CN203658016U - A photoelectric detector parameter test clamp - Google Patents
A photoelectric detector parameter test clamp Download PDFInfo
- Publication number
- CN203658016U CN203658016U CN201320863369.6U CN201320863369U CN203658016U CN 203658016 U CN203658016 U CN 203658016U CN 201320863369 U CN201320863369 U CN 201320863369U CN 203658016 U CN203658016 U CN 203658016U
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- China
- Prior art keywords
- photodetector
- cover plate
- clamping device
- metal shielding
- printed board
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Abstract
The utility model discloses a photoelectric detector parameter test clamp comprising a fixed portion and a movable portion. The fixed portion comprises a metal shielding case and a printed board installed inside the metal shielding case. A data interface is arranged in the left side of the metal shielding case. A socket is connected to the right side of the metal shielding case. The movable portion comprises a printed board, a cover plate and a clamping device. The printed board is installed on the back side of the cover plate. The printed board is provided with a connection plug and a test seat. The connection plug is in mutual cooperation with the connection plug. Positioning columns and hand-operated screw bolts are arranged on the cover plate. The clamping device is installed on the left side of the cover plate. A light input interface and a hand-operated screw bolt are arranged on the clamping device. The fixed portion is connected to and installed on the left side of the movable portion through the hand-operated screw bolts. The movable portion of the clamp is a replaceable portion, and can be replaced according to different photoelectric detectors. The universality of the clamp is raised; the installation and the dismounting of the clamp are convenient; test steps are simplified; and the test efficiency is raised.
Description
Technical field
The utility model relates to photodetector field tests, relates in particular to a kind of test fixture of photodetector parameter.
Background technology
Photodetector is receiving device the most basic in optical communication system, and its performance parameters has directly determined the indices of whole optical communication system to a great extent, therefore usually needs the parameters of photodetector to carry out performance test.
At present, conventionally carry out testing photoelectronic parameter detector performance with special test fixture, Fig. 1 is the structural representation of the test fixture of prior art, the test fixture of prior art comprises: metal shielding box 11, printed board 13 and clamping device 23, metal shielding box 11 comprises end box and upper cover, metal shielding box 11 is treated 4 parameter testings of photometry electric explorer and is caused interference for preventing external noise, and there is data-interface 15 in its left side, for carrying out data communication with Test Host; Printed board 13 is for realizing the prime test of photodetector 4 output electrical signals to be measured; Described clamping device 23 is positioned at metal shielding box 11 right sides, be used for clamping photodetector 4 to be measured and the light input signal that is coupled and aligned, there is light input interface in clamping device 23 outsides, for realizing the input of external optical signal, when use, photodetector 4 to be measured is fixed in clamping device 23 with jackscrew 6, utilizes cable 5 that the pin of photodetector 4 to be measured is connected with the corresponding connector of printed board 13, upper cover is installed, can be carried out the parameter testing of photodetector 4 to be measured.
In prior art, there are the following problems:
1,, easily there is connection error in not anti-error correction between cable 5 and photodetector to be measured 4 pins, and in cargo handling process, easily cause photodetector 4 pin stress deformations to be measured;
2, need to treat photometry electric explorer 4 by instrument and install and change, operating process complexity, the running time is long, reduces testing efficiency;
3, test fixture can only be applied to an a kind of photodetector of encapsulation, and versatility is poor.
Utility model content
The technical problems to be solved in the utility model is to provide a kind of photodetector parameter testing jig, this test fixture practicality and highly versatile, and installation and removal are convenient, can also simplify testing procedure, improve testing efficiency.
For solving the problems of the technologies described above, the utility model provides a kind of photodetector parameter testing jig, comprises fixed part and movable part;
Fixed part comprises metal shielding box and the printed board that is arranged on metal shielding box inside, and there is data-interface in metal shielding box left side, and there is gang socket on metal shielding box right side;
Movable part comprises printed board, cover plate and clamping device, described printed board is arranged on the cover plate back side, in printed board, there are attachment plug and test bench, described attachment plug and described gang socket cooperatively interact, on cover plate, there are reference column and manual bolt, clamping device is arranged on cover plate left side, has light input interface and manual bolt on clamping device;
Fixed part is mounted on movable part left side by manual bolt.
For the purpose of brief description problem, below photodetector parameter testing jig described in the utility model all referred to as this fixture.
The printed board of this fixture is amplified processing for the prime that realizes photodetector output electrical signals; Gang socket is for being electrically connected with the attachment plug of test fixture movable part, and gang socket and attachment plug all adopt the electric definition of unified interface, can realize between the movable part of the test fixture of difference encapsulation and exchanging; Manual bolt, for manually the fixed part of test fixture being closely connected with movable part, guarantees that socket between the two is reliably connected with plug, realizes dismantling without instrument of test fixture; Reference column is both for the installation location of photodetector to be measured, also for guaranteeing maintaining static of light input adapter rotation insertion process clamping device, and the distortion that do not stress of the pin of guaranteeing photodetector to be measured; Light input interface is for realizing the input of external optical signal.
The movable part of this fixture is replaceable part, in the time that the parameter that need to encapsulate photodetector to difference is tested, only change the movable part of test fixture, can adapt to different encapsulation photodetectors: first unscrew two manual bolts on cover plate right side, the movable part of test fixture is extracted from the fixed part of test fixture; Secondly movable part is replaced by the movable part that is directed to another kind of encapsulation, two manual bolts that screw cover plate right side are closely connected test fixture movable part with fixed part, guarantee that socket between the two is reliably connected with plug.Complete after aforesaid operations process, can complete the replacing of test fixture movable part, and carry out the parameter testing of different encapsulation photodetectors, improved the versatility of this fixture.
The movable part of this fixture is placed on fixed part right side, utilizes manual bolt to dismantle, and meets human body operating habit.
Described metal shielding box comprises: end box and upper cover, upper cover is positioned at box top, the end, upper cover becomes an airtight metallic shield space with end box-like, prevent that parameter testing causes interference to external noise to photodetector, data-interface is located at box left side, the end, for being electrically connected with Test Host, Power supply, the test that can realize between test fixture and Test Host are controlled and data communication.
Described test bench is made up of insulation cylinder and copper contact pin, insulation cylinder porch is tapered structure, the guiding insertion effect of playing, copper contact pin is inner via hole structure, can the different photodetector pin of compatible length, copper contact pin surface is coated with hard gold, has effectively reduced owing to repeatedly plugging the problem that causes the caused loose contact of contact pin surface oxidation, has improved the reliability of test.
Cover plate front silk-screen has photodetector mounting direction mark, and described mounting direction mark is consistent with the profile of clamping device, coordinates reference column, can realize photodetector zero defect and install.
Clamping device is coaxial with the shell center of photodetector, and and leave narrow space between the optical window of photodetector, both within having guaranteed that light input signal was all incident upon the photosurface scope of photodetector to be measured, also guarantee that light input adapter can directly not touch the optical window surface of the photodetector of calling a taxi, and causes optical window breakage.
Accompanying drawing explanation
Fig. 1 is the structural representation of test fixture of the prior art.
Fig. 2 is the structural representation of the test fixture of the utility model embodiment.
Fig. 3 is the structural representation of the test fixture fixed part of the utility model embodiment.
Fig. 4 is the structural representation of the test fixture movable part of the utility model embodiment.
Fig. 5 is the right view of Fig. 4.
Fig. 6 is the vertical view of Fig. 4.
Fig. 7 is the schematic diagram of the direction signs of the test fixture movable part of the utility model embodiment.
Embodiment
Below in conjunction with drawings and Examples, embodiment of the present utility model is described in further detail.
As shown in Figure 2, photodetector test fixture, comprises fixed part 1 and movable part 2, and movable part 2 is placed on the right side of test fixture fixed part 1, utilizes two manual bolt 25a to dismantle, and meets human body operating habit.
The movable part 2 of above-mentioned test fixture is replaceable part, can, according to the photodetector of difference encapsulation, select the movable part matching.
As shown in Figure 3, test fixture fixed part 1 comprises metal shielding box 11 and printed board 12a, metal shielding box 11 comprises that end box 13 and upper cover 14(are as shown in Figure 2), upper cover 14 is arranged on end box 13 tops, can form an airtight metallic shield space, prevent that parameter testing causes interference to external noise to photodetector; Box left side, the end is provided with data-interface 15, and for being electrically connected with Test Host, Power supply, the test that can realize between test fixture and Test Host are controlled and data communication; Printed board 12a is arranged on box 13 inside at the bottom of metal shielding box, and printed board 12a amplifies and processes for realizing the prime of photodetector output electrical signals; Printed board 12a right side arranges gang socket 16.
As shown in Fig. 4-Fig. 6, the movable part 2 of test fixture comprises cover plate 21, printed board 12b and clamping device 22, on cover plate 21, there are two manual bolt 25a and four reference columns 26, manual bolt 25a, for manually the fixed part of test fixture 1 being closely connected with movable part 2, realizes dismantling and install without instrument of test fixture; Reference column 26 is both for the installation location of photodetector 4 to be measured, also for guaranteeing maintaining static of light input adapter rotation insertion process clamping device 22, and the distortion that do not stress of the pin of guaranteeing photodetector 4 to be measured;
Printed board 12b is arranged on the back side of cover plate 21, printed board 12b is provided with attachment plug 23 and test bench 24, attachment plug 23 is for being electrically connected with the gang socket 16 of test fixture fixed part 1, gang socket 16 and attachment plug 23 all adopt the electric definition of unified interface, can realize between the movable part of the test fixture of difference encapsulation and exchanging; Test bench 24, is made up of insulation cylinder 24a and copper contact pin 24b two parts, and insulation cylinder 24a porch has adopted tapered structure, the guiding insertion effect of playing; Copper contact pin 24b adopts inner via hole structure, can the different photodetector pin of compatible length; Be coated with hard gold on copper contact pin 24b surface, effectively reduced owing to repeatedly plugging the problem that causes the caused loose contact of contact pin surface oxidation, improved the reliability of test simultaneously;
The above is only embodiment of the present utility model; should be understood that; for those skilled in the art; do not departing under the prerequisite of the utility model principle; can also make some distortion or be equal to replacement, these distortion and replacement also should be considered as protection domain of the present utility model.
Claims (5)
1. photodetector parameter testing jig, comprises fixed part and movable part, it is characterized in that:
Fixed part comprises metal shielding box and the printed board that is arranged on metal shielding box inside, and there is data-interface in metal shielding box left side, and there is gang socket on metal shielding box right side;
Movable part comprises printed board, cover plate and clamping device, described printed board is arranged on the cover plate back side, in printed board, there are attachment plug and test bench, described attachment plug and described gang socket cooperatively interact, on cover plate, there are reference column and manual bolt, clamping device is arranged on cover plate left side, has light input interface and manual bolt on clamping device;
Fixed part is mounted on movable part left side by manual bolt.
2. photodetector parameter testing jig as claimed in claim 1, it is characterized in that: described metal shielding box comprises: end box and upper cover, upper cover is positioned at box top, the end, and upper cover becomes an airtight metallic shield space with end box-like, and data-interface is located at box left side, the end.
3. photodetector parameter testing jig as claimed in claim 1, is characterized in that: described test bench is made up of insulation cylinder and copper contact pin, and insulation cylinder porch is tapered structure, and copper contact pin is inner via hole structure, and copper contact pin surface has been coated with hard gold.
4. photodetector parameter testing jig as claimed in claim 1, is characterized in that: cover plate front silk-screen has photodetector mounting direction mark, and described mounting direction mark is consistent with the profile of clamping device.
5. photodetector parameter testing jig as claimed in claim 1, is characterized in that: clamping device is coaxial with the shell center of photodetector, and and the optical window of photodetector between leave narrow space.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201320863369.6U CN203658016U (en) | 2013-12-25 | 2013-12-25 | A photoelectric detector parameter test clamp |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201320863369.6U CN203658016U (en) | 2013-12-25 | 2013-12-25 | A photoelectric detector parameter test clamp |
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CN203658016U true CN203658016U (en) | 2014-06-18 |
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CN201320863369.6U Withdrawn - After Issue CN203658016U (en) | 2013-12-25 | 2013-12-25 | A photoelectric detector parameter test clamp |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103674485A (en) * | 2013-12-25 | 2014-03-26 | 中国电子科技集团公司第四十一研究所 | Photoelectric detector parameter testing fixture and testing method |
CN104634447A (en) * | 2014-12-31 | 2015-05-20 | 西南技术物理研究所 | Photoelectric detector service life assessment test system |
CN110260902A (en) * | 2019-07-26 | 2019-09-20 | 中电科仪器仪表有限公司 | A kind of portable instrument grip structure, portable instrument and application method |
CN113865829A (en) * | 2021-10-12 | 2021-12-31 | 中国电子科技集团公司第四十四研究所 | Multichannel light focusing device for parameter test of photoelectric detector |
-
2013
- 2013-12-25 CN CN201320863369.6U patent/CN203658016U/en not_active Withdrawn - After Issue
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103674485A (en) * | 2013-12-25 | 2014-03-26 | 中国电子科技集团公司第四十一研究所 | Photoelectric detector parameter testing fixture and testing method |
CN103674485B (en) * | 2013-12-25 | 2015-12-02 | 中国电子科技集团公司第四十一研究所 | Photodetector parameter testing jig and method of testing |
CN104634447A (en) * | 2014-12-31 | 2015-05-20 | 西南技术物理研究所 | Photoelectric detector service life assessment test system |
CN110260902A (en) * | 2019-07-26 | 2019-09-20 | 中电科仪器仪表有限公司 | A kind of portable instrument grip structure, portable instrument and application method |
CN110260902B (en) * | 2019-07-26 | 2021-06-04 | 中电科思仪科技股份有限公司 | Handle structure for portable instrument, portable instrument and using method |
CN113865829A (en) * | 2021-10-12 | 2021-12-31 | 中国电子科技集团公司第四十四研究所 | Multichannel light focusing device for parameter test of photoelectric detector |
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Legal Events
Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
AV01 | Patent right actively abandoned |
Granted publication date: 20140618 Effective date of abandoning: 20151202 |
|
C25 | Abandonment of patent right or utility model to avoid double patenting |