CN107167722A - A kind of instrument detecting tool platform and instrument detection device - Google Patents
A kind of instrument detecting tool platform and instrument detection device Download PDFInfo
- Publication number
- CN107167722A CN107167722A CN201610131288.5A CN201610131288A CN107167722A CN 107167722 A CN107167722 A CN 107167722A CN 201610131288 A CN201610131288 A CN 201610131288A CN 107167722 A CN107167722 A CN 107167722A
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- China
- Prior art keywords
- mounting seat
- detecting tool
- tool platform
- plate
- support baseboard
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
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- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
Abstract
The present invention relates to the technical field of experimental facilities, a kind of instrument detecting tool platform and instrument detection device are disclosed.The tooling platform includes：Support baseboard；It is slidedly assemblied on the support baseboard and may be locked in the unit under test mounting seat of setting position；And the unit under test mounting seat can be slided along the vertical support baseboard length direction；It is slidedly assemblied on the support baseboard and may be locked in the tester mounting seat of setting position；And the tester mounting seat can be slided along parallel to the support baseboard length direction.Can easily realize the testing requirement of different scale chips by this Fixture Design, and can with it is more efficient, flexible, accurate, reliably build the test environments of different test equipments compositions, reduce connector fit tolerance, prevent connector from damaging.Tooling platform can embed radiator simultaneously, and placing in hyperpyrexia chip testing process causes side test error because temperature is too high.
Description
Technical field
The present invention relates to the technical field of experimental facilities, more particularly to a kind of instrument detecting tool platform and
Instrument detection device.
Background technology
, it is necessary to be carried out with the professional test equipment such as professional instrument, coupler, attenuator when power amplifier chips are tested
Axially connection, makes the connector of distinct device be docked successively, forms the test wrapper that a set of length reaches several meters
Border.But at present mostly in test environment, tested board is directly deposited in experiment table top with these test equipments
On, positioning by hand is carried out by simple rack and docked, not only precision and reliability are difficult to control to, and operation
Inefficiency, it is inconvenient.
The content of the invention
The invention provides a kind of instrument detecting tool platform and instrument detection device, facilitate taking for detection device
Build and detection chip.
The invention provides a kind of instrument detecting tool platform, the tooling platform includes：
Support baseboard；
It is slidedly assemblied on the support baseboard and may be locked in the unit under test mounting seat of setting position；And institute
Stating unit under test mounting seat can slide along the vertical support baseboard length direction；
It is slidedly assemblied on the support baseboard and may be locked in the tester mounting seat of setting position；And institute
Stating tester mounting seat can slide along parallel to the support baseboard length direction.
In the above-mentioned technical solutions, tested chip is carried by unit under test mounting seat, and passes through tester
Device mounting seat carries detection device, and unit under test mounting seat distinguishes slidable fit with tester mounting seat
On support baseboard, so as to facilitate the installation of chip under test and the fixation of tester, it is to avoid each survey
Line is chaotic between test instrument, improves the security of connector between tester, and then convenient detection core
Piece.The testing requirement of different scale chips can be easily realized by this Fixture Design, and can be higher
Effect, the test environment for flexibly, accurately, reliably building different test equipments compositions, reduce connector and coordinate
Tolerance, prevents connector from damaging.Tooling platform can embed radiator simultaneously, prevent hyperpyrexia chip testing
Cause side test error in journey because temperature is too high.
It is preferred that, it is provided with the first slide rail on the support baseboard, the length direction of first slide rail is along institute
State the length direction of support baseboard；The installing plate that may be locked in setting position is provided with first slide rail,
The second slide rail is provided with the installing plate, the unit under test mounting seat is slidedly assemblied in second slide rail
On.
It is preferred that, the unit under test mounting seat includes：The horizontal supporting plate on the second slide rail is slidedly assemblied in,
It is arranged on the DOCK LEVELER on the horizontal supporting plate；It is fixed on the radiator branch on the DOCK LEVELER
Frame, is arranged on the radiator bearer and for fixing the attachment structure of unit under test, and be arranged on institute
State the radiator on radiator bearer.
It is preferred that, be provided with the installing plate on lock-screw, the horizontal supporting plate be provided with it is described
The waist-shaped hole that lock-screw is engaged, and the waist-shaped hole length direction parallel to second slide rail length
Spend direction.
It is preferred that, connected between the DOCK LEVELER and the horizontal supporting plate by height adjustment bolt component
Connect.
It is preferred that, the height adjustment bolt component includes：Spiral is connected to the spiral shell on the horizontal supporting plate
Rasp bar, is sleeved on the threaded rod and for supporting the first nut of the DOCK LEVELER, and be set with
On the threaded rod and for coordinating be fixed the DOCK LEVELER the with first nut
Two nuts.
It is preferred that, the attachment structure includes：The chip fixed plate on the radiator bearer is fixed on, with
And it is symmetricly set on the cabling substrate of the chip fixed plate both sides；Wherein, it is removable in the chip fixed plate
Being fixed with chip clinching, each cabling substrate for unloading is provided with wiring board.
It is preferred that, the chip fixed plate be inverted T-shaped, the cabling substrate by connector with it is described
The vertical portion of chip fixed plate is fixedly connected.
It is preferred that, the tester mounting seat includes input equipment mounting seat and output equipment mounting seat,
And the input equipment mounting seat is separately positioned on the unit under test with the output equipment mounting seat and installed
The both sides of seat.
It is preferred that, the input equipment mounting seat and the output equipment mounting seat include being locked in setting position
The test instrumentation installing plate put, is slidedly assemblied in the equipment that on first slide rail and may be locked in setting position
Installing plate.
It is preferred that, modulus mounting hole is provided with the apparatus mounting plate.
It is preferred that, the height adjustment assembly for fixed test equipment is provided with the apparatus mounting plate.
It is preferred that, it is provided with handle on the test instrumentation installing plate.
Present invention also offers a kind of instrument detection device, the instrument detection device is included described in any of the above-described
Instrument detecting tool platform, and the tester being arranged on the instrument detecting tool platform.
Brief description of the drawings
Fig. 1 is the stereogram of instrument detecting tool platform provided in an embodiment of the present invention；
Fig. 2 shows for the decomposition of the unit under test mounting seat of instrument detecting tool platform provided in an embodiment of the present invention
It is intended to；
Tester mounting seats and support bottom of the Fig. 3 for instrument detecting tool platform provided in an embodiment of the present invention
The cooperation schematic diagram of plate.
Reference：
1- support baseboards 11- the first slide rail the second slide rails of 12-
13- installing plate 131- screwed hole 2- unit under test mounting seats
21- horizontal supporting plate 211- waist-shaped hole 22- DOCK LEVELERs
23- radiator bearer 24- radiator 25- chip fixed plates
26- cabling substrate 27- wiring board 28- chip clinchings
3- tester mounting seat 31- test instrumentation installing plate 311- handles
32- apparatus mounting plate 4- test instrumentation 5- couplers
6- attenuators
Embodiment
In order that the object, technical solutions and advantages of the present invention are clearer, below in conjunction with accompanying drawing to this hair
It is bright to be described in further detail, it is clear that described embodiment is only a part of embodiment of the invention,
Rather than whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art are not doing
Go out all other embodiment obtained under the premise of creative work, belong to the scope of protection of the invention.
As shown in figure 1, Fig. 1 shows that the structure of instrument detecting tool platform provided in an embodiment of the present invention is shown
It is intended to.
The embodiments of the invention provide a kind of instrument detecting tool platform, the platform includes：
Support baseboard 1；
It is slidedly assemblied on the support baseboard 1 and may be locked in the unit under test mounting seat 2 of setting position；
And the unit under test mounting seat 2 can be slided along the vertical length direction of support baseboard 1；
It is slidedly assemblied on the support baseboard 1 and may be locked in the tester mounting seat 3 of setting position；
And the tester mounting seat 3 can be slided along parallel to the length direction of support baseboard 1.
In the above-described embodiments, tested chip is carried by unit under test mounting seat 2, and passes through tester
Device mounting seat 3 carries detection device, and unit under test mounting seat 2 is slided respectively with tester mounting seat 3
It is dynamic to be assemblied on support baseboard 1, so as to facilitate the installation of chip under test and the fixation of tester, keep away
Line is chaotic between exempting from each tester, improves the security of connector between tester, Jin Erfang
Just detection chip.The testing requirement of different scale chips can be easily realized by this Fixture Design, and
Can with it is more efficient, flexible, accurate, reliably build the test environment of different test equipments composition, the company of reduction
Device fit tolerance is connect, prevents connector from damaging.Tooling platform can embed radiator 24 simultaneously, prevent hyperpyrexia
Cause side test error in chip testing process because temperature is too high.
To facilitate understanding of the present embodiment of the invention the workbench and instrument detection device provided, with reference to tool
It is described in detail the embodiment of body.
As shown in figure 1, Fig. 1 shows the structural representation of instrument detection device.The instrument that the present embodiment is provided
Device detection device includes signal input device, signal output apparatus, and carrying signal input equipment, signal
The workbench of output equipment and detected chip.When setting, signal input device and signal output apparatus
The both sides of detected chip are separately positioned on, and are connected respectively with the input and output end of chip.
Signal input device, detected chip and the signal output provided with continued reference to Fig. 1, the present embodiment
Equipment is carried on workbench respectively.The workbench includes：Support baseboard 1, is slidedly assemblied in support
Chip under test support base on bottom plate 1 and it is slidedly assemblied in support baseboard 1 and point row are supported with chip under test
The tester mounting seat 3 of seat both sides.Specifically, as shown in figure 1, support baseboard 1 uses the plate of strip
Type structure, in order to the arrangement of tester.The first cunning along its length is provided with support baseboard 1
Rail 11, the number of first slide rail 11 is two.Tester support base is slidedly assemblied in first slide rail
The mounting hole of single-row arrangement is provided with 11, and on the first slide rail 11, positioned at the pars intermedia of the first slide rail 11
Set up separately and be equipped with an installing plate 13 that may be locked in setting position, the installing plate 13 is by connector with installing
Installing plate 13 is fixed on the first slide rail 11 by the cooperation in hole, and can pass through installed part and different mounting holes
Coordinate the adjustment realized to the position of installing plate 13.In the present embodiment, as a specific embodiment,
Installing plate 13 is fixed on the centre position of the first slide rail 11.
Refer in the lump on Fig. 1 and Fig. 2, the installing plate 13 and be provided with the second slide rail 12, the second slide rail 12
Length direction is perpendicular to the length direction of mounting base, and unit under test mounting seat 2 is slidedly assemblied in the second slide rail
On 12 and it may be locked in specific position.The tested part includes：It is slidedly assemblied on the second slide rail 12
Horizontal supporting plate 21, be arranged on the DOCK LEVELER 22 on the horizontal supporting plate 21；It is fixed on described
Radiator bearer 23 on DOCK LEVELER 22, is arranged on the radiator bearer 23 and for fixing quilt
Survey the attachment structure of part, and the radiator 24 being arranged on the radiator bearer 23.
Specifically, horizontal supporting plate 21 is slidedly assemblied on installing plate 13, as shown in Fig. 2 horizontal support
Two chutes are provided with plate 21, each chute correspondence is assemblied on second slide rail 12 so that tested
Component mount 2 can be slided on the second slide rail 12, when being locked in setting position, pass through locking screw
Nail realizes the locking to unit under test mounting seat 2.Specifically, lock-screw is provided with installing plate 13,
The waist-shaped hole 211 being engaged with the lock-screw, and the waist-shaped hole are provided with horizontal supporting plate 21
Length direction of 211 length direction parallel to second slide rail 12.As shown in Fig. 2 installing plate 13
On be provided with lock-screw, horizontal supporting plate 21 be provided with length along the length direction of the second slide rail 12 set
Waist-shaped hole 211, lock-screw is located in the long waist-shaped hole 211, when needing to slide, unscrews locking
Screw, horizontal supporting plate 21 can be slided on the second slide rail 12, when sliding into desired position, be screwed
Lock-screw, setting position is locked in by unit under test mounting seat 2.Further, since the length of waist-shaped hole 211
Degree is limited, in order to ensure that unit under test mounting seat 2 has good sliding scale, preferably, installing plate 13
On be provided with along the length direction of the second slide rail 12 arrange multiple screwed holes 131, by lock-screw from it is different
Screwed hole 131 cooperation, realize to unit under test mounting seat 2 slide amplitude adjustment.More preferably,
In order to ensure the effect of locking, the number of the lock-screw is two, and two lock-screws are along the second slide rail
12 length direction arrangement.When using two lock-screws, corresponding waist-shaped hole 211 is also two.
As a kind of preferred embodiment, in order that obtaining the apparatus measures equipment of the present embodiment offer can detect
Different chip, preferably, the unit under test mounting seat 2 also includes a height adjustment platform, the height
Adjustment platform can realize adjustment in height, so as to the connection with unit under test and tester.Specifically
, in the lump with reference to Fig. 1 and Fig. 2, pass through height between DOCK LEVELER 22 and the horizontal supporting plate 21
Regulating bolt component is connected.The height adjustment bolt component can adjust the height of DOCK LEVELER 22, make
Chip when detected in different height.Specifically, the height adjustment bolt component includes：Spiral
The threaded rod on the horizontal supporting plate 21 is connected to, is sleeved on the threaded rod and described for supporting
First nut of DOCK LEVELER 22, and be sleeved on the threaded rod and be used for and first nut
Coordinate the second nut for being fixed the DOCK LEVELER 22.As shown in Figures 1 and 2, threaded rod
Spiral is fixed on horizontal supporting plate 21, or using other modes as being fixed on level branch by the way of welding
On fagging 21, and spiral is provided with the first nut on threaded rod, and first nut is adjusted for bearing height
Plate 22, specifically, as shown in figure 1, the number of the threaded rod can be using multiple, such as three or four,
In the present embodiment using four screw rods, four edges of horizontal supporting plate 21, four are set again respectively
The support base of individual first nut formation bearing height adjustable plate 22, screw rod is sleeved in DOCK LEVELER 22
When upper, DOCK LEVELER 22 was supported, in addition, the stability in order to ensure DOCK LEVELER 22,
The unit under test mounting seat 2 that the present embodiment is provided also includes the second nut, and second nut is matched somebody with somebody with the first nut
Conjunction locks DOCK LEVELER 22, as shown in figure 1, after DOCK LEVELER 22 is arranged on screw rod,
The second nut is screwed in be locked DOCK LEVELER 22.When needing to adjust the height of DOCK LEVELER 22,
Position of the nut of adjustment first and the second nut that can coordinate on screw rod, so as to adjust DOCK LEVELER
22 height.Realize the adjustment to chip under test height, it is ensured that chip under test can be connected with tester
Stability.
In the present embodiment, in order to improve the effect of test, preferably, being provided with cooling dress on workbench
Put, be provided with specifically, being provided with height adjustment plate on radiator bearer 23, the radiator bearer 23
The attachment structure for fixing unit under test is provided with radiator 24, and radiator bearer 23 so that dissipate
Hot device 24 is located at the lower section of chip under test, convenient that detected chip is radiated.The attachment structure has
Body includes：The chip fixed plate 25 on the radiator bearer 23 is fixed on, and is symmetricly set on described
The cabling substrate 26 of the both sides of chip fixed plate 25；Wherein, removably fixed in the chip fixed plate 25
Have and be provided with wiring board 27 on chip clinching 28, each cabling substrate 26.Specifically, chip fixed plate 25
For fix on chip under test, and chip fixed plate 25 be provided with chip clinching 28 chip is locked,
And the both sides of chip fixed plate 25 are provided with cabling substrate 26, each cabling substrate 26 and are provided with wiring board
27, two wiring boards 27 are connected with chip under test signal respectively, and two wiring boards 27 are defeated with signal respectively
Enter equipment and signal output apparatus connection, so that chip is connected with tester.With continued reference to figure
2, the chip fixed plate 25 is inverted T-shaped, and the cabling substrate 26 passes through connector and the chip
The vertical portion of fixed plate 25 is fixedly connected., can be by the connector of setting when using said structure
The distance between cabling substrate 26 and chip fixed plate 25 are adjusted, so that can in chip fixed plate 25
To set different size of chip, the applicability of whole workbench is improved.
As shown in figure 1, the present embodiment provide tester mounting seat 3 include input equipment mounting seat and
Output equipment mounting seat, and the input equipment mounting seat is separately positioned on institute with the output equipment mounting seat
State the both sides of unit under test mounting seat 2.Specifically, as shown in figure 1, above-mentioned input equipment mounting seat and defeated
Going out equipment mounting seat includes being locked in the test instrumentation installing plate 31 of setting position, is slidedly assemblied in described the
On one slide rail 11 and it may be locked in the apparatus mounting plate 32 of setting position.With continued reference to Fig. 1, test instrumentation
Installing plate 31 is slidedly assemblied on the first slide rail 11 and can slided along the first slide rail 11, and support baseboard 1
On be provided with multiple screwed holes, test instrumentation installing plate 13 and be provided with lock-screw, when test instrumentation peace
When dress plate 31 is adjusted to desired position, test instrumentation is installed by the cooperation of lock-screw and screwed hole
Plate 31 is fixed on the position, specifically, unscrewing lock-screw first, afterwards, adjustment test instrumentation is installed
The position of plate 31 so that test instrumentation 4 is attached by connector with wiring board 27, upon connection,
Screw lock-screw and test instrumentation installing plate 31 is fixed on the position, so that between ensure that connector only
Only as a signal transmission device part, attachment force between part is not subject to, connector of knowing clearly is improved and is using
When security.More preferably, the slip of test instrumentation installing plate 31 for convenience, as shown in figure 3, surveying
Handle 311 is provided with examination instrument installing plate 31, the handle 311 is located at the two of test instrumentation installing plate 13
Side, facilitates staff's mobile test instrument installing plate 31.
In addition, apparatus mounting plate 32 is used to carry other testers, as a kind of specific embodiment,
As shown in figure 1, input side includes：Attenuator 6 and two couplers 5, outlet side includes：Decay
Device 6 and coupler 5.Other testers that certain the present embodiment is provided also include other instruments
Combination, specifically can be according to actually detected project depending on.The setting of tester for convenience,
As a kind of perferred technical scheme, it is provided with modulus mounting hole on apparatus mounting plate 32.By being arranged on
Tester can be arranged on different positions by the connector on tester from the cooperation of modulus mounting hole,
To facilitate the connection between tester.
As a kind of more preferably embodiment, it is provided with the apparatus mounting plate 32 for fixed test equipment
Height adjustment assembly.Tester is caused to realize junction in connection by the height adjustment assembly of setting
In sustained height, the connection of tester is facilitated.
By foregoing description as can be seen that the tooling platform that the present embodiment is provided can realize chip under test and survey
The flexible modulation of connector and docking between examination equipment, it is to avoid the low precision problem docked manually, prevent connection
Device is damaged, it is ensured that the levelness of test system, improves testing reliability；In addition, below chip mounting surface
Embedded radiator 24, is conducive to chip cooling, improves the test result degree of accuracy.Meanwhile, using above-mentioned work
Platform improves flexibility and the operating efficiency that test environment is built, and saves manpower and time.
The present embodiment additionally provides a kind of instrument detection device, and the equipment includes the instrument described in any of the above-described
Detecting tool platform, and the tester being arranged on the instrument detecting tool platform.
In the above-described embodiments, tested chip is carried by unit under test mounting seat 2, and passes through tester
Device mounting seat 3 carries detection device, and unit under test mounting seat 2 is slided respectively with tester mounting seat 3
It is dynamic to be assemblied on support baseboard 1, so as to facilitate the installation of chip under test and the fixation of tester, keep away
Line is chaotic between exempting from each tester, improves the security of connector between tester, Jin Erfang
Just detection chip.The testing requirement of different scale chips can be easily realized by this Fixture Design, and
Can with it is more efficient, flexible, accurate, reliably build the test environment of different test equipments composition, the company of reduction
Device fit tolerance is connect, prevents connector from damaging.Tooling platform can embed radiator 24 simultaneously, prevent hyperpyrexia
Cause side test error in chip testing process because temperature is too high.
Obviously, those skilled in the art can carry out various changes and modification without departing from this hair to the present invention
Bright spirit and scope.So, if the present invention these modifications and variations belong to the claims in the present invention and
Within the scope of its equivalent technologies, then the present invention is also intended to comprising including these changes and modification.
Claims (14)
1. a kind of instrument detecting tool platform, it is characterised in that including：
Support baseboard；
It is slidedly assemblied on the support baseboard and may be locked in the unit under test mounting seat of setting position；And institute
Stating unit under test mounting seat can slide along the vertical support baseboard length direction；
It is slidedly assemblied on the support baseboard and may be locked in the tester mounting seat of setting position；And institute
Stating tester mounting seat can slide along parallel to the support baseboard length direction.
2. instrument detecting tool platform as claimed in claim 1, it is characterised in that the support baseboard
On be provided with the first slide rail, the length direction of the length direction of first slide rail along the support baseboard；Institute
State and be provided with the second cunning on the installing plate for being provided with the first slide rail and may be locked in setting position, the installing plate
Rail, the unit under test mounting seat is slidedly assemblied on second slide rail.
3. instrument detecting tool platform as claimed in claim 2, it is characterised in that the unit under test
Mounting seat includes：The horizontal supporting plate on the second slide rail is slidedly assemblied in, is arranged on the horizontal supporting plate
DOCK LEVELER；The radiator bearer on the DOCK LEVELER is fixed on, the radiator branch is arranged on
On frame and for fixing the attachment structure of unit under test, and the radiating being arranged on the radiator bearer
Device.
4. instrument detecting tool platform as claimed in claim 3, it is characterised in that on the installing plate
It is provided with lock-screw, the horizontal supporting plate and is provided with the waist-shaped hole being engaged with the lock-screw,
And the length direction of the waist-shaped hole is parallel to the length direction of second slide rail.
5. instrument detecting tool platform as claimed in claim 3, it is characterised in that the height regulation
Connected between plate and the horizontal supporting plate by height adjustment bolt component.
6. instrument detecting tool platform as claimed in claim 5, it is characterised in that the height regulation
Bolt assembly includes：Spiral is connected to the threaded rod on the horizontal supporting plate, is sleeved on the threaded rod
And for supporting the first nut of the DOCK LEVELER, and be sleeved on the threaded rod and be used for and institute
State the first nut and coordinate the second nut for being fixed the DOCK LEVELER.
7. instrument detecting tool platform as claimed in claim 4, it is characterised in that the attachment structure
Including：The chip fixed plate on the radiator bearer is fixed on, and is symmetricly set on the chip and is fixed
The cabling substrate of plate both sides；Wherein, chip clinching is detachably and fixedly provided with the chip fixed plate, each
Wiring board is provided with cabling substrate.
8. instrument detecting tool platform as claimed in claim 7, it is characterised in that the chip is fixed
Plate is inverted T-shaped, and the cabling substrate is fixed by connector and the vertical portion of the chip fixed plate
Connection.
9. the instrument detecting tool platform as described in any one of claim 1~8, it is characterised in that described
Tester mounting seat includes input equipment mounting seat and output equipment mounting seat, and the input equipment is pacified
Dress seat is separately positioned on the both sides of the unit under test mounting seat with the output equipment mounting seat.
10. instrument detecting tool platform as claimed in claim 9, it is characterised in that the input equipment
Mounting seat and the output equipment mounting seat include the test instrumentation installing plate for being locked in setting position, slide
It is assemblied on first slide rail and may be locked in the apparatus mounting plate of setting position.
11. instrument detecting tool platform as claimed in claim 10, it is characterised in that the equipment peace
Modulus mounting hole is provided with dress plate.
12. instrument detecting tool platform as claimed in claim 11, it is characterised in that the equipment peace
The height adjustment assembly for fixed test equipment is provided with dress plate.
13. instrument detecting tool platform as claimed in claim 11, it is characterised in that the tester
Handle is provided with table installing plate.
14. a kind of instrument detection device, it is characterised in that including as described in any one of claim 1~13
Instrument detecting tool platform, and the tester being arranged on the instrument detecting tool platform.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610131288.5A CN107167722A (en) | 2016-03-08 | 2016-03-08 | A kind of instrument detecting tool platform and instrument detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610131288.5A CN107167722A (en) | 2016-03-08 | 2016-03-08 | A kind of instrument detecting tool platform and instrument detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107167722A true CN107167722A (en) | 2017-09-15 |
Family
ID=59848698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610131288.5A Pending CN107167722A (en) | 2016-03-08 | 2016-03-08 | A kind of instrument detecting tool platform and instrument detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107167722A (en) |
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| CN111223804A (en) * | 2018-11-26 | 2020-06-02 | 合肥欣奕华智能机器有限公司 | Substrate conveying device |
| CN110568267A (en) * | 2019-07-22 | 2019-12-13 | 中国航空工业集团公司济南特种结构研究所 | Quick assembling and disassembling device for waveguide test of dielectric property of material |
| CN110568267B (en) * | 2019-07-22 | 2021-12-03 | 中国航空工业集团公司济南特种结构研究所 | Quick assembling and disassembling device for waveguide test of dielectric property of material |
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Application publication date: 20170915 |