CN106932700A - The opto-electronic device DC performance test system of transistor outline package - Google Patents
The opto-electronic device DC performance test system of transistor outline package Download PDFInfo
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- CN106932700A CN106932700A CN201710206776.2A CN201710206776A CN106932700A CN 106932700 A CN106932700 A CN 106932700A CN 201710206776 A CN201710206776 A CN 201710206776A CN 106932700 A CN106932700 A CN 106932700A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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Abstract
The present invention proposes a kind of opto-electronic device DC performance test system of transistor outline package, including：Dc source；Multi-channel control plate, its input is connected to dc source, and multi-channel control plate includes multiple passages；Multi-channel test plate, it is connected with multi-channel control plate, opto-electronic device for assembling multiple transistor outline packages to be tested, so that the corresponding passage of each opto-electronic device is connected, multiple passages are in turn switched on, when any passage is connected, dc source is by the passage of connection for its corresponding opto-electronic device provides electric signal；And device for detecting performance parameter, multi-channel control plate and/or multi-channel test plate are connected to, the DC performance parameter of the corresponding opto-electronic device of the passage for detecting with connect.By technical scheme, the testing efficiency and accuracy rate of the opto-electronic device of transistor outline package can be improved, while avoiding the high cost of the opto-electronic device DC performance test system of transistor outline package.
Description
Technical field
The present invention relates to opto-electronic device technical field of measurement and test, in particular to the photoelectron of transistor outline package
Device DC performance test system.
Background technology
The DC performance of the opto-electronic device of transistor outline package is main by following parameter characterization：Dark current, breakdown potential
Pressure, operating current, two-port quiescent output voltage etc..In the prior art, by following two modes come test light electronics device
The performance of part, the first is single only test, and the opto-electronic device DC performance test system of transistor outline package is straight by voltage stabilizing
Opto-electronic device to be tested is first inserted into list by the compositions such as stream power supply, pico-ampere table, universal meter and single-path testing plate, tester
In the jack of drive test test plate (panel), it is powered manually, manual record data again extract opto-electronic device from jack after the completion of test.
This method testing efficiency is low, test intensity is big, large-scale production cannot be met the need for.Second is multi-channel test, crystal
Multi-channel test plate is used in the opto-electronic device DC performance test system of pipe outline packages, has been devised on multi-channel test plate specially
Testing weld pad, by software movable mechanical arm, mechanical arm is surveyed with docking for testing weld pad so as to realize that single channel is powered
Examination, the making required precision of the opto-electronic device DC performance test system of this transistor outline package to fixture is high, while
As a result of mechanical mobile device, its system building needs high expense, and regular maintenance cost is high.
Therefore, the testing efficiency and test accuracy of the opto-electronic device of transistor outline package how are improved, while keeping away
The high cost for exempting from the opto-electronic device DC performance test system of transistor outline package turns into technical problem urgently to be resolved hurrily.
The content of the invention
The present invention is based on above mentioned problem, it is proposed that a kind of new technical scheme, can solve the crystalline substance in correlation technique
The testing efficiency of the opto-electronic device of body pipe outline packages is low, low and transistor outline package the opto-electronic device direct current of the degree of accuracy
The technical problem of the high cost of Performance Test System.
In view of this, the first aspect of the present invention proposes a kind of opto-electronic device DC performance of transistor outline package
Test system, including：Dc source；Multi-channel control plate, its input is connected to the dc source, the multi-channel control plate bag
Include multiple passages；Multi-channel test plate, is connected with the multi-channel control plate, for assembling multiple transistor outline packages to be tested
Opto-electronic device so that the corresponding passage of each described opto-electronic device be connected, multiple passages connect successively
Logical, when any passage is connected, the dc source is its corresponding described photoelectron device by the passage connected
Part provides electric signal；And device for detecting performance parameter, the multi-channel control plate and/or the multi-channel test plate are connected to, use
In the DC performance parameter of the detection opto-electronic device corresponding with the passage connected.
In the technical scheme, the opto-electronic device of multiple transistor outline packages to be tested is assembled in multi-channel test
On plate, each opto-electronic device is connected with a passage of multi-channel control plate, and when any passage is connected, dc source is the passage
Corresponding opto-electronic device provides electric signal, so that device for detecting performance parameter detects the DC performance of the opto-electronic device
Parameter.Therefore, it can in turn switch on multiple passages of multi-channel control plate, with realize it is multiple it is above-mentioned in opto-electronic device successively
Test.By above technical scheme, due to the photoelectron of multiple transistor outline packages can be assembled on a multi-channel test plate
Device, therefore, it can substantially increase the testing efficiency and test accuracy rate of the opto-electronic device of transistor outline package, meet
The demand of large-scale production.And the performance test for using mechanical arm to participate in opto-electronic device is avoided, so as to avoid crystalline substance
The high cost of the opto-electronic device DC performance test system of body pipe outline packages, reduces being produced into for opto-electronic device
This.
In the above-mentioned technical solutions, it is preferable that also include：Terminal, is connected to the dc source, the multi-channel control plate
With the device for detecting performance parameter, the terminal is for controlling the dc source output electric signal, control multiple described logical
Road in turn switches on and reads and store the DC performance parameter that the device for detecting performance parameter is detected.
In the technical scheme, it is controlled by terminal-pair dc source, multi-channel control plate and multi-channel test plate, is reduced
The step of DC performance that user participates in the opto-electronic device of transistor outline package is tested, further increasing transistor
The efficiency and accuracy rate of the opto-electronic device performance test of outline packages.In addition, being read by terminal and storing what is detected
DC performance parameter, it is to avoid manual record testing result, the opto-electronic device that meets transistor outline package is surveyed on a large scale
The demand of examination.
In any of the above-described technical scheme, it is preferable that the multi-channel control plate includes：Multiple electromagnetic relays, with multiple
The passage is corresponded, the terminal controlled by controlling the switch of each electromagnetic relay it is corresponding described in
Passage is switched on and off.
In the technical scheme, each passage one electromagnetic relay of correspondence, to control correspondence by electromagnetic relay
Passage is switched on and off, so as to realizing the survey successively of the opto-electronic device of the multiple transistor outline packages on multi-channel test plate
Examination.
In any of the above-described technical scheme, it is preferable that the device for detecting performance parameter includes one below or various
Combination：Ammeter, pico-ampere table, universal meter, the pico-ampere table are used to read the photoelectron corresponding with the passage connected
The dark current of device, the ammeter is used to read the work electricity of the opto-electronic device corresponding with the passage connected
Stream, the universal meter is used to read the quiescent output voltage of the opto-electronic device corresponding with the passage connected.
In the technical scheme, the dark current of opto-electronic device is read by pico-ampere table, ammeter reads opto-electronic device
Operating current, universal meter read opto-electronic device quiescent output voltage, so as to realize the performance test of opto-electronic device.
In any of the above-described technical scheme, it is preferable that the precision of the pico-ampere table is pico-ampere level.
In the technical scheme, the precision of pico-ampere table is pico-ampere level, it is ensured that the test of the dark current of opto-electronic device
Accuracy.
In any of the above-described technical scheme, it is preferable that by shielding line by the pico-ampere table and the multi-channel control plate phase
Even, and/or the pico-ampere table is connected with the multi-channel test plate by shielding line.
In any of the above-described technical scheme, it is preferable that the dc source can export two-way electric signal, all the way electric signal
Export and come to provide reverse bias voltage or reverse for the optical chip of the opto-electronic device to the optical chip of the opto-electronic device
Bias current, another road electric signal output to be the opto-electronic device across resistance to the trans-impedance amplifier of the opto-electronic device
Amplifier provides operating voltage.
In the technical scheme, dc source can export two-way electric signal, it is to avoid use two independent dc sources
The optical chip and trans-impedance amplifier of respectively opto-electronic device are powered, so that the opto-electronic device of transistor outline package is straight
The design for flowing Performance Test System is more reasonable, and the opto-electronic device DC performance for further reducing transistor outline package is surveyed
The cost of test system.
In any of the above-described technical scheme, it is preferable that the dc source is program controllable power.
In the technical scheme, dc source is program controllable power, i.e., can be to dc source by software program
It is controlled, it is to avoid artificial control dc source, it is to avoid in the artificial performance test for participating in opto-electronic device too much, from
And cause that the opto-electronic device DC performance test system of transistor outline package is easily operated.
In any of the above-described technical scheme, it is preferable that a multi-channel control plate connects a multi-channel test plate,
Or a multi-channel control plate connects multiple multi-channel test plates.
In the technical scheme, a multi-channel control plate can connect a multi-channel test plate, it is also possible to which connection is multiple more
Drive test test plate (panel), so as to meet the demand of the opto-electronic device large scale test of transistor outline package.
In any of the above-described technical scheme, it is preferable that by winding displacement by the dc source and the multi-channel control plate phase
Even, and the multi-channel control plate is connected with the multi-channel test plate by winding displacement.
By technical scheme, testing efficiency and the survey of the opto-electronic device of transistor outline package can be improved
Examination accuracy rate, while avoiding the high cost of the opto-electronic device DC performance test system of transistor outline package.
Brief description of the drawings
Fig. 1 shows that the opto-electronic device DC performance of transistor outline package according to an embodiment of the invention is surveyed
The structural representation of test system；
Fig. 2 shows the opto-electronic device DC performance of transistor outline package according to another embodiment of the invention
The structural representation of test system；
Fig. 3 shows the structure connected between multi-channel control plate according to an embodiment of the invention and multi-channel test plate
Schematic diagram.
Specific embodiment
It is below in conjunction with the accompanying drawings and specific real in order to the above objects, features and advantages of the present invention can be more clearly understood that
Mode is applied to be further described in detail the present invention.It should be noted that in the case where not conflicting, the implementation of the application
Feature in example and embodiment can be mutually combined.
Many details are elaborated in the following description in order to fully understand the present invention, but, the present invention may be used also
Implemented with being different from other modes described here using other, therefore, protection scope of the present invention is not by described below
Specific embodiment limitation.
Fig. 1 shows that the opto-electronic device DC performance of transistor outline package according to an embodiment of the invention is surveyed
The structural representation of test system.
As shown in figure 1, the opto-electronic device DC performance of transistor outline package according to an embodiment of the invention
Test system 100, including：Dc source 102；Multi-channel control plate 104, its input is connected to dc source 102, multi-channel control
Plate 104 includes multiple passages；Multi-channel test plate 106, is connected with multi-channel control plate 104, for assembling multiple crystal to be tested
The opto-electronic device of pipe outline packages, so that the corresponding passage of each opto-electronic device is connected, multiple passages are in turn switched on,
When any passage is connected, dc source 102 is by the passage of connection for its corresponding opto-electronic device provides electric signal；And
Device for detecting performance parameter 108, is connected to multi-channel control plate 104 and/or multi-channel test plate 106, logical for what is detected and connect
The DC performance parameter of the corresponding opto-electronic device in road.
In the technical scheme, the opto-electronic device of multiple transistor outline packages to be tested is assembled in multi-channel test
On plate 106, each opto-electronic device is connected with a passage of multi-channel control plate 104 after assembling, when any passage is connected, direct current
Power supply provides electric signal for the corresponding opto-electronic device of the passage, so that device for detecting performance parameter 108 detects the photoelectricity
The DC performance parameter of sub- device.Therefore, it can in turn switch on multiple passages of multi-channel control plate 104, it is multiple above-mentioned to realize
In opto-electronic device test successively.By above technical scheme, due to multiple can be assembled on a multi-channel test plate 106
The opto-electronic device of transistor outline package, therefore, it can substantially increase the survey of the opto-electronic device of transistor outline package
Examination efficiency and test accuracy rate, meet the demand of large-scale production.And avoid using mechanical arm to participate in opto-electronic device
Performance test, so as to avoid the high cost of the opto-electronic device DC performance test system 100 of transistor outline package,
Reduce the production cost of the opto-electronic device of transistor outline package.
It is understood that dc source 102 can export two-way electric signal, electric signal output is to opto-electronic device all the way
Optical chip to provide reverse bias voltage or reverse biased current, another road electric signal output for the optical chip of opto-electronic device
Come to provide operating voltage for the trans-impedance amplifier of opto-electronic device to the trans-impedance amplifier of opto-electronic device.
It is understood that dc source 102 is program controllable power.
It is understood that a multi-channel control plate 104 connects a multi-channel test plate 106, or a multi-channel control
Plate 104 connects multiple multi-channel test plates 106.
It is understood that dc source 102 is connected with multi-channel control plate 104 by winding displacement, and will by winding displacement
Multi-channel control plate 104 is connected with multi-channel test plate 106.
Fig. 2 shows the opto-electronic device DC performance of transistor outline package according to another embodiment of the invention
The structural representation of test system 100.
As shown in Fig. 2 the opto-electronic device of transistor outline package according to another embodiment of the invention is galvanic
Energy test system 100, including：Dc source 102；Multi-channel control plate 104, its input is connected to dc source 102, multichannel control
Making sheet 104 includes multiple passages, and multi-channel test plate 106 is connected with multi-channel control plate 104, and the multiple for assembling to be tested is brilliant
The opto-electronic device of body pipe outline packages, so that the corresponding passage of each opto-electronic device is connected, multiple passages connect successively
Logical, when any passage is connected, dc source 102 is by the passage of connection for its corresponding opto-electronic device provides electric signal；
And device for detecting performance parameter 108, multi-channel control plate 104 and/or multi-channel test plate 106 are connected to, for detecting and connecting
The corresponding opto-electronic device of passage DC performance parameter.
In addition, the opto-electronic device DC performance test system 100 of transistor outline package also includes：Terminal 110, connection
To dc source 102, multi-channel control plate 104 and device for detecting performance parameter, terminal 110 is used to control dc source 102 to export
Electric signal, the multiple passages of control in turn switching on and read and DC performance ginseng that storage performance parameter detection device is detected
Number.Device for detecting performance parameter includes one below or various combinations：Ammeter 1082, pico-ampere table 1084, universal meter 1086,
Pico-ampere table 1084 is used to read the dark current of opto-electronic device corresponding with the passage connected, and ammeter 1082 is used to read and connect
The operating current of the corresponding opto-electronic device of logical passage, universal meter 1086 is used to read photoelectron corresponding with the passage connected
The quiescent output voltage of device.
In the technical scheme, the opto-electronic device of multiple transistor outline packages to be tested is assembled in multi-channel test
On plate 106, each opto-electronic device is connected with a passage of multi-channel control plate 104 after assembling, when any passage is connected, direct current
Power supply provides electric signal for the corresponding opto-electronic device of the passage, so that device for detecting performance parameter 108 detects the photoelectricity
The DC performance parameter of sub- device.Therefore, it can in turn switch on multiple passages of multi-channel control plate 104, it is multiple above-mentioned to realize
In opto-electronic device test successively.By above technical scheme, due to multiple can be assembled on a multi-channel test plate 106
The opto-electronic device of transistor outline package, therefore, it can substantially increase the survey of the opto-electronic device of transistor outline package
Examination efficiency and test accuracy rate, meet the demand of large-scale production.And avoid using mechanical arm to participate in opto-electronic device
Performance test, so as to avoid the high cost of the opto-electronic device DC performance test system 100 of transistor outline package,
Reduce the production cost of the opto-electronic device of transistor outline package.In addition, by terminal 110 to dc source 102, multichannel
Control panel 104 and multi-channel test plate 106 are controlled, reduce user participate in transistor outline package opto-electronic device it is straight
The step of stream performance test, further increasing the efficiency and accuracy rate of DC performance test.In addition, by terminal 110 come
Read and the DC performance parameter that detects of storage, it is to avoid manual record testing result, meet transistor outline package
The demand of opto-electronic device large scale test.
It is understood that multi-channel control plate 104 includes：Multiple electromagnetic relays, correspond, terminal with multiple passages
110 control being switched on and off for corresponding passage by controlling the switch of each electromagnetic relay.
Each passage one electromagnetic relay of correspondence, to control connection and the pass of respective channel by electromagnetic relay
Close, so as to realize the test successively of the multiple opto-electronic devices on multi-channel test plate 106.The quantity of electromagnetic relay is many drive tests
The integral multiple of the jack total quantity on test plate (panel) 106.For example, having 64 jacks, the quantity of electromagnetic relay on multi-channel test plate 106
It is 64,128 etc..So, one or more multi-channel test plates 106 can are connected on a multi-channel control plate 104.
It is understood that the precision of pico-ampere table 1084 is pico-ampere level.
The precision of pico-ampere table 1084 is pico-ampere level, it is ensured that the test accuracy of the dark current of opto-electronic device.
It is understood that pico-ampere table 1084 is connected with multi-channel control plate 104 by shielding line, pico-ampere table 1084 with
In the case that multi-channel test plate 106 is connected, pico-ampere table 1084 is connected with multi-channel test plate 106 by shielding line.
It is understood that dc source 102 can export two-way electric signal, electric signal output is to opto-electronic device all the way
Optical chip to provide reverse bias voltage or reverse biased current, another road electric signal output for the optical chip of opto-electronic device
Come to provide operating voltage for the trans-impedance amplifier of opto-electronic device to the trans-impedance amplifier of opto-electronic device.
For example, opto-electronic device has five leads, wherein, first lead is the trans-impedance amplifier inside opto-electronic device
Operating voltage, generally 3.3V or 5V are provided；Second lead provides reverse bias for the optical chip inside opto-electronic device
Voltage, if optical chip is PIN photodiode, the reverse bias voltage of second lead offer is 5V；If optical chip is snow
Avalanche photo diode, then the reverse bias voltage of second lead offer is 0.9 times of the breakdown voltage of avalanche photodide.
Meanwhile, second lead also has a kind of definition, i.e. monitor current pin, and the operating voltage of optical chip is amplified by across resistance in such cases
Device is provided.3rd lead and the 4th lead are electric signal difference output pin, and the 5th lead is grounding leg.
Dc source 102 can export two-way electric signal, it is to avoid be respectively photoelectricity using two independent dc sources 102
The optical chip and trans-impedance amplifier of sub- device are powered, so that the opto-electronic device DC performance test of transistor outline package
The design of system 100 is more reasonable, further reduces the opto-electronic device DC performance test system of transistor outline package
100 cost.
It is understood that dc source 102 is program controllable power.
Dc source 102 is program controllable power, i.e., dc source 102 can be controlled by software program,
Avoid artificial control dc source 102, it is to avoid in the artificial performance test for participating in opto-electronic device too much, so that
The opto-electronic device DC performance test system 100 of transistor outline package is easily operated.
It is understood that a multi-channel control plate 104 connects a multi-channel test plate 106, or a multi-channel control
Plate 104 connects multiple multi-channel test plates 106.As shown in figure 3, a multi-channel control plate 104 connects two multi-channel test plates 106,
Each multi-channel test plate 106 one universal meter 1086 of correspondence, to detect the quiet of the opto-electronic device on multi-channel test plate 106 respectively
State output voltage.
One multi-channel control plate 104 can connect a multi-channel test plate 106, it is also possible to the multiple multi-channel test plates of connection
106, so as to meet the demand of opto-electronic device large scale test.
It is understood that dc source 102 is connected with multi-channel control plate 104 by winding displacement, and will by winding displacement
Multi-channel control plate 104 is connected with multi-channel test plate 106.
Further illustrate how to use the opto-electronic device DC performance of transistor outline package to test with reference to Fig. 2
System 100 is tested.Wherein, there are three test links, represented with heavy line, fine line, dotted line respectively.
After be assembled to the opto-electronic device of multiple transistor outline packages on multi-channel test plate 106 by tester, will
Multi-channel test plate 106 links together with multi-channel control plate 104, clicks on the software test automatic running in terminal 110.Specifically
Ground, any passage of the control multi-channel control of terminal 110 plate 104 is connected, the dark electricity of opto-electronic device corresponding with the passage connected
Stream, breakdown voltage complete test in solid wired link, and its step is：
Step one, 10 microamperes of current signal is exported by dc source 102, and any passage of multi-channel control plate 104 is connected,
The magnitude of voltage that universal meter 1086 reads is the breakdown voltage of opto-electronic device corresponding with the passage connected.
Step 2, by the output voltage signal of dc source 102, the numerical value for reading pico-ampere table 1084 is and the passage connected
The dark current of corresponding opto-electronic device.
The operating current of opto-electronic device corresponding with the passage connected completes test in dotted line link, by dc source
102 voltage signals for providing 3.3V or 5V, the numerical value for reading ammeter 1082 is photoelectron device corresponding with the passage connected
The operating current of part.
The quiescent output voltage of opto-electronic device corresponding with the passage connected completes test, the chain in fine line link
Need to use two universal meters 1086 in road, respectively read quiescent output voltage just, quiescent output voltage bear.Concretely comprise the following steps,
Two-way voltage signal is provided by dc source 102, is added on the optical chip of opto-electronic device all the way, another road is added to photoelectron device
On the trans-impedance amplifier of part, on two universal meters 1086 numerical value be respectively quiescent output voltage just, quiescent output voltage bear.
Multiple passages of multi-channel control plate 104 are connected and in turn switched on, and after each passage is connected, are come according to above scheme
Test the performance parameter of the corresponding opto-electronic device of each passage.After test terminates, display circle that tester passes through terminal 110
The instruction in face, certified products are separated with defective products.
Technical scheme is described in detail above in association with accompanying drawing, by technical scheme, can improve
The testing efficiency and test accuracy rate of the opto-electronic device of transistor outline package, while avoiding the photoelectricity of transistor outline package
The high cost of sub- device DC performance test system.
In the present invention, term " first ", " second " are only used for the purpose for describing, and it is not intended that indicating or implying phase
To importance；Term " multiple " represents two or more；Term " connected ", " connection " etc. all should be interpreted broadly, for example,
Can be fixedly connected, or be detachably connected, or be integrally connected；Can be joined directly together, it is also possible to by centre
Medium is indirectly connected to.For the ordinary skill in the art, can as the case may be understand above-mentioned term in this hair
Concrete meaning in bright.
The preferred embodiments of the present invention are the foregoing is only, is not intended to limit the invention, for the skill of this area
For art personnel, the present invention can have various modifications and variations.It is all within the spirit and principles in the present invention, made any repair
Change, equivalent, improvement etc., should be included within the scope of the present invention.
Claims (10)
1. the opto-electronic device DC performance test system of a kind of transistor outline package, it is characterised in that including：
Dc source；
Multi-channel control plate, its input is connected to the dc source, and the multi-channel control plate includes multiple passages；
Multi-channel test plate, is connected with the multi-channel control plate, the photoelectricity for assembling multiple transistor outline packages to be tested
Sub- device so that the corresponding passage of each described opto-electronic device be connected, multiple passages are in turn switched on, when appoint
When passage described in is connected, the dc source is by the passage of connection for its corresponding described opto-electronic device provides electricity
Signal；And
Device for detecting performance parameter, is connected to the multi-channel control plate and/or the multi-channel test plate, for what is detected and connect
The DC performance parameter of the corresponding opto-electronic device of the passage.
2. the opto-electronic device DC performance test system of transistor outline package according to claim 1, its feature exists
In also including：
Terminal, is connected to the dc source, the multi-channel control plate and the device for detecting performance parameter, and the terminal is used for
Control dc source output electric signal, control in turn switching on and read and store the performance and joining for multiple passages
The DC performance parameter that number detection means is detected.
3. the opto-electronic device DC performance test system of transistor outline package according to claim 2, its feature exists
In the multi-channel control plate includes：
Multiple electromagnetic relays, correspond with multiple passages, and the terminal is by controlling each described electromagnetic relay
Switch control being switched on and off for the corresponding passage.
4. the opto-electronic device DC performance test system of transistor outline package according to claim 1, its feature exists
In,
The device for detecting performance parameter includes one below or various combinations：Ammeter, pico-ampere table, universal meter,
The pico-ampere table is used to read the dark current of the opto-electronic device corresponding with the passage connected, the ammeter
The operating current of the corresponding opto-electronic device of the passage for reading with connect, the universal meter is used to read and connect
The quiescent output voltage of the corresponding opto-electronic device of the logical passage.
5. the opto-electronic device DC performance test system of transistor outline package according to claim 4, its feature exists
In,
The precision of the pico-ampere table is pico-ampere level.
6. the opto-electronic device DC performance test system of transistor outline package according to claim 4, its feature exists
In,
The pico-ampere table is connected with the multi-channel control plate by shielding line, and/or by shielding line by the pico-ampere table and
The multi-channel test plate is connected.
7. the opto-electronic device DC performance of transistor outline package according to any one of claim 1 to 6 tests system
System, it is characterised in that
The dc source can export two-way electric signal, all the way electric signal output to the opto-electronic device optical chip come for
The optical chip of the opto-electronic device provides reverse bias voltage or reverse biased current, and another road electric signal output gives the light
The trans-impedance amplifier of electronic device to provide operating voltage for the trans-impedance amplifier of the opto-electronic device.
8. the opto-electronic device DC performance of transistor outline package according to any one of claim 1 to 6 tests system
System, it is characterised in that
The dc source is program controllable power.
9. the opto-electronic device DC performance of transistor outline package according to any one of claim 1 to 6 tests system
System, it is characterised in that
One multi-channel control plate connects a multi-channel test plate, or the multiple institutes of multi-channel control plate connection
State multi-channel test plate.
10. the opto-electronic device DC performance of transistor outline package according to any one of claim 1 to 6 tests system
System, it is characterised in that
The dc source is connected with the multi-channel control plate by winding displacement, and by winding displacement by the multi-channel control plate with
The multi-channel test plate is connected.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108828383A (en) * | 2018-08-13 | 2018-11-16 | 深圳市亚派光电器件有限公司 | Photoelectric cell test macro and method |
| CN110907787A (en) * | 2018-09-17 | 2020-03-24 | 国网浙江省电力公司 | IGCT drive circuit high-temperature characteristic batch detection device and method |
| CN112461506A (en) * | 2021-01-28 | 2021-03-09 | 深圳市迅特通信技术股份有限公司 | Automatic test circuit for multipath APD and PIN light receiving device |
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