CN202631620U - Optical module intelligent test board - Google Patents

Optical module intelligent test board Download PDF

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Publication number
CN202631620U
CN202631620U CN 201220219601 CN201220219601U CN202631620U CN 202631620 U CN202631620 U CN 202631620U CN 201220219601 CN201220219601 CN 201220219601 CN 201220219601 U CN201220219601 U CN 201220219601U CN 202631620 U CN202631620 U CN 202631620U
Authority
CN
China
Prior art keywords
module
monitoring
mcu
optical module
supply voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201220219601
Other languages
Chinese (zh)
Inventor
夏哲
胡锋
张中甜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dongguan Mentech Optical and Magnetic Co Ltd
Original Assignee
Dongguan Mentech Optical and Magnetic Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongguan Mentech Optical and Magnetic Co Ltd filed Critical Dongguan Mentech Optical and Magnetic Co Ltd
Priority to CN 201220219601 priority Critical patent/CN202631620U/en
Application granted granted Critical
Publication of CN202631620U publication Critical patent/CN202631620U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model discloses an optical module intelligent test board which comprises a base plate and an electronic module which is embedded on the base plate. The electronic module comprises a micro controller unit (MCU), a digital diagnostic monitoring (DDM) module, a current flow monitoring module, an adjustable power supply voltage module and a module parameter adjusting piece. The DDM monitoring module, the current flow monitoring module, the adjustable power supply voltage module and the module parameter adjusting piece are respectively connected with the MCU. The optical module intelligent test board with the above structure has the advantages of being convenient to use and easy to operate and simplifying modules in a test, adjusting the voltage, monitoring in real-time mode, transmitting signals in a high speed and the like.

Description

A kind of optical module intelligence test plate
Technical field
The utility model design relates to the digital module field tests, is specifically related to a kind of optical module intelligence test plate.
Background technology
The digital module test board is used in existing optical communication, in test process, need too much utility appliance, and much parameter can not change very easily and detect, like the voltage of load module and the electric current of module.Brought very big inconvenience to our test like this, made test become loaded down with trivial details and consuming time.
The utility model content
The purpose of the utility model is: in order to solve above-mentioned prior art problems, a kind of required module of test, optical module intelligence test plate easy to use, simple to operate simplified is provided.
To achieve these goals, the technical scheme of the utility model is:
A kind of optical module intelligence test plate; Comprise at the bottom of the plate and electronic module; On electronic module is embedded at the bottom of the plate; This electronic module comprises MCU (Micro Controller Unit) microcontroller, DDM (Digital Diagnostic Monitoring) monitoring module, current monitoring module, variable supply voltage module and module parameter regulating block, and DDM monitoring module, current monitoring module, variable supply voltage module and module parameter regulating block are connected with the MCU microcontroller through transmission line respectively.The utility model has been realized functions such as real-time regulated voltage swing, monitoring in real time, high speed transmission of signals; Can conveniently monitor, and can directly monitor out electric current test module.The test that comprises digital modules such as PON module, SFP module can be used this test board.Its employed external unit significantly reduces, and the direct state of monitor current, online change supply voltage and real-time monitoring module.Test speed and measuring accuracy have been accelerated greatly.
As the further improvement of the utility model, the MCU microcontroller is communicated by letter with test module through I2C (Inter-Integrated Circuit) bus.Utilize the I2C bus to communicate, realize remote monitoring.
As the further improvement of the utility model, the MCU microcontroller communicates through USB connecting line and host computer, realizes that test module is carried out in remote monitoring and test board communicates.MCU microcontroller and host computer communicate, and make the better regulating and controlling MCU microcontroller of host computer.
As the further improvement of the utility model, the DDM monitoring module comprises a plurality of monitoring LED indications, comprises that power supply, data, burst, TX_SD, LOS, TX_Fault monitor pilot lamp.Utilize each monitoring pilot lamp, better in time regulate and control each element, it is operated in the normal range.
As the further improvement of the utility model, this current monitoring module constitutes by detecting resistance, sampling resistor, electric capacity and ADC (A-D converter).
As the further improvement of the utility model, this variable supply voltage module is made up of LDO (low dropout regulator) low pressure difference linear voltage regulator, sampling resistor and AD.Thereby can be through the MCU microcontroller being controlled the adjusting that realizes supply voltage, the MCU microcontroller is through sampling to the resistance two ends, thereby calculates the blocks current size.
The beneficial effect of the utility model is: a kind of structure that the utility model structure is such, the required module of simplification test, the external unit of use significantly reduces; Easy to use; Can conveniently monitor, and can directly monitor out electric current test module, simple to operate; Realize functions such as real-time regulated voltage swing, monitoring in real time, high speed transmission of signals, accelerated test speed and measuring accuracy greatly.
Description of drawings
Fig. 1 is the principle of work synoptic diagram of the utility model.
Fig. 2 is first kind of monitor mode synoptic diagram of current monitoring blocks current of the utility model.
Fig. 3 is second kind of monitor mode synoptic diagram of current monitoring blocks current of the utility model.
Fig. 4 is first kind of voltage regulating mode synoptic diagram of variable supply voltage module of the utility model.
Fig. 5 is second kind of voltage regulating mode synoptic diagram of variable supply voltage module of the utility model.
Fig. 6 is the third voltage regulating mode synoptic diagram of variable supply voltage module of the utility model.
Embodiment
With reference to shown in Figure 1; A kind of optical module intelligence test plate; Comprise at the bottom of the plate 1 with electronic module 2; Electronic module 2 is embedded at the bottom of the plate on 1; This electronic module 2 comprises MCU (Micro Controller Unit) microcontroller 21, DDM (Digital Diagnostic Monitoring) monitoring module 22, current monitoring module 23, variable supply voltage module 24 and module parameter regulating block 25, and DDM monitoring module 22, current monitoring module 23, variable supply voltage module 24 and module parameter regulating block 25 are connected with MCU microcontroller 21 through transmission line respectively.The utility model has been realized functions such as real-time regulated voltage swing, monitoring in real time, high speed transmission of signals; Can conveniently monitor, and can directly monitor out electric current test module.The test that comprises digital modules such as PON module, SFP module can be used this test board.Its employed external unit significantly reduces, and the direct state of monitor current, online change supply voltage and real-time monitoring module.Test speed and measuring accuracy have been accelerated greatly.
MCU microcontroller 21 is communicated by letter with test module 5 through I2C (Inter-Integrated Circuit) bus 31.Utilize I2C bus 31 to communicate, realize remote monitoring.
MCU microcontroller 21 communicates through USB connecting line 32 and host computer 4, realizes that test module 5 is carried out in remote monitoring and test board communicates.MCU microcontroller 21 communicates with host computer 4, makes host computer 4 better regulating and controlling MCU microcontrollers 21.
DDM monitoring module 22 comprises a plurality of monitoring LED indications, comprises that power supply, data, burst, TX_SD, LOS, TX_Fault monitor pilot lamp.Utilize each monitoring pilot lamp, better in time regulate and control each element, it is operated in the normal range.
This current monitoring module 23 constitutes by detecting resistance, sampling resistor, electric capacity and ADC (A-D converter).
This variable supply voltage module 24 is made up of LDO (low dropout regulator) low pressure difference linear voltage regulator, sampling resistor and AD.Thereby can be through MCU microcontroller 21 being controlled the adjusting that realizes supply voltage, MCU microcontroller 21 is through sampling to the resistance two ends, thereby calculates the blocks current size.
Adopt the resistance sampling voltage method, calculated the electric current of the test board of flowing through, and then calculated the electric current of test module 5; Adopt regulated power supply chip and 21 controls of MCU microcontroller, make the voltage of supplying with test module 5 can carry out voltage-regulation.And make test module 5 supply voltages stable more, accurate.
The current monitoring mode of current monitoring module 23 is following:
With reference to shown in Figure 2, obtain needed resistance through R1, R2, R3 parallel connection, carry out voltage sample through ADC_CRT+, ADC_CRT-again, suppose R4=R5; R6=R7 can calculate test module 5 current values and is: (R4+R6) * (VADC_CRT+-VADC_CRT-)/[(R1//R2//R3) * R6], can calculate test module 5 current values through this formula; With reference to shown in Figure 3; Test module 5 electric currents produce pressure reduction through R1, and voltage difference is amplified through amplifier, carry out mirror image by a certain percentage through mirror current source again; And then the generation correspondent voltage, calculate test module 5 current values through MCU microcontroller 21 at last.
The voltage-regulation mode of variable supply voltage module 24 is following:
With reference to shown in Figure 4, MCU microcontroller 21 changes the resistance value of ADJ to ground with this, and then can regulate output voltage values through VCTRL1, VCTRL2, VCTRL3, four ports of VCTRL4 are controlled; With reference to shown in Figure 5, change the DA magnitude of voltage through MCU microcontroller 21 and regulate output voltage values; With reference to shown in Figure 6, through R1, R2 resistance value adjusting are changed the magnitude of voltage of ADJ, and then can regulate output voltage values.

Claims (6)

1. optical module intelligence test plate; Comprise at the bottom of the plate and electronic module; On electronic module is embedded at the bottom of the plate; It is characterized in that: described electronic module comprises MCU (Micro Controller Unit) microcontroller, DDM (Digital Diagnostic Monitoring) monitoring module, current monitoring module, variable supply voltage module and module parameter regulating block, and DDM monitoring module, current monitoring module, variable supply voltage module and module parameter regulating block are connected with MCU (Micro Controller Unit) microcontroller through transmission line respectively.
2. optical module intelligence test plate according to claim 1 is characterized in that: the MCU microcontroller is communicated by letter with test module through I2C (Inter-Integrated Circuit) bus.
3. optical module intelligence test plate according to claim 1, it is characterized in that: MCU communicates through USB connecting line and host computer, realizes that test module is carried out in remote monitoring and test board communicates.
4. optical module intelligence test plate according to claim 1 is characterized in that: the DDM monitoring module comprises a plurality of monitoring LED indications, comprises that power supply, data, burst, TX_SD, LOS, TX_Fault monitor pilot lamp.
5. optical module intelligence test plate according to claim 1 is characterized in that: described current monitoring module constitutes by detecting resistance, sampling resistor, electric capacity and ADC (A-D converter).
6. optical module intelligence test plate according to claim 1 is characterized in that: described variable supply voltage module is made up of LDO (low dropout regulator) low pressure difference linear voltage regulator, sampling resistor and AD.
CN 201220219601 2012-05-15 2012-05-15 Optical module intelligent test board Expired - Fee Related CN202631620U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220219601 CN202631620U (en) 2012-05-15 2012-05-15 Optical module intelligent test board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220219601 CN202631620U (en) 2012-05-15 2012-05-15 Optical module intelligent test board

Publications (1)

Publication Number Publication Date
CN202631620U true CN202631620U (en) 2012-12-26

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201220219601 Expired - Fee Related CN202631620U (en) 2012-05-15 2012-05-15 Optical module intelligent test board

Country Status (1)

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CN (1) CN202631620U (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104515951A (en) * 2014-11-27 2015-04-15 北京航天测控技术有限公司 Board-level embedded test controller and board-level embedded test method
CN105760318A (en) * 2016-02-16 2016-07-13 烽火通信科技股份有限公司 Method for reading and writing optical module register on basis of Linux system
CN106788692A (en) * 2016-12-15 2017-05-31 武汉电信器件有限公司 A kind of test equipment and its method of testing of module LOS
CN107543951A (en) * 2016-06-24 2018-01-05 中兴通讯股份有限公司 A kind of optical module on-Line Voltage detection means and method
CN107966269A (en) * 2017-11-14 2018-04-27 东莞铭普光磁股份有限公司 A kind of optical module, optical device condition monitoring system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104515951A (en) * 2014-11-27 2015-04-15 北京航天测控技术有限公司 Board-level embedded test controller and board-level embedded test method
CN105760318A (en) * 2016-02-16 2016-07-13 烽火通信科技股份有限公司 Method for reading and writing optical module register on basis of Linux system
CN107543951A (en) * 2016-06-24 2018-01-05 中兴通讯股份有限公司 A kind of optical module on-Line Voltage detection means and method
CN106788692A (en) * 2016-12-15 2017-05-31 武汉电信器件有限公司 A kind of test equipment and its method of testing of module LOS
CN107966269A (en) * 2017-11-14 2018-04-27 东莞铭普光磁股份有限公司 A kind of optical module, optical device condition monitoring system

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20121226

Termination date: 20190515