CN114236363A - Stability testing method and system based on integrated circuit chip - Google Patents

Stability testing method and system based on integrated circuit chip Download PDF

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CN114236363A
CN114236363A CN202210001109.1A CN202210001109A CN114236363A CN 114236363 A CN114236363 A CN 114236363A CN 202210001109 A CN202210001109 A CN 202210001109A CN 114236363 A CN114236363 A CN 114236363A
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operation input
input condition
integrated circuit
circuit chip
condition parameters
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刘国军
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Shenzhen Kairuitong Electronics Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]

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Abstract

The invention provides a stability testing method and system based on an integrated circuit chip. The stability test method comprises the following steps: acquiring two first reference measured signals with different values and two second reference measured signals with different values of an integrated circuit chip; testing and analyzing a first reference tested signal and a second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; continuously adjusting the operation input condition parameters of the integrated circuit chip to obtain changed operation input condition parameters and corresponding output parameter signals, and respectively using the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group; and analyzing the first monitoring signal group and the second monitoring signal group in real time, and acquiring whether the position of the signal site of the second monitoring signal group on the shmoo graph is in a normal working area or not in real time. The system comprises modules corresponding to the method steps.

Description

Stability testing method and system based on integrated circuit chip
Technical Field
The invention provides a stability testing method and system based on an integrated circuit chip, and belongs to the technical field of chip detection.
Background
After designing and producing the integrated circuit chip, a design and production factory of the integrated circuit chip usually needs to use a special chip tester to test the integrated circuit chip to identify a bad chip and identify the bad chip, only the integrated circuit chip which passes the test can be sold, and the integrated circuit chip which does not pass the test can not be sold, thereby creating conditions for the production of the next procedure. However, in the prior art, the test for the integrated circuit chip is performed only for a constant fixed duration test on the measurement parameters to test the performance of the chip, and this test method is usually only capable of testing whether the chip operates normally, but cannot perform an omnidirectional test on the operation stability of the chip, which often results in an inaccurate test result of the operation stability of the chip.
Disclosure of Invention
The invention provides a stability test method and a system based on an integrated circuit chip, which are used for solving the problem of low accuracy rate of stability detection of the integrated circuit chip in the prior art:
a stability test method based on an integrated circuit chip, the stability test method comprising:
acquiring two first reference measured signals with different values and two second reference measured signals with different values of the integrated circuit chip; wherein the first reference measured signal is one or more of the operating input condition parameters of the integrated circuit chip; the second reference measured signal is an output parameter signal corresponding to the operation input condition parameter;
testing and analyzing the first reference tested signal and the second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; wherein, a normal working area and an abnormal working area corresponding to the integrated circuit chip are displayed in the shmoo diagram;
continuously adjusting the operation input condition parameters of the integrated circuit chip to obtain changed operation input condition parameters and corresponding output parameter signals, and respectively using the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group;
and analyzing the first monitoring signal group and the second monitoring signal group in real time, and acquiring whether the position of the signal site of the second monitoring signal group on the shmoo graph is in a normal working area or not in real time.
Further, continuously adjusting the operation input condition parameters of the integrated circuit chip to obtain the changed operation input condition parameters and the corresponding output parameter signals, and respectively using the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group, including:
continuously adjusting the operation input condition parameters of the integrated circuit chip according to the stability detection requirement of the integrated circuit chip and a signal adjustment rule;
acquiring adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip in real time;
and respectively forming a first monitoring signal group and a second monitoring signal group by using the real-time adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip.
Further, according to the stability detection requirement of the integrated circuit chip, continuously adjusting the data control signal of the integrated circuit chip according to a signal adjustment rule, comprising:
the operation input condition parameters comprise the working temperature of the integrated circuit chip, the rated range of the input parameters and a data control signal DQS;
when the integrated circuit chip detects the stability of the chip aiming at the rated ranges of the working temperature and the input parameters, the data control signal of the integrated circuit chip is continuously adjusted according to a first signal adjustment rule;
and when the integrated circuit chip needs to detect the chip stability aiming at the data control signal DQS, continuously adjusting the data control signal of the integrated circuit chip according to a second signal adjustment rule.
Further, the first signal adjustment rule is as follows:
when the stability detection of the integrated circuit chip is implemented according to the working temperature and the rated range of the input parameters, acquiring an upper limit value and a lower limit value corresponding to the operation input condition parameters of each type; then, the operation input condition parameters of each kind are adjusted in value according to a preset time interval, and the adjustment mode is as follows:
step 1, setting a first monitoring duration corresponding to a current operation input condition parameter to be tested according to an upper limit value and a lower limit value corresponding to the current operation input condition parameter to be tested;
step 2, keeping the numerical conditions of other operation input condition parameters except the operation input condition parameter of the current test unchanged, setting the operation input condition parameter according to the upper limit value, and enabling the integrated circuit chip to operate according to the upper limit value setting of the operation input condition parameter of the current test, wherein the operation time is the time length corresponding to the preset time interval;
step 3, after the preset time interval is reached, adjusting the integrated circuit chip to set operation input condition parameters according to the lower limit value to operate; after the time length corresponding to the preset time interval is set according to the lower limit value, the operation input condition parameters in each preset time interval are increased according to the parameter values corresponding to the lower limit values, the amplification of which is 0.3% -0.5% of each preset time interval, until the operation input condition parameters reach the upper limit values, and the operation input condition parameters in each preset time interval are reduced according to the parameter values corresponding to the upper limit values, the amplification of which is 0.8% -1.0% of each preset time interval, until the operation input condition parameters reach the lower limit values; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 4, after the operation input condition parameters reach the lower limit value, increasing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the lower limit value with the amplitude increased by 0.5% -0.8% in each preset time interval until the operation input condition parameters reach the upper limit value, and reducing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the upper limit value with the amplitude decreased by 0.95% -1.2% in each preset time interval until the operation input condition parameters reach the lower limit value; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 5, continuously repeating the execution contents of the steps 1 to 4, and adjusting corresponding values of the amplification and the attenuation within a given amplification and attenuation range until a first monitoring time length is reached;
and 6, sequentially carrying out operation stability test on each operation input condition parameter in the rated ranges of the working temperature and the input parameter according to the execution content of the steps 1 to 5.
Further, the second signal adjustment rule is as follows: when the stability detection of the integrated circuit chip is realized only aiming at one operation input condition parameter in the data control signal DQS, the numerical values of other operation input condition parameters of the integrated control chip except the data control signal DQS are kept constant, and the state of the data control signal DQS is adjusted according to a preset time interval until the second monitoring time length. The state of the data control signal DQS includes a memory read-write state, an I/Q port read-write state, an interrupt request state, a reset signal state, a clock state, an interrupt response state, and the like.
The first monitoring time length and the second monitoring time length are obtained through the following formulas:
Figure 793524DEST_PATH_IMAGE001
Figure 949305DEST_PATH_IMAGE002
wherein,T 1andT 2respectively representing a first monitoring time length and a second monitoring time length;N 1andN 2respectively representing the number of detection criteria of the first monitoring period and the second monitoring period,N 1the value range of (A) is 500-1000,N 2the value range of (A) is 800-1500;C max andC min respectively representing an upper limit value and a lower limit value corresponding to the current running input condition parameter to be tested;f min representing the lowest adjusting range value corresponding to the amplifying range in the parameter adjusting process;T 0representing a preset time interval.
An integrated circuit chip based stability test system, the stability test system comprising:
the acquisition module is used for acquiring two first reference measured signals with different values and two second reference measured signals with different values of the integrated circuit chip; wherein the first reference measured signal is one or more of the operating input condition parameters of the integrated circuit chip; the second reference measured signal is an output parameter signal corresponding to the operation input condition parameter;
the region determining module is used for testing and analyzing the first reference tested signal and the second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; wherein, a normal working area and an abnormal working area corresponding to the integrated circuit chip are displayed in the shmoo diagram;
the adjusting module is used for obtaining changed operation input condition parameters and corresponding output parameter signals by continuously adjusting the operation input condition parameters of the integrated circuit chip, and respectively taking the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group;
and the analysis module is used for analyzing the first monitoring signal group and the second monitoring signal group in real time and acquiring whether the positions of the signal sites of the first monitoring signal group and the second monitoring signal group on the shmoo graph are in a normal working area or not in real time.
Further, the adjustment module includes:
the parameter adjusting module is used for continuously adjusting the operation input condition parameters of the integrated circuit chip according to the stability detection requirement of the integrated circuit chip and a signal adjusting rule;
the acquisition module is used for acquiring the adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip in real time;
and the signal group forming module is used for respectively forming a first monitoring signal group and a second monitoring signal group from the real-time adjusted operation input condition parameters and the output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip.
Further, the parameter adjusting module comprises:
the first adjusting module is used for continuously adjusting a data control signal of the integrated circuit chip according to a first signal adjusting rule when the integrated circuit chip detects the stability of the chip aiming at the working temperature and the rated range of the input parameter;
and the second adjusting module is used for continuously adjusting the data control signal of the integrated circuit chip according to a second signal adjusting rule when the integrated circuit chip needs to detect the stability of the chip aiming at the data control signal DQS.
Further, the first signal adjustment rule is as follows:
when the stability detection of the integrated circuit chip is implemented according to the working temperature and the rated range of the input parameters, acquiring an upper limit value and a lower limit value corresponding to the operation input condition parameters of each type; then, the operation input condition parameters of each kind are adjusted in value according to a preset time interval, and the adjustment mode is as follows:
step 1, setting a first monitoring duration corresponding to a current operation input condition parameter to be tested according to an upper limit value and a lower limit value corresponding to the current operation input condition parameter to be tested;
step 2, keeping the numerical conditions of other operation input condition parameters except the operation input condition parameter of the current test unchanged, setting the operation input condition parameter according to the upper limit value, and enabling the integrated circuit chip to operate according to the upper limit value setting of the operation input condition parameter of the current test, wherein the operation time is the time length corresponding to the preset time interval;
step 3, after the preset time interval is reached, adjusting the integrated circuit chip to set operation input condition parameters according to the lower limit value to operate; after the time length corresponding to the preset time interval is set according to the lower limit value, the operation input condition parameters in each preset time interval are increased according to the parameter values corresponding to the lower limit values, the amplification of which is 0.3% -0.5% of each preset time interval, until the operation input condition parameters reach the upper limit values, and the operation input condition parameters in each preset time interval are reduced according to the parameter values corresponding to the upper limit values, the amplification of which is 0.8% -1.0% of each preset time interval, until the operation input condition parameters reach the lower limit values; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 4, after the operation input condition parameters reach the lower limit value, increasing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the lower limit value with the amplitude increased by 0.5% -0.8% in each preset time interval until the operation input condition parameters reach the upper limit value, and reducing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the upper limit value with the amplitude decreased by 0.95% -1.2% in each preset time interval until the operation input condition parameters reach the lower limit value; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 5, continuously repeating the execution contents of the steps 1 to 4, and adjusting corresponding values of the amplification and the attenuation within a given amplification and attenuation range until a first monitoring time length is reached;
and 6, sequentially carrying out operation stability test on each operation input condition parameter in the rated ranges of the working temperature and the input parameter according to the execution content of the steps 1 to 5.
Further, the second signal adjustment rule is as follows: when the stability detection of the integrated circuit chip is realized only aiming at one operation input condition parameter in the data control signal DQS, the numerical values of other operation input condition parameters of the integrated control chip except the data control signal DQS are kept constant, and the state of the data control signal DQS is adjusted according to a preset time interval until the second monitoring time length. The state of the data control signal DQS includes a memory read-write state, an I/Q port read-write state, an interrupt request state, a reset signal state, a clock state, an interrupt response state, and the like.
The first monitoring time length and the second monitoring time length are obtained through the following formulas:
Figure 538418DEST_PATH_IMAGE001
Figure 364554DEST_PATH_IMAGE002
wherein,T 1andT 2respectively representing a first monitoring time length and a second monitoring time length;N 1andN 2respectively representing the number of detection criteria of the first monitoring period and the second monitoring period,N 1the value range of (A) is 500-1000,N 2the value range of (A) is 800-1500;C max andC min respectively representing an upper limit value and a lower limit value corresponding to the current running input condition parameter to be tested;f min representing the lowest adjusting range value corresponding to the amplifying range in the parameter adjusting process;T 0representing a preset time interval.
The invention has the beneficial effects that:
the stability testing method and the system based on the integrated circuit chip provided by the invention can detect the operation condition of the integrated circuit chip by a parameter conversion mode of different amplitude adjustment of operation input parameters, can judge the operation stability of the integrated circuit chip to the maximum extent, and can improve the accuracy of the operation stability detection of the integrated circuit chip to the maximum extent in the limited chip detection time by the operation input parameter change mode of the stability testing method and the system based on the integrated circuit chip provided by the invention, thereby improving the yield detection and judgment of the integrated circuit chip. Meanwhile, the stability test of the integrated circuit chip is carried out in the parameter conversion mode, and the variability of the operation parameters in the detection process can ensure that the accuracy of the stability detection can be effectively ensured even if the stability detection time is shortened under the condition that the task amount of a product is increased rapidly, so that the stability detection efficiency of the integrated circuit chip is effectively improved.
Drawings
FIG. 1 is a first flowchart of the method of the present invention;
FIG. 2 is a flow chart of a second method of the present invention;
fig. 3 is a system block diagram of the system of the present invention.
Detailed Description
The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are described herein for the purpose of illustration and explanation and not limitation.
The embodiment of the invention provides a stability test method based on an integrated circuit chip, as shown in fig. 1, the stability test method comprises the following steps:
s1, acquiring two first reference measured signals with different values and two second reference measured signals with different values of the integrated circuit chip; wherein the first reference measured signal is one or more of the operating input condition parameters of the integrated circuit chip; the second reference measured signal is an output parameter signal corresponding to the operation input condition parameter;
s2, testing and analyzing the first reference tested signal and the second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; wherein, a normal working area and an abnormal working area corresponding to the integrated circuit chip are displayed in the shmoo diagram;
s3, continuously adjusting the operation input condition parameters of the integrated circuit chip to obtain the changed operation input condition parameters and the corresponding output parameter signals, and respectively using the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group;
and S4, analyzing the first monitoring signal group and the second monitoring signal group in real time, and acquiring whether the position of the signal site of the second monitoring signal group on the shmoo graph is in a normal working area or not in real time.
The working principle of the technical scheme is as follows: firstly, two first reference measured signals with different values and two second reference measured signals with different values of the integrated circuit chip are obtained; wherein the first reference measured signal is one or more of the operating input condition parameters of the integrated circuit chip; the second reference measured signal is an output parameter signal corresponding to the operation input condition parameter; then, carrying out test analysis on the first reference tested signal and the second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; wherein, a normal working area and an abnormal working area corresponding to the integrated circuit chip are displayed in the shmoo diagram; then, continuously adjusting the operation input condition parameters of the integrated circuit chip to obtain the changed operation input condition parameters and corresponding output parameter signals, and respectively using the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group; and finally, analyzing the first monitoring signal group and the second monitoring signal group in real time, and acquiring whether the position of the signal site of the second monitoring signal group on the shmoo graph is in a normal working area or not in real time.
The effect of the above technical scheme is as follows: according to the stability testing method based on the integrated circuit chip, the operation condition of the integrated circuit chip is detected in a parameter conversion mode of different amplitude adjustment of the operation input parameters, the operation stability of the integrated circuit chip can be judged to the greatest extent, the accuracy of the operation stability detection of the integrated circuit chip can be improved to the greatest extent within the limited chip detection time through the mode, and then the yield detection and judgment of the integrated circuit chip are improved. Meanwhile, the stability test of the integrated circuit chip is carried out in the parameter conversion mode, and the variability of the operation parameters in the detection process can ensure that the accuracy of the stability detection can be effectively ensured even if the stability detection time is shortened under the condition that the task amount of a product is increased rapidly, so that the stability detection efficiency of the integrated circuit chip is effectively improved.
In an embodiment of the present invention, obtaining a variable operation input condition parameter and a corresponding output parameter signal by continuously adjusting an operation input condition parameter of the integrated circuit chip, and using the operation input condition parameter and the corresponding output parameter signal as a first monitoring signal group and a second monitoring signal group respectively, includes:
s301, continuously adjusting the operation input condition parameters of the integrated circuit chip according to the stability detection requirement of the integrated circuit chip and a signal adjustment rule;
s302, acquiring adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip in real time;
and S303, respectively forming a first monitoring signal group and a second monitoring signal group by the real-time adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip.
The working principle of the technical scheme is as follows: firstly, continuously adjusting the operation input condition parameters of the integrated circuit chip according to the stability detection requirement of the integrated circuit chip and a signal adjustment rule; then, acquiring the adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip in real time; and finally, respectively forming a first monitoring signal group and a second monitoring signal group by the real-time adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip.
The effect of the above technical scheme is as follows: the operation state of the integrated circuit chip is detected in a parameter conversion mode of different amplitude adjustment of operation input parameters, the operation stability of the integrated circuit chip can be judged to the greatest extent, the accuracy of the operation stability detection of the integrated circuit chip can be improved to the greatest extent in the limited chip detection time through the mode, and then the yield detection and judgment of the integrated circuit chip are improved. Meanwhile, the stability test of the integrated circuit chip is carried out in the parameter conversion mode, and the variability of the operation parameters in the detection process can ensure that the accuracy of the stability detection can be effectively ensured even if the stability detection time is shortened under the condition that the task amount of a product is increased rapidly, so that the stability detection efficiency of the integrated circuit chip is effectively improved.
In an embodiment of the present invention, continuously adjusting a data control signal of the integrated circuit chip according to a signal adjustment rule according to a stability detection requirement of the integrated circuit chip includes:
the operation input condition parameters comprise the working temperature of the integrated circuit chip, the rated range of the input parameters and a data control signal DQS;
s3011, when the chip stability of the integrated circuit chip is detected according to the working temperature and the rated range of input parameters, continuously adjusting a data control signal of the integrated circuit chip according to a first signal adjustment rule;
s3012, when the integrated circuit chip needs to detect the chip stability aiming at the data control signal DQS, the data control signal of the integrated circuit chip is continuously adjusted according to a second signal adjustment rule.
The working principle of the technical scheme is as follows: firstly, when the integrated circuit chip detects the stability of the chip aiming at the rated ranges of the working temperature and the input parameters, continuously adjusting a data control signal of the integrated circuit chip according to a first signal adjustment rule; and then, when the integrated circuit chip needs to detect the chip stability aiming at the data control signal DQS, continuously adjusting the data control signal of the integrated circuit chip according to a second signal adjustment rule.
The effect of the above technical scheme is as follows: according to different operation input condition parameter properties, different data are adopted to adjust the crime rule, and the accuracy of the stability detection of the integrated circuit chip can be further effectively improved.
In an embodiment of the invention, the first signal adjustment rule is as follows:
when the stability detection of the integrated circuit chip is implemented according to the working temperature and the rated range of the input parameters, acquiring an upper limit value and a lower limit value corresponding to the operation input condition parameters of each type; then, the operation input condition parameters of each category are adjusted in value according to a preset time interval, as shown in fig. 2, the adjustment mode is as follows:
step 1, setting a first monitoring duration corresponding to a current operation input condition parameter to be tested according to an upper limit value and a lower limit value corresponding to the current operation input condition parameter to be tested;
step 2, keeping the numerical conditions of other operation input condition parameters except the operation input condition parameter of the current test unchanged, setting the operation input condition parameter according to the upper limit value, and enabling the integrated circuit chip to operate according to the upper limit value setting of the operation input condition parameter of the current test, wherein the operation time is the time length corresponding to the preset time interval;
step 3, after the preset time interval is reached, adjusting the integrated circuit chip to set operation input condition parameters according to the lower limit value to operate; after the time length corresponding to the preset time interval is set according to the lower limit value, the operation input condition parameters in each preset time interval are increased according to the parameter values corresponding to the lower limit values, the amplification of which is 0.3% -0.5% of each preset time interval, until the operation input condition parameters reach the upper limit values, and the operation input condition parameters in each preset time interval are reduced according to the parameter values corresponding to the upper limit values, the amplification of which is 0.8% -1.0% of each preset time interval, until the operation input condition parameters reach the lower limit values; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 4, after the operation input condition parameters reach the lower limit value, increasing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the lower limit value with the amplitude increased by 0.5% -0.8% in each preset time interval until the operation input condition parameters reach the upper limit value, and reducing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the upper limit value with the amplitude decreased by 0.95% -1.2% in each preset time interval until the operation input condition parameters reach the lower limit value; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 5, continuously repeating the execution contents of the steps 1 to 4, and adjusting corresponding values of the amplification and the attenuation within a given amplification and attenuation range until a first monitoring time length is reached;
and 6, sequentially carrying out operation stability test on each operation input condition parameter in the rated ranges of the working temperature and the input parameter according to the execution content of the steps 1 to 5.
The second signal adjustment rule is as follows: when the stability detection of the integrated circuit chip is realized only aiming at one operation input condition parameter in the data control signal DQS, the numerical values of other operation input condition parameters of the integrated control chip except the data control signal DQS are kept constant, and the state of the data control signal DQS is adjusted according to a preset time interval until the second monitoring time length. The state of the data control signal DQS includes a memory read-write state, an I/Q port read-write state, an interrupt request state, a reset signal state, a clock state, an interrupt response state, and the like.
The first monitoring time length and the second monitoring time length are obtained through the following formulas:
Figure 216972DEST_PATH_IMAGE004
Figure 588611DEST_PATH_IMAGE006
wherein,T 1andT 2respectively representing a first monitoring time length and a second monitoring time length;N 1andN 2respectively representing the number of detection criteria of the first monitoring period and the second monitoring period,N 1the value range of (A) is 500-1000,N 2the value range of (A) is 800-1500;C max andC min respectively representing an upper limit value and a lower limit value corresponding to the current running input condition parameter to be tested;f min representing the lowest adjusting range value corresponding to the amplifying range in the parameter adjusting process;T 0representing a preset time interval.
The working principle of the technical scheme is as follows: firstly, setting a first monitoring duration corresponding to a current operation input condition parameter to be tested according to an upper limit value and a lower limit value corresponding to the current operation input condition parameter to be tested; then, keeping the numerical conditions of other operation input condition parameters except the operation input condition parameter of the current test unchanged, setting the operation input condition parameter according to the upper limit value, and enabling the integrated circuit chip to operate according to the upper limit value setting of the operation input condition parameter of the current test, wherein the operation time is the time length corresponding to the preset time interval; then, after the preset time interval is reached, adjusting the integrated circuit chip to set operation input condition parameters according to the lower limit value to operate; after the time length corresponding to the preset time interval is set according to the lower limit value, the operation input condition parameters in each preset time interval are increased according to the parameter values corresponding to the lower limit values, the amplification of which is 0.3% -0.5% of each preset time interval, until the operation input condition parameters reach the upper limit values, and the operation input condition parameters in each preset time interval are reduced according to the parameter values corresponding to the upper limit values, the amplification of which is 0.8% -1.0% of each preset time interval, until the operation input condition parameters reach the lower limit values; then, after the operation input condition parameters reach the lower limit value, increasing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the lower limit value with the amplitude increased by 0.5% -0.8% in each preset time interval until the operation input condition parameters reach the upper limit value, and reducing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the upper limit value with the amplitude decreased by 0.95% -1.2% in each preset time interval until the operation input condition parameters reach the lower limit value; continuously repeating the execution content, and adjusting the corresponding values of the amplification and the attenuation in a given amplification and attenuation range until the first monitoring time length is reached; and finally, sequentially carrying out operation stability test on each operation input condition parameter in the rated ranges of the working temperature and the input parameter according to the debugging mode.
The effect of the above technical scheme is as follows: firstly, the operation state of the integrated circuit chip is detected by a parameter conversion mode of different amplitude adjustment of operation input parameters, the operation stability of the integrated circuit chip can be judged to the greatest extent, in addition, the accuracy of the operation stability detection of the integrated circuit chip can be improved to the greatest extent in the limited chip detection time by the mode, and further, the yield detection and the judgment of the integrated circuit chip are improved. Meanwhile, the stability test of the integrated circuit chip is carried out in the parameter conversion mode, and the variability of the operation parameters in the detection process can ensure that the accuracy of the stability detection can be effectively ensured even if the stability detection time is shortened under the condition that the task amount of a product is increased rapidly, so that the stability detection efficiency of the integrated circuit chip is effectively improved.
Secondly, through the range and the range of the amplification and the reduction, and the collocation setting of the amplitude and the reduction of the amplification and the reduction of the parameter, the operation input parameter adjustment in the process of the parameter increase and the parameter reduction is carried out, the stability detection duration can be shortened, the stability detection efficiency is improved, the parameter detection density is increased, the parameter change rate and the change distinctiveness in the process of the parameter increase and the reduction are effectively improved while the parameter detection density is ensured, and further the stability detection accuracy can be furthest improved under the condition of shortening the stability detection duration.
On the other hand, the first monitoring time and the second monitoring time obtained through the formula can be effectively combined with the actual condition and the parameter range of the operation input parameter to set the monitoring time, the reasonability of the setting of the monitoring time can be effectively improved, meanwhile, the stability detection time length with the lowest operation input parameter aiming at one integrated circuit chip can be definitely given, and then, indicative data can be given to the stability detection time of the integrated circuit chip, so that the balance among enough stability detection time, stability detection efficiency and stability detection accuracy can be realized, and the problem that the stability detection accuracy is reduced due to the fact that the stability detection time is too short is prevented from occurring. Therefore, the first monitoring time and the second monitoring time obtained through the formula can effectively improve the stability detection efficiency of the integrated circuit chip and can also effectively improve the stability detection accuracy of the integrated circuit chip.
An embodiment of the present invention provides a stability testing system based on an integrated circuit chip, and as shown in fig. 3, the stability testing system includes:
the acquisition module is used for acquiring two first reference measured signals with different values and two second reference measured signals with different values of the integrated circuit chip; wherein the first reference measured signal is one or more of the operating input condition parameters of the integrated circuit chip; the second reference measured signal is an output parameter signal corresponding to the operation input condition parameter;
the region determining module is used for testing and analyzing the first reference tested signal and the second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; wherein, a normal working area and an abnormal working area corresponding to the integrated circuit chip are displayed in the shmoo diagram;
the adjusting module is used for obtaining changed operation input condition parameters and corresponding output parameter signals by continuously adjusting the operation input condition parameters of the integrated circuit chip, and respectively taking the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group;
and the analysis module is used for analyzing the first monitoring signal group and the second monitoring signal group in real time and acquiring whether the positions of the signal sites of the first monitoring signal group and the second monitoring signal group on the shmoo graph are in a normal working area or not in real time.
The working principle of the technical scheme is as follows: firstly, two first reference measured signals with different values and two second reference measured signals with different values of the integrated circuit chip are obtained through an obtaining module; wherein the first reference measured signal is one or more of the operating input condition parameters of the integrated circuit chip; the second reference measured signal is an output parameter signal corresponding to the operation input condition parameter; then, a region determination module is used for testing and analyzing the first reference tested signal and the second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; wherein, a normal working area and an abnormal working area corresponding to the integrated circuit chip are displayed in the shmoo diagram; then, continuously adjusting the operation input condition parameters of the integrated circuit chip by adopting an adjusting module to obtain changed operation input condition parameters and corresponding output parameter signals, and respectively taking the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group; and finally, analyzing the first monitoring signal group and the second monitoring signal group in real time by using an analysis module, and acquiring whether the positions of the signal sites of the first monitoring signal group and the second monitoring signal group on the shmoo graph are in a normal working area or not in real time.
The effect of the above technical scheme is as follows: the stability test system based on the integrated circuit chip provided by the embodiment can detect the operation condition of the integrated circuit chip by the parameter conversion mode of different amplitude adjustments of the operation input parameters, can judge the operation stability of the integrated circuit chip to the maximum extent, and can improve the accuracy of the operation stability detection of the integrated circuit chip to the maximum extent in the limited chip detection time by the mode, thereby improving the yield detection and judgment of the integrated circuit chip. Meanwhile, the stability test of the integrated circuit chip is carried out in the parameter conversion mode, and the variability of the operation parameters in the detection process can ensure that the accuracy of the stability detection can be effectively ensured even if the stability detection time is shortened under the condition that the task amount of a product is increased rapidly, so that the stability detection efficiency of the integrated circuit chip is effectively improved.
In one embodiment of the present invention, the adjusting module includes:
the parameter adjusting module is used for continuously adjusting the operation input condition parameters of the integrated circuit chip according to the stability detection requirement of the integrated circuit chip and a signal adjusting rule;
the acquisition module is used for acquiring the adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip in real time;
and the signal group forming module is used for respectively forming a first monitoring signal group and a second monitoring signal group from the real-time adjusted operation input condition parameters and the output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip.
The working principle of the technical scheme is as follows: firstly, continuously adjusting the operation input condition parameters of the integrated circuit chip according to the stability detection requirement of the integrated circuit chip and a signal adjustment rule by a parameter adjustment module; then, acquiring the adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip in real time by using an acquisition module; and finally, respectively forming a first monitoring signal group and a second monitoring signal group by using the real-time adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip through a signal group forming module.
The effect of the above technical scheme is as follows: the operation state of the integrated circuit chip is detected in a parameter conversion mode of different amplitude adjustment of operation input parameters, the operation stability of the integrated circuit chip can be judged to the greatest extent, the accuracy of the operation stability detection of the integrated circuit chip can be improved to the greatest extent in the limited chip detection time through the mode, and then the yield detection and judgment of the integrated circuit chip are improved. Meanwhile, the stability test of the integrated circuit chip is carried out in the parameter conversion mode, and the variability of the operation parameters in the detection process can ensure that the accuracy of the stability detection can be effectively ensured even if the stability detection time is shortened under the condition that the task amount of a product is increased rapidly, so that the stability detection efficiency of the integrated circuit chip is effectively improved.
In an embodiment of the present invention, the parameter adjusting module includes:
the first adjusting module is used for continuously adjusting a data control signal of the integrated circuit chip according to a first signal adjusting rule when the integrated circuit chip detects the stability of the chip aiming at the working temperature and the rated range of the input parameter;
and the second adjusting module is used for continuously adjusting the data control signal of the integrated circuit chip according to a second signal adjusting rule when the integrated circuit chip needs to detect the stability of the chip aiming at the data control signal DQS.
The working principle of the technical scheme is as follows: firstly, continuously adjusting a data control signal of the integrated circuit chip according to a first signal adjustment rule when the integrated circuit chip detects the stability of the chip aiming at the working temperature and the rated range of input parameters through a first adjustment module; and then, continuously adjusting the data control signal of the integrated circuit chip according to a second signal adjustment rule when the integrated circuit chip needs to perform chip stability detection aiming at the data control signal DQS through a second adjustment module.
The effect of the above technical scheme is as follows: according to different operation input condition parameter properties, different data are adopted to adjust the crime rule, and the accuracy of the stability detection of the integrated circuit chip can be further effectively improved.
In an embodiment of the invention, the first signal adjustment rule is as follows:
when the stability detection of the integrated circuit chip is implemented according to the working temperature and the rated range of the input parameters, acquiring an upper limit value and a lower limit value corresponding to the operation input condition parameters of each type; then, the operation input condition parameters of each kind are adjusted in value according to a preset time interval, and the adjustment mode is as follows:
step 1, setting a first monitoring duration corresponding to a current operation input condition parameter to be tested according to an upper limit value and a lower limit value corresponding to the current operation input condition parameter to be tested;
step 2, keeping the numerical conditions of other operation input condition parameters except the operation input condition parameter of the current test unchanged, setting the operation input condition parameter according to the upper limit value, and enabling the integrated circuit chip to operate according to the upper limit value setting of the operation input condition parameter of the current test, wherein the operation time is the time length corresponding to the preset time interval;
step 3, after the preset time interval is reached, adjusting the integrated circuit chip to set operation input condition parameters according to the lower limit value to operate; after the time length corresponding to the preset time interval is set according to the lower limit value, the operation input condition parameters in each preset time interval are increased according to the parameter values corresponding to the lower limit values, the amplification of which is 0.3% -0.5% of each preset time interval, until the operation input condition parameters reach the upper limit values, and the operation input condition parameters in each preset time interval are reduced according to the parameter values corresponding to the upper limit values, the amplification of which is 0.8% -1.0% of each preset time interval, until the operation input condition parameters reach the lower limit values; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 4, after the operation input condition parameters reach the lower limit value, increasing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the lower limit value with the amplitude increased by 0.5% -0.8% in each preset time interval until the operation input condition parameters reach the upper limit value, and reducing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the upper limit value with the amplitude decreased by 0.95% -1.2% in each preset time interval until the operation input condition parameters reach the lower limit value; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 5, continuously repeating the execution contents of the steps 1 to 4, and adjusting corresponding values of the amplification and the attenuation within a given amplification and attenuation range until a first monitoring time length is reached;
and 6, sequentially carrying out operation stability test on each operation input condition parameter in the rated ranges of the working temperature and the input parameter according to the execution content of the steps 1 to 5.
The second signal adjustment rule is as follows: when the stability detection of the integrated circuit chip is realized only aiming at one operation input condition parameter in the data control signal DQS, the numerical values of other operation input condition parameters of the integrated control chip except the data control signal DQS are kept constant, and the state of the data control signal DQS is adjusted according to a preset time interval until the second monitoring time length. The state of the data control signal DQS includes a memory read-write state, an I/Q port read-write state, an interrupt request state, a reset signal state, a clock state, an interrupt response state, and the like.
The first monitoring time length and the second monitoring time length are obtained through the following formulas:
Figure 184678DEST_PATH_IMAGE004
Figure 334162DEST_PATH_IMAGE006
wherein,T 1andT 2respectively representing a first monitoring time length and a second monitoring time length;N 1andN 2respectively representing the number of detection criteria of the first monitoring period and the second monitoring period,N 1the value range of (A) is 500-1000,N 2the value range of (A) is 800-1500;C max andC min respectively representing an upper limit value and a lower limit value corresponding to the current running input condition parameter to be tested;f min representing the lowest adjusting range value corresponding to the amplifying range in the parameter adjusting process;T 0representing a preset time interval.
The working principle of the technical scheme is as follows: firstly, setting a first monitoring duration corresponding to a current operation input condition parameter to be tested according to an upper limit value and a lower limit value corresponding to the current operation input condition parameter to be tested; then, keeping the numerical conditions of other operation input condition parameters except the operation input condition parameter of the current test unchanged, setting the operation input condition parameter according to the upper limit value, and enabling the integrated circuit chip to operate according to the upper limit value setting of the operation input condition parameter of the current test, wherein the operation time is the time length corresponding to the preset time interval; then, after the preset time interval is reached, adjusting the integrated circuit chip to set operation input condition parameters according to the lower limit value to operate; after the time length corresponding to the preset time interval is set according to the lower limit value, the operation input condition parameters in each preset time interval are increased according to the parameter values corresponding to the lower limit values, the amplification of which is 0.3% -0.5% of each preset time interval, until the operation input condition parameters reach the upper limit values, and the operation input condition parameters in each preset time interval are reduced according to the parameter values corresponding to the upper limit values, the amplification of which is 0.8% -1.0% of each preset time interval, until the operation input condition parameters reach the lower limit values; then, after the operation input condition parameters reach the lower limit value, increasing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the lower limit value with the amplitude increased by 0.5% -0.8% in each preset time interval until the operation input condition parameters reach the upper limit value, and reducing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the upper limit value with the amplitude decreased by 0.95% -1.2% in each preset time interval until the operation input condition parameters reach the lower limit value; continuously repeating the execution content, and adjusting the corresponding values of the amplification and the attenuation in a given amplification and attenuation range until the first monitoring time length is reached; and finally, sequentially carrying out operation stability test on each operation input condition parameter in the rated ranges of the working temperature and the input parameter according to the debugging mode.
The effect of the above technical scheme is as follows: firstly, the operation state of the integrated circuit chip is detected by a parameter conversion mode of different amplitude adjustment of operation input parameters, the operation stability of the integrated circuit chip can be judged to the greatest extent, in addition, the accuracy of the operation stability detection of the integrated circuit chip can be improved to the greatest extent in the limited chip detection time by the mode, and further, the yield detection and the judgment of the integrated circuit chip are improved. Meanwhile, the stability test of the integrated circuit chip is carried out in the parameter conversion mode, and the variability of the operation parameters in the detection process can ensure that the accuracy of the stability detection can be effectively ensured even if the stability detection time is shortened under the condition that the task amount of a product is increased rapidly, so that the stability detection efficiency of the integrated circuit chip is effectively improved.
Secondly, through the range and the range of the amplification and the reduction, and the collocation setting of the amplitude and the reduction of the amplification and the reduction of the parameter, the operation input parameter adjustment in the process of the parameter increase and the parameter reduction is carried out, the stability detection duration can be shortened, the stability detection efficiency is improved, the parameter detection density is increased, the parameter change rate and the change distinctiveness in the process of the parameter increase and the reduction are effectively improved while the parameter detection density is ensured, and further the stability detection accuracy can be furthest improved under the condition of shortening the stability detection duration.
On the other hand, the first monitoring time and the second monitoring time obtained through the formula can be effectively combined with the actual condition and the parameter range of the operation input parameter to set the monitoring time, the reasonability of the setting of the monitoring time can be effectively improved, meanwhile, the stability detection time length with the lowest operation input parameter aiming at one integrated circuit chip can be definitely given, and then, indicative data can be given to the stability detection time of the integrated circuit chip, so that the balance among enough stability detection time, stability detection efficiency and stability detection accuracy can be realized, and the problem that the stability detection accuracy is reduced due to the fact that the stability detection time is too short is prevented from occurring. Therefore, the first monitoring time and the second monitoring time obtained through the formula can effectively improve the stability detection efficiency of the integrated circuit chip and can also effectively improve the stability detection accuracy of the integrated circuit chip.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.

Claims (10)

1. A stability test method based on an integrated circuit chip is characterized by comprising the following steps:
acquiring two first reference measured signals with different values and two second reference measured signals with different values of the integrated circuit chip; wherein the first reference measured signal is one or more of the operating input condition parameters of the integrated circuit chip; the second reference measured signal is an output parameter signal corresponding to the operation input condition parameter;
testing and analyzing the first reference tested signal and the second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; wherein, a normal working area and an abnormal working area corresponding to the integrated circuit chip are displayed in the shmoo diagram;
continuously adjusting the operation input condition parameters of the integrated circuit chip to obtain changed operation input condition parameters and corresponding output parameter signals, and respectively using the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group;
and analyzing the first monitoring signal group and the second monitoring signal group in real time, and acquiring whether the position of the signal site of the second monitoring signal group on the shmoo graph is in a normal working area or not in real time.
2. The stability testing method of claim 1, wherein obtaining varying operational input condition parameters and corresponding output parameter signals by continuously adjusting operational input condition parameters of the integrated circuit chip, the operational input condition parameters and corresponding output parameter signals being respectively used as a first monitoring signal group and a second monitoring signal group, comprises:
continuously adjusting the operation input condition parameters of the integrated circuit chip according to the stability detection requirement of the integrated circuit chip and a signal adjustment rule;
acquiring adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip in real time;
and respectively forming a first monitoring signal group and a second monitoring signal group by using the real-time adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip.
3. The stability testing method of claim 2, wherein continuously adjusting the data control signal of the integrated circuit chip according to the signal adjustment rule according to the stability testing requirement of the integrated circuit chip comprises:
the operation input condition parameters comprise the working temperature of the integrated circuit chip, the rated range of the input parameters and a data control signal DQS;
when the integrated circuit chip detects the stability of the chip aiming at the rated ranges of the working temperature and the input parameters, the data control signal of the integrated circuit chip is continuously adjusted according to a first signal adjustment rule;
and when the integrated circuit chip needs to detect the chip stability aiming at the data control signal DQS, continuously adjusting the data control signal of the integrated circuit chip according to a second signal adjustment rule.
4. The stability testing method of claim 3, wherein the first signal adjustment rule is as follows:
when the stability detection of the integrated circuit chip is implemented according to the working temperature and the rated range of the input parameters, acquiring an upper limit value and a lower limit value corresponding to the operation input condition parameters of each type; then, the operation input condition parameters of each kind are adjusted in value according to a preset time interval, and the adjustment mode is as follows:
step 1, setting a first monitoring duration corresponding to a current operation input condition parameter to be tested according to an upper limit value and a lower limit value corresponding to the current operation input condition parameter to be tested;
step 2, keeping the numerical conditions of other operation input condition parameters except the operation input condition parameter of the current test unchanged, setting the operation input condition parameter according to the upper limit value, and enabling the integrated circuit chip to operate according to the upper limit value setting of the operation input condition parameter of the current test, wherein the operation time is the time length corresponding to the preset time interval;
step 3, after the preset time interval is reached, adjusting the integrated circuit chip to set operation input condition parameters according to the lower limit value to operate; after the time length corresponding to the preset time interval is set according to the lower limit value, the operation input condition parameters in each preset time interval are increased according to the parameter values corresponding to the lower limit values, the amplification of which is 0.3% -0.5% of each preset time interval, until the operation input condition parameters reach the upper limit values, and the operation input condition parameters in each preset time interval are reduced according to the parameter values corresponding to the upper limit values, the amplification of which is 0.8% -1.0% of each preset time interval, until the operation input condition parameters reach the lower limit values; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 4, after the operation input condition parameters reach the lower limit value, increasing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the lower limit value with the amplitude increased by 0.5% -0.8% in each preset time interval until the operation input condition parameters reach the upper limit value, and reducing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the upper limit value with the amplitude decreased by 0.95% -1.2% in each preset time interval until the operation input condition parameters reach the lower limit value; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 5, continuously repeating the execution contents of the steps 1 to 4, and adjusting corresponding values of the amplification and the attenuation within a given amplification and attenuation range until a first monitoring time length is reached;
and 6, sequentially carrying out operation stability test on each operation input condition parameter in the rated ranges of the working temperature and the input parameter according to the execution content of the steps 1 to 5.
5. The stability testing method of claim 3, wherein the second signal adjustment rule is as follows: when the stability detection of the integrated circuit chip is realized only aiming at one operation input condition parameter in the data control signal DQS, the numerical values of other operation input condition parameters of the integrated control chip except the data control signal DQS are kept constant, and the state of the data control signal DQS is adjusted according to a preset time interval until the second monitoring time length.
6. An integrated circuit chip based stability test system, the stability test system comprising:
the acquisition module is used for acquiring two first reference measured signals with different values and two second reference measured signals with different values of the integrated circuit chip; wherein the first reference measured signal is one or more of the operating input condition parameters of the integrated circuit chip; the second reference measured signal is an output parameter signal corresponding to the operation input condition parameter;
the region determining module is used for testing and analyzing the first reference tested signal and the second reference tested signal with different values to obtain a shmoo graph corresponding to the integrated circuit chip; wherein, a normal working area and an abnormal working area corresponding to the integrated circuit chip are displayed in the shmoo diagram;
the adjusting module is used for obtaining changed operation input condition parameters and corresponding output parameter signals by continuously adjusting the operation input condition parameters of the integrated circuit chip, and respectively taking the operation input condition parameters and the corresponding output parameter signals as a first monitoring signal group and a second monitoring signal group;
and the analysis module is used for analyzing the first monitoring signal group and the second monitoring signal group in real time and acquiring whether the positions of the signal sites of the first monitoring signal group and the second monitoring signal group on the shmoo graph are in a normal working area or not in real time.
7. The stability testing system of claim 6, wherein the adjustment module comprises:
the parameter adjusting module is used for continuously adjusting the operation input condition parameters of the integrated circuit chip according to the stability detection requirement of the integrated circuit chip and a signal adjusting rule;
the acquisition module is used for acquiring the adjusted operation input condition parameters and output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip in real time;
and the signal group forming module is used for respectively forming a first monitoring signal group and a second monitoring signal group from the real-time adjusted operation input condition parameters and the output parameter signals corresponding to the operation input condition parameters on the integrated circuit chip.
8. The stability testing system of claim 7, wherein the parameter adjustment module comprises:
the first adjusting module is used for continuously adjusting a data control signal of the integrated circuit chip according to a first signal adjusting rule when the integrated circuit chip detects the stability of the chip aiming at the working temperature and the rated range of the input parameter;
and the second adjusting module is used for continuously adjusting the data control signal of the integrated circuit chip according to a second signal adjusting rule when the integrated circuit chip needs to detect the stability of the chip aiming at the data control signal DQS.
9. The stability testing system of claim 8, wherein the first signal adjustment rule is as follows:
when the stability detection of the integrated circuit chip is implemented according to the working temperature and the rated range of the input parameters, acquiring an upper limit value and a lower limit value corresponding to the operation input condition parameters of each type; then, the operation input condition parameters of each kind are adjusted in value according to a preset time interval, and the adjustment mode is as follows:
step 1, setting a first monitoring duration corresponding to a current operation input condition parameter to be tested according to an upper limit value and a lower limit value corresponding to the current operation input condition parameter to be tested;
step 2, keeping the numerical conditions of other operation input condition parameters except the operation input condition parameter of the current test unchanged, setting the operation input condition parameter according to the upper limit value, and enabling the integrated circuit chip to operate according to the upper limit value setting of the operation input condition parameter of the current test, wherein the operation time is the time length corresponding to the preset time interval;
step 3, after the preset time interval is reached, adjusting the integrated circuit chip to set operation input condition parameters according to the lower limit value to operate; after the time length corresponding to the preset time interval is set according to the lower limit value, the operation input condition parameters in each preset time interval are increased according to the parameter values corresponding to the lower limit values, the amplification of which is 0.3% -0.5% of each preset time interval, until the operation input condition parameters reach the upper limit values, and the operation input condition parameters in each preset time interval are reduced according to the parameter values corresponding to the upper limit values, the amplification of which is 0.8% -1.0% of each preset time interval, until the operation input condition parameters reach the lower limit values; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 4, after the operation input condition parameters reach the lower limit value, increasing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the lower limit value with the amplitude increased by 0.5% -0.8% in each preset time interval until the operation input condition parameters reach the upper limit value, and reducing the operation input condition parameters in each preset time interval according to the parameter value corresponding to the upper limit value with the amplitude decreased by 0.95% -1.2% in each preset time interval until the operation input condition parameters reach the lower limit value; wherein, the amplitude multiples of the amplification or the reduction in every two adjacent preset time intervals are different;
step 5, continuously repeating the execution contents of the steps 1 to 4, and adjusting corresponding values of the amplification and the attenuation within a given amplification and attenuation range until a first monitoring time length is reached;
and 6, sequentially carrying out operation stability test on each operation input condition parameter in the rated ranges of the working temperature and the input parameter according to the execution content of the steps 1 to 5.
10. The stability testing system of claim 8, wherein the second signal adjustment rule is as follows: when the stability detection of the integrated circuit chip is realized only aiming at one operation input condition parameter in the data control signal DQS, the numerical values of other operation input condition parameters of the integrated control chip except the data control signal DQS are kept constant, and the state of the data control signal DQS is adjusted according to a preset time interval until the second monitoring time length.
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