CN110568267B - Quick assembling and disassembling device for waveguide test of dielectric property of material - Google Patents

Quick assembling and disassembling device for waveguide test of dielectric property of material Download PDF

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Publication number
CN110568267B
CN110568267B CN201910661389.7A CN201910661389A CN110568267B CN 110568267 B CN110568267 B CN 110568267B CN 201910661389 A CN201910661389 A CN 201910661389A CN 110568267 B CN110568267 B CN 110568267B
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waveguide
test
longitudinal adjusting
bin
pressing block
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CN201910661389.7A
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CN110568267A (en
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王维峰
李秀英
崔冬雷
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AVIC Research Institute Special Structures Aeronautical Composites
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AVIC Research Institute Special Structures Aeronautical Composites
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617Measuring dielectric properties, e.g. constants

Abstract

The invention belongs to the field of material electrical property tests, and particularly relates to a rapid loading and unloading device for a material dielectric property waveguide test. When the dielectric property test of the existing material adopts waveguide test, the time and labor are wasted by connecting the waveguide flange with bolts and nuts. The base is provided with a guide rail, a waveguide support, a longitudinal adjusting pressing block, a test bin and a main guide shaft, wherein the waveguide support is arranged on the front side of the guide rail, the main guide shaft and a front positioning pin which are parallel to the guide rail are arranged on the waveguide support, the test bin is sleeved on the main guide shaft, the longitudinal adjusting pressing block is arranged on the guide rail in a matched mode, the main guide shaft penetrates through the test bin and the longitudinal adjusting pressing block and then is in threaded connection with a locking and unlocking device, and the longitudinal adjusting pressing block is provided with a rear positioning pin. The rapid assembling and disassembling device can meet the requirements of the connection of most waveguide types and waveguide flanges at present. So that the test material can be replaced simply and conveniently in the test process. The installation process is simplified.

Description

Quick assembling and disassembling device for waveguide test of dielectric property of material
Technical Field
The invention belongs to the field of material electrical property tests, and particularly relates to a rapid loading and unloading device for a material dielectric property waveguide test.
Background
When the dielectric property of the existing material is tested by adopting waveguide, the waveguide flange needs to be connected by bolts and nuts, which wastes time and labor, so that the labor intensity of material testers is greatly increased, the tightness is different during installation, and the tightening force of operators is different, so that the standards are unified and the test error is easily generated. At present, a single waveguide connection mode cannot meet the requirements of multiple types, large quantity and high precision of material tests at the present stage.
Disclosure of Invention
The invention aims to provide a device for testing dielectric properties of multiple types of material test blocks by adopting waveguides with different models, which can solve the problems of time and labor waste, inconsistent bonding and the like of the traditional material test.
A quick assembling and disassembling device for waveguide test of dielectric property of materials is provided with a guide rail, a waveguide support, a longitudinal adjusting pressing block, a test bin and a main guide shaft on a base, wherein the waveguide support is arranged on the front side of the guide rail and is provided with the main guide shaft and a front positioning pin which are parallel to the guide rail; providing a rearward force to the test chamber through a pressure structure; the test bin is provided with a positioning hole, and the front side and the rear side of the test bin are respectively matched with the front positioning pin and the rear positioning pin.
Further, the waveguide support is installed with the waveguide flange in a matched mode through the front positioning pin.
Further, the pressure structure is a thrust spring, is sleeved on the main guide shaft and is arranged between the waveguide bracket and the test bin in a pre-compression mode.
Furthermore, the lower part of the base is also provided with a horizontal adjusting supporting leg.
Furthermore, a longitudinal adjusting sliding block is arranged on the guide rail in a matching mode, and an adjusting bolt is connected to the waveguide support in a threaded mode to adjust the position of the longitudinal adjusting sliding block.
Further, the waveguide extends from the front side of the waveguide support.
Further, different types of waveguides are installed in the waveguide support according to test requirements.
Further, test bins with different block regions are selected according to test requirements.
Further, the front positioning pin and the rear positioning pin are multiple.
Furthermore, the longitudinal adjusting pressing block and the test bin are pressed onto the waveguide support by rotating the locking and unlocking device during testing.
The device enables the waveguide connection in the material test to be rapid, consistent and accurate; the connection mode of the waveguide and the waveguide flange can be extended, and a foundation is provided for automatic testing of various materials; the cooperative adjustment of the multiple components of the device can be used for the replacement test of multiple types of waveguides.
The rapid assembling and disassembling device can meet the requirements of the connection of most waveguide types and waveguide flanges at present. So that the test material can be replaced simply and conveniently in the test process. The installation process is simplified.
Has the advantages that: by adopting the testing device, the waveguide flange can be quickly and accurately connected; quickly disassembling the material test block; the test process of the whole material test block is simplified, and the measurement of various material test blocks can be carried out by matching with waveguides of different models.
Drawings
FIG. 1 is a schematic view of the fast loading and unloading apparatus of the present invention.
1-base, 2-horizontal adjusting supporting foot, 3-guide rail, 4-longitudinal adjusting sliding block, 5-longitudinal adjusting pressing block, 6-waveguide bracket, 7-adjusting bolt, 8-thrust spring, 9-waveguide, 10-waveguide flange, 11-front positioning pin, 12-testing bin, 13-testing block area, 14-positioning hole, 15-main guide shaft, 16-rear positioning pin and 17-locking and unlocking device
Detailed Description
As shown in figure 1, a base 1 is a foundation for bearing the device of the invention, and the bottom of the base 1 is provided with adjustable horizontal adjustment supporting legs 2, so that the height, the parallelism and the like of the base can be conveniently adjusted. The upper portion of the base 1 is provided with a waveguide support 6, the upper end of the waveguide support 6 is provided with a waveguide flange 10 at the end portion of a waveguide 9, the base 1 is further provided with a guide rail 3 and a longitudinal adjusting pressing block 5 which are of a dovetail structure, the longitudinal adjusting sliding block 4 is enabled to longitudinally move on the sliding rail 3 through an adjusting bolt 7, and therefore the longitudinal adjusting pressing block 5 is limited and adjusted, and the parallelism of the adjusting pressing block 5 and the test bin 12 is improved.
During testing, a required installation waveguide 9 is selected, a waveguide flange 10 is combined with a front positioning pin 11 on a waveguide support 6, a module to be tested is placed into a testing bin 12, a locking and unlocking device 17 is manually adjusted, so that a longitudinal movement pressing block 5 moves towards the front side along a main guide shaft 15, a rear positioning pin 16 on the longitudinal movement pressing block 5 is inserted into a positioning hole 14 of the testing bin 12, the testing bin 12 is driven to move forwards until the front positioning pin 11 is inserted into the positioning hole 14 of the testing bin 12, the testing bin 12 is tightly close to the waveguide flange 10, and fine adjustment is carried out through an adjusting bolt 7 so that a longitudinal adjustment sliding block 4 compresses the lower part of the longitudinal adjustment pressing block 5.
After the test is finished, the locking and unlocking device 17 is adjusted to unlock, the test bin 12 is pushed out under the action of the thrust spring 8, the tested module is taken down by the small sucker, and the test work is finished.

Claims (6)

1. The utility model provides a material dielectric property waveguide test fast loading and unloading device which characterized in that: the device is provided with a guide rail (3), a waveguide bracket (6), a longitudinal adjusting pressing block (5), a test bin (12) and a capstan shaft (15) on a base (1), wherein the waveguide bracket (6) is arranged at the front side of the guide rail (3), a main guide shaft (15) parallel to the guide rail (3) and a front positioning pin (11) are arranged on the waveguide bracket (6), the waveguide (9) extends out from the front side of the waveguide bracket (6), the waveguide bracket (6) is matched and installed with the waveguide flange (10) through the front positioning pin (11), a test bin (12) is sleeved on the main guide shaft (15), the longitudinal adjusting pressing block (5) is arranged on the guide rail (3) in a matching way, the main guide shaft (15) penetrates through the test bin (12) and the longitudinal adjusting pressing block (5) and then is in threaded connection with the locking and unlocking device (17), and the longitudinal adjusting pressing block (5) is provided with a rear positioning pin (16); a backward acting force is provided for the test bin (12) through a pressure structure, the pressure structure is a thrust spring (8), is sleeved on the main guide shaft (15), and is arranged between the waveguide bracket (6) and the test bin (12) in a pre-compression mode; the test bin (12) is provided with a positioning hole (14), and the front side and the rear side of the test bin are respectively matched with the front positioning pin (11) and the rear positioning pin (16); during testing, the longitudinal adjusting pressing block (5) and the testing bin (12) are pressed onto the waveguide bracket (6) by rotating the locking and unlocking device (17).
2. The material dielectric property waveguide test fast handler of claim 1, characterized by: the lower part of the base (1) is also provided with a horizontal adjusting supporting leg (2).
3. The material dielectric property waveguide test fast handler of claim 1, characterized by: the guide rail (3) is also provided with a longitudinal adjusting sliding block (4) in a matching way, and the waveguide bracket (6) is connected with an adjusting bolt (7) in a threaded way to adjust the position of the longitudinal adjusting sliding block (4).
4. The material dielectric property waveguide test fast handler of claim 1, characterized by: different types of waveguides (9) are arranged in the waveguide bracket (6) according to the test requirement.
5. The material dielectric property waveguide test fast handler of claim 1, characterized by: test bins (12) having different block areas (13) are selected according to test requirements.
6. The material dielectric property waveguide test fast handler of claim 1, characterized by: the number of the front positioning pins (11) and the number of the rear positioning pins (16) are multiple.
CN201910661389.7A 2019-07-22 2019-07-22 Quick assembling and disassembling device for waveguide test of dielectric property of material Active CN110568267B (en)

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CN110568267B true CN110568267B (en) 2021-12-03

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CN106353540A (en) * 2016-11-22 2017-01-25 贵州航天计量测试技术研究所 Test fixture for low pass filter
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