CN205301543U - Many channel separation type electronic load and power aging testing system - Google Patents
Many channel separation type electronic load and power aging testing system Download PDFInfo
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- CN205301543U CN205301543U CN201520921993.6U CN201520921993U CN205301543U CN 205301543 U CN205301543 U CN 205301543U CN 201520921993 U CN201520921993 U CN 201520921993U CN 205301543 U CN205301543 U CN 205301543U
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Abstract
The utility model discloses a many channel separation type electronic load, including main microprocessor, serial ports and more than one channel unit, the passageway unit includes optoelectronic isolation communication circuit, from microprocessor, high -speed DA converter, mode switching circuit is carried in the area, switch drive circuit, the switch tube, the current detection circui, voltage detection circuit, high -speed AD converter with examine the leakage resistance, main microprocessor passes through optoelectronic isolation communication circuit to setting up the instruction from microprocessor transmission parameter, set up current value or the magnitude of voltage that carries in the area from microprocessor according to setting up the command control DA converter. The utility model discloses still disclose a power aging testing system, including host computer, interface converter, communication bus, power supply, a plurality of electronic load and a plurality of by the survey power. Implement the utility model discloses a many channel separation type electronic load and power aging testing system have following beneficial effect: the security of testing non - isolation power has improved, system's reliability of operation is higher, the cost is lower.
Description
Technical field
This utility model relates to burn-in test field, particularly to a kind of multichannel isolated form electronic load and Test System On Power Aging.
Background technology
Development along with lighting engineering, LED (light emitting diode) enters lighting field in recent years, traditional incandescent lamp bulb is replaced just gradually with advantages such as its energy-saving and environmental protection and life-span length, become the main flow of lighting, bring exploding in market demand also to the core LED drive power of LED illumination lamp simultaneously. In the application technology of LED drive power, the many merits such as non-isolated LED drive power is little with its volume, efficiency is high and with low cost, become the main flow power supply of LED illumination lamp. " non-isolated " refers to and carries out electrical isolation not over transformator between ac input end (thermally) and load end (cold), but has identical current path. The circuit theory diagrams of typical non-isolated LED drive power (hereinafter referred to as non-isolated power supply) are as shown in Figure 1. Fig. 2 is the circuit theory diagrams of typical electronic load circuit in conventional art.
Electronic load is the detecting instrument that power source products is indispensable, but traditional electronic load is generally used for insulating power supply, but not insulating power supply is due to the particularity of its circuit framework, if adopting traditional electronic load to do test equally can run into following Railway Project:
First, it is absent from transformator between load owing to the AC of non-isolated power supply inputs, therefore cannot accomplish between output and input in isolation electrically and insulation, and between the guidance panel of traditional electronic load, communication interface and power section circuit, also there is no electrical isolation, when being used for testing non-isolated power supply, the probability of electric shock can be brought to operator.
Second, when adopting traditional electronic load test non-isolated power supply, it is difficult to be monitored by computer, and it is difficult to networking, because the Leakage Current of non-isolated power supply can constitute loop through the RS232 interface of electronic load and computer, the RS232 interface even computer main board of electronic load, computer time serious, can be damaged.Thus the aging testing systems such as the aging vehicle being made up of traditional electronic load, burn-in chamber, also can be only applied to insulating power supply, to non-isolated power supply inapplicable.
3rd, it is impossible to use separate unit electronic load to test many non-isolated power supplys simultaneously. Although traditional electronic load some there is multiple passage, but it is not electrical isolation on hardware circuit between passage and passage, and it is belonging to common ground framework, if use separate unit electronic load to test many non-isolated power supplys simultaneously, generation voltage or electric current between tested power supply will be caused to interfere, and this interference can cause that the constant-current circuit of tested power supply itself is not normal so that test result is inaccurate, even easily cause short circuit, damage components and parts therein. Thus cause system reliability of operation not high.
The design of traditional electronic load uses mainly for research and development and the department such as QC, and it is expensive, and the input cost of equipment is higher, it is impossible to meet that manufacturer is hundreds of easily or even thousands of power supplys carry out burn-in test to the quantitative demand of electronic load simultaneously. It is used in parallel to extend bearing power that conditional electronic load can only carry out passage under CC (constant current) pattern, especially in parallel owing to current-sharing cannot cause that load is because of overcurrent damage under CV (constant voltage) pattern under other pattern.
Utility model content
The technical problems to be solved in the utility model is in that, the defect that safety problem, system reliability of operation are high, not relatively costly is there is, it is provided that a kind of improve the test safety of non-isolated power supply, system reliability of operation multichannel isolated form electronic load higher, lower-cost and Test System On Power Aging for the above-mentioned test non-isolated power supply of prior art.
This utility model solves its technical problem and be the technical scheme is that a kind of multichannel isolated form electronic load of structure, including master microprocessor, serial ports and multiple channel unit, described master microprocessor passes through described serial ports and upper machine communication, described master microprocessor is also connected with the plurality of channel unit, described channel unit includes photoelectric isolation communication circuit, from microprocessor, high speed D/A converter, band load mode switching circuit, switch driving circuit, switching tube, current detection circuit, voltage detecting circuit, speed A/D converter and inspection leakage resistance, described master microprocessor sends parameter setting instruction to described from microprocessor by described photoelectric isolation communication circuit, described it is connected from microprocessor with described high speed D/A converter, for controlling described high speed D/A converter according to described parameter setting instruction, the current value with load or magnitude of voltage are set, the described input with load mode switching circuit is connected with the outfan of described high speed D/A converter, its outfan is connected with one end of described switching tube by described switch driving circuit, the other end of described switching tube is connected with described inspection leakage resistance and current detection circuit respectively, described current detection circuit is also connected with described speed A/D converter, for the current value of the tested power supply of detection is sent to described speed A/D converter, described voltage detecting circuit is connected with described speed A/D converter, for the output voltage values of the described tested power supply of detection is sent to described speed A/D converter, described speed A/D converter is sent to described from microprocessor after described current value and output voltage values are carried out analog digital conversion.
In multichannel isolated form electronic load described in the utility model, described photoelectric isolation communication circuit includes the first photoelectrical coupler, second photoelectrical coupler, first current-limiting resistance, second pull-up resistor, 3rd pull-up resistor and the 4th current-limiting resistance, described first photoelectrical coupler includes the first light emitting diode and the first phototriode, described second photoelectrical coupler includes the second light emitting diode and the second phototriode, described master microprocessor includes serial ports transmitting terminal and serial ports receiving terminal, described include serial ports transmitting terminal and serial ports receiving terminal from microprocessor, the serial ports transmitting terminal of described master microprocessor is connected with the negative electrode of described first light emitting diode, the anode of described first light emitting diode is connected with described first current-limiting resistance, the colelctor electrode of described first phototriode is connected with the described serial ports receiving terminal from microprocessor, the colelctor electrode of described first phototriode connects power supply also by described 3rd pull-up resistor, the grounded emitter of described first phototriode, the described negative electrode from the serial ports transmitting terminal of microprocessor with described second light emitting diode is connected, the anode of described second light emitting diode connects described power supply by described 4th current-limiting resistance, the colelctor electrode of described second phototriode is connected with the serial ports receiving terminal of described master microprocessor and the second pull-up resistor respectively, the grounded emitter of described second phototriode.
In multichannel isolated form electronic load described in the utility model, also include channel separation power supply circuits, described channel separation power supply circuits include PWM controller, isolating transformer and power supply unit, described isolating transformer includes input winding and multiple output winding, one end of described input winding is connected with one end of described PWM controller, its other end is connected with the other end of described PWM controller, said supply unit includes multiple supplied for electronic unit, described supplied for electronic unit includes diode and electrochemical capacitor, one end of described output winding is connected with the anode of described diode, the negative electrode of described diode is connected with the positive pole of described electrochemical capacitor and power supply respectively, the other end of described output winding and the equal ground connection of negative pole of described electrochemical capacitor.
In multichannel isolated form electronic load described in the utility model, described switching tube is metal-oxide-semiconductor, the grid of described metal-oxide-semiconductor is connected with described switch driving circuit, the drain electrode of described metal-oxide-semiconductor is connected with the positive pole of described tested power supply, and the source electrode of described metal-oxide-semiconductor is connected by the negative pole of described inspection leakage resistance with described tested power supply.
In multichannel isolated form electronic load described in the utility model, also include being connected with described master microprocessor, matrix keyboard for entering the operating instructions, and be connected with described master microprocessor, for showing the LCDs of described current value and output voltage values.
In multichannel isolated form electronic load described in the utility model, also include being connected with described master microprocessor, for arranging the address code configuration switch of address coding.
In multichannel isolated form electronic load described in the utility model, also include radiator fan and control circuit, described radiator fan is connected with described master microprocessor, and described control circuit is connected with described radiator fan, is used for controlling being turned on and off of described radiator fan.
In multichannel isolated form electronic load described in the utility model, also including heatsink temperature testing circuit, described heatsink temperature testing circuit is connected, is used for detecting the temperature of fin with described master microprocessor.
This utility model further relates to a kind of Test System On Power Aging, including host computer, interface convertor, communication bus, power supply unit, multiple electronic loads and multiple tested power supply, described host computer is connected with described interface convertor, described interface convertor is connected with multiple described electronic loads by described communication bus, described power supply unit is connected with multiple described electronic loads respectively, for being powered, described electronic load is provided with multiple passage, each passage is all connected with a described tested power supply, described electronic load is any one in above-mentioned any multichannel isolated form electronic load.
In Test System On Power Aging described in the utility model, also include switching surge controller and alternating current power supply, described interface convertor is connected with described switching surge controller also by described communication bus, and described switching surge controller is also connected with all of described tested power supply.
Implement multichannel isolated form electronic load of the present utility model and Test System On Power Aging, have the advantages that owing to using master microprocessor, photoelectric isolation communication circuit in multiple channel units and channel unit and from microprocessor, master microprocessor sends parameter setting instruction by photoelectric isolation communication circuit to from microprocessor, thus achieve electrical equipment isolation and insulation, improve the safety to tester and equipment when testing non-isolated power supply, owing to have employed channel separation technology, stop to be susceptible between tested power supply when separate unit electronic load tests many non-isolated power supplys simultaneously to interfere or the possibility of short circuit, improve system reliability of operation, in same electronic load, number of channels can carry out arbitrary extension by identical channel unit, effectively reduces equipment investment cost, so it is higher, less costly to which raises the test safety of non-isolated power supply, system reliability of operation.
Accompanying drawing explanation
In order to be illustrated more clearly that this utility model embodiment or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be briefly described below, apparently, accompanying drawing in the following describes is only embodiments more of the present utility model, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the circuit theory diagrams of conventional non-isolated LED drive power;
Fig. 2 is the circuit block diagram of conditional electronic load;
Fig. 3 is the structural representation of multichannel isolated form electronic load in this utility model multichannel isolated form electronic load and one embodiment of Test System On Power Aging;
Fig. 4 is the circuit theory diagrams of photoelectric isolation communication circuit in described embodiment;
Fig. 5 is the circuit theory diagrams of channel separation power supply circuits in described embodiment;
Fig. 6 is the structural representation of Test System On Power Aging in described embodiment.
Detailed description of the invention
Below in conjunction with the accompanying drawing in this utility model embodiment, the technical scheme in this utility model embodiment is clearly and completely described, it is clear that described embodiment is only a part of embodiment of this utility model, rather than whole embodiments. Based on the embodiment in this utility model, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of this utility model protection.
In this utility model multichannel isolated form electronic load and Test System On Power Aging embodiment, the structural representation of its multichannel isolated form electronic load is as shown in Figure 3. In Fig. 3, this multichannel isolated form electronic load includes master microprocessor 1, serial ports 2 and multiple channel unit 3, Fig. 3 depicts four channel units 3 as an example, in fact, the number of this channel unit 3 included by multichannel isolated form electronic load can increase or reduce the number of channel unit 3 as required accordingly, such as: the number of channel unit 3 can be two, three, five, six or more, say, that the number at least two of channel unit 3. In the present embodiment, serial ports 2 adopts RS485 communication interface, and certainly, under the certain situation of the present embodiment, serial ports 2 can also select other types, for instance select RS232 communication interface.
In the present embodiment, master microprocessor 1 by serial ports 2 and host computer (not shown) communication, receives control instruction that host computer sends or by data back to host computer. master microprocessor is also connected with multiple channel units 3, channel unit 3 includes photoelectric isolation communication circuit 31, from microprocessor 32, high speed D/A converter 33, band load mode switching circuit 34, switch driving circuit 35, switching tube Q, current detection circuit 36, voltage detecting circuit 37, speed A/D converter 38 and inspection leakage resistance R, master microprocessor 1 sends parameter setting instruction by photoelectric isolation communication circuit 31 to from microprocessor 32, it is connected from microprocessor 32 with high speed D/A converter 33, for controlling high speed D/A converter 33 according to parameter setting instruction, the current value with load or magnitude of voltage are set, perform various to draw load Modal action, and coordinate speed A/D converter 38 to be AD converted, input with load mode switching circuit 34 is connected with the outfan of high speed D/A converter 33, its outfan is connected with one end of switching tube Q by switch driving circuit 35, the other end of switching tube Q is connected with inspection leakage resistance R, the other end of switching tube Q is connected with detection resistance R and current detection circuit 36 respectively, current detection circuit 36 is also connected with speed A/D converter 38, for the current value of the tested power supply of detection is sent to speed A/D converter 38, voltage detecting circuit 37 is connected with speed A/D converter 38, for the output voltage values of the tested power supply of detection is sent to speed A/D converter 38, speed A/D converter 38 is sent to from microprocessor 32 after current value and output voltage values are carried out analog digital conversion.Namely current detection circuit 36 and voltage detecting circuit 37 measure current value and the output voltage values of tested power supply respectively in real time, and current value and the output voltage values of measurement are finally returned to master microprocessor 1, then it is sent to host computer by master microprocessor 1 by serial ports 2 and displays.
In the present embodiment, switching tube Q is metal-oxide-semiconductor, the grid of metal-oxide-semiconductor is connected with switch driving circuit 35, the drain electrode of metal-oxide-semiconductor is connected with the positive pole of tested power supply (specifically the positive pole of tested power input interface), and the source electrode of metal-oxide-semiconductor is connected with the negative pole of tested power supply (specifically the negative pole of tested power input interface) by examining leakage resistance R.
It is worth mentioning that, in the present embodiment, this multichannel isolated form electronic load also includes matrix keyboard 4 and LCDs 5, matrix keyboard 4 and LCDs 5 are all connected with master microprocessor 1, wherein, matrix keyboard 4 is used for entering the operating instructions, and the current value of above-mentioned measurement and output voltage values are sent to LCDs 5 by master microprocessor 1 and display. When being applied to power source aging system or test system, it may be unnecessary to matrix keyboard 4 and LCDs 5, direct and upper machine communication.
The present embodiment by adding photoelectric isolation communication circuit 31 on the basis of conditional electronic load circuit, increase a microprocessor as main frame (i.e. master microprocessor 1), microprocessor originally serves as from machine (namely from microprocessor 32), overcome conditional electronic load in problem compatible not high when power supply product various in style, as being applied to many deficiencies during non-isolated power supply, the problems such as during for multiple power specification load motility and utilization rate be not high, it is less costly, there is multiple passage, and it is independent of one another between passage, entirely without electric loop, master microprocessor 1 and carry out communication by photoelectric isolation communication circuit 31 between microprocessor 32, under arbitrary patterns, support that any passage is in parallel, this multichannel isolated form electronic load can be applied not only to non-isolated power supply, isolated supplies is equally applicable, when being applied to small-power power, each passage is used alone, when the output of tested power supply is more than the input power of single passage, multiple passage can be selected to improve utilization rate of equipment and installations used in parallel according to practical situation. so it is higher, less costly to which raises the test safety of non-isolated power supply, system reliability of operation.
Fig. 4 is the structural representation of photoelectric isolation communication circuit in the present embodiment, in Fig. 4, this photoelectric isolation communication circuit includes the first photoelectrical coupler U1, second photoelectrical coupler U2, first current-limiting resistance R1, second pull-up resistor R2, 3rd pull-up resistor R3 and the four current-limiting resistance R4, first photoelectrical coupler U1 includes the first light emitting diode and the first phototriode, second photoelectrical coupler U2 includes the second light emitting diode and the second phototriode, master microprocessor 1 includes serial ports transmitting terminal UART_TX and serial ports receiving terminal UART_RX, serial ports transmitting terminal UART_TX and serial ports receiving terminal UART_RX is included from microprocessor 32, the serial ports transmitting terminal UART_TX of master microprocessor 1 and the negative electrode of the first light emitting diode connect, the anode of the first light emitting diode and the first current-limiting resistance R1 connect, the colelctor electrode of the first phototriode is connected with the serial ports receiving terminal UART_RX from microprocessor 32, the colelctor electrode of the first phototriode connects power supply VCC also by the 3rd pull-up resistor R3, the grounded emitter of the first phototriode, connect from the negative electrode of the serial ports transmitting terminal UART_TX of microprocessor 32 and the second light emitting diode, the anode of the second light emitting diode connects power supply VCC by the 4th current-limiting resistance R4, the colelctor electrode of the second phototriode is connected with the serial ports receiving terminal UART_RX and the second pull-up resistor R2 of master microprocessor 1 respectively, the grounded emitter of the second phototriode.This photoelectric isolation communication circuit 31 make use of the self character of photoelectrical coupler, has both achieved master microprocessor 1 and has transmitted from the data between microprocessor 32, having reached again the purpose of electrical isolation and insulation.
In the present embodiment, this multichannel isolated form electronic load also includes channel separation power supply circuits, and its circuit theory diagrams are as shown in Figure 5. In Fig. 5, these channel separation power supply circuits include PWM controller, isolating transformer T and power supply unit, isolating transformer T includes input winding and multiple output winding, Fig. 5 depicts four output windings, one end of input winding is connected with one end of PWM controller, the other end of input winding is connected with the other end of PWM controller, power supply unit includes multiple supplied for electronic unit, in the present embodiment, the quantity of supplied for electronic unit is identical with the quantity of channel unit, and namely the quantity of supplied for electronic unit is four. Supplied for electronic unit includes diode and electrochemical capacitor, and each one end of output winding is connected with the anode of diode, and the negative electrode of diode is connected with the positive pole of electrochemical capacitor and power supply respectively, the other end of each output winding and the equal ground connection of negative pole of electrochemical capacitor. Fig. 5 depicts four supplied for electronic unit, first supplied for electronic unit includes the first diode D1 and the first electrochemical capacitor C1, second supplied for electronic unit includes the second diode D2 and the second electrochemical capacitor C2,3rd supplied for electronic unit includes the 3rd diode D3 and the three electrochemical capacitor C3, and the 4th supplied for electronic unit includes the 4th diode D4 and the four electrochemical capacitor C4; Wherein, one end of first output winding is connected with the anode of the first diode D1, the negative electrode of the first diode D2 is connected with the positive pole of the first electrochemical capacitor C1 and the first power supply Vcc1 respectively, the equal ground connection GND1 of negative pole of first other end exporting winding and the first electrochemical capacitor C1; One end of second output winding is connected with the anode of the second diode D2, the negative electrode of the second diode D2 is connected with the positive pole of the second electrochemical capacitor C2 and the second power supply Vcc2 respectively, the equal ground connection GND2 of negative pole of second other end exporting winding and the second electrochemical capacitor C2; One end of 3rd output winding is connected with the anode of the 3rd diode D3, the negative electrode of the 3rd diode D3 is connected with the positive pole of the 3rd electrochemical capacitor C3 and the 3rd power supply Vcc3 respectively, the equal ground connection GND3 of negative pole of the 3rd other end exporting winding and the 3rd electrochemical capacitor C3; One end of 4th output winding is connected with the anode of the 4th diode D4, the negative electrode of the 4th diode D4 is connected with the positive pole of the 4th electrochemical capacitor C4 and the 4th power supply Vcc4 respectively, the equal ground connection GND4 of negative pole of the 4th other end exporting winding and the 4th electrochemical capacitor C4. In the present embodiment, the working power of each passage by the different winding power assisting isolating transformer T, being electrically entirely isolated and insulating between each winding.
In the present embodiment, this multichannel isolated form electronic load also includes address code configuration switch 6, and this address code configuration switch 6 is connected with master microprocessor 1, is used for arranging address coding. This multichannel isolated form electronic load also includes radiator fan 7 and control circuit 8, and radiator fan 8 is connected with master microprocessor 1, and control circuit 8 is connected with radiator fan 7, for controlling being turned on and off of radiator fan 7. This multichannel isolated form electronic load also includes heatsink temperature testing circuit 9, and heatsink temperature testing circuit 9 is connected with master microprocessor 1, for detecting the temperature of fin.
The present embodiment further relates to a kind of Test System On Power Aging, and its structural representation is as shown in Figure 6. in Fig. 6, this Test System On Power Aging includes host computer, interface convertor, communication bus, power supply unit, multiple electronic loads and multiple tested power supply, host computer is connected with interface convertor, interface convertor is connected with multiple electronic loads by communication bus, power supply unit is connected with multiple electronic loads respectively, for being powered, in the present embodiment, the number of electronic load is four, the number of tested power supply is 16, electronic load is provided with four passage (CH1, CH2, CH3, CH4), each passage is all connected with a tested power supply, namely each electronic load is all connected with four tested power supplys, electronic load is the above-mentioned multichannel isolated form electronic load in the present embodiment. in the present embodiment, interface convertor is for the conversion between RS485 communication interface and RS232 communication interface, and communication bus is RS485 communication bus, and power supply unit supply is direct current 12D voltage. this Test System On Power Aging also includes switching surge controller and alternating current power supply, and this alternating current power supply is 85Vac-265Vac. interface convertor is connected with switching surge controller also by communication bus, and switching surge controller is also connected with all of tested power supply. all electronic loads on communication bus are uniformly carried out parameter and arrange by host computer, status information and the indication information of the tested power supply simultaneously each electronic load uploaded are analyzed, store and show, and are generated test data sheet and data curve chart etc. by host computer. this Test System On Power Aging is that power supply manufacturing firm achieves large batch of power supply and carries out burn-in test simultaneously, is effectively increased production efficiency. this Test System On Power Aging is not only applicable to insulating power supply, is equally applicable to non-isolated power supply.
In a word, in the present embodiment, this utility model has CC (constant current)/CV (constant voltage)/CR (permanent resistance)/CP (invariable power)/LED five kinds stand-alone mode and the mixed model being mutually combined thereof. Under arbitrary patterns, support interchannel any parallel connection, to meet the power supply test demand of different capacity section, improve utilization rate and the cost performance of equipment.
The foregoing is only preferred embodiment of the present utility model; not in order to limit this utility model; all within spirit of the present utility model and principle, any amendment of making, equivalent replacement, improvement etc., should be included within protection domain of the present utility model.
Claims (10)
1. a multichannel isolated form electronic load, it is characterized in that, including master microprocessor, serial ports and multiple channel unit, described master microprocessor passes through described serial ports and upper machine communication, described master microprocessor is also connected with the plurality of channel unit, described channel unit includes photoelectric isolation communication circuit, from microprocessor, high speed D/A converter, band load mode switching circuit, switch driving circuit, switching tube, current detection circuit, voltage detecting circuit, speed A/D converter and inspection leakage resistance, described master microprocessor sends parameter setting instruction to described from microprocessor by described photoelectric isolation communication circuit, described it is connected from microprocessor with described high speed D/A converter, for controlling described high speed D/A converter according to described parameter setting instruction, the current value with load or magnitude of voltage are set, the described input with load mode switching circuit is connected with the outfan of described high speed D/A converter, its outfan is connected with one end of described switching tube by described switch driving circuit, the other end of described switching tube is connected with described inspection leakage resistance and current detection circuit respectively, described current detection circuit is also connected with described speed A/D converter, for the current value of the tested power supply of detection is sent to described speed A/D converter, described voltage detecting circuit is connected with described speed A/D converter, for the output voltage values of the described tested power supply of detection is sent to described speed A/D converter, described speed A/D converter is sent to described from microprocessor after described current value and output voltage values are carried out analog digital conversion.
2. multichannel isolated form electronic load according to claim 1, it is characterized in that, described photoelectric isolation communication circuit includes the first photoelectrical coupler, second photoelectrical coupler, first current-limiting resistance, second pull-up resistor, 3rd pull-up resistor and the 4th current-limiting resistance, described first photoelectrical coupler includes the first light emitting diode and the first phototriode, described second photoelectrical coupler includes the second light emitting diode and the second phototriode, described master microprocessor includes serial ports transmitting terminal and serial ports receiving terminal, described include serial ports transmitting terminal and serial ports receiving terminal from microprocessor, the serial ports transmitting terminal of described master microprocessor is connected with the negative electrode of described first light emitting diode, the anode of described first light emitting diode is connected with described first current-limiting resistance, the colelctor electrode of described first phototriode is connected with the described serial ports receiving terminal from microprocessor, the colelctor electrode of described first phototriode connects power supply also by described 3rd pull-up resistor, the grounded emitter of described first phototriode, the described negative electrode from the serial ports transmitting terminal of microprocessor with described second light emitting diode is connected, the anode of described second light emitting diode connects described power supply by described 4th current-limiting resistance, the colelctor electrode of described second phototriode is connected with the serial ports receiving terminal of described master microprocessor and the second pull-up resistor respectively, the grounded emitter of described second phototriode.
3. multichannel isolated form electronic load according to claim 2, it is characterized in that, also include channel separation power supply circuits, described channel separation power supply circuits include PWM controller, isolating transformer and power supply unit, described isolating transformer includes input winding and multiple output winding, one end of described input winding is connected with one end of described PWM controller, its other end is connected with the other end of described PWM controller, said supply unit includes multiple supplied for electronic unit, described supplied for electronic unit includes diode and electrochemical capacitor, one end of described output winding is connected with the anode of described diode, the negative electrode of described diode is connected with the positive pole of described electrochemical capacitor and described power supply respectively, the other end of described output winding and the equal ground connection of negative pole of described electrochemical capacitor.
4. the multichannel isolated form electronic load according to claims 1 to 3 any one, it is characterized in that, described switching tube is metal-oxide-semiconductor, the grid of described metal-oxide-semiconductor is connected with described switch driving circuit, the drain electrode of described metal-oxide-semiconductor is connected with the positive pole of described tested power supply, and the source electrode of described metal-oxide-semiconductor is connected by the negative pole of described inspection leakage resistance with described tested power supply.
5. multichannel isolated form electronic load according to claim 1, it is characterized in that, also include being connected with described master microprocessor, matrix keyboard for entering the operating instructions, and be connected with described master microprocessor, for showing the LCDs of described current value and output voltage values.
6. multichannel isolated form electronic load according to claim 1 or 5, it is characterised in that also include being connected with described master microprocessor, for arranging the address code configuration switch of address coding.
7. multichannel isolated form electronic load according to claim 1 or 5, it is characterized in that, also include radiator fan and control circuit, described radiator fan is connected with described master microprocessor, and described control circuit is connected with described radiator fan, is used for controlling being turned on and off of described radiator fan.
8. multichannel isolated form electronic load according to claim 7, it is characterised in that also include heatsink temperature testing circuit, described heatsink temperature testing circuit is connected, is used for detecting the temperature of fin with described master microprocessor.
9. a Test System On Power Aging, it is characterized in that, including host computer, interface convertor, communication bus, power supply unit, multiple electronic loads and multiple tested power supply, described host computer is connected with described interface convertor, described interface convertor is connected with multiple described electronic loads by described communication bus, described power supply unit is connected with multiple described electronic loads respectively, for being powered, described electronic load is provided with multiple passage, each passage is all connected with a described tested power supply, described electronic load is any one multichannel isolated form electronic load in described claim 1 to 8.
10. Test System On Power Aging according to claim 9, it is characterized in that, also include switching surge controller and alternating current power supply, described interface convertor is connected with described switching surge controller also by described communication bus, and described switching surge controller is also connected with all of described tested power supply.
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| CN201520921993.6U CN205301543U (en) | 2015-11-18 | 2015-11-18 | Many channel separation type electronic load and power aging testing system |
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| CN201520921993.6U CN205301543U (en) | 2015-11-18 | 2015-11-18 | Many channel separation type electronic load and power aging testing system |
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| CN105467331A (en) * | 2015-11-18 | 2016-04-06 | 深圳市中科源电子有限公司 | Multichannel isolation electron load and power source aging test system |
| CN107528298A (en) * | 2017-09-11 | 2017-12-29 | 深圳传音制造有限公司 | The protection circuit and electronic load of electronic load |
| CN109085443A (en) * | 2018-10-29 | 2018-12-25 | 泰华智慧产业集团股份有限公司 | A kind of power supply adaptor rated life time test method |
| CN109116263A (en) * | 2017-11-21 | 2019-01-01 | 惠州市蓝微电子有限公司 | A kind of multiple power supplies product loading test set and test method |
| CN109375021A (en) * | 2018-11-16 | 2019-02-22 | 浙江理工大学 | A kind of universal program controlled testing system and method for electric car central electrical part holder |
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2015
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105467331A (en) * | 2015-11-18 | 2016-04-06 | 深圳市中科源电子有限公司 | Multichannel isolation electron load and power source aging test system |
| CN105467331B (en) * | 2015-11-18 | 2018-09-04 | 深圳市中科源电子有限公司 | A kind of multichannel isolated form electronic load and Test System On Power Aging |
| CN107528298A (en) * | 2017-09-11 | 2017-12-29 | 深圳传音制造有限公司 | The protection circuit and electronic load of electronic load |
| CN107528298B (en) * | 2017-09-11 | 2020-08-14 | 深圳传音制造有限公司 | Protection circuit of electronic load and electronic load |
| CN109116263A (en) * | 2017-11-21 | 2019-01-01 | 惠州市蓝微电子有限公司 | A kind of multiple power supplies product loading test set and test method |
| CN109085443A (en) * | 2018-10-29 | 2018-12-25 | 泰华智慧产业集团股份有限公司 | A kind of power supply adaptor rated life time test method |
| CN109375021A (en) * | 2018-11-16 | 2019-02-22 | 浙江理工大学 | A kind of universal program controlled testing system and method for electric car central electrical part holder |
| CN109375021B (en) * | 2018-11-16 | 2024-02-06 | 浙江理工大学 | Universal program control testing system and method for electric automobile central electric box |
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