CN206832945U - The opto-electronic device DC performance test system of transistor outline package - Google Patents
The opto-electronic device DC performance test system of transistor outline package Download PDFInfo
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- CN206832945U CN206832945U CN201720336101.5U CN201720336101U CN206832945U CN 206832945 U CN206832945 U CN 206832945U CN 201720336101 U CN201720336101 U CN 201720336101U CN 206832945 U CN206832945 U CN 206832945U
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Abstract
The utility model proposes a kind of opto-electronic device DC performance test system of transistor outline package, including：Dc source；Multi-channel control plate, its input are connected to dc source, and multi-channel control plate includes multiple passages；Multi-channel test plate, it is connected with multi-channel control plate, for assembling the opto-electronic device of multiple transistor outline packages to be tested, so that each corresponding passage of opto-electronic device is connected, multiple passages in turn switch on, when any passage is connected, dc source provides electric signal by the passage of connection for its corresponding opto-electronic device；And device for detecting performance parameter, multi-channel control plate and/or multi-channel test plate are connected to, the DC performance parameter of the corresponding opto-electronic device of the passage for detecting with connecting.By the technical solution of the utility model, the testing efficiency and accuracy rate of the opto-electronic device of transistor outline package can be improved, while avoids the cost of the opto-electronic device DC performance test system of transistor outline package too high.
Description
Technical field
Opto-electronic device technical field of measurement and test is the utility model is related to, in particular to the light of transistor outline package
Electronic device DC performance test system.
Background technology
The DC performance of the opto-electronic device of transistor outline package is mainly by following parameter characterization：Dark current, breakdown potential
Pressure, operating current, two-port quiescent output voltage etc..In the prior art, by following two modes come test light electronics device
The performance of part, the first is that single only test, the opto-electronic device DC performance test system of transistor outline package are straight by voltage stabilizing
The composition such as power supply, pico-ampere table, universal meter and single-path testing plate is flowed, opto-electronic device to be tested is first inserted into list by tester
In the jack of drive test test plate (panel), it is powered, manual record data, again extracts opto-electronic device out of jack after the completion of test manually.
This method testing efficiency is low, test intensity is big, can not meet the needs of large-scale production.It is for second multi-channel test, crystal
Multi-channel test plate has been used in the opto-electronic device DC performance test system of pipe outline packages, has been devised on multi-channel test plate specially
Testing weld pad, by software movable mechanical arm, mechanical arm is surveyed with docking for testing weld pad so as to realize that single channel is powered
Examination, the making required precision of the opto-electronic device DC performance test system of this transistor outline package to fixture is high, simultaneously
As a result of mechanical mobile device, its system building needs high expense, and regular maintenance cost is high.
Therefore, the testing efficiency and test accuracy of the opto-electronic device of transistor outline package how are improved, is kept away simultaneously
Exempting from the cost of the opto-electronic device DC performance test system of transistor outline package too high turns into technical problem urgently to be resolved hurrily.
Utility model content
The utility model is based on above mentioned problem, it is proposed that a kind of new technical scheme, can solve in correlation technique
Transistor outline package opto-electronic device testing efficiency is low, the degree of accuracy is low and the opto-electronic device of transistor outline package
The too high technical problem of the cost of DC performance test system.
In view of this, first aspect of the present utility model proposes a kind of opto-electronic device direct current of transistor outline package
Performance Test System, including：Dc source；Multi-channel control plate, its input are connected to the dc source, the multi-channel control
Plate includes multiple passages；Multi-channel test plate, it is connected with the multi-channel control plate, for assembling multiple transistor outlines to be tested
The opto-electronic device of encapsulation so that each corresponding passage of the opto-electronic device is connected, multiple passages according to
Secondary connection, when any passage is connected, dc source photoelectricity corresponding to it by the passage of connection
Sub- device provides electric signal；And device for detecting performance parameter, it is connected to the multi-channel control plate and/or the multi-channel test
Plate, the DC performance parameter of the corresponding opto-electronic device of the passage for detecting with connecting.
In the technical scheme, the opto-electronic device of multiple transistor outline packages to be tested is assembled in multi-channel test
On plate, each opto-electronic device is connected with a passage of multi-channel control plate, and when any passage is connected, dc source is the passage
Corresponding opto-electronic device provides electric signal, so that device for detecting performance parameter detects the DC performance of the opto-electronic device
Parameter.Therefore, multiple passages of multi-channel control plate can be in turn switched on, with realize it is multiple it is above-mentioned in opto-electronic device successively
Test.By above technical scheme, due to the photoelectron of multiple transistor outline packages can be assembled on a multi-channel test plate
Device, therefore, the testing efficiency and test accuracy rate of the opto-electronic device of transistor outline package can be substantially increased, met
The demand of large-scale production.And avoid participating in the performance test of opto-electronic device using mechanical arm, so as to avoid crystalline substance
The cost of the opto-electronic device DC performance test system of body pipe outline packages is too high, reduces being produced into for opto-electronic device
This.
In the above-mentioned technical solutions, it is preferable that also include：Terminal, it is connected to the dc source, the multi-channel control plate
With the device for detecting performance parameter, the terminal is used to control the dc source output electric signal, control multiple described logical
The DC performance parameter in turn switching on and reading and store the device for detecting performance parameter and detect in road.
In the technical scheme, it is controlled, is reduced by terminal-pair dc source, multi-channel control plate and multi-channel test plate
User participates in the step of DC performance test of the opto-electronic device of transistor outline package, further increasing transistor
The efficiency and accuracy rate of the opto-electronic device performance test of outline packages.In addition, read and store what is detected by terminal
DC performance parameter, manual record testing result is avoided, the opto-electronic device for meeting transistor outline package is surveyed on a large scale
The demand of examination.
In any of the above-described technical scheme, it is preferable that the multi-channel control plate includes：Multiple electromagnetic relays, it is and multiple
The passage corresponds, the terminal controlled by controlling the switch of each electromagnetic relay it is corresponding described in
Passage is switched on and off.
In the technical scheme, the corresponding electromagnetic relay of each passage, to be controlled correspondingly by electromagnetic relay
Passage is switched on and off, so as to realize the survey successively of the opto-electronic device of multiple transistor outline packages on multi-channel test plate
Examination.
In any of the above-described technical scheme, it is preferable that the device for detecting performance parameter includes one below or a variety of
Combination：Ammeter, pico-ampere table, universal meter, the pico-ampere table are used to read the photoelectron corresponding with the passage connected
The dark current of device, the ammeter are used for the work electricity for reading the opto-electronic device corresponding with the passage connected
Stream, the universal meter are used for the quiescent output voltage for reading the opto-electronic device corresponding with the passage connected.
In the technical scheme, the dark current of opto-electronic device is read by pico-ampere table, ammeter reads opto-electronic device
Operating current, universal meter read opto-electronic device quiescent output voltage, so as to realize the performance test of opto-electronic device.
In any of the above-described technical scheme, it is preferable that the precision of the pico-ampere table is pico-ampere level.
In the technical scheme, the precision of pico-ampere table is pico-ampere level, it is ensured that the test of the dark current of opto-electronic device
Accuracy.
In any of the above-described technical scheme, it is preferable that by shielding line by the pico-ampere table and the multi-channel control plate phase
Even, and/or the pico-ampere table is connected with the multi-channel test plate by shielding line.
In any of the above-described technical scheme, it is preferable that the dc source can export two-way electric signal, all the way electric signal
Export and come to provide reverse bias voltage or reverse for the optical chip of the opto-electronic device to the optical chip of the opto-electronic device
Bias current, another way electric signal output to be the opto-electronic device across resistance to the trans-impedance amplifier of the opto-electronic device
Amplifier provides operating voltage.
In the technical scheme, dc source can export two-way electric signal, avoid using two independent dc sources
The respectively optical chip of opto-electronic device and trans-impedance amplifier power supply, so that the opto-electronic device of transistor outline package is straight
The design of stream Performance Test System is more reasonable, and the opto-electronic device DC performance for further reducing transistor outline package is surveyed
The cost of test system.
In any of the above-described technical scheme, it is preferable that the dc source is program controllable power.
In the technical scheme, dc source is program controllable power, i.e., can be to dc source by software program
It is controlled, avoids manual control dc source, avoids manually participating in too much in the performance test of opto-electronic device, from
And make it that the opto-electronic device DC performance test system of transistor outline package is easily operated.
In any of the above-described technical scheme, it is preferable that a multi-channel control plate connects a multi-channel test plate,
Or a multi-channel control plate connects multiple multi-channel test plates.
In the technical scheme, a multi-channel control plate can connect a multi-channel test plate, can also connect multiple more
Drive test test plate (panel), so as to meet the demand of the opto-electronic device large scale test of transistor outline package.
In any of the above-described technical scheme, it is preferable that by winding displacement by the dc source and the multi-channel control plate phase
Even, and the multi-channel control plate is connected with the multi-channel test plate by winding displacement.
By the technical solution of the utility model, the testing efficiency of the opto-electronic device of transistor outline package can be improved
And test accuracy rate, while avoid the cost of the opto-electronic device DC performance test system of transistor outline package too high.
Brief description of the drawings
Fig. 1 shows galvanic according to the opto-electronic device of the transistor outline package of one embodiment of the present utility model
The structural representation of energy test system；
Fig. 2 shows the opto-electronic device direct current according to the transistor outline package of another embodiment of the present utility model
The structural representation of Performance Test System；
Fig. 3 shows what is connected between multi-channel control plate and multi-channel test plate according to one embodiment of the present utility model
Structural representation.
Embodiment
In order to which above-mentioned purpose of the present utility model, feature and advantage can be more clearly understood that, below in conjunction with the accompanying drawings and tool
The utility model is further described in detail body embodiment.It should be noted that in the case where not conflicting, this Shen
The feature in embodiment and embodiment please can be mutually combined.
Many details are elaborated in the following description in order to fully understand the utility model, still, this practicality
New to be different from other modes described here using other to implement, therefore, the scope of protection of the utility model is simultaneously
Do not limited by following public specific embodiment.
Fig. 1 shows galvanic according to the opto-electronic device of the transistor outline package of one embodiment of the present utility model
The structural representation of energy test system.
As shown in figure 1, the opto-electronic device direct current according to the transistor outline package of one embodiment of the present utility model
Performance Test System 100, including：Dc source 102；Multi-channel control plate 104, its input are connected to dc source 102, multichannel
Control panel 104 includes multiple passages；Multi-channel test plate 106, it is connected with multi-channel control plate 104, it is to be tested multiple for assembling
The opto-electronic device of transistor outline package, so that each corresponding passage of opto-electronic device is connected, multiple passages are successively
Connect, when any passage is connected, dc source 102 provides telecommunications by the passage of connection for its corresponding opto-electronic device
Number；And device for detecting performance parameter 108, multi-channel control plate 104 and/or multi-channel test plate 106 are connected to, for detecting and connecing
The DC performance parameter of opto-electronic device corresponding to logical passage.
In the technical scheme, the opto-electronic device of multiple transistor outline packages to be tested is assembled in multi-channel test
On plate 106, each opto-electronic device is connected with a passage of multi-channel control plate 104 after assembling, when any passage is connected, direct current
Power supply provides electric signal for opto-electronic device corresponding to the passage, so that device for detecting performance parameter 108 detects the photoelectricity
The DC performance parameter of sub- device.Therefore, multiple passages of multi-channel control plate 104 can be in turn switched on, it is multiple above-mentioned to realize
In opto-electronic device test successively.It is multiple due to that can be assembled on a multi-channel test plate 106 by above technical scheme
The opto-electronic device of transistor outline package, therefore, the survey of the opto-electronic device of transistor outline package can be substantially increased
Efficiency and test accuracy rate are tried, meets the demand of large-scale production.And avoid participating in opto-electronic device using mechanical arm
Performance test, it is too high so as to avoid the cost of the opto-electronic device DC performance test system 100 of transistor outline package,
Reduce the production cost of the opto-electronic device of transistor outline package.
It is understood that dc source 102 can export two-way electric signal, electric signal output is to opto-electronic device all the way
Optical chip to provide reverse bias voltage or reverse biased current, another way electric signal output for the optical chip of opto-electronic device
Trans-impedance amplifier to opto-electronic device to provide operating voltage for the trans-impedance amplifier of opto-electronic device.
It is understood that dc source 102 is program controllable power.
It is understood that a multi-channel control plate 104 connects a multi-channel test plate 106, or a multi-channel control
Plate 104 connects multiple multi-channel test plates 106.
It is understood that dc source 102 is connected with multi-channel control plate 104 by winding displacement, and will by winding displacement
Multi-channel control plate 104 is connected with multi-channel test plate 106.
Fig. 2 shows the opto-electronic device direct current according to the transistor outline package of another embodiment of the present utility model
The structural representation of Performance Test System 100.
It is as shown in Fig. 2 straight according to the opto-electronic device of the transistor outline package of another embodiment of the present utility model
Performance Test System 100 is flowed, including：Dc source 102；Multi-channel control plate 104, its input is connected to dc source 102, more
Road control panel 104 includes multiple passages, multi-channel test plate 106, is connected with multi-channel control plate 104, to be tested more for assembling
The opto-electronic device of individual transistor outline package so that each corresponding passage of opto-electronic device is connected, multiple passages according to
Secondary connection, when any passage is connected, dc source 102 provides telecommunications by the passage of connection for its corresponding opto-electronic device
Number；And device for detecting performance parameter 108, multi-channel control plate 104 and/or multi-channel test plate 106 are connected to, for detecting and connecing
The DC performance parameter of opto-electronic device corresponding to logical passage.
In addition, the opto-electronic device DC performance test system 100 of transistor outline package also includes：Terminal 110, connection
To dc source 102, multi-channel control plate 104 and device for detecting performance parameter, terminal 110 is used to control dc source 102 to export
Electric signal, the multiple passages of control in turn switch on and read and DC performance ginseng that storage performance parameter detection device detects
Number.Device for detecting performance parameter includes one below or a variety of combinations：Ammeter 1082, pico-ampere table 1084, universal meter 1086,
Pico-ampere table 1084 is used for the dark current for reading opto-electronic device corresponding with the passage connected, and ammeter 1082 is used to read and connect
The operating current of opto-electronic device corresponding to logical passage, universal meter 1086 are used to read photoelectron corresponding with the passage connected
The quiescent output voltage of device.
In the technical scheme, the opto-electronic device of multiple transistor outline packages to be tested is assembled in multi-channel test
On plate 106, each opto-electronic device is connected with a passage of multi-channel control plate 104 after assembling, when any passage is connected, direct current
Power supply provides electric signal for opto-electronic device corresponding to the passage, so that device for detecting performance parameter 108 detects the photoelectricity
The DC performance parameter of sub- device.Therefore, multiple passages of multi-channel control plate 104 can be in turn switched on, it is multiple above-mentioned to realize
In opto-electronic device test successively.It is multiple due to that can be assembled on a multi-channel test plate 106 by above technical scheme
The opto-electronic device of transistor outline package, therefore, the survey of the opto-electronic device of transistor outline package can be substantially increased
Efficiency and test accuracy rate are tried, meets the demand of large-scale production.And avoid participating in opto-electronic device using mechanical arm
Performance test, it is too high so as to avoid the cost of the opto-electronic device DC performance test system 100 of transistor outline package,
Reduce the production cost of the opto-electronic device of transistor outline package.In addition, by terminal 110 to dc source 102, multichannel
Control panel 104 and multi-channel test plate 106 are controlled, reduce user participate in transistor outline package opto-electronic device it is straight
The step of flowing performance test, it further increasing the efficiency and accuracy rate of DC performance test.In addition, by terminal 110 come
The DC performance parameter detected is read and stored, manual record testing result is avoided, meets transistor outline package
The demand of opto-electronic device large scale test.
It is understood that multi-channel control plate 104 includes：Multiple electromagnetic relays, corresponded with multiple passages, terminal
110 control being switched on and off for corresponding passage by controlling the switch of each electromagnetic relay.
Each corresponding electromagnetic relay of passage, to control the connection of respective channel and pass by electromagnetic relay
Close, so as to realize the test successively of multiple opto-electronic devices on multi-channel test plate 106.The quantity of electromagnetic relay is more drive tests
The integral multiple of jack total quantity on test plate (panel) 106.For example, there are 64 jacks, the quantity of electromagnetic relay on multi-channel test plate 106
For 64,128 etc..So, one or more multi-channel test plates 106 can are connected on a multi-channel control plate 104.
It is understood that the precision of pico-ampere table 1084 is pico-ampere level.
The precision of pico-ampere table 1084 is pico-ampere level, it is ensured that the test accuracy of the dark current of opto-electronic device.
It is understood that pico-ampere table 1084 is connected with multi-channel control plate 104 by shielding line, pico-ampere table 1084 with
In the case that multi-channel test plate 106 is connected, pico-ampere table 1084 is connected with multi-channel test plate 106 by shielding line.
It is understood that dc source 102 can export two-way electric signal, electric signal output is to opto-electronic device all the way
Optical chip to provide reverse bias voltage or reverse biased current, another way electric signal output for the optical chip of opto-electronic device
Trans-impedance amplifier to opto-electronic device to provide operating voltage for the trans-impedance amplifier of opto-electronic device.
For example, opto-electronic device has five leads, wherein, first lead is the trans-impedance amplifier inside opto-electronic device
Operating voltage, generally 3.3V or 5V are provided；Second lead provides reverse bias for the optical chip inside opto-electronic device
Voltage, if optical chip is PIN photodiode, the reverse bias voltage that second lead provides is 5V；If optical chip is snow
Avalanche photo diode, the then reverse bias voltage that second lead provides are 0.9 times of the breakdown voltage of avalanche photodide.
Meanwhile second lead also has a kind of definition, i.e. monitor current pin, the operating voltage of optical chip across resistance by amplifying in such cases
Device provides.3rd lead and the 4th lead are electric signal difference output pin, and the 5th lead is grounding leg.
Dc source 102 can export two-way electric signal, and it is respectively photoelectricity to avoid using two independent dc sources 102
Optical chip and the trans-impedance amplifier power supply of sub- device, so that the opto-electronic device DC performance test of transistor outline package
The design of system 100 is more reasonable, further reduces the opto-electronic device DC performance test system of transistor outline package
100 cost.
It is understood that dc source 102 is program controllable power.
Dc source 102 is program controllable power, i.e., dc source 102 can be controlled by software program,
Manual control dc source 102 is avoided, avoids manually participating in too much in the performance test of opto-electronic device, so that
The opto-electronic device DC performance test system 100 of transistor outline package is easily operated.
It is understood that a multi-channel control plate 104 connects a multi-channel test plate 106, or a multi-channel control
Plate 104 connects multiple multi-channel test plates 106.As shown in figure 3, a multi-channel control plate 104 connects two multi-channel test plates 106,
Each 106 corresponding universal meter 1086 of multi-channel test plate, to detect the quiet of the opto-electronic device on multi-channel test plate 106 respectively
State output voltage.
One multi-channel control plate 104 can connect a multi-channel test plate 106, can also connect multiple multi-channel test plates
106, so as to meet the demand of opto-electronic device large scale test.
It is understood that dc source 102 is connected with multi-channel control plate 104 by winding displacement, and will by winding displacement
Multi-channel control plate 104 is connected with multi-channel test plate 106.
Further illustrate how to test using the opto-electronic device DC performance of transistor outline package with reference to Fig. 2
System 100 is tested.Wherein, there are three test links, represented respectively with heavy line, fine line, dotted line.
, will after the opto-electronic device of multiple transistor outline packages is assembled on multi-channel test plate 106 by tester
Multi-channel test plate 106 links together with multi-channel control plate 104, clicks on the software test automatic running in terminal 110.Specifically
Ground, terminal 110 control any passage of multi-channel control plate 104 to connect, the dark electricity of opto-electronic device corresponding with the passage of connection
Stream, breakdown voltage complete test in solid wired link, and its step is：
Step 1,10 microamperes of current signal being exported by dc source 102, any passage of multi-channel control plate 104 is connected,
The magnitude of voltage that universal meter 1086 is read is the breakdown voltage of opto-electronic device corresponding with the passage of connection.
Step 2, by the output voltage signal of dc source 102, the numerical value for reading pico-ampere table 1084 is the passage with connection
The dark current of corresponding opto-electronic device.
The operating current of opto-electronic device corresponding with the passage of connection completes test in dotted line link, by dc source
102 provide 3.3V or 5V voltage signal, and the numerical value for reading ammeter 1082 is photoelectron device corresponding with the passage of connection
The operating current of part.
The quiescent output voltage of opto-electronic device corresponding with the passage of connection completes test, the chain in fine line link
Need to use two universal meters 1086 in road, read respectively quiescent output voltage just, quiescent output voltage bears.Concretely comprise the following steps,
Two-way voltage signal is provided by dc source 102, is added to all the way on the optical chip of opto-electronic device, another way is added to photoelectron device
On the trans-impedance amplifier of part, on two universal meters 1086 numerical value be respectively quiescent output voltage just, quiescent output voltage bears.
Multiple passages of multi-channel control plate 104 are connected and in turn switched on, and after each passage is connected, are come according to above scheme
Test the performance parameter of opto-electronic device corresponding to each passage.Test after terminating, display circle that tester passes through terminal 110
The instruction in face, certified products are separated with defective products.
The technical solution of the utility model is described in detail above in association with accompanying drawing, by the technical solution of the utility model,
The testing efficiency and test accuracy rate of the opto-electronic device of transistor outline package can be improved, while avoids transistor outline from sealing
The cost of the opto-electronic device DC performance test system of dress is too high.
In the utility model, term " first ", " second " are only used for the purpose of description, and it is not intended that instruction or dark
Show relative importance；Term " multiple " represents two or more；Term " connected ", " connection " etc. all should be interpreted broadly,
For example, it may be being fixedly connected or being detachably connected, or it is integrally connected；Can be joined directly together, can also pass through
Intermediary is indirectly connected.For the ordinary skill in the art, it can understand that above-mentioned term exists as the case may be
Concrete meaning in the utility model.
Preferred embodiment of the present utility model is the foregoing is only, is not limited to the utility model, for this
For the technical staff in field, the utility model can have various modifications and variations.It is all in the spirit and principles of the utility model
Within, any modification, equivalent substitution and improvements made etc., it should be included within the scope of protection of the utility model.
Claims (10)
- A kind of 1. opto-electronic device DC performance test system of transistor outline package, it is characterised in that including：Dc source；Multi-channel control plate, its input are connected to the dc source, and the multi-channel control plate includes multiple passages；Multi-channel test plate, it is connected with the multi-channel control plate, for assembling the photoelectricity of multiple transistor outline packages to be tested Sub- device, so that each corresponding passage of the opto-electronic device is connected, multiple passages in turn switch on, when appointing When one passage is connected, the dc source provides electricity by the passage of connection opto-electronic device corresponding to it Signal；AndDevice for detecting performance parameter, the multi-channel control plate and/or the multi-channel test plate are connected to, for what is detected and connect The DC performance parameter of the opto-electronic device corresponding to the passage.
- 2. the opto-electronic device DC performance test system of transistor outline package according to claim 1, its feature exist In, in addition to：Terminal, it is connected to the dc source, the multi-channel control plate and the device for detecting performance parameter, the terminal and is used for Dc source output electric signal, the multiple passages of control is controlled in turn switch on and read and store the performance ginseng The DC performance parameter that number detection means detects.
- 3. the opto-electronic device DC performance test system of transistor outline package according to claim 2, its feature exist In the multi-channel control plate includes：Multiple electromagnetic relays, corresponded with multiple passages, the terminal is by controlling each electromagnetic relay Switch control being switched on and off for the corresponding passage.
- 4. the opto-electronic device DC performance test system of transistor outline package according to claim 1, its feature exist In,The device for detecting performance parameter includes one below or a variety of combinations：Ammeter, pico-ampere table, universal meter,The pico-ampere table is used for the dark current for reading the opto-electronic device corresponding with the passage connected, the ammeter The operating current of the corresponding opto-electronic device of the passage for reading with connecting, the universal meter are used to read and connect The quiescent output voltage of the opto-electronic device corresponding to the logical passage.
- 5. the opto-electronic device DC performance test system of transistor outline package according to claim 4, its feature exist In,The precision of the pico-ampere table is pico-ampere level.
- 6. the opto-electronic device DC performance test system of transistor outline package according to claim 4, its feature exist In,The pico-ampere table is connected with the multi-channel control plate by shielding line, and/or by shielding line by the pico-ampere table and The multi-channel test plate is connected.
- 7. the opto-electronic device DC performance test system of transistor outline package according to any one of claim 1 to 6 System, it is characterised in thatThe dc source can export two-way electric signal, all the way electric signal output to the opto-electronic device optical chip come for The optical chip of the opto-electronic device provides reverse bias voltage or reverse biased current, another way electric signal output give the light The trans-impedance amplifier of electronic device to provide operating voltage for the trans-impedance amplifier of the opto-electronic device.
- 8. the opto-electronic device DC performance test system of transistor outline package according to any one of claim 1 to 6 System, it is characterised in thatThe dc source is program controllable power.
- 9. the opto-electronic device DC performance test system of transistor outline package according to any one of claim 1 to 6 System, it is characterised in thatOne multi-channel control plate connects a multi-channel test plate, or a multi-channel control plate connects multiple institutes State multi-channel test plate.
- 10. the opto-electronic device DC performance test system of transistor outline package according to any one of claim 1 to 6 System, it is characterised in thatThe dc source is connected with the multi-channel control plate by winding displacement, and by winding displacement by the multi-channel control plate with The multi-channel test plate is connected.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106932700A (en) * | 2017-03-31 | 2017-07-07 | 深圳市芯思杰智能物联网技术有限公司 | The opto-electronic device DC performance test system of transistor outline package |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106932700A (en) * | 2017-03-31 | 2017-07-07 | 深圳市芯思杰智能物联网技术有限公司 | The opto-electronic device DC performance test system of transistor outline package |
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