JPH0318891A - Image display device and its inspecting method - Google Patents
Image display device and its inspecting methodInfo
- Publication number
- JPH0318891A JPH0318891A JP1153422A JP15342289A JPH0318891A JP H0318891 A JPH0318891 A JP H0318891A JP 1153422 A JP1153422 A JP 1153422A JP 15342289 A JP15342289 A JP 15342289A JP H0318891 A JPH0318891 A JP H0318891A
- Authority
- JP
- Japan
- Prior art keywords
- switch group
- signal line
- vertical signal
- scanning circuit
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 16
- 238000007689 inspection Methods 0.000 claims abstract description 15
- 238000012360 testing method Methods 0.000 claims description 27
- 239000011159 matrix material Substances 0.000 claims description 4
- 239000010409 thin film Substances 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、絶縁基板上に薄膜トランジスタを用いて形成
した液晶画像表示装置及びその検査方法に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a liquid crystal image display device formed using thin film transistors on an insulating substrate and a method for inspecting the same.
従来の技術
本発明の画像表示装置は、バックライトを備えた液晶に
よる画像表示装置である。2. Description of the Related Art The image display device of the present invention is a liquid crystal image display device equipped with a backlight.
以下に従来の画像表示装置について説明する。A conventional image display device will be explained below.
第４図に従来の構成図を示す。垂直走査回路１１及び水
平走査回路１２による駆動回路があり、水平走査回路１
２の各出力部には、水平走査回路】２の出力により制御
される転送用トランジスタスイッチ群１３が形成されて
いる。画素部１４は二次元マトリクス状に配列されたア
クティブマトリクス方式である。さらに水平走査回路の
出力により制御される転送用トランジスタスイッチ群１
３からの出力は画素部へ点順次に書き込まれるようにな
っている。FIG. 4 shows a conventional configuration diagram. There is a drive circuit including a vertical scanning circuit 11 and a horizontal scanning circuit 12.
A transfer transistor switch group 13 controlled by the output of the horizontal scanning circuit 2 is formed in each output section of the horizontal scanning circuit 2. The pixel section 14 is of an active matrix type arranged in a two-dimensional matrix. Further, transfer transistor switch group 1 is controlled by the output of the horizontal scanning circuit.
The output from 3 is written to the pixel section point-by-point.
発明が解決しようとする課題
しかしながら、このような従来の構成では水平走査回路
からの垂直信号線の断線を調べる場合各信号線の終端に
バットを形成して１本１本調べるか、回路作製後に液晶
工程を通し、画像を表示させなければならず、断線を検
査するには多（の工程が必要という欠点があった。Problems to be Solved by the Invention However, with such a conventional configuration, when checking for disconnections in the vertical signal lines from the horizontal scanning circuit, it is necessary to form a butt at the end of each signal line and check each line one by one, or to check each line after the circuit is fabricated. The disadvantage was that images had to be displayed through a liquid crystal process, and multiple processes were required to inspect for wire breaks.
本発明は上記欠点に鑑み、各垂直信号線を１本１本検査
しな（でも、また液晶工程以前に、垂直信号線の断線及
び水平走査回路の動作を確認することができる画像表示
装置及び検査方法を提供するものである。In view of the above-mentioned drawbacks, the present invention provides an image display device and an image display device that can check for disconnections in vertical signal lines and the operation of horizontal scanning circuits without inspecting each vertical signal line one by one (but also before the liquid crystal manufacturing process). It provides an inspection method.
課題を解決するための手段
上記課題を解決するために、本発明の画像表示装置は画
素部を通る垂直信号線の終端に、別の検査用スイッチ群
を設け、垂直信号線の信号が検査用スイッチ群の制御端
子に接続されることにより構成されている。また、本発
明の画像表示装置の検査方法は、検査用スイッチ群と抵
抗によりＯＲ回路を形成し、検査用パルスの出力により
垂直信号線の断線を検査することにより構成されている
。Means for Solving the Problems In order to solve the above problems, the image display device of the present invention is provided with another test switch group at the end of the vertical signal line passing through the pixel section, so that the signals of the vertical signal line are not used for test purposes. It is configured by being connected to the control terminal of the switch group. Further, the method for inspecting an image display device of the present invention is configured by forming an OR circuit with a group of inspection switches and a resistor, and inspecting a vertical signal line for disconnection by outputting a inspection pulse.
作用
各信号線の終端には各々検査用スイッチが設けられてお
り、各検査用スイッチは抵抗とによりＯＲ回路を構成し
ている。水平走査回路の出力により制御される転送用ト
ランジスタスイッチ群の入力端子には水平走査回路の各
出力の選択期間よりも短かいパルスを入力する。もしも
垂直信号線に断線がなければ、垂直信号線の終端に設け
た検査用スイッチ群の出力波形は、転送用ｉ・ランジス
タスイッチ群に入力したパルスと同じ波形となる。A test switch is provided at the end of each signal line, and each test switch and a resistor form an OR circuit. A pulse shorter than the selection period of each output of the horizontal scanning circuit is input to the input terminal of the transfer transistor switch group controlled by the output of the horizontal scanning circuit. If there is no break in the vertical signal line, the output waveform of the test switch group provided at the end of the vertical signal line will be the same waveform as the pulse input to the transfer i-transistor switch group.
本発明は上記の原理に基づくものであり、垂直信号線の
有無及び位置を簡単に調べることのできる画像表示装置
及びその検査方法を提供するものである。The present invention is based on the above-mentioned principle, and provides an image display device and an inspection method thereof that can easily check the presence or absence and position of vertical signal lines.
実施例
以下、本発明の一実施例について図面を参照しながら説
明する。EXAMPLE Hereinafter, an example of the present invention will be described with reference to the drawings.
第１図は本発明の実施例における画像表示装置の構成図
を示す。１は垂直走査回路、２は水平走査回路、３は転
送用トランジスタスイッチ群、４は画素部、５は検査用
スイッチである。画素はアクティブマトリクス方式で、
スイッチング用薄膜トランジスタを有している。また、
水平走査回路２の出力部には、水平走査回路２の出力に
より制御される転送用トランジスタスイッチ群３が備え
られており、画素部４へＡＬ配線により点順次書き込み
で信号伝達を行う。FIG. 1 shows a configuration diagram of an image display device in an embodiment of the present invention. 1 is a vertical scanning circuit, 2 is a horizontal scanning circuit, 3 is a transfer transistor switch group, 4 is a pixel section, and 5 is a test switch. The pixels are active matrix type.
It has a thin film transistor for switching. Also,
The output section of the horizontal scanning circuit 2 is equipped with a transfer transistor switch group 3 that is controlled by the output of the horizontal scanning circuit 2, and transmits signals to the pixel section 4 by dot-sequential writing via AL wiring.
次に本発明の画像表示装置の画素部４を通るＡＬ配線の
垂直信号線の断線を調べる方法について説明する。第２
図にその構成図と各点における電圧波形を示す。Ａ、Ｂ
、Ｃはそれぞれの垂直信号線及びその出力波形、Ｄは転
送用トランジスタスイッチ群３に入力する検査用パルス
を示している。各垂直信号線は検査用スイッチ群５のゲ
ートに入力されており、ソース・ドレインは共通となっ
ている。また、検査用スイッチ群３と抵抗によりＯＲ回
路を形成している。Next, a method of checking for a break in the vertical signal line of the AL wiring passing through the pixel section 4 of the image display device of the present invention will be described. Second
The figure shows its configuration and voltage waveforms at each point. A, B
, C indicate the respective vertical signal lines and their output waveforms, and D indicates a test pulse input to the transfer transistor switch group 3. Each vertical signal line is input to the gate of the inspection switch group 5, and the source and drain are common. Further, an OR circuit is formed by the test switch group 3 and the resistor.
抵抗Ｒの大きさは検査用スイッチ５のトランジスタのオ
ン抵抗より大きく、オフ抵抗よりも小さく設定される。The resistance R is set to be larger than the on-resistance of the transistor of the test switch 5 and smaller than the off-resistance.
ここで垂直信号線Ａ、Ｂ、Ｃ共に断線がないとすると、
Ｅ点における出力波形は転送用トランジスタスイッチ群
３に入力されるパルスＤと同じ波形が出力される。しか
し、例えば垂直信号線Ｂに断線があると、水平走査回路
２の垂直信号線Ｂの出力により転送用トランジスタスイ
ッチ群３がパルスを通しても、断線により信号が検査用
スイッチ５のゲートまで伝わらないため、Ｅ′に示すよ
うに出力波形は転送用トランジスタスイッチ群３に入力
されるパルスＤとは異なり、断線部分での出力はなくな
る。Assuming that there is no disconnection in vertical signal lines A, B, and C,
The output waveform at point E is the same as that of the pulse D input to the transfer transistor switch group 3. However, for example, if there is a break in the vertical signal line B, even if the transfer transistor switch group 3 passes a pulse due to the output of the vertical signal line B of the horizontal scanning circuit 2, the signal will not be transmitted to the gate of the test switch 5 due to the break. , E', the output waveform is different from the pulse D input to the transfer transistor switch group 3, and there is no output at the disconnected portion.
次に本発明の第二の実施例について図面を参照しながら
説明する。Next, a second embodiment of the present invention will be described with reference to the drawings.
第３図は第二の実施例における画像表示装置の構成図を
示す。第一の実施例と興なる点は、水平走査回路の出力
が、隣りの出力と時間的に重なっている事と、これによ
って垂直信号線の終端に設けた検査用スイッチ群が、二
列に分かれており、検査用スイッチが交互の列に設けら
れている。FIG. 3 shows a configuration diagram of an image display device in a second embodiment. The difference from the first embodiment is that the output of the horizontal scanning circuit temporally overlaps with the adjacent output, and as a result, the test switches provided at the end of the vertical signal line are arranged in two rows. The test switches are arranged in alternating rows.
次に本実施例における画像表示装置の画素部を通るＡＬ
配線の垂直信号線の断線を調べる方法について説明する
。第３図にその構成図と各点における電圧波形を示す。Next, the AL passing through the pixel portion of the image display device in this embodiment
A method for checking for breaks in vertical signal lines in wiring will be explained. FIG. 3 shows its configuration and voltage waveforms at each point.
Ｆ、Ｇ、Ｈはそれぞれの垂直信号線及びその出力波形で
ある。各線の出力波形は隣りの出力と、時間的に重なっ
ている。■は転送用トランジスタスイッチ群に入力する
検査用パルスを示している。検査用パルスは、ある垂直
信号線の出力の立ち上がりから次のパルスの立ち上がり
の間にのみ出力があるパルスとなっている。各垂直信号
線は検査用スイッチのゲートに入力されており、各検査
用スイッチは、垂直信号線の奇数段出力と、偶数段出力
とに分かれており、各検査用スイッチ群はソース、ドレ
インは共通となっている。また各検査用スイッチ群と抵
抗によりＯＲ回路を形成している。ここで垂直信号線Ｆ
、Ｇ、Ｈに断線がないとすると、１点における出力波形
は共に転送用トランジスタスイッチ群に入力されるパル
スＩと同じ波形が出力される。しかし、例えば垂直信号
線Ｇに断線があると、水平走査回路の垂直信号線Ｇの出
力により転送用トランジスタスイッチ群がパルスを通し
ても、断線により信号が検査用スイッチのゲートに伝わ
らないため、Ｊ゛に示すように、Ｇのパルスの選択期間
中にある検査用パルスのみが出力されない波形となり、
垂直信号線の断線及びその位置が判定できる。F, G, and H are respective vertical signal lines and their output waveforms. The output waveform of each line temporally overlaps with the adjacent output. (2) indicates a test pulse input to the transfer transistor switch group. The test pulse is a pulse that is output only between the rising edge of the output of one vertical signal line and the rising edge of the next pulse. Each vertical signal line is input to the gate of a test switch, and each test switch is divided into odd-numbered stage outputs and even-numbered stage outputs of the vertical signal line, and each test switch group has a source and a drain. It is common. Further, an OR circuit is formed by each test switch group and a resistor. Here, vertical signal line F
, G, and H have no disconnection, the output waveform at one point is the same as the pulse I input to the transfer transistor switch group. However, if there is a disconnection in the vertical signal line G, for example, even if the transfer transistor switch group passes a pulse due to the output of the vertical signal line G of the horizontal scanning circuit, the signal will not be transmitted to the gate of the test switch due to the disconnection. As shown in , the waveform is such that only the test pulses during the G pulse selection period are not output.
Disconnections in vertical signal lines and their locations can be determined.
以上のように、画像表示装置の垂直信号線の終端に、検
査用スイッチ群を設け、転送用トランジスタスイッチ群
３に適当なパルスを入力することにより、従来各信号線
を１本１本調べるか又は液晶工程を経て画像を表示させ
るまで不明があった垂直信号線の断線及びその位置を液
晶工程以前に簡単に知ることができる。また、検査用ス
イッチ群５は実施例では薄膜トランジスタにより形成し
たが、この検査用スイッチ群は水平、垂直走査回路を形
成する場合と同時に作製することができるので、新たに
プロセスを増やす必要がない。As described above, by providing an inspection switch group at the end of the vertical signal line of the image display device and inputting an appropriate pulse to the transfer transistor switch group 3, it is possible to inspect each signal line one by one. Alternatively, it is possible to easily know the disconnection of the vertical signal line and its position, which was unknown until the image is displayed after going through the liquid crystal process, before the liquid crystal process. Furthermore, although the test switch group 5 is formed using thin film transistors in the embodiment, this test switch group can be manufactured at the same time as forming the horizontal and vertical scanning circuits, so there is no need to add a new process.
なお、本実施例では、検査用スイッチ群５としてトラン
ジスタを用いたが、他の構成にしてもよい。また抵抗は
外付けにしても、内蔵してもよく、トランジスタによる
抵抗を用いてもよい。さらに、転送用トランジスタスイ
ッチ群はｎチャネルトランジスタでもＰチャネルトラン
ジスタでもよい。In this embodiment, transistors are used as the inspection switch group 5, but other configurations may be used. Further, the resistor may be externally attached or built-in, or a resistor using a transistor may be used. Further, the transfer transistor switch group may be an n-channel transistor or a p-channel transistor.
発明の効果
以上のように本発明は各垂直信号線の終端に新たに検査
用スイッチ群を設け、抵抗とによりＯＲ回路を形成した
ところにある。このような構成によれば、転送用トラン
ジスタスイッチの入力部に適当なパルスを印加するだけ
で、従来は各信号線１本１本を検査するか液晶工程を経
て画像を表示するまで不明であった垂直信号線の断線を
、液晶工程以前に簡単に知ることができる。さらに、断
線の位置までも知ることができるようになり、断線のあ
る不良のものを液晶工程以前に判定でき、その実用的効
果は大なるものがある。Effects of the Invention As described above, the present invention consists in newly providing a group of testing switches at the end of each vertical signal line and forming an OR circuit with a resistor. With such a configuration, by simply applying an appropriate pulse to the input part of the transfer transistor switch, it is possible to detect problems that were previously unknown until each signal line was inspected one by one or the image was displayed through the liquid crystal process. Disconnections in vertical signal lines can be easily detected before the liquid crystal process. Furthermore, it is now possible to know the location of the wire breakage, and defective wire breaks can be identified before the liquid crystal process, which has great practical effects.
第１図は本発明の実施例における画像表示装置の構成図
、第２図は本発明の第一の実施例における断線の検査例
の構成図、第３図は本発明の第の実施例における断線の
検査例の構成図、第４図は従来の画像表示装置の構成図
である。
１・・・・・・垂直走査回路、２・・・・・・水平走査
回路、３・・・・・・転送用トランジスタスイッチ群、
４・旧・・画素部、５・・・・・・検査用スイッチ群。FIG. 1 is a block diagram of an image display device in an embodiment of the present invention, FIG. 2 is a block diagram of an example of disconnection inspection in the first embodiment of the present invention, and FIG. 3 is a block diagram of an example of disconnection inspection in the first embodiment of the present invention. FIG. 4 is a block diagram of an example of a wire breakage inspection, and FIG. 4 is a block diagram of a conventional image display device. 1...Vertical scanning circuit, 2...Horizontal scanning circuit, 3...Transfer transistor switch group,
4. Old: Pixel section, 5: Inspection switch group.
Claims (2)
回路部、垂直走査回路部、及び二次元マトリクス状に配
列された画素と、各列の画素に映像信号を供給する垂直
信号線からなる画素部が形成されてなり、前記水平走査
回路の出力部は前記水平走査回路の出力パルスにより制
御される映像信号を前記画素部の各列の垂直信号線に転
送する転送用トランジスタスイッチ群を有し、かつ前記
画素部の各列垂直信号線の終端が別の検査用スイッチ群
の制御端子に接続されていることを特徴とする画像表示
装置。(1) A pixel section consisting of a horizontal scanning circuit section made of thin film transistors, a vertical scanning circuit section, and a vertical scanning circuit section consisting of pixels arranged in a two-dimensional matrix and vertical signal lines that supply video signals to pixels in each column on an insulating substrate. The output section of the horizontal scanning circuit has a transfer transistor switch group for transferring a video signal controlled by the output pulse of the horizontal scanning circuit to the vertical signal line of each column of the pixel section, and An image display device characterized in that a terminal end of each column vertical signal line of the pixel section is connected to a control terminal of another inspection switch group.
力し、検査用スイッチ群と抵抗によりＯＲ回路を形成し
、検査用スイッチ群からの出力波形により垂直信号線の
断線を検査することを特徴とする画像表示装置の検査方
法。(2) Input a test pulse to the control terminal of the test switch group, form an OR circuit with the test switch group and a resistor, and check for disconnection in the vertical signal line using the output waveform from the test switch group. A method for inspecting a featured image display device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15342289A JP2618042B2 (en) | 1989-06-15 | 1989-06-15 | Inspection method for image display device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15342289A JP2618042B2 (en) | 1989-06-15 | 1989-06-15 | Inspection method for image display device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0318891A true JPH0318891A (en) | 1991-01-28 |
| JP2618042B2 JP2618042B2 (en) | 1997-06-11 |
Family
ID=15562161
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15342289A Expired - Fee Related JP2618042B2 (en) | 1989-06-15 | 1989-06-15 | Inspection method for image display device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2618042B2 (en) |
Cited By (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH055897A (en) * | 1991-06-28 | 1993-01-14 | Sharp Corp | Method for checking active matrix substrate |
| US5453991A (en) * | 1992-03-18 | 1995-09-26 | Kabushiki Kaisha Toshiba | Integrated circuit device with internal inspection circuitry |
| JP2003029296A (en) * | 2001-07-13 | 2003-01-29 | Toshiba Corp | Array substrate and inspection method therefor, and liquid crystal display device |
| JP2004199054A (en) * | 2002-12-06 | 2004-07-15 | Semiconductor Energy Lab Co Ltd | Image display device and inspection method therefor |
| US6784862B2 (en) | 2000-03-14 | 2004-08-31 | International Business Machines Corporation | Active matrix display device and inspection method for the same |
| WO2005008318A1 (en) * | 2003-07-22 | 2005-01-27 | Sony Corporation | Inspection method, semiconductor device, and display device |
| US7167151B2 (en) | 2002-02-13 | 2007-01-23 | Sharp Kabushiki Kaisha | Active matrix substrate |
| WO2007037043A1 (en) * | 2005-09-28 | 2007-04-05 | Sharp Kabushiki Kaisha | Display panel, and display device |
| JP2017156446A (en) * | 2016-02-29 | 2017-09-07 | パナソニック液晶ディスプレイ株式会社 | Display device and inspection method for display device |
| WO2018150875A1 (en) * | 2017-02-17 | 2018-08-23 | パナソニック液晶ディスプレイ株式会社 | Display device |
| US10231607B2 (en) | 2012-06-27 | 2019-03-19 | Camplex, Inc. | Surgical visualization systems |
| JP2019101261A (en) * | 2017-12-04 | 2019-06-24 | 株式会社ジャパンディスプレイ | Display |
| US10555728B2 (en) | 2012-06-27 | 2020-02-11 | Camplex, Inc. | Surgical visualization system |
| US10568499B2 (en) | 2013-09-20 | 2020-02-25 | Camplex, Inc. | Surgical visualization systems and displays |
| US10702353B2 (en) | 2014-12-05 | 2020-07-07 | Camplex, Inc. | Surgical visualizations systems and displays |
| WO2020189007A1 (en) * | 2019-03-18 | 2020-09-24 | 株式会社ジャパンディスプレイ | Display device |
| WO2020195076A1 (en) * | 2019-03-22 | 2020-10-01 | 株式会社ジャパンディスプレイ | Display device and inspection method |
| US10918455B2 (en) | 2017-05-08 | 2021-02-16 | Camplex, Inc. | Variable light source |
| US10932766B2 (en) | 2013-05-21 | 2021-03-02 | Camplex, Inc. | Surgical visualization systems |
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| US7265572B2 (en) | 2002-12-06 | 2007-09-04 | Semicondcutor Energy Laboratory Co., Ltd. | Image display device and method of testing the same |
| US7053649B1 (en) | 2002-12-06 | 2006-05-30 | Semiconductor Energy Laboratory Co., Ltd. | Image display device and method of testing the same |
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| JPS63116190A (en) * | 1986-11-05 | 1988-05-20 | セイコーエプソン株式会社 | Active matrix panel |
| JPS6352121A (en) * | 1987-08-14 | 1988-03-05 | Seiko Instr & Electronics Ltd | Electrooptic device |
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| JPH055897A (en) * | 1991-06-28 | 1993-01-14 | Sharp Corp | Method for checking active matrix substrate |
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