CN202903459U - Laser assembly test tooling - Google Patents
Laser assembly test tooling Download PDFInfo
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- CN202903459U CN202903459U CN 201220627859 CN201220627859U CN202903459U CN 202903459 U CN202903459 U CN 202903459U CN 201220627859 CN201220627859 CN 201220627859 CN 201220627859 U CN201220627859 U CN 201220627859U CN 202903459 U CN202903459 U CN 202903459U
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- laser
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- chip microcomputer
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Abstract
A laser assembly test tooling which belongs to the test tooling technology field is disclosed. The utility model provides the laser assembly test tooling whose test efficiency is high and a test project is comprehensive. The tooling of the utility model comprises a single chip microcomputer, an optical module, an optical interface, a DA conversion circuit, an AD conversion circuit, a laser assembly control interface and an upper computer communication interface. The tooling is characterized in that a single chip microcomputer port is connected with an optical module port, a DA conversion circuit port, an AD conversion circuit port and the upper computer communication interface respectively; the optical module port is connected with the optical interface; the laser assembly control interface is connected with the DA conversion circuit port and the AD conversion circuit port respectively; the single chip microcomputer emits an output value control signal to the DA conversion circuit and the single chip microcomputer emits a luminous power control signal to the optical module.
Description
Technical field
The utility model belongs to the test fixture technical field, relates in particular to a kind of laser assembly test fixture.
Background technology
Laser assembly comprises laser instrument and laser detector.At present, the laser assembly method of testing is: use light power meter that laser instrument is carried out the luminous power test, there have the luminous power generation to be to be qualified; Laser detector is carried out voltage, current detecting.Above-mentioned test process is all by artificial line, adjusting, reading, and testing efficiency is low, test event is few.
Summary of the invention
The utility model is exactly for the problems referred to above, and a kind of testing efficiency height, the comprehensive laser assembly test fixture of test event are provided.
For achieving the above object, the utility model adopts following technical scheme, the utility model comprises single-chip microcomputer, optical module, optical interface, DA change-over circuit, A/D convertor circuit, laser assembly control interface and host computer communication interface, its structural feature one-chip machine port links to each other with optical module port, DA change-over circuit port, A/D convertor circuit port, host computer communication interface respectively, the optical module port links to each other with optical interface, and the laser assembly control interface links to each other with DA change-over circuit port, A/D convertor circuit port respectively.
Described single-chip microcomputer sends the output valve control signal to the DA change-over circuit, and single-chip microcomputer sends the luminous power control signal to optical module.
Described optical module receives the luminous power control signal and sends the laser testing signal to the testing laser detector, and receives the light signal that the testing laser device sends by optical interface, and the power of the light signal that again the testing laser device is sent sends to single-chip microcomputer.
Described DA change-over circuit receives the output valve control signal and controls the laser instrument luminous power by the laser assembly control interface.
Described A/D convertor circuit receives the feedback test signal of testing laser detector and testing laser device, and sends to single-chip microcomputer.
As a kind of preferred version, the utility model also comprises power supply (power) module, and the power module input port links to each other with the single-chip microcomputer output port, and the power module outlet mouth links to each other with the laser assembly control interface; The Single-chip Controlling power module is powered to laser instrument.
As another kind of preferred version, laser assembly control interface described in the utility model comprises computing regulating circuit, current control circuit, laser interface and laser detector interface, described DA change-over circuit, computing regulating circuit, current control circuit, laser interface, computing regulating circuit link to each other successively, and the A/D convertor circuit port links to each other with current control circuit port, laser interface and laser detector interface respectively.
As another kind of preferred version, laser detector interface described in the utility model is two.
Secondly, the utility model also comprises EEPROM, and the EEPROM port links to each other with one-chip machine port.
In addition, single-chip microcomputer described in the utility model adopts ATMEGA 128A single-chip microcomputer.
The utility model beneficial effect.
The utility model is used by single-chip microcomputer, optical module, optical interface, DA change-over circuit, A/D convertor circuit, laser assembly control interface and host computer communication interface, the measuring process automatic controlling level is high, so testing efficiency is high, test event is comprehensive.
Description of drawings
Below in conjunction with the drawings and specific embodiments the utility model is described further.The utility model protection domain not only is confined to the statement of following content.
Fig. 1 is this practical circuit theory diagram.
Fig. 2 is the utility model structural representation.
Among the figure, 1 is that laser detector interface, 2 is that laser interface, 3 is that optical interface, 4 is optical module.
Embodiment
As shown in the figure, the utility model comprises single-chip microcomputer, optical module 4, optical interface 3, DA change-over circuit, A/D convertor circuit, laser assembly control interface and host computer communication interface, one-chip machine port links to each other with optical module 4 ports, DA change-over circuit port, A/D convertor circuit port, host computer communication interface respectively, optical module 4 ports link to each other with optical interface 3, and the laser assembly control interface links to each other with DA change-over circuit port, A/D convertor circuit port respectively.
Described single-chip microcomputer sends the output valve control signal to the DA change-over circuit, and single-chip microcomputer sends the luminous power control signal to optical module 4.
Described optical module 4 receives the luminous power control signals and sends the laser testing signal to the testing laser detector, and receives light signal that the testing laser devices send and the power of light signal that the testing laser device is sent sends to single-chip microcomputer by optical interface 3.
Described DA change-over circuit receives the output valve control signal and controls the laser instrument luminous power by the laser assembly control interface.
Described A/D convertor circuit receives the feedback test signal of testing laser detector and testing laser device, and sends to single-chip microcomputer.
The utility model also comprises power module, and the power module input port links to each other with the single-chip microcomputer output port, and the power module outlet mouth links to each other with the laser assembly control interface; The Single-chip Controlling power module is powered to laser instrument.
Described laser assembly control interface comprises computing regulating circuit, current control circuit, laser interface 2 and laser detector interface 1, described DA change-over circuit, computing regulating circuit, current control circuit, laser interface 2, computing regulating circuit link to each other successively, and the A/D convertor circuit port links to each other with current control circuit port, laser interface 2 and laser detector interface 1 respectively.
Described laser detector interface 1 is two.Can test simultaneously two laser detectors, further improve testing efficiency.
The utility model also comprises EEPROM, and the EEPROM port links to each other with one-chip machine port.
Described single-chip microcomputer adopts ATMEGA 128A single-chip microcomputer.
Below in conjunction with the drawings and specific embodiments the process that adopts the utility model testing laser device assembly is done to illustrate.
1, connects the laser control port by laser interface 2 after the system power-up, connect the optical output port of laser instrument by optical interface 3, connect the laser detector port by laser detector interface 1; Host computer begins test by host computer communication interface control single chip computer, and this moment, the Single-chip Controlling power module was powered to laser instrument.
2, single-chip microcomputer adjustment DA change-over circuit output valve makes laser instrument luminous, and DA change-over circuit output valve increases progressively; Inquire about simultaneously the luminous power of laser instruments by optical module 4, until luminous power is-10dBm that stop the DA change-over circuit and increase progressively this moment, pins DA change-over circuit output valve; Single-chip microcomputer reads corresponding laser instrument test value and feeds back to host computer by A/D convertor circuit.
3, after the current value result who records laser instrument adds 20mA, make DA change-over circuit output valve continue to increase progressively so that the current value result of laser instrument with equate that stop the DA change-over circuit and increase progressively this moment after the current value that records adds 20mA, pin DA change-over circuit output valve; Single-chip microcomputer reads corresponding laser instrument test value and feeds back to host computer by A/D convertor circuit.
4, to make the luminous power of optical module 4 be 0dBm to Single-chip Controlling optical module 4, and this moment, single-chip microcomputer read corresponding laser detector test value by A/D convertor circuit, and feed back to upper computer software and show.
5, after test is finished, by host computer click stop test after, this moment, the Single-chip Controlling power module forbade that test finishes to the laser instrument power supply.
Above ephemeral data and test setting item all exist among the EEPROM.
Be understandable that, more than about specific descriptions of the present utility model, only for the utility model being described and being not to be subject to the described technical scheme of the utility model embodiment, those of ordinary skill in the art is to be understood that, still can make amendment or be equal to replacement the utility model, to reach identical technique effect; Use needs as long as satisfy, all within protection domain of the present utility model.
Claims (6)
1. laser assembly test fixture, comprise single-chip microcomputer, optical module (4), optical interface (3), DA change-over circuit, A/D convertor circuit, laser assembly control interface and host computer communication interface, it is characterized in that one-chip machine port links to each other with optical module (4) port, DA change-over circuit port, A/D convertor circuit port, host computer communication interface respectively, optical module (4) port links to each other with optical interface (3), and the laser assembly control interface links to each other with DA change-over circuit port, A/D convertor circuit port respectively;
Described single-chip microcomputer sends the output valve control signal to the DA change-over circuit, and single-chip microcomputer sends the luminous power control signal to optical module (4);
Described optical module (4) receives the luminous power control signal and sends the laser testing signal to the testing laser detector, and the power of the light signal that sends by optical interface (3) reception testing laser device and light signal that the testing laser device is sent sends to single-chip microcomputer;
Described DA change-over circuit receives the output valve control signal and controls the laser instrument luminous power by the laser assembly control interface;
Described A/D convertor circuit receives the feedback test signal of testing laser detector and testing laser device, and sends to single-chip microcomputer.
2. described a kind of laser assembly test fixture according to claim 1 characterized by further comprising power module, and the power module input port links to each other with the single-chip microcomputer output port, and the power module outlet mouth links to each other with the laser assembly control interface; The Single-chip Controlling power module is powered to laser instrument.
3. described a kind of laser assembly test fixture according to claim 1, it is characterized in that described laser assembly control interface comprises computing regulating circuit, current control circuit, laser interface (2) and laser detector interface (1), described DA change-over circuit, computing regulating circuit, current control circuit, laser interface (2), computing regulating circuit link to each other successively, and the A/D convertor circuit port links to each other with current control circuit port, laser interface (2) and laser detector interface (1) respectively.
4. described a kind of laser assembly test fixture according to claim 3 is characterized in that described laser detector interface (1) is two.
5. described a kind of laser assembly test fixture according to claim 1 characterized by further comprising EEPROM, and the EEPROM port links to each other with one-chip machine port.
6. described a kind of laser assembly test fixture according to claim 1 is characterized in that described single-chip microcomputer adopts ATMEGA 128A single-chip microcomputer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN 201220627859 CN202903459U (en) | 2012-11-26 | 2012-11-26 | Laser assembly test tooling |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN 201220627859 CN202903459U (en) | 2012-11-26 | 2012-11-26 | Laser assembly test tooling |
Publications (1)
Publication Number | Publication Date |
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CN202903459U true CN202903459U (en) | 2013-04-24 |
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CN 201220627859 Expired - Lifetime CN202903459U (en) | 2012-11-26 | 2012-11-26 | Laser assembly test tooling |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104122466A (en) * | 2014-07-22 | 2014-10-29 | 泉州市明佳电子科技有限公司 | Test device of automotive bidirectional burglar alarm mainboard |
CN106324408A (en) * | 2016-10-10 | 2017-01-11 | 武汉锐科光纤激光技术股份有限公司 | Firing machine tool circuit for medium and high power continuous laser |
CN117871052A (en) * | 2024-01-15 | 2024-04-12 | 吉林省科英医疗激光有限责任公司 | Device and method for rapidly measuring laser output power in real time |
-
2012
- 2012-11-26 CN CN 201220627859 patent/CN202903459U/en not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104122466A (en) * | 2014-07-22 | 2014-10-29 | 泉州市明佳电子科技有限公司 | Test device of automotive bidirectional burglar alarm mainboard |
CN104122466B (en) * | 2014-07-22 | 2017-10-03 | 泉州市福连天电子科技有限公司 | A kind of test device of vehicle bidirectional theftproof device motherboard |
CN106324408A (en) * | 2016-10-10 | 2017-01-11 | 武汉锐科光纤激光技术股份有限公司 | Firing machine tool circuit for medium and high power continuous laser |
CN106324408B (en) * | 2016-10-10 | 2023-08-22 | 武汉锐科光纤激光技术股份有限公司 | Work circuit of baking machine for medium-high power continuous laser |
CN117871052A (en) * | 2024-01-15 | 2024-04-12 | 吉林省科英医疗激光有限责任公司 | Device and method for rapidly measuring laser output power in real time |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CX01 | Expiry of patent term |
Granted publication date: 20130424 |
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CX01 | Expiry of patent term |