CN214750458U - Test jig for circuit board - Google Patents
Test jig for circuit board Download PDFInfo
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- CN214750458U CN214750458U CN202121254479.3U CN202121254479U CN214750458U CN 214750458 U CN214750458 U CN 214750458U CN 202121254479 U CN202121254479 U CN 202121254479U CN 214750458 U CN214750458 U CN 214750458U
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Abstract
The utility model provides a test rack for a circuit board, which comprises a base, wherein a bearing platform for placing the circuit board is arranged on the base, a movable rack which can move longitudinally is arranged on the upper side of the bearing platform, and a clamping component for fixing a probe card is arranged on the movable rack; the two clamping assemblies are arranged on the lower side surface of the movable frame in a mode that the clamping direction is vertical; the clamping assembly comprises a fixed flange, a movable flange and a first driving piece, wherein the fixed flange and the movable flange are arranged on the movable frame; the probe board is distributed between the fixed flange and the movable flange; the clamping direction is from the movable flange to the fixed flange; the fixed flange and the movable flange are both provided with a first clamping groove for clamping a probe plate, and the lower side surfaces of the fixed flange and the movable flange are both provided with a first compression screw in a penetrating way; when the probe board is clamped in the first clamping groove, the first compression screw is abutted to the probe board. The utility model discloses convenient to use can test the circuit board of different specifications.
Description
Technical Field
The utility model relates to a circuit board detects technical field, particularly, relates to a test jig for circuit board.
Background
Circuit boards, also known as printed circuit boards, are important electronic components, support bodies for electronic components, and carriers for electrical connection of electronic components. Because it is manufactured by electronic printing, so called "printed" circuit board is a very important link in the electronic manufacturing industry, and the circuit board needs to be tested for on-off of each circuit in production.
Chinese patent publication No. CN207817189U discloses an electricity meter circuit board testing jig, which comprises a bottom plate, wherein a placing plate, a supporting rod and a control cabinet are arranged on the top of the bottom plate, the supporting rod is arranged on one side of the placing plate, the control cabinet is arranged on one side of the supporting rod, a placing groove is arranged on the placing plate, a plurality of springs are arranged in the placing groove, a bearing plate is arranged on the tops of the springs, an elastic plate is arranged on the top of the bearing plate, a motor is fixedly arranged on the top of the side surface of the supporting rod, a lead screw is arranged at the bottom end of the motor, a probe plate is sleeved on the outer side of the lead screw, the utility model sets time by electrifying the motor so as to prevent the probe from being broken due to excessive descending distance, and when the electricity meter circuit board to be detected receives excessive pressure, the springs in the placing groove can be shortened, and the elastic plate made of rubber materials can also be deformed, therefore, the pressure on the electric meter circuit board to be detected is effectively reduced.
However, the above patent adopts a compression deformation mode of the spring and the elastic plate to prevent the circuit board from being excessively pressed, so that the circuit board can be prevented from being damaged due to excessive pressing to a certain extent, but the elastic plate made of the spring and the rubber material does not only longitudinally deform when being pressed to deform, and also transversely deforms, so that when the spring or the elastic plate deforms, the circuit board placed on the elastic plate can deviate in position along with the deformation of the spring or the elastic plate, so that a detection point on the circuit board is dislocated relative to the probe, and the accuracy of a detection result is influenced; moreover, the above patents are difficult to test circuit boards of different specifications, and meanwhile, the cantilever-shaped probe board makes the stress on each part uneven when the probe board contacts with the circuit board, which may cause bad contact, thereby affecting the test effect.
SUMMERY OF THE UTILITY MODEL
To the deficiency of the prior art, an object of the utility model is to provide a test jig for circuit board, its simple structure can test the circuit board of different specifications.
The embodiment of the utility model discloses a realize through following technical scheme:
a test jig for a circuit board comprises a base, wherein a bearing table for placing the circuit board is arranged on the base, a movable frame capable of moving longitudinally is arranged on the upper side of the bearing table, and a clamping assembly for fixing a probe board is arranged on the movable frame; the two clamping assemblies are arranged on the lower side surface of the movable frame in a mode that the clamping direction is vertical; the clamping assembly comprises a fixed flange, a movable flange and a first driving piece, wherein the fixed flange and the movable flange are arranged on the movable frame, and the first driving piece is used for driving the movable flange; the probe board is distributed between the fixed retaining edge and the movable retaining edge; the clamping direction is from the movable flange to the fixed flange; the fixed retaining edge and the movable retaining edge are respectively provided with a first clamping groove for clamping the probe plate, and the lower side surfaces of the fixed retaining edge and the movable retaining edge are respectively provided with a first compression screw in a penetrating manner; when the probe board is clamped in the first clamping groove, the first compression screw is abutted to the probe board.
According to a preferred embodiment, the first driving member comprises a fixed block arranged on the movable frame, a screw rod penetrates through the fixed block, and one end of the screw rod is hinged to the movable flange.
According to a preferred embodiment, the probe card is distributed between the moving frame and the circuit board; the side surface of the probe board close to the circuit board is provided with a pressure measuring head and a plurality of probe heads; the pressure measuring head comprises a fixing section arranged on the probe board and an adjusting section embedded in the fixing section, and the adjusting section is in threaded connection with the fixing section; the end part of the adjusting section, which is close to the circuit board, is provided with a pressure sensor.
According to a preferred embodiment, the base is provided with two parallel guide rods, and the moving frame and the bearing platform are distributed between the two guide rods; the removal frame includes vertical board and circumference board, the circumference board is close to the plummer distributes, wherein: the end part of the longitudinal plate is connected with the guide rod adjacent to the longitudinal plate in a sliding manner, two arc-shaped holes are symmetrically formed in the longitudinal plate, two adjusting rods which correspond to the two arc-shaped holes one by one are arranged on the circumferential plate, and the adjusting rods correspondingly penetrate through the arc-shaped holes; nuts are arranged on the adjusting rods, and the longitudinal plates are distributed between the circumferential plates and the nuts; the two arc-shaped holes are distributed on the same circumference; the clamping assembly is arranged on the lower side face of the circumferential plate.
According to a preferred embodiment, a connecting plate is arranged between the two guide rods and is distributed above the longitudinal plate; and a second driving piece is arranged between the connecting plate and the longitudinal plate.
According to a preferred embodiment, the upper surface of the bearing table is provided with a limiting block in a one-to-one correspondence manner with the fixed flange, the limiting block is provided with a second clamping groove for clamping the circuit board, and the upper side surface of the limiting block is provided with a second compression screw in a penetrating manner; when the circuit board is clamped in the second clamping groove, the second compression screw is abutted to the circuit board.
According to a preferred embodiment, the upper surface of the carrier is provided with a plurality of spacers.
The utility model discloses technical scheme has following advantage and beneficial effect at least:
(1) the utility model discloses the flange cooperation is moved in deciding of setting up and the flange forms the location to the probe card and presss from both sides tightly, and two clamping components arrange according to the tight vertically mode of clamp for the probe card is fixed by the accuracy in the ascending position of horizontal direction.
(2) The utility model discloses an use the adjustable distance of deciding between the flange and moving the flange of first driving piece to make the probe card of the different specifications of mountable on removing the frame, and then make this test jig can test the circuit board of different specifications.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a schematic front view of the present invention;
FIG. 2 is a schematic view of the bottom view of the probe card in cooperation with the movable frame of the present invention;
FIG. 3 is a schematic top view of the probe card in cooperation with the movable frame of the present invention;
FIG. 4 is a schematic top view of the circuit board of the carrier platform of the present invention;
fig. 5 is a schematic structural diagram of the middle pressure measuring head of the present invention.
Icon: 1-base, 2-bearing platform, 3-circuit board, 4-limiting block, 5-second compression screw, 6-guide rod, 7-lead screw, 8-fixed block, 9-movable flange, 10-first compression screw, 11-pressure measuring head, 111-fixed segment, 112-adjusting segment, 113-pressure sensor, 12-probe head, 13-probe board, 14-fixed flange, 15-adjusting rod, 16-nut, 17-longitudinal board, 18-second driving piece, 19-connecting board, 20-circumferential board, 21-arc hole, 22-slide hole and 23-gasket.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention, as generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the accompanying drawings, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that, if the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" and the like indicate the position or positional relationship based on the position or positional relationship shown in the drawings, or the position or positional relationship which is usually placed when the product of the present invention is used, the description is only for convenience of description and simplification, but the indication or suggestion that the device or element to be referred must have a specific position, be constructed and operated in a specific position, and thus, cannot be understood as a limitation of the present invention.
In the description of the present invention, it should be further noted that unless otherwise explicitly stated or limited, the terms "disposed," "mounted," "connected," and "connected" should be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1 to 5, a test rack for a circuit board includes a base 1, a carrier 2 for placing a circuit board 3 is disposed on the base 1, a movable rack capable of moving longitudinally is disposed on the upper side of the carrier 2, and a clamping assembly for fixing a probe card 13 is disposed on the movable rack. As shown in fig. 2, two clamping units are provided on the lower side of the moving frame in such a manner that the clamping direction is perpendicular. The clamping assembly comprises a fixed flange 14 arranged on the moving frame, a movable flange 9 and a first driving piece for driving the movable flange 9. The probe card 13 is distributed between the fixed retaining rim 14 and the movable retaining rim 9. The clamping direction is directed from the moving rib 9 to the fixed rib 14. In this embodiment, the fixed retaining edge 14 cooperates with the movable retaining edge 9 to form a positioning clamp for the probe card 13, and the two clamping assemblies are arranged in a manner that the clamping direction is perpendicular, so that the position of the probe card 13 in the horizontal direction is accurately fixed. In this embodiment, the distance between the fixed retaining edge 14 and the movable retaining edge 9 can be adjusted by using the first driving member, so that probe cards 13 with different specifications can be mounted on the movable rack, and the test rack can test circuit boards 3 with different specifications. Further, as shown in fig. 1 and 2, the fixed flange 14 and the movable flange 9 are both provided with a first clamping groove for clamping the probe card 13, and the respective lower side surfaces of the fixed flange 14 and the movable flange 9 are both provided with a first compression screw 10 in a penetrating manner. When the probe card 13 is clamped in the first clamping groove, the first compression screw 10 abuts against the probe card 13. After the probe board 13 installed in the first card slot is determined in the horizontal direction, the first compression screw 10 is screwed to enable the probe board 13 to abut against the upper bottom surface of the first card slot in the first card slot, so that the probe board 13 is fixed in the horizontal and vertical directions, the spatial position of the probe board 13 on the movable frame is fixed, the probe board 13 is convenient to correspond to the circuit board 3, and the subsequent test work can be conveniently carried out.
Preferably, as shown in fig. 1 and 2, the first driving member includes a fixed block 8 disposed on the moving frame, a screw rod 7 is disposed on the fixed block 8 in a penetrating manner, and one end of the screw rod 7 is hinged to the moving flange 9. In this embodiment, the screw rod 7 is connected with the fixed block 8 by a screw thread, a rotating wheel is arranged at the other end of the screw rod 7, and a handle is arranged on the rotating wheel. The screw rod 7 is rotated through a handle to drive the movable retaining edge 9 to be close to or far away from the fixed retaining edge 14, so that the probe board 13 is clamped and disassembled. As shown in fig. 1, the movable rib 9 is slidably attached to the lower surface of the movable frame, and the first engaging grooves of the fixed rib 14 and the movable rib 9 have the same height.
In this embodiment, the probe card 13 is disposed between the movable frame and the circuit board 3. The side of the probe card 13 close to the circuit board 3 is provided with a pressure measuring head 11 and a plurality of probe heads 12. The pressure measuring head 11 is used for measuring the test pressure of the probe head 12 on the circuit board 3, and the moving distance of the moving frame is controlled by feeding back pressure data. Further, as shown in fig. 5, the pressure measuring head 11 includes a fixing section 111 disposed on the probe card 13, and an adjusting section 112 embedded in the fixing section 111, wherein the adjusting section 112 is in threaded connection with the fixing section 111; the end of the adjustment segment 112 near the circuit board 3 is provided with a pressure sensor 113. The length of the pressure measuring head 11 can be adjusted by rotating the adjusting section 112 to make it move relatively to the fixing section 111 in the axial direction, so that the length of the pressure measuring head is matched with the length of the probe head 12, pressure data of the probe head 12 can be fed back accurately, and the circuit board 3 is prevented from being pressed too much.
As shown in fig. 1, two parallel guide rods 6 are disposed on the base 1, and the movable frame and the platform 2 are equally distributed between the two guide rods 6. As shown in fig. 2 and 3, the movable frame comprises a longitudinal plate 17 and a circumferential plate 20, the circumferential plate 20 being distributed close to the carrier table 2, wherein: the end of the longitudinal plate 17 is provided with a sliding hole 22, the end of the longitudinal plate 17 is slidably connected with the adjacent guide rod 6 through the sliding hole 22, and specifically, the guide rod 6 is inserted into the sliding hole 22. In order to avoid errors, the position of the probe board 13 relative to the circuit board 3 in the circumferential direction can be finely adjusted, two arc-shaped holes 21 are symmetrically arranged on the longitudinal board 17, two adjusting rods 15 corresponding to the two arc-shaped holes 21 one by one are arranged on the circumferential board 20, and the adjusting rods 15 correspondingly penetrate through the arc-shaped holes 21. A nut 16 is arranged on the adjusting rod 15, and a longitudinal plate 17 is distributed between the circumferential plate 20 and the nut 16. The two arc-shaped holes 21 are distributed on the same circumference. The clamping assembly is provided on the underside of the circumferential plate 20. In use, the nut 16 is loosened and the peripheral plate 20 is rotated so that the probe head 12 on the probe card 13 is aligned with the test point on the circuit board 3 by tightening the nut 16.
As shown in fig. 1, a connecting plate 19 is arranged between the two guide rods 6, and the connecting plate 19 is distributed above the longitudinal plates 17. A second drive member 18 is arranged between the link plate 19 and the longitudinal plate 17. In this embodiment, the second driving member 18 may be any one of an electric rod, a hydraulic cylinder, or an air cylinder. Preferably, the second driving member 18 is an electric lever. It should be noted that a single chip microcomputer is arranged on the connecting plate 19, and the single chip microcomputer is electrically connected with the second driving member 18 and the pressure sensor 113 respectively. When the pressure sensor 113 feeds back a pressure value exceeding the set value, the single chip microcomputer controls the second driving member 18 to stop driving.
As shown in fig. 4, the upper surface of the bearing table 2 is provided with a limiting block 4 in a one-to-one correspondence manner with the fixed flanges 14, the limiting block 4 is provided with a second clamping groove for clamping the circuit board 3, and the upper side surface of the limiting block 4 is provided with a second compression screw 5 in a penetrating manner. When the circuit board 3 is clamped in the second clamping groove, the second compression screw 5 is abutted to the circuit board 3. Further, the upper surface of the carrier 2 is provided with a plurality of spacers 23. In this embodiment, the gasket 23 is made of rubber. The circuit board 3 can be prevented from being scratched, the friction force between the circuit board 3 and the bearing table 2 is increased, and the circuit board is prevented from being displaced when being pressed.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes will occur to those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. The utility model provides a test jig for circuit board which characterized in that: the probe board fixing device comprises a base (1), wherein a bearing table (2) used for placing a circuit board (3) is arranged on the base (1), a movable frame capable of moving longitudinally is arranged on the upper side of the bearing table (2), and a clamping assembly used for fixing a probe board (13) is arranged on the movable frame;
the two clamping assemblies are arranged on the lower side surface of the movable frame in a mode that the clamping direction is vertical;
the clamping assembly comprises a fixed flange (14) arranged on the moving frame, a movable flange (9) and a first driving piece for driving the movable flange (9); the probe plates (13) are distributed between the fixed retaining sides (14) and the movable retaining sides (9);
the clamping direction is directed to the fixed flange (14) from the movable flange (9);
the fixed retaining side (14) and the movable retaining side (9) are respectively provided with a first clamping groove for clamping the probe plate (13), and the lower side surfaces of the fixed retaining side (14) and the movable retaining side (9) are respectively provided with a first compression screw (10) in a penetrating manner;
when the probe board (13) is clamped in the first clamping groove, the first compression screw (10) is abutted to the probe board (13).
2. The test rack for circuit boards according to claim 1, wherein: the first driving piece comprises a fixing block (8) arranged on the moving frame, a screw rod (7) penetrates through the fixing block (8), and one end of the screw rod (7) is hinged to the moving flange (9).
3. The test rack for circuit boards according to claim 1 or 2, characterized in that: the probe cards (13) are distributed between the moving frame and the circuit board (3); the side surface of the probe board (13) close to the circuit board (3) is provided with a pressure measuring head (11) and a plurality of probe heads (12);
the pressure measuring head (11) comprises a fixing section (111) arranged on the probe board (13) and an adjusting section (112) embedded in the fixing section (111), and the adjusting section (112) is in threaded connection with the fixing section (111); the end part of the adjusting section (112) close to the circuit board (3) is provided with a pressure sensor (113).
4. The test rack for circuit boards according to claim 1, wherein: the base (1) is provided with two parallel guide rods (6), and the moving frame and the bearing platform (2) are distributed between the two guide rods (6);
the mobile frame comprises a longitudinal plate (17) and a circumferential plate (20), the circumferential plate (20) being distributed close to the carrier table (2), wherein:
the end part of the longitudinal plate (17) is connected with the guide rod (6) adjacent to the longitudinal plate in a sliding manner, two arc-shaped holes (21) are symmetrically formed in the longitudinal plate (17), two adjusting rods (15) which correspond to the two arc-shaped holes (21) one by one are arranged on the circumferential plate (20), and the adjusting rods (15) correspondingly penetrate through the arc-shaped holes (21); a nut (16) is arranged on the adjusting rod (15), and the longitudinal plate (17) is distributed between the circumferential plate (20) and the nut (16); the two arc-shaped holes (21) are distributed on the same circumference;
the clamping assembly is arranged on the lower side of the circumferential plate (20).
5. The test rack for circuit boards according to claim 4, wherein: a connecting plate (19) is arranged between the two guide rods (6), and the connecting plate (19) is distributed above the longitudinal plate (17);
a second drive element (18) is arranged between the connecting plate (19) and the longitudinal plate (17).
6. The test rack for circuit boards according to claim 1, wherein: the upper surface of the bearing table (2) is provided with a limiting block (4) in a one-to-one correspondence manner with the fixed flanges (14), the limiting block (4) is provided with a second clamping groove for clamping the circuit board (3), and the upper side surface of the limiting block (4) is provided with a second compression screw (5) in a penetrating manner;
when the circuit board (3) is clamped in the second clamping groove, the second compression screw (5) is abutted to the circuit board (3).
7. The test rack for circuit boards according to claim 6, wherein: the upper surface of plummer (2) disposes a plurality of gasket (23).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121254479.3U CN214750458U (en) | 2021-06-04 | 2021-06-04 | Test jig for circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121254479.3U CN214750458U (en) | 2021-06-04 | 2021-06-04 | Test jig for circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214750458U true CN214750458U (en) | 2021-11-16 |
Family
ID=78628275
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121254479.3U Active CN214750458U (en) | 2021-06-04 | 2021-06-04 | Test jig for circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214750458U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114377912A (en) * | 2022-01-04 | 2022-04-22 | 河源顺科塑胶制品有限公司 | Automatic probe dispenser |
| CN115843158A (en) * | 2023-02-22 | 2023-03-24 | 遂宁睿杰兴科技有限公司 | Printed circuit board with embedded inductance magnetic core and manufacturing method thereof |
| CN117388672A (en) * | 2023-12-11 | 2024-01-12 | 四川睿杰鑫电子股份有限公司 | Power supply path detection device for circuit board and detection method thereof |
-
2021
- 2021-06-04 CN CN202121254479.3U patent/CN214750458U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114377912A (en) * | 2022-01-04 | 2022-04-22 | 河源顺科塑胶制品有限公司 | Automatic probe dispenser |
| CN115843158A (en) * | 2023-02-22 | 2023-03-24 | 遂宁睿杰兴科技有限公司 | Printed circuit board with embedded inductance magnetic core and manufacturing method thereof |
| CN117388672A (en) * | 2023-12-11 | 2024-01-12 | 四川睿杰鑫电子股份有限公司 | Power supply path detection device for circuit board and detection method thereof |
| CN117388672B (en) * | 2023-12-11 | 2024-04-19 | 四川睿杰鑫电子股份有限公司 | Power supply path detection device for circuit board and detection method thereof |
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