CN106353540A - Test fixture for low pass filter - Google Patents
Test fixture for low pass filter Download PDFInfo
- Publication number
- CN106353540A CN106353540A CN201611026191.4A CN201611026191A CN106353540A CN 106353540 A CN106353540 A CN 106353540A CN 201611026191 A CN201611026191 A CN 201611026191A CN 106353540 A CN106353540 A CN 106353540A
- Authority
- CN
- China
- Prior art keywords
- test fixture
- circuit board
- low pass
- pass filter
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 39
- 238000012806 monitoring device Methods 0.000 claims abstract description 9
- 238000013016 damping Methods 0.000 claims abstract description 4
- 241000269799 Perca fluviatilis Species 0.000 claims description 17
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims 1
- 230000003044 adaptive effect Effects 0.000 abstract 4
- 230000003139 buffering effect Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 239000006173 Good's buffer Substances 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Abstract
The invention discloses a test fixture for a low pass filter. The test fixture comprises a micrometer sliding table, an adaptive base, a circuit board and a flat spring fixture, wherein a groove is arranged on an upper end face of the adaptive base; a lower end face of the adaptive base is fixedly connected with the micrometer sliding table; the micrometer sliding table is fixed on the base and is capable of adjusting X and Y directions of the adaptive base; the circuit board and a positioning plate are fixedly arranged in the groove from bottom to top; the circuit board is connected with a monitoring device through a wire; the flat spring fixture is fixedly connected with a slide plate; the slide plate is connected with a rear lateral plate through two damping shafts and is capable of moving along the axial direction of a slide rail; a limiting groove for accommodating a detected filter is arranged on the positioning plate; after downward moving, the flat spring fixture is directly faced to the limiting groove. Under the buffering function of the flat spring fixture, the test fixture provided by the invention can prevent the detected component from being damaged by hard pressing. The test fixture can be mounted in the manner of adopting the positioning plate for limiting the position of the detected component and pressing by the flat spring fixture, so that high test efficiency and test result precision can be guaranteed.
Description
Technical field
The invention belongs to electronic component testing apparatus technical field, it is related to a kind of low pass filter test fixture.
Background technology
Passive low ventilating filter (as lfcn-320), in 320mhz, due to being microwave device, size is relatively for its operating frequency
Little, generally using the method being directly welded in p-wire on device during test, welding and special appearance when size is less, cannot be completed
Easily short circuit, this method of testing has serious deficiency, destroys the attribute of device itself during welding, and time-consuming
Arduously, test process easily malfunctions, and cannot easily complete the test of device at all, there is presently no corresponding fixture and is surveyed
Examination.
Content of the invention
The technical problem to be solved in the present invention is: provides a kind of low pass filter test fixture, is capable of wave filter device
Not damaged during part test, contact are good, not short-circuit, operation reliability and test data accurately, it is time saving and energy saving to test, existing to overcome
Problem present in technology.
The technical scheme that the present invention takes is: a kind of low pass filter test fixture, including micrometer slide unit, adapted seat,
Circuit board, tabletting spring perch, the setting of adapted seat upper surface is fluted, and its lower surface is fixedly connected on micrometer slide unit, and thousand
Point chi slide unit is fixed on base and can be to the xy of adapted seat to being adjusted, and in groove, fixed placement has successively from top to bottom
Circuit board and location-plate, circuit board is wired to monitoring device, and tabletting spring perch is fixedly connected on slide plate, slide plate
It is connected on back side panel by two damping shafts and can move axially along slide rail, location-plate is provided with the limit placing tested wave filter
Position groove, tabletting spring perch move down after just to stopper slot.
Preferably, it is connected with the quick-locking mechanism with self-locking above above-mentioned slide plate, quick-locking mechanism passes through to support
Plate is fixedly connected on back side panel, and back side panel lower end is fixedly connected on base, and the quick-locking mechanism with self-locking can be by
After slide plate pushes down on, tabletting spring perch can abut to tested wave filter on circuit board.
Preferably, above-mentioned tabletting spring perch includes depression bar, spring and base plate, and depression bar is placed in the hole at baseplate underside center
In, its upper end is connected with spring, and spring upper end is resisted against bottom hole portion, and depression bar is scalable in the hole.
Preferably, foregoing circuit plate is connected to monitoring device by sma joint, and sma joint is fixedly connected on adapted seat
On, the inner core of sma joint is connected with circuit board.
Preferably, foregoing circuit plate upper surface is printed circuit, and lower surface coats one layer of copper.
Preferably, above-mentioned gripper shoe is connected on back side panel by vertical bar hole.
Preferably, above-mentioned slide rail two ends are fixedly connected on slide track seat.
Preferably, it is provided with the deflation mechanism of fastening wave filter in above-mentioned stopper slot, tighten the Ya Ke using elasticity for the mechanism
Power panel material makes.
Beneficial effects of the present invention: compared with prior art, tested filter device is placed in stopper slot the present invention,
Tabletting spring perch is pressed measured device, measured device pin keeps closely being connected with circuit board, by tabletting spring perch
Cushioning effect, it is to avoid measured device presses the damage causing firmly, device can be tested, adopt after connecting related monitoring device
With the mode that location-plate defined position, tabletting spring perch push, microwave device is installed, is capable of quickly loading and unloading and testing,
Testing efficiency and test result high precision, adapted seat using micrometer slide unit be capable of its xy to accurate adjustment, on the one hand
It is easy to the pin of the measured device contact point just to circuit board, on the other hand it is also possible to adapt to the wave filter of different size pin
Test, test scope is wider, self-align to measured device using having the stopper slot tightening mechanism using moving up and down, and protects
Demonstrate,prove the entirely electrical connection of measured device and circuit board, decreased the decay of power, the present invention has also had that structure is simple, cost
Low and load and unload efficiently feature easy to maintenance.
Brief description
Fig. 1 is the forward sight structural representation of the present invention；
Fig. 2 is the left view structural representation of the present invention；
Fig. 3 is a portion mplifying structure schematic diagram in Fig. 1 of the present invention；
Fig. 4 is the positioning plate structure schematic diagram of the present invention.
Specific embodiment
Below in conjunction with the accompanying drawings and specific embodiment is described further to the present invention.
Embodiment: as Figure 1-Figure 4, a kind of low pass filter test fixture, including micrometer slide unit 2, adapted seat 3,
Circuit board 4, tabletting spring perch 5, adapted seat 3 upper surface setting fluted 12, its lower surface is fixedly connected on micrometer slide unit 2
On, micrometer slide unit 2 is fixed on base 1 and can be to the xy of adapted seat 3 to being adjusted, in groove 12 from top to bottom successively
Fixed placement has circuit board 4 and location-plate 9, and circuit board 4 is wired to monitoring device, and tabletting spring perch 5 is fixing even
It is connected on slide plate 10, slide plate 10 is connected on back side panel 7 by two damping shafts 13 and can move axially along slide rail 13, location-plate 9
On be provided with the stopper slot 6 placing tested wave filter, tabletting spring perch 5 move down after just to stopper slot 6.
Preferably, it is connected with the quick-locking mechanism 8 with self-locking above above-mentioned slide plate 10, quick-locking mechanism 8 passes through
Gripper shoe 17 is fixedly connected on back side panel 7, and back side panel 7 lower end is fixedly connected on base 1, has the quick locking machine of self-locking
After slide plate 10 can be pushed down on by structure 8, tabletting spring perch 5 can abut to tested wave filter on circuit board 4, using certainly
Slide plate can quickly be moved up and down and lock-bit by the quick-locking mechanism 8 of lock, allows measured device to connect relatively reliable,
Substantially increase testing efficiency and measuring accuracy.
Preferably, above-mentioned tabletting spring perch 6 includes depression bar 14, spring 15 and base plate 16, and depression bar 14 is placed under base plate 16
In the hole at side center, its upper end is connected with spring 15, and spring 15 upper end is resisted against bottom hole portion, and depression bar 14 is scalable in the hole, knot
Structure is simple, good buffer effect, makes simple, low cost.
Preferably, foregoing circuit plate 4 is connected to monitoring device by sma joint 11, and sma joint 11 is fixedly connected on adaptation
On seat 3, the inner core of sma joint 11 is connected with circuit board 4, the joint being provided with monitoring device by standard sma joint can be very
Smoothly match it is ensured that in test process microwave signal quality, without multiple conversion test cable simultaneously when testing, make
The more stable reliability of data of test, concordance is good.
Preferably, above-mentioned location-plate 9 by screw, circuit board 4 is fixed in adapted seat 2 in the lump, location-plate 9 spacing
Groove 6, just to measured device pins contact point on circuit board 4, ensure that connection is reliable, easy to loading and unloading.
Preferably, foregoing circuit plate 4 upper surface is printed circuit, and lower surface coats one layer of copper, it is possible to increase contact area,
Ensure that sufficiently large contact area, improve the capacity of resisting disturbance of test, make the more stable reliability of test data.
Preferably, above-mentioned gripper shoe 17 is connected on back side panel 7 by vertical bar hole 18, and strip through-hole is conveniently adjusted cunning
The height of plate movement is it is ensured that optimum distance that measured device is loaded and unloaded.
Preferably, above-mentioned slide rail 13 two ends are fixedly connected on slide track seat 19.
Preferably, it is provided with the deflation mechanism 20 of fastening wave filter in above-mentioned stopper slot 6, tighten mechanism 20 using elasticity
Acrylic board material makes, staggered relatively using two panels, and every elastic acrylic board is wavelike structure, simple by structure
The acrylic board pressing measured device of elasticity, allows measured device can navigate to specified location, it is to avoid tested device during depression bar pressing
The deviation of part position.
Preferably, foregoing circuit plate 4 is provided with conducting resinl, conducting resinl is placed in stopper slot 6, and conducting resinl prevents tested device
Part and circuit board directly contact and damage device by pressure.
The above, the only specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, and any
Those familiar with the art the invention discloses technical scope in, change or replacement can be readily occurred in, all should contain
Cover within protection scope of the present invention, therefore, protection scope of the present invention should be defined by described scope of the claims.
Claims (8)
1. a kind of low pass filter test fixture it is characterised in that: include micrometer slide unit (2), adapted seat (3), circuit board
(4), tabletting spring perch (5), adapted seat (3) upper surface arranges fluted (12), and its lower surface is fixedly connected on micrometer and slides
On platform (2), micrometer slide unit (2) is fixed on that base (1) is upper and can be to adapted seat (3) xy to being adjusted, and groove (12) is interior
Fixed placement has circuit board (4) and location-plate (9) successively from top to bottom, and circuit board (4) is wired to monitoring device, pressure
Flat spring fixture (5) is fixedly connected on slide plate (10), and slide plate (10) is connected on back side panel (7) simultaneously by two damping shafts (13)
Can move axially along slide rail (13), location-plate (9) is provided with the stopper slot (6) placing tested wave filter, tabletting spring perch
(5) just to stopper slot (6) after moving down.
2. a kind of low pass filter test fixture according to claim 1 it is characterised in that: slide plate is connected with above (10)
There is the quick-locking mechanism (8) of self-locking, quick-locking mechanism (8) is fixedly connected on back side panel (7) by gripper shoe (17),
Back side panel (7) lower end is fixedly connected on base (1), and the quick-locking mechanism (8) with self-locking can by slide plate (10) downwards
After promotion, tabletting spring perch (5) can abut to tested wave filter on circuit board (4).
3. a kind of low pass filter test fixture according to claim 1 it is characterised in that: tabletting spring perch (6) bag
Include depression bar (14), spring (15) and base plate (16), depression bar (14) is placed in the hole at center on the downside of base plate (16), and its upper end is connected with
Spring (15), spring (15) upper end is resisted against bottom hole portion, and depression bar (14) is scalable in the hole.
4. a kind of low pass filter test fixture according to claim 1 it is characterised in that: circuit board (4) is connect by sma
Head (11) be connected to monitoring device, sma joint (11) is fixedly connected in adapted seat (3), the inner core of sma joint (11) with electricity
Road plate (4) connects.
5. a kind of low pass filter test fixture according to claim 1 it is characterised in that: circuit board (4) upper surface is
Printed circuit, lower surface coats one layer of copper.
6. a kind of low pass filter test fixture according to claim 2 it is characterised in that: gripper shoe (17) is passed through vertically
Bar hole (18) is connected on back side panel (7).
7. a kind of low pass filter test fixture according to claim 1 it is characterised in that: slide rail (13) two ends are fixing even
It is connected on slide track seat (19).
8. a kind of low pass filter test fixture according to claim 1 it is characterised in that: stopper slot is provided with (6)
The deflation mechanism (20) of fastening wave filter, is tightened mechanism (20) and is made using the acrylic board material of elasticity.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611026191.4A CN106353540A (en) | 2016-11-22 | 2016-11-22 | Test fixture for low pass filter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611026191.4A CN106353540A (en) | 2016-11-22 | 2016-11-22 | Test fixture for low pass filter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106353540A true CN106353540A (en) | 2017-01-25 |
Family
ID=57862536
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611026191.4A Pending CN106353540A (en) | 2016-11-22 | 2016-11-22 | Test fixture for low pass filter |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106353540A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107688105A (en) * | 2017-08-14 | 2018-02-13 | 杜俊慧 | A kind of height-adjustable test device of surface-mounted integrated circuit |
| CN107907826A (en) * | 2017-11-03 | 2018-04-13 | 东莞市北扬工业设计有限公司 | A kind of device for elevator button quality testing |
| CN108732482A (en) * | 2018-07-09 | 2018-11-02 | 西安派瑞功率半导体变流技术股份有限公司 | High-power IGCT device test fixtures slide unit detent mechanism |
| CN110568267A (en) * | 2019-07-22 | 2019-12-13 | 中国航空工业集团公司济南特种结构研究所 | Quick assembling and disassembling device for waveguide test of dielectric property of material |
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| GB2335548A (en) * | 1998-03-20 | 1999-09-22 | Capital Formation Inc | Floating spring probe pcb test fixture |
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| CN105044402A (en) * | 2015-08-25 | 2015-11-11 | 贵州航天计量测试技术研究所 | Encapsulated micro-wave voltage-controlled oscillator test device |
| CN105158525A (en) * | 2015-08-25 | 2015-12-16 | 贵州航天计量测试技术研究所 | Test bench for microwave power divider |
| CN206300974U (en) * | 2016-11-22 | 2017-07-04 | 贵州航天计量测试技术研究所 | A kind of low pass filter test fixture |
-
2016
- 2016-11-22 CN CN201611026191.4A patent/CN106353540A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| GB2335548A (en) * | 1998-03-20 | 1999-09-22 | Capital Formation Inc | Floating spring probe pcb test fixture |
| CN201145728Y (en) * | 2007-11-27 | 2008-11-05 | 比亚迪股份有限公司 | Apparatus for testing chip |
| CN203117226U (en) * | 2013-01-15 | 2013-08-07 | 西门子数控（南京）有限公司 | Test fixture |
| CN204269684U (en) * | 2014-12-09 | 2015-04-15 | 杭州华扬电子有限公司 | IC product test frock |
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| CN206300974U (en) * | 2016-11-22 | 2017-07-04 | 贵州航天计量测试技术研究所 | A kind of low pass filter test fixture |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107688105A (en) * | 2017-08-14 | 2018-02-13 | 杜俊慧 | A kind of height-adjustable test device of surface-mounted integrated circuit |
| CN107907826A (en) * | 2017-11-03 | 2018-04-13 | 东莞市北扬工业设计有限公司 | A kind of device for elevator button quality testing |
| CN108732482A (en) * | 2018-07-09 | 2018-11-02 | 西安派瑞功率半导体变流技术股份有限公司 | High-power IGCT device test fixtures slide unit detent mechanism |
| CN108732482B (en) * | 2018-07-09 | 2023-12-29 | 西安派瑞功率半导体变流技术股份有限公司 | High-power IGCT device test fixture sliding table positioning mechanism |
| CN110568267A (en) * | 2019-07-22 | 2019-12-13 | 中国航空工业集团公司济南特种结构研究所 | Quick assembling and disassembling device for waveguide test of dielectric property of material |
| CN110568267B (en) * | 2019-07-22 | 2021-12-03 | 中国航空工业集团公司济南特种结构研究所 | Quick assembling and disassembling device for waveguide test of dielectric property of material |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170125 |
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| RJ01 | Rejection of invention patent application after publication |