CN110445538A - A kind of optical module multiple channel test system - Google Patents
A kind of optical module multiple channel test system Download PDFInfo
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- CN110445538A CN110445538A CN201910875606.2A CN201910875606A CN110445538A CN 110445538 A CN110445538 A CN 110445538A CN 201910875606 A CN201910875606 A CN 201910875606A CN 110445538 A CN110445538 A CN 110445538A
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- 230000003287 optical effect Effects 0.000 title claims abstract description 57
- 238000012360 testing method Methods 0.000 title claims abstract description 43
- 238000006243 chemical reaction Methods 0.000 claims description 7
- MKGHDZIEKZPBCZ-ULQPCXBYSA-N methyl (2s,3s,4r,5r,6r)-4,5,6-trihydroxy-3-methoxyoxane-2-carboxylate Chemical compound CO[C@H]1[C@H](O)[C@@H](O)[C@H](O)O[C@@H]1C(=O)OC MKGHDZIEKZPBCZ-ULQPCXBYSA-N 0.000 claims 7
- 238000000034 method Methods 0.000 description 5
- 230000001276 controlling effect Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
- H04B10/07955—Monitoring or measuring power
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Optical Communication System (AREA)
Abstract
The invention discloses a kind of optical module multiple channel test systems, status indicator lamp is tried including the standard optical module applicable with CDR, 32 channel photoswitches, state display lamp, module to be measured, current acquisition chip, MCU, 8 road electric current driving chips and module commissioning, the standard optical module applicable of the band CDR is connect by optical patchcord with 32 channel photoswitch.In the present invention, in the examination of room temperature commissioning, adjust tester that can leave with the short time, the commissioning for carrying out other products is gone to try, after the completion of this organizes module testing to be measured, it only needs to try status indicator lamp according to module commissioning to judge the tune test mode of module to be measured, and in the high and low temperature test, since 16 modules to be measured are constantly in power supply state, so after only needing to wait for a period of time, 16 modules to be measured just can start to be tested, and can greatly save the testing time in this way, while improve test consistency.
Description
Technical field
The present invention relates to technical field of photo communication more particularly to a kind of optical module multiple channel test systems.
Background technique
With the fast development of optical communication technique and Internet of Things, core component of the optical module as network interconnection intercommunication, In
More and more fields have obtained large-scale application, and critical component-optical device used in optical module, performance parameter is by temperature
Be affected, generally can be to optical module in order to examine whether the performance of optical module meets requirement under high and low temperature environment
Progress high temperature performance test, and single channel test macro at this stage, the survey due to the temperature characterisitic of optical device, in test
It is generally not high to try efficiency.
In the examination of room temperature commissioning, every time after the completion of test, requires to replace next module to be measured manually, need tester
Before member is sitting in test macro always, other operations can not be carried out；If carrying out the high and low temperature test, then each optical module requires
It individually waits for a period of time, in optical module negligible amounts to be tested, this method is also possible to be applicable in, but works as optical mode number of blocks
When more, which then seems that efficiency is very low, because being tested for the property when carrying out module temperature test to module
The time it takes is less, is to waste more time in the waiting of module the operation is stable state instead, if it is possible to not
Single carries out the performance test of more modules under the premise of opening chamber door, then is equivalent to the temperature etc. for greatly reducing every module
To the time, test speed can be greatly speeded up, meets the requirement of production and scientific research.
Summary of the invention
It is an object of the invention to: the high temperature performance testing efficiency in order to solve the problems, such as traditional optical module is lower,
And a kind of optical module multiple channel test system proposed.
To achieve the goals above, present invention employs following technical solutions:
A kind of optical module multiple channel test system, including the standard optical module applicable with CDR, 32 channel photoswitches, status display
Lamp, module to be measured, current acquisition chip, MCU, 8 road electric current driving chips and module commissioning try status indicator lamp, the band CDR
Standard optical module applicable connect with 32 channel photoswitch by optical patchcord, and 32 channel photoswitch by standard sources and
32 module connections to be measured, the MCU are expanded into 16 tunnels by two 8 road IIC expensive chips, and the MCU passes through
It controls the described 2nd 8 road I/O mouthfuls of expensive chip the TX Disable foot of the module to be measured is drawn high or dragged down, it is described
MCU increases by the 8 road electric current driving chip driving capability, the 8 road electricity by the road I/O mouthfuls of expensive chip of control the described 3rd 8
Driving chip is flowed, the low and high level output of the 8 road electric current driving chip refers to for completing the different module tune test modes
Show the state control of lamp.
It is as above-mentioned technical proposal to further describe:
The TX Fault of the module to be measured, RX LOS, TX Disable state shown by state display lamp.
It is as above-mentioned technical proposal to further describe:
Module to be measured state in place and los state are read by the MCU.
It is as above-mentioned technical proposal to further describe:
The MCU controlling to the power switch of the module to be measured by the one 8 road I/O mouthfuls of expensive chip.
It is as above-mentioned technical proposal to further describe:
The collected voltage of current acquisition chip is flowed into the 8 road ADC conversion chip.
It is as above-mentioned technical proposal to further describe:
The MCU reads the AD value in the 8 road ADC conversion chip, and is converted into the corresponding blocks current to be measured
Value.
In conclusion by adopting the above-described technical solution, the beneficial effects of the present invention are:
In the present invention, in the examination of room temperature commissioning, adjusts tester that can leave with the short time, go the commissioning for carrying out other products
Examination, after the completion of this organizes module testing to be measured, it is only necessary to status indicator lamp be tried according to module commissioning to judge the tune of module to be measured
Test mode, and in the high and low temperature test, since 16 modules to be measured are constantly in power supply state, so only needing to wait one section
After time, 16 modules to be measured just can start to be tested, and can greatly save the testing time in this way, while improving test
Consistency.
Detailed description of the invention
Fig. 1 is a kind of multiple channel test schematic construction schematic diagram of optical module multiple channel test system proposed by the present invention；
Fig. 2 is a kind of multi-channel system schematic construction schematic diagram of optical module multiple channel test system proposed by the present invention.
Marginal data:
1, with the standard optical module applicable of CDR；2,32 channel photoswitch；3, state display lamp；4, module to be measured；5, current acquisition
Chip；6, the one 8 road I/O mouthfuls of expensive chip；7,8 road IIC expensive chip；8, the 2nd 8 road I/O mouthfuls of expensive chip；9,8 road ADC
Conversion chip；10,MCU；11, the 3rd 8 road I/O mouthfuls of expensive chip；12,8 road electric current driving chip；13, module tune test mode
Indicator light.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts all other
Embodiment shall fall within the protection scope of the present invention.
Embodiment 1
Referring to Fig. 1, a kind of optical module multiple channel test system, is opened including the standard optical module applicable 1 with CDR, 32 channel light
It closes 2, state display lamp 3, module to be measured 4, current acquisition chip 5, MCU10,8 road electric current driving chips 12 and module commissioning and tries shape
State indicator light 13, the standard optical module applicable 1 with CDR is connect by optical patchcord with 32 channel photoswitches 2, and 32 channel photoswitches 2
Standard sources is connect with 32 modules 4 to be measured, by controlling 32 channel photoswitch, 2 access, is respectively completed to 32 moulds to be measured
The commissioning of block 4 is tried, and MCU10 is expanded into 16 tunnels by two 8 road IIC expensive chips 7, is realized to the independent of 16 modules 4 to be measured
Read-write and debugging respectively, MCU10 by the 2nd 8 road I/O mouthfuls of expensive chip 8 of control to the TXDisable foot of module 4 to be measured into
Row is drawn high or is dragged down, and in order to complete the originator shutdown test of module 4 to be measured, MCU10 is opened up for road I/O mouthfuls by control the 3rd 8
It opens up chip 11 and increases by 8 road electric current driving chip, 12 driving capability, the height of 8 road electric current driving chip, 12,8 road electric current driving chip 12
Low level output is used to complete the state control of disparate modules commissioning examination status indicator lamp 13.
Embodiment 2
Referring to Fig. 1, the state of the TX Fault of module 4 to be measured, RX LOS, TX Disable pass through state display lamp 3
It shows, state display lamp 3 is paster LED lamp.
Embodiment 3
Referring to Fig. 1, MCU10 by the one 8 road I/O mouthfuls of expensive chip 6 controlling to the power switch of module 4 to be measured
System, for the input to 4 electric current of module to be measured, electric current is mould to be measured after metal-oxide-semiconductor electric switch enters current acquisition chip 5
Block 4 is powered, and electric current flows into metal-oxide-semiconductor, and metal-oxide-semiconductor switch state is controlled by the one 8 road I/O mouthfuls of expensive chip 6, current acquisition core
The collected voltage of piece 5 is flowed into 8 road ADC conversion chips 9, and MCU10 reads the AD value in 8 road ADC conversion chips 9, and converts
At corresponding 4 current value of module to be measured, the acquisition to 4 current value of module to be measured is completed.
Working principle: in use, MCU10 initialize when should ensure that every module 4 to be measured all in normal operating conditions, i.e.,
Guarantee that TX Disable is in low level state, while 16 module commissioning examination status indicator lamps 13 are initialized as Yellow light-emitting low temperature
(green is that commissioning pinged, red is to adjust test crash, yellow state to be measured)；Module 4 to be measured can be read by host computer
Internal information, and show on host computer panel；When commissioning is tried, opened by host computer in requisition at commissioning die trial block
Channel so that the standard optical module applicable 1 with CDR and module 4 to be measured are in the state transmitted mutually, module commissioning tries state instruction
Lamp 13 is amber light at this time, and subsequent commissioning examination just as conventional single channel test macro, is completed to 4 commissioning of module to be measured
Afterwards, judge whether it debugs to pass through, by then giving a green light, not by then sending out a warning, be then turned on next channel.It repeats above-mentioned
Debugging process.
During practical application, need for the standard optical module applicable 1 with CDR to be connected to multiple channel test system it
In, the sending and receiving end of 16 optical modules 4 to be measured passes through the photoswitch on two roads 1*16, and the optical patchcord of 16 optical modules is aggregated in
In one optical patchcord, wherein the originator of module to be measured 4, after the photoswitch of the road 1*16, difference can be with light power meter, oscillography
Device and standard sources are attached, and have been convenient for carrying out commissioning examination to related photoelectric parameter.And the originator of standard sources is by declining
After subtracting device, optical module to be measured is reached after the photoswitch of the road 1*16, is being carried out by receiving end of the regulated attenuator to module to be measured
Commissioning examination.
The specific working mode of this system is as follows: Error Detector is added corresponding by the originator that high speed c-axial is standard sources
Modulated signal, while the originator of standard sources enters optical attenuator by optical patchcord, and the output end of optical attenuator is connected to
The road 1*16 photoswitch, is divided into the receiving end that 16 road optical patchcords are connected respectively to 16 modules 4 to be measured, and the road 1*16 photoswitch passes through phase
Software control is closed, different channels is opened, in order to test different modules to be measured 4, the receiving end of module 4 to be measured is receiving light letter
After number, chip is put by receiving end optical device and limit, converts optical signal into electric signal, while on layout board, electric signal
The receiving end at end is connect with originator by cabling, so that the electric signal of its receiving end is directly that the originator of module 4 to be measured adds modulated signal,
The receiving end and originator for directly connecting its power port end by cabling in this way, can make a single pass Error Detector in photoswitch
Under collocation, 16 optical modules are tested respectively, is its originator plus modulation letter by the receiving end power port signal of module 4 to be measured
After number, optical patchcord is connected to light power meter when needing to test optical power by the road 1*16 photoswitch by originator；Work as needs
When testing its originator eye graph parameter, optical patchcord is connected to oscillograph；When needing to survey sensitivity, optical patchcord is connected to standard
The receiving end optical port of light source.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto,
Anyone skilled in the art in the technical scope disclosed by the present invention, according to the technique and scheme of the present invention and its
Inventive concept is subject to equivalent substitution or change, should be covered by the protection scope of the present invention.
Claims (6)
1. a kind of optical module multiple channel test system, which is characterized in that opened including the standard optical module applicable (1) with CDR, 32 channel light
Close (2), state display lamp (3), module to be measured (4), current acquisition chip (5), MCU (10), 8 road electric current driving chips (12) and
Module commissioning tries status indicator lamp (13)；
Standard optical module applicable (1) with CDR: it is connect by optical patchcord with 32 channel photoswitches (2), and 32 channel photoswitches (2)
Standard sources is connect with 32 modules (4) to be measured；
MCU (10): MCU (10) is expanded into 16 tunnels by two 8 road IIC expensive chips (7)；MCU (10) passes through the 2nd 8 tunnel of control
I/O mouthfuls of expensive chips (8) are drawn high or are dragged down to the TX Disable foot of module to be measured (4)；MCU (10) passes through control the
38 road I/O mouthfuls of expensive chips (11) increase by 8 road electric current driving chip (12) driving capabilities；
8 road electric current driving chips (12): the low and high level of 8 road electric current driving chips (12) is exported for completing disparate modules commissioning
Try the state control of status indicator lamp (13).
2. a kind of optical module multiple channel test system according to claim 1, which is characterized in that the module (4) to be measured
TX Fault, RX LOS, TX Disable state shown by state display lamp (3).
3. a kind of optical module multiple channel test system according to claim 2, which is characterized in that pass through the MCU (10)
Read module to be measured (4) state in place and los state.
4. a kind of optical module multiple channel test system according to claim 1, which is characterized in that the MCU (10) passes through
One 8 road I/O mouthfuls of expensive chip (6) controls the power switch of module to be measured (4).
5. a kind of optical module multiple channel test system according to claim 4, which is characterized in that the current acquisition chip
(5) collected voltage is flowed into 8 road ADC conversion chips (9).
6. a kind of optical module multiple channel test system according to claim 5, which is characterized in that the MCU (10) reads 8
AD value in road ADC conversion chip (9), and it is converted into corresponding module to be measured (4) current value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201910875606.2A CN110445538A (en) | 2019-09-17 | 2019-09-17 | A kind of optical module multiple channel test system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910875606.2A CN110445538A (en) | 2019-09-17 | 2019-09-17 | A kind of optical module multiple channel test system |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112636824A (en) * | 2020-12-16 | 2021-04-09 | 武汉永鼎光通科技有限公司 | OAM function testing device and method of OAM optical module |
| CN113242089A (en) * | 2021-05-10 | 2021-08-10 | 上海剑桥科技股份有限公司 | Test method and test circuit based on 400G optical module |
| CN114966210A (en) * | 2022-05-26 | 2022-08-30 | 欣强电子（清远）有限公司 | Optical module connecting sheet impedance test method |
| CN115696269A (en) * | 2022-10-26 | 2023-02-03 | 四川虹美智能科技有限公司 | Method capable of carrying out factory test in batch |
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| CN114966210A (en) * | 2022-05-26 | 2022-08-30 | 欣强电子（清远）有限公司 | Optical module connecting sheet impedance test method |
| CN115696269A (en) * | 2022-10-26 | 2023-02-03 | 四川虹美智能科技有限公司 | Method capable of carrying out factory test in batch |
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