CN105911394A - PIN-PET optical receiving assembly automatic test system - Google Patents
PIN-PET optical receiving assembly automatic test system Download PDFInfo
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- CN105911394A CN105911394A CN201610311739.3A CN201610311739A CN105911394A CN 105911394 A CN105911394 A CN 105911394A CN 201610311739 A CN201610311739 A CN 201610311739A CN 105911394 A CN105911394 A CN 105911394A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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Abstract
The invention discloses a PIN-PET (P-Intrinsic-N Filed-effect Transistor) optical receiving assembly automatic test system, comprising a photoelectric measurement and control platform, a measurement and control module, a measured device adapter and a host computer. The measurement and control platform is a plug-in type cabinet, and provides a bus communication and work power supply for each inserted function module; the photoelectric measurement and control platform realizes data communication with the host computer through a USB cable or a wireless transmission interface; the measurement and control module and the photoelectric measurement and control platform are inserted to form the host computer of the PIN-PET optical receiving assembly automatic test system; the host computer performs signal connection with the measured device adapter through a general or special-purpose cable so as to realize automatic test of the measured device adapter. The system realizes PIN-PET device parameter test based on the photoelectric measurement and control platform, plans and integrates functions of different single parameter measurement devices again, employs a uniform communication interface and communication protocol for realizing a plug-in type module, and can flexibly expand hardware, and conveniently and rapidly establish test programs.
Description
Technical field
The present invention relates to photoelectric monitoring technical field, a kind of test system set up on photoelectric monitoring platform,
Modular function combinations realizes PIN-FET device index of correlation and tests, records, adds up, analyzes, for PIN-FET
The inspection of electrooptical device, screening and aging.
Background technology
PIN-FET (P-Intrinsic-N Field-Effect Transistor) light-receiving assembly is mainly used in light
The optical fiber sensing systems such as fine gyro, as optical signal receiving portion, play opto-electronic conversion and amplify the effect of signal,
Its important technological parameters include linear response degree, linear minimum optical power, linear saturated light power, without photovoltage,
Three dB bandwidth, root-mean-square noise voltage etc..
Wherein, linear response degree (Re) is at PIN-FET output voltage in the range of-1.5V～0.5V, Linear Quasi
The U-P slope of curve value closed is referred to as linear response degree, unit: V/ μ W；
It is corresponding that linear minimum optical power (PMin) is that PIN-FET receives when U-P measures deviation from linearity equal to 3%
Minimum optical power value, unit: μ W；
It is corresponding that linear saturated light power (PMax) is that PIN-FET receives when U-P measures deviation from linearity equal to 3%
Maximum luminous power value, unit: μ W；
It is under unglazed input without photovoltage (U0), the DC voltage of PIN-FET output, unit: V；
Bandwidth (fB) is for measuring PIN-FET amplitude-versus-frequency curve, and PIN-FET exchange output peak-to-peak value is from 10KHz frequency
When lower power level (0dB) drops to-3dB level, when i.e. Voltage Peak peak amplitude drops to 0.707, corresponding
Frequency be bandwidth fB, unit: MHz；
When root-mean-square noise voltage (UN (rms)) PIN-FET inputs without optical signal, the noise voltage root-mean-square of outfan
Value, unit: mV.
Integrated test system uses multiple stage test instrunment to measure every technical parameter respectively, and theory diagram is shown in
Fig. 1, Fig. 1 are the circuit diagrams of PIN-FET light-receiving assembly.PIN-FET light-receiving component internal uses high line
Property degree photoelectric detector chip (Photodiode Chip) and by field-effect transistor (FET), microwave triode with
And other microwave component composition is preposition across resistance amplifying circuit.After PIN-FET light-receiving assembly receives optical signal, light is believed
Number carrying out opto-electronic conversion through PIN photodiode is the signal of telecommunication, and the signal of telecommunication preposition is carried out across resistance amplifying circuit by this again
Signal amplifies, and is finally output as the signal of telecommunication after amplifying.PIN-FET light-receiving assembly have high-gain, high bandwidth,
The features such as low noise, the general metallization case package that uses, maskable external electromagnetic interference, minimizing is done due to the external world
Disturb the distorted signals caused.Use digital multimeter, video millivoltmeter, oscillograph, light power meter, programmable light source,
The equipment such as variable optical attenuator, signal generator carries out the test of PIN-FET device parameters and has certain versatility,
But its system composition complexity, bulky, single device purchase cost is high, and test program portability is poor, limit
Make the application of PIN-FET Auto-Test System.
Originally PIN-FET light-receiving assembly is applied to low speed optical communication field, the criterion of its performance indications be for
Digital optical communication field, such as: 1. transfer rate, 2. across resistance, the PIN detector dark current of 3.InGaAs or Si,
4. maximum output voltage, 5. under nonreturn to zero code test condition, the range of sensitivity of bit error rate 10-9,6.PIN light
The responsiveness etc. of electric explorer.Partial properties index in above-mentioned performance indications, as across resistance, InGaAs's or Si
PIN detector dark current, the responsiveness etc. of PIN photoelectric detector, even if at digital communicating field, growing up to be a useful person in assembling
After part, also cannot measure, it is impossible to the performance of enough outlines device.
Along with the surprising raising of optic communication speed, PIN-FET light-receiving assembly has been no longer desirable for high speed optical communication neck
Territory, it is mainly used in the optical transport field of low rate, simulation, such as Fibre Optical Sensor, particularly optical fibre gyro, light
The fields such as fiber current sensor.But in simulation application, aforesaid performance indications can not describe PIN-FET light
The performance of receiving unit, is not suitable for analog sensed systematic difference.
Authorize patent of invention, " PIN-FET light-receiving assembly property indication test method " (patent No.
2011101193366), it is possible to resolve above-mentioned technical problem, test system block diagram is shown in Fig. 2, but the patent No.
2011101193366 do not provide the PIN-FET device parameters test that its method is used for reality, are not carried out certainly yet
Dynamic data record and survey calculation.This patent in order to be used for reality by granted patent ZL2011101193366 method
PIN-FET device parameters is tested, and realizes automatic data logging and survey calculation, is integrated with the measurement of several functions
Equipment, including high-frequency signal source, light source, electricity circuit tester, electric oscillograph, light power meter, optical attenuator, high frequency
The equipment such as noise millivoltmeter, reduce the complexity of test system, have easily operated, volume is little, low cost,
The advantages such as modularity work, batch testing, it is achieved that by practical for the method for testing of patent 2011101193366 with
Industrialization, promotes technological progress, social development.
Summary of the invention
For reaching above-mentioned purpose, this invention purpose is by the most authorized patent 2011101193366 method, is used for
Actual PIN-FET device parameters test, realizes the test of PIN-FET device parameters based on photoelectric monitoring platform, will not
Same one-parameter is measured functions of the equipments and is re-started planning and integrate, and is embodied as plug-in type module, uses unification
Communication interface and communications protocol, it is possible to development hardware flexibly, conveniently set up test program.And based on
Photoelectric monitoring platform coordinates different functional modules can conveniently realize the parameter testing system of other optics
System.
To achieve the above object of the invention, the present invention uses the basic conception of technical scheme to be:
PIN-FET light-receiving assembly Auto-Test System, fits including photoelectric monitoring platform, control module, measured device
Orchestration and host computer；
Described photoelectric monitoring platform is plug-in type cabinet, and each functional module for grafting provides bus communication and work electricity
Source；Described photoelectric monitoring platform realizes data communication by USB cable or wireless transmission interface with host computer；Described
Described PIN-FET light-receiving assembly Auto-Test System is formed after control module and described photoelectric monitoring platform grafting
Main frame, described main frame carries out signal with cable with described measured device adapter by general or special purpose optical cable and is connected,
Realize the automatic test to described measured device adapter.
Further, described control module includes that signal generator, light source module, optical attenuator module and signal are surveyed
Amount module, wherein said signal generator provides calibration AC signal to signal measurement module, triggers modulated signal simultaneously
To light source module, light source module produces reference light and is irradiated in optical attenuator module, and optical attenuator module receives base
After quasi-optical, input light alternating current-direct current signal is sent to signal measurement module with output light DC voltage detection signal.
Further, described control module also includes power supply supply and flow measurement module, the supply of described power supply and flow measurement mould
The outfan of block is connected with the input of described measured device adapter, it is preferable that the supply of described power supply and flow measurement mould
Block output direct current biasing is in described measured device adapter.
Further, described measured device adapter is multiple interface convertor, and device under test is placed in described tested device
Part adapter relevant position so that the output light of the optical attenuator module of control module connects to be measured by optical patchcord
Device input light, the device under test output signal of telecommunication is connected to the main signal Measurement channel of measurement module by coaxial cable,
By the operation and control interface of host computer.
Further, described measured device adapter includes DUT adaptation box, and described DUT adaptation box is device under test
Mechanical clamp, be equipped with the connection socket of multiple device under test, described socket is connected with power supply selectivity, selected insert
Seat has display lamp to do gating instruction, and the power supply for device under test is powered, and realizes the output of high frequency electrical signal.
Further, described optical attenuator module is by test optical transport to DUT adaptation box, on DUT adaptation box
PIN-FET unit to be measured detect, measured signal is sent to signal measurement module by described DUT adaptation box
Row test.
Further, described measured signal includes: transmitted by DC detecting alternate channel by described DUT adaptation box
Direct current measured signal and by device under test by the alternating current-direct current measured signal of alternating current-direct current measured signal channel transfer.
Further, described signal generator is connected with described light source module by BNC coaxial cable, described light source
Module is connected with described optical attenuator module by optical patchcord, and described optical attenuator module is by tail optical fiber and device to be measured
Part connects, and optical attenuator module is connected with measurement module, and described measurement module is by BNC coaxial cable and tested device
Part adapter connects, and described measured device adapter is supplied and flow measurement mould by power client cables and power supply of adapter
Block connects.
Further, described host computer is connected with main control module by USB cable or wireless transmission interface, described master
Control module is SP-A020A type, and with the slot grafting of described photoelectric monitoring platform, by the power supply of photoelectric monitoring platform
Power for it.
Further, described host computer is connected with display by USB interface.
After using technique scheme, the present invention compared with prior art has the advantages that
Realize the test of PIN-FET device parameters based on photoelectric monitoring platform, different one-parameters is measured functions of the equipments weight
Newly plan and integrate, and being embodied as plug-in type module, using unified communication interface and communications protocol, it is possible to
Development hardware flexibly, conveniently sets up test program.And coordinate different merits based on photoelectric monitoring platform
Energy module can conveniently realize the parameter test system of other optics.
Photoelectric monitoring platform and plug-in type control module constitute PIN-FET based on photoelectric monitoring platform and automatically test system
System main frame.Signal between module, between module and adapter is connected by general or special purpose optical cable and cable realization；
Platform and host computer realize data communication by USB cable；Communication between each module and main control module is by plug-in unit
Core bus in formula cabinet realizes.The working power needed for each module is provided by backboard.
PIN-FET device is placed in adapter relevant position according to the direction of mark, main frame program control optical attenuator module
Output light connects PIN-FET by optical patchcord and inputs light, and the PIN-FET output signal of telecommunication is connected to by coaxial cable
The main signal Measurement channel of main frame precision AC/DC voltage measurement module, by the operation and control interface of host computer,
Perform the test program worked out by " PIN-FET light-receiving assembly property indication test method " regulation, control each mould
Block completes all parameter measurements and the record of PIN-FET device in order.
Accompanying drawing explanation
Fig. 1 is the circuit diagram of PIN-FET light-receiving assembly.
Fig. 2 is traditional integrated test principle block diagram.
Fig. 3 is one of PIN-FET light-receiving assembly Auto-Test System hardware structure diagram.
Fig. 4 is the two of PIN-FET light-receiving assembly Auto-Test System hardware structure diagram.
Fig. 5 is that PIN-FET light-receiving assembly Auto-Test System communication bus configures block diagram.
Detailed description of the invention
Below in conjunction with the accompanying drawings the detailed description of the invention of the present invention is described in further detail.
As shown in Figure 3 to Figure 4, embodiment of the invention discloses that PIN-FET light-receiving assembly Auto-Test System,
Realize the test of PIN-FET device parameters based on photoelectric monitoring platform, then can development hardware flexibly, efficient and convenient
Set up test program, can support multiple instrument and equipment, the most on-demand configure, thus the carrying of maximum possible
For general, flexible, the test system scheme of specification.
PIN-FET light-receiving assembly Auto-Test System, including photoelectric monitoring platform 1, control module 2, tested device
Part adapter 3 and host computer 4；
Described photoelectric monitoring platform 1 is plug-in type cabinet, and each functional module for grafting provides bus communication and work
Power supply；Described photoelectric monitoring platform 1 realizes data communication by USB cable or wireless transmission interface with host computer 4；
Form described PIN-FET light-receiving assembly after described control module 2 and the grafting of described photoelectric monitoring platform 1 automatically to survey
The main frame of test system, described main frame is entered with described measured device adapter 3 with cable by general or special purpose optical cable
Row signal connects, it is achieved the automatic test to described measured device adapter.
Realize device under test based on photoelectric monitoring platform, as PIN-FET device parameters is tested, different one-parameters is surveyed
Amount functions of the equipments re-start planning and integrate, and are embodied as plug-in type module, use unified communication interface and lead to
News agreement, the communication between each module and main control module is realized by the core bus in plug-in type cabinet, backboard carries
For the working power needed for each module, it is possible to development hardware flexibly, conveniently set up test program.And
The parameter coordinating different functional modules can conveniently realize other optics based on photoelectric monitoring platform is surveyed
Test system.
Described control module 2 includes that signal generator 21, light source module 22, optical attenuator module 23 and signal are surveyed
Amount module 25, wherein said signal generator 21 provides calibration AC signal to signal measurement module 25, triggers simultaneously
Modulated signal is to light source module 22, and light source module 22 produces reference light and is irradiated in optical attenuator module 23, light decay
Subtract and after device module 23 receives reference light, input light alternating current-direct current signal is sent extremely with output light DC voltage detection signal
In signal measurement module 25.
Described control module also includes power supply supply and flow measurement module 24, the supply of described power supply and the output of flow measurement module
End is connected with the input of described measured device adapter, it is preferable that the supply of described power supply is straight with the output of flow measurement module
Stream is biased in described measured device adapter.
Signal measurement module 25 has been used for multrirange DC voltage measurement, broadband exchange level measurement, noise level
Measure, substitute the common apparatus such as conventional digital D.C. voltmeter, digital oscilloscope, video millivoltmeter, completed PINFET
Measuring multiple parameters requirement, such as: the major parameters such as unglazed output voltage, bandwidth, noise.
Described measured device adapter is multiple interface convertor, device under test, as PIN-FET device is placed in adapter
Relevant position so that the output light of the program control optical attenuator module of control module connects PIN-FET by optical patchcord
Device input light, the PIN-FET device output signal of telecommunication is connected to accurate AC/DC voltage measurement mould by coaxial cable
The main signal Measurement channel of block, by the operation and control interface of host computer.
Concrete, PIN-FET device is placed in adapter relevant position according to the direction of mark, the light decay in main frame
The output light subtracting device module passes through optical patchcord connection PIN-FET input light, and the PIN-FET output signal of telecommunication is by same
Shaft cable is connected to the main signal Measurement channel of the measurement module of main frame, and described measurement module is accurate AC/DC electricity
Pressure measurement module, by the operation and control interface of host computer, performs by " PIN-FET light-receiving assembly property index test
Method " test program worked out of regulation, control each module and complete all parameter measurements of PIN-FET device in order
With record.
Described measured device adapter 3 includes the adaptive box of DUT (Device Under Test, device under test), institute
Stating DUT adaptation box is the mechanical clamp of device under test, is equipped with the connection socket of multiple device under test, described socket with
Power supply selectivity connects, and selected socket has display lamp to do gating instruction, and the power supply for device under test is powered, and
Realize the output of high frequency electrical signal.
Described optical attenuator module will test optical transport in DUT adaptation box, to be measured on DUT adaptation box
PIN-FET unit detects, and measured signal transmission is tested by described DUT adaptation box to signal measurement module.
Described measured signal includes: the direct current transmitted by DC detecting alternate channel by described DUT adaptation box is to be measured
Signal and by PIN-PET unit to be measured by the alternating current-direct current measured signal of alternating current-direct current measured signal channel transfer.
Described signal generator is connected with described light source module by BNC coaxial cable, and described light source module passes through light
Fine wire jumper is connected with described optical attenuator module, and described optical attenuator module is connected with device under test by tail optical fiber, light
Attenuator module is connected with measurement module, and described measurement module is by BNC coaxial cable with measured device adapter even
Connecing, described measured device adapter is connected with flow measurement module by adapter client cables and power supply supply of powering.
Power supply supply can pass through routine change output voltage numerical value within the specific limits with flow measurement module, real to simulate
Every technical characteristic of device during the supply voltage deviation nominal of border.The measurement of source current reflects device not
With the duty under environmental condition, quality analysis and Quality estimation for measured device provide reference frame.
Described host computer 3 is connected with main control module 5 by USB cable or wireless transmission interface, described main control module 5
Be preferably SP-A020A type, and with the slot grafting of described photoelectric monitoring platform 1, by the power supply of photoelectric monitoring platform
11 power for it.
SP-A020A type main control module is changed for communications protocol, will the USB communication data that transmits of host computer 4 and
Order is converted to test the communications protocol form of internal system, and is sent to each control module by core bus；
And return to host computer by USB cable after the reply data of each control module is converted to USB communication format.
Preferably, main control module can be selected for the module of integrated industrial computer function, is directly connected to display and netting twine, no longer needs
Want external host computer just can be with complete independently automatic measuring and controlling function.
Described SP-A020A type main control module can be selected for chopper, ADM202EARNZ transceiver, LM224D circuit,
ST24C16 memorizer and power module are connected laggard by carrying out communication with the interface of STM32F103VCT6 type single-chip microcomputer
Row communications protocol is changed.
Described host computer 4 is connected with display 6 by USB interface.
The workflow of the present invention is as follows: system connects figure configuration according to above, runs upper computer software and configures conjunction
Suitable serial line interface and VISA interface, click on software interface and start to measure, perform by " PIN-FET light-receiving
Assembly property indication test method " test program worked out of regulation, control each module and complete PIN-FET device in order
All parameter measurements of part and record.
After using technique scheme, the present invention compared with prior art has the advantages that
Realize the test of PIN-FET device parameters based on photoelectric monitoring platform, different one-parameters is measured functions of the equipments weight
Newly plan and integrate, and being embodied as plug-in type module, using unified communication interface and communications protocol, it is possible to
Development hardware flexibly, conveniently sets up test program.And coordinate different merits based on photoelectric monitoring platform
Energy module can conveniently realize the parameter test system of other optics.
Photoelectric monitoring platform and plug-in type control module constitute PIN-FET based on photoelectric monitoring platform and automatically test system
System main frame.Signal between module, between module and adapter is connected by general or special purpose optical cable and cable realization；
Platform and host computer realize data communication by USB cable；Communication between each module and main control module is by plug-in unit
Core bus in formula cabinet realizes.The working power needed for each module is provided by backboard.
PIN-FET device is placed in adapter relevant position according to the direction of mark, main frame program control optical attenuator module
Output light connects PIN-FET by optical patchcord and inputs light, and the PIN-FET output signal of telecommunication is connected to by coaxial cable
The main signal Measurement channel of main frame precision AC/DC voltage measurement module, by the operation and control interface of host computer,
Perform to press application number: 2011101193366 denominations of invention " PIN-FET light-receiving assembly property indication test method "
The test program that regulation is worked out, controls each module and completes all parameter measurements and the record of PIN-FET device in order.
Embodiment in above-described embodiment can be further combined or replace, and embodiment is only to the present invention
Preferred embodiment be described, not the spirit and scope of the present invention are defined, are setting without departing from the present invention
On the premise of meter thought, various changes that in this area, technical scheme is made by professional and technical personnel and changing
Enter, belong to protection scope of the present invention.
Claims (10)
1.PIN-FET light-receiving assembly Auto-Test System, it is characterised in that include photoelectric monitoring platform, observing and controlling
Module, measured device adapter and host computer；
Described photoelectric monitoring platform is plug-in type cabinet, and each functional module for grafting provides bus communication and work electricity
Source；Described photoelectric monitoring platform realizes data communication by USB cable or wireless transmission interface with host computer；Described
Described PIN-FET light-receiving assembly Auto-Test System is formed after control module and described photoelectric monitoring platform grafting
Main frame, described main frame carries out signal with cable with described measured device adapter by general or special purpose optical cable and is connected,
Realize the automatic test to described measured device adapter.
2. the system as claimed in claim 1, it is characterised in that described control module includes signal generator, light
Source module, optical attenuator module and signal measurement module, wherein said signal generator provides calibration AC signal extremely
Signal measurement module, triggers modulated signal simultaneously and produces reference light be irradiated to optical attenuator to light source module, light source module
In module, optical attenuator module will input light alternating current-direct current signal and output light DC voltage detection after receiving reference light
Signal sends to signal measurement module.
3. system as claimed in claim 2, it is characterised in that described control module also includes power supply supply and surveys
Flow module, the supply of described power supply is connected with the input of the outfan of flow measurement module with described measured device adapter,
Preferably, the supply of described power supply and flow measurement module output direct current biasing are in described measured device adapter.
4. the system as described in one of claim 1-3, it is characterised in that described measured device adapter is multiple
Interface convertor, device under test is placed in described measured device adapter relevant position so that the optical attenuation of control module
The output light of device module connects device under test input light by optical patchcord, and the device under test output signal of telecommunication is by coaxial
Cable is connected to the main signal Measurement channel of measurement module, by the operation and control interface of host computer.
5. system as claimed in claim 4, it is characterised in that described measured device adapter includes that DUT is adaptive
Box, described DUT adaptation box is the mechanical clamp of device under test, is equipped with the connection socket of multiple device under test, described
Socket is connected with power supply selectivity, and selected socket has display lamp to do gating instruction, and the power supply for device under test is powered,
And realize the output of high frequency electrical signal.
6. system as claimed in claim 5, it is characterised in that described optical attenuator module will test optical transport extremely
In DUT adaptation box, detecting the PIN-FET unit to be measured on DUT adaptation box, described DUT adaptation box will be treated
Survey signal transmission to test to signal measurement module.
7. system as claimed in claim 6, it is characterised in that described measured signal includes: fitted by described DUT
Join direct current measured signal that box transmitted by DC detecting alternate channel and by device under test by alternating current-direct current measured signal
The alternating current-direct current measured signal of channel transfer.
8. system as claimed in claim 2, it is characterised in that described signal generator passes through BNC coaxial cable
Being connected with described light source module, described light source module is connected with described optical attenuator module by optical patchcord, described
Optical attenuator module is connected with device under test by tail optical fiber, and optical attenuator module is connected with measurement module, described measurement
Module is connected with measured device adapter by BNC coaxial cable, and described measured device adapter is supplied by adapter
Electricity client cables is connected with flow measurement module with power supply supply.
9. the system as claimed in claim 1, it is characterised in that described host computer passes through USB cable or wireless biography
Defeated interface is connected with main control module, and described main control module is SP-A020A type, and with described photoelectric monitoring platform insert
Groove grafting, is its power supply by the power supply of photoelectric monitoring platform.
10. system as claimed in claim 9, it is characterised in that described host computer passes through USB interface and display
Device connects.
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| CN107450013A (en) * | 2017-09-15 | 2017-12-08 | 北京锐视康科技发展有限公司 | A kind of circuit board functional completeness test platform and method of testing |
| CN107493202A (en) * | 2017-09-29 | 2017-12-19 | 珠海思开达技术有限公司 | Expansible high speed code error tester |
| CN112285517A (en) * | 2020-09-29 | 2021-01-29 | 厦门三优光电股份有限公司 | Automatic test system and test method for APD-TIA ROSA |
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