CN208044026U - A kind of DC/AC drive modules dynamic accelerated ageing test device - Google Patents
A kind of DC/AC drive modules dynamic accelerated ageing test device Download PDFInfo
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- CN208044026U CN208044026U CN201820584579.4U CN201820584579U CN208044026U CN 208044026 U CN208044026 U CN 208044026U CN 201820584579 U CN201820584579 U CN 201820584579U CN 208044026 U CN208044026 U CN 208044026U
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Abstract
The utility model discloses a kind of DC/AC drive modules dynamic accelerated ageing test device, including the test of one piece of testing host and one piece or more is provided with multiple-channel output interface from plate, the testing host, for connecting one to one from plate with each test；Each test is provided with multi-channel test interface from plate, for being connect with each DC/AC drive modules to be measured；For generating pwm signal, be sent to each DC/AC drive modules to be measured from plate after tested is tested the testing host；The test is from plate for being compared to the detection signal that DC/AC drive modules to be measured export to judge whether each DC/AC drive modules to be measured are qualified.The DC/AC drive module dynamic accelerated ageing test devices of the utility model have many advantages, such as simple in structure, at low cost, easy to operate.
Description
Technical field
The utility model relates generally to electronic circuit test technical field, refers in particular to a kind of DC/AC drive modules dynamic acceleration
Ageing tester.
Background technology
Without the DC/AC drive modules of dynamic aging after electric machine controller, when dispatching from the factory test, failure is difficult table
Reveal and, be attached to after vehicle operation a period of time due to the abnormal component aging in part or meet with electric injury, DC/ may be caused
The function of AC drive modules is lost, and the high failure rate of controller is caused.So a kind of aging equipment is designed to drive mould to DC/AC
Block carries out aging and is necessary.But since a DC/AC drive module has 3 road voltage signals to need to test, high-volume DC/AC
When drive module carries out burn-in test, a DC/AC drive modules up to a hundred are tested simultaneously, a voltage signal of secondary processing hundreds of,
If be acquired with modulus conversion chip, then with control the complete data of chip processing after judged again, cost is very high.
Utility model content
The technical problems to be solved in the utility model is that：For technical problem of the existing technology, this practicality is new
Type provides a kind of DC/AC drive modules dynamic accelerated ageing test device simple in structure, easy to operate.
In order to solve the above technical problems, the utility model proposes technical solution be：
A kind of DC/AC drive modules dynamic accelerated ageing test device, including one piece of testing host and one piece or more
Test is provided with multiple-channel output interface from plate, the testing host, for connecting one to one from plate with each test；Each test
Multi-channel test interface is provided with from plate, for being connect with each DC/AC drive modules to be measured；The testing host is for generating
Pwm signal is sent to each DC/AC drive modules to be measured from plate after tested and is tested；The test is used for from plate to DC/ to be measured
The detection signal of AC drive modules output is compared to judge whether each DC/AC drive modules to be measured are qualified.
As a further improvement of the above technical scheme：
The testing host includes dsp chip, DC power supply, power circuit and mainboard driving circuit；The power circuit
Input terminal be connected with the DC power supply, for the power supply of DC power supply to be converted；The output end of the power circuit
It is connected respectively with the mainboard driving circuit and dsp chip, for providing transformed power supply；The mainboard driving circuit difference
It is connected with output interface with the dsp chip, the pwm signal for generating dsp chip is sent to output interface.
The dsp chip is connected through CAN transceiver with PC machine, for the program writing to dsp chip.
The voltage of the DC power supply is 24V/12V DC power supplies, and the voltage of the power circuit output is 15V, 3.3V
And 1.8V.
It is described from plate include reference power circuit, comparison circuit and fault latch circuit；The input terminal of the comparison circuit
Reference power circuit is connected, and interface is connected with the DC/AC drive modules after tested, mould is driven for receiving the DC/AC
The detection signal of block is simultaneously compared with the reference power supply of reference power circuit；The output end of the comparison circuit and the failure
Latch cicuit is connected, and fault latch is carried out for exporting comparison result to fault latch circuit.
It is both provided with emergency light, the fault latch circuit and indicating fault on the output interface and test interface
Lamp is connected, for lighting corresponding emergency light when generating failure.
It is described from plate further include from drive circuit, it is described from drive circuit respectively with the output interface of mainboard and from plate
Test interface be connected, the driving capability for increasing pwm signal.
Described to be circumscribed with dc power power supply from plate, the external dc power power supply is electric with benchmark respectively through power outlet
Source circuit, comparison circuit, fault latch circuit are connected with test interface.
Described test from the quantity of plate is 5~10 pieces.
The output interface of the testing host is 5~10 tunnels, and described test from the test interface of plate is 10~20 tunnels.With it is existing
There is technology to compare, the utility model has the advantage of：
The DC/AC drive module dynamic accelerated ageing test devices of the utility model are tested using testing host and polylith
The pattern to match from plate can simultaneously be detected the multi-way detecting signal of multiple DC/AC drive modules, simple in structure,
Easy to operate, cost is relatively low.It is directly detected and is handled additionally, due to detection signal (voltage signal), do not need analog-to-digital conversion
Deng, directly and handling result be back to mainboard, further simplify structure, improve the simplicity of operation.
Description of the drawings
Fig. 1 is the frame principle figure of the utility model.
Figure label indicates：1, testing host；2, DC power supply；3, mainboard filter capacitor；4, power circuit；5, DSP cores
Piece；6, mainboard driving circuit；7, CAN transceiver；8, PC machine；9, output interface；10, main board failure lamp；11, it tests from plate；12,
Input socket；13, from drive circuit；14, dc power power supply；15, from plate filter capacitor；16, power outlet；17, benchmark
Power circuit；18, comparison circuit；19, fault latch circuit；20, test interface；21, from plate trouble light；22, DC/AC drives mould
Block.
Specific implementation mode
The utility model is further described below in conjunction with Figure of description and specific embodiment.
As shown in Figure 1, the DC/AC drive module dynamic accelerated ageing test devices of the present embodiment, specifically include one piece of survey
Examination mainboard 1 and one piece or more of test are provided with multiple-channel output interface 9 from plate 11, testing host 1, for each test from
Plate 11 connects one to one；Each test is provided with multi-channel test interface 20 from plate 11, is used for and each DC/AC drive modules to be measured
22 connections；For generating pwm signal, be sent to each DC/AC drive modules 22 to be measured from plate 11 after tested is surveyed testing host 1
Examination；Test is from plate 11 for being compared the detection signal that DC/AC drive modules 22 to be measured export to judge each DC/AC to be measured
Whether drive module 22 is qualified.The DC/AC drive module dynamic accelerated ageing test devices of the utility model, using testing host
1 tests the pattern to match from plate 11 with polylith, can be carried out simultaneously to the multi-way detecting signal of multiple DC/AC drive modules 22
It detects simultaneously, simple in structure, easy to operate, cost is relatively low.
Specifically, wherein testing host 1 includes：DC power supply 2, power circuit 4 (such as power modulation chip LM5175), master
Plate filter capacitor 3, control core TMS320F2808 (dsp chip 5), mainboard driving circuit 6 (such as driving chip MCU14504),
CAN transceiver 7, output interface 9 (mainboard accessory power outlet Xi in Fig. 1 (i=1,2,3 ..., 8)) and main board failure lamp 10 are (in Fig. 1
LEDi (i=1,2,3 ..., 8))；
Wherein the DC power supply 2 of testing host 1 is external 24V/12V power supplys, output termination mainboard filter capacitor 3 and power supply
Circuit 4.The input termination of power circuit 4 24V/12V DC power supplies 2, power circuit 4 by 24V/12V be converted to 15V, 3.3V and
1.8V, wherein output end 3.3V and 1.8V connect dsp chip 5, and 15V connects mainboard driving circuit 6, and the ground of power circuit 4 is exported to survey
Examination from plate 11, with test from plate 11 altogether.Wherein power circuit 4 is mainly that testing host 1 provides power supply, while giving test from plate
11 provide a public ground.
Wherein dsp chip 5, power pack input signal connect power circuit 4, and output section taps driving chip MCU14504,
6 road pwm signals are provided for entire test device.Wherein the power supply unit of mainboard driving circuit 6 taps power circuit 4, signal input
Terminate 5 output end of dsp chip, and output termination mainboard accessory power outlet Xi (i=1,2,3 ..., 8).Wherein CAN transceiver 7 meets DSP
Chip 5 and affiliated PC machine 8 realize 5 program writing of dsp chip.Mainboard accessory power outlet connects the output end of mainboard driving circuit 6, electricity
The module ground of source circuit 4 is tested from 11 fault-signal of plate, dsp chip 5 (reset signal), is realized testing host 1 and is tested from plate
Signal between 11 transmits.Wherein main board failure lamp 10 connects mainboard accessory power outlet, wherein main board failure lamp LEDi (i=1,2,
3 ..., 8) what is actually connect is to test the fault-signal sent up from plate 11.
Test includes from plate i (i=1,2,3 ..., 8)：From plate i signal input sockets 12 (S1 in Fig. 1), from plate i power supplys
Socket 16, test interface 20 (such as from plate accessory power outlet X1i (i=1,2,3 ..., 16)), from drive circuit 13, reference power supply
Circuit 17, voltage comparator circuit 18, fault latch circuit 19, from plate trouble light 21 (see LED1i in Fig. 1 (i=1,2,3 ...,
16)).The input signal S1 input termination mainboard accessory power outlets Xi of signal input socket 12 (from plate 11 and mainboard output insert by test
Seat corresponds) and 19 output end of fault latch circuit；S1 outputs are terminated from drive circuit 13.Outside 16 input terminal of power outlet
Connecing dc power power supply 14,16 input terminal of power outlet is parallel with from plate filter capacitor 15, output termination reference power circuit 17,
From drive circuit 13, comparison circuit 18 and from plate accessory power outlet, electricity is provided from plate 11 and DC/AC drive modules 22 for test
Source.From plate accessory power outlet input termination from 13 output end of drive circuit and power outlet 16, output terminates DC/AC drive modules
22.From the input of drive circuit 13 termination from plate input socket 12S1, output is terminated from plate accessory power outlet.Reference power circuit 17
Input termination power outlet 16, output termination 18 input terminal of comparison circuit.Comparison circuit 18 input termination from plate accessory power outlet, from
Plate power outlet 16 and affiliated reference power circuit 17, output termination fault latch circuit 19.19 input terminal of fault latch circuit
The output signal of voltage comparator circuit 18 is connect, output termination realizes the lock of failure from plate trouble light 21 and from plate input socket 12
It deposits and reports.It is connect respectively from plate trouble light LED1i (i=1,2,3 ..., 16) corresponding from plate accessory power outlet and affiliated fault latch
Circuit 19.
Wherein DC/AC drive modules 22 include one 61 encapsulation IGBT of conjunction and driving plate, have 6 road pwm signal input ports,
The input port of 2 NTC, 2 road current sensor outputs and several earth signals.
It is as follows to test concrete principle：
(1) DC power supply 2 introduces 12/24V power supplys on testing host 1, and 15V, 1.8V, 3.3V are converted to through power circuit 4
And 5V；Wherein 15V is used to mainboard driving circuit 6, and 1.8V and 3.3V are used to dsp chip 5, and 5V gives corresponding CAN transceiver 7
It uses；
(2) dsp chip 5 generates 6 road pwm signals on testing host 1, adds a driving circuit 6 in the output end of 6 road signals
Enhance the driving capability of 6 road PWM；
(3) earth signal, 6 road pwm signals, reset signal and fault-signal these signals are sent to master by testing host 1
Plate accessory power outlet Xi (i=1,2,3 ..., 8)；Each mainboard accessory power outlet connects corresponding test from plate 11, on mainboard accessory power outlet side
On connect a main board failure lamp 10 and pull down to ground again.If the test of mainboard accessory power outlet correspondence is broken down from plate 11 all the way for certain,
Then the corresponding main board failure lamp of the mainboard accessory power outlet 10 lights that (fault-signal is from 18 output signal of plate comparison circuit, failure
When export high RST), can rapid positioning failure from plate；
(4) test designs an input socket 12 from plate 11 and is docked with mainboard accessory power outlet, pair in receiving step (3)
Induction signal；
(5) wherein each test has 16 from plate accessory power outlet from plate 11, respectively connects a DC/AC drive module
22.Due to needing electric current 0.4A in each DC/AC drive module 22, electric current is needed altogether in 16 DC/AC drive modules 22
6.4A, i.e., one test needs to provide 6.4A from plate 11, and testing host 1 will connect N number of test from plate 11 (N >=8), then be pooled to
The electric current of testing host 1 is more than 50A, can not be born for plate grade device or harness it is so high-power, so each test
A power outlet 16 is designed from plate 11, is powered by individual dc power power supply 14, but the dc power power supply 14
The ground of ground and testing host 1 will link together, which exports 15V；
(6) each DC/AC drive modules 22 have following signal respectively：6 road PWM inputs, 1 road NTC, No. 2 current sensors
Voltage signal, 15V power supply signals and the enable signal of generation, each port respectively by a plug with from plate accessory power outlet pair
It connects；Enable signal is directly connected to ground in test from plate 11, enables continuously effective；
(7) test from plate 11 from testing host 1 receive the 6 road pwm signals that come again this by one from drive circuit
13, give DC/AC drive modules 22；
(8) reference power circuit 17 generates high-precision 5V power supplys, entire power supply all the way and is divided again with precision resistance, is compared
Compared with 18 benchmark comparison voltage of circuit；
(9) there is the voltage signal that NTC (2 interfaces) all the way and two-way current sensor generate in DC/AC drive modules 22.
Temperature/resistance curve of NTC is searched according to dynamic aging test temperature for NTC, finds resistance of the NTC near test point
Value, is then divided with a precision resistance with NTC resistance；The voltage that NTC divides in aging test temperature point range is most
Big value is UNTCMax, minimum value UNTCMin；Reference power circuit 17 in step (8) divides to obtain U by precision resistanceNTCMax
And UNTCMin, by UNTC、UNTCMaxAnd UNTCMinThe two-way of comparison circuit 18 (such as comparator LM2903) is given, if UNTCDo not exist
UNTCMinAnd UNTCMaxBetween, then it is problematic to regard as NTC, by fault latch circuit 19 (such as chip CD4044) by fault-signal
It latches, while one is lighted from plate trouble light at the accessory power outlet that plate 11 is docked with block DC/AC drive modules 22 in test
21 (LED light).The high level of the latch can give testing host 1 simultaneously, light corresponding main board failure lamp 10.Press testing host
After reset signal on 1, the fault-signal can be understood.By above method, 6 pwm signals of DC/AC drive modules 22 are logical
Road, 1 NTC and 2 current sensor signal can obtain burn-in test, and whole device can 128 DC/AC of aging simultaneously
Drive module 22.The analog signal such as generated for current sensor finds one rationally according to databook and practical measurement
Quiescent output voltage range, give the quiescent output voltage of 2 current sensors to comparator LM2903 respectively, if sensing
The voltage of device output is not within the scope of defined, then it is assumed that the current sensor is faulty, by the fault latch, while at this
DC/AC drive modules 22 light one from plate trouble light 21 with corresponding from plate accessory power outlet.
(10) if entire test process fault-free lamp is lighted, DC/AC drive modules 22 pass through test.
Although the utility model has been disclosed with preferred embodiment as above, it is not limited to the utility model.It is any
Those skilled in the art, in the case where not departing from technical solutions of the utility model range, all using the disclosure above
Technology contents many possible changes and modifications are made to technical solutions of the utility model, or be revised as the equivalent of equivalent variations
Embodiment.Therefore, every content without departing from technical solutions of the utility model, according to the utility model technical spirit to above real
Any simple modifications, equivalents, and modifications that example is done are applied, should all be fallen in the range of technical solutions of the utility model are protected.
Claims (10)
1. a kind of DC/AC drive modules dynamic accelerated ageing test device, which is characterized in that including one piece of testing host (1) with
And one piece or more of test is provided with multiple-channel output interface (9) from plate (11), the testing host (1), is used for and each test
It connects one to one from plate (11)；Each test is provided with multi-channel test interface (20) from plate (11), is used for and each DC/AC to be measured
Drive module (22) connects；The testing host (1) is sent to each DC/ to be measured from plate (11) after tested for generating pwm signal
AC drive modules (22) are tested；The detection that the test is used to export DC/AC drive modules (22) to be measured from plate (11)
Signal is compared to judge whether each DC/AC drive modules (22) to be measured are qualified.
2. DC/AC drive modules dynamic accelerated ageing test device according to claim 1, which is characterized in that the survey
It includes dsp chip (5), DC power supply (2), power circuit (4) and mainboard driving circuit (6) to try mainboard (1)；The power circuit
(4) input terminal is connected with the DC power supply (2), for converting the power supply of DC power supply (2)；The power circuit
(4) output end is connected with the mainboard driving circuit (6) and dsp chip (5) respectively, for providing transformed power supply；Institute
It states mainboard driving circuit (6) to be respectively connected with the dsp chip (5) with output interface (9), for generate dsp chip (5)
Pwm signal is sent to output interface (9).
3. DC/AC drive modules dynamic accelerated ageing test device according to claim 2, which is characterized in that the DSP
Chip (5) is connected through CAN transceiver (7) with PC machine (8), for the program writing to dsp chip (5).
4. DC/AC drive modules dynamic accelerated ageing test device according to claim 2, which is characterized in that described straight
The voltage in galvanic electricity source (2) is 24V/12V DC power supplies (2), the voltage of the power circuit (4) output be 15V, 3.3V and
1.8V。
5. DC/AC drive modules dynamic accelerated ageing test device as claimed in any of claims 1 to 4, special
Sign is that described test from plate (11) includes reference power circuit (17), comparison circuit (18) and fault latch circuit (19)；Institute
The input terminal connection reference power circuit (17) of comparison circuit (18) is stated, and interface (20) drives mould with the DC/AC after tested
Block (22) is connected, detection signal for receiving the DC/AC drive modules (22) and with the benchmark of reference power circuit (17)
Power supply is compared；The output end of the comparison circuit (18) is connected with the fault latch circuit (19), for that will compare knot
Fruit exports to fault latch circuit (19) and carries out fault latch.
6. DC/AC drive modules dynamic accelerated ageing test device according to claim 5, which is characterized in that described defeated
It is both provided with emergency light, the fault latch circuit (19) and malfunction indicator lamp on outgoing interface (9) and test interface (20)
It is connected, for lighting corresponding emergency light when generating failure.
7. DC/AC drive modules dynamic accelerated ageing test device according to claim 5, which is characterized in that the survey
Examination from plate (11) further include from drive circuit (13), it is described from drive circuit (13) output with testing host (1) respectively
Interface (9) is connected with test from the test interface (20) of plate (11), the driving capability for increasing pwm signal.
8. DC/AC drive modules dynamic accelerated ageing test device according to claim 5, which is characterized in that the survey
Examination is circumscribed with dc power power supply (14) from plate (11), the external dc power power supply (14) through power outlet (16) respectively with
Reference power circuit (17), comparison circuit (18), fault latch circuit (19) are connected with test interface (20).
9. DC/AC drive modules dynamic accelerated ageing test device as claimed in any of claims 1 to 4, special
Sign is that described test from the quantity of plate (11) is 5~10 pieces.
10. DC/AC drive modules dynamic accelerated ageing test device as claimed in any of claims 1 to 4, special
Sign is that the output interface (9) of the testing host (1) is 5~10 tunnels, and the test is from the test interface (20) of plate (11)
10~20 tunnels.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820584579.4U CN208044026U (en) | 2018-04-23 | 2018-04-23 | A kind of DC/AC drive modules dynamic accelerated ageing test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820584579.4U CN208044026U (en) | 2018-04-23 | 2018-04-23 | A kind of DC/AC drive modules dynamic accelerated ageing test device |
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| Publication Number | Publication Date |
|---|---|
| CN208044026U true CN208044026U (en) | 2018-11-02 |
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ID=63928260
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|---|---|---|---|
| CN201820584579.4U Active CN208044026U (en) | 2018-04-23 | 2018-04-23 | A kind of DC/AC drive modules dynamic accelerated ageing test device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109471422A (en) * | 2018-11-13 | 2019-03-15 | 重庆佰节成测控技术有限公司 | A kind of aging tooling control system and its detection method |
-
2018
- 2018-04-23 CN CN201820584579.4U patent/CN208044026U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109471422A (en) * | 2018-11-13 | 2019-03-15 | 重庆佰节成测控技术有限公司 | A kind of aging tooling control system and its detection method |
| CN109471422B (en) * | 2018-11-13 | 2021-07-13 | 重庆佰节成测控技术有限公司 | Aging tool control system and detection method thereof |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: Fifty-seven, Zhuzhou Province, China National hi tech Development Zone, Hunan, Li Yu Industrial Park, district 412007 Patentee after: Zhongche Times Electric Vehicle Co., Ltd. Address before: Fifty-seven, Zhuzhou Province, China National hi tech Development Zone, Hunan, Li Yu Industrial Park, district 412007 Patentee before: Hunan Zhongche times electric Limited by Share Ltd |
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| CP01 | Change in the name or title of a patent holder |