CN107039881B - 光半导体装置 - Google Patents

光半导体装置 Download PDF

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Publication number
CN107039881B
CN107039881B CN201710056430.9A CN201710056430A CN107039881B CN 107039881 B CN107039881 B CN 107039881B CN 201710056430 A CN201710056430 A CN 201710056430A CN 107039881 B CN107039881 B CN 107039881B
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layer
semiconductor device
optical semiconductor
surface side
emergent light
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CN107039881A (zh
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铃木洋介
奥贯雄一郎
境野刚
中村直干
铃木凉子
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Mitsubishi Corp
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    • HELECTRICITY
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    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/023Mount members, e.g. sub-mount members
    • H01S5/02315Support members, e.g. bases or carriers
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    • H01S5/00Semiconductor lasers
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    • H01S5/023Mount members, e.g. sub-mount members
    • H01S5/02325Mechanically integrated components on mount members or optical micro-benches
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    • H01S5/00Semiconductor lasers
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    • H01S5/00Semiconductor lasers
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    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/16Window-type lasers, i.e. with a region of non-absorbing material between the active region and the reflecting surface
    • H01S5/164Window-type lasers, i.e. with a region of non-absorbing material between the active region and the reflecting surface with window regions comprising semiconductor material with a wider bandgap than the active layer
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    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/3211Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
    • H01S5/3213Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities asymmetric clading layers
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    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/323Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/32308Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
    • H01S5/32316Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm comprising only (Al)GaAs
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    • H01S2301/18Semiconductor lasers with special structural design for influencing the near- or far-field
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    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/02208Mountings; Housings characterised by the shape of the housings
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    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/0683Stabilisation of laser output parameters by monitoring the optical output parameters
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    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2222Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special electric properties
    • H01S5/2224Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special electric properties semi-insulating semiconductors
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    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/227Buried mesa structure ; Striped active layer
    • H01S5/2275Buried mesa structure ; Striped active layer mesa created by etching
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    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/323Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/3235Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000 nm, e.g. InP-based 1300 nm and 1500 nm lasers

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)
  • Optical Integrated Circuits (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
  • Optical Couplings Of Light Guides (AREA)
CN201710056430.9A 2016-01-25 2017-01-25 光半导体装置 Active CN107039881B (zh)

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JP2016011648A JP6790364B2 (ja) 2016-01-25 2016-01-25 光半導体装置
JP2016-011648 2016-01-25

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EP3716417B1 (en) * 2017-11-24 2024-06-05 Kyocera Corporation Substrate for mounting light-emitting element, array substrate, and light-emitting device
EP3859912B1 (en) * 2018-09-28 2023-08-09 Kyocera Corporation Light-emitting element mounting substrate, array substrate, and light-emitting device
US20220166185A1 (en) * 2019-08-06 2022-05-26 Mitsubishi Electric Corporation Semiconductor laser device
CN114667652B (zh) * 2019-11-28 2025-03-25 三菱电机株式会社 半导体激光装置
CN114946026A (zh) 2019-12-12 2022-08-26 布罗利思感测科技公司 固态设备
JP2021174928A (ja) * 2020-04-28 2021-11-01 住友電気工業株式会社 光学装置

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CN1202694A (zh) * 1997-05-22 1998-12-23 株式会社三协精机制作所 半导体激光装置和光拾取装置
CN1338736A (zh) * 2000-07-21 2002-03-06 株式会社三协精机制作所 光头装置的光源装置
CN100438062C (zh) * 2003-02-10 2008-11-26 波科海姆技术公共有限公司 用于半导体激光器的光功率监测
CN103531437A (zh) * 2012-07-06 2014-01-22 日立化成株式会社 半导体装置的制造方法和半导体装置
CN103875139A (zh) * 2011-11-16 2014-06-18 三菱电机株式会社 半导体激光器激励固体激光器

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US5016253A (en) * 1989-04-12 1991-05-14 Mitsubishi Denki Kabushiki Kaisha Semiconductor laser device
CN1202694A (zh) * 1997-05-22 1998-12-23 株式会社三协精机制作所 半导体激光装置和光拾取装置
CN1338736A (zh) * 2000-07-21 2002-03-06 株式会社三协精机制作所 光头装置的光源装置
CN100438062C (zh) * 2003-02-10 2008-11-26 波科海姆技术公共有限公司 用于半导体激光器的光功率监测
CN103875139A (zh) * 2011-11-16 2014-06-18 三菱电机株式会社 半导体激光器激励固体激光器
CN103531437A (zh) * 2012-07-06 2014-01-22 日立化成株式会社 半导体装置的制造方法和半导体装置

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US9929530B2 (en) 2018-03-27
CN107039881A (zh) 2017-08-11
JP2017135158A (ja) 2017-08-03
JP6790364B2 (ja) 2020-11-25

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