CN106569162B - A kind of the analog bandwidth measurement method and device of logic analyser probe - Google Patents
A kind of the analog bandwidth measurement method and device of logic analyser probe Download PDFInfo
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- CN106569162B CN106569162B CN201610901085.XA CN201610901085A CN106569162B CN 106569162 B CN106569162 B CN 106569162B CN 201610901085 A CN201610901085 A CN 201610901085A CN 106569162 B CN106569162 B CN 106569162B
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
This application discloses a kind of analog bandwidth test devices of logic analyser probe, including signal source, logic analyser probe and oscillograph, the oscillograph includes I/O interface, sampling unit, data processor and measuring unit etc., the connection of oscillograph and logic analyser probe is realized using I/O interface, it is convenient to obtain the data of logic analyser probe capture, data sampling is carried out by sampling unit again, it ensure that the accuracy of test object, so that measured result accurately reflects the captured signal amplitude of logic analyser probe；Again by constantly changing the frequency of external test signal and carrying out data analysis using measuring unit, calculate the corresponding signal amplitude of each frequency point, it is accurately obtained the analog bandwidth of logic analyser probe, so that measuring device and method high degree of automation, simple to operate, measurement result is accurate and accurate.Meanwhile disclosed herein as well is corresponding test method and for the measuring unit of test.
Description
Technical field
The analog bandwidth test method popped one's head in this application involves electronic instrumentation more particularly to a kind of logic analyser with
Device.
Background technique
Logic analyser is the instrument for analyzing digital display circuit logical relation, can be flowed into simultaneously to the data in a plurality of data
Row observation and test.Logic analyser probe is the capture device of data flow, including sequentially connected attenuator and comparator, is surveyed
Trial signal is after attenuator is decayed, then is input to comparator and is compared with threshold level, obtain logic level signal and export.
Although logic analyser probe capture is digital signal, (such as minimum detection pulsewidth, highest are defeated for its core technology index
Enter data rate etc.) it is all closely related with the analog bandwidth of logic analyser probe.
The analog bandwidth method of traditional measurement analyzer probe is filled by the input terminal that signal source is popped one's head in from logic analyser
Enter a test signal, is inputted with the comparator in the additional internal each channel of oscilloprobe measurement logic analyser probe
The signal at end, thus the analog bandwidth popped one's head in.There are following disadvantages in such scheme:
1. logic analyser is popped one's head in, input impedance requirement is high resistant, so used in logic analyser probe attenuated inside device
Damping resistance needs very big (more than ten thousand ohm of ranks), and when measuring comparator input terminal signal with oscilloprobe, oscillograph is visited
The input capacitance and measurement bring parasitic capacitance and damping resistance of head constitute a lowpass system, can seriously affect and be tested
The bandwidth of logic analyser probe, is unable to test out real simulation bandwidth, test result is caused to have very big error；
2. measured by is the analog bandwidth of comparator input terminal, can not accurately reflect the whole mould of logic analyser probe
Quasi- bandwidth；
3. this test method labor intensive, the mass production detection for being just unfavorable for logic probe is not put in measurement.
Summary of the invention
The application provides the analog bandwidth test method and device of a kind of logic analyser probe, can it is accurate, be convenient for measuring
Obtain the analog bandwidth of logic analyser probe.
According to a first aspect of the present application, the application provides a kind of analog bandwidth test method of logic analyser probe,
Include:
Data sampling step, selects the channel to be measured of logic analyser probe, and the channel reception to be measured is tested signal, made
Logic analyser probe output logic level signal is obtained, the logic level signal is sampled, sampled data is obtained；
The path input to be measured is grounded by data processing step, for the comparator arrangement threshold value electricity in the channel to be measured
It is flat, and the sampled data is stored, detected, converted and transmitted；
Amplitude measurement step calculates the survey according to the configuration threshold level and the sampled data after data processing
The amplitude of logic probe capture signal under trial signal；
Analog bandwidth measuring process changes the frequency of variable test signal, repeats the above steps, and calculates that different frequency is corresponding patrols
The amplitude for collecting probe capture signal, obtains the frequency response of logic analyser probe system, to obtain the logic analyser
The analog bandwidth of probe.
Preferably, the test signal in analog bandwidth measuring process is the sinusoidal signal that signal source issues.
Preferably, the amplitude measurement step includes:
Zero bias calibration steps obtains the zero bias value of comparator threshold level and the sluggishness electricity of comparator using the method for successive approximation
It is flat, and the zero bias of the comparator threshold level are calibrated；
Change duty ratio step, the threshold level is changed to change accounting for for the sampled data using the method for successive approximation
Empty ratio, and threshold level when recording different duty；
Amplitude step is calculated, threshold level when according to the sluggish level and different duty, calculating logic level letter
Number amplitude.
Preferably, amplitude measurement module described in amplitude step is calculated to be used to be believed according to formula c1-c2+b calculating logic level
Number amplitude, wherein b indicate comparator sluggish level, c1 indicate duty ratio be zero threshold level, c2 indicate duty ratio be
Threshold level when a hundred percent.
According to a second aspect of the present application, the application provide it is a kind of for logic analyser probe analog bandwidth test
Measuring unit, including zero bias calibration module, sluggish measurement module, level detection module and amplitude measurement module；
The zero bias calibration module is used to obtain the zero bias value of the comparator threshold level of logic analyser probe and to institute
Zero bias value is stated to be calibrated；
The sluggishness measurement module is used to measure and record the sluggish level of comparator；
The level detection module is used to change the duty ratio of the sampled data by changing threshold level, and record is not
With threshold level when duty ratio；
Threshold level when the amplitude measurement module is used for according to the sluggish level and different duty, calculating logic
The amplitude of probe capture signal.
Preferably, the signal width that the amplitude measurement module is captured according to formula c1-c2+b calculating logic analyzer probe
Value, wherein b indicates that the sluggish level of comparator, c1 indicate that the threshold level that duty ratio is zero, c2 indicate that duty ratio is percent
Threshold level when hundred.
According to the third aspect of the application, the application provides a kind of analog bandwidth test device of logic analyser probe,
Including signal source and oscillograph；The signal source is connected with the logic analyser probe signal input terminal, for described
Logic analyser probe input test signal；The oscillograph includes sequentially connected sampling unit, data processor；
The oscillograph further includes I/O interface before being connected to the sampling unit and is connected to the data processing list
Measuring unit after member is connected by oscillograph described in the I/O interface with logic analyser probe；
The sampling unit is used to sample the logic level signal of logic analyser probe output, obtains hits
According to；
To be measured path input ground connection of the data processor for control logic analyzer probe, for the ratio in the channel
Threshold level is configured compared with device, the sampled data is stored, converted and transmitted；
The measuring unit is used to obtain logic according to the threshold level and through the sampled data of data processor processes
The zero bias value of the comparator threshold level of analyzer probe simultaneously calibrates the zero bias value, measures the sluggishness electricity of comparator
It is flat；Change the duty ratio of the sampled data by changing threshold level, records threshold level when different duty；It is surveying
When trial signal frequency shift, threshold level when according to the sluggish level and different duty calculates logic under each frequency point
The amplitude of probe capture signal, obtains the frequency response of logic analyser probe system, visits to obtain the logic analyser
The analog bandwidth of head.
Preferably, the logic analyser probe at least has a channel, and each channel includes sequentially connected declines
Subtract device and comparator.
Preferably, the signal source is sinusoidal signal to the test signal of logic analyser probe input.
The beneficial effect of the application is: the connection due to realizing oscillograph and logic analyser probe using I/O interface,
No longer need to use the signal of the comparator input terminal in each channel of additional oscilloscope measurement as conventional method, so that obtaining
The data of logic analyser probe capture are more convenient；Data sampling is carried out by sampling unit again, ensure that the standard of test object
True property, the data than the acquisition of conventional method are more acurrate, so that the mould of the more acurrate reflection logic analyser probe of the result of measurement
Quasi- bandwidth；Data analysis, meter are carried out due to the frequency by constantly changing external test signal and using special measuring unit
The corresponding amplitude of each frequency point has been calculated, the analog bandwidth of logic analyser probe has been accurately obtained, so that measuring device and side
Method high degree of automation, simple to operate, measurement result is accurate and accurate.
Detailed description of the invention
Fig. 1 is a kind of inside schematic diagram in a channel of logic analyser probe provided by the embodiments of the present application；
Fig. 2 is a kind of analog bandwidth test device structural block diagram of logic analyser probe provided by the embodiments of the present application；
Fig. 3 is a kind of measuring unit of analog bandwidth test for logic analyser probe provided by the embodiments of the present application
As a result block diagram；
Fig. 4 is a kind of analog bandwidth test method flow chart of logic analyser probe provided by the embodiments of the present application；
Fig. 5 is amplitude measurement in a kind of analog bandwidth test method of logic analyser probe provided by the embodiments of the present application
The sub-step flow chart of step.
Specific embodiment
The application is described in further detail below by specific embodiment combination attached drawing.
It is as shown in Figure 1 a kind of inside schematic diagram of logic analyser probe in the prior art, 2 packet of logic analyser probe
Sequentially connected attenuator 21 and comparator 22 are included, test signal is after the decaying of attenuator 21, then is input to comparator 22 and threshold
Value level (VREF) is compared, and is obtained logic level signal and is exported.
It should be pointed out that logic analyser probe is that multichannel logic analyser is popped one's head in, at least there is a channel, often
A channel includes sequentially connected attenuator 21 and comparator 22.
Referring to FIG. 2, the embodiment of the present application provides a kind of analog bandwidth test device of logic analyser probe, including
Signal source 1 and oscillograph 3.Oscillograph 3 include sequentially connected I/O interface 30, sampling unit 31, storage unit 32, at data
Manage device 33, measuring unit 34 and the display 35 being connected with data processor 33.
Signal source 1 is connected with logic analyser 2 signal input parts of probe, for surveying to 2 input of logic analyser probe
Trial signal；Preferably, signal source is signal generator, and test signal is sinusoidal signal.
Oscillograph 3 is connected by I/O interface 30 with logic analyser 2 signal output ends of probe, and logic can be directly acquired
The internal data information in more than 2 a channels of analyzer probe changes dividing in conventional method using oscilloprobe measurement logic
The method that 22 input terminal of comparator inside analyzer probe 2 obtains data tests it without logic analyser probe 2 is dismantled
Internal circuit, so that it is more convenient, safe to obtain data.
When connecting oscillograph 3 and logic analyser probe 2 by I/O interface 30, logic analyser spy is being selected
Behind first 2 channel to be measured, the path input to be measured of 33 control logic analyzer of data processor probe is grounded and is the channel
Comparator 22 configure threshold level, sampling unit 31 to logic analyser probe 2 output logic level signal sample,
Sampled data is obtained, the sampled data is stored in storage unit 32.Data processor 3 by the sampled data into
The data processings such as row detection, transformation and transmission, so as to the use of rear class measuring unit 34.
Measuring unit 34 is used to obtain the comparator threshold level according to the threshold level and data processed result
Zero bias value simultaneously calibrates the zero bias value, measures the sluggish level of comparator；Changed by changing threshold level described
The duty ratio of sampled data records threshold level when different duty；When frequency test signal changes, according to the sluggishness
Threshold level when level and different duty calculates the amplitude of logic capture signal under each frequency point, obtains logic analyser
The frequency response of probe system, to obtain the analog bandwidth of the logic analyser probe.
Preferably, frequency test signal since 0Hz (DC) frequency sweep and change, to measure meter using measuring unit 34
Calculate the amplitude for the signal that logic analyser probe captures under every frequency point.
The frequency response image for the logic analyser probe system that display 35 is used to show that measurement obtains and logic analysis
The analog bandwidth result of instrument probe.
With reference to Fig. 3, the embodiment of the present application provides a kind of measurement of analog bandwidth test for logic analyser probe
Unit, including zero bias calibration module 341, sluggish measurement module 342, level detection module 343 and amplitude measurement module 344.
The zero bias value of comparator 22 threshold level of the zero bias calibration module 341 for obtaining logic analyser probe 2 is simultaneously right
The zero bias value is calibrated, so that comparator 22, when input signal is zero, output signal is also zero；Sluggish measurement module
342 for measuring and recording the sluggish level of comparator；The level detection module 343 is used to change by changing threshold level
Become the duty ratio of the sampled data, records threshold level when different duty；Amplitude measurement module 344 is used for according to
Threshold level when sluggish level and different duty, the amplitude of calculating logic probe capture signal.
Preferably, amplitude measurement module 344 is popped one's head according to formula c1-c2+b calculating logic captures the amplitude of signal, wherein
B indicates that the sluggish level of comparator, c1 indicate that the threshold level that duty ratio is zero, c2 indicate threshold when duty ratio is a hundred percent
It is worth level.
It can be seen that the analog bandwidth test device of logic analyser provided by the embodiments of the present application probe no longer need as
Conventional method uses the signal of the comparator input terminal in each channel of additional oscilloscope measurement like that, but passes through I/O interface 30
Data sampling is carried out with sampling unit 31, to more easily obtain the data inside logic analyser 2, then passes through sampling unit
31 obtain sampled datas, and data processor 32 is right by measuring unit 33 to being sent to measuring unit 33 after the sampled-data processing
The sampled data of acquisition is analyzed, and the analog bandwidth of system can be accurately obtained.
Correspondingly, analog bandwidth test device and measuring unit 34 based on above-mentioned logic analyser probe, the application is also
Provide a kind of analog bandwidth test method of logic analyser probe.
It is illustrated in figure 4 a kind of analog bandwidth test method process for logic analyser probe that application embodiment provides
Figure, comprising:
Data sampling step 100 selects the channel to be measured of logic analyser probe 2, gives the channel input test to be measured
Signal, so that 2 output logic level signal of logic analyser probe, recycles I/O interface 30 and sampling unit 31 automatically to institute
It states logic level signal to be sampled, obtains sampled data；Preferably, test signal is sinusoidal signal；
Path input to be measured is grounded by data processing step 200, then configures threshold value electricity for the comparator 22 in the channel
It is flat, the sampled data is stored, is detected, converted and transmitted；
Amplitude measurement step 300 calculates under the test signal according to the configuration threshold level and the sampled data
The amplitude of logic probe capture signal；
Analog bandwidth measuring process 400 changes the frequency of variable test signal, repeats the above steps, and calculates different frequency condition
The amplitude of lower logic probe capture signal, obtains the frequency response of logic analyser probe system, to obtain the logic point
The analog bandwidth of analyzer probe 2；Preferably, frequency test signal since 0Hz (DC) frequency sweep and change, thus single using measurement
Member 34 measures the amplitude for calculating the signal that logic analyser probe captures under every frequency point.
Wherein, with reference to Fig. 5, the amplitude measurement step 300 further includes some sub-steps, comprising:
Zero bias calibration steps 301 obtains the zero bias value and comparator 22 of 22 threshold level of comparator using the method for successive approximation
Sluggish level, and the zero bias of 22 threshold level of comparator are calibrated；
Change duty ratio step 302, the threshold level is changed to change the sampled data using the method for successive approximation
Duty ratio, and threshold level when recording different duty；
Amplitude step 303 is calculated, threshold level when according to the sluggish level and different duty, calculating logic probe
Capture the amplitude of signal.
It can be seen that the analog bandwidth test method of logic analyser probe provided by the embodiments of the present application passes through to logic
The internal data of analyzer probe is sampled automatically, handles and is analyzed, and constantly changes test frequency, and measurement obtains different frequency item
The amplitude of logic probe capture signal, has been accurately obtained the analog bandwidth of system under part.
In conclusion due to the connection for realizing oscillograph and logic analyser probe using I/O interface, it is no longer necessary to such as
Conventional method uses the signal of the comparator input terminal in each channel of additional oscilloscope measurement like that, so that obtaining logic analyser
The data of probe capture are more convenient；Data sampling is carried out by sampling unit again, ensure that the accuracy of test object, than tradition
The data of the acquisition of method are more acurrate, so that the analog bandwidth of the more acurrate reflection logic analyser probe of the result of measurement；Due to
By constantly changing the frequency of external test signal and carrying out data analysis using special measuring unit, each frequency has been calculated
The corresponding amplitude of point, is accurately obtained the analog bandwidth of logic analyser probe, so that measuring device and method the degree of automation
High, simple to operate, measurement result is accurate and accurate.
The foregoing is a further detailed description of the present application in conjunction with specific implementation manners, and it cannot be said that this Shen
Specific implementation please is only limited to these instructions.For those of ordinary skill in the art to which this application belongs, it is not taking off
Under the premise of from the present application design, a number of simple deductions or replacements can also be made.
Claims (7)
1. a kind of analog bandwidth test method of logic analyser probe characterized by comprising
Data sampling step selects the channel to be measured of logic analyser probe, and the channel reception to be measured tests signal, so that patrolling
Analyzer probe output logic level signal is collected, the logic level signal is sampled, sampled data is obtained；
The path input to be measured is grounded by data processing step, for the comparator arrangement threshold level in the channel to be measured, and
The sampled data is stored, is detected, converted and transmitted；
Amplitude measurement step calculates test letter according to the configuration threshold level and the sampled data after data processing
Number amplitude；The amplitude measurement step includes: zero bias calibration steps, obtains comparator threshold level using the method for successive approximation
The sluggish level of zero bias value and comparator, and the zero bias of the comparator threshold level are calibrated；Change duty ratio step,
When changing the threshold level using the method for successive approximation to change the duty ratio of the sampled data, and recording different duty
Threshold level；Amplitude step is calculated, threshold level when according to the sluggish level and different duty, calculating logic analysis
The signal amplitude of instrument probe capture；
Analog bandwidth measuring process changes the frequency of variable test signal, repeats the above steps, and calculates different frequency to the width of induction signal
Value, obtains the frequency response of logic analyser probe system, to obtain the analog bandwidth of the logic analyser probe；It is described
Testing signal is the sinusoidal signal that signal source issues.
2. the method as described in claim 1, which is characterized in that in the calculating amplitude step, for according to formula c1-c2
The signal amplitude of+b calculating logic analyzer probe capture, wherein b indicates that the sluggish level of comparator, c1 indicate that duty ratio is
Zero threshold level, c2 indicate threshold level when duty ratio is a hundred percent.
3. it is a kind of for logic analyser probe analog bandwidth test device, which is characterized in that including zero bias calibration module,
Sluggish measurement module, level detection module and amplitude measurement module；
The zero bias calibration module is used to obtain the zero bias value of the comparator threshold level of logic analyser probe and to described zero
Bias is calibrated；
The sluggishness measurement module is used to measure and record the sluggish level of comparator；
The level detection module is used to change the duty ratio of a sampled data by changing threshold level, records different duties
Than when threshold level, the sampled data be by logic analyser probe output logic level signal sample and
It obtains；
Threshold level when the amplitude measurement module is used for according to the sluggish level and different duty, calculating logic analysis
The signal amplitude of instrument probe capture.
4. device as claimed in claim 3, which is characterized in that the amplitude measurement module is patrolled according to formula c1-c2+b calculating
Collect the signal amplitude of analyzer probe capture, wherein b indicates that the sluggish level of comparator, c1 indicate the threshold value that duty ratio is zero
Level, c2 indicate threshold level when duty ratio is a hundred percent.
5. a kind of analog bandwidth test device of logic analyser probe, including signal source and oscillograph；The signal source and institute
It states logic analyser probe signal input terminal to be connected, for giving logic analyser probe input test signal；It is described to show
Wave device includes sequentially connected sampling unit, data processor；
It is characterized in that,
The oscillograph further includes I/O interface before being connected to the sampling unit and is connected to after the data processor
Measuring unit, be connected by oscillograph described in the I/O interface with logic analyser probe signal output end；
The sampling unit is used to sample the logic level signal of logic analyser probe output, obtains sampled data；
To be measured path input ground connection of the data processor for control logic analyzer probe, for the ratio in the channel to be measured
Threshold level is configured compared with device, the sampled data is stored, converted and transmitted；
The measuring unit is used to obtain logic analysis according to the threshold level and through the sampled data of data processor processes
The zero bias value of the comparator threshold level of instrument probe simultaneously calibrates the zero bias value, measures the sluggish level of comparator；It is logical
The duty ratio for changing threshold level to change the sampled data is crossed, threshold level when different duty is recorded；Believe in test
When number frequency shift, threshold level when according to the sluggish level and different duty calculates logic analysis under each frequency point
The signal amplitude of instrument probe capture, obtains the frequency response of logic analyser probe system, to obtain the logic analyser
The analog bandwidth of probe.
6. device as claimed in claim 5, which is characterized in that at least there are two channels for tool for the logic analyser probe, often
A channel includes sequentially connected attenuator and comparator.
7. device as claimed in claim 5, which is characterized in that survey of the signal source to logic analyser probe input
Trial signal is sinusoidal signal.
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| CN109521407B (en) * | 2018-12-20 | 2020-10-27 | 陕西黄河集团有限公司 | Working bandwidth testing method for radar emission subsystem |
| CN110379375B (en) * | 2019-06-25 | 2021-05-07 | 深圳市金锐显数码科技有限公司 | Automatic switching method and automatic switching system for backlight current gears |
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