an oscilloscope.
8. A liquid crystal display panel inspection method applied to the liquid crystal display panel inspection system of claim 6 or 7, characterized by comprising:
the signal generator generates a test signal and sends the test signal to a first test terminal;
the first test terminal sends the received test signal to a scanning line and a second test terminal connected with the first test terminal;
the second test terminal receives an output signal, wherein the output signal is a signal which is sent by the signal generator and passes through the first test terminal;
the waveform detector acquires the output signal output from the second test terminal and detects a waveform of the output signal.
9. The method according to claim 8, wherein the test signal comprises a plurality of test sub-signals, the first test terminal comprises a plurality of first test sub-terminals, the number of the first test sub-terminals is a multiple of the number of the test sub-signals, and each of the test sub-signals is output to the scan line through one or more of the first test sub-terminals;
each first test sub-terminal is sequentially connected with each numbered scanning line, wherein each scanning line is numbered from large to small according to the time length of the test signal reaching each scanning line;
the second test terminals comprise a plurality of second test sub-terminals, the number of the second test sub-terminals is the same as that of the first test sub-terminals, and the second test sub-terminals are connected with the first test sub-terminals in a one-to-one correspondence manner so as to receive signals output from the corresponding first test sub-terminals.
10. The liquid crystal display panel detection method according to claim 8 or 9, wherein after the waveform detector acquires the output signal output from the second test terminal and detects the waveform of the output signal, the method further comprises:
and if the waveform displayed on the waveform detector is abnormal, adjusting the test signal generated by the signal generator in real time until the waveform displayed on the waveform detector is normal.
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| CN110853565B (en) * | 2019-11-29 | 2022-10-04 | 昆山国显光电有限公司 | Preparation method of display substrate, display panel and display device |
| CN111158177B (en) * | 2020-02-28 | 2022-11-22 | 京东方科技集团股份有限公司 | Detection structure, display panel, detection device and detection system |
| CN112599062B (en) * | 2021-01-06 | 2023-09-26 | 深圳市华星光电半导体显示技术有限公司 | Display panel |
| CN113990270B (en) * | 2021-11-08 | 2023-03-17 | 深圳市华星光电半导体显示技术有限公司 | Display device |
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| CN100451742C (en) * | 2007-07-06 | 2009-01-14 | 友达光电股份有限公司 | Liquid crystal panel detecting method and device |
| CN102681227A (en) * | 2012-05-30 | 2012-09-19 | 深圳市华星光电技术有限公司 | Detection method for liquid crystal display panel |
| CN106384578B (en) * | 2016-08-31 | 2019-06-25 | 深圳市华星光电技术有限公司 | A kind of protection circuit, method and display preventing GOA panel operation irregularity |
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