CN203688743U - OLED device optical and electrical property testing system - Google Patents
OLED device optical and electrical property testing system Download PDFInfo
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- CN203688743U CN203688743U CN201420008791.8U CN201420008791U CN203688743U CN 203688743 U CN203688743 U CN 203688743U CN 201420008791 U CN201420008791 U CN 201420008791U CN 203688743 U CN203688743 U CN 203688743U
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Abstract
The utility model discloses an OLED device optical and electrical property testing system. The system comprises a computer used for providing a man-machine interaction interface and transmitting instructions; a single-chip microcomputer used for receiving the instructions transmitted from the computer, outputting AC pulse control signals and feedback mode control signals, and communicating with a multi-channel ADC, DAC1, and DAC2; the multi-channel ADC used for converting analog signals acquired from an AC drive circuit into digital signals and transmitting the digital signals to the single-chip microcomputer; the DAC1 and DAC2 used for converting control signals of the single-chip microcomputer into analog signals and transmitting the analog signals to an OLED drive and acquisition circuit; the OLED drive and acquisition circuit used for receiving the AC pulse control signals and the feedback mode control signals and outputting testing results; and a voltage reference source used for providing a reference voltage and a temperature sensor used for correcting. The system of the utility model is reasonable in circuit system structure and low in cost, and tests OLED optical and electrical properties through three modes, i.e., a constant voltage mode, a constant current mode, and a constant brightness mode. The system is advantaged by high testing speed, high precision, good reliability, and the like.
Description
Technical field
The utility model relates to device photoelectric characteristic test field, particularly a kind of OLED device photoelectric characteristic test system.
Background technology
At present, light emitting semiconductor device take Organic Light Emitting Diode (OLED) as representative, organic light emitting diode display (OLED) relies on its autoluminescence, fast response time, operating voltage is low, plate thickness is little, wide working temperature interval, wide visual angle, can make the many merits such as large scale pliability panel, gathering around and have broad application prospects, is the most popular current display technique.OLED becomes most potential display technique.
Although Organic Light Emitting Diode (OLED) display technique has obtained development rapidly in recent years, technical is not on the whole also very ripe, especially domestic OLED technology, is also in the starting stage.For a display device that will enter into market, we need to test sign to the performance of its each side, to reach the aobvious device standard of industry.At present very limited for the equipment of oled light electric performance test, and function singleness.
Therefore, need a kind of new Circuits System for manufacturer and demand unit, in order to organic light emitting diode device (OLED) is carried out to photoelectric characteristic test, and must develop low cost, high-speed and stable test macro, could apply on a large scale, thereby satisfy the demands veritably.
Utility model content
The purpose of this utility model is that the shortcoming that overcomes prior art, with not enough, provides a kind of OLED device photoelectric characteristic test system.
The purpose of this utility model realizes by following technical scheme:
A kind of OLED device photoelectric characteristic test system, comprises
For human-computer interaction interface being provided and sending the computing machine of instruction;
For the single-chip microcomputer of accepting instruction that computing machine sends output AC pulse control signal and feedback system control signal and communicating with hyperchannel ADC, DAC1, DAC2;
Be used for the hyperchannel ADC that the simulating signal collecting from AC driving circuit is converted to digital signal and sends single-chip microcomputer to;
Drive and DAC1, the DAC2 of Acquisition Circuit for the control signal of single-chip microcomputer being converted to simulating signal and sending OLED to;
The OLED driving and the Acquisition Circuit that output test result for accepting alternating-current pulse control signal and feedback system control signal;
And for the voltage reference source of reference voltage and the temperature sensor for proofreading and correct are provided;
Its Computer is connected with single-chip microcomputer, described single-chip microcomputer is connected with hyperchannel ADC, DAC1, DAC2 respectively, hyperchannel ADC drives and is connected with Acquisition Circuit with voltage reference source, temperature sensor, OLED respectively, OLED drives and is connected with DAC1, DAC2 respectively with Acquisition Circuit, DAC1, DAC2 are digital to analog converter, and ADC is analog to digital converter.
Described OLED drives with Acquisition Circuit and comprises analog operational circuit, AC driving circuit, brightness Acquisition Circuit, and alternating-current pulse control signal and the feedback system control signal of wherein said single-chip microcomputer output are sent to AC driving circuit; Described DAC1, DAC2 are connected with AC driving circuit by analog operational circuit; Described AC driving circuit the first output signal V
pV, V
pI, V
nV, V
nIbe connected with hyperchannel ADC by analog operational circuit; Described AC driving circuit is connected with brightness Acquisition Circuit; Described brightness Acquisition Circuit is connected with hyperchannel ADC by analog operational circuit; Described hyperchannel ADC exports signal to single-chip microcomputer.
Described analog operational circuit is a reverse scale operation amplifying circuit.
Described AC driving circuit is with the mode driving OLED of alternating-current pulse.The interchange dutycycle of alternating-current pulse is adjustable, can realize 1%～90% dutycycle.
Described brightness Acquisition Circuit comprises silicon photoelectric diode, R3, R4 and operational amplifier, and silicon photoelectric diode transfers the light of acceptance electric signal to and be converted to by the operational amplification circuit being made up of R3, R4, operational amplifier the voltage VL of output.
Described OLED device photoelectric characteristic test system also comprises SD card, and single-chip microcomputer leaves measured result in SD card.
Compared with prior art, tool has the following advantages and beneficial effect the utility model:
The utility model utilizes single-chip microcomputer as control chip, can control flexibly driving voltage and the waveform of OLED; The test error causing for device parameters with temperature drift, native system utilizes temperature sensor collecting temperature information, then utilizes single-chip microcomputer to compensate test error, makes native system can reach high measuring accuracy; The memory stores real time data of utilizing plate to carry, has improved the speed of data transmission, can carry out independent test by PC, has improved the reliability of system.
Accompanying drawing explanation
Fig. 1 is the structural representation of OLED device photoelectric characteristic test system described in the utility model;
Fig. 2 is that the OLED of system described in Fig. 1 drives and Acquisition Circuit structural representation;
Fig. 3 is the AC driving circuit schematic diagram of system described in Fig. 1;
Fig. 4 is the analog operational circuit schematic diagram of system described in Fig. 1;
Fig. 5 is the brightness Acquisition Circuit schematic diagram of system described in Fig. 1.
Embodiment
Below in conjunction with embodiment and accompanying drawing, the utility model is described in further detail, but embodiment of the present utility model is not limited to this.
As Fig. 1,2, a kind of OLED device photoelectric characteristic test system, comprises
For human-computer interaction interface being provided and sending the computing machine of instruction;
For the single-chip microcomputer of accepting instruction that computing machine sends output AC pulse control signal and feedback system control signal and communicating with hyperchannel ADC, DAC1, DAC2;
Be used for the hyperchannel ADC that the simulating signal collecting from AC driving circuit is converted to digital signal and sends single-chip microcomputer to;
Drive and DAC1, the DAC2 of Acquisition Circuit for the control signal of single-chip microcomputer being converted to simulating signal and sending OLED to;
The OLED driving and the Acquisition Circuit that output test result for accepting alternating-current pulse control signal and feedback system control signal; Described OLED drives with Acquisition Circuit and comprises analog operational circuit, AC driving circuit, brightness Acquisition Circuit, and alternating-current pulse control signal and the feedback system control signal of wherein said single-chip microcomputer output are sent to AC driving circuit; Described DAC1, DAC2 are connected with AC driving circuit by analog operational circuit; Described AC driving circuit the first output signal VPV, VPI, VNV, VNI are connected with hyperchannel ADC by analog operational circuit; Described AC driving circuit is connected with brightness Acquisition Circuit; Described brightness Acquisition Circuit is connected with hyperchannel ADC by analog operational circuit; Described hyperchannel ADC exports signal to single-chip microcomputer; As Fig. 4, described analog operational circuit is a reverse scale operation amplifying circuit; Described AC driving circuit is with the mode driving OLED of alternating-current pulse; As Fig. 5, described brightness Acquisition Circuit comprises silicon photoelectric diode, R3, R4 and operational amplifier, and silicon photoelectric diode transfers the light of acceptance electric signal to and be converted to by the operational amplification circuit being made up of R3, R4, operational amplifier the voltage VL of output;
And for the voltage reference source of reference voltage, SD card for the temperature sensor proofreaied and correct and storage single-chip microcomputer test result are provided;
Its Computer is connected with single-chip microcomputer, described single-chip microcomputer is connected with hyperchannel ADC, DAC1, DAC2 respectively, hyperchannel ADC drives and is connected with Acquisition Circuit with voltage reference source, temperature sensor, OLED respectively, OLED drives and is connected with DAC1, DAC2 respectively with Acquisition Circuit, DAC1, DAC2 are digital to analog converter, and ADC is analog to digital converter.
Single-chip microcomputer in above-described embodiment adopts 32 single-chip microcomputers, in addition can also adopt other single-chip microcomputers such as 64 single-chip microcomputers.
Illustrate the specific works process of the OLED device photoelectric characteristic test system of the present embodiment below:
Drive test process as follows to OLED device constant voltage:
1) as shown in Figure 3, OLED device to be measured is arranged in testing cassete;
2) while then inputting constant voltage drive pattern on computer man-machine interacting interface, by digital to analog converter DAC1, DAC2, then outputting analog signal VP, VN. are low level by single-chip I/O mouth control Q6 input end to corresponding magnitude of voltage respectively, so Q6 pinch off, multiplexer M9 input termination VSS, multiplexer M8 meets VSS, so M3, M4 output low level, Q4, Q5 are by pinch off.Therefore the right half part of test module can not have impact to OLED, , through this VP of simulation trial, VN is input to respectively the M5 of multiplexer, M6, select VP to be input to the forward end of M1 by the control multiplexer M5 of single-chip microcomputer, the now Q2 conducting of M1 output voltage, single-chip I/O mouth control Q1 conducting simultaneously, due to retroactive effect VPV=VFPV, and by the empty disconnected empty short characteristic of computing circuit, can obtain VFPV=VP, so can control the constant of VPV by keeping the constant of VP, in like manner multiplexer M6 is by single-chip I/O mouth control access VN, the same now VNV=VFNV=VN, so can control the constant of VNV by keeping the constant of VN,
3) can realize as mentioned above constant voltage control OLED, then by sampling resistor RO1, gather the value of VPI, can draw through calculating electric current I=(the VPI-VSS)/RO1 that flows through OLED, result is saved in single-chip microcomputer, then the monochrome information that gathers OLED by brightness Acquisition Circuit, is converted to voltage VL and is saved in single-chip microcomputer.
OLED device is exchanged to driving process as follows:
1) after the input AC Impulsive control mode of computer man-machine interacting interface, first to add positive voltage at OLED two ends, by calculating corresponding magnitude of voltage by digital to analog converter DAC1, DAC2 outputting analog signal VP, VN respectively, then single-chip I/O mouth control Q6 input end is low level, so Q6 pinch off, multiplexer M9 input termination VSS, multiplexer M8 meets VSS, so M3, M4 output low level, Q4, Q5 are by pinch off.Therefore the right half part of test module can not have impact to OLED.Be input to respectively M5, the M6 of multiplexer through simulation trial VP, VN, with above-mentioned constant voltage test philosophy, the voltage at OLED two ends keeps forward constant.
2) then to add negative voltage at OLED two ends, first to add positive voltage at OLED two ends, by calculating corresponding magnitude of voltage by digital to analog converter DAC1, DAC2 outputting analog signal VP, VN respectively, first be low level by single-chip I/O mouth control Q1 input end, so Q1 pinch off, multiplexer M5 input termination VSS, multiplexer M6 meets VSS, so M1, M2 output low level, Q2, Q3 are by pinch off.Therefore the left-half of test module can not have impact to OLED, is input to respectively M8, the M9 of multiplexer through simulation trial VP, VN, and with above-mentioned constant voltage test philosophy, the voltage at OLED two ends keeps negative sense constant.
In sum, can realize alternating-current pulse control OLED according to certain frequency above-mentioned two steps that circulate, and dutycycle is adjustable.
As follows to OLED device steady current test process:
In the time inputting constant-current mode on the human-computer interaction interface at computing machine, by calculating corresponding magnitude of voltage by digital to analog converter DAC2 outputting analog signal VN respectively, be input to multiplexer M6 through simulation trial, with above-mentioned principle, can control Q2 by single-chip I/O mouth, Q4, Q5, Q6 pinch off, then select VN to be input to the forward end of M2 by the control multiplexer M6 of single-chip microcomputer, select VFPI to be input to the negative end of M2 by the control multiplexer M7 of single-chip microcomputer simultaneously, the now Q3 conducting of M2 output voltage, single-chip I/O mouth control Q1 conducting simultaneously, due to retroactive effect VPI=VFPI, and by the empty disconnected empty short characteristic of computing circuit, can obtain VFPI=VN, so can control the constant of VPI by keeping the constant of VN, thereby guarantee to flow through electric current constant of OLED, then gather respectively VPV, the value of VNV, gather the monochrome information of OLED by brightness Acquisition Circuit, then send these information to single-chip microcomputer.
As follows to OLED device constant luminance test process:
Need first record in the external world current value I that original intensity is corresponding (0).Then on the human-computer interaction interface of computing machine, select constant luminance pattern, and input the value of initial current I (0).With above-mentioned principle, single-chip microcomputer will be controlled metal-oxide-semiconductor and multiplexer, make OLED forward drive circuit turn-on.In Fig. 3, multiplexer M5 gating VSS, M6 gating VN, M7 gating VFL, M8, the equal gating VSS of M9, single-chip microcomputer is output low level on PMOS pipe Q1, and on Q6, exports high level.Q1 afterwards, Q3 conducting, and Q2, Q4, Q5, Q6 cut-off.Single-chip Controlling DAC2 exports a specific magnitude of voltage, then gathers OLED actual current, and compares with I (0), if error, in given scope, no longer regulates VN, enters permanent luminance patterns work.If error is not in given range, single-chip microcomputer can regulate the output of DAC2, by changing the value of VN, thereby change electric current and the brightness of OLED, until the electric current of OLED and I (0) error is allowed to, brightness and the original intensity approximately equal of OLED output, stop regulating DAC2 like this, the large young pathbreaker of VN keeps constant, enters permanent luminance patterns work.
As follows to OLED device brightness test process:
As shown in Figure 4, when silicon photo diode collects the light time, meeting generation current, thus add voltage U at amplifier two ends, can obtain VL=(R3+R4) * I by amplifying circuit principle, VL is passed to single-chip microcomputer, complete the work that gathers brightness.
Above-described embodiment is preferably embodiment of the utility model; but embodiment of the present utility model is not restricted to the described embodiments; other any do not deviate from change, the modification done under Spirit Essence of the present utility model and principle, substitutes, combination, simplify; all should be equivalent substitute mode, within being included in protection domain of the present utility model.
Claims (6)
1. an OLED device photoelectric characteristic test system, is characterized in that: comprise
For human-computer interaction interface being provided and sending the computing machine of instruction;
For the single-chip microcomputer of accepting instruction that computing machine sends output AC pulse control signal and feedback system control signal and communicating with hyperchannel ADC, DAC1, DAC2;
Be used for the hyperchannel ADC that the simulating signal collecting from AC driving circuit is converted to digital signal and sends single-chip microcomputer to;
Drive and DAC1, the DAC2 of Acquisition Circuit for the control signal of single-chip microcomputer being converted to simulating signal and sending OLED to;
The OLED driving and the Acquisition Circuit that output test result for accepting alternating-current pulse control signal and feedback system control signal;
And for the voltage reference source of reference voltage and the temperature sensor for proofreading and correct are provided;
Its Computer is connected with single-chip microcomputer, described single-chip microcomputer is connected with hyperchannel ADC, DAC1, DAC2 respectively, hyperchannel ADC drives and is connected with Acquisition Circuit with voltage reference source, temperature sensor, OLED respectively, OLED drives and is connected with DAC1, DAC2 respectively with Acquisition Circuit, DAC1, DAC2 are digital to analog converter, and ADC is analog to digital converter.
2. OLED device photoelectric characteristic test system according to claim 1, it is characterized in that: described OLED drives with Acquisition Circuit and comprises analog operational circuit, AC driving circuit, brightness Acquisition Circuit, alternating-current pulse control signal and the feedback system control signal of wherein said single-chip microcomputer output are sent to AC driving circuit; Described DAC1, DAC2 are connected with AC driving circuit by analog operational circuit; Described AC driving circuit the first output signal V
pV, V
pI, V
nV, V
nIbe connected with hyperchannel ADC by analog operational circuit; Described AC driving circuit is connected with brightness Acquisition Circuit; Described brightness Acquisition Circuit is connected with hyperchannel ADC by analog operational circuit; Described hyperchannel ADC exports signal to single-chip microcomputer.
3. OLED device photoelectric characteristic test system according to claim 2, is characterized in that: described analog operational circuit is a reverse scale operation amplifying circuit.
4. OLED device photoelectric characteristic test system according to claim 2, is characterized in that: described AC driving circuit is with the mode driving OLED of alternating-current pulse.
5. OLED device photoelectric characteristic test system according to claim 2, it is characterized in that: described brightness Acquisition Circuit comprises silicon photoelectric diode, R3, R4 and operational amplifier, silicon photoelectric diode transfers the light of acceptance electric signal to and is converted to by the operational amplification circuit being made up of R3, R4, operational amplifier the voltage VL of output.
6. OLED device photoelectric characteristic test system according to claim 1, is characterized in that: also comprise SD card, single-chip microcomputer leaves measured result in SD card in.
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| CN201420008791.8U CN203688743U (en) | 2014-01-07 | 2014-01-07 | OLED device optical and electrical property testing system |
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| CN201420008791.8U CN203688743U (en) | 2014-01-07 | 2014-01-07 | OLED device optical and electrical property testing system |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103760483A (en) * | 2014-01-07 | 2014-04-30 | 华南理工大学 | Optical-electrical characteristic testing system for OLED device |
| CN104155508A (en) * | 2014-08-01 | 2014-11-19 | 武汉精测电子技术股份有限公司 | Signal current detection device and method of OLED CELL detection equipment |
| CN105514300A (en) * | 2014-10-10 | 2016-04-20 | 三星显示有限公司 | Method of inspecting quality of organic light-emitting diode and inspecting system for performing the method |
| CN109738774A (en) * | 2018-11-29 | 2019-05-10 | 西北工业大学 | A kind of diode detection instrument |
| CN109752990A (en) * | 2018-11-29 | 2019-05-14 | 西北工业大学 | A kind of control of multi-channel circuit on-off and voltage collecting device |
-
2014
- 2014-01-07 CN CN201420008791.8U patent/CN203688743U/en not_active Expired - Lifetime
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103760483A (en) * | 2014-01-07 | 2014-04-30 | 华南理工大学 | Optical-electrical characteristic testing system for OLED device |
| CN104155508A (en) * | 2014-08-01 | 2014-11-19 | 武汉精测电子技术股份有限公司 | Signal current detection device and method of OLED CELL detection equipment |
| CN105514300A (en) * | 2014-10-10 | 2016-04-20 | 三星显示有限公司 | Method of inspecting quality of organic light-emitting diode and inspecting system for performing the method |
| US10317457B2 (en) | 2014-10-10 | 2019-06-11 | Samsung Display Co., Ltd. | Method of inspecting quality of organic light-emitting diode and inspecting system for performing the method |
| CN105514300B (en) * | 2014-10-10 | 2019-10-29 | 三星显示有限公司 | It checks the method for the quality of Organic Light Emitting Diode and checks system |
| CN109738774A (en) * | 2018-11-29 | 2019-05-10 | 西北工业大学 | A kind of diode detection instrument |
| CN109752990A (en) * | 2018-11-29 | 2019-05-14 | 西北工业大学 | A kind of control of multi-channel circuit on-off and voltage collecting device |
| CN109752990B (en) * | 2018-11-29 | 2023-12-05 | 西北工业大学 | Multichannel circuit on-off control and voltage acquisition device |
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Effective date of registration: 20190409 Address after: 510663 G614, 201 Kezhu Road, Science City, Guangzhou High-tech Industrial Development Zone, Guangzhou, Guangdong Province Patentee after: Guangzhou Jinghe Measurement and Control Technology Co.,Ltd. Address before: 510640 No. five, 381 mountain road, Guangzhou, Guangdong, Tianhe District Patentee before: South China University of Technology |
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Granted publication date: 20140702 |