CN103674485B - Photodetector parameter testing jig and method of testing - Google Patents
Photodetector parameter testing jig and method of testing Download PDFInfo
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- CN103674485B CN103674485B CN201310726436.4A CN201310726436A CN103674485B CN 103674485 B CN103674485 B CN 103674485B CN 201310726436 A CN201310726436 A CN 201310726436A CN 103674485 B CN103674485 B CN 103674485B
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- photodetector
- clamping device
- cover plate
- movable part
- printed board
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- 238000012360 testing method Methods 0.000 title claims abstract description 85
- 238000010998 test method Methods 0.000 title claims abstract description 11
- 239000002184 metal Substances 0.000 claims abstract description 20
- 229910052751 metal Inorganic materials 0.000 claims abstract description 20
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 11
- 229910052802 copper Inorganic materials 0.000 claims description 11
- 239000010949 copper Substances 0.000 claims description 11
- 230000003287 optical effect Effects 0.000 claims description 11
- 238000009413 insulation Methods 0.000 claims description 6
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 10
- 238000005538 encapsulation Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 7
- 241000168254 Siro Species 0.000 description 5
- 238000004891 communication Methods 0.000 description 5
- 238000009987 spinning Methods 0.000 description 5
- 238000009434 installation Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000010301 surface-oxidation reaction Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 238000012956 testing procedure Methods 0.000 description 1
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Abstract
The invention discloses a kind of photodetector parameter testing jig and method of testing, comprise fixed part and movable part, fixed part comprises metal shielding box and is arranged on the printed board in metal shielding box, and have data-interface on the left of metal shielding box, there is gang socket on right side; Movable part comprises printed board, cover plate and clamping device, described printed board is arranged on the cover plate back side, printed board there are attachment plug and test bench, attachment plug and described gang socket cooperatively interact, cover plate there are reference column and manual bolt, clamping device is arranged on the left of cover plate, clamping device has light input interface and manual bolt; Fixed part is mounted on the left of movable part by manual bolt.The movable part of this fixture is replaceable part, can change, improve the versatility of this fixture according to different photodetector.Present invention also offers the method for testing of photodetector, this method of testing simplifies operation steps, improves testing efficiency, effectively avoids misoperation.
Description
Technical field
The present invention relates to photodetector field tests, particularly relate to a kind of test fixture and method of testing of photodetector parameter.
Background technology
Photodetector is receiving device the most basic in optical communication system, and its performance parameters directly determines the indices of whole optical communication system to a great extent, therefore usually needs to carry out performance test to the parameters of photodetector.
At present, the special test fixture of usual use carrys out testing photoelectronic parameter detector performance, Fig. 1 is the structural representation of the test fixture of prior art, the test fixture of prior art comprises: metal shielding box 11, printed board 13 and clamping device 23, metal shielding box 11 comprises end box and upper cover, metal shielding box 11 causes interference for preventing external noise from treating light-metering electric explorer 4 parameter testing, has data-interface 15, for carrying out data communication with Test Host on the left of it; Printed board 13 exports the prime test of electric signal for realizing photodetector 4 to be measured; Described clamping device 23 is positioned on the right side of metal shielding box 11, for clamping photodetector 4 to be measured and the light input signal that is coupled and aligned, light input interface is had outside clamping device 23, for realizing the input of external optical signal, during use, with jackscrew 6, photodetector 4 to be measured is fixed in clamping device 23, utilizes cable 5 to be connected to the corresponding connector of printed board 13 by the pin of photodetector 4 to be measured, upper cover is installed, namely can carries out the parameter testing of photodetector 4 to be measured.
In prior art, there are the following problems:
1, easily there is connection error in not anti-error correction between cable 5 and photodetector to be measured 4 pin, and in cargo handling process, easily cause photodetector 4 pin stress deformation to be measured;
2, need to treat light-metering electric explorer 4 by instrument to carry out installing and changing, operating process is complicated, and the running time is long, reduces testing efficiency;
3, test fixture can only be applied to an a kind of photodetector of encapsulation, poor universality.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of photodetector parameter testing jig, this test fixture practicality and highly versatile, and installation and removal are convenient, can also simplify testing procedure, improves testing efficiency.
For solving the problems of the technologies described above, the invention provides a kind of photodetector parameter testing jig, comprising fixed part and movable part;
Fixed part comprises metal shielding box and is arranged on the printed board of metal shielding box inside, has data-interface, have gang socket on the right side of metal shielding box on the left of metal shielding box;
Movable part comprises printed board, cover plate and clamping device, described printed board is arranged on the cover plate back side, printed board there are attachment plug and test bench, described attachment plug and described gang socket cooperatively interact, cover plate there are reference column and manual bolt, clamping device is arranged on the left of cover plate, clamping device has light input interface and manual bolt;
Fixed part is mounted on the left of movable part by manual bolt.
For the purpose of brief description problem, below photodetector parameter testing jig of the present invention all referred to as this fixture.
The printed board of this fixture exports the prime amplification process of electric signal for realizing photodetector; Gang socket is used for being electrically connected with the attachment plug in test fixture movable part, and gang socket and attachment plug all adopt the definition of unified Interface Electrical, exchanges between the movable part that can be implemented in the test fixture of different encapsulation; Manual bolt be used for manually the fixed part of test fixture and movable part are carried out compact siro spinning technology, guarantee that socket between the two is reliably connected with plug, realize test fixture without tool ejector; Reference column was both located for the installation of photodetector to be measured, also for ensureing that light input adapter is rotatably inserted into maintaining static of clamping device in process, guaranteed that the pin of photodetector to be measured does not stress distortion; Light input interface is for realizing the input of external optical signal.
The movable part of this fixture is replaceable part, when needing to test the parameter of difference encapsulation photodetector, only change the movable part of test fixture, different encapsulation photodetector can be adapted to: first unscrew two manual bolts on the right side of cover plate, extracted by the fixed part of the movable part of test fixture from test fixture; Secondly movable part is replaced by the movable part being directed to another kind of encapsulation, test fixture movable part and fixed part are carried out compact siro spinning technology by two manual bolts screwed on the right side of cover plate, guarantee that socket between the two is reliably connected with plug.After completing aforesaid operations process, the replacing of test fixture movable part can be completed, and carry out the parameter testing of different encapsulation photodetector, improve the versatility of this fixture.
The movable part of this fixture is placed on the right side of fixed part, utilizes manual bolt to dismantle, and meets human body operating habit.
Described metal shielding box comprises: end box and upper cover, upper cover is positioned at box top, the end, upper cover becomes an airtight metallic shield space with end box-like, prevent external noise from causing interference to photodetector parameter testing, data-interface is located on the left of end box, for being electrically connected with Test Host, the Power supply between test fixture and Test Host, testing and control and data communication can be realized.
Described test bench is made up of insulation cylinder and copper contact pin, insulation cylinder porch is tapered structure, the guiding Insertion action played, copper contact pin is inner via hole structure, can the different photodetector pin of compatible length, copper contact pin surface is coated with hard gold, effectively reduces because repeatedly plug causes the problem of the loose contact caused by contact pin surface oxidation, improves the reliability of test.
Cover plate front silk-screen has photodetector mounting direction mark, and described mounting direction mark is consistent with the profile of clamping device, coordinates reference column, can realize photodetector zero defect and install.
The shell central coaxial of clamping device and photodetector, and and leave narrow space between the optical window of photodetector, both guaranteed that light input signal was all incident upon within the photosurface scope of photodetector to be measured, also guarantee that light input adapter directly can not touch the optical window surface of photodetector of calling a taxi, cause optical window damaged.
Present invention also offers a kind of photodetector method of testing using this fixture, this method of testing comprises:
Manual bolt is utilized to be fixed in clamping device by photodetector to be measured;
Carry out location, position according to reference column, clamping device is arranged in test bench;
Utilize manual bolt to be connected with fixed part by the movable part of test fixture, and the plug of movable part is connected with the socket of fixed part.
Be specially: first keep photodetector shell projection to be measured consistent with the projection direction of clamping device, photodetector to be measured is put into clamping device, and utilizes manual bolt to be fixed; Secondly keep clamping device profile consistent with the mark direction on cover plate, and utilize on cover plate four reference columns accurately to locate, the pin of the photodetector on clamping device is inserted in the proprietary test bench on cover plate, guarantees that the pin of photodetector is reliably connected with the copper contact pin of proprietary test bench; The fixed part of test fixture and movable part are carried out compact siro spinning technology by two manual bolts finally turned clockwise on the right side of cover plate, guarantee that socket between the two is reliably connected with plug.After completing aforesaid operations process, photodetector parameter testing to be measured can be carried out.
Method of testing of the present invention can realize photodetector zero defect to be measured, install without instrument, both simplifies operation steps, and improves testing efficiency, and also effectively avoided misoperation, and added the practicality of test fixture.
Accompanying drawing explanation
Fig. 1 is the structural representation of test fixture of the prior art.
Fig. 2 is the structural representation of the test fixture of the embodiment of the present invention.
Fig. 3 is the structural representation of the test fixture fixed part of the embodiment of the present invention.
Fig. 4 is the structural representation of the test fixture movable part of the embodiment of the present invention.
Fig. 5 is the right view of Fig. 4.
Fig. 6 is the vertical view of Fig. 4.
Fig. 7 is the schematic diagram of the direction signs of the test fixture movable part of the embodiment of the present invention.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.
As shown in Figure 2, photodetector test fixture, comprise fixed part 1 and movable part 2, movable part 2 is placed on the right side of test fixture fixed part 1, utilizes two manual bolt 25a to dismantle, meets human body operating habit.
The movable part 2 of above-mentioned test fixture is replaceable part, according to the photodetector of difference encapsulation, can select the movable part matched.
As shown in Figure 3, test fixture fixed part 1 comprises metal shielding box 11 and printed board 12a, metal shielding box 11 comprises end box 13 and upper cover 14(as shown in Figure 2), upper cover 14 is arranged on end box 13 top, an airtight metallic shield space can be formed, prevent external noise from causing interference to photodetector parameter testing; Being provided with data-interface 15 on the left of end box, for being electrically connected with Test Host, the Power supply between test fixture and Test Host, testing and control and data communication can being realized; It is inner that printed board 12a is arranged on box 13 at the bottom of metal shielding box, and printed board 12a exports electric signal prime for realizing photodetector amplifies process; Gang socket 16 is set on the right side of printed board 12a.
As shown in Fig. 4-Fig. 6, the movable part 2 of test fixture comprises cover plate 21, printed board 12b and clamping device 22, cover plate 21 there are two manual bolt 25a and four reference columns 26, manual bolt 25a be used for manually the fixed part 1 of test fixture and movable part 2 are carried out compact siro spinning technology, realize test fixture without tool ejector and installation; Reference column 26 was both located for the installation of photodetector 4 to be measured, also for ensureing that light input adapter is rotatably inserted into maintaining static of clamping device 22 in process, guaranteed that the pin of photodetector 4 to be measured does not stress distortion;
Printed board 12b is arranged on the back side of cover plate 21, printed board 12b is provided with attachment plug 23 and test bench 24, attachment plug 23 is for being electrically connected with the gang socket 16 in test fixture fixed part 1, gang socket 16 and attachment plug 23 all adopt the definition of unified Interface Electrical, exchange between the movable part that can be implemented in the test fixture of different encapsulation; Test bench 24, be made up of insulation cylinder 24a and copper contact pin 24b two parts, insulation cylinder 24a porch have employed tapered structure, the guiding Insertion action played; Copper contact pin 24b adopts inner via hole structure, can the different photodetector pin of compatible length; Be coated with hard gold on copper contact pin 24b surface simultaneously, effectively reduced because repeatedly plug causes the problem of the loose contact caused by contact pin surface oxidation, improve the reliability of test;
The shell central coaxial of clamping device 22 and photodetector 4 to be measured, and and leave enough little space between the optical window of photodetector to be measured 4, both guaranteed that light input signal was all incident upon within the photosurface scope of photodetector 4 to be measured, also guarantee that light input adapter directly can not touch the optical window surface of photodetector 4 to be measured, cause optical window damaged; Clamping device 22 is provided with light input interface 27 and manual bolt 25b, on cover plate 21, the photodetector mounting direction mark 28 of silk-screen is consistent with the profile of clamping device 22, as shown in Figure 7, direction signs 28 coordinate reference column 26, can realize photodetector zero defect to be measured and install.
The photodetector method of testing of this fixture is used to be specially:
First keep the shell projection of photodetector 4 to be measured consistent with the projection direction of clamping device 22, photodetector 4 to be measured is put into clamping device 22, and utilize manual bolt 25b to be fixed;
Secondly keep clamping device 22 profile consistent with the mark direction 28 on cover plate, and utilize on cover plate 21 four reference columns 26 accurately to locate, the pin of the photodetector to be measured 4 on clamping device 22 is inserted in the test bench 24 on cover plate 21, guarantees that the pin of photodetector 4 to be measured is reliably connected with the copper contact pin 24b of test bench 24;
Finally utilize two manual bolt 25a on the right side of cover plate 21 that the fixed part 1 of test fixture and movable part 2 are carried out compact siro spinning technology, guarantee that socket 16 between the two is reliably connected with plug 23, after completing aforesaid operations process, the parameter testing of photodetector 4 to be measured can be carried out.
The above is only the specific embodiment of the present invention; it should be pointed out that for those skilled in the art, under the premise without departing from the principles of the invention; can also make some distortion or equivalent replacement, these distortion and replacement also should be considered as protection scope of the present invention.
Claims (5)
1. photodetector parameter testing jig, comprises fixed part and movable part, it is characterized in that:
Fixed part comprises metal shielding box and is arranged on the printed board of metal shielding box inside, has data-interface, have gang socket on the right side of metal shielding box on the left of metal shielding box;
Movable part comprises printed board, cover plate and clamping device, described printed board is arranged on the cover plate back side, printed board there are attachment plug and test bench, described attachment plug and described gang socket cooperatively interact, cover plate there are reference column and manual bolt, clamping device is arranged on the left of cover plate, clamping device has light input interface and manual bolt;
Fixed part is mounted on the left of movable part by manual bolt;
Described test bench is made up of insulation cylinder and copper contact pin, and insulation cylinder porch is tapered structure, and copper contact pin is inner via hole structure, and copper contact pin surface has been coated with hard gold.
2. photodetector parameter testing jig as claimed in claim 1, it is characterized in that: described metal shielding box comprises: end box and upper cover, upper cover is positioned at box top, the end, and upper cover becomes an airtight metallic shield space with end box-like, data-interface is located on the left of end box.
3. photodetector parameter testing jig as claimed in claim 1, is characterized in that: cover plate front silk-screen has photodetector mounting direction mark, and described mounting direction mark is consistent with the profile of clamping device.
4. photodetector parameter testing jig as claimed in claim 1, is characterized in that: the shell central coaxial of clamping device and photodetector, and and leaves narrow space between the optical window of photodetector.
5. use a method of testing for the photodetector parameter testing jig according to any one of claim 1 to 4, photodetector wherein to be tested is arranged in clamping device, it is characterized in that: this method of testing comprises:
Photodetector to be measured is fixed in clamping device;
Clamping device is arranged in test bench;
Utilize manual bolt to be connected with fixed part by the movable part of photodetector parameter testing jig, and the attachment plug of movable part is connected with the gang socket of fixed part.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310726436.4A CN103674485B (en) | 2013-12-25 | 2013-12-25 | Photodetector parameter testing jig and method of testing |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310726436.4A CN103674485B (en) | 2013-12-25 | 2013-12-25 | Photodetector parameter testing jig and method of testing |
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| CN103674485A CN103674485A (en) | 2014-03-26 |
| CN103674485B true CN103674485B (en) | 2015-12-02 |
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| CN201310726436.4A Expired - Fee Related CN103674485B (en) | 2013-12-25 | 2013-12-25 | Photodetector parameter testing jig and method of testing |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108981916B (en) * | 2018-08-01 | 2020-07-07 | 合肥中科九衡科技有限公司 | Data acquisition method based on multi-channel filtering radiometer |
| CN112985487B (en) * | 2021-02-08 | 2023-03-10 | 中国科学院半导体研究所 | Array type photoelectric detector test system |
| CN113865829A (en) * | 2021-10-12 | 2021-12-31 | 中国电子科技集团公司第四十四研究所 | Multichannel light focusing device for parameter test of photoelectric detector |
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| US6341981B1 (en) * | 2000-01-05 | 2002-01-29 | Michael P. Gorman | Safety electrical outlet and switch system |
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| CN103674485A (en) | 2014-03-26 |
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