CN106323465B - 延时线装置及太赫兹时域光谱仪系统 - Google Patents
延时线装置及太赫兹时域光谱仪系统 Download PDFInfo
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- CN106323465B CN106323465B CN201610852715.9A CN201610852715A CN106323465B CN 106323465 B CN106323465 B CN 106323465B CN 201610852715 A CN201610852715 A CN 201610852715A CN 106323465 B CN106323465 B CN 106323465B
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- 238000001328 terahertz time-domain spectroscopy Methods 0.000 title claims abstract description 13
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0202—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0237—Adjustable, e.g. focussing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/06—Scanning arrangements arrangements for order-selection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/06—Scanning arrangements arrangements for order-selection
- G01J2003/064—Use of other elements for scan, e.g. mirror, fixed grating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J2003/423—Spectral arrangements using lasers, e.g. tunable
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (9)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610852715.9A CN106323465B (zh) | 2016-09-26 | 2016-09-26 | 延时线装置及太赫兹时域光谱仪系统 |
US15/768,714 US10161790B2 (en) | 2016-09-26 | 2017-08-10 | Delay line device and terahertz time-domain spectrometer system |
EP17851947.6A EP3517907A4 (en) | 2016-09-26 | 2017-08-10 | DELAY LINE DEVICE AND TEMPERATURE TERRAHERTZ SPECTROMETER SYSTEM |
PCT/CN2017/096773 WO2018054182A1 (zh) | 2016-09-26 | 2017-08-10 | 延时线装置及太赫兹时域光谱仪系统 |
Applications Claiming Priority (1)
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CN201610852715.9A CN106323465B (zh) | 2016-09-26 | 2016-09-26 | 延时线装置及太赫兹时域光谱仪系统 |
Publications (2)
Publication Number | Publication Date |
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CN106323465A CN106323465A (zh) | 2017-01-11 |
CN106323465B true CN106323465B (zh) | 2018-06-26 |
Family
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CN201610852715.9A Active CN106323465B (zh) | 2016-09-26 | 2016-09-26 | 延时线装置及太赫兹时域光谱仪系统 |
Country Status (4)
Country | Link |
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US (1) | US10161790B2 (zh) |
EP (1) | EP3517907A4 (zh) |
CN (1) | CN106323465B (zh) |
WO (1) | WO2018054182A1 (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106323465B (zh) | 2016-09-26 | 2018-06-26 | 深圳市太赫兹科技创新研究院 | 延时线装置及太赫兹时域光谱仪系统 |
CN107678156A (zh) * | 2017-10-23 | 2018-02-09 | 深圳市太赫兹科技创新研究院有限公司 | 光学结构及延迟装置 |
CN107748438B (zh) * | 2017-11-29 | 2020-09-04 | 雄安华讯方舟科技有限公司 | 一种光学延迟结构及装置 |
CN109540835A (zh) * | 2018-12-28 | 2019-03-29 | 深圳市太赫兹科技创新研究院有限公司 | 光程控制装置及太赫兹时域光谱仪 |
CN110346893A (zh) * | 2019-07-15 | 2019-10-18 | 四川梓冠光电科技有限公司 | 可调光纤延迟仪 |
US11112355B2 (en) | 2019-12-26 | 2021-09-07 | Wisconsin Alumni Research Foundation | Narrowband, acoustically mediated spintronic terahertz emitter |
US11199447B1 (en) | 2020-10-20 | 2021-12-14 | Wisconsin Alumni Research Foundation | Single-mode, high-frequency, high-power narrowband spintronic terahertz emitter |
CN112881322A (zh) * | 2021-01-18 | 2021-06-01 | 清华大学 | 一种浸没式紫外可见吸收光谱传感器及其使用方法 |
CN113375791B (zh) * | 2021-06-22 | 2022-09-23 | 南京工程学院 | 一种基于螺旋扫描技术的超导太赫兹源空间辐射测试装置 |
US11817242B2 (en) | 2021-11-17 | 2023-11-14 | Wisconsin Alumni Research Foundation | Magnonic electromagnetic radiation sources with high output power at high frequencies |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN206223295U (zh) * | 2016-09-26 | 2017-06-06 | 深圳市太赫兹科技创新研究院 | 延时线装置及太赫兹时域光谱仪系统 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8759778B2 (en) * | 2007-09-27 | 2014-06-24 | Anis Rahman | Terahertz time domain and frequency domain spectroscopy |
JP2009300109A (ja) * | 2008-06-10 | 2009-12-24 | Sony Corp | テラヘルツ波測定方法及びテラヘルツ分光装置 |
US7899281B2 (en) * | 2008-07-08 | 2011-03-01 | Honeywell Asca Inc. | Large amplitude high frequency optical delay |
JP2011202972A (ja) * | 2010-03-24 | 2011-10-13 | Fujitsu Ltd | イメージング装置 |
EP2679984A1 (en) * | 2012-06-29 | 2014-01-01 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method and arrangement for carrying out time-domain measurements |
US8546762B1 (en) * | 2012-06-29 | 2013-10-01 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Method and arrangement for carrying out time-domain measurements |
CN103575393A (zh) * | 2012-08-03 | 2014-02-12 | 中国科学院深圳先进技术研究院 | 光学延迟线装置及太赫兹时域光谱系统 |
CN203981375U (zh) * | 2014-06-25 | 2014-12-03 | 首都师范大学 | 太赫兹波导测试系统 |
CN204188262U (zh) * | 2014-10-16 | 2015-03-04 | 中国电子科技集团公司第五十研究所 | 基于曲柄连杆机构的快速扫描延时线 |
KR101624482B1 (ko) * | 2014-10-24 | 2016-05-26 | 한국표준과학연구원 | 원자 자력계 및 그 동작 방법 |
CN104393734B (zh) * | 2014-11-13 | 2017-11-24 | 杨锦堂 | 可控位移进给驱动系统 |
CN104568819B (zh) * | 2015-01-15 | 2017-02-22 | 南开大学 | 一种全光纤透反射一体式太赫兹时域光谱系统 |
JP2016153831A (ja) * | 2015-02-20 | 2016-08-25 | キヤノン株式会社 | 光遅延装置、光遅延方法、及び光遅延装置を用いた測定装置 |
CN106323465B (zh) * | 2016-09-26 | 2018-06-26 | 深圳市太赫兹科技创新研究院 | 延时线装置及太赫兹时域光谱仪系统 |
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2016
- 2016-09-26 CN CN201610852715.9A patent/CN106323465B/zh active Active
-
2017
- 2017-08-10 US US15/768,714 patent/US10161790B2/en active Active
- 2017-08-10 WO PCT/CN2017/096773 patent/WO2018054182A1/zh active Application Filing
- 2017-08-10 EP EP17851947.6A patent/EP3517907A4/en not_active Withdrawn
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN206223295U (zh) * | 2016-09-26 | 2017-06-06 | 深圳市太赫兹科技创新研究院 | 延时线装置及太赫兹时域光谱仪系统 |
Also Published As
Publication number | Publication date |
---|---|
US20180274978A1 (en) | 2018-09-27 |
EP3517907A1 (en) | 2019-07-31 |
EP3517907A4 (en) | 2020-05-27 |
CN106323465A (zh) | 2017-01-11 |
WO2018054182A1 (zh) | 2018-03-29 |
US10161790B2 (en) | 2018-12-25 |
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Inventor after: Ding Qing Inventor after: Peng Shichang Inventor after: Pan Yi Inventor after: Li Chen Inventor before: Peng Shichang Inventor before: Pan Yi Inventor before: Li Chen Inventor before: Ding Qing |
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Effective date of registration: 20201013 Address after: Room 430, building 37, chentian Industrial Zone, Baotian 1st Road, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Zhongtou Huaxun Terahertz Technology Co.,Ltd. Patentee after: SHENZHEN TERAHERTZ SYSTEM EQUIPMENT Co.,Ltd. Address before: 518101 404, building 37, chentian Industrial Zone, chentian community, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Huaxun ark Photoelectric Technology Co.,Ltd. Patentee before: Shenzhen Terahertz System Equipment Co.,Ltd. Effective date of registration: 20201013 Address after: 518101 404, building 37, chentian Industrial Zone, chentian community, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Huaxun ark Photoelectric Technology Co.,Ltd. Patentee after: SHENZHEN TERAHERTZ SYSTEM EQUIPMENT Co.,Ltd. Address before: 518102 Guangdong Province, Baoan District Xixiang street Shenzhen City Tian Yi Lu Chen Tian Bao Industrial District 37 building two floor East Patentee before: SHENZHEN THZ SCIENCE AND TECHNOLOGY INNOVATION INSTITUTE Patentee before: Shenzhen Terahertz System Equipment Co.,Ltd. |
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Effective date of registration: 20210928 Address after: 518000 Shenzhen, Baoan District, Xixiang, Guangdong Xixiang street, thirty-seventh fields, 430 estate. Patentee after: Shenzhen Zhongtou Huaxun Terahertz Technology Co.,Ltd. Address before: 518101 room 430, building 37, chentian Industrial Zone, Baotian 1st Road, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Zhongtou Huaxun Terahertz Technology Co.,Ltd. Patentee before: SHENZHEN TERAHERTZ SYSTEM EQUIPMENT Co.,Ltd. |