CN210112006U

CN210112006U - Optical module multichannel test system

Info

Publication number: CN210112006U
Application number: CN201921541581.4U
Authority: CN
Inventors: 黄健轩
Original assignee: Chengdu Xinrui Technology Co Ltd
Current assignee: Chengdu Xinrui Technology Co Ltd
Priority date: 2019-09-17
Filing date: 2019-09-17
Publication date: 2020-02-21
Anticipated expiration: 2029-09-17

Abstract

The utility model discloses an optical module multichannel test system, including taking CDR's standard optical module, 32 passageway photoswitch, status display lamp, the module that awaits measuring, current acquisition chip, MCU, 8 way current drive chips and module debugging status indicator lamp, take CDR's standard optical module pass through the optic fibre wire jumper with 32 passageway photoswitch connects. The utility model discloses in, when the test is transferred at the normal atmospheric temperature, transfer the tester and can leave for a short time, go to carry out the transfer test of other products, treat this group module that awaits measuring test completion after, only need transfer the test status indicator lamp according to the module and judge the transfer test status of the module that awaits measuring, and when high low temperature test, because 16 modules that await measuring are in power supply state always, so only need wait for after a period, 16 modules that await measuring just all can begin to test, can practice thrift test time greatly like this, improve the test uniformity simultaneously.

Description

Optical module multichannel test system

Technical Field

The utility model relates to an optical communication technical field especially relates to an optical module multichannel test system.

Background

With the rapid development of optical communication technology and internet of things, an optical module is used as a core component for network interconnection and intercommunication and is widely applied in more and more fields, the performance parameters of a key material used in the optical module, namely an optical device, are greatly influenced by temperature, and in order to test whether the performance of the optical module meets the use requirements in high and low temperature environments, high and low temperature performance tests are generally carried out on the optical module, while the test efficiency of a single-channel test system at the present stage is generally not high due to the temperature characteristics of the optical device.

During normal temperature debugging test, after each test is finished, the next module to be tested needs to be manually replaced, and a tester needs to be seated in front of the test system all the time and cannot perform other operations; if the high and low temperature test is carried out, each optical module needs to wait for a period of time independently, the method can be also applicable when the number of the optical modules to be tested is small, but when the number of the optical modules is large, the test system has low efficiency, because the time spent on the performance test of the modules is small when the module temperature test is carried out, on the contrary, more time is wasted on the waiting of the stable working state of the modules, if the performance test of a plurality of modules can be carried out on the premise of not opening the box door once, the temperature waiting time of each module is greatly reduced, the test speed can be greatly accelerated, and the requirements of production and scientific research are met.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a: the multi-channel test system for the optical module is provided for solving the problem that the high-low temperature performance test efficiency of the traditional optical module is low.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

an optical module multi-channel test system comprises a standard optical module with a CDR, a 32-channel optical switch, a state display lamp, a module to be tested, a current acquisition chip, an MCU, an 8-channel current driving chip and a module debugging and testing state indicator lamp, the standard optical module with the CDR is connected with the 32-channel optical switch through an optical fiber jumper, and the 32-channel optical switch connects the standard light source with the 32 modules to be tested, the MCU expands into 16 paths through the two 8 paths of IIC expansion chips, the MCU pulls up or pulls down the TX Disable pin of the module to be tested by controlling the second 8 paths of I/O port expansion chips, the MCU increases the driving capability of the 8 current driving chips by controlling the third 8I/O port expansion chips, and the high-low level output of the 8 paths of current driving chips is used for finishing the state control of the module debugging test state indicator lamps.

As a further description of the above technical solution:

and the states of the TX Fault, the RX LOS and the TX Disable of the module to be tested are displayed through a state display lamp.

As a further description of the above technical solution:

and reading the in-place state and the LOS state of the module to be tested by the MCU.

As a further description of the above technical solution:

and the MCU controls a power supply switch of the module to be tested through the first 8 paths of I/O port expansion chips.

As a further description of the above technical solution:

the voltage collected by the current collecting chip flows into the 8-path ADC conversion chip.

As a further description of the above technical solution:

and the MCU reads the AD value in the 8-path ADC conversion chip and converts the AD value into a corresponding current value of the module to be tested.

To sum up, owing to adopted above-mentioned technical scheme, the beneficial effects of the utility model are that:

the utility model discloses in, when the test is transferred at the normal atmospheric temperature, transfer the tester and can leave for a short time, go to carry out the transfer test of other products, treat this group module that awaits measuring test completion after, only need transfer the test status indicator lamp according to the module and judge the transfer test status of the module that awaits measuring, and when high low temperature test, because 16 modules that await measuring are in power supply state always, so only need wait for after a period, 16 modules that await measuring just all can begin to test, can practice thrift test time greatly like this, improve the test uniformity simultaneously.

Drawings

Fig. 1 is a schematic structural diagram of a multi-channel test of an optical module multi-channel test system provided by the present invention;

fig. 2 is the utility model provides an optical module multichannel test system's multichannel system schematic structure diagram.

Illustration of the drawings:

1. a standard optical module with a CDR; 2. a 32-channel optical switch; 3. a status display light; 4. a module to be tested; 5. a current acquisition chip; 6. the first 8 paths of I/O port expansion chips; 7. 8 paths of IIC extended chips; 8. a second 8-channel I/O port expansion chip; 9. 8-path ADC conversion chip; 10. MCU; 11. a third 8-path I/O port expansion chip; 12. 8-path current driving chips; 13. and the module adjusts a test state indicator lamp.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the protection scope of the present invention.

Example 1

Referring to fig. 1, an optical module multi-channel test system includes a standard optical module 1 with CDR, a 32-channel optical switch 2, a status display lamp 3, a module 4 to be tested, a current collection chip 5, an MCU10, an 8-channel current driving chip 12 and a module debugging and testing status indicator lamp 13, where the standard optical module 1 with CDR is connected to the 32-channel optical switch 2 through an optical fiber jumper, and the 32-channel optical switch 2 connects a standard light source to 32 modules 4 to be tested, and completes debugging tests on the 32 modules 4 to be tested by controlling the 32-channel optical switch 2 to access, respectively, the MCU10 expands into 16 channels through two 8-channel IIC expansion chips 7, so as to implement independent and respective read/write and debugging on the 16 modules 4 to be tested, the MCU10 pulls up or pulls down a TX Disable pin of the module 4 to be tested by controlling a second 8-channel I/O port expansion chip 8, so as to complete the turn-off test of the module 4 to be tested, the MCU10 increases the driving capability of the 8 current driver chips 12 by controlling the third 8I/O ports expansion chip 11, and the high and low level outputs of the 8 current driver chips 12 and 8 current driver chips 12 are used to complete the state control of the different module test status indicator lamps 13.

Example 2

Referring to fig. 1, the states of TX Fault, RX LOS, and TX Disable of the module 4 to be tested are displayed by the status display lamp 3, and the status display lamp 3 is a patch LED lamp.

Example 3

Referring to fig. 1, the MCU10 controls the power supply switch of the module 4 to be tested through the first 8I/O port expansion chips 6, and is configured to input the current of the module 4 to be tested, and supply the current to the module 4 to be tested after the current enters the current collection chip 5 through the MOS transistor electric switch, and the current flows into the MOS transistor, where the switching state of the MOS transistor is controlled by the first 8I/O port expansion chips 6, the voltage collected by the current collection chip 5 flows into the 8 ADC conversion chips 9, and the MCU10 reads the AD value in the 8 ADC conversion chips 9 and converts the AD value into the corresponding current value of the module 4 to be tested, thereby completing the collection of the current value of the module 4 to be tested.

The working principle is as follows: when the device is used, the MCU10 should ensure that each module 4 to be tested is in a normal working state when it is initialized, i.e. ensure that the TX Disable is in a low level state, and initialize the 16 module debugging test status indicator lamps 13 to emit yellow light (green is for debugging test pass, red is for debugging test fail, yellow is for testing state); the internal information of the module to be tested 4 can be read by the upper computer and displayed on the panel of the upper computer; during debugging test, the upper computer is used for opening the channel where the corresponding module to be debugged and tested is located, so that the standard optical module 1 with the CDR and the module 4 to be tested are in the state of mutual transmission, the module debugging test state indicator lamp 13 is a yellow lamp at the moment, the subsequent debugging test is the same as that of a conventional single-channel test system, after the debugging test of one module 4 to be tested is completed, whether the debugging is passed is judged, a green lamp is lightened through the debugging, a red lamp is lightened if the debugging is not passed, and then the next channel is opened. The debugging process is repeated.

In the practical application process, the standard optical module 1 with the CDR needs to be connected in a multi-channel testing system, the transceiver end of 16 optical modules to be tested 4 aggregates the optical fiber jumpers of 16 optical modules into one optical fiber jumper through two 1 × 16 optical switches, wherein the transmitting end of the module to be tested 4 can be respectively connected with an optical power meter, an oscilloscope and a standard light source after passing through the 1 × 16 optical switches, so that the related photoelectric parameters can be conveniently adjusted and tested. And the transmitting end of the standard light source passes through the attenuator and then reaches the optical module to be tested after passing through the 1 × 16 optical switches, and the receiving end of the module to be tested is subjected to adjustment test by adjusting the attenuator.

The specific working mode of the system is as follows: the error code instrument adds corresponding modulation signals to the sending end of a standard light source through a high-speed coaxial line, the sending end of the standard light source enters an optical attenuator through an optical fiber jumper, the output end of the optical attenuator is connected to 1-16 optical switches, the optical fiber jumper is divided into 16 optical fiber jumpers which are respectively connected to the receiving ends of 16 modules 4 to be tested, the 1-16 optical switches are controlled by related software to open different channels so as to test different modules 4 to be tested, after the receiving end of the module 4 to be tested receives the optical signals, the optical signals are converted into electric signals through a receiving end optical device and a limiting and amplifying chip, meanwhile, the receiving end and the sending end of the electric signal end are connected through wiring on a design board, so that the electric signals of the receiving end are directly added with the modulation signals to the sending end of the module 4 to be tested, the receiving end and the sending end of the electric signal end are directly connected through wiring, and the single-channel, respectively testing the 16 optical modules, adding a modulation signal to a transmitting end of the module to be tested 4 through a receiving end electric port signal, and connecting an optical fiber jumper to an optical power meter when optical power needs to be tested through a 1-16-path optical switch at the transmitting end; when the parameters of the eye pattern at the transmitting end of the optical fiber are required to be tested, the optical fiber jumper is connected to an oscilloscope; when the sensitivity needs to be measured, the optical fiber jumper wire is connected to the receiving end optical port of the standard light source.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. An optical module multichannel test system is characterized by comprising a standard optical module (1) with a CDR, a 32-channel optical switch (2), a state display lamp (3), a module to be tested (4), a current acquisition chip (5), an MCU (10), an 8-path current drive chip (12) and a module testing state adjusting indicator lamp (13);

standard optical module with CDR (1): the standard light source is connected with the 32-channel optical switch (2) through the optical fiber jumper, and the 32-channel optical switch (2) connects the standard light source with the 32 modules to be tested (4);

MCU (10): the MCU (10) is expanded into 16 paths through two 8 paths of IIC expansion chips (7); the MCU (10) pulls up or pulls down a TX Disable pin of the module to be tested (4) by controlling the second 8 paths of I/O port expansion chips (8); the MCU (10) controls the third 8 paths of I/O port expansion chips (11) to increase the driving capability of 8 paths of current driving chips (12);

8-way current driving chip (12): the high-low level output of the 8-path current driving chip (12) is used for finishing the state control of different module debugging test state indicator lamps (13).

2. The multi-channel test system for optical modules as claimed in claim 1, wherein the status of TX Fault, RX LOS, TX Disable of the module under test (4) is displayed by the status display lamp (3).

3. The optical module multichannel test system as claimed in claim 2, characterized in that the in-place status and the LOS status of the module under test (4) are read by the MCU (10).

4. The optical module multichannel test system as claimed in claim 1, wherein the MCU (10) controls a power switch of the module under test (4) through the first 8I/O port expansion chips (6).

5. The multi-channel test system for the optical modules as claimed in claim 4, wherein the voltage collected by the current collection chip (5) flows into an 8-way ADC conversion chip (9).

6. The multi-channel test system for the optical modules as claimed in claim 5, wherein the MCU (10) reads the AD value in the 8-channel ADC conversion chip (9) and converts the AD value into the corresponding current value of the module (4) to be tested.