CN107015891A - Information processing method and test chip - Google Patents
Information processing method and test chip Download PDFInfo
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- CN107015891A CN107015891A CN201710121712.2A CN201710121712A CN107015891A CN 107015891 A CN107015891 A CN 107015891A CN 201710121712 A CN201710121712 A CN 201710121712A CN 107015891 A CN107015891 A CN 107015891A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2284—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]
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- General Physics & Mathematics (AREA)
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Abstract
The embodiment of the invention discloses a kind of information processing method and test chip, methods described includes：Determine the present operating frequency and present operating voltage of single tested chip；To the tested chip worked using the present operating frequency and present operating voltage, pressure test is carried out；When the tested chip is by the pressure test, increase the pressure test of the present operating frequency and return to the tested chip；When the tested chip is not by the pressure test, increase the present operating voltage；The pressure test to the tested chip is returned when the present operating voltage after increase is not more than the maximum working voltage of the tested chip support, otherwise the corresponding working frequency of pressure test passed through according to the tested chip, determines the maximum operation frequency that the tested chip is supported.
Description
Technical field
The present invention relates to electronic technology field, more particularly to a kind of information processing method and test chip.
Background technology
Chip, for example, the working frequency of CPU (Central Processing Unit, CPU), determines core
The speed of response of piece.Generally, chip has the rated frequency that its optimum works, and chip can work in some cases
In overclocking state.When chip operation is in overclocking state, the working frequency of chip is higher than the rated frequency, now, chip
Response speed is further lifted.But the maximum operation frequency that chip can be supported, it is the maximum operating frequency of overclocking state.
In the prior art, it is determined that chip supported maximum operating frequency when, be true based on overclocking (Over Clock, OC) test
Fixed.OC tests in the prior art are to carry out batch testing to multiple devices, and a working frequency is inputted by tester, are used
Tested in multiple devices, when wherein there is an equipment not support the working frequency, tester will adjust accordingly
The working frequency of input, repeatedly test obtains the working frequency that this group of equipment is supported, is set as all in this group of equipment
Standby supported maximum operating frequency.But, the performance of the chip of actually distinct equipment is different, and this OC method of testings are obtained
The supported maximum operating frequency of equipment arrived, can not often reflect the performance of itself of single device, and then equipment one
After denier comes into operation, it is impossible to play the performance of equipment itself to greatest extent.Therefore the accuracy of OC tests how is lifted, how
It is urgently to be resolved hurrily one of prior art to make to test the maximum operating frequency for determining to support under single device overclocking state by OC
Problem.
The content of the invention
In view of this, the embodiment of the present invention is expected to provide a kind of information processing method and test chip, at least partly solves
Above mentioned problem.
To reach above-mentioned purpose, the technical proposal of the invention is realized in this way：
First aspect of the embodiment of the present invention provides a kind of information processing method, including：
Determine the present operating frequency and present operating voltage of single tested chip；
To the tested chip worked using the present operating frequency and present operating voltage, pressure test is carried out；
When the tested chip is by the pressure test, increases the present operating frequency and return to described tested
The pressure test of chip；
When the tested chip is not by the pressure test, increase the present operating voltage；
Returned when the present operating voltage after increase is not more than the maximum working voltage of the tested chip support
The pressure test to the tested chip, the corresponding work frequency of pressure test otherwise passed through according to the tested chip
Rate, determines the maximum operation frequency that the tested chip is supported.
Based on such scheme, the increase present operating frequency, in addition to：
According to the first default step-length, increase frequency parameter；
The frequency parameter after increase is entered to the tested chip；Wherein, the frequency parameter, for for it is described by
Survey chip and process of frequency multiplication is carried out on the basis of frequency base value.
Based on such scheme, methods described also includes：
Test chip, which is read, characterizes the tested chip in whether normal first register of the pressure test；
When the test chip from the value that first register is read be first value when, the test chip
Determine that the chip to be measured passes through the pressure test.
Based on such scheme, the increase present operating frequency, including：
When putting on the number of times of the pressure test of the tested chip less than preset times, with the increase of the first amplitude
The present operating frequency；
When putting on the number of times of the pressure test of the tested chip not less than preset times, increased with the second amplitude
Plus the present operating frequency；Wherein, first amplitude is more than second amplitude.
Based on such scheme, methods described also includes：
When the present operating voltage of the tested chip has reached the maximum working voltage, and this pressure is not passed through
During test, the pressure test of the present operating frequency and return to the tested chip is reduced, wherein, the institute after the diminution
Present operating voltage is stated, the corresponding working frequency of the one-pass pressure test and less than institute more than before the tested chip
State the corresponding working frequency of this pressure test.
Second aspect of the embodiment of the present invention provides a kind of test chip, including test chip, and the test chip includes：
First determining unit, present operating frequency and present operating voltage for determining single tested chip；
Test cell, for the tested chip to being worked using the present operating frequency and present operating voltage,
Carry out pressure test；
Adjustment unit, for when the tested chip is by the pressure test, increasing the present operating frequency simultaneously
Return to the pressure test to the tested chip；When the tested chip is not by the pressure test, increase described current
Operating voltage；
Second determining unit, is not more than the tested chip for present operating voltage after increase and supports most
The pressure test to the tested chip is returned to during big operating voltage, the pressure otherwise passed through according to the tested chip is surveyed
Corresponding working frequency is tried, the maximum operation frequency that the tested chip is supported is determined.
Based on such scheme, the adjustment unit, specifically for according to the first default step-length, increasing frequency parameter；It will increase
The frequency parameter after big enters to the tested chip；Wherein, the frequency parameter, for supplying the tested chip in frequency
Process of frequency multiplication is carried out on the basis of base value.
Based on such scheme, the test chip, in addition to：
Reading unit, the tested chip is characterized in whether normal first deposit of the pressure test specifically for reading
Device；
3rd determining unit, for being taken when the value that the test chip is read from first register for described first
During value, determine that the chip to be measured passes through the pressure test.
Based on such scheme, the adjustment unit, specifically for when the pressure test for putting on the tested chip
Number of times when being less than preset times, the present operating frequency is increased with the first amplitude；When the institute for putting on the tested chip
When the number of times for stating pressure test is not less than preset times, the present operating frequency is increased with the second amplitude；Wherein, described first
Amplitude is more than second amplitude.
Based on such scheme, the adjustment unit is additionally operable to when the present operating voltage of the tested chip has reached
The maximum working voltage, and when not by this pressure test, reduce the present operating frequency and return to described tested
The pressure test of chip, wherein, the present operating voltage after the diminution is one-pass more than before the tested chip
The corresponding working frequency of the pressure test and less than the corresponding working frequency of this described pressure test.
Information processing method provided in an embodiment of the present invention and test chip, are positioning the maximum functional that tested chip is supported
During frequency, it is determined that present operating frequency and present operating voltage both for single tested chip, detection be it is single by
Chip is surveyed whether by the result of pressure test, therefore is that single survey is carried out to tested chip using test chip in the present embodiment
Examination, so clearly can be based on the tested chip performance of itself, be accurately positioned out the maximum operation frequency of tested chip, carry
The determine accuracy of the overclocking screen frequency of chip is risen, while the performance of the utilization chip of maximal efficiency.
Brief description of the drawings
Fig. 1 is the schematic flow sheet of the first information processing method provided in an embodiment of the present invention；
Fig. 2 is the schematic flow sheet of second of information processing method provided in an embodiment of the present invention；
Fig. 3 is a kind of structural representation of test chip provided in an embodiment of the present invention；
Fig. 4 is the schematic flow sheet of the third information processing method provided in an embodiment of the present invention；
Fig. 5 is a kind of structural representation of measurement equipment provided in an embodiment of the present invention.
Embodiment
Technical scheme is further elaborated below in conjunction with Figure of description and specific embodiment.
As shown in figure 1, the present embodiment provides a kind of information processing method, including：
Step S110：Determine the present operating frequency and present operating voltage of single tested chip；
Step S120：To the tested chip worked using the present operating frequency and present operating voltage, carry out
Pressure test；
Step S130：When the tested chip is by the pressure test, increase the present operating frequency, and return
The step S120；
Step S140：When the tested chip is not by the pressure test, increase the present operating voltage；
Step S151：Present operating voltage after increase is not more than the maximum functional electricity that the tested chip is supported
The step S120 is returned during pressure,
Step S152：Present operating voltage after increase is more than the maximum working voltage that the tested chip is supported
When, the corresponding working frequency of pressure test passed through according to the tested chip determines the maximum work that the tested chip is supported
Working frequency.
The present embodiment described information processing method can be applied to the method in test chip.Here test chip includes
Test chip.Here test chip can be overclocking test chip, and the overclocking test chip can be referred to as the integrated electricity of OC again
Road IC.Certainly, when implementing, the test chip, can be with addition to carrying out the special OC IC for carrying out overclocking test
It is that other can carry out the process chip of pressure test.For example, when the tested chip is the north bridge chips of measurement equipment, institute
The South Bridge chip in measurement equipment can be thought by stating test chip.Therefore test chip can be the test core for being exclusively used in OC tests
Piece or the non-dedicated test chip for being integrated with other functions.
Here tested chip can be central processor CPU chip, image processor GPU chips, digital signal processor
Dsp chip or application processor AP chips, in a word, tested chip here is various types of chips.
In step S110, the test chip determines the present operating frequency and work at present electricity of single tested chip
Pressure.The test chip determines present operating frequency and present operating voltage in the present embodiment, is only for a tested core
Piece, rather than multiple tested chips.
The present operating frequency is the clock frequency of the tested chip, and the present operating voltage can be to be input to institute
State the magnitude of voltage of tested chip.
In the starting stage of test, the usual present operating frequency adds one for the rated frequency of the tested chip
Frequency offseting value.The present operating voltage is the rated voltage of the tested chip.Like this, then the present embodiment provide
Information processing method, is directly to measure the maximum work that tested chip can be made into
Once it is determined that after the present operating frequency and present operating voltage of tested chip, test chip is to described tested
Chip sends test instruction, and test instruction here can be used for starting pressure test.The test instruction can carry instruction ginseng
Number, the order parameter may be used to indicate the present operating frequency and present operating voltage.
The tested chip is received after the test instruction, enters pressure test.Here pressure test can be
The test event in the tested chip is pre-designed, tested chip operation is in the work at present described in test process
Frequency and present operating voltage, then perform the various functions or operations in test event.If tested chip performs test
Do not occur the phenomenons such as machine that report an error or delay during project, it is believed that by the pressure test, otherwise it is believed that not passing through
The pressure test.
Generally, the pressure test also includes the testing time, and the testing time can be a longer time period.For example,
The pressure test time is 24 hours or 48 hours.The test event can be that various functions in measurement equipment are continuously performed,
Detect tested chip when performing these functions, if occur occurring reports an error, overloads or temperature is excessively high various different
Chang Xianxiang.Detect whether tested chip predetermined anomaly occurs in pressure test sequence, if within the testing time it is described by
Survey chip and predetermined anomaly do not occur, then by the pressure test, once the above-mentioned anomaly of appearance is detected, then really
This fixed pressure test does not pass through, and terminates this pressure test, into next step, to reduce unnecessary pressure test
Journey.
During pressure test is carried out, the test chip can monitor the tested chip in pressure test sequence
In state parameter, for example, the temperature of the detection tested chip, judges whether that temperature is too high according to the temperature of detection
Problem, such as, detect temperature higher than temperature threshold, it is believed that do not pass through the pressure test.
In step s 130, when tested chip is by the pressure test, it is to support current work to illustrate the tested chip
Working frequency, and the tested chip is possible to the support working frequency higher than present operating frequency, so when, then increase described
Present operating frequency.Equivalent to the working frequency for adjusting the tested chip again, the work frequency of the tested chip is being adjusted
After rate, step S120 is again returned to, pressure test is carried out to tested chip, to determine the work of tested chip operation after the adjustment
During working frequency, if exception occur, so repeatedly until finding the maximum operation frequency that tested chip can be made into.
If tested chip causes tested chip not by the pressure test not by pressure test in the present embodiment
Reason can be divided into two classes, and the first kind is strictly that the working frequency of tested chip is too high, and Equations of The Second Kind is the work of the tested chip
Voltage does not support so high working frequency.In order to exclude Equations of The Second Kind reason.The tested chip can be increased in the present embodiment
Present operating voltage.But in order to prevent the operating voltage for putting on the tested chip too high, cause tested chip to be hit
The damage problem such as wear, the maximum functional that the present operating voltage after increase is supported with tested chip can be also compared in the present embodiment
Voltage is compared, can not will be current after increase if the present operating voltage after increase is more than the maximum working voltage
Operating voltage, which puts on tested chip, makes its work, otherwise tested chip may be caused to be damaged.Simultaneously because a preceding pressure
Corresponding present operating voltage is already close to maximum working voltage or equal to maximum working voltage during test, and tested chip does not have still
Have by pressure test, it is possible to the reason for operating voltage causes tested chip not by pressure test is excluded, so as to true
Make is to cause it not by pressure test because the working frequency of tested chip is too high.Therefore at this point it is possible to according to tested chip
The corresponding working frequency of pressure test passed through in test process, determines the maximum functional frequency that the tested chip is supported
Rate, the maximum operation frequency can be the overclock frequency of the tested chip.
During concrete implementation, in the step S150, if the present operating voltage after increase is more than the maximum
Operating voltage, and the present operating voltage before increasing is less than the maximum working voltage, then adjusts present operating voltage again, make
Present operating voltage after adjustment is equal to the maximum working voltage of the tested chip, and returns to the pressure to the tested chip
Test.
In step S150, if the present operating frequency is adjusted by the way of incrementally increasing, it is determined that described
During maximum operation frequency, it is determined that it is described to go out the corresponding working frequency of pressure test that the tested chip last time passes through
The maximum operation frequency that tested chip is supported.
Therefore provide firstly a kind of method of the tested chip of non-batch testing in the present embodiment, by test process when
The adjustment repeatedly of preceding working frequency and present operating voltage, can accurately determine the maximum functional that each tested chip is supported
Frequency.Like this, can be different according to the performances of different tested chips, the overclock frequency of different tested chips is recorded, so
The overclock frequency of different tested chip records is different, can be with different maximum functionals after follow-up tested chip comes into operation
Frequency works, and gives full play to the performance of each chip.
In certain embodiments, the step S130 can also include：
According to the first default step-length, increase frequency parameter；
The frequency parameter after increase is entered to the tested chip；Wherein, the frequency parameter, for for it is described by
Survey chip and process of frequency multiplication is carried out on the basis of frequency base value.
Increase the present operating frequency, directly can export a present operating frequency to the tested chip corresponding
Frequency values.It is substantially adjustment frequency parameter in the present embodiment.For example, the frequency parameter is Rn, the tested chip
Frequency base value is F, then the tested chip can be operated in Rn*F after the frequency parameter is received.Like this, it is clear that
By the increase of frequency parameter, with regard to the easy effect for serving the present operating frequency for increasing the tested chip.If therefore described
When test chip sends the test to the tested chip and instructed, the test instruction carry on present operating frequency
Parameter, can be the frequency parameter, naturally it is also possible to be frequency values or other instruction works at present indirectly of present operating frequency
The configured information of frequency.
In certain embodiments, methods described also includes：
Test chip, which is read, characterizes the tested chip in whether normal first register of the pressure test；
When the test chip from the value that first register is read be first value when, the test chip
Determine that the chip to be measured passes through the pressure test.
First register can be the part of the tested chip, first register in the present embodiment
Can be the part of the test chip, certain first register can also be simultaneously independently of the tested chip and
The test chip, but the register being connected respectively with the tested chip and the test chip.But the first register
It can be used for the value that storage characterizes pressure testing results.First register includes the flag of one or more bits,
When the tested chip is by the pressure test, the flag is the first value, and otherwise the flag is described the
Two values.
For example, when the tested chip does not occur exception in pressure test sequence, then can at the end of pressure test, to
First register writes the first value.Like this, the tested chip passage time monitoring, finds current tested chip
Pressure test should be finished, first register is just read., can be direct if what test chip was read is the first value
Think that tested chip passes through the pressure test.If the tested chip occur in pressure test sequence it is abnormal, it is described by
Chip is surveyed to have no ability to the value of first stockpile device being set to first value, or will not be by first register
Value is set to first value.
Tested chip described in the present embodiment has the mode that first register is set to first value a lot
Kind, including write first value to first register.When first value is 0, the tested chip may be used also
So that by emptying first register, first register is set into first value.
If the test chip is integrated south bridge (Platform Controller Hub, PCH) in the present embodiment,
Then first register can be the part of the test chip, and concretely PCH-OC-WDT is posted first register
Storage.The PCH-OC-WDT registers are the register of PCH pressure test-Watch Dog Timer.The PCH-OC-WDT
For Platform Controller Hub-Over Clock-Watch Dog Timer abbreviation.Described in the present embodiment
One register has directly been multiplexed the existing register of the test chip, then without setting special register, so reduces
Testing cost.The PCH-OC-WDT registers will be set to 1, so by the PCH before pressure test in the present embodiment
If, the result that the tested chip can be allowed to be tested according to pressure itself adjusts the value of the PCH-OC-WDT registers.
Certainly, the PCH can be according to the state of itself, the value periodically in adjustment CH-OC-WDT registers, in order to avoid making
Stating PCH needs specially to adjust the value of the CH-OC-WDT registers before the pressure test time of tested chip, in this reality
The testing time of the pressure test can be set to the week that the N times of PCH updates the CH-OC-WDT registers by applying in example
Phase.And the PCH is that the CH-OC-WDT registers are set into the second value under normal circumstances, second value is different from
First value.Further, the initial time of the pressure test and the PCH update the week of PCH-OC-WDT registers
The initial time of phase is misaligned, and the initial time of the pressure test is slightly later than the PCH and updates PCH-OC-WDT registers
The initial time of a cycle, but the duration being later than PCH described no more than one updates the cycle of PCH-OC-WDT registers.
The increase present operating frequency in certain embodiments, including：
When putting on the number of times of the pressure test of the tested chip less than preset times, with the increase of the first amplitude
The present operating frequency；
When putting on the number of times of the pressure test of the tested chip not less than preset times, increased with the second amplitude
Plus the present operating frequency；Wherein, first amplitude is more than second amplitude.
When carrying out the pressure test test, the present operating frequency of tested chip is incrementally increased.Obviously, opening
Begin test when, the maximum operation frequency that the present operating frequency of the tested chip is supported apart from it farther out, in order to reduce pressure
The number of times of test, can increase present operating frequency, when by multiple pressure test in the incipient stage with the amplitude of increasing
After test, multiple increase has been carried out relative to rated frequency in the present operating frequency of tested chip, is propped up apart from it
The maximum operation frequency held is nearer, if it is obstructed to have occurred as soon as pressure test also to increase by a relatively large margin, after may once increasing
The phenomenon crossed, therefore after by pressure test, present operating frequency is increased with less amplitude.On the one hand pressure is reduced
Test or the number of times of whole OC tests, the opposing party can be accurately positioned out the maximum operation frequency that tested chip is supported.In this reality
OC tests can be referred to as by applying the whole flow process of step S110 to step S150 in example.
The first amplitude may include one or more first adjusting step values in the present embodiment, and second amplitude can also
Including one or more second adjusting step values.The first all adjusting step values are all higher than the second adjusting step value.When
So, can be using two kinds of different calculations when increasing the present operating frequency.When using the first amplitude, using the
One calculation calculates the present operating frequency after being increased, when being using the second amplitude, using the calculating of the second calculation
Present operating frequency after being increased.Calculated using two kinds of calculations so that the present operating frequency after increase is than increase
The adjustment amplitude of preceding present operating frequency is different.
In certain embodiments, as shown in Fig. 2 methods described also includes：
Step S153：When the present operating voltage of the tested chip has reached the maximum working voltage, and do not lead to
When crossing this pressure test, the present operating frequency and return to step S120 are reduced, wherein, it is described current after the diminution
Operating voltage, more than before the tested chip the corresponding working frequency of the one-pass pressure test and less than it is described this
The corresponding working frequency of pressure test.
If the present operating frequency is started to step up from the rated frequency of tested chip, when increasing to some work
Find that tested chip does not support the working frequency really during working frequency, therefore the supported maximum functional of tested chip can be determined
Frequency is located at the working frequency and tested chip between the corresponding working frequency of preceding one-pass pressure test.In this implementation
In order to be accurately positioned out the maximum operation frequency that the tested chip is supported in example, the current work can be reduced in the present embodiment
Working frequency, carries out pressure test with the present operating frequency after diminution to tested chip again.
The present operating frequency after the diminution can be the present operating frequency after the increase with before in the present embodiment
The intermediate value or average of the corresponding working frequency of one-pass pressure test.
Certainly, the present operating frequency is reduced in certain embodiments may include：Reduced with predetermined amplitude described current
Working frequency.Here predetermined amplitude corresponds directly to an adjusting step value, and predetermined amplitude here is less than working as before reducing
Difference between preceding working frequency working frequency corresponding with the preceding one-pass pressure test.
For example, it is assumed that increasing the present operating frequency as the first adjusting stage using the first amplitude, with the increase of the second amplitude
The present operating frequency was the second adjusting stage.When having occurred as soon as what pressure test did not passed through in first adjusting stage
During situation, the step 151 may include：
The pressure test of the present operating frequency and return to the tested chip is reduced with the 3rd amplitude；Wherein, institute
The 3rd amplitude is stated equal to or more than second amplitude.
In the present embodiment first by way of incrementally increasing, the big of the maximum working voltage that tested chip is supported is oriented
Scope is caused, then the tested chip support can be accurately positioned out most by the adjustment again (such as finely tuning) in approximate range
Big working frequency, so as to realize being accurately positioned for the overclock frequency of tested chip.
During concrete implementation, the test chip or the tested chip can also be tied according to test parameter and test
Really, OC test records are formed.Here test parameter includes each present operating frequency and present operating voltage, the survey
Test result can for the pressure test final result and/or the test result of each project in pressure test sequence.
In addition, methods described may also include：
Export the OC test records.By the output of OC test records, facilitate accident analysis chip or tester fixed
Position failure or the maximum operation frequency for understanding tested chip.
In certain embodiments, methods described also includes：
Once it is determined that going out the maximum operation frequency of the tested chip, then write in the predetermined memory of the tested chip
Enter the instruction parameter of the maximum operation frequency, facilitate after tested chip comes into operation, according to indicating that parameter determined in overclocking
Overclock frequency under state.Thus manually write without tester, realize what OC tests write with maximum operation frequency
It is full-automatic.
As shown in figure 3, the present embodiment provides a kind of test chip, including test chip, the test chip includes：
First determining unit 110, present operating frequency and present operating voltage for determining single tested chip；
Test cell 120, for the tested core to being worked using the present operating frequency and present operating voltage
Piece, carries out pressure test；
Adjustment unit 130, for when the tested chip is by the pressure test, increasing the present operating frequency
And pressure test of the return to the tested chip；When the tested chip is not by the pressure test, increase is described to work as
Preceding operating voltage；
Second determining unit 140, is not more than the tested chip for present operating voltage after increase and supports
Maximum working voltage when return to the pressure test to the tested chip, the pressure otherwise passed through according to the tested chip
Power tests corresponding working frequency, determines the maximum operation frequency that the tested chip is supported.
The present embodiment provides a kind of test chip, and the test chip can be special OC test chips.In the present embodiment
The test chip also cocoa is process chip different from tested chip in measurement equipment.For example, in a measurement equipment
Tested chip is CPU, and the PCH in the measurement equipment can serve as the test chip.
First determining unit 110, test cell 120, the determining unit of adjustment unit 130 and second in the present embodiment
140 integrated circuits that can all correspond in test chip etc., the integrated circuit can be realized by the execution of predetermined code
State the operation of functional unit.
Also provide in the present embodiment with a kind of test equipment, the test equipment includes the test chip and the test
The supporting construction of chip.The supporting construction may include housing or supporting plate；The test chip may be mounted at the support
In structure.The supporting plate can be printed circuit board (PCB) etc..
The test chip is arranged in the housing, and the test chip is connected by the opening on housing and test chip
Connect, or be connected by the access path on printed circuit board (PCB) with test chip.
The present operating frequency and present operating voltage that test chip is determined in the present embodiment are for single tested
Chip, present operating frequency is also the pressure testing results of itself according only to single tested chip in whole OC test process
Carry out, therefore the maximum operation frequency of tested chip can be accurately obtained, it is achieved thereby that the maximum functional of single tested chip
Frequency is accurately determined.
In certain embodiments, the adjustment unit 130, specifically for according to the first default step-length, increasing frequency parameter；
The frequency parameter after increase is entered to the tested chip；Wherein, the frequency parameter, for existing for the tested chip
Process of frequency multiplication is carried out on the basis of frequency base value.
In certain embodiments, the test chip, in addition to：
Reading unit, the tested chip is characterized in whether normal first deposit of the pressure test specifically for reading
Device；
3rd determining unit, for being taken when the value that the test chip is read from first register for described first
During value, determine that the chip to be measured passes through the pressure test.
Test chip described in the present embodiment also includes reading unit and the 3rd determining unit, reading unit here and the
Three determining units, the integrated circuit that equally can correspond in test chip.The test chip can be read by reading unit
The first register is taken, the 3rd determining unit determines tested chip whether by the pressure according to the value read from the first register
Power is tested.What first register itself can just carry for the tested chip in the present embodiment has posting for other functions
Storage.For example, when the test chip is PCH, first register can be PCH-OC-WDT registers.
In certain embodiments, the adjustment unit 130, specifically for when the pressure for putting on the tested chip
When the number of times of test is less than preset times, the present operating frequency is increased with the first amplitude；When putting on the tested chip
The number of times of pressure test when being not less than preset times, the present operating frequency is increased with the second amplitude；Wherein, it is described
First amplitude is more than second amplitude.
The adjustment unit 130 in the present embodiment, it may include counter, the counter can record this OC and test
The number of times for the pressure test that tested chip had been subjected in journey, can be with larger amplitude increase currently if number of times is smaller
Working frequency, otherwise with the increase of less amplitude, like this, it is possible to reduce pressure test number of times in OC test process, lifting
The efficiency of OC tests.
In certain embodiments, the adjustment unit 130, be additionally operable to when the tested chip present operating voltage
The maximum working voltage is reached, and when not by this pressure test, reduces the present operating frequency and returns to described
The pressure test of tested chip, wherein, the present operating voltage after the diminution, more than once leading to before the tested chip
The corresponding working frequency of the pressure test and the corresponding working frequency of this pressure test less than described in crossed.
In the present embodiment adjustment unit 130 not only can positive increase present operating voltage, can also be when appropriate
Wait and reversely reduce present operating voltage, so as to be accurately positioned out the maximum operation frequency that current tested chip is supported, lifted single
The overclock frequency of the maximum operation frequency of tested chip.
A specific example is provided below in conjunction with above-mentioned any embodiment：
As shown in figure 4, this example is by taking CPU as an example, a kind of overclock frequency localization method is provided based on above-mentioned any embodiment,
Including：
Step 1：Into CPU OC test patterns；
Step 2：OC IC set CPU present operating voltage Vp；When OC IC set the Vp for the first time, using public affairs
The setting of Formula V p=Vcpu+Voffset settings CPU present operating voltage, wherein, the Vp is present operating voltage, described
Vcpu is CPU rated voltage；The Voffset is voltage offset values；
Step 3：OC IC set current frequency parameter Rn；
Step 4：CPU carries out pressure test, specifically may include：CPU determines present operating frequency based on above-mentioned frequency parameter
Enter working condition with present operating voltage, and carry out pressure test.
Step 5：Judge the value of PCH-OC-WDT flags, when for 1 enter step 6, when for 0 when, utilize formula Rn=
Rn+b, obtains current frequency parameter, return to step 3.The b is that frequency parameter increases step-length, and value can take for 0.5,1 or 2 etc.
Value.Here PCH-OC-WDT flags are used to indicate whether whether CPU pass through in present operating frequency and present operating voltage
Pressure test.
Step 6：OC IC trigger CPU Global resets；Here global repair includes：Recover tested chip (this example middle finger
Be CPU) present operating voltage return to OC test initial operating voltage, such as rated voltage.Present operating frequency is extensive
Initial operating frequency is arrived again, for example, rated frequency.
Step 7：CPU present operating voltage is determined using formula Vp=Vp+Vstep, Vstep is present operating voltage
Increase step-length；
Step 8：Judge whether VP is less than Vcpumax, Vcpumax is the maximum working voltage that CPU is supported here；If returning
Step 2 is returned, if not into step 9；
Step 9：The OC test files that OC is tested and produced CPU are exited, OC test generations are included in the OC test files
Various OC test records.
Step 10：Using the OC test files.
Shown in Fig. 5 for a kind of measurement equipment, the equipment includes CPU and PCH；Wherein, PCH includes integrated circuit and PCH-
OC-WDT registers.CPU is tested chip, and PCH is test chip, and the PCH-OC-WDT registers are storage PCH-OC-WDT
The register of flag.The measurement equipment can carry out OC tests using above-mentioned steps 1 to step 10, like this, tested to set
It is standby to utilize the structure of itself, being accurately positioned to CPU overclock frequency is realized, while also having the characteristics of realizing simple.
After above-mentioned example is performed, following technique effect can be obtained：
1) OC IC carry out OC tests and corrected parameter automatically；
2) frequency and voltage of customized CPU overclockings；
3) CPU overclocking abilities are at utmost excavated；
4) CPU overclocking performances are maximized, Consumer's Experience is lifted.
, can be by it in several embodiments provided herein, it should be understood that disclosed apparatus and method
Its mode is realized.Apparatus embodiments described above are only schematical, for example, the division of the unit, is only
A kind of division of logic function, can have other dividing mode, such as when actually realizing：Multiple units or component can be combined, or
Another system is desirably integrated into, or some features can be ignored, or do not perform.In addition, shown or discussed each composition portion
Coupling point each other or direct-coupling or communication connection can be the INDIRECT COUPLINGs of equipment or unit by some interfaces
Or communication connection, can be electrical, machinery or other forms.
The above-mentioned unit illustrated as separating component can be or may not be it is physically separate, it is aobvious as unit
The part shown can be or may not be physical location, you can positioned at a place, can also be distributed to multiple network lists
In member；Part or all of unit therein can be selected to realize the purpose of this embodiment scheme according to the actual needs.
In addition, each functional unit in various embodiments of the present invention can be fully integrated into a processing module, also may be used
Be each unit individually as a unit, can also two or more units it is integrated in a unit；It is above-mentioned
Integrated unit can both be realized in the form of hardware, it would however also be possible to employ hardware adds the form of SFU software functional unit to realize.
One of ordinary skill in the art will appreciate that：Realizing all or part of step of above method embodiment can pass through
Programmed instruction related hardware is completed, and foregoing program can be stored in a computer read/write memory medium, the program
Upon execution, the step of including above method embodiment is performed；And foregoing storage medium includes：It is movable storage device, read-only
Memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), magnetic disc or
Person's CD etc. is various can be with the medium of store program codes.
The foregoing is only a specific embodiment of the invention, but protection scope of the present invention is not limited thereto, any
Those familiar with the art the invention discloses technical scope in, change or replacement can be readily occurred in, should all be contained
Cover within protection scope of the present invention.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.
Claims (10)
1. a kind of information processing method, it is characterised in that including：
Determine the present operating frequency and present operating voltage of single tested chip；
To the tested chip worked using the present operating frequency and present operating voltage, pressure test is carried out；
When the tested chip is by the pressure test, increases the present operating frequency and return to the tested chip
Pressure test；
When the tested chip is not by the pressure test, increase the present operating voltage；
Returned when the present operating voltage after increase is not more than the maximum working voltage of the tested chip support to institute
The pressure test of tested chip is stated, the corresponding working frequency of pressure test otherwise passed through according to the tested chip, really
The maximum operation frequency that the fixed tested chip is supported.
2. according to the method described in claim 1, it is characterised in that
The increase present operating frequency, in addition to：
According to the first default step-length, increase frequency parameter；
The frequency parameter after increase is entered to the tested chip；Wherein, the frequency parameter, for supplying the tested core
Piece carries out process of frequency multiplication on the basis of frequency base value.
3. according to the method described in claim 1, it is characterised in that
Methods described also includes：
Test chip, which is read, characterizes the tested chip in whether normal first register of the pressure test；
When the test chip from the value that first register is read be first value when, the test chip is determined
The chip to be measured passes through the pressure test.
4. the method according to claim 1,2 or 3, it is characterised in that
The increase present operating frequency, including：
It is described with the increase of the first amplitude when putting on the number of times of the pressure test of the tested chip less than preset times
Present operating frequency；
When putting on the number of times of the pressure test of the tested chip not less than preset times, institute is increased with the second amplitude
State present operating frequency；Wherein, first amplitude is more than second amplitude.
5. the method according to claim 1,2 or 3, it is characterised in that
Methods described also includes：
When the present operating voltage of the tested chip has reached the maximum working voltage, and this pressure test is not passed through
When, reduce the present operating frequency and return to pressure test to the tested chip, wherein, described after the diminution is worked as
Preceding operating voltage, the corresponding working frequency of the one-pass pressure test and less than described more than before the tested chip
The corresponding working frequency of secondary pressure test.
6. a kind of test chip, it is characterised in that including：
First determining unit, present operating frequency and present operating voltage for determining single tested chip；
Test cell, for the tested chip to being worked using the present operating frequency and present operating voltage, is carried out
Pressure test；
Adjustment unit, for when the tested chip is by the pressure test, increasing the present operating frequency and returning
Pressure test to the tested chip；When the tested chip is not by the pressure test, increase the work at present
Voltage；
Second determining unit, is not more than the maximum work that the tested chip is supported for present operating voltage after increase
Make to return to the pressure test to the tested chip, the pressure test pair otherwise according to the tested chip passed through during voltage
The working frequency answered, determines the maximum operation frequency that the tested chip is supported.
7. test chip according to claim 6, it is characterised in that
The adjustment unit, specifically for according to the first default step-length, increasing frequency parameter；By the frequency parameter after increase
Enter to the tested chip；Wherein, the frequency parameter, for being carried out for the tested chip on the basis of frequency base value again
Frequency is handled.
8. test chip according to claim 6, it is characterised in that
The test chip, in addition to：
Reading unit, the tested chip is characterized in whether normal first register of the pressure test specifically for reading；
3rd determining unit, for being first value when the value that the test chip is read from first register
When, determine that the chip to be measured passes through the pressure test.
9. the test chip according to claim 6,7 or 8, it is characterised in that
The adjustment unit, is less than preset times specifically for the number of times when the pressure test for putting on the tested chip
When, the present operating frequency is increased with the first amplitude；When the pressure test for putting on the tested chip number of times not
During less than preset times, the present operating frequency is increased with the second amplitude；Wherein, first amplitude is more than second width
Degree.
10. the test chip according to claim 6,7 or 8, it is characterised in that
The adjustment unit, the present operating voltage for being additionally operable to work as the tested chip has reached the maximum working voltage,
And when not by this pressure test, the pressure test of the present operating frequency and return to the tested chip is reduced, its
In, the present operating voltage after the diminution, the one-pass pressure test correspondence more than before the tested chip
Working frequency and less than the corresponding working frequency of this pressure test.
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| CN107908509A (en) * | 2017-11-07 | 2018-04-13 | 晶晨半导体(上海)股份有限公司 | A kind of automated testing method for processor |
| CN108459934A (en) * | 2017-12-22 | 2018-08-28 | 深圳比特微电子科技有限公司 | The method for searching optimum frequency |
| CN109065094A (en) * | 2018-08-09 | 2018-12-21 | 晶晨半导体（深圳）有限公司 | Obtain the method and system of Double Data Rate synchronous DRAM volume production frequency |
| CN111290890A (en) * | 2019-01-28 | 2020-06-16 | 紫光展讯通信(惠州)有限公司 | Chip screening method and device |
| CN111289873A (en) * | 2019-05-10 | 2020-06-16 | 展讯通信（上海）有限公司 | Chip testing method, chip parameter setting method and chip |
| CN112526319A (en) * | 2020-11-25 | 2021-03-19 | 海光信息技术股份有限公司 | Chip testing method and device, processor chip and server |
| CN114236363A (en) * | 2022-01-04 | 2022-03-25 | 深圳凯瑞通电子有限公司 | Stability testing method and system based on integrated circuit chip |
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| CN107908509A (en) * | 2017-11-07 | 2018-04-13 | 晶晨半导体(上海)股份有限公司 | A kind of automated testing method for processor |
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| CN114236363A (en) * | 2022-01-04 | 2022-03-25 | 深圳凯瑞通电子有限公司 | Stability testing method and system based on integrated circuit chip |
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|---|---|
| CN107015891B (en) | 2020-06-23 |
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