CN110186516A - A kind of equipment, system and method for the test of laser automatic Synthesis and aging - Google Patents
A kind of equipment, system and method for the test of laser automatic Synthesis and aging Download PDFInfo
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- CN110186516A CN110186516A CN201910544964.5A CN201910544964A CN110186516A CN 110186516 A CN110186516 A CN 110186516A CN 201910544964 A CN201910544964 A CN 201910544964A CN 110186516 A CN110186516 A CN 110186516A
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- 238000012360 testing method Methods 0.000 title claims abstract description 170
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- 230000033001 locomotion Effects 0.000 claims description 14
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- 239000013307 optical fiber Substances 0.000 claims description 11
- 238000001228 spectrum Methods 0.000 claims description 10
- 230000005611 electricity Effects 0.000 claims description 7
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 6
- 230000011664 signaling Effects 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 4
- 230000002950 deficient Effects 0.000 claims description 4
- 238000012797 qualification Methods 0.000 claims description 4
- 241001269238 Data Species 0.000 claims description 3
- 238000010616 electrical installation Methods 0.000 claims description 3
- 230000003760 hair shine Effects 0.000 claims description 3
- 238000009413 insulation Methods 0.000 claims description 3
- 230000002452 interceptive effect Effects 0.000 claims description 3
- 238000010079 rubber tapping Methods 0.000 claims description 3
- 238000003466 welding Methods 0.000 claims description 3
- 238000010183 spectrum analysis Methods 0.000 claims description 2
- 230000008901 benefit Effects 0.000 description 6
- 230000008859 change Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000010923 batch production Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000005070 sampling Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 238000012549 training Methods 0.000 description 2
- 241000931526 Acer campestre Species 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 230000012010 growth Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000035772 mutation Effects 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
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- G—PHYSICS
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- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
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- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/0014—Monitoring arrangements not otherwise provided for
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Abstract
The present invention provides a kind of equipment of automatic Synthesis test and aging for laser, it include: bottom plate (1), ball-screw (2), coaster (3), first sliding rail (4), second sliding rail (5), drive beam (6), first sliding block (7), second sliding block (8), first column (9), second column (10), third column (11), 4th column (12), testboard (13), first support arm (14), second supporting walls (15), crossbeam (16), first straight line bearing (17), second straight line bearing (18), cylinder (19), it detects beam (20), electric mounting board (21), controller (23), one-dimensional stepper motor and electrification high temperature ageing device.The system for laser automatic Synthesis test and aging is also provided, the equipment and host computer human-computer interaction module of automatic Synthesis test and aging including hardware components, laser.Additionally provide the method for the automatic Synthesis test and aging of laser.
Description
Technical field
The present invention relates to technical field of photo communication, and in particular to a kind of automatic Synthesis test and aging for laser
Equipment, system and method.
Background technique
With quick universal, the development pair of fiber to the home, broadband China, 5G communication and large data center etc. of fiber optic communication
The demand of optical device is presented the growth of explosion type, and optic communication is become being favored by capital of having a extensive future by minority's industry
Big industry.Full fiber tunable laser is the critical component in high-speed high capacity optical communication system, especially its wider increasing
The advantages that beneficial bandwidth and easy stable tuning structure and its optical maser wavelength are exactly in optic communication 1500nm wave band,
A hot spot in field is developed as laser.In fiber optic communication weight, rear-earth-doped optical fiber laser is compared with semiconductor laser
Device has the advantages that
1, it need not can change original noise characteristic and the bit error rate directly to optical signal amplification by photoelectric conversion
Under the premise of, the blended data format of number, simulation or the two can be directly amplified.
2, the excitation wavelength of optical fiber laser is determined by the rare earth dopant of host material, not by the control of pump wavelength
System；
3, optical fiber laser and fiber amplifier and existing optical fibre device (such as coupler, polarizer and modulator) are complete
It is compatible, all -fiber Transmission system being made of completely optical fibre device can be produced, it is anti-by directional couple technology and Prague
Emitter technology produces narrow linewidth, tunable optical fiber laser.
4, optical fiber laser can directly generate the transformation pole of enough power as optical soliton source, erbium-doped fiber mode-locked laser
Ultrashort light pulse is limited, simultaneously because nonlinear effect of the light pulse when fiber resonance cavity retransmits defeated under suitable condition can
The transform limit hyperbolic secant shape light pulse that pulsewidth is tens of or hundreds of femtoseconds is generated, is the perfect light source of optical soliton communication.
However, the large batch of production capacity and the degree of automation of laser lowly then become the bottleneck of the sector development.
This is because, being performance of the single single device cooperation test software to product mostly in the batch production of present laser
Parameter is tested item by item, and product sequential testing one by one is got off, this needs a large amount of artificial and equipment, and the survey of product
Consistency is tried by certain limitation；In addition test equipment is mutually separated with aging equipment, repeat loading and unloading cause it is artificial very big
Waste.
Therefore, it is necessary to effectively carry out multi-parameter in mass production disposably in high volume to test, needed for reducing to the greatest extent
The personnel wanted and other resources, and each parameter testing part and aging part can be organically fused together, to improve laser
The production efficiency of device product.
In addition, being all the light function by light power meter to laser during currently known optical fiber laser burn-in test
Rate data are acquired, but existing light power meter be easy to cause laser to leak, and are also single component independent test, in synthesis
Burn-in test is completed again after the completion of test, therefore safety is low and the efficiency and accuracy of test are lower.
Summary of the invention
For the deficiency of existing method and means, the present invention provides one kind for the test of laser automatic Synthesis and aging
Equipment, system and method, automatic Synthesis test and the production processes such as aging applied to laser can be widely applied to light
Laser batch production in fiber communication component is suitable for the work such as product test, data acquisition storage and the aging of product, can
To carry out the disposable automatic test job of high-volume of multi-parameter in high-volume laser production.
To achieve the goals above, the purpose of the present invention is to provide a kind of automatic Synthesis test for laser and always
The equipment of change, comprising:
Bottom plate (1), ball-screw (2), coaster (3), the first sliding rail (4), the second sliding rail (5), drive beam (6), first are slided
Block (7), the second sliding block (8), the first column (9), the second column (10), third column (11), the 4th column (12), testboard
(13), the first support arm (14), the second supporting walls (15), crossbeam (16), first straight line bearing (17), second straight line bearing
(18), cylinder (19), detection beam (20), electric mounting board (21), controller (23), one-dimensional stepper motor and electrification high temperature are old
Makeup is set, wherein the coaster (3) is arranged on bottom plate (1) by ball-screw (2), first sliding rail (4) and second is slided
Rail (5) is arranged in parallel in the both ends of bottom plate (1) respectively, and first sliding block (7) and second sliding block (8) are separately positioned on institute
It states on the first sliding rail (4) and the second sliding rail (5), the drive beam (6) is supported on first sliding block (7) and described second and slides
Between block (8), and it is orthogonal with the transmission plane that the first column (9) and the second column (10) are constituted, one above the drive beam (6)
It is arranged in parallel at set a distance the testboard (13), multiple laser monolithic test boards, each laser is laid on the testboard
It is insulation between device monolithic test board, and the laser list of corresponding form and specification can be set according to the model of laser
Block test board, the testboard (13) are plate, and opposite two sides are supported by the first support arm (14) and the second supporting walls (15),
It is arranged in parallel the crossbeam (16) right above the testboard (13), crossbeam (16) center opening, and from center tapping
It wearing cylinder (19), cylinder (19) two sides are symmetrical arranged first straight line bearing (17) and second straight line bearing (18), and described first
The lower end of linear bearing (17) and second straight line bearing (18) passes through mechanical fastener connecting detection beam (20), the electrical installation
Plate (21) is mounted on the testboard (17) side, and the sensor on electric mounting board is used for multiple sharp on testboard (17)
Laser after light device and electrification high temperature ageing is detected, comprising: cylinder, connecting line, program board and multiple probes, institute
The other side that controller (23) is mounted on the testboard (17) is stated, for controlling the detection process (21) of laser；Described one
Dimension stepper motor movement will drive include cylinder, multimode fibre, probe and optical power detecting unit superstructure run
To above the product of the first row of the testboard.
Preferably, the testboard is the mode of 5*20, a laser of socket 5, while testing 5 products, totally 20 row,
Around the pedestal of each plug in laser be arranged four pads, for when upper probe is fallen with four pads
Contact is powered on and reads the back facet current of laser for laser, the electric property of four pads be respectively power supply,
Back facet current and laser diode current.
Preferably, the electrification high temperature ageing device is high temperature ageing case, and the product for completing test is put into high temperature
Ageing oven carries out aging, installs dustproof cover on the outside of the electric mounting board (21).
The object of the invention is also to provide a kind of systems for laser automatic Synthesis test and aging, comprising: should
System include hardware components, for laser automatic Synthesis test and aging equipment and host computer human-computer interaction module,
In: the hardware components include: that single-chip microcontroller (MCU) and electric signal processing unit, optical signal detection and processing unit, electromagnetism are gentle
Dynamic control unit, stepper motor, spectroanalysis instrument and communication and signaling control unit.
Preferably, the single-chip microcontroller (MCU) and electric signal processing unit include up/down position machine module and circuit hardware mould
Block, the slave computer module acquire for control circuit hardware data and carry out data communication with host computer；The circuit is hard
Part module is made of sensor, A/D converter and function of the MCU control panel, the sensor and testboard detection test
Parameter converts analog signals into digital signal by A/D conversion circuit, by the software journey in the function of the MCU control panel
Sequence carries out corresponding operation and judgement, and is transmitted in the upper computer module by data/address bus；Or described in reversed reception
The control signal that upper computer module is sent by data/address bus, by the function of the MCU control panel control stepper motor and
The movement of sensor and data acquisition.
Preferably, the optical signal detection and processing unit are large area optical signal detector, the large area optical detection
Device receives the light that laser issues, and is calculated and analyzed, and the large area optical signal detector includes four probes, in electricity
Drive down four probes to move up and down by pneumatic unit under the control of magnetic and pneumatic control unit, move to bottom when
It waits, probe, which touches, to be inserted on four pads provided around the pedestal of laser, and laser shines to the big face of top
Product optical signal detector forms electric current on the large area optical signal detector and is used for subsequent processing.
Preferably, the electromagnetism and pneumatic control unit are driven by the opening and closing control pneumatic unit of solenoid valve
Large area optical signal detector moves up and down, and the solenoid valve is connect by transmitting tracheae with the pneumatic unit, the electromagnetism
Air pump is connected with pneumatic control unit, the up and down motion of the large area optical signal detector is controlled using pneumatic mode.
Preferably, the communication sends the slave computer mould for the information of the upper computer module with signaling control unit
In the software of block perhaps spectroanalysis instrument and by the information back for feeding back or reading give the upper computer module man-machine friendship
Mutual software.
Preferably, for realizing data processing and human-computer interaction, function includes the host computer human-computer interaction module: passing through data
Size of the threshold value, slope, backlight, front and back of the laser of bus acquisition to optical power under voltage and specified current flow, drafting
P-I (power-current), U-I (current-voltage) and backlight curve, i.e. PIV curve out；Spectrum analysis is read by gpib interface
Instrument internal register information obtains each spectrum test data of the laser；It will during the electrification high temperature ageing
The laser backlight current that the MCU and electric signal processing unit monitor carries out qualification judgement；All data classifications are deposited
Enter long-range and the machine database；Data interaction is carried out with intelligence manufacture management platform (IMMP) or MES.
The object of the invention is also to provide a kind of methods of automatic Synthesis test and aging for laser, including step
It is rapid:
Step 1, testing laser device is inserted into monolithic test board, and be placed on testboard, it is light that test starts preceding finger
It is calibrated at the welding plate edge that micro-touch touches the laser surrounding；
Step 2, host computer is opened, to carry out all test datas with IMMP platform and control the interaction of signal, is loaded into
Configuration file default；
Step 3, the calibration before being tested using standard component equipment, it is ensured that the number that next use process detects
It is worth authentic and valid；
Step 4, it clicks " the starting to test " at upper computer software interface, the man-machine interface of PC machine sends control command to communication
Unit, equipment select I/O unit to select product to be measured by piece, and it includes cylinder, multimode fibre, probe that stepper motor movement, which drives,
It is run to the superstructure of optical power detecting unit etc. above the product of the first via；
Step 5, the equipment pressurizes to cylinder, by solenoid valve conduction air pump so that optical signal detection and place
Reason unit and probe move downward, until probe is pressed on testboard on four pads on product periphery to be measured, described four
The electric property of pad be respectively power supply, back facet current and laser diode current, so that the product to be measured on test board be added
Electricity, slave computer just pass through four probes and read laser diode current and back facet current, are transmitted to optical signal by optical fiber
The power of testing laser device is read in spectrometer, by optical signal detection and processing unit；
Step 6, analog signal optical signal detection and processing unit and probe received is turned by A/D converter
It changes, the signal after conversion carries out processing by MCU processor and obtains related data, and the related data is passed through USB and spi bus
The communication unit of composition passes host computer back and is calculated, stored and shown, while indication signal is stored in memory, and passes through finger
Show that lamp makes mark, calculates power, threshold value, slope and the backlight performance indicator of laser, store data into corresponding data
In library, and it is shown in the host computer of man-machine interface；
Step 7, after completing the concurrent testing of product all the way, system communicates instructions to solenoid valve and cylinder is deflated, above
Test cell lift, after probe completely disengages testboard a distance, system sends control information to one-dimensional stepper motor, band
The test cell on dynamic top is moved to down product all the way, the test process of repeating said steps 5 and step 6, until monolith is tested
Product to be measured on plate is fully completed test, and last stepper motor drives the test cell on top to return to initial origin.
Step 8, data processing is carried out, the product to be measured on testboard all after test, data is saved, are sieved
Choosing and processing, determine whether corresponding position product test passes through according to processing result, for not passing through the laser of test, by it
Taking-up is placed in defective products holder；
Step 9, the product for testing completion is put into high temperature ageing case and carries out aging, detects product to be measured by USB interface
Dark current is simultaneously recorded into database；
Step 10, the product completed after aging needs after test pattern is revised as aging, again repeatedly step 1~step
Rapid 8 test.
Beneficial effects of the present invention: it efficiently solves in the production of high-volume laser and lacks the multi-parameter (threshold of such as laser
Value, slope, dark current, wavelength, spectrum width, side mode suppression ratio etc.) disposable high-volume automatic test the problem of, greatly subtract
Lack required Manufacturing Worker and all kinds of production equipments, improves to several times production efficiency and product quality, and such as PIV
Multiple work such as each testing performance index and aging of (power-current-voltage) and spectrum are organically fused together, this
Outside, thus the system realize laser product parallel automatically test, data are automatically stored and compare, test and aging completes
It is organically unified, man power and material required for production can be largely saved, significantly reduces production cost, and test one can be made
Cause property effectively improves.
For above and other objects of the present invention, feature and advantage can be clearer and more comprehensible, preferred embodiment is cited below particularly,
And cooperate attached drawing, it is described in detail below.
Detailed description of the invention
Fig. 1 is according to the test of the laser automatic Synthesis of the embodiment of the present invention and aging equipment mechanical structure exploded pictorial
Figure.
Fig. 2 show laser automatic Synthesis test according to an embodiment of the present invention and ageing system system function module is former
Manage schematic diagram.
Fig. 3 show the test of laser automatic Synthesis and the acquisition of ageing system data according to an embodiment of the present invention and communicates
Structure chart.
Fig. 4 show laser automatic Synthesis test according to an embodiment of the present invention and ageing system element circuit plate function
Figure.
Fig. 5 show the electricity under laser automatic Synthesis test according to an embodiment of the present invention and ageing system working condition
Gas mounting plate hardware configuration layout drawing.
Fig. 6 show laser automatic Synthesis according to an embodiment of the present invention test and ageing system solenoid valve, switch with
And gas circuit structure layout drawing.
Fig. 7 show laser automatic Synthesis test according to an embodiment of the present invention and aging method flow chart.
Specific embodiment
Automatic Synthesis for equipment, the system and method for the test of laser automatic Synthesis and aging, applied to laser
The production processes such as test and aging can be widely applied to the laser batch production in fiber optic communication component, be suitable for producing
Product test, data acquisition storage and the work such as the aging of product can carry out the disposable of multi-parameter in high-volume laser production
In high volume automatic test job.
In the present embodiment for laser automatic Synthesis test and aging equipment, comprising: bottom plate 1, ball-screw 2,
Coaster 3, the first sliding rail 4, the second sliding rail 5, drive beam 6, the first sliding block 7, the second sliding block 8, the first column 9, the second column 10,
Three columns 11, the 4th column 12, testboard 13, the first support arm 14, the second supporting walls 15, crossbeam 16, first straight line bearing 17,
Second straight line bearing 18, cylinder 19, detection beam 20, electric mounting board 21 and controller 23, wherein coaster 3 passes through ball-screw
2 are arranged on bottom plate 1, and the first sliding rail 4 and the second sliding rail 5 are arranged in parallel in the both ends of bottom plate 1, the first sliding block 7 and second respectively
Sliding block 8 is separately positioned on the first sliding rail 4 and the second sliding rail 5, drive beam 6 be supported on the first sliding block 7 and the second sliding block 8 it
Between, and it is orthogonal with the transmission plane that the first column 9 and the second column 10 are constituted, drive beam is arranged in parallel at a certain distance from 6 top
Testboard 13 lays multiple laser monolithic test boards on testboard, is insulation between each laser monolithic test board, and
And the laser monolithic test board of corresponding form and specification can be set according to the model of laser, testboard 13 is plate, phase
Pair two sides supported by the first support arm 14 and the second supporting walls 15, crossbeam 16, crossbeam 16 are arranged in parallel right above testboard 13
Center opening, and cylinder 19 is worn from center tapping, 19 two sides of cylinder are symmetrical arranged first straight line bearing 17 and second straight line
The lower end of bearing 18, first straight line bearing 17 and second straight line bearing 18 is electrical to pacify by mechanical fastener connecting detection beam 20
Loading board 21 is mounted on 17 side of testboard, and the sensor on electric mounting board is used to carry out multiple lasers on testboard 17
Detection, while carrying out electrification high temperature ageing, comprising: cylinder, connecting line, program board and multiple probes, as shown in figure 5, control
Device 23 is mounted on the other side of testboard 17, for controlling the detection process 21 of laser.
The mechanical structure exploded view that the structural member of screw rod guide rail and other support functions composition, in detail parsing are shown in Fig. 1.Make
For the mechanical platform for carrying its part, and relevant portion is driven to move forward and backward when motor movement, so that detector reaches
Designated position carries out dependence test.
In the present embodiment, testboard is the mode of 5*20, and a row can insert 5 lasers, it can while 5 productions of test
Product, totally 20 row, is arranged four pads, as shown in attached drawing 7a, when upper probe is fallen around the pedestal of each plug in laser
When, with four contact pads, it is powered on for laser and reads the back facet current of laser.
As shown in figure 4, further including one-dimensional stepper motor, slave computer controls one-dimensional stepper motor, the fortune of one-dimensional stepper motor
Dynamic will drive includes that the superstructure of cylinder, multimode fibre, probe and optical power detecting unit runs to the first of testboard
Above the product of row.
It further include high temperature ageing case, the product for completing test is put into high temperature ageing case and carries out aging.Electrical installation
Dustproof cover 22 is installed on the outside of plate 21.
As in Figure 2-4, the system integration is carried out on the basis of the test of laser automatic Synthesis and aging equipment, comprising:
Hardware components, for laser automatic Synthesis test and aging equipment and host computer human-computer interaction module, in which: Hardware Subdivision
Dividing includes: single-chip microprocessor MCU) and electric signal processing unit, optical signal detection and processing unit, electromagnetism and pneumatic control unit, step
Into motor, spectroanalysis instrument and communication and signaling control unit.
Single-chip microprocessor MCU) and electric signal processing unit include up/down position machine module and circuit hardware module, slave computer mould
Block is arranged in single-chip microcontroller, software program of the programming in the MCU of the processing unit in slave computer module, for passing through these
Software program control circuit hardware data in MCU acquires and carries out data communication with host computer；Circuit hardware module is by passing
Sensor, A/D converter and function of the MCU control panel composition, sensor and testboard will need test parameter detected, and lead to
It crosses A/D conversion circuit and converts analog signals into digital signal, transported accordingly by the software program in MCU function control plate
It calculates and judges, and be transmitted in the upper computer module software in single-chip microcontroller by data/address bus；Or reversed reception host computer mould
The control signal that block is sent by data/address bus, by MCU function control plate control stepper motor and sensor movement and
Data acquisition.
In the present embodiment, optical signal detection and processing unit use large area optical signal detector, pass through preceding light and rear light
Laser component be very important a ring, this part is substantially to have made a light power meter by oneself, can also actually be recognized
For the sensor for being an optical power size, large area optical detector receives the light that laser issues, calculate by software and
Analysis.Large area optical signal detector includes four probes, by pneumatic unit band under the control of electromagnetism and pneumatic control unit
It moves lower four probes to move up and down, when moving to bottom, probe, which touches, to be inserted with four provided around the pedestal of laser
On a pad, laser shines to the large area optical signal detector of top, forms electric current on large area optical signal detector
For subsequent processing.
As shown in fig. 6, electromagnetism and pneumatic control unit control pneumatic unit by the opening and closing of solenoid valve, drive big
Area optical signal detector moves up and down, and solenoid valve is connect by transmitting tracheae with pneumatic unit, electromagnetism and pneumatic control unit
It further include a switch, electromagnetism connects air pump with pneumatic control unit, controls large area optical signal detector using pneumatic mode
Up and down motion, enable to probe even closer in conjunction with circuit board, movement velocity faster, reduce error checking risk.
The information of the interactive software of upper computer module is sent slave computer module by communication and signaling control unit
In software perhaps spectroanalysis instrument and by the information back for feeding back or reading to the interactive software of upper computer module.
In the present embodiment, setting piece selects I/O unit, selects I/O unit to select testing laser device by piece.
For host computer human-computer interaction module for realizing data processing and human-computer interaction function, function includes: total by data
Line uses usb bus, spi bus or gpib bus) threshold value of laser of acquisition, slope, backlight, front and back is to voltage and specified
The size of optical power under electric current, draws out P-I power-current), U-I current-voltage) and backlight curve, i.e. PIV curve；Pass through
Gpib interface reads spectroanalysis instrument internal register information, obtains each spectrum test data of laser；In electrification high temperature
The laser backlight current for monitoring MCU and electric signal processing unit in ageing process carries out qualification judgement；By all numbers
Long-range and the machine database is stored according to classification；Platform IMMP is managed with intelligence manufacture) or MES progress data interaction.
The method of automatic Synthesis test and aging for laser, comprising steps of
Step 1, testing laser device is inserted into monolithic test board, and be placed on testboard, there is machine in the equipment of system
It is positioned at the front and back salient point of tool support construction, with monolithic test board bottom notch, tests before starting and slightly touch laser with finger
It is calibrated at the welding plate edge of device surrounding；
Step 2, open host computer in IMMP platform, this operation guarantee all test datas and IMMP platform into
The interaction of row data and control signal, is loaded into configuration file default, as shown in attached drawing 7a；
Step 3, as shown in Figure 7b, equipment Alignment is required before being tested using standard component equipment before each use
Calibration, the parameter index of testing standard part, and make test error be less than 100uW microwatt), it is ensured that next use process
The numerical value detected is authentic and valid；According further to the needs of measuring accuracy, testing number of sampling can arbitrarily be adjusted, to production efficiency
It makes even weighing apparatus with the quality of data, and encrypts the number of sampling in particular range, so that it may smooth threshold curve region and find out Kink
Area power mutation), allow user effectively to avoid the nonlinear area of laser or determine rejected product, no
Qualified product can be identified by system indicator, can also be screened by data comparison.
Step 4, it clicks " the starting to test " at upper computer software interface, the man-machine interface of PC machine sends control command to communication
Unit, equipment select I/O unit to select product to be measured by piece, stepper motor movement just will drive include cylinder, multimode fibre,
The superstructure of probe and optical power detecting unit etc. is run to above the product of the first via, in the present embodiment, equipment design
It is the test pattern of 5*20, therefore per there is 5 products to be measured all the way, each piece of test board has 20 tunnels, therefore on one piece of test board
Be up to 100 products to be measured；
Step 5, equipment pressurizes to cylinder, by solenoid valve conduction air pump so that optical signal detection and processing at this time
Unit and probe move downward, until probe is pressed onto four blank pads on product periphery to be measured on test board, this four welderings
The electric property of disk be respectively power supply, back facet current and laser diode current, at this time the product to be measured on test board just adds
Electricity, slave computer just read laser diode current and back facet current by probe, optical signal are transmitted in spectrometer by optical fiber
In, pass through the power that large area photo detecting unit above reads testing laser device.
Step 6, the signal that photo detecting unit and probe receive is analog signal, they pass through the signal of A/D converter
Handled by MCU processor, related data passes through USB again passed back with the communication unit that spi bus forms PC machine do it is mutually accrued
It calculates, store and shows, while indication signal is stored in memory, and mark is made by indicator light, it can be by the function of laser
The indexs such as rate, threshold value, slope and backlight performance are calculated, and are stored data into corresponding database, and are shown to man-machine
In the host computer at interface, one row of the top of the human-computer interaction interface of Fig. 7 c host computer shows PIV curve, is then immediately below
The data value of each index.While testing above-mentioned performance parameter, spectrum is linked by the optical signal that multimode fibre receives
In the optical port of analyzer, the upper computer software of PC machine reads the number of each register in spectroanalysis instrument by GPI B bus interface
According to required spectral information being recovered, to obtain the spectrum tests data such as wavelength, spectrum width and side mode suppression ratio；
Step 7, after completing the concurrent testing of product all the way, system communicates instructions to solenoid valve and cylinder is deflated, above
Test cell lift, after probe completely disengages test board a distance, system retransmits control information to stepper motor, drive
The test cell on top is moved to down product all the way.The test process for 5 and the step 6 of repeating the above steps, until monolith test board
On product to be measured be fully completed test, then stepper motor drive top test cell return to initial origin.
System can be suspended at any time during the test, can accomplish continuous survey, repetition measurement, return and survey and be arbitrarily designated test position
It sets, does not generate duplicate serial numbers product；For the accuracy for guaranteeing product test, system setup number is optionally repeatedly multiple
Brake, this can effectively be avoided the erroneous judgement of normal laser, improve the accuracy rate of test, avoid frequently the fiber crops of artificial repetition measurement
It is tired.
Step 8, data processing.After product to be measured on testboard is all tested, right click is exported at data text
To at my document, name saves data, opens " Before Aging " label clicked after the file of preservation in the key of lower section,
Automatic machine data screening Excel is opened again, clicks lower section " need to handle data " later, will show this test acquired results: word
Sample " FALL " indicates that corresponding position product test does not pass through, and taking-up is placed in defective products holder；Black " PASS " printed words table
Show and passes through.Data handling procedure is as shown in attached drawing 7d.
Step 9, the product for testing completion is put into high temperature ageing case and carries out aging, detects product to be measured by USB interface
Dark current is simultaneously recorded into database.
Step 10, the product completed after aging needs to test again, repeats above step step 1~step 8, only
" Before Aging " is changed to selection " After Aging ", and equipment can be voluntarily to each performance parameter before and after illumination aging
Test data.Therefore the system realize laser product parallel automatically test, data are automatically stored and compare, test and aging
Organic unification is completed, man power and material required for production can be largely saved, significantly reduces production cost, and can make
Test consistency effectively improves.
Using the laser automatic Synthesis test of the present embodiment and ageing system, by PC machine, MCU processor, optical detection list
Member, A/D converter, the central processing unit of stepper motor composition and coupled upper computer and lower computer communication unit,
Usb bus, spi bus, gpib bus, air pump, probe, solenoid valve, indicator light, memory, piece select I/O unit, relay mould
Block, power supply, spectroanalysis instrument etc. are constituted, and realize: the tests such as laser power, threshold value, slope and spectrum are integrated
Disposable integration test is carried out, the forward direction test pattern that wherein optical power test is popped one's head in using large area；System in parallel is surveyed automatically
Threshold value, slope, power and the dark current parameter for trying laser, can draw PIV curve graph；Laser ageing function is integrated in certainly
In dynamic test macro, aging to be done using test board, avoids multiple loading and unloading, ageing process monitors the dark current of laser in real time,
Test data before and after aging can be compared automatically by system, select defective products；It can according to need in test process pair
Equipment carries out arbitrariness control, pause, continuous surveys, repetition measurement, return survey and be arbitrarily designated test position, number can choose it is multiple again
Brake, the precision guarantee that test number of sampling can be adjusted arbitrarily；The comprehensive method for using pneumatic control and step motor control,
Ensure the accuracy and good contact of sample point position；Using the big pad connection in product periphery to be measured, and pushed by upper probe
The method of power supply and sample of signal, contact are good close；Test data, which can store, locally can also remotely store server,
And by production management system MES or IMMP) carry out control and data interaction.
Also, from industrial practice obtain it is following the utility model has the advantages that
1, production efficiency: the daily production quantity of an employee can be promoted by 1500 to 8000 or so, therefore can
To greatly reduce artificial use, production efficiency improves five times and has a surplus.
2, First Pass Yield and yield rate: frequent contact product when due to avoiding single manual testing, so that half
The ratio of product is damaged in finished product and finished product test by being reduced to 3/1000ths hereinafter, production is greatly improved close to 2%
The yield rate of First Pass Yield and final products.
3, the automatic disposable completion on a set of equipment such as power, threshold value, slope, backlight and spectrum property, saves more
A process procedure.
4, test consistency is effectively ensured: due to using Database Systems, testing environment before and after the aging of product
Do not change, test data is voluntarily compared, the confidence level of data is also just higher.
5, economic benefit: since personnel are reduced, the raising of yield rate and production efficiency, manufacturing cost is greatly lowered, and is passed through
Benefit of helping is very considerable.
6, ease for use: originally artificial production needs employee to have very skilled workmanship, and the training time is longer；And make
It only needs employee few in number to do the movement of loading and unloading with this equipment, does not need to carry out product again whether qualification is judged,
The simple training that employee does a few minutes can be grasped completely, greatly reduce the requirement that personnel are ensured with dynamics.
7, cheap, so that production cost is greatly lowered, the cost of a set of this system is configured not higher than 20,000 yuan of people
People's coin, the half of equal to one one yearly wage of worker, price is very cheap, is suitable for producing configuration in enormous quantities.
Although the present invention is described by reference to specific illustrative embodiments, these embodiments are not will receive
Restriction and only limited by accessory claim.It should be understood by those skilled in the art that can be without departing from of the invention
Change and modification are able to carry out to the embodiment of the present invention in the case where protection scope and spirit.
Claims (10)
1. a kind of equipment of automatic Synthesis test and aging for laser, characterized by comprising:
Bottom plate (1), ball-screw (2), coaster (3), the first sliding rail (4), the second sliding rail (5), drive beam (6), the first sliding block
(7), the second sliding block (8), the first column (9), the second column (10), third column (11), the 4th column (12), testboard
(13), the first support arm (14), the second supporting walls (15), crossbeam (16), first straight line bearing (17), second straight line bearing
(18), cylinder (19), detection beam (20), electric mounting board (21), controller (23), one-dimensional stepper motor and electrification high temperature are old
Makeup is set, wherein the coaster (3) is arranged on bottom plate (1) by ball-screw (2), first sliding rail (4) and second is slided
Rail (5) is arranged in parallel in the both ends of bottom plate (1) respectively, and first sliding block (7) and second sliding block (8) are separately positioned on institute
It states on the first sliding rail (4) and the second sliding rail (5), the drive beam (6) is supported on first sliding block (7) and described second and slides
Between block (8), and it is orthogonal with the transmission plane that the first column (9) and the second column (10) are constituted, one above the drive beam (6)
It is arranged in parallel at set a distance the testboard (13), multiple laser monolithic test boards, each laser is laid on the testboard
It is insulation between device monolithic test board, and the laser list of corresponding form and specification can be set according to the model of laser
Block test board, the testboard (13) are plate, and opposite two sides are supported by the first support arm (14) and the second supporting walls (15),
It is arranged in parallel the crossbeam (16) right above the testboard (13), crossbeam (16) center opening, and from center tapping
It wearing cylinder (19), cylinder (19) two sides are symmetrical arranged first straight line bearing (17) and second straight line bearing (18), and described first
The lower end of linear bearing (17) and second straight line bearing (18) passes through mechanical fastener connecting detection beam (20), the electrical installation
Plate (21) is mounted on the testboard (17) side, and the sensor on electric mounting board is used for multiple sharp on testboard (17)
Laser after light device and electrification high temperature ageing is detected, comprising: cylinder, connecting line, program board and multiple probes, institute
The other side that controller (23) is mounted on the testboard (17) is stated, for controlling the detection process (21) of laser；Described one
Dimension stepper motor movement will drive include cylinder, multimode fibre, probe and optical power detecting unit superstructure run
To above the product of the first row of the testboard.
2. a kind of equipment of automatic Synthesis test and aging for laser according to claim 1, it is characterised in that:
The testboard is the mode of 5*20, a laser of socket 5, while testing 5 products, totally 20 row, in each plug in laser
Pedestal around be arranged four pads, for when upper probe is fallen with four contact pads, be laser
Be powered on and read the back facet current of laser, the electric property of four pads be respectively power supply, back facet current and laser
Device electric current.
3. a kind of equipment of automatic Synthesis test and aging for laser, it is characterised in that: the electrification high temperature ageing dress
It is set to high temperature ageing case, the product for completing test is put into high temperature ageing case and carries out aging, the electric mounting board (21)
Outside is installed by dustproof cover.
4. a kind of system for laser automatic Synthesis test and aging, characterized by comprising: hardware components, such as right are wanted
The equipment and host computer human-computer interaction module of any the automatic Synthesis test and aging for laser of 1-3 are asked,
In: the hardware components include: that single-chip microcontroller (MCU) and electric signal processing unit, optical signal detection and processing unit, electromagnetism are gentle
Dynamic control unit, stepper motor, spectroanalysis instrument and communication and signaling control unit.
5. a kind of system for laser automatic Synthesis test and aging according to claim 4, it is characterised in that: institute
It states single-chip microcontroller (MCU) and electric signal processing unit includes up/down position machine module and circuit hardware module, the slave computer module
It is acquired for control circuit hardware data and carries out data communication with host computer；The circuit hardware module is by sensor, A/D
Converter and function of the MCU control panel composition, the sensor and the testboard detect test parameter, convert electricity by A/D
Road converts analog signals into digital signal, by the software program in the function of the MCU control panel carry out corresponding operation and
Judgement, and be transmitted in the upper computer module by data/address bus；Or it reversely receives the upper computer module and passes through data
The control signal that bus is sent, by the movement and data of function of the MCU control panel control stepper motor and sensor
Acquisition.
6. a kind of system for laser automatic Synthesis test and aging according to claim 5, it is characterised in that: institute
It states optical signal detection and processing unit is large area optical signal detector, the large area optical detector receives what laser issued
Light, and calculated and analyzed, the large area optical signal detector include four probes, in electromagnetism and pneumatic control unit
Drive down four probes to move up and down by pneumatic unit under control, when moving to bottom, probe touch be inserted with it is sharp
On four pads provided around the pedestal of light device, laser shines to the large area optical signal detector of top, in institute
It states and forms electric current on large area optical signal detector for subsequent processing.
7. a kind of system for laser automatic Synthesis test and aging according to claim 6, it is characterised in that: institute
It states electromagnetism and pneumatic control unit and controls pneumatic unit by the opening and closing of solenoid valve, drive large area optical signal detector
It moves up and down, the solenoid valve is connect by transmitting tracheae with the pneumatic unit, and the electromagnetism is connected with pneumatic control unit
Air pump controls the up and down motion of the large area optical signal detector using pneumatic mode.
8. a kind of system for laser automatic Synthesis test and aging according to claim 7, it is characterised in that: institute
Communication and signaling control unit is stated to send the information of the upper computer module in the software of the slave computer module or light
Spectrum analysis instrument, and by the information back for feeding back or reading to the interactive software of the upper computer module.
9. a kind of system for laser automatic Synthesis test and aging according to claim 8, it is characterised in that: institute
Host computer human-computer interaction module is stated for realizing data processing and human-computer interaction, function includes: being acquired by data/address bus described sharp
The threshold value of light device, slope, backlight, size from front and back to optical power under voltage and specified current flow, draw out P-I (power-current),
U-I (current-voltage) and backlight curve, i.e. PIV curve；Spectroanalysis instrument internal register information is read by gpib interface,
Obtain each spectrum test data of the laser；It will be at the MCU and electric signal during the electrification high temperature ageing
The laser backlight current that reason unit monitors arrive carries out qualification judgement；All data classifications are stored in long-range and the machine data
Library；Data interaction is carried out with intelligence manufacture management platform (IMMP) or MES.
10. a kind of method for carrying out laser automatic Synthesis test and aging using system as claimed in claim 9, including step
It is rapid:
Step 1, testing laser device is inserted into monolithic test board, and be placed on testboard, test is slightly touched before starting with finger
It is calibrated at the welding plate edge for touching the laser surrounding；
Step 2, host computer is opened, to carry out all test datas with IMMP platform and control the interaction of signal, is loaded into configuration
File default；
Step 3, the calibration before being tested using standard component equipment, it is ensured that the numerical value that next use process detects is true
It is real effective；
Step 4, it clicks " the starting to test " at upper computer software interface, the man-machine interface of PC machine sends control command to communication unit
Member, equipment select I/O unit to select product to be measured by piece, stepper motor movement drive include cylinder, multimode fibre, probe and
The superstructure of optical power detecting unit etc. is run to above the product of the first via；
Step 5, the equipment pressurizes to cylinder by solenoid valve conduction air pump, so that optical signal detection and processing are single
Member and probe move downward, until probe is pressed on testboard on four pads on product periphery to be measured, four pads
Electric property be respectively power supply, back facet current and laser diode current, so that the product to be measured on test board added
Electricity, slave computer just pass through four probes and read laser diode current and back facet current, optical signal is transmitted to light by optical fiber
The power of testing laser device is read in spectrometer, by optical signal detection and processing unit；
Step 6, analog signal optical signal detection and processing unit and probe received is converted by A/D converter, is turned
Signal after changing carries out processing by MCU processor and obtains related data, and the related data is made up of USB and spi bus
Communication unit pass host computer back and calculated, stored and shown, while indication signal is stored in memory, and pass through indicator light
Mark is made, power, threshold value, slope and the backlight performance indicator of laser is calculated, stores data into corresponding database,
And it is shown in the host computer of man-machine interface；
Step 7, after completing the concurrent testing of product all the way, system communicates instructions to solenoid valve and cylinder is deflated, survey above
Examination unit lifts, and after probe completely disengages testboard a distance, system sends control information to one-dimensional stepper motor, in drive
The test cell in portion is moved to down product all the way, the test process of repeating said steps 5 and step 6, until on monolith test board
Product to be measured be fully completed test, last stepper motor drives the test cell on top to return to initial origin.
Step 8, carry out data processing, all after test, data are saved the product to be measured on testboard, screen and
Processing, determines whether corresponding position product test passes through according to processing result, for by the laser of test, not being drawn off
It is placed in defective products holder；
Step 9, the product for testing completion is put into high temperature ageing case and carries out aging, and the dark electricity of product to be measured is detected by USB interface
It flows and records into database；
Step 10, the product completed after aging needs after test pattern is revised as aging, again repeatedly step 1~step 8
Test.
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| CN110954771A (en) * | 2019-12-17 | 2020-04-03 | 武汉英飞光创科技有限公司 | Aging method for COC (chip on chip) of optical module |
| CN111880087A (en) * | 2020-09-28 | 2020-11-03 | 上海菲莱测试技术有限公司 | Laser chip aging and LIV test detection method and system |
| CN112147490A (en) * | 2020-11-26 | 2020-12-29 | 上海菲莱测试技术有限公司 | Method and system for laser chip integration test |
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