CN207965045U - A kind of laser parameter test instrument - Google Patents
A kind of laser parameter test instrument Download PDFInfo
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- CN207965045U CN207965045U CN201820373412.3U CN201820373412U CN207965045U CN 207965045 U CN207965045 U CN 207965045U CN 201820373412 U CN201820373412 U CN 201820373412U CN 207965045 U CN207965045 U CN 207965045U
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model is related to a kind of laser parameter test instrument.Regulated power supply including test circuit, for providing power supply for test circuit, the laser being connect with the test circuit；The test circuit includes microcontroller, current source module, AD acquisition modules, serial communication module, back facet current conversion module, luminous power conversion module, the microcontroller is communicated through serial communication module with computer, the microcontroller is also connect through current source module with laser, the microcontroller is also connect with AD acquisition modules, luminous power conversion module with laser, the current source module is also connect with AD acquisition modules, and the back facet current conversion module is connect with AD acquisition modules, laser.The utility model can realize the automatic test of the LIV curves and back facet current of optical fiber laser, and accuracy of detection is high, and speed is fast, flexible setting for parameters, simple in structure, simple to operate, at low cost.
Description
Technical field
The utility model is related to laser testing field more particularly to a kind of laser parameter test instrument.
Background technology
Semiconductor laser has small, light-weight, long lifespan, distinguishing features, its application range such as is easily integrated
More extensively with the development of optical communication industry.It needs to pick defective products in test in semiconductor laser production process
It removes.
The test equipment of routine outsourcing at present, expensive, test speed is slow, and part instrument does not have back facet current to detect work(
Can, and parameter setting is complicated.
Invention content
The purpose of this utility model is that being directed to the above shortcoming, a kind of utility model laser tester is provided.
To achieve the above object, the technical solution of the utility model is：A kind of laser parameter test instrument, including test electricity
Road, the regulated power supply for providing power supply for test circuit, the laser being connect with the test circuit；The test circuit packet
Microcontroller, current source module, AD acquisition modules, serial communication module, back facet current conversion module, luminous power conversion module are included,
The microcontroller is communicated through serial communication module with computer, and the microcontroller also connects through current source module and laser
It connects, the microcontroller is also connect with AD acquisition modules, luminous power conversion module with laser, and the current source module is also adopted with AD
Collect module connection, the back facet current conversion module is connect with AD acquisition modules, laser.
In one embodiment of the utility model, the microcontroller uses STM32F103VE chips.
In one embodiment of the utility model, the regulated power supply include bridge rectifier and for provide ± 12V,
The LDO chips of ± 5V, 3.3V voltage.
In one embodiment of the utility model, AD acquisition modules use AD acquisition chips AD7606.
In one embodiment of the utility model, the serial communication module turns serial port chip using USB.
Compared to the prior art, the utility model has the advantages that：The utility model can realize optical-fiber laser
The automatic test of the LIV curves and back facet current of device, accuracy of detection is high, and speed is fast, flexible setting for parameters, simple in structure, operation
It is simple and convenient, it is at low cost.
Description of the drawings
Fig. 1 is the utility model tester structure chart.
Fig. 2 is the utility model single chip circuit schematic diagram.
Fig. 3 is the utility model AD acquisition module circuit diagrams.
Fig. 4 is the utility model current source module circuit diagram.
Fig. 5 is the utility model back facet current conversion module circuit diagram.
Fig. 6 is the utility model luminous power conversion module circuit diagram.
Fig. 7 is the utility model load voltage Acquisition Circuit schematic diagram.
Fig. 8 is the utility model tester work flow diagram.
In figure：1- regulated power supplies；2- test circuits；3- computers；4- lasers；5- serial communication modules；6- microcontrollers；
7-AD acquisition modules；8- back facet current conversion modules；9- luminous power conversion modules；10- current source modules.
Specific implementation mode
Below in conjunction with the accompanying drawings, the technical solution of the utility model is specifically described.
A kind of laser parameter test instrument of the utility model, including test circuit, for providing power supply for test circuit
Regulated power supply, the laser that is connect with the test circuit；The test circuit includes that microcontroller, current source module, AD are adopted
Collect module, serial communication module, back facet current conversion module, luminous power conversion module, the microcontroller is through serial communication module
It is communicated with computer, the microcontroller is also connect through current source module with laser, and the microcontroller also acquires mould with AD
Block, luminous power conversion module are connect with laser, and the current source module is also connect with AD acquisition modules, and the back facet current turns
Mold changing block is connect with AD acquisition modules, laser.
The microcontroller uses STM32F103VE chips.
The regulated power supply includes bridge rectifier and the LDO chips for providing ± 12V, ± 5V, 3.3V voltage.
AD acquisition modules use AD acquisition chips AD7606.
The serial communication module turns serial port chip using USB.
It is specific embodiment of the utility model below.
As shown in Fig. 1~8, a kind of 4 test device of laser of the present embodiment, includes the numerical control based on 32 microcontrollers 6
Current source module 10,24 high-precision AD acquisition modules 7, serial communication modules 5, the luminous power based on amplifier IV conversion circuit turn
Change the mold block 9, back facet current conversion module 8, positive and negative 12V, positive and negative 5V, 3.3V multichannel based on bridge rectifier and LDO chips
Regulated power supply 1, the computer 3 with USB interface and host computer procedure.
The current source module 10 is the voltage controlled current source electricity that the DAC pins control amplifier of microcontroller 6 adds metal-oxide-semiconductor to form
Road is used as the drive current source of laser.
The luminous power conversion module 9 is that the PD detectors of the DAC pins control amplifier generation 1V biasings of microcontroller 6 add fortune
IV conversion circuit is put, the luminous power for being used as laser is converted.
The back facet current conversion module 8 is the back facet current IV conversion circuit that 4 inside PD detectors of laser generate, and is used
Make the back facet current detection of laser.
The AD acquisition modules 7 are to control 24 high-precision AD acquisition chips by the SPI communication programs of microcontroller 6
AD7606 is used as laser optical power acquisition, current acquisition, voltage acquisition（LIV data, as shown in Figure 7）, back facet current adopts
Collection.
The serial communication module 5 turns serial port chip by USB and realizes that computer 3 is communicated with microcontroller 6.
From the foregoing, the beneficial effects of the utility model are：Computer 3 turns serial communication module 5 by USB and sends
Control command and test parameter to microcontroller 6, microcontroller 6 control the voltage controlled current source electricity of current source module 10 by DAC pins
Road makes current source module output setting electric current be connected to laser 4 and sends out light, by the photodetector of luminous power conversion module 9
The photoelectric current that corresponding laser 4 is sent out is received, the photoelectric current acquisition pin that corresponding voltage is connected to AD acquisition modules 7 is converted to,
The back facet current of laser 4 is converted into the backlight electricity that corresponding voltage is connected to AD acquisition modules 7 by back facet current conversion module 8
Stream acquisition pin, 4 current acquisition of laser that AD acquisition modules 7 are connected to by the load current interface of current source module 10 draw
Foot, load voltage interface are connected to the 4 voltage acquisition pin of laser of AD acquisition modules 7, and the microcontroller 6 passes through SPI communication
Protocol integrated test system AD acquisition modules 7 are by 4 luminous power of laser, electric current, voltage（LIV parameters）, back facet current be converted to digital quantity simultaneously
It is transmitted to the array of microcontroller 6, repeats output stair step current, 4 luminous power of acquisition laser, electric current, voltage（LIV joins
Number）, back facet current be converted to digital quantity and be transmitted to the array task of microcontroller 6, until 4 electric current of laser reach setting ginseng
Number, then LIV curves are drawn by 5 transmitting test data of serial communication modular to computer 3 by microcontroller 6, obtain 4 threshold of laser
Back facet current value when value can show and analyze in PC machine 10.
In conclusion a kind of laser tester provided by the utility model, simple in structure, and it is easily operated, it is at low cost, it surveys
It is fast to try speed, measuring accuracy is high, and the automatic test of laser LIV curves and back facet current may be implemented.
Above-listed preferred embodiment has been further described the purpose of this utility model, technical solution and advantage,
It should be understood that the above is only the preferred embodiment of the utility model only, it is not intended to limit the utility model, it is all
Within the spirit and principles of the present invention, any modification, equivalent replacement, improvement and so on should be included in this practicality
Within novel protection domain.
Claims (5)
1. a kind of laser parameter test instrument, which is characterized in that including test circuit, for providing the steady of power supply for test circuit
Voltage source, the laser being connect with the test circuit；The test circuit includes microcontroller, current source module, AD acquisition moulds
Block, serial communication module, back facet current conversion module, luminous power conversion module, the microcontroller is through serial communication module and meter
Calculation machine is communicated, and the microcontroller is also connect through current source module with laser, the microcontroller also with AD acquisition modules, light
Power conversion module is connect with laser, and the current source module is also connect with AD acquisition modules, the back facet current modulus of conversion
Block is connect with AD acquisition modules, laser.
2. laser parameter test instrument according to claim 1, which is characterized in that the microcontroller uses
STM32F103VE chips.
3. laser parameter test instrument according to claim 1, which is characterized in that the regulated power supply includes bridge rectifier
Circuit and LDO chips for providing ± 12V, ± 5V, 3.3V voltage.
4. laser parameter test instrument according to claim 1, which is characterized in that AD acquisition modules use AD acquisition chips
AD7606。
5. laser parameter test instrument according to claim 1, which is characterized in that the serial communication module uses USB
Turn serial port chip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820373412.3U CN207965045U (en) | 2018-03-20 | 2018-03-20 | A kind of laser parameter test instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820373412.3U CN207965045U (en) | 2018-03-20 | 2018-03-20 | A kind of laser parameter test instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207965045U true CN207965045U (en) | 2018-10-12 |
Family
ID=63725055
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| Application Number | Title | Priority Date | Filing Date |
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| CN201820373412.3U Active CN207965045U (en) | 2018-03-20 | 2018-03-20 | A kind of laser parameter test instrument |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109781388A (en) * | 2019-02-25 | 2019-05-21 | 电子科技大学中山学院 | Single-tube high-power laser screening test system based on distributed constant-current driving power supply |
| CN111273208A (en) * | 2020-03-11 | 2020-06-12 | 深圳市金锐显数码科技有限公司 | Precision automatic correction method and system based on electronic load |
| CN111880087A (en) * | 2020-09-28 | 2020-11-03 | 上海菲莱测试技术有限公司 | Laser chip aging and LIV test detection method and system |
-
2018
- 2018-03-20 CN CN201820373412.3U patent/CN207965045U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109781388A (en) * | 2019-02-25 | 2019-05-21 | 电子科技大学中山学院 | Single-tube high-power laser screening test system based on distributed constant-current driving power supply |
| CN111273208A (en) * | 2020-03-11 | 2020-06-12 | 深圳市金锐显数码科技有限公司 | Precision automatic correction method and system based on electronic load |
| CN111880087A (en) * | 2020-09-28 | 2020-11-03 | 上海菲莱测试技术有限公司 | Laser chip aging and LIV test detection method and system |
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