CN105911394B - PIN-FET light-receiving component Auto-Test System - Google Patents
PIN-FET light-receiving component Auto-Test System Download PDFInfo
- Publication number
- CN105911394B CN105911394B CN201610311739.3A CN201610311739A CN105911394B CN 105911394 B CN105911394 B CN 105911394B CN 201610311739 A CN201610311739 A CN 201610311739A CN 105911394 B CN105911394 B CN 105911394B
- Authority
- CN
- China
- Prior art keywords
- module
- signal
- pin
- light
- fet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
Abstract
The invention discloses a kind of PIN-FET light-receiving component Auto-Test Systems, including photoelectric monitoring platform, control module, measured device adapter and host computer；The photoelectric monitoring platform is plug-in type cabinet, provides bus communication and working power for each functional module of grafting；The photoelectric monitoring platform realizes data communication by USB cable or wireless transmission interface and host computer；The host of the PIN-FET light-receiving component Auto-Test System is formed after the control module and the photoelectric monitoring platform grafting, the host carries out signal connection by general or special purpose optical cable and cable and the measured device adapter, realizes the automatic test to the measured device adapter.The test of PIN-FET device parameters is realized based on photoelectric monitoring platform, different one-parameter measuring device functions is re-started into planning and integration, and is embodied as plug-in type module, using unified communication interface and communications protocol, can flexible development hardware, conveniently establish test program.
Description
Technical field
The present invention relates to photoelectric monitoring technical field, especially a kind of test macro established on photoelectric monitoring platform,
The test of PIN-FET device index of correlation, record, statistics, analysis are realized in modular function combination, are turned for PIN-FET photoelectricity
Inspection, screening and the aging of parallel operation part.
Background technique
PIN-FET (P-Intrinsic-N Field-Effect Transistor) light-receiving component is mainly used in light
The optical fiber sensing systems such as fine gyro play the role of photoelectric conversion and amplified signal, main skill as optical signal receiving portion
Art parameter includes linear response degree, linear minimum optical power, is linearly saturated optical power, makes an uproar without photovoltage, three dB bandwidth, root mean square
Psophometric voltage etc..
Wherein, linear response degree (Re) be in PIN-FET output voltage within the scope of -1.5V~0.5V, linear fit
U-P slope of curve value is known as linear response degree, unit: V/ μ W；
Linear minimum optical power (PMin) be PIN-FET receive U-P measure deviation from linearity be equal to when 3% it is corresponding most
Small optical power value, unit: μ W；
Linear saturation optical power (PMax) be PIN-FET receive U-P measure deviation from linearity be equal to when 3% it is corresponding most
Big optical power value, unit: μ W；
No photovoltage (U0) is the DC voltage of PIN-FET output under unglazed input, unit: V；
Bandwidth (fB) is measurement PIN-FET amplitude-versus-frequency curve, and PIN-FET exchange output peak-to-peak value is under 10KHz frequency
When power level (0dB) drops to -3dB level, i.e., when Voltage Peak peak amplitude drops to 0.707, corresponding frequency is
Bandwidth fB, unit: MHz；
When root-mean-square noise voltage (UN (rms)) PIN-FET is inputted without optical signal, the noise voltage root mean square of output end
Value, unit: mV.
Integrated test macro respectively measures every technical parameter using more test equipments, and functional block diagram is shown in figure
1, Fig. 1 is the circuit diagram of PIN-FET light-receiving component.PIN-FET light-receiving component internal is visited using high linearity photoelectricity
It surveys device chip (Photodiode Chip) and is made of field effect transistor (FET), microwave triode and other microwave components
It is preposition across resistance amplifying circuit.After PIN-FET light-receiving component receives optical signal, optical signal carries out light through PIN photodiode
Electricity is converted to electric signal, and electric signal is preposition across resistance amplifying circuit progress signal amplification by this again, and finally output is amplified electricity
Signal.PIN-FET light-receiving component has the characteristics that high-gain, high bandwidth, low noise, general to use metallization case package,
Maskable external electromagnetic interference reduces the distorted signals as caused by external interference.Using digital multimeter, video milivoltmeter,
The equipment such as oscillograph, light power meter, programmable light source, variable optical attenuator, signal generator carry out the test of PIN-FET device parameters
With certain versatility, but its system complicated composition, bulky, single device purchase cost is high, test program portable
Property is poor, limits the application of PIN-FET Auto-Test System.
Originally PIN-FET light-receiving component is applied to low speed optical communication field, the measurement standard of performance indicator is to be used for
Digital optical communication field, such as: 1. transmission rates, 2. across resistance, the PIN detector dark current of 3.InGaAs or Si, 4. maximum outputs
Voltage, 5. under nonreturn to zero code test condition, the range of sensitivity of bit error rate 10-9, the responsiveness etc. of 6.PIN photodetector.
Partial properties index in above-mentioned performance indicator, such as across resistance, the PIN detector dark current of InGaAs or Si, PIN photoelectric detector
Responsiveness etc., even if after being assembled into device, being also unable to measure in digital communicating field, can not outlines device performance.
With the surprising raising of optic communication rate, PIN-FET light-receiving component has been no longer desirable for high speed optical communication neck
Domain, which are mainly applied to low rate, the optical transport field of simulation, such as Fibre Optical Sensors, especially optical fibre gyro, fiber-optic current sensor
The fields such as device.But in simulation application, performance indicator above-mentioned can not describe the performance of PIN-FET light-receiving component, no
Suitable for analog sensed systematic difference.
Has authorization patent of invention, " PIN-FET light-receiving assembly property indication test method " (patent No.
2011101193366) above-mentioned technical problem, can be solved, test macro block diagram is shown in Fig. 2, but the patent No. 2011101193366 does not have
It provides and its method is used for actual PIN-FET device parameters test, be also not carried out automatic data logging and survey calculation.
This patent is tested in order to which granted patent ZL2011101193366 method is used for actual PIN-FET device parameters, and realizes
Automatic data logging and survey calculation, are integrated with the measuring device of multiple functions, including high-frequency signal source, light source, electric multimeter,
The equipment such as electric oscillograph, light power meter, optical attenuator, high-frequency noise milivoltmeter, reduce the complexity of test macro, have easy
In operation, it is small in size, at low cost, the advantages such as modularization work, batch testing are realized the survey of patent 2011101193366
Method for testing functionization and industrialization, promote technological progress, social development.
Summary of the invention
It in order to achieve the above objectives, is by authorized 2011101193366 method of patent, for real the purpose of this invention
The PIN-FET device parameters on border are tested, and realize the test of PIN-FET device parameters based on photoelectric monitoring platform, different lists is joined
Number measuring device function re-starts planning and integration, and is embodied as plug-in type module, using unified communication interface and communication
Agreement, can flexible development hardware, conveniently establish test program.And cooperated based on photoelectric monitoring platform different
Functional module can be convenient the parameter test system for efficiently realizing other optical devices.
To achieve the above object of the invention, the present invention is using the basic conception of technical solution:
PIN-FET light-receiving component Auto-Test System, including photoelectric monitoring platform, control module, measured device adaptation
Device and host computer；
The photoelectric monitoring platform is plug-in type cabinet, provides bus communication and work electricity for each functional module of grafting
Source；The photoelectric monitoring platform realizes data communication by USB cable or wireless transmission interface and host computer；The control module
With the host for forming the PIN-FET light-receiving component Auto-Test System after the photoelectric monitoring platform grafting, the host
Signal connection is carried out by general or special purpose optical cable and cable and the measured device adapter, is realized to the measured device
The automatic test of adapter.
Further, the control module includes signal generator, light source module, optical attenuator module and signal measurement mould
Block wherein the signal generator provides calibration AC signal to signal measurement module, while triggering modulated signal to light source die
Block, light source module generate reference light and are irradiated in optical attenuator module, and optical attenuator module receives input light after reference light
Alternating current-direct current signal and output light DC voltage detection signal are sent in signal measurement module.
Further, the control module further includes power supply and flow measurement module, the power supply and flow measurement module
Output end connect with the input terminal of the measured device adapter, it is preferable that the power supply and the output of flow measurement module are straight
Stream is biased in the measured device adapter.
Further, the measured device adapter is multiple interface convertors, and device under test is placed in the measured device
Adapter corresponding position inputs so that the output light of the optical attenuator module of control module connects device under test by optical patchcord
Light, device under test output electric signal are connected to the main signal Measurement channel of measurement module by coaxial cable, pass through host computer
Operation and control interface.
Further, the measured device adapter includes DUT adaptation box, and the DUT adaptation box is the machine of device under test
Tool fixture, is equipped with the connection socket of multiple device under test, the socket and power supply selective connection, and selected socket has indicator light to do
Gating instruction for the power supply power supply of device under test, and realizes that high frequency electrical signal exports.
Further, the optical attenuator module by test light be transmitted to DUT adaptation box in, to DUT adaptation box on to
It surveys PIN-FET unit to be detected, measured signal is sent to signal measurement module and tested by the DUT adaptation box.
Further, the measured signal include: transmitted by DUT adaptation box by DC detecting alternate channel it is straight
It flows measured signal and passes through the alternating current-direct current measured signal of alternating current-direct current measured signal channel transfer by device under test.
Further, the signal generator is connect by BNC coaxial cable with the light source module, the light source module
It is connect by optical patchcord with the optical attenuator module, the optical attenuator module is connect by tail optical fiber with device under test, light
Attenuator module is connect with measurement module, and the measurement module is connect by BNC coaxial cable with measured device adapter, described
Measured device adapter is connect by adapter power supply client cables with power supply with flow measurement module.
Further, the host computer is connect by USB cable or wireless transmission interface with main control module, the master control mould
Block is SP-A020A type, and the slot grafting with the photoelectric monitoring platform is powered by the power supply of photoelectric monitoring platform for it.
Further, the host computer is connect by USB interface with display.
After adopting the above technical scheme, compared with the prior art, the invention has the following beneficial effects:
The test of PIN-FET device parameters is realized based on photoelectric monitoring platform, by different one-parameter measuring device function weights
It is newly planned and is integrated, and be embodied as plug-in type module, using unified communication interface and communications protocol, can flexibly be expanded
Hardware is opened up, test program is conveniently established.And different functional modules is cooperated to can be convenient based on photoelectric monitoring platform
Efficiently realize the parameter test system of other optical devices.
Photoelectric monitoring platform and plug-in type control module constitute the PIN-FET Auto-Test System based on photoelectric monitoring platform
Host.Signal connection between module, between module and adapter is realized by general or special purpose optical cable and cable；Platform with it is upper
Bit machine realizes data communication by USB cable；Communication between each module and main control module is by the back in plug-in type cabinet
Plate bus is realized.Working power needed for providing each module as backboard.
PIN-FET device is placed in adapter corresponding position according to the direction of mark, the program-controlled optical attenuator module of host
Output light connects PIN-FET input light by optical patchcord, and PIN-FET exports electric signal and is connected to host essence by coaxial cable
The main signal Measurement channel of close AC DC voltage measurement module executes by the operation and control interface of host computer and presses " PIN-
FET light-receiving assembly property indication test method " the worked out test program of regulation, it controls each module and orderly completes PIN-FET
All parameter measurements of device and record.
Detailed description of the invention
Fig. 1 is the circuit diagram of PIN-FET light-receiving component.
Fig. 2 is the integrated test principle block diagram of tradition.
Fig. 3 is one of PIN-FET light-receiving component Auto-Test System hardware structure diagram.
Fig. 4 is the two of PIN-FET light-receiving component Auto-Test System hardware structure diagram.
Fig. 5 is PIN-FET light-receiving component Auto-Test System communication bus configuration block diagram.
Specific embodiment
A specific embodiment of the invention is described in further detail with reference to the accompanying drawing.
As shown in Figure 3 to Figure 4, it embodiment of the invention discloses PIN-FET light-receiving component Auto-Test System, is based on
Photoelectric monitoring platform realize PIN-FET device parameters test, then can flexible development hardware, fast and easily establish test journey
Sequence can support a variety of instrument and equipments, flexibly be configured on demand, so that the offer of maximum possible is general, flexible, the survey of specification
Test system solution.
PIN-FET light-receiving component Auto-Test System, including photoelectric monitoring platform 1, control module 2, measured device are suitable
Orchestration 3 and host computer 4；
The photoelectric monitoring platform 1 is plug-in type cabinet, provides bus communication and work electricity for each functional module of grafting
Source；The photoelectric monitoring platform 1 realizes data communication by USB cable or wireless transmission interface and host computer 4；The observing and controlling mould
The host of the PIN-FET light-receiving component Auto-Test System is formed after block 2 and 1 grafting of photoelectric monitoring platform, it is described
Host carries out signal connection by general or special purpose optical cable and cable and the measured device adapter 3, realizes to the quilt
Survey the automatic test of device adapter.
Device under test is realized based on photoelectric monitoring platform, and if PIN-FET device parameters are tested, different one-parameters is measured
Functions of the equipments re-start planning and integration, and are embodied as plug-in type module, using unified communication interface and communications protocol, respectively
Communication between module and main control module is by the core bus realization in plug-in type cabinet, work needed for providing each module as backboard
Make power supply, can flexible development hardware, conveniently establish test program.And it is different based on the cooperation of photoelectric monitoring platform
Functional module can be convenient the parameter test system for efficiently realizing other optical devices.
The control module 2 includes signal generator 21, light source module 22, optical attenuator module 23 and signal measurement module
25, wherein the signal generator 21 provides calibration AC signal to signal measurement module 25, while modulated signal is triggered to light
Source module 22, light source module 22 generate reference light and are irradiated in optical attenuator module 23, and optical attenuator module 23 receives benchmark
Input light alternating current-direct current signal and output light DC voltage detection signal are sent in signal measurement module 25 after light.
The control module further includes power supply and flow measurement module 24, the output end of the power supply and flow measurement module
It is connect with the input terminal of the measured device adapter, it is preferable that the power supply is arrived with flow measurement module output direct current biasing
In the measured device adapter.
Signal measurement module 25 is for completing multrirange DC voltage measurement, broadband exchange level measurement, noise level survey
Amount, the common apparatus such as substitution conventional digital D.C. voltmeter, digital oscilloscope, video milivoltmeter, is completed PINFET multi-parameter
Measurement request, such as: unglazed output voltage, bandwidth, noise major parameter.
The measured device adapter is multiple interface convertors, device under test, as PIN-FET device is placed in adapter phase
Position is answered, is inputted so that the output light of the program-controlled optical attenuator module of control module connects PIN-FET device by optical patchcord
Light, PIN-FET device export electric signal and are surveyed by the main signal that coaxial cable is connected to accurate AC DC voltage measurement module
Channel is measured, the operation and control interface of host computer is passed through.
Specifically, PIN-FET device is placed in adapter corresponding position according to the direction of mark, the optical attenuator in host
The output light of module connects PIN-FET input light by optical patchcord, and PIN-FET output electric signal is connected to by coaxial cable
The main signal Measurement channel of the measurement module of host, the measurement module is accurate AC DC voltage measurement module, by upper
The operation and control interface of position machine, executes and provides worked out test program by " PIN-FET light-receiving assembly property indication test method ",
Control all parameter measurements and record that each module orderly completes PIN-FET device.
The measured device adapter 3 includes that DUT (Device Under Test, device under test) is adapted to box, the DUT
It is adapted to the mechanical clamp that box is device under test, is equipped with the connection socket of multiple device under test, the socket selectively connects with power supply
It connects, selected socket has indicator light to do gating instruction, for the power supply power supply of device under test, and realizes that high frequency electrical signal is defeated
Out.
Test light is transmitted in DUT adaptation box by the optical attenuator module, to the PIN-FET to be measured on DUT adaptation box
Unit is detected, and measured signal is sent to signal measurement module and tested by the DUT adaptation box.
The measured signal includes: the direct current letter to be measured transmitted by DUT adaptation box by DC detecting alternate channel
Number and the alternating current-direct current measured signal of alternating current-direct current measured signal channel transfer is passed through by PIN-PET unit to be measured.
The signal generator is connect by BNC coaxial cable with the light source module, and the light source module passes through optical fiber
Wire jumper is connect with the optical attenuator module, and the optical attenuator module is connect by tail optical fiber with device under test, optical attenuator mould
Block is connect with measurement module, and the measurement module is connect by BNC coaxial cable with measured device adapter, the measured device
Adapter is connect by adapter power supply client cables with power supply with flow measurement module.
Power supply and flow measurement module can in a certain range can be by routine change output voltage numerical value, to simulate reality
Every technical characteristic of device when supply voltage deviates nominal.The measurement of source current reflects device in varying environment item
Working condition under part, quality analysis and Quality estimation for measured device provide reference frame.
The host computer 3 is connect by USB cable or wireless transmission interface with main control module 5, and the main control module 5 is preferably
For SP-A020A type, and the slot grafting with the photoelectric monitoring platform 1, it is powered by the power supply 11 of photoelectric monitoring platform for it.
SP-A020A type main control module is converted for communications protocol, i.e., the USB communication data transmitted host computer 4 and order
The communications protocol format inside test macro is converted to, and each control module is sent to by core bus；And by each survey
The reply data of control module is converted to and returns to host computer by USB cable after USB communication format.Preferably, main control module can
The module for selecting integrated industrial personal computer function, is directly connected to display and cable, it is no longer necessary to which external host computer can be independent complete
At automatic measuring and controlling function.
The SP-A020A type main control module can be selected breaker, ADM202EARNZ transceiver, LM224D circuit,
ST24C16 memory and power module after carrying out communication connection with the interface of STM32F103VCT6 type single-chip microcontroller by being led to
Interrogate protocol conversion.
The host computer 4 is connect by USB interface with display 6.
Workflow of the invention is as follows: system is configured according to the above connection figure, is run upper computer software and is configured properly
Serial line interface and VISA interface, clicked on software interface and start to measure, executed by " PIN-FET light-receiving assembly property refers to
Mapping method for testing " the worked out test program of regulation, control each module orderly complete all parameter measurements of PIN-FET device with
Record.
After adopting the above technical scheme, compared with the prior art, the invention has the following beneficial effects:
The test of PIN-FET device parameters is realized based on photoelectric monitoring platform, by different one-parameter measuring device function weights
It is newly planned and is integrated, and be embodied as plug-in type module, using unified communication interface and communications protocol, can flexibly be expanded
Hardware is opened up, test program is conveniently established.And different functional modules is cooperated to can be convenient based on photoelectric monitoring platform
Efficiently realize the parameter test system of other optical devices.
Photoelectric monitoring platform and plug-in type control module constitute the PIN-FET Auto-Test System based on photoelectric monitoring platform
Host.Signal connection between module, between module and adapter is realized by general or special purpose optical cable and cable；Platform with it is upper
Bit machine realizes data communication by USB cable；Communication between each module and main control module is by the back in plug-in type cabinet
Plate bus is realized.Working power needed for providing each module as backboard.
PIN-FET device is placed in adapter corresponding position according to the direction of mark, the program-controlled optical attenuator module of host
Output light connects PIN-FET input light by optical patchcord, and PIN-FET exports electric signal and is connected to host essence by coaxial cable
The main signal Measurement channel of close AC DC voltage measurement module executes by the operation and control interface of host computer and presses application number:
2011101193366 denominations of invention " PIN-FET light-receiving assembly property indication test method " provide worked out test program,
Control all parameter measurements and record that each module orderly completes PIN-FET device.
Embodiment in above-described embodiment can be further combined or replace, and embodiment is only to of the invention
Preferred embodiment is described, and it is not intended to limit the concept and scope of the present invention, is not departing from design philosophy of the present invention
Under the premise of, the various changes and modifications that professional and technical personnel in the art make technical solution of the present invention belong to this hair
Bright protection scope.
Claims (7)
1.PIN-FET light-receiving component Auto-Test System, which is characterized in that including photoelectric monitoring platform, control module, be tested
Device adapter and host computer；
The photoelectric monitoring platform is plug-in type cabinet, provides bus communication and working power for each functional module of grafting；Institute
It states photoelectric monitoring platform and data communication is realized by USB cable or wireless transmission interface and host computer；The control module and institute
The host that the PIN-FET light-receiving component Auto-Test System is formed after photoelectric monitoring platform grafting is stated, the host passes through
General or special purpose optical cable and cable and the measured device adapter carry out signal connection, realize and are adapted to the measured device
The automatic test of device；The host computer is connect by USB cable or wireless transmission interface with main control module, the main control module and
The slot grafting of the photoelectric monitoring platform, is powered by the power supply of photoelectric monitoring platform for it；
The control module includes signal generator, light source module, optical attenuator module and signal measurement module, wherein the letter
Number generator provides calibration AC signal to signal measurement module, while triggering modulated signal to light source module, and light source module produces
Raw reference light is irradiated in optical attenuator module, and optical attenuator module receives input light alternating current-direct current signal and defeated after reference light
Light DC voltage detection signal is sent in signal measurement module out.
2. the system as claimed in claim 1, which is characterized in that the control module further includes power supply and flow measurement module,
The power supply is connect with the output end of flow measurement module with the input terminal of the measured device adapter, the power supply with
Flow measurement module exports in direct current biasing to the measured device adapter.
3. the system as claimed in claim 1, which is characterized in that the measured device adapter includes DUT adaptation box, described
DUT is adapted to the mechanical clamp that box is device under test, is equipped with the connection socket of multiple device under test, the socket and power supply selectivity
Connection, selected socket have indicator light to do gating instruction, for the power supply power supply of device under test, and realize that high frequency electrical signal is defeated
Out.
4. system as claimed in claim 3, which is characterized in that test light is transmitted to DUT and is adapted to by the optical attenuator module
In box, the PIN-FET unit to be measured on DUT adaptation box is detected, measured signal is sent to signal by the DUT adaptation box
Measurement module is tested.
5. system as claimed in claim 4, which is characterized in that the measured signal includes: to be passed through directly by DUT adaptation box
The direct current measured signal of stream detection alternate channel transmission and straight by the friendship of alternating current-direct current measured signal channel transfer by device under test
Flow measured signal.
6. the system as claimed in claim 1, which is characterized in that the signal generator passes through BNC coaxial cable and the light
Source module connection, the light source module are connect by optical patchcord with the optical attenuator module, and the optical attenuator module is logical
It crosses tail optical fiber to connect with device under test, optical attenuator module is connect with signal measurement module, and the signal measurement module is same by BNC
Axis cable is connect with measured device adapter, and the measured device adapter passes through adapter power supply client cables and power supply
It is connect with flow measurement module.
7. the system as claimed in claim 1, which is characterized in that the host computer is connect by USB interface with display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610311739.3A CN105911394B (en) | 2016-05-11 | 2016-05-11 | PIN-FET light-receiving component Auto-Test System |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610311739.3A CN105911394B (en) | 2016-05-11 | 2016-05-11 | PIN-FET light-receiving component Auto-Test System |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105911394A CN105911394A (en) | 2016-08-31 |
| CN105911394B true CN105911394B (en) | 2019-05-07 |
Family
ID=56748933
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610311739.3A Active CN105911394B (en) | 2016-05-11 | 2016-05-11 | PIN-FET light-receiving component Auto-Test System |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105911394B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107450013B (en) * | 2017-09-15 | 2023-05-12 | 北京锐视康科技发展有限公司 | Circuit board functional integrity test platform and test method |
| CN107493202B (en) * | 2017-09-29 | 2024-03-22 | 珠海思开达技术有限公司 | Extensible high-speed error code tester |
| CN112285517B (en) * | 2020-09-29 | 2021-06-11 | 厦门三优光电股份有限公司 | Automatic test system and test method for APD-TIA ROSA |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102770002A (en) * | 2011-05-06 | 2012-11-07 | 北京普源精电科技有限公司 | Chassis with bus structure |
| CN102778613A (en) * | 2011-05-10 | 2012-11-14 | 北京浦丹光电技术有限公司 | Performance index test method of PIN-FET (p-intrinsic-n field effect transistor) light receiving assembly |
| CN204154474U (en) * | 2014-10-10 | 2015-02-11 | 武汉宜鹏光电科技有限公司 | A kind of combined test stand of light-receiving detector |
| CN204481817U (en) * | 2015-03-18 | 2015-07-15 | 江苏奥雷光电有限公司 | Optical module parameter testing equipment |
| CN204559589U (en) * | 2015-05-06 | 2015-08-12 | 大连藏龙光电子科技有限公司 | Optical receiver performance test system |
| CN205594105U (en) * | 2016-05-11 | 2016-09-21 | 北京浦丹光电股份有限公司 | PIN -FET opto -receiver module automatic test system |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6479979B1 (en) * | 1999-07-09 | 2002-11-12 | Srico, Inc. | Opto-electric device for measuring the root-mean-square value of an alternating current voltage |
| CN100439931C (en) * | 2005-11-29 | 2008-12-03 | 吉林大学 | Electro-optical detector capable of calibrating voltage |
| JP2011053114A (en) * | 2009-09-02 | 2011-03-17 | Hitachi Cable Ltd | Optical transceiver inspection system |
| CN103048121B (en) * | 2012-12-24 | 2015-07-01 | 南京航空航天大学 | Optical device measuring method and measuring device |
| CN103091072B (en) * | 2012-12-25 | 2015-09-09 | 南京航空航天大学 | Based on optical device measuring method, the measurement mechanism of optical SSB modulation |
| CN103424242B (en) * | 2013-07-22 | 2016-01-06 | 南京航空航天大学 | A kind of optical device measuring method |
-
2016
- 2016-05-11 CN CN201610311739.3A patent/CN105911394B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102770002A (en) * | 2011-05-06 | 2012-11-07 | 北京普源精电科技有限公司 | Chassis with bus structure |
| CN102778613A (en) * | 2011-05-10 | 2012-11-14 | 北京浦丹光电技术有限公司 | Performance index test method of PIN-FET (p-intrinsic-n field effect transistor) light receiving assembly |
| CN204154474U (en) * | 2014-10-10 | 2015-02-11 | 武汉宜鹏光电科技有限公司 | A kind of combined test stand of light-receiving detector |
| CN204481817U (en) * | 2015-03-18 | 2015-07-15 | 江苏奥雷光电有限公司 | Optical module parameter testing equipment |
| CN204559589U (en) * | 2015-05-06 | 2015-08-12 | 大连藏龙光电子科技有限公司 | Optical receiver performance test system |
| CN205594105U (en) * | 2016-05-11 | 2016-09-21 | 北京浦丹光电股份有限公司 | PIN -FET opto -receiver module automatic test system |
Non-Patent Citations (1)
| Title |
|---|
| PIN光接收器测试系统研究;潘树志;《中国优秀博硕士学位论文全文数据库 (硕士)信息科技辑》;20031216;全文 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105911394A (en) | 2016-08-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100561241C (en) | The photodetector amplitude versus frequency characte method of testing that optical fibre gyro is used | |
| CN104569902B (en) | Digital type electric energy meter power consumption measuring device and method | |
| CN105911394B (en) | PIN-FET light-receiving component Auto-Test System | |
| CN105005016B (en) | A kind of three-phase electric energy meter on-site check system and its method | |
| CN104655908A (en) | Signal transmission device and method for current transformer | |
| CN107783069A (en) | The on-line calibration system and method for DC measurement in integrated circuit test system | |
| CN203178431U (en) | Full-automatic testing system for circuit boards | |
| CN203117415U (en) | Parallel detection system for active power errors and reactive power errors of electric energy meter | |
| CN100543491C (en) | The accuracy test macro of electric energy meter electrical fast transient (eft) interference test | |
| CN109100678A (en) | A kind of detection device and detection method for digitalized electrical energy meter | |
| CN108204824A (en) | A kind of photodetector detection device and detection method | |
| CN205594105U (en) | PIN -FET opto -receiver module automatic test system | |
| CN107179451A (en) | Integrated low frequency noise measurement device | |
| CN204694799U (en) | A kind of novel package detection system | |
| CN207380211U (en) | A kind of device of detecting magnetic holding relays in batches | |
| CN206990690U (en) | Low frequency noise measurement device | |
| CN106768351B (en) | Infrared detector single mode changeable responsiveness test macro and method | |
| CN210346590U (en) | Wireless static strain tester and wireless static strain test system | |
| CN2426609Y (en) | High voltage equipment electric parameter measuring device | |
| CN107765202A (en) | The on-line calibration system and method for AC measurment unit in integrated circuit test system | |
| CN106199486A (en) | A kind of measurement system of power meter temperature impact test | |
| CN105812052B (en) | A kind of optical module calibration system and method | |
| CN211123024U (en) | PCB branch current detection device and PCB detection system | |
| CN107870313A (en) | A kind of electric energy meter pulse sampling method and device being applied in EMC test | |
| CN114415100A (en) | Electric energy metering device on-site detection equipment and data transmission method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |