CN106291006A - A kind of probe more changing device and replacing options thereof and test equipment - Google Patents

A kind of probe more changing device and replacing options thereof and test equipment Download PDF

Info

Publication number
CN106291006A
CN106291006A CN201610602438.6A CN201610602438A CN106291006A CN 106291006 A CN106291006 A CN 106291006A CN 201610602438 A CN201610602438 A CN 201610602438A CN 106291006 A CN106291006 A CN 106291006A
Authority
CN
China
Prior art keywords
probe
drive division
tube
replacing
box
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201610602438.6A
Other languages
Chinese (zh)
Other versions
CN106291006B (en
Inventor
王锦谦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BOE Technology Group Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to CN201610602438.6A priority Critical patent/CN106291006B/en
Publication of CN106291006A publication Critical patent/CN106291006A/en
Application granted granted Critical
Publication of CN106291006B publication Critical patent/CN106291006B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention provides a kind of probe more changing device and replacing options thereof and test equipment.This probe more changing device includes changing mechanism and auxiliary body, changes mechanism for being replaced probe;Auxiliary body is used for assisting replacing mechanism by standby probe pusher to changing position.This probe more changing device is capable of the automatic replacing to probe, automatically more transducing makes probe keep cleaning and position to put accurately in Renewal process, thus avoid and artificially manually changes the probe location after the probe caused is stained with foreign body and replacing and put inaccurate defect, and then reduce the test error of probe, improve the accuracy of probe test result;Meanwhile, automatically change the replacing efficiency also improving probe, thus improve the testing efficiency of probe.

Description

A kind of probe more changing device and replacing options thereof and test equipment
Technical field
The present invention relates to technical field of measurement and test, in particular it relates to a kind of probe more changing device and replacing options thereof and test Equipment.
Background technology
The most many display products are required for carrying out signal of telecommunication test in manufacturing process, and this most inevitably uses Some signal-testing apparatus.Most of signal-testing apparatus are all by applying test signals to test on probe, then will Test probe is manually plugged into corresponding test position and carries out signal testing.
Test probe is often damaged in test process, causes test result inaccurate, therefore, and great majority test Equipment is required for frequently changing probe.Replacing to probe at present is all manually to be changed, the most more by artificial Change easily cause probe be stained with foreign body or change after probe location put inaccurate, cause test time occur bigger Test error, has a strong impact on the accuracy of test result;Meanwhile, artificial probe of manually changing also makes testing efficiency on the low side.
Summary of the invention
The present invention is directed to above-mentioned technical problem present in prior art, it is provided that a kind of probe more changing device and replacing side thereof Method and test equipment.This probe more changing device is capable of the automatic replacing to probe, and the most more transducing makes probe change Journey keeps cleaning and position put accurately, thus avoid and artificially manually change after the probe caused is stained with foreign body and replacing Probe location put inaccurate defect, and then reduce the test error of probe, improve the accurate of probe test result Property;Meanwhile, automatically change the replacing efficiency also improving probe, thus improve the testing efficiency of probe.
The present invention provides a kind of probe more changing device, and including changing mechanism and auxiliary body, described replacing mechanism is for right Described probe is replaced;Described auxiliary body is used for assisting described replacing mechanism by standby probe pusher to changing position.
Preferably, described replacing mechanism includes probe box, is used for accommodating and provide described standby probe;
Replacing portion, for closure or openness under the effect of power, so that described probe departs from described replacing portion or described Described standby Probe clip is handled by replacing portion;
Described probe box is connected by the first probe tube with described replacing portion.
Preferably, one end back to described first probe tube of described probe box is provided with the second probe tube, and described second Probe tube connects with described probe box;
Described probe box includes top cover and bottom, and described bottom offers the first opening, described first probe tube and institute State bottom by described first open communication;The second opening, described second probe tube and described top cover is offered on described top cover By described second open communication;
Described first opening is corresponding with described second aperture position.
Preferably, described probe box also includes the first drive division and the chuck being arranged in box, the surrounding zone of described chuck Territory offers multiple draw-in groove, is used for placing described standby probe in described draw-in groove;
The center of described chuck is offered porose, and described first drive division connects described hole, is used for driving described chuck to rotate, So that each draw-in groove on described chuck can move to the position corresponding with described first opening and described second opening.
Preferably, described replacing portion includes holder and the second drive division, and described holder is clamped in described first probe The free end of pipe, described holder can close under the driving of described second drive division, will be located in described first probe tube certainly Handled by the described Probe clip held;Can also open under the driving of described second drive division, so that being positioned at described first probe tube The described probe of free end departs from described first probe tube.
Preferably, described auxiliary body includes that the 3rd drive division and thimble, described thimble are applied in described second probe tube In, and under the drive of described 3rd drive division, discrepancy motion can be done in described second probe tube;
Described 3rd drive division can promote described thimble to enter described probe box, with by described in corresponding described draw-in groove The free end of standby probe pusher extremely described first probe tube;Described 3rd drive division can also be by described thimble from described probe box Interior pull-out.
Preferably, described replacing mechanism also includes that control portion, described control portion are used for controlling described first drive division, described Second drive division and described 3rd drive division work.
Preferably, described control portion includes that switch member, detection piece and control piece, described switch member and described detection piece all connect Connect described control piece;
Described switch member can be opened, so that described control piece controls described first drive division, described second drive division and institute State the 3rd drive division work, so that described probe to be replaced;
Whether described detection piece has described probe for the free end detecting described first probe tube, and makes institute when not having State control piece and control described second drive division work, so that described second drive division drives described holder Guan Bi.
Preferably, described probe box also includes sidewall, and it is described that described sidewall is connected formation with described top cover and described bottom The shell of probe box;
Described shell and described chuck all use insulant.
Preferably, described first probe tube includes internal layer, intermediate layer and outer layer the most nested, described internal layer All using conductive material with described outer layer, described intermediate layer uses insulant;The structure of described second probe tube and described the One probe tube is identical;
Described thimble can contact with the internal layer of described first probe tube and described second probe tube;Described thimble uses and leads Electric material.
Preferably, described probe includes that probe bodies and probe set, one end of described probe bodies are needle cap, and the other end is Syringe needle, described probe set is set in described needle end, and the outer surface of described probe set can be with the internal layer phase of described first probe tube Contact;Needle cap is for contacting with described thimble;
The outer ring of described probe set uses conductive material, and the inner ring of described probe set uses flexible insulating material;
At the free end of described first probe tube, described thimble can promote the most described probe set of described probe bodies sliding It is dynamic, so that described syringe needle passes from described probe set.
The present invention also provides for a kind of test equipment, including above-mentioned probe more changing device.
The present invention also provides for the probe replacing options of a kind of above-mentioned probe more changing device, including: change mechanism to described spy Pin is replaced;Auxiliary body's auxiliary is described changes mechanism by standby probe pusher to changing position.
Preferably, described probe is replaced by described replacing mechanism;The described mechanism that changes of auxiliary body's auxiliary is by standby Probe pusher includes to changing position:
Second drive division drives holder to open, and the 3rd drive division promotes thimble to enter probe box, until will be located in first The described probe pusher of probe tube free end is to departing from described first probe tube;
Detecting when the free end of described first probe tube does not has described probe, described second drive division drives described clamping Part closes;
Described thimble is pulled out in probe box by described 3rd drive division;
First drive division drives chuck to rotate, and makes the draw-in groove being placed with standby probe on described chuck move to and the One opening and position corresponding to the second opening;
Described 3rd drive division promotes described thimble to enter described probe box, until by the described standby spy in described draw-in groove Pin is pushed to the free end of described first probe tube.
Beneficial effects of the present invention: probe provided by the present invention more changing device, by arranging replacing mechanism and auxiliary machine Structure, it is possible to realize the automatic replacing to probe, the most more transducing makes probe keep cleaning and position to put standard in Renewal process Really, thus avoid and artificially manually change the probe location after the probe caused is stained with foreign body and replacing and put inaccurate scarce Fall into, and then reduce the test error of probe, improve the accuracy of probe test result;Meanwhile, replacing also improves automatically The replacing efficiency of probe, thus improve the testing efficiency of probe.
Test equipment provided by the present invention, by using above-mentioned probe more changing device, it is achieved that to probe automatically the most more Change, thus not only increase test accuracy, and improve testing efficiency.
Accompanying drawing explanation
Fig. 1 is the structural representation of the embodiment of the present invention 1 middle probe more changing device;
Fig. 2 is the structural representation of Fig. 1 middle probe cassette bottom lid;
Fig. 3 is that the structure of Fig. 1 middle probe box analyses schematic diagram;
Fig. 4 is the structural representation of chuck in Fig. 1 middle probe box;
Fig. 5 is the structural representation in replacing portion in Fig. 1;
Fig. 6 is the probe structural representation when the first probe in-pipe;
Fig. 7 is the probe structural representation when moving to the free end of the first probe tube;
Fig. 8 is the probe more changing device structure principle chart when changing probe;
Fig. 9 is the flow chart of probe replacing options.
Description of reference numerals therein:
1. change mechanism;11. probe boxs;111. top cover;112. bottom;100. first openings;101. second openings;113. First drive division;114. chuck;102. draw-in groove;103. hole;12. replacing portions;121. holder;122. second drive divisions;13. One probe tube;14. second probe tubes;15. control portions;2. auxiliary body;21. the 3rd drive divisions;22. thimbles;3 probes;31. visit Pin body;311. needle cap;312. syringe needle;32. probe sets.
Detailed description of the invention
For making those skilled in the art be more fully understood that technical scheme, below in conjunction with the accompanying drawings and be embodied as A kind of probe more changing device provided by the present invention and replacing options thereof and test equipment are described in further detail by mode.
Embodiment 1:
The present embodiment provides a kind of probe more changing device, as it is shown in figure 1, include changing mechanism 1 and auxiliary body 2, changes Mechanism 1 is for being replaced probe 3;Auxiliary body 2 is used for assisting replacing mechanism 1 to be pushed to standby probe 3 change position.
Replacing position therein refers to the probe 3 fixed position when test, when the probe 3 being currently in use damages, changes Mechanism 1 replaces being in the probe 3 changed on position.
By arranging replacing mechanism 1 and auxiliary body 2, it is possible to realizing the automatic replacing to probe 3, the most more transducing makes spy Pin 3 keeps cleaning and position to put accurately in Renewal process, thus avoids and artificial manually change the probe 3 caused and be stained with Inaccurate defect is put in foreign body and probe 3 position after changing, and then reduces the test error of probe 3, improves probe 3 The accuracy of test result;Meanwhile, automatically change the replacing efficiency also improving probe 3, thus improve the test effect of probe 3 Rate.
Wherein, change mechanism 1 and include probe box 11, be used for accommodating and provide standby probe 3.Replacing portion 12, for dynamic Closure or openness under the effect of power, so that probe 3 departs from replacing portion 12 or replacing portion 12 and is clamped by standby probe 3.Probe box 11 are connected by the first probe tube 13 with replacing portion 12.The setting in replacing portion 12, the probe 3 damaged that can will be currently in use The standby new probe 3 deposited in being replaced by probe box 11.
In the present embodiment, one end back to the first probe tube 13 of probe box 11 is provided with the second probe tube 14, and second visits Needle tubing 14 connects with probe box 11.As shown in Figures 2 and 3, probe box 11 includes top cover 111 and bottom 112, and bottom 112 is opened Being provided with the first opening 100, the first probe tube 13 is connected by the first opening 100 with bottom 112;Second is offered on top cover 111 Opening 101, the second probe tube 14 is connected by the second opening 101 with top cover 111.First opening 100 and the second opening 101 position Corresponding.First probe tube 13 and the second probe tube 14 be disposed to after replacing the probe of damage 3 being currently in use, Make the standby probe 3 in probe box 11 can be fed to change position.
In the present embodiment, as shown in Figure 4, probe box 11 also includes the first drive division 113 and the chuck being arranged in box 114, the neighboring area of chuck 114 offers multiple draw-in groove 102, is used for placing standby probe 3 in draw-in groove 102.In chuck 114 The heart offers porose 103, and the first drive division 113 connecting hole 103 is used for driving chuck 114 to rotate, so that each on chuck 114 Draw-in groove 102 can move to the position corresponding with the first opening 100 and the second opening 101.
Wherein, draw-in groove 102 can be placed on standby probe 3 therein and block, and standby probe 3 can be at the work of outside motive force With lower disengaging draw-in groove 102.This holding principle based on draw-in groove 102, the fastening structure form in draw-in groove 102 does not limits, as holding is tied Structure can be provided in the resilient balls on draw-in groove 102 inwall, when being placed with standby probe 3 in draw-in groove 102, resilient balls energy Under the elastic acting force being perpendicular to draw-in groove 102 inwall, standby probe 3 is blocked;When standby probe 3 is by outside motive force effect Time, relative slip can be produced between its outer surface with resilient balls, thus under the effect of outside motive force, standby probe 3 energy Enough depart from draw-in groove 102.
It addition, the first drive division 113 is not limited, as long as chuck 114 can be driven to rotate, the first drive division 113 Any-mode can be used to be driven.As the first drive division 113 uses motor, motor shaft to be inserted in hole 103, motor shaft turns Kinetic energy drives chuck 114 to rotate.First drive division 113 can be arranged in probe box 11, it is also possible to is arranged on outside probe box 11, As: if motor is arranged on outside probe box 11, can offer open in the center of bottom 112 corresponding aperture 103 of probe box 11 Mouthful, so that motor shaft can enter in probe box 11 through this opening, and it is connected with the hole 103 on chuck 114.
In the present embodiment, as it is shown in figure 5, replacing portion 12 includes holder 121 and the second drive division 122, holder 121 presss from both sides Holding the free end at the first probe tube 13, holder 121 can close, will be located in first under the driving of the second drive division 122 The probe 3 of probe tube 13 free end clamps;Can also open under the driving of the second drive division 122, so that being positioned at the first probe The probe 3 of pipe 13 free end departs from the first probe tube 13.Wherein, the free end of the first probe tube 13 is probe 3 and changes position, Probe 3 is replaced by holder 121 in this position.The probe 3 of unspoiled normal work can be pressed from both sides by holder 121 Hold fixing, the probe damaged can be unloaded again.
It addition, do not limit the second drive division 122, as long as holder 121 can be driven to close and open, second drives Dynamic portion 122 can use any-mode to be driven.As the second drive division 122 can also use motor.
In the present embodiment, as Figure 1-Figure 5, auxiliary body 2 includes that the 3rd drive division 21 and thimble 22, thimble 22 run through In the second probe tube 14, and under the drive of the 3rd drive division 21, discrepancy motion can be done in the second probe tube 14.3rd drives Dynamic portion 21 can promote thimble 22 to enter probe box 11, so that the standby probe 3 in corresponding draw-in groove 102 is pushed to the first probe tube The free end of 13;Thimble 22 can also be pulled out in probe box 11 by the 3rd drive division 21.
Wherein, the effect of thimble 22 is mainly in probe 3 Renewal process, assists and is visited from first by the probe 3 damaged The free end of needle tubing 13 (namely probe 3 change position) is released;Can also assist simultaneously and the standby probe 3 in probe box 11 is promoted To the free end of the first probe tube 13, thus realize the replacing to probe 3.It addition, carry out the process of proper testing at probe 3 In, thimble 22 can also be pointed to the probe 3 of the free end of the first probe tube 13 to carry out promoting support, so that probe 3 can be consolidated Surely the free end being maintained at the first probe tube 13 carries out the signal testing of position to be tested.
It addition, the 3rd drive division 21 is not limited, as long as thimble 22 can be driven to make in the second probe tube 14 Entering motion, the 3rd drive division 21 can use any-mode to be driven.Such as: the 3rd drive division 21 uses electric piston or gas Dynamic piston, piston connects thimble 22 by connecting rod, and piston movement can drive thimble 22 in the second probe tube 14 by connecting rod Do discrepancy motion.
In the present embodiment, changing mechanism 1 and also include control portion 15, control portion 15 is for controlling the first drive division 113, second Drive division 122 and the 3rd drive division 21 work.
Wherein, control portion 15 includes that switch member, detection piece and control piece, switch member and detection piece are all connected with control piece.Open Close part can open, so that control piece controls first drive division the 113, second drive division 122 and the 3rd drive division 21 works, with to spy Pin 3 is replaced.In the present embodiment, control piece is control chip.Detection piece for the free end of detection the first probe tube 13 is No have a probe 3, and makes control piece control the second drive division 122 to work, so that the second drive division 122 drives holder when not having 121 Guan Bis.
In the present embodiment, switch member uses button, and button is arranged on the control panel of this probe more changing device, once sends out Probe 3 in now working has damage, can press the button, to start the Each part replacement operation to probe 3.Detection piece is adopted With sensor, the effect of sensor mainly detection, when the free end of the first probe tube 13 does not has probe 3, makes holder 121 Guan Bi.The setting of sensor, it is possible to fall into row detection to the probe damaged is the most unloaded, do not have on position so that it is guaranteed that change Having when damaging probe 3, standby probe 3 just can be replaced this position, it is to avoid has damaged probe 3 and has not also uninstalled, standby spy Pin 3 has been moved to this position the most, easily causes standby probe 3 damaged when changing.
In the present embodiment, probe box 11 also includes sidewall, and sidewall is connected formation probe box 11 with top cover 111 and bottom 112 Shell;Shell and chuck 114 all use insulant.Owing to probe 3 and thimble 22 are all electric conductors, insulant can make spy Pin 3 will not be charged at Renewal process housing and chuck 114, ensures that the safety that probe 3 is changed.
In the present embodiment, the first probe tube 13 includes the most nested internal layer, intermediate layer and outer layer, internal layer and Outer layer all uses conductive material, and intermediate layer uses insulant;The structure of the second probe tube 14 is identical with the first probe tube 13.Top Pin 22 can contact with the internal layer of the first probe tube 13 and the second probe tube 14.Thimble 22 uses conductive material.
Wherein, the test signal on probe 3 is introduced by the internal layer of the second probe tube 14, therefore, thimble 22 can by with The internal layer of the first probe tube 13 and the second probe tube 14 contacts and is conducted to probe 3 by test signal.First probe tube 13 The test signal being applied on its internal layer can be played good shielding action with the outer layer conductive layer of the second probe tube 14, it is to avoid Test signal is interfered.
In the present embodiment, as shown in Figure 6 and Figure 7, probe 3 includes probe bodies 31 and probe set 32, probe bodies 31 One end is needle cap 311, and the other end is syringe needle 312, and probe set 32 is set in syringe needle 312 end, and the outer surface of probe set 32 can be with The internal layer of one probe tube 13 contacts;Needle cap 311 is for contacting with thimble 22.The outer ring of probe set 32 uses conductive material, visits The inner ring of needle guard 32 uses flexible insulating material;At the free end of the first probe tube 13, thimble 22 can promote probe bodies 31 phase Probe set 32 is slided, so that syringe needle 312 passes from probe set 32.When test, syringe needle 312 penetrates position to be tested, Introduce test signals into and test.
Wherein, when probe 3 moves to the free end of the first probe tube 13, due to the flexible insulation material of probe set 32 inner ring Material there is certain elasticity, it is possible to probe bodies 31 flexible contact, so probe bodies 31 can be played guarantor by probe set 32 The effect protected;On the other hand, probe is introduced test signals into owing to probe bodies 31 is contacted with thimble 22 by needle cap 311 Body 31, only needle cap 311 and the contacts contact face of thimble 22 are long-pending less, and the outer ring of probe set 32 is conductive material, its outer ring and the The internal layer of one probe tube 13 contacts and can increase probe 3 and the contact area of the first probe tube 13 internal layer, so that being applied to The test signal of the second probe tube 14 internal layer can be advantageously incorporated in probe bodies 31, makes test result more accurately may be used Lean on.
Said structure based on probe more changing device, the present embodiment also provides for the probe of a kind of this probe more changing device and changes Method, including: change mechanism and probe is replaced;Auxiliary body's auxiliary changes mechanism by standby probe pusher to change bit Put.
As shown in Figure 8 and Figure 9, this probe replacing options specifically includes:
Step S1: the second drive division 122 drives holder 121 to open, and the 3rd drive division 21 promotes thimble 22 to enter probe Box 11, until the probe 3 that will be located in the first probe tube 13 free end is pushed to depart from the first probe tube 13.
In this step, when finding that the probe 3 being currently in use damages, make switch member open, as pressed shift knob, control Part controls the second drive division 122 and drives holder 121 to open, and the probe 3 being positioned at the first probe tube 13 free end departs from the first spy Needle tubing 13.Wherein, control piece is control chip, and control chip sends control signal to the second drive division 122, controls the second driving Portion 122 performs corresponding operating.
Step S2: detect that, when the free end of the first probe tube 13 does not has probe 3, the second drive division 122 drives holder 121 Guan Bis.
In this step, detection piece detects when the free end of the first probe tube 13 does not has probe 3, sends detection to control piece Signal, control piece sends control signal according to detection signal to the second drive division 122, and the second drive division 122 drives holder 121 Guan Bi.
Step S3: thimble 22 is pulled out in probe box 11 by the 3rd drive division 21.
In this step, control piece sends control signal to the 3rd drive division 21, the 3rd drive division 21 by thimble 22 from probe Pull-out in box 11.
Step S4: the first drive division 113 drives chuck to rotate, makes the draw-in groove being placed with standby probe on chuck move To the position corresponding with the first opening and the second opening.
In this step, control piece sends control signal to the first drive division 113, and the first drive division 113 drives chuck to rotate, The draw-in groove being placed with standby probe on chuck is made to move to the position corresponding with the first opening and the second opening.
Step S5: the 3rd drive division 21 promotes thimble 22 to enter probe box 11, until by the standby probe pusher in draw-in groove Free end to the first probe tube 13.
In this step, control piece sends control signal to the 3rd drive division 21, and the 3rd drive division 21 promotes thimble 22 to enter Probe box 11, until by the free end of the standby probe pusher in draw-in groove to the first probe tube 13.
So far, probe 3 is changed complete.
The beneficial effect of embodiment 1: the probe more changing device provided in the present embodiment, by arranging replacing mechanism and auxiliary Mechanism, it is possible to realize the automatic replacing to probe, the most more transducing makes probe keep cleaning and position to put in Renewal process Accurately, thus avoid and artificially manually change the probe location after the probe caused is stained with foreign body and replacing and put inaccurate Defect, and then reduce the test error of probe, improve the accuracy of probe test result;Meanwhile, automatic replacing also improves The replacing efficiency of probe, thus improve the testing efficiency of probe.
Embodiment 2:
The present embodiment provides a kind of test equipment, including the more changing device of the probe in embodiment 1.
By using the probe more changing device in embodiment 1, make this test equipment be capable of probe and automatically change, thus Not only increase test accuracy, and improve testing efficiency.
It is understood that the principle that is intended to be merely illustrative of the present of embodiment of above and the exemplary enforcement that uses Mode, but the invention is not limited in this.For those skilled in the art, in the essence without departing from the present invention In the case of god and essence, can make various modification and improvement, these modification and improvement are also considered as protection scope of the present invention.

Claims (14)

1. a probe more changing device, it is characterised in that including changing mechanism and auxiliary body, described replacing mechanism is for institute State probe to be replaced;Described auxiliary body is used for assisting described replacing mechanism by standby probe pusher to changing position.
Probe the most according to claim 1 more changing device, it is characterised in that described replacing mechanism includes probe box, is used for Accommodate and described standby probe is provided;
Replacing portion, for closure or openness under the effect of power, so that described probe departs from described replacing portion or described replacing Described standby Probe clip is handled by portion;
Described probe box is connected by the first probe tube with described replacing portion.
Probe the most according to claim 2 more changing device, it is characterised in that described probe box back to described first probe One end of pipe is provided with the second probe tube, and described second probe tube connects with described probe box;
Described probe box includes top cover and bottom, and described bottom offers the first opening, described first probe tube and the described end Lid is by described first open communication;Offering the second opening on described top cover, described second probe tube passes through with described top cover Described second open communication;
Described first opening is corresponding with described second aperture position.
Probe the most according to claim 3 more changing device, it is characterised in that described probe box also include the first drive division and The chuck being arranged in box, the neighboring area of described chuck offers multiple draw-in groove, is used for placing described standby in described draw-in groove Probe;
The center of described chuck is offered porose, and described first drive division connects described hole, is used for driving described chuck to rotate, so that Each draw-in groove on described chuck can move to the position corresponding with described first opening and described second opening.
Probe the most according to claim 4 more changing device, it is characterised in that described replacing portion includes that holder and second drives Dynamic portion, described holder is clamped in the free end of described first probe tube, and described holder can driving at described second drive division Dynamic lower Guan Bi, handles will be located in the described Probe clip of described first probe tube free end;Can also be at described second drive division Drive lower unlatching, so that the described probe being positioned at described first probe tube free end departs from described first probe tube.
Probe the most according to claim 5 more changing device, it is characterised in that described auxiliary body include the 3rd drive division and Thimble, described thimble is applied in described second probe tube, and can visit described second under the drive of described 3rd drive division Needle tubing does discrepancy motion;
Described 3rd drive division can promote described thimble to enter described probe box, described standby with by corresponding described draw-in groove The free end of probe pusher extremely described first probe tube;Described thimble can also be drawn in described probe box by described 3rd drive division Go out.
Probe the most according to claim 6 more changing device, it is characterised in that described replacing mechanism also includes control portion, institute State control portion for controlling described first drive division, described second drive division and described 3rd drive division work.
Probe the most according to claim 7 more changing device, it is characterised in that described control portion includes switch member, detection piece With control piece, described switch member and described detection piece are all connected with described control piece;
Described switch member can be opened, so that described control piece controls described first drive division, described second drive division and described the Three drive division work, to be replaced described probe;
Whether described detection piece has described probe for the free end detecting described first probe tube, and makes described control when not having Product controls described second drive division work, so that described second drive division drives described holder Guan Bi.
Probe the most according to claim 4 more changing device, it is characterised in that described probe box also includes sidewall, described side Wall is connected the shell forming described probe box with described top cover and described bottom;
Described shell and described chuck all use insulant.
Probe the most according to claim 6 more changing device, it is characterised in that described first probe tube includes from inside to outside Internal layer, intermediate layer and outer layer nested successively, described internal layer and described outer layer all use conductive material, and described intermediate layer uses absolutely Edge material;The structure of described second probe tube is identical with described first probe tube;
Described thimble can contact with the internal layer of described first probe tube and described second probe tube;Described thimble uses conduction material Material.
11. probe according to claim 10 more changing devices, it is characterised in that described probe includes probe bodies and probe Set, one end of described probe bodies is needle cap, and the other end is syringe needle, and described probe set is set in described needle end, described probe The outer surface of set can contact with the internal layer of described first probe tube;Needle cap is for contacting with described thimble;
The outer ring of described probe set uses conductive material, and the inner ring of described probe set uses flexible insulating material;
At the free end of described first probe tube, described thimble can promote the most described probe set of described probe bodies to slide, with Described syringe needle is made to pass from described probe set.
12. 1 kinds of test equipment, it is characterised in that include the more changing device of the probe described in claim 1-11 any one.
13. 1 kinds of probe replacing options of probe more changing device as described in claim 1-11 any one, it is characterised in that bag Include: change mechanism and described probe is replaced;Auxiliary body's auxiliary is described changes mechanism by standby probe pusher to change bit Put.
14. probe replacing options according to claim 13, it is characterised in that described probe is carried out by described replacing mechanism Change;Standby probe pusher is included by the described mechanism that changes of auxiliary body's auxiliary to changing position:
Second drive division drives holder to open, and the 3rd drive division promotes thimble to enter probe box, until will be located in the first probe The described probe pusher of pipe free end is to departing from described first probe tube;
Detecting when the free end of described first probe tube does not has described probe, described second drive division drives described holder to close Close;
Described thimble is pulled out in probe box by described 3rd drive division;
First drive division drives chuck to rotate, and makes the draw-in groove being placed with standby probe on described chuck move to first and opens The position that mouth is corresponding with the second opening;
Described 3rd drive division promotes described thimble to enter described probe box, until being pushed away by the described standby probe in described draw-in groove Move the free end to described first probe tube.
CN201610602438.6A 2016-07-27 2016-07-27 A kind of probe more changing device and its replacing options and test equipment Active CN106291006B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610602438.6A CN106291006B (en) 2016-07-27 2016-07-27 A kind of probe more changing device and its replacing options and test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610602438.6A CN106291006B (en) 2016-07-27 2016-07-27 A kind of probe more changing device and its replacing options and test equipment

Publications (2)

Publication Number Publication Date
CN106291006A true CN106291006A (en) 2017-01-04
CN106291006B CN106291006B (en) 2019-01-22

Family

ID=57662812

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610602438.6A Active CN106291006B (en) 2016-07-27 2016-07-27 A kind of probe more changing device and its replacing options and test equipment

Country Status (1)

Country Link
CN (1) CN106291006B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110297110A (en) * 2018-03-21 2019-10-01 科磊股份有限公司 Probe structure, fixture, container, automation probe replacement system and method
CN113391101A (en) * 2021-04-25 2021-09-14 西安交通大学 Shell-core microprobe and preparation method thereof

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5105148A (en) * 1991-01-24 1992-04-14 Itt Corporation Replaceable tip test probe
JPH0772209A (en) * 1993-06-14 1995-03-17 Hioki Ee Corp Probe for detecting component on circuit board
CN2525522Y (en) * 2002-02-02 2002-12-11 中国科学院长春光学精密机械与物理研究所 Electronic probe
CN2862044Y (en) * 2005-11-17 2007-01-24 广辉电子股份有限公司 Probe removal device
CN200956035Y (en) * 2006-08-24 2007-10-03 中国探针股份有限公司 Replaceable probe structure
CN101930016A (en) * 2009-06-19 2010-12-29 旺矽科技股份有限公司 Replaceable probe device and probe card applied by same
CN202916308U (en) * 2012-11-08 2013-05-01 王焕平 Programming test needle apparatus and system capable of rapid replacement
CN104044767A (en) * 2013-12-19 2014-09-17 中国人民解放军第二军医大学 Replacing head arranging and filling equipment
CN203850607U (en) * 2014-04-30 2014-09-24 乔讯电子(上海)有限公司 Inner pin detection device used for pin plugging machine
CN204366893U (en) * 2014-12-05 2015-06-03 国家电网公司 Change electric energy meter intelligent checking table to plug into the device of probe
CN104932135A (en) * 2015-05-18 2015-09-23 合肥京东方光电科技有限公司 Device and method for changing probes
CN204659201U (en) * 2015-04-30 2015-09-23 天津长荣印刷设备股份有限公司 A kind of device of quick-replaceable roller
CN204694732U (en) * 2015-04-20 2015-10-07 武汉新芯集成电路制造有限公司 Board probe more changing device

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5105148A (en) * 1991-01-24 1992-04-14 Itt Corporation Replaceable tip test probe
JPH0772209A (en) * 1993-06-14 1995-03-17 Hioki Ee Corp Probe for detecting component on circuit board
CN2525522Y (en) * 2002-02-02 2002-12-11 中国科学院长春光学精密机械与物理研究所 Electronic probe
CN2862044Y (en) * 2005-11-17 2007-01-24 广辉电子股份有限公司 Probe removal device
CN200956035Y (en) * 2006-08-24 2007-10-03 中国探针股份有限公司 Replaceable probe structure
CN101930016A (en) * 2009-06-19 2010-12-29 旺矽科技股份有限公司 Replaceable probe device and probe card applied by same
CN202916308U (en) * 2012-11-08 2013-05-01 王焕平 Programming test needle apparatus and system capable of rapid replacement
CN104044767A (en) * 2013-12-19 2014-09-17 中国人民解放军第二军医大学 Replacing head arranging and filling equipment
CN203850607U (en) * 2014-04-30 2014-09-24 乔讯电子(上海)有限公司 Inner pin detection device used for pin plugging machine
CN204366893U (en) * 2014-12-05 2015-06-03 国家电网公司 Change electric energy meter intelligent checking table to plug into the device of probe
CN204694732U (en) * 2015-04-20 2015-10-07 武汉新芯集成电路制造有限公司 Board probe more changing device
CN204659201U (en) * 2015-04-30 2015-09-23 天津长荣印刷设备股份有限公司 A kind of device of quick-replaceable roller
CN104932135A (en) * 2015-05-18 2015-09-23 合肥京东方光电科技有限公司 Device and method for changing probes

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110297110A (en) * 2018-03-21 2019-10-01 科磊股份有限公司 Probe structure, fixture, container, automation probe replacement system and method
CN110297110B (en) * 2018-03-21 2022-02-15 科磊股份有限公司 Probe structure, clamp, containing box, automatic probe replacing system and method
CN113391101A (en) * 2021-04-25 2021-09-14 西安交通大学 Shell-core microprobe and preparation method thereof

Also Published As

Publication number Publication date
CN106291006B (en) 2019-01-22

Similar Documents

Publication Publication Date Title
US12188874B2 (en) Chemiluminescence detector and detection method thereof
CN108132388B (en) Test device for determining electromagnetic performance of measured object
CN109406801A (en) Sample analyser and its sample collection and distribution method
CN109406804B (en) Full-automatic chemiluminescence determinator
CN106291006A (en) A kind of probe more changing device and replacing options thereof and test equipment
CN107271433A (en) A kind of luminous measuring method of single reaction cup
CN215492662U (en) Urine analysis device, closestool and urinal
CN208060522U (en) The locating and detecting device of Urine Analyzer test paper
CN111123121A (en) Clamping detection clamp for battery and battery assembling equipment
CN115184592A (en) Immunoassay detection equipment and detection method
CN103288022B (en) Test tube cover collection mechanism
KR102512741B1 (en) Lead wire withdrawal device
CN210781356U (en) Wireless earphone test equipment
CN114041829B (en) Throat swab detection device
TW201816398A (en) Titration module of bio-chip and titration test apparatus thereof
JP5850310B2 (en) Eyeglass frame shape measuring device
CN208913923U (en) Oil pump automatic assembly line jig
CN210886019U (en) A antifouling antibiotic detection device for touch-sensitive screen
CN108927752A (en) Oil pump automatic assembly line jig
CN104479991B (en) A kind of instrument for extracting nucleic acid list gun apparatus
CN215834113U (en) Visual ice bath box experimental apparatus
CN221078852U (en) SiC power device product testing device
CN105507730B (en) A kind of measuring chamber automatic switch door gear of chemical luminescence detector device
CN204214600U (en) Inhale vacuum test
CN117498062A (en) Medical examination apparatus and method for operating medical examination apparatus

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant