CN106899296B - 频域adc闪存校准系统、方法及计算机可读介质 - Google Patents
频域adc闪存校准系统、方法及计算机可读介质 Download PDFInfo
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- CN106899296B CN106899296B CN201611163546.4A CN201611163546A CN106899296B CN 106899296 B CN106899296 B CN 106899296B CN 201611163546 A CN201611163546 A CN 201611163546A CN 106899296 B CN106899296 B CN 106899296B
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- calibration
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- adc
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
- H03M1/0854—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of quantisation noise
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M1/1023—Offset correction
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/1085—Measuring or testing using domain transforms, e.g. Fast Fourier Transform
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
- H03M1/361—Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/378—Testing
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/38—Calibration
- H03M3/382—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M3/384—Offset correction
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/458—Analogue/digital converters using delta-sigma modulation as an intermediate step
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Analogue/Digital Conversion (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
Abstract
Description
Claims (18)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562269656P | 2015-12-18 | 2015-12-18 | |
US62/269,656 | 2015-12-18 | ||
US15/282,586 | 2016-09-30 | ||
US15/282,586 US10056914B2 (en) | 2015-12-18 | 2016-09-30 | Frequency-domain ADC flash calibration |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106899296A CN106899296A (zh) | 2017-06-27 |
CN106899296B true CN106899296B (zh) | 2021-01-01 |
Family
ID=57517706
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201611163546.4A Active CN106899296B (zh) | 2015-12-18 | 2016-12-16 | 频域adc闪存校准系统、方法及计算机可读介质 |
Country Status (5)
Country | Link |
---|---|
US (1) | US10056914B2 (zh) |
EP (1) | EP3182594B1 (zh) |
JP (1) | JP6339166B2 (zh) |
CN (1) | CN106899296B (zh) |
TW (1) | TWI629871B (zh) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102016110344A1 (de) * | 2016-06-03 | 2017-12-07 | Infineon Technologies Ag | Rf-empfänger mit eingebauter selbsttestfunktion |
US10892768B2 (en) * | 2017-09-11 | 2021-01-12 | Texas Instruments Incorporated | Low noise and low distortion test method and system for analog-to-digital converters |
JP7084638B2 (ja) * | 2017-09-29 | 2022-06-15 | 国立大学法人 名古屋工業大学 | ノイズシェーピング機能を有する再量子化装置およびノイズシェーピング機能を有する信号圧縮装置およびノイズシェーピング機能を有する信号送信装置 |
KR20190066479A (ko) * | 2017-12-05 | 2019-06-13 | 한국과학기술원 | 입력 신호의 도함수에 기초하여 복수의 클록 사이의 스큐를 조절하는 전자 회로 |
US10944418B2 (en) | 2018-01-26 | 2021-03-09 | Mediatek Inc. | Analog-to-digital converter capable of generate digital output signal having different bits |
US10541706B2 (en) * | 2018-05-25 | 2020-01-21 | Arizona Board Of Regents On Behalf Of Arizona State University | Dynamic-zoom analog to digital converter (ADC) having a coarse flash ADC and a fine passive single-bit modulator |
WO2020231717A1 (en) * | 2019-05-10 | 2020-11-19 | Westinghouse Electric Company Llc | Calibration system and method |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10255354B3 (de) * | 2002-11-27 | 2004-03-04 | Infineon Technologies Ag | A/D-Wandler mit minimiertem Umschaltfehler |
US7227479B1 (en) * | 2005-12-22 | 2007-06-05 | Lucent Technologies Inc. | Digital background calibration for time-interlaced analog-to-digital converters |
US8290031B1 (en) * | 2006-08-14 | 2012-10-16 | The Board Of Trustees Of The Leland Stanford Junior University | Arrangements and methods for providing compensation for non-idealities of components in communications systems |
FR2911454B1 (fr) * | 2007-01-17 | 2009-06-26 | St Microelectronics Sa | Procede et dispositif de traitement d'un signal incident, en particulier de filtrage et de conversion analogique/numerique. |
JPWO2009136480A1 (ja) * | 2008-05-08 | 2011-09-08 | パナソニック株式会社 | フラッシュad変換器、フラッシュad変換モジュール及びデルタシグマad変換器 |
TWI376150B (en) * | 2009-02-13 | 2012-11-01 | Primax Electronics Ltd | Circuit for calibrating focus position of optical module and related calibrating method |
TW201041319A (en) * | 2009-05-04 | 2010-11-16 | Sunplus Mmedia Inc | Digital/analog conversion system for dynamic element matching and sigma-delta modulator using the same |
JP5427658B2 (ja) | 2010-03-16 | 2014-02-26 | パナソニック株式会社 | コンパレータのオフセット補正装置 |
US8773966B1 (en) | 2010-05-07 | 2014-07-08 | Marvell International Ltd. | Signal power measurement and automatic gain control in orthogonal frequency division multiple access systems |
JP5433673B2 (ja) * | 2011-02-28 | 2014-03-05 | 株式会社東芝 | 周波数変調装置 |
JP5809522B2 (ja) * | 2011-10-25 | 2015-11-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US8884802B2 (en) | 2013-03-15 | 2014-11-11 | Analog Devices Technology | System, method and recording medium for analog to digital converter calibration |
-
2016
- 2016-09-30 US US15/282,586 patent/US10056914B2/en active Active
- 2016-12-02 EP EP16201917.8A patent/EP3182594B1/en active Active
- 2016-12-14 TW TW105141403A patent/TWI629871B/zh active
- 2016-12-16 CN CN201611163546.4A patent/CN106899296B/zh active Active
- 2016-12-16 JP JP2016244303A patent/JP6339166B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
US20170179971A1 (en) | 2017-06-22 |
TW201725867A (zh) | 2017-07-16 |
US10056914B2 (en) | 2018-08-21 |
EP3182594A1 (en) | 2017-06-21 |
EP3182594B1 (en) | 2020-12-02 |
JP6339166B2 (ja) | 2018-06-06 |
JP2017112613A (ja) | 2017-06-22 |
CN106899296A (zh) | 2017-06-27 |
TWI629871B (zh) | 2018-07-11 |
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CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Bermuda (UK), Hamilton Patentee after: Analog Devices Global Unlimited Co. Address before: Bermuda (UK), Hamilton Patentee before: ANALOG DEVICES GLOBAL |
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TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220107 Address after: Limerick Patentee after: ANALOG DEVICES INTERNATIONAL UNLIMITED Co. Address before: Bermuda (UK), Hamilton Patentee before: Analog Devices Global Unlimited Co. |