CN106226965A - 一种基于igzo‑tft的boa液晶面板的结构及制作方法 - Google Patents

一种基于igzo‑tft的boa液晶面板的结构及制作方法 Download PDF

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CN106226965A
CN106226965A CN201610796745.2A CN201610796745A CN106226965A CN 106226965 A CN106226965 A CN 106226965A CN 201610796745 A CN201610796745 A CN 201610796745A CN 106226965 A CN106226965 A CN 106226965A
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igzo
thin film
carry out
drain electrode
tft
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CN106226965B (zh
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石龙强
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Priority to CN201610796745.2A priority Critical patent/CN106226965B/zh
Publication of CN106226965A publication Critical patent/CN106226965A/zh
Priority to PCT/CN2017/070280 priority patent/WO2018040464A1/zh
Priority to US15/328,920 priority patent/US10191339B2/en
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Abstract

本发明提供一种基于IGZO‑TFT的BOA液晶面板的结构及制作方法,其中方法具有如下步骤:(1)制作黑色矩阵;(2)制作栅;(3)制作GI;(4)制作源漏极;(5)制作IGZO;(6)制作PV;(7)制作R/G/B;(8)制作ITO。本发明提出了用氧化铜做黑色矩阵的共平面结构的IGZO‑TFT的BOA器件,有效地避免IGZO被刻蚀的风险。

Description

一种基于IGZO-TFT的BOA液晶面板的结构及制作方法
技术领域
本发明涉及液晶领域,特别涉及一种基于IGZO-TFT的BOA液晶面板的结构及制作方法。
背景技术
首先,解释两个名词,IGZO(indium gallium zinc oxide,铟镓锌氧化物)为一种金属氧化物,而TFT(Thin Film Transistor)为薄膜晶体管。BOA(Black Martix On Array,黑色矩阵做在阵列基板上)是目前一种流行的LCD做法。该工艺省去了CF(color filter,彩色滤光片)基板,这样做不仅减去了CF工艺,降低成本,而且提高了制程的对位精度,有利于高开口率和高分辨率显示器的制作。
传统BOA的BM(Black Martix黑色矩阵)为有机光阻,是做完R、G、B后再做图案化处理。由于黑色矩阵对光学密度(OD)要求高,而现有的针对BOA结构的黑色矩阵(BM)的对光学密度值低,所以黑色矩阵(BM)涂布很厚,然而这样会导致遮挡阵列基板上的对位标记(mark),不利于制程中的曝光对位,而且,过高的黑色矩阵的tapper角度难控制,比较陡,容易造成像素(pixel)ITO(ITO是一种N型氧化物半导体-氧化铟锡,ITO薄膜即铟锡氧化物半导体透明导电膜)搭接上去会断线的问题。
金属氧化物的绝缘性比较好,然而许多金属氧化物,特别是容易工业化应用的材料,大多数透光性能好,如三氧化二铝(Al2O3),不适合做黑色矩阵(BM)材料,然而,本发明的发明人发现氧化铜(CuO)是一种黑色的氧化物,而且极易用于工业化生产,可以用来做BM材料。
IGZO由于高迁移率,成膜均匀性好,易于大尺寸化制作,并且和砷(As)有相同的制程,是很好的TFT有源层材料。近年来得到广泛发展。IGZO由于和ITO的性质相似,容易被铝(Al)酸刻蚀,所以一般而言,不适合做BCE(BackChannel Etched,背沟道刻蚀型)结构的器件。因为BCE结构在刻蚀源漏极的同时,会将IGZO层刻蚀掉,导致TFT器件制作失败。
鉴于此,本发明的发明人设计出一种基于IGZO-TFT的BOA液晶面板的结构和制作方法,以克服上述缺陷。
发明内容
本发明的目的是提供一种基于IGZO-TFT的BOA液晶面板的结构及制作方法,其提出了用氧化铜做黑色矩阵的共平面结构的IGZO-TFT的BOA器件,有效地避免IGZO被刻蚀的风险。
为达上述目的,本发明提供一种基于IGZO-TFT的BOA液晶面板的制作方法,其具有如下步骤:
(1)制作黑色矩阵:在基板上进行铜成膜,然后经过氧化处理得到氧化铜,再进行图案化处理并裸露出开口区域,得到黑色矩阵图形;
(2)制作栅:在所述黑色矩阵图形进行栅成膜,然后曝光,得到栅图形;
(3)制作GI:在步骤(2)的成品上进行GI成膜,形成GI薄膜;
(4)制作源漏极:在由GI薄膜覆盖的栅图形上进行源漏极成膜,然后曝光,得到源漏极图形;
(5)制作IGZO:在由GI薄膜覆盖的栅图形上并且在源漏极之间进行IGZO成膜,得到IGZO图形;
(6)制作PV:在步骤(5)的成品上进行PV成膜,穿过PV薄膜在源漏极上制作接触孔;
(7)制作R/G/B:在步骤(6)的成品上进行R/G/B涂布,留出所述接触孔,并曝光得到所需图形;
(8)制作ITO:覆盖接触孔以及所述开口区域进行ITO成膜,然后曝光,得到ITO图形。
所述的基于IGZO-TFT的BOA液晶面板的制作方法,其中,在步骤(1)中,是通过物理气相沉积进行铜成膜。
所述的基于IGZO-TFT的BOA液晶面板的制作方法,其中,在步骤(2)中,是通过物理气相沉积进行栅成膜,然后曝光,再通过干法刻蚀得到栅图形,所述栅图形的材料为铜。
所述的基于IGZO-TFT的BOA液晶面板的制作方法,其中,在步骤(3)中,是通过化学气相沉积进行GI成膜,所述GI薄膜的材料为二氧化硅。
所述的基于IGZO-TFT的BOA液晶面板的制作方法,其中,在步骤(4)中,是通过物理气相沉积进行源漏极成膜,然后曝光,再通过湿法刻蚀得到源漏极图形,所述源漏极图形的材料为铜。
所述的基于IGZO-TFT的BOA液晶面板的制作方法,其中,在步骤(5)中,是通过物理气相沉积进行金属氧化物IGZO成膜,然后曝光,再通过湿法刻蚀得到IGZO图形。
所述的基于IGZO-TFT的BOA液晶面板的制作方法,其中,在步骤(6)中,是通过化学气相沉积进行PV成膜,PV的材料为SiO2
所述的基于IGZO-TFT的BOA液晶面板的制作方法,其中,在步骤(8)中,是通过物理气相沉积进行ITO成膜,然后曝光,再通过湿法刻蚀得到ITO图形。
本发明还提供一种基于IGZO-TFT的BOA液晶面板的结构,其包括基板,所述基板上具有黑色矩阵图形,并且所述黑色矩阵图形将开口区域裸露出来,所述黑色矩阵图形上具有栅图形,所述基板、黑色矩阵图形以及栅图形上具有GI薄膜,在由GI薄膜覆盖的栅图形上具有源漏极,并且在由GI薄膜覆盖的栅图形上以及源漏极之间具有IGZO薄膜,在所述源漏极、IGZO薄膜以及GI薄膜上具有PV薄膜,并且PV薄膜在对应源漏极处具有接触孔,在PV薄膜上除接触孔外具有R/G/B涂布层,覆盖接触孔以及所述开口区域具有ITO图形。
所述的基于IGZO-TFT的BOA液晶面板的结构,其中,所述黑色矩阵图形由氧化铜形成。
本发明的有益效果是:本发明针对现有BOA结构黑色矩阵(BM)难制作和IGZO-TFT中BCE结构中IGZO被刻蚀的难点,提出了用氧化铜做黑色矩阵的共平面结构的IGZO-TFT的BOA器件,有效的解决了问题。此外,本发明采用底栅底接触的结构,制作即先做源漏极,再做IGZO,这样有效的避免IGZO被刻蚀的风险。
附图说明
在下文中将基于实施例并参考附图来对本发明进行更详细的描述。其中:
图1是制作BM图形的示意图;
图2是制作Gate图形的示意图;
图3是制作GI薄膜的示意图;
图4是制作源漏极的示意图;
图5是制作IGZO图形的示意图;
图6是制作PV薄膜的示意图;
图7是制作R/G/B的示意图;
图8是制作ITO图形的示意图。
在附图中,相同的部件使用相同的附图标记。附图并未按照实际的比例。
具体实施方式
下面将结合附图对本发明作进一步说明。
本发明提供一种基于IGZO-TFT的BOA液晶面板的制作方法,其具有如下步骤:
(1)制作黑色矩阵(BM):
如图1所示,首先,在基板1上通过物理气相沉积(Physical Vapor Deposition,PVD)进行铜(Cu)成膜,然后进行氧等离子体(O2plasma)处理,得到氧化铜(CuO),即利用氧化铜(CuO)做BM的遮挡层,进行图案化处理,并且裸露出开口区域3。然后进行曝光,湿法刻蚀得到BM图形2。需要强调的是,BM图形仅仅裸露出开口区域3。
(2)制作栅(Gate):
如图2所示,在BM图形2上通过物理气相沉积(PVD)进行Gate成膜,然后曝光,干法刻蚀得到Gate图形4。优选地,Gate图形4的材料优选为铜(Cu)。
(3)制作GI:
如图3所示,在整体上通过化学气相沉积(Chemical Vapor Deposition,CVD)进行GI成膜。优选地,GI薄膜5的材料优选为二氧化硅(SiO2)。
(4)制作源漏极:
如图4所示,在由GI薄膜5覆盖的Gate图形4上通过物理气相沉积(PVD)进行源漏极成膜,然后曝光,湿法刻蚀得到源漏极图形。优选地,源漏极6的材料优选为铜(Cu)。
(5)制作金属氧化物:
如图5所示,在由GI薄膜5覆盖的Gate图形4上、源漏极之间通过物理气相沉积(PVD)进行金属氧化物(IGZO)成膜,然后曝光,湿法刻蚀得到金属氧化物(IGZO)图形7。
(6)制作PV:
如图6所示,在整体上通过化学气相沉积(CVD)进行PV成膜,穿过PV薄膜8在源漏极6上通过干刻蚀得到像素(Pixel)的接触孔9。优选地,PV材料优选为SiO2
(7)制作R/G/B:
如图7所示,在整体上进行R/G/B 10涂布,留出所述接触孔9,并曝光得到所需图形。
(8)制作ITO:
如图8所示,覆盖接触孔9以及所述开口区域3、通过物理气相沉积(PVD)进行ITO成膜,然后曝光,湿法刻蚀得到ITO图形11。
此外,本发明还提供一种基于IGZO-TFT的BOA液晶面板的结构,如图8所示,其主要包括基板1,基板1上具有BM图形2,并且所述BM图形2将开口区域3裸露出来,所述BM图形2上具有Gate图形4,所述基板1、BM图形2以及Gate图形4上具有GI薄膜5,在由GI薄膜5覆盖的Gate图形4上具有源漏极6,在由GI薄膜5覆盖的Gate图形4上、源漏极6之间具有IGZO薄膜7,在整体上具有PV薄膜8,并且PV薄膜8在对应源漏极6处具有接触孔9,在整体上进行R/G/B10涂布,留出所述接触孔9,覆盖接触孔9以及所述开口区域3具有ITO图形11。
综上所述,本发明的有益效果是:
本发明针对现有BOA结构BM难制作和IGZO-TFT中BCE结构中IGZO被刻蚀的难点,提出了用CuO做BM的共平面结构(Coplanar Structrue)的IGZO-TFT的BOA器件,有效的解决了问题。此外,本发明采用底栅底接触的结构(coplanar),制作即先做源漏极,再做IGZO,这样有效的避免IGZO被刻蚀的风险。
虽然已经参考优选实施例对本发明进行了描述,但在不脱离本发明的范围的情况下,可以对其进行各种改进并且可以用等效物替换其中的部件。尤其是,只要不存在结构冲突,各个实施例中所提到的各项技术特征均可以任意方式组合起来。本发明并不局限于文中公开的特定实施例,而是包括落入权利要求的范围内的所有技术方案。

Claims (10)

1.一种基于IGZO-TFT的BOA液晶面板的制作方法,其特征在于,具有如下步骤:
(1)制作黑色矩阵:在基板上进行铜成膜,然后经过氧化处理得到氧化铜,再进行图案化处理并裸露出开口区域,得到黑色矩阵图形;
(2)制作栅:在所述黑色矩阵图形进行栅成膜,然后曝光,得到栅图形;
(3)制作GI:在步骤(2)的成品上进行GI成膜,形成GI薄膜;
(4)制作源漏极:在由GI薄膜覆盖的栅图形上进行源漏极成膜,然后曝光,得到源漏极图形;
(5)制作IGZO:在由GI薄膜覆盖的栅图形上并且在源漏极之间进行IGZO成膜,得到IGZO图形;
(6)制作PV:在步骤(5)的成品上进行PV成膜,穿过PV薄膜在源漏极上制作接触孔;
(7)制作R/G/B:在步骤(6)的成品上进行R/G/B涂布,留出所述接触孔,并曝光得到所需图形;
(8)制作ITO:覆盖接触孔以及所述开口区域进行ITO成膜,然后曝光,得到ITO图形。
2.根据权利要求1所述的基于IGZO-TFT的BOA液晶面板的制作方法,其特征在于,在步骤(1)中,是通过物理气相沉积进行铜成膜。
3.根据权利要求1所述的基于IGZO-TFT的BOA液晶面板的制作方法,其特征在于,在步骤(2)中,是通过物理气相沉积进行栅成膜,然后曝光,再通过干法刻蚀得到栅图形,所述栅图形的材料为铜。
4.根据权利要求1所述的基于IGZO-TFT的BOA液晶面板的制作方法,其特征在于,在步骤(3)中,是通过化学气相沉积进行GI成膜,所述GI薄膜的材料为二氧化硅。
5.根据权利要求1所述的基于IGZO-TFT的BOA液晶面板的制作方法,其特征在于,在步骤(4)中,是通过物理气相沉积进行源漏极成膜,然后曝光,再通过湿法刻蚀得到源漏极图形,所述源漏极图形的材料为铜。
6.根据权利要求1所述的基于IGZO-TFT的BOA液晶面板的制作方法,其特征在于,在步骤(5)中,是通过物理气相沉积进行金属氧化物IGZO成膜,然后曝光,再通过湿法刻蚀得到IGZO图形。
7.根据权利要求1所述的基于IGZO-TFT的BOA液晶面板的制作方法,其特征在于,在步骤(6)中,是通过化学气相沉积进行PV成膜,PV的材料为SiO2
8.根据权利要求1所述的基于IGZO-TFT的BOA液晶面板的制作方法,其特征在于,在步骤(8)中,是通过物理气相沉积进行ITO成膜,然后曝光,再通过湿法刻蚀得到ITO图形。
9.一种基于IGZO-TFT的BOA液晶面板的结构,其特征在于,包括基板,所述基板上具有黑色矩阵图形,并且所述黑色矩阵图形将开口区域裸露出来,所述黑色矩阵图形上具有栅图形,所述基板、黑色矩阵图形以及栅图形上具有GI薄膜,在由GI薄膜覆盖的栅图形上具有源漏极,并且在由GI薄膜覆盖的栅图形上以及源漏极之间具有IGZO薄膜,在所述源漏极、IGZO薄膜以及GI薄膜上具有PV薄膜,并且PV薄膜在对应源漏极处具有接触孔,在PV薄膜上除接触孔外具有R/G/B涂布层,覆盖接触孔以及所述开口区域具有ITO图形。
10.根据权利要求9所述的基于IGZO-TFT的BOA液晶面板的结构,其特征在于,所述黑色矩阵图形由氧化铜形成。
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