CN103760483A - Optical-electrical characteristic testing system for OLED device - Google Patents
Optical-electrical characteristic testing system for OLED device Download PDFInfo
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- CN103760483A CN103760483A CN201410007644.3A CN201410007644A CN103760483A CN 103760483 A CN103760483 A CN 103760483A CN 201410007644 A CN201410007644 A CN 201410007644A CN 103760483 A CN103760483 A CN 103760483A
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Abstract
The invention discloses an optical-electrical characteristic testing system for an OLED device. The optical-electrical characteristic testing system for the OLED device comprises a computer, a single chip microcomputer, a multichannel ADC, a DAC1, a DAC2, an OLED driving and collecting circuit, a voltage reference source and a temperature sensor. The computer is used for providing a human-computer interaction interface and giving out instructions. The single chip microcomputer is used for receiving the instructions given out by the computer and outputting AC pulse control signals and feedback mode control signals, and is in communication with the multichannel ADC, the DAC1 and the DAC2. The multichannel ADC is used for converting simulation signals collected from an AC driving circuit into digital signals and then transmitting the digital signals to the single chip microcomputer. The DAC1 and the DAC2 are used for converting the control signals of the single chip microcomputer into simulation signals and transmitting the simulation signals to the OLED driving and collecting circuit. The OLED driving and collecting circuit is used for receiving the AC pulse control signals and the feedback mode control signals to output testing results. The voltage reference source is sued for providing reference voltages, and the temperature sensor is used for correcting. The optical-electrical characteristic testing system for the OLED device is reasonable in circuit system structure and low in cost, the optical-electrical characteristics are tested through the three modes of constant voltages, constant currents and constant brightness, and the advantages of being high in testing speed, high in precision and good in reliability are achieved.
Description
Technical field
The present invention relates to device photoelectric characteristic test field, particularly a kind of OLED device photoelectric characteristic test system.
Background technology
At present, the light emitting semiconductor device that the Organic Light Emitting Diode (OLED) of take is representative, organic light emitting diode display (OLED) relies on its autoluminescence, fast response time, operating voltage is low, plate thickness is little, wide working temperature interval, wide visual angle, can make the many merits such as large scale pliability panel, gathering around and have broad application prospects, is the most popular current display technique.OLED becomes most potential display technique.
Although Organic Light Emitting Diode (OLED) display technique has obtained development rapidly in recent years, technical is not on the whole also very ripe, especially domestic OLED technology, is also in the starting stage.For a display device that will enter into market, we need to test sign to the performance of its each side, to reach the aobvious device standard of industry.At present very limited for the equipment of oled light electric performance test, and function singleness.
Therefore, for manufacturer and demand unit, need a kind of new Circuits System, in order to organic light emitting diode device (OLED) is carried out to photoelectric characteristic test, and must develop low-cost, high-speed and stable test macro, could apply on a large scale, thereby satisfy the demands veritably.
Summary of the invention
The shortcoming that the object of the invention is to overcome prior art, with not enough, provides a kind of OLED device photoelectric characteristic test system.
Object of the present invention realizes by following technical scheme:
An OLED device photoelectric characteristic test system, comprises
For human-computer interaction interface being provided and sending the computing machine of instruction;
For the single-chip microcomputer of accepting instruction that computing machine sends output AC pulse control signal and feedback system control signal and communicating with hyperchannel ADC, DAC1, DAC2;
Be used for the hyperchannel ADC that the simulating signal collecting from AC driving circuit is converted to digital signal and sends single-chip microcomputer to;
For the control signal of single-chip microcomputer being converted to simulating signal and sending OLED to, drive DAC1, the DAC2 with Acquisition Circuit;
The OLED driving and the Acquisition Circuit that for accepting alternating-current pulse control signal and feedback system control signal, output test result;
And for voltage reference source and the temperature sensor for proofreading and correct of reference voltage are provided;
Its Computer is connected with single-chip microcomputer, described single-chip microcomputer is connected with hyperchannel ADC, DAC1, DAC2 respectively, hyperchannel ADC drives and is connected with Acquisition Circuit with voltage reference source, temperature sensor, OLED respectively, OLED drives and is connected with DAC1, DAC2 respectively with Acquisition Circuit, DAC1, DAC2 are digital to analog converter, and ADC is analog to digital converter.
Described OLED drives with Acquisition Circuit and comprises analog operational circuit, AC driving circuit, brightness Acquisition Circuit, and alternating-current pulse control signal and the feedback system control signal of wherein said single-chip microcomputer output are sent to AC driving circuit; Described DAC1, DAC2 are connected with AC driving circuit by analog operational circuit; Described AC driving circuit the first output signal V
pV, V
pI, V
nV, V
nIby analog operational circuit, be connected with hyperchannel ADC; Described AC driving circuit is connected with brightness Acquisition Circuit; Described brightness Acquisition Circuit is connected with hyperchannel ADC by analog operational circuit; Described hyperchannel ADC exports signal to single-chip microcomputer.
Described analog operational circuit is a reverse scale operation amplifying circuit.
Described AC driving circuit is with the mode driving OLED of alternating-current pulse.The interchange dutycycle of alternating-current pulse is adjustable, can realize 1%～90% dutycycle.
Described brightness Acquisition Circuit comprises silicon photoelectric diode, R3, R4 and operational amplifier, and silicon photoelectric diode transfers the light of acceptance to electric signal and by the operational amplification circuit being comprised of R3, R4, operational amplifier, is converted to the voltage VL of output.
Described OLED device photoelectric characteristic test system also comprises SD card, and single-chip microcomputer leaves measured result in SD card.
Compared with prior art, tool has the following advantages and beneficial effect in the present invention:
The present invention utilizes single-chip microcomputer as control chip, can control flexibly driving voltage and the waveform of OLED; The test error causing for device parameters with temperature drift, native system utilizes temperature sensor collecting temperature information, then utilizes single-chip microcomputer to compensate test error, makes native system can reach high measuring accuracy; The memory stores real time data of utilizing plate to carry, has improved the speed of data transmission, can carry out independent test by PC, has improved the reliability of system.
Accompanying drawing explanation
Fig. 1 is the structural representation of OLED device photoelectric characteristic test system of the present invention;
Fig. 2 is that the OLED of system described in Fig. 1 drives and Acquisition Circuit structural representation;
Fig. 3 is the AC driving circuit schematic diagram of system described in Fig. 1;
Fig. 4 is the analog operational circuit schematic diagram of system described in Fig. 1;
Fig. 5 is the brightness Acquisition Circuit schematic diagram of system described in Fig. 1.
Embodiment
Below in conjunction with embodiment and accompanying drawing, the present invention is described in further detail, but embodiments of the present invention are not limited to this.
As Fig. 1,2, a kind of OLED device photoelectric characteristic test system, comprises
For human-computer interaction interface being provided and sending the computing machine of instruction;
For the single-chip microcomputer of accepting instruction that computing machine sends output AC pulse control signal and feedback system control signal and communicating with hyperchannel ADC, DAC1, DAC2;
Be used for the hyperchannel ADC that the simulating signal collecting from AC driving circuit is converted to digital signal and sends single-chip microcomputer to;
For the control signal of single-chip microcomputer being converted to simulating signal and sending OLED to, drive DAC1, the DAC2 with Acquisition Circuit;
The OLED driving and the Acquisition Circuit that for accepting alternating-current pulse control signal and feedback system control signal, output test result; Described OLED drives with Acquisition Circuit and comprises analog operational circuit, AC driving circuit, brightness Acquisition Circuit, and alternating-current pulse control signal and the feedback system control signal of wherein said single-chip microcomputer output are sent to AC driving circuit; Described DAC1, DAC2 are connected with AC driving circuit by analog operational circuit; Described AC driving circuit the first output signal VPV, VPI, VNV, VNI are connected with hyperchannel ADC by analog operational circuit; Described AC driving circuit is connected with brightness Acquisition Circuit; Described brightness Acquisition Circuit is connected with hyperchannel ADC by analog operational circuit; Described hyperchannel ADC exports signal to single-chip microcomputer; As Fig. 4, described analog operational circuit is a reverse scale operation amplifying circuit; Described AC driving circuit is with the mode driving OLED of alternating-current pulse; As Fig. 5, described brightness Acquisition Circuit comprises silicon photoelectric diode, R3, R4 and operational amplifier, and silicon photoelectric diode transfers the light of acceptance to electric signal and by the operational amplification circuit being comprised of R3, R4, operational amplifier, is converted to the voltage VL of output;
And for the voltage reference source of reference voltage is provided, for the SD card of the temperature sensor proofreaied and correct and storage single-chip microcomputer test result;
Its Computer is connected with single-chip microcomputer, described single-chip microcomputer is connected with hyperchannel ADC, DAC1, DAC2 respectively, hyperchannel ADC drives and is connected with Acquisition Circuit with voltage reference source, temperature sensor, OLED respectively, OLED drives and is connected with DAC1, DAC2 respectively with Acquisition Circuit, DAC1, DAC2 are digital to analog converter, and ADC is analog to digital converter.
Single-chip microcomputer in above-described embodiment adopts 32 single-chip microcomputers, in addition can also adopt other single-chip microcomputers such as 64 single-chip microcomputers.
Illustrate the specific works process of the OLED device photoelectric characteristic test system of the present embodiment below:
To OLED device constant voltage, drive test process as follows:
1) as shown in Figure 3, OLED device to be measured is arranged in testing cassete;
2) while then inputting constant voltage drive pattern on computer man-machine interacting interface, corresponding magnitude of voltage by digital to analog converter DAC1, DAC2 respectively outputting analog signal VP, VN. then by single-chip I/O mouth, to control Q6 input end be low level, so Q6 pinch off, multiplexer M9 input termination VSS, multiplexer M8 meets VSS, so M3, M4 output low level, Q4, Q5 are by pinch off.Therefore the right half part of test module can not have impact to OLED, , through this VP of simulation trial, VN is input to respectively the M5 of multiplexer, M6, control multiplexer M5 by single-chip microcomputer selects VP to be input to the forward end of M1, the now Q2 conducting of M1 output voltage, single-chip I/O mouth is controlled Q1 conducting simultaneously, due to retroactive effect VPV=VFPV, and by the empty disconnected empty short characteristic of computing circuit, can obtain VFPV=VP, so can control the constant of VPV by keeping the constant of VP, in like manner multiplexer M6 controls access VN by single-chip I/O mouth, the same now VNV=VFNV=VN, so can control the constant of VNV by keeping the constant of VN,
3) can realize as mentioned above constant voltage and control OLED, then by sampling resistor RO1, gather the value of VPI, through calculating, can draw electric current I=(the VPI-VSS)/RO1 that flows through OLED, result is saved in single-chip microcomputer, then by brightness Acquisition Circuit, gather the monochrome information of OLED, be converted to voltage VL and be saved in single-chip microcomputer.
OLED device is exchanged to driving process as follows:
1) after the input AC Impulsive control mode of computer man-machine interacting interface, first to add positive voltage at OLED two ends, by calculating corresponding magnitude of voltage by digital to analog converter DAC1, DAC2 difference outputting analog signal VP, VN, then single-chip I/O mouth control Q6 input end is low level, so Q6 pinch off, multiplexer M9 input termination VSS, multiplexer M8 meets VSS, so M3, M4 output low level, Q4, Q5 are by pinch off.Therefore the right half part of test module can not have impact to OLED.Through simulation trial VP, VN, be input to respectively M5, the M6 of multiplexer, with above-mentioned constant voltage test philosophy, the voltage at OLED two ends keeps forward constant.
2) then to add negative voltage at OLED two ends, first to add positive voltage at OLED two ends, by calculating corresponding magnitude of voltage by digital to analog converter DAC1, DAC2 difference outputting analog signal VP, VN, first by single-chip I/O mouth, controlling Q1 input end is low level, so Q1 pinch off, multiplexer M5 input termination VSS, multiplexer M6 meets VSS, so M1, M2 output low level, Q2, Q3 are by pinch off.Therefore the left-half of test module can not have impact to OLED, is input to respectively M8, the M9 of multiplexer through simulation trial VP, VN, and with above-mentioned constant voltage test philosophy, the voltage at OLED two ends keeps negative sense constant.
In sum, according to certain frequency above-mentioned two steps that circulate, can realize alternating-current pulse and control OLED, and dutycycle is adjustable.
As follows to OLED device steady current test process:
While inputting constant-current mode on the human-computer interaction interface at computing machine, by calculating corresponding magnitude of voltage by digital to analog converter DAC2 difference outputting analog signal VN, through simulation trial, be input to multiplexer M6, with above-mentioned principle, by single-chip I/O mouth, can control Q2, Q4, Q5, Q6 pinch off, then the control multiplexer M6 by single-chip microcomputer selects VN to be input to the forward end of M2, control multiplexer M7 by single-chip microcomputer selects VFPI to be input to the negative end of M2 simultaneously, the now Q3 conducting of M2 output voltage, single-chip I/O mouth is controlled Q1 conducting simultaneously, due to retroactive effect VPI=VFPI, and by the empty disconnected empty short characteristic of computing circuit, can obtain VFPI=VN, so can control the constant of VPI by keeping the constant of VN, thereby guarantee to flow through electric current constant of OLED, then gather respectively VPV, the value of VNV, by brightness Acquisition Circuit, gather the monochrome information of OLED, then send these information to single-chip microcomputer.
As follows to OLED device constant luminance test process:
Need first record in the external world current value I that original intensity is corresponding (0).Then on the human-computer interaction interface of computing machine, select constant luminance pattern, and input the value of initial current I (0).With above-mentioned principle, single-chip microcomputer will be controlled metal-oxide-semiconductor and multiplexer, make OLED forward drive circuit turn-on.In Fig. 3, multiplexer M5 gating VSS, M6 gating VN, M7 gating VFL, M8, the equal gating VSS of M9, single-chip microcomputer is output low level on PMOS pipe Q1, and on Q6, exports high level.Q1 afterwards, Q3 conducting, and Q2, Q4, Q5, Q6 cut-off.Single-chip Controlling DAC2 exports a specific magnitude of voltage, then gathers OLED actual current, and compares with I (0), if error, in given scope, no longer regulates VN, enters permanent luminance patterns work.If error is not in given range, single-chip microcomputer can regulate the output of DAC2, by changing the value of VN, thereby change electric current and the brightness of OLED, until the electric current of OLED and I (0) error is allowed to, brightness and the original intensity approximately equal of OLED output, stop regulating DAC2 like this, the large young pathbreaker of VN keeps constant, enters permanent luminance patterns work.
As follows to OLED device brightness test process:
As shown in Figure 4, when silicon photo diode collects the light time, meeting generation current, thus at amplifier two ends, add voltage U, by amplifying circuit principle, can obtain VL=(R3+R4) * I, VL is passed to single-chip microcomputer, completed the work that gathers brightness.
Above-described embodiment is preferably embodiment of the present invention; but embodiments of the present invention are not restricted to the described embodiments; other any do not deviate from change, the modification done under Spirit Essence of the present invention and principle, substitutes, combination, simplify; all should be equivalent substitute mode, within being included in protection scope of the present invention.
Claims (6)
1. an OLED device photoelectric characteristic test system, is characterized in that: comprise
For human-computer interaction interface being provided and sending the computing machine of instruction;
For the single-chip microcomputer of accepting instruction that computing machine sends output AC pulse control signal and feedback system control signal and communicating with hyperchannel ADC, DAC1, DAC2;
Be used for the hyperchannel ADC that the simulating signal collecting from AC driving circuit is converted to digital signal and sends single-chip microcomputer to;
For the control signal of single-chip microcomputer being converted to simulating signal and sending OLED to, drive DAC1, the DAC2 with Acquisition Circuit;
The OLED driving and the Acquisition Circuit that for accepting alternating-current pulse control signal and feedback system control signal, output test result;
And for voltage reference source and the temperature sensor for proofreading and correct of reference voltage are provided;
Its Computer is connected with single-chip microcomputer, described single-chip microcomputer is connected with hyperchannel ADC, DAC1, DAC2 respectively, hyperchannel ADC drives and is connected with Acquisition Circuit with voltage reference source, temperature sensor, OLED respectively, OLED drives and is connected with DAC1, DAC2 respectively with Acquisition Circuit, DAC1, DAC2 are digital to analog converter, and ADC is analog to digital converter.
2. OLED device photoelectric characteristic test system according to claim 1, it is characterized in that: described OLED drives with Acquisition Circuit and comprises analog operational circuit, AC driving circuit, brightness Acquisition Circuit, alternating-current pulse control signal and the feedback system control signal of wherein said single-chip microcomputer output are sent to AC driving circuit; Described DAC1, DAC2 are connected with AC driving circuit by analog operational circuit; Described AC driving circuit the first output signal V
pV, V
pI, V
nV, V
nIby analog operational circuit, be connected with hyperchannel ADC; Described AC driving circuit is connected with brightness Acquisition Circuit; Described brightness Acquisition Circuit is connected with hyperchannel ADC by analog operational circuit; Described hyperchannel ADC exports signal to single-chip microcomputer.
3. OLED device photoelectric characteristic test system according to claim 2, is characterized in that: described analog operational circuit is a reverse scale operation amplifying circuit.
4. OLED device photoelectric characteristic test system according to claim 2, is characterized in that: described AC driving circuit is with the mode driving OLED of alternating-current pulse.
5. OLED device photoelectric characteristic test system according to claim 2, it is characterized in that: described brightness Acquisition Circuit comprises silicon photoelectric diode, R3, R4 and operational amplifier, silicon photoelectric diode transfers the light of acceptance to electric signal and by the operational amplification circuit being comprised of R3, R4, operational amplifier, is converted to the voltage VL of output.
6. OLED device photoelectric characteristic test system according to claim 1, is characterized in that: also comprise SD card, single-chip microcomputer leaves measured result in SD card in.
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Application publication date: 20140430 |