CN203054176U - Automatic coupling testing system of optical detector TO-CAN - Google Patents

Automatic coupling testing system of optical detector TO-CAN Download PDF

Info

Publication number
CN203054176U
CN203054176U CN 201220709112 CN201220709112U CN203054176U CN 203054176 U CN203054176 U CN 203054176U CN 201220709112 CN201220709112 CN 201220709112 CN 201220709112 U CN201220709112 U CN 201220709112U CN 203054176 U CN203054176 U CN 203054176U
Authority
CN
China
Prior art keywords
slide unit
test
detector
axle
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN 201220709112
Other languages
Chinese (zh)
Inventor
王黎
王超
张振峰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuhan Huagong Genuine Optics Tech Co Ltd
Original Assignee
Wuhan Huagong Genuine Optics Tech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wuhan Huagong Genuine Optics Tech Co Ltd filed Critical Wuhan Huagong Genuine Optics Tech Co Ltd
Priority to CN 201220709112 priority Critical patent/CN203054176U/en
Application granted granted Critical
Publication of CN203054176U publication Critical patent/CN203054176U/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Abstract

Disclosed in the utility model is an automatic coupling testing system of an optical detector TO-CAN. The automatic coupling testing system comprises a testing box, an external device and a computer. A positioning seat and six-dimensional sliding platforms for positioning and coupling of the testing system are fixed on a base plate inside the testing box; and testing plates capable of realizing bulk loading of detector TOs are fixed on the positioning seat. Three electric sliding platform controllers for controlling the motions of the sliding platforms are arranged at the top outside the testing box, wherein the sliding platform controllers are electrically connected with the computer. The external device is respectively and electrically connected with the computer and the testing box. And the testing box is a light-proof sealed box body. According to the utility model, modes of manual feeding and blanking, automatic coupling and automatic testing are employed; and the problems of wrong determination and misoperation during the manual testing can be solved. Moreover, the provided system has the characteristics of high testing precision and fast testing rate and the like. The production qualification rate and the capacity of the optical detector TO-CAN can be effectively improved. And the system cost is much less than costs of the same kind of automatic devices at home and abroad.

Description

The photo-detector TO-CAN test macro that is coupled automatically
Technical field
The utility model relates to a kind of system that is used for the testing photoelectronic element, specifically refers to the semiconductor photo diode of test light detector TO-CAN(transistor encapsulation) automatic coupling test macro.
Background technology
(Photodiode PD) is the semiconductor devices with PN junction to photodiode, and when the light of suitable wavelength was injected into the photosensitive material layer of semiconductor, light signal can change electric signal into.Photodiode is to work under the reverse voltage effect, and when not having illumination, inverse current is extremely faint, is referred to as dark current; When illumination was arranged, inverse current increased rapidly, was referred to as photocurrent.Light intensity is more big, and inverse current is also more big.The variation of light causes that photodiode current changes, and this just can convert light signal to electric signal, becomes optoelectronic sensor.
Be designated hereinafter simply as detector TO at photo-detector TO-CAN() in the product actual production process, can earlier the PD chip be installed to the TO base, and the lensed TO pipe cap of band, be made into the detector TO of transistor encapsulation, parts such as body and tail optical fiber be installed by coupling again be made into the detector device.Therefore the coupling of detector TO, encapsulation, test require also than higher it as the important step in the photoelectric device production run, need in process of production every photoelectricity index of detector TO to be carried out strict test.
Under the situation of the market price, production efficiency and performance mutual restriction, the research and development of automated production testing apparatus become an important directions of optical fiber communication enterprise development, and the shortage of domestic automation equipment also makes detector TO ATE (automatic test equipment) become an important research project.At present, automatic coupling testing apparatus in the optical fiber communication industry is because of differences such as different company's background and strength, the various kinds of equipment of design and outsourcing also is varied voluntarily, wherein in the majority with test spectral characteristic and the automatic Coupling device of the isoparametric laser instrument of focal length, and be used for the test probe responsiveness automatic Coupling device seldom.Present domestic great majority are artificial coupling, and in the artificial coupling process, because of influences such as focal length, frock clamp precision, personnel's technical ability moods, when having caused expending a large amount of man-hour, test accuracy and stability are unsatisfactory, have influenced yield rate and the quality of production greatly.
The utility model content
In view of this, fundamental purpose of the present utility model is to provide a kind of speed is fast, precision is high, the photo-detector TO-CAN of good stability is coupled automatically test macro.
For achieving the above object, the utility model provides a kind of photo-detector TO-CAN the test macro that is coupled automatically, it comprises test box, external unit and computing machine, positioning seat is fixedly arranged on the test box internal backplane and be used for the location of test macro and the sextuple electronic slide unit of coupling, the test panel that can load detector TO is in batches fixedly arranged on this positioning seat, this test panel is to place the anchor clamps that are connected with circuit for product, this test box exterior top is placed with three electronic slide unit controllers that are used for the electronic slide unit motion of control, this electronic slide unit controller is electrically connected with computing machine, this external unit is electrically connected with computing machine and test box respectively, and this test box is lighttight seal case.
The electronic slide unit of described 6 DOF is made up of two cover three-D electric slide units, be respectively the electronic slide unit of XYZ and the electronic slide unit of UVW, the electronic slide unit of this XYZ comprises orthogonal X-axis slide unit, Y-axis slide unit and Z axle slide unit in twos, wherein the X-axis slide unit of the electronic slide unit of XYZ and Y-axis slide unit are installed on the test box base plate and are vertical mutually, this Z axle slide unit is installed on the X-axis slide unit by Connection Block and is vertical with the XY plane, the electronic slide unit of UVW comprises mutually vertical U axle slide unit, V axle slide unit and W axle slide unit in twos, and the electronic slide unit of UVW is installed on this X-axis slide unit by Connection Block.
Described Z axle slide unit bottom is connected with the probe panel seat for the fixing test circuit board, this probe panel seat moves up and down with Z axle slide unit, be welded with probe on this testing circuit board, this probe vertically passes the pilot hole of this probe panel seat lower end to fix, described W axle slide unit also can move up and down perpendicular to the UV plane, described W axle slide unit is provided with fiber bench vertically downward, the fibre-optical probe that light is sought in coupling that is used for that arranges is fixedly arranged on this fiber bench down, and light path is injected vertically downward in the lens of detector TO and is produced induction current during coupling.
Described Y-axis slide unit is installed on this base plate one side, this base plate opposite side is equipped with the contour slide rail consistent with Y-axis slide unit height, all be provided with the identical slide block of shape size on this slide unit and the slide rail, T type support column is installed respectively on two slide blocks, two T type support columns couple together by web joint, slide block on the Y-axis slide unit moves forward and backward and drives the same moved further of slide block on this slide rail, described X-axis slide unit is parallel to this web joint and installs, being connected with on this X-axis slide unit can be with first Connection Block of X-axis slide unit move left and right, described U axle slide unit and Z axle slide unit are connected to described X-axis slide unit by this first Connection Block, described U axle slide unit is parallel to the side that this X-axis slide unit is installed in this first Connection Block, Z axle slide unit is installed in the opposite side of this first Connection Block, being connected with on the described U axle slide unit can be with second Connection Block of U axle slide unit move left and right, described V axle slide unit is connected to this U axle slide unit by this second Connection Block perpendicular to the U axle, described V axle slide unit is provided with the 3rd Connection Block that can move forward and backward with V axle slide unit, and described W axle slide unit is connected to described V axle slide unit by the 3rd Connection Block perpendicular to the UV plane.
Described positioning seat is provided with 4 register pins of being convenient to the assignment test dish, and the outside of described positioning seat is provided with 2 fixedly buckles that are used for the fixing test dish.
Described test panel includes test panel loam cake, interfix plate, PCB and test panel lower cover, design has 100 stations on the described test panel, the corresponding socket aperture of each station and a probe aperture are equipped with socket in the described socket aperture, are used for inserting detector TO and being fixed; Thimble with socket pins quantity same number is installed in the described probe aperture, is used for contacting with probe; Described thimble and socket all are welded on the middle PCB of test panel, fix by test panel loam cake and test panel lower cover, and the below design of described each socket aperture of test panel loam cake has the groove of being convenient to detector TO plug.
On each described electronic slide unit controller two control ports are arranged all, can control two electronic slide units simultaneously moves, three electronic slide unit controllers are controlled described X-axis slide unit, Y-axis slide unit, Z axle slide unit, U axle slide unit, V axle slide unit and W axle slide unit simultaneously and are moved, on the mainboard PCI expansion slot of described computing machine multi-serial-port card is installed, these three electronic slide unit controllers are connected on the multi-serial-port card by Serial Port Line.
The measuring equipment that described external unit comprises described electronic slide unit controller, is used for providing the optical device of coupling light source and is used for adding electrical measurement to element under test, this light source comprises that constant light source, optical attenuator, light are counted along separate routes, light power meter, this measuring equipment comprises reometer, voltage table, oscillograph, described computing machine is installed the GPIB card at mainboard PCI expansion slot, and described reometer, voltage table, optical attenuator, light power meter and oscillograph are connected on the GPIB card by the GPIB line.
The output terminal of described constant light source is connected to the input end of optical attenuator, the luminous power of light source output should be 2 times demand luminous power after decaying through optical attenuator, the output terminal of this optical attenuator is connected to the input end that 1 fen 2 light are counted along separate routes, and 2 output terminals that this light is counted along separate routes are connected respectively on described fibre-optical probe and the described light power meter.
Be provided with trough in the described test box, the casing of described test box is provided with cable hole.
The utility model adopts the mode of artificial loading and unloading, coupling automatically, automatic test; The problem of erroneous judgement, maloperation when effectively having avoided the manual testing has characteristics such as measuring accuracy height, test rate be fast, can effectively improve production qualification rate and the production capacity of photo-detector TO-CAN, and this equipment cost is much smaller than similar automation equipment both domestic and external.
Description of drawings
Fig. 1 is the utility model photo-detector TO-CAN test system structure block diagram that is coupled automatically;
Fig. 2 is be coupled the automatically test box cut-away view of test macro of the utility model photo-detector TO-CAN;
Fig. 3 is the test flow chart of automatic coupling test macro of the present utility model;
Fig. 4 is the software test interface of automatic coupling test macro of the present utility model.
Embodiment
For ease of to structure of the present utility model and the further understanding that has been effective, show the preferred embodiment that develops simultaneously by reference to the accompanying drawings and be described in detail as follows.
As Fig. 1 and shown in Figure 2, the utility model photo-detector TO-CAN test macro that is coupled automatically comprises test box, external unit and computing machine.Positioning seat 13 is fixedly arranged on the test box internal backplane and be used for the location of test macro and the sextuple electronic slide unit of mechanical motion such as coupling, the test panel that can load detector TO is in batches fixedly arranged on this positioning seat 13, test panel is to place the anchor clamps that are connected with circuit for product, 3 electronic slide unit controllers that are used for the electronic slide unit motion of control are placed at the test box top, and test box itself provides a lighttight sealed environment.The measuring equipment that external unit comprises above-mentioned electronic slide unit controller, is used for providing the optical device of coupling light source and is used for adding electrical measurement to element under test, this optical device comprise that constant light source, optical attenuator, light power meter, light counts along separate routes; This measuring equipment comprises reometer, voltage table, oscillograph, and being used for provides the required electric current of device work, voltage, obtains test value and feeds back to computing machine.Computing machine is mainly used in the analyzing and processing of data, sends each the instrument collaborative work of instruction control whole test system by testing software.
As shown in Figure 2, the sextuple electronic slide unit in the test box is made up of two cover three-D electric slide units, is respectively the electronic slide unit of XYZ and the electronic slide unit of UVW.The electronic slide unit of this XYZ comprises orthogonal X-axis slide unit 6 in twos, Y-axis slide unit 9 and Z axle slide unit 22, wherein the X-axis slide unit 6 of the electronic slide unit of XYZ and Y-axis slide unit 9 are installed on the test box base plate and are vertical mutually, this base plate places on the worktable of a complete level, Z axle slide unit 22 is installed on the X-axis slide unit 6 by Connection Block and is vertical with the XY plane, and the electronic slide unit of another set of UVW comprises U axle slide unit 5, V axle slide unit 23 and W axle slide unit 25, U, V, W axle slide unit is also vertical mutually in twos, and be installed on the X-axis slide unit 6 by Connection Block, formed the sextuple electronic slide unit of cover system.This Y-axis slide unit 9 is installed on this base plate one side, and the base plate opposite side is equipped with the contour slide rail 17 highly consistent with Y-axis slide unit 9.All be provided with the identical slide block of shape size on slide unit and the slide rail, T type support column 8 is installed respectively on two slide blocks, two T type support columns 8 couple together by web joint 7, just can drive the same moved further of slide block on the right side slide rail 17 like this when the slide block on the Y-axis slide unit 9 moves forward and backward.X-axis slide unit 6 is parallel to web joint 7 and installs perpendicular to Y-axis slide unit 9, is connected with first Connection Block 21 on the X-axis slide unit 6, and this first Connection Block 21 can be with X-axis slide unit 6 move left and right.U axle slide unit 5 and Z axle slide unit 22 are connected to X-axis slide unit 6 by first Connection Block 21, and U axle slide unit 5 is parallel to the side that X-axis slide unit 6 is installed in first Connection Block 21, and Z axle slide unit 22 is perpendicular to the opposite side of XY Plane Installation at first Connection Block 21.These Z axle slide unit 22 bottom linking probe panel seats 20 are used for the fixing test circuit board, can move up and down with Z axle slide unit 22, are welded with probe 16 on the testing circuit board, and probe 16 vertically passes the pilot hole of probe panel seat 20 lower ends to fix.Be connected with second Connection Block 3 on the U axle slide unit 5, can be with U axle slide unit 5 move left and right, V axle slide unit 23 is connected to U axle slide unit 5 by second Connection Block 3 perpendicular to the U axle.V axle slide unit 23 is provided with the 3rd Connection Block 26, can move forward and backward with V axle slide unit 23, and W axle slide unit 25 is connected to V axle slide unit 23 by the 3rd Connection Block 26 perpendicular to the UV plane.W axle slide unit 25 is provided with the 4th Connection Block 24, can move up and down with W axle slide unit 25, and the 4th Connection Block 24 is provided with fiber bench 14, and fiber bench 14 vertically downward; Fiber bench 14 lower ends designs has round tray, inserts fibre-optical probe in the pallet pilot hole, covers fiber cover 15 and with screw its fibre-optical probe is fixed.Positioning seat 13 is arranged on the appropriate location on the base plate, guarantees test panel in the shift motion of X, Y-axis slide unit, and the limit of positioning seat 13 is parallel to the XY axis installs.The centre of positioning seat 13 is equipped with 4 register pins, is used for the assignment test dish; The outside of positioning seat 13 is provided with 2 fixedly buckles 12, is used for the fixing test dish.Test panel includes test panel loam cake 19, interfix plate, cushion block 11, TO socket PCB, test panel lower cover 18, test panel is provided with 100 stations in the utility model, the corresponding socket aperture of each station and a probe aperture, socket is installed in the socket aperture, is used for inserting detector TO and being fixed; Thimble with socket pins quantity same number is installed in the probe aperture, is used for contacting with probe; Thimble and socket all are welded on the PCB in the middle of the test panel, fix by cover plate up and down.18 designs of test panel lower cover have 4 to be convenient at the fixing pilot hole of test box positioning seat, and the below design of each socket aperture of test panel loam cake has the groove of being convenient to detector TO plug.During installation, earlier 100 sockets are welded on the PCB, the PCB that has welded socket and thimble is placed on the test panel lower cover 18, then cushion block 11 is pressed in the both sides of PCB, adjust again that the interfix plate is disposable packs all sockets in the pilot hole into, what part was not packed into can adjust separately, cover test panel loam cake 19 at last, cover plate is locked fixing up and down to screw screw, 4 register pins that 4 pilot holes of test panel bottom are aimed on the test box positioning seat 13 are put into and flattened, with 2 fixedly buckle 12 lockings in positioning seat 13 outsides, be parallel to each other to guarantee test panel and XY axis again.Bracing frame 2 and the casing 1 of last installation testing case can't shine in the test box extraneous light, are convenient to test dark current.Cables such as the control line of motor, the p-wire on the testing circuit board, optical fiber can carry out cabling by the trough that is arranged on X-axis slide unit 6 and Y-axis slide unit 9 limits, and all cables pick out from the cable hole 4 of test box backboard, connect for external unit.The utility model middle probe number can be changed according to the number of pin of product, to adapt to the detector TO product of different model.
On each electronic slide unit controller two control ports are arranged, can control 2 electronic slide units simultaneously and move, 3 electronic slide unit controllers can be controlled 6 electronic slide units simultaneously and move.During connection control signal wire is connected to electronic slide unit port from director port, comprises the Electric Machine Control line and the limit switch signal line that is arranged on electronic slide unit guide rail two ends of electronic slide unit in the control signal wire.
All be provided with the steering order interface for the running of receiving computer output order opertaing device on reometer, voltage table, electronic slide unit controller, optical attenuator, light power meter and the oscillograph, these interfaces are connected on the corresponding steering order card by control line.Reometer, voltage table, optical attenuator, light power meter and oscillograph are by GPIB line (General-Purpose Interface Bus, general purpose interface bus) is connected on the GPIB card, 3 electronic slide unit controllers are connected on the multi-serial-port card by Serial Port Line, and GPIB card and multi-serial-port card are installed on the PCI expansion slot of computing machine.
The connection of external unit is simple relatively, illustrate with PIN-TIA type detector: the voltage table correspondence is connected to the detector TIA(Transimpedance Amplifier on the testing circuit board, trans-impedance amplifier) pin, be used for providing the Vcc operating voltage and measure the Icc working current, to guarantee the TIA steady operation.Another set of voltage table and reometer correspondence are connected to the detector PD pin on the testing circuit board, and reometer is for the breakdown reverse voltage Vbr that provides the Ipd electric current to measure PD simultaneously; Voltage table is for the dark current Id or the response current Ir that provide the Vpd bias voltage to measure PD simultaneously.The oscillograph correspondence is connected to the voltage output end pin (comprising Vout+, Vout-) of TIA on the testing circuit board, when automatic coupling reaches the peak response electric current, can measure output voltage amplitude.When optical device connects, the output terminal of constant light source is connected to the input end of optical attenuator, the luminous power of light source output should be 2 times demand luminous power after decaying through optical attenuator, the output terminal of optical attenuator is connected to the input end that 1 fen 2 light are counted along separate routes, 2 output terminals that light is counted along separate routes are connected respectively on fibre-optical probe and the light power meter, because two output terminal light intensity that 1 fen 2 light are counted along separate routes are basically identicals, so the optical power value that light power meter reads can be approximately the optical power value that fibre-optical probe is exported, so just can be by the output power of light power meter reading monitoring fibre-optical probe, thereby optical attenuator is adjusted in real time, to guarantee the stable output of light source.If this luminous power does not satisfy the requirement of setting value, can it be adjusted to setting value by the pad value that changes the input end optical attenuator, above reaction type monitoring can guarantee the constant of light source.6 electronic slide unit control lines are connected respectively on 6 control interfaces of 3 electronic slide unit controllers.
Computer hardware of the present utility model partly is: at mainboard PCI expansion slot GPIB card and multi-serial-port card are installed, the GPIB cartoon is crossed the gpib interface that the GPIB line is connected to each equipment, can adopt mode such as series connection to connect; Multi-serial-port card is connected respectively to 3 electronic slide unit controllers by Serial Port Line; Digital voltage source is connected to the computing machine USB interface by the USB control line.Computer software part: the photo-detector TO-CAN testing software that is coupled automatically is installed, be used for above each equipment of control and finish sequence of operations such as motor running fix, test automatically, coupling automatically, judgement automatically, data storage, software interface can show various test parameters and station information (as shown in Figure 4) intuitively, and controls the running of total system as control terminal.
X, Y, Z axle slide unit stroke are longer, the location that is used for probe with contact, after X, Y-axis slide unit moved to the coordinate of station correspondence, Z axle slide unit begins to move down made probe contact with thimble, the connection test circuit; U, V, W axle slide unit stroke are shorter, mobile accuracy is higher relatively, be used for the optically-coupled of seeking of detector, after test circuit is connected, U, V axle slide unit move to the coordinate of station correspondence, fibre-optical probe namely is in directly over the detector TO, and three are all carried out the high speed coupling according to the algorithm that sets in stroke range separately.
During test, the test panel that installs detector TO element is placed on the positioning seat in the test box, and confirms to fix, by computer software product type and the station that needs test is set then.Steering order is transferred in the electronic slide unit controller by serial ports of computers, and electronic slide unit controller control slide unit moves to the correspondence position of station and begins test.Power up for detector TO by reometer and voltage table, test electrical performance indexes such as its dark current, breakdown reverse voltage; Constant luminous energy is provided for detector TO by light source and optical attenuator, detector induction simultaneously produces photocurrent, the photocurrent data feed back to computing machine by reometer, and computer software is controlled electronic slide unit according to coupling algorithm and is coupled automatically, finally optical property index such as degree of meeting with a response.
As shown in Figure 3, the utility model photo-detector TO-CAN detailed test process of test macro that is coupled automatically is as follows:
(A) detector TO is installed on the test panel according to the station order, the register pin on the corresponding test box positioning seat of test panel is installed in the test box again, the locking snap close is closed the test chamber door, and material loading is finished.
(B) open testing software; parameters such as test odd numbers, test man's job number, product type are set; testing software calls corresponding device parameter according to product type; comprise: voltage fed voltage, current source supply electric current, light source light power, voltage table range, protection voltage, reometer range, protective current, test rate, instrument show setting, output port, power supply time-delay, light power meter wavelength, light decay depreciation, and the correlation parameter that is coupled automatically, motor initiation parameter, index judgement scope etc.Software can carry out initialization to testing apparatus according to the parameter that reads then, controls the motor playback simultaneously.
(C) carry out station according to test panel material loading state and select, choose the corresponding station that detector TO is housed, can begin test.Testing software reads the good station coordinate of calibration in advance, and control X, Y-axis slide unit move to the probe aperture top of No. 1 station, fall Z axle slide unit, make the probe on the slide unit touch thimble, are communicated with test circuit; Control the element top that U, V axle slide unit move to No. 1 station simultaneously, the fibre-optical probe on the W axle slide unit roughly is positioned at the lens center of detector TO.
(D) test electrical property: each reometer, voltage table begin to power up to element, parameters such as surveying work electric current, breakdown reverse voltage, dark current, and test result returned to computing machine, come out by the testing software interface display.If product through overaging, can show the variable quantity of each parameter of aging front and back according to the selection of testing process.
(E) test light performance: the optical attenuator optical gate is opened, source device output optical power, and light power meter reads current optical power value and returns to computing machine.If test value and setting value are not inconsistent, it is big or small that the computer control optical attenuator is regulated decay, until light stability in setting value.Voltage source is supplied with the suitable reversed bias voltage of PD, can begin automatic coupling, and idiographic flow is as follows:
(E1) thick coupling: U axle slide unit and V axle slide unit carry out from inside to outside spiral coupling according to the stepping of setting.When fibre-optical probe moved, the luminous power of vertically being injected by fibre-optical probe that detector TO receives also changed thereupon, and the response current of detector TO also changes thereupon simultaneously.Response current value and the UV coordinate figure of record every bit when the response current value surpasses limit value or spiral coupling area and exceeds setting range, namely stop coupling, and U, V axle slide unit are moved to the coordinate position of response current maximum.Whole process repeats twice, and the different current limit value of correspondence is looked for ray velocity with quickening respectively.
(E2) thin coupling: the response current that at first records initial position, response current after U axle slide unit moves a stepping and records movement along rectilinear direction according to the step distance of setting, if the corresponding electric current after mobile then continues to move along the initial movable direction greater than the response current of initial position, otherwise move toward reverse direction.Response current value and the U axial coordinate value of record every bit in the moving process, current value rises and then continues to move forward, and current value descends and then turns back to a current point position, stops coupling when mobile step number reaches setting value.V axle slide unit and W axle slide unit be coupling in this manner successively also.Whole process triplicate, each step distance is successively decreased, to improve measuring accuracy.
(F) after coupling is finished, according to peak response current value and optical power value calculated response degree parameter, and read the voltage magnitude of response wave shape by digital oscilloscope.Testing software carries out bad judgement according to the bound scope that arranges, and shows poor prognostic cause.
(G) after No. 1 station test was finished, Z axle slide unit rose, and probe leaves test panel, and testing software reads the station coordinate No. 2, and X, Y-axis slide unit drive probe and fibre-optical probe moves to position of components No. 2.Repeat above (C)-(F) step and carry out the test of No. 2 elements, and finish the test that all choose station by that analogy.
(H) after whole looping test was finished, probe rose, the motor playback.Snap close on the positioning seat is unclamped, take off test panel, finish blanking.As required test data is exported to electrical form or printing.
The beneficial effects of the utility model are as follows:
The utility model photo-detector TO-CAN test macro that is coupled automatically, with respect to the total man worker's test mode that extensively adopts at present, artificial loading and unloading have been adopted, automatically coupling, automatically the mode of test, because personnel's technical ability or emotion influence cause judging by accident, the problem of maloperation, and this system's operation is simple and easy when effectively having avoided the manual testing, reduce the technical ability requirement to the tester, had characteristics such as measuring accuracy height, test speed be fast.Automatically the speed that is coupled according to statistics is 3 times of speed of manually being coupled approximately, has improved production qualification rate and the test rate of detector TO greatly.Though and similar external full-automatic testing equipment also can reach high precision and two-forty, structure is very complicated, and price is very expensive, is not easy to maintenance and popularization.
The above is preferred embodiment of the present utility model only, is not for limiting protection domain of the present utility model.

Claims (10)

1. photo-detector TO-CAN test macro that is coupled automatically, it is characterized in that, it comprises test box, external unit and computing machine, positioning seat is fixedly arranged on the test box internal backplane and be used for the location of test macro and the sextuple electronic slide unit of coupling, the test panel that can load detector TO is in batches fixedly arranged on this positioning seat, this test panel is to place the anchor clamps that are connected with circuit for product, this test box exterior top is placed with three electronic slide unit controllers that are used for the electronic slide unit motion of control, this electronic slide unit controller is electrically connected with computing machine, this external unit is electrically connected with computing machine and test box respectively, and this test box is lighttight seal case.
2. the photo-detector TO-CAN as claimed in claim 1 test macro that is coupled automatically, it is characterized in that, the electronic slide unit of described 6 DOF is made up of two cover three-D electric slide units, be respectively the electronic slide unit of XYZ and the electronic slide unit of UVW, the electronic slide unit of this XYZ comprises orthogonal X-axis slide unit in twos, Y-axis slide unit and Z axle slide unit, wherein the X-axis slide unit of the electronic slide unit of XYZ and Y-axis slide unit are installed on the test box base plate and are vertical mutually, this Z axle slide unit is installed on the X-axis slide unit by Connection Block and is vertical with the XY plane, the electronic slide unit of UVW comprises mutually vertical U axle slide unit in twos, V axle slide unit and W axle slide unit, the electronic slide unit of UVW is installed on this X-axis slide unit by Connection Block.
3. the described photo-detector TO-CAN of claim 2 test macro that is coupled automatically, it is characterized in that, described Z axle slide unit bottom is connected with the probe panel seat for the fixing test circuit board, this probe panel seat moves up and down with Z axle slide unit, be welded with probe on this testing circuit board, this probe vertically passes the pilot hole of this probe panel seat lower end to fix, described W axle slide unit also can move up and down perpendicular to the UV plane, described W axle slide unit is provided with fiber bench vertically downward, the fibre-optical probe that light is sought in coupling that is used for that arranges is fixedly arranged on this fiber bench down, and light path is injected vertically downward in the lens of detector TO and is produced induction current during coupling.
4. the described photo-detector TO-CAN of claim 2 test macro that is coupled automatically, it is characterized in that, described Y-axis slide unit is installed on this base plate one side, this base plate opposite side is equipped with the contour slide rail consistent with Y-axis slide unit height, all be provided with the identical slide block of shape size on this slide unit and the slide rail, T type support column is installed respectively on two slide blocks, two T type support columns couple together by web joint, slide block on the Y-axis slide unit moves forward and backward and drives the same moved further of slide block on this slide rail, described X-axis slide unit is parallel to this web joint and installs, being connected with on this X-axis slide unit can be with first Connection Block of X-axis slide unit move left and right, described U axle slide unit and Z axle slide unit are connected to described X-axis slide unit by this first Connection Block, described U axle slide unit is parallel to the side that this X-axis slide unit is installed in this first Connection Block, Z axle slide unit is installed in the opposite side of this first Connection Block, being connected with on the described U axle slide unit can be with second Connection Block of U axle slide unit move left and right, described V axle slide unit is connected to this U axle slide unit by this second Connection Block perpendicular to the U axle, described V axle slide unit is provided with the 3rd Connection Block that can move forward and backward with V axle slide unit, and described W axle slide unit is connected to described V axle slide unit by the 3rd Connection Block perpendicular to the UV plane.
5. the described photo-detector TO-CAN of claim 1 test macro that is coupled automatically is characterized in that described positioning seat is provided with 4 register pins of being convenient to the assignment test dish, and the outside of described positioning seat is provided with 2 fixedly buckles that are used for the fixing test dish.
6. the described photo-detector TO-CAN of claim 3 test macro that is coupled automatically, it is characterized in that, described test panel includes test panel loam cake, interfix plate, PCB and test panel lower cover, design has 100 stations on the described test panel, the corresponding socket aperture of each station and a probe aperture, in the described socket aperture socket is installed, is used for inserting detector TO and being fixed; Thimble with socket pins quantity same number is installed in the described probe aperture, is used for contacting with probe; Described thimble and socket all are welded on the middle PCB of test panel, fix by test panel loam cake and test panel lower cover, and the below design of described each socket aperture of test panel loam cake has the groove of being convenient to detector TO plug.
7. the photo-detector TO-CAN as claimed in claim 2 test macro that is coupled automatically, it is characterized in that, on each described electronic slide unit controller two control ports are arranged all, can control two electronic slide units simultaneously moves, three electronic slide unit controllers are controlled described X-axis slide unit, Y-axis slide unit, Z axle slide unit, U axle slide unit, V axle slide unit and W axle slide unit simultaneously and are moved, on the mainboard PCI expansion slot of described computing machine multi-serial-port card is installed, these three electronic slide unit controllers are connected on the multi-serial-port card by Serial Port Line.
8. the photo-detector TO-CAN as claimed in claim 3 test macro that is coupled automatically, it is characterized in that, described external unit comprises described electronic slide unit controller, the measuring equipment that is used for providing the optical device of coupling light source and is used for adding electrical measurement to element under test, this light source comprises constant light source, optical attenuator, light is counted along separate routes, light power meter, this measuring equipment comprises reometer, voltage table, oscillograph, described computing machine is installed GPIB card, described reometer at mainboard PCI expansion slot, voltage table, optical attenuator, light power meter and oscillograph are connected on the GPIB card by the GPIB line.
9. the photo-detector TO-CAN as claimed in claim 8 test macro that is coupled automatically, it is characterized in that, the output terminal of described constant light source is connected to the input end of optical attenuator, the luminous power of light source output should be 2 times demand luminous power after decaying through optical attenuator, the output terminal of this optical attenuator is connected to the input end that 1 fen 2 light are counted along separate routes, and 2 output terminals that this light is counted along separate routes are connected respectively on described fibre-optical probe and the described light power meter.
10. the photo-detector TO-CAN as claimed in claim 1 test macro that is coupled automatically is characterized in that be provided with trough in the described test box, the casing of described test box is provided with cable hole.
CN 201220709112 2012-12-20 2012-12-20 Automatic coupling testing system of optical detector TO-CAN Expired - Lifetime CN203054176U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220709112 CN203054176U (en) 2012-12-20 2012-12-20 Automatic coupling testing system of optical detector TO-CAN

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220709112 CN203054176U (en) 2012-12-20 2012-12-20 Automatic coupling testing system of optical detector TO-CAN

Publications (1)

Publication Number Publication Date
CN203054176U true CN203054176U (en) 2013-07-10

Family

ID=48737116

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201220709112 Expired - Lifetime CN203054176U (en) 2012-12-20 2012-12-20 Automatic coupling testing system of optical detector TO-CAN

Country Status (1)

Country Link
CN (1) CN203054176U (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103674485A (en) * 2013-12-25 2014-03-26 中国电子科技集团公司第四十一研究所 Photoelectric detector parameter testing fixture and testing method
CN104280209A (en) * 2013-07-11 2015-01-14 武汉亿科思德科技有限公司 Optical sub-module detecting machine and detecting method
CN105486465A (en) * 2015-11-19 2016-04-13 中国商用飞机有限责任公司 Automatic detection tool and method
CN106932700A (en) * 2017-03-31 2017-07-07 深圳市芯思杰智能物联网技术有限公司 The opto-electronic device DC performance test system of transistor outline package
CN107167722A (en) * 2016-03-08 2017-09-15 大唐移动通信设备有限公司 A kind of instrument detecting tool platform and instrument detection device
CN107917753A (en) * 2017-07-31 2018-04-17 河南中基阳光电子技术有限公司 A kind of automatic coupling method suitable for optical device detector
CN108548656A (en) * 2018-03-29 2018-09-18 昂纳信息技术(深圳)有限公司 A kind of test device for TO-CAN lasers and test system
CN109580189A (en) * 2019-01-22 2019-04-05 中国科学院福建物质结构研究所 Automatic focal length measuring equipment and its measurement method for laser diode
CN110186516A (en) * 2019-06-21 2019-08-30 北京壹达创智科技有限公司 A kind of equipment, system and method for the test of laser automatic Synthesis and aging

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104280209A (en) * 2013-07-11 2015-01-14 武汉亿科思德科技有限公司 Optical sub-module detecting machine and detecting method
CN103674485A (en) * 2013-12-25 2014-03-26 中国电子科技集团公司第四十一研究所 Photoelectric detector parameter testing fixture and testing method
CN103674485B (en) * 2013-12-25 2015-12-02 中国电子科技集团公司第四十一研究所 Photodetector parameter testing jig and method of testing
CN105486465A (en) * 2015-11-19 2016-04-13 中国商用飞机有限责任公司 Automatic detection tool and method
CN107167722A (en) * 2016-03-08 2017-09-15 大唐移动通信设备有限公司 A kind of instrument detecting tool platform and instrument detection device
CN106932700A (en) * 2017-03-31 2017-07-07 深圳市芯思杰智能物联网技术有限公司 The opto-electronic device DC performance test system of transistor outline package
CN107917753A (en) * 2017-07-31 2018-04-17 河南中基阳光电子技术有限公司 A kind of automatic coupling method suitable for optical device detector
CN107917753B (en) * 2017-07-31 2022-12-23 河南中基阳光电子技术有限公司 Automatic coupling method suitable for optical device detector
CN108548656A (en) * 2018-03-29 2018-09-18 昂纳信息技术(深圳)有限公司 A kind of test device for TO-CAN lasers and test system
WO2019184244A1 (en) * 2018-03-29 2019-10-03 昂纳信息技术(深圳)有限公司 Testing device and testing system used for to-can laser
CN108548656B (en) * 2018-03-29 2021-08-03 昂纳信息技术(深圳)有限公司 Test device and test system for TO-CAN laser
CN109580189A (en) * 2019-01-22 2019-04-05 中国科学院福建物质结构研究所 Automatic focal length measuring equipment and its measurement method for laser diode
CN110186516A (en) * 2019-06-21 2019-08-30 北京壹达创智科技有限公司 A kind of equipment, system and method for the test of laser automatic Synthesis and aging

Similar Documents

Publication Publication Date Title
CN203054176U (en) Automatic coupling testing system of optical detector TO-CAN
RU2715045C1 (en) Test system for monitoring electrical connections of electronic components with printed circuit board
CN110186516A (en) A kind of equipment, system and method for the test of laser automatic Synthesis and aging
CN212540614U (en) TO base APD testing arrangement
CN110456253A (en) A kind of test of collection and the integrated chip manufacture device of sorting function
CN205898176U (en) Automatic test system in batches of photoelectric detector
CN202903227U (en) Tester for simultaneously testing multiple optical modules with one path of signals
CN106896281A (en) A kind of method of testing of the transient state common mode inhibition parameter to numeral isolation class device
CN204008075U (en) Optical Fiber Numerical Aperture experiments of measuring system
CN100373165C (en) Ball grid array substrate detecting device and constructive method thereof
CN215115100U (en) Photoelectric characteristic test platform
CN205594105U (en) PIN -FET opto -receiver module automatic test system
CN218002694U (en) Light sensation calibration testing device of electronic equipment
CN208888344U (en) A kind of test device of light emitting secondary module
CN112824850A (en) State detection, material taking and placing control device of openable tool and module detection equipment
RU2719303C1 (en) Printed-circuit board with contact device
CN111123071A (en) Single-point laser attack injection testing device for chip safety detection
CN2138303Y (en) Unit of LED tester
CN206618399U (en) It is automatic to survey workpiece height instrument
CN213302010U (en) System for testing infrared detector
CN220961693U (en) Automatic testing device for photoelectric coupler
CN110031745A (en) The method and apparatus calibrated and tested for optical transceiver
CN215869326U (en) TO-CAN sensitivity detection device
CN213023361U (en) Wireless receiving terminal aging test tool that charges
CN110420866A (en) A kind of optical filter test equipment

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CX01 Expiry of patent term

Granted publication date: 20130710

CX01 Expiry of patent term