CN106133536B - 集成电路动态去老化 - Google Patents
集成电路动态去老化 Download PDFInfo
- Publication number
- CN106133536B CN106133536B CN201580017723.5A CN201580017723A CN106133536B CN 106133536 B CN106133536 B CN 106133536B CN 201580017723 A CN201580017723 A CN 201580017723A CN 106133536 B CN106133536 B CN 106133536B
- Authority
- CN
- China
- Prior art keywords
- aging
- input
- delay
- output
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B11/00—Automatic controllers
- G05B11/01—Automatic controllers electric
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
- H03K19/00384—Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/01—Details
- H03K3/012—Modifications of generator to improve response time or to decrease power consumption
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/03—Astable circuits
- H03K3/0315—Ring oscillators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Nonlinear Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Automation & Control Theory (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201461973765P | 2014-04-01 | 2014-04-01 | |
US61/973,765 | 2014-04-01 | ||
US14/507,679 | 2014-10-06 | ||
US14/507,679 US20150277393A1 (en) | 2014-04-01 | 2014-10-06 | Integrated circuit dynamic de-aging |
PCT/US2015/018785 WO2015153048A1 (en) | 2014-04-01 | 2015-03-04 | Integrated circuit dynamic de-aging |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106133536A CN106133536A (zh) | 2016-11-16 |
CN106133536B true CN106133536B (zh) | 2019-09-13 |
Family
ID=54190208
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201580017723.5A Expired - Fee Related CN106133536B (zh) | 2014-04-01 | 2015-03-04 | 集成电路动态去老化 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20150277393A1 (he) |
EP (1) | EP3127239B1 (he) |
JP (1) | JP2017517873A (he) |
KR (1) | KR20160140667A (he) |
CN (1) | CN106133536B (he) |
WO (1) | WO2015153048A1 (he) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9465373B2 (en) | 2013-09-17 | 2016-10-11 | International Business Machines Corporation | Dynamic adjustment of operational parameters to compensate for sensor based measurements of circuit degradation |
US9780793B2 (en) | 2016-01-06 | 2017-10-03 | Altera Corporation | Methods and apparatuses for offsetting aging in pass transistors |
CN106569120B (zh) * | 2016-10-26 | 2019-01-22 | 宁波大学 | 一种对温度不敏感的检测集成电路老化状态传感器 |
US10128248B1 (en) * | 2017-07-14 | 2018-11-13 | Intel Corporation | Aging tolerant apparatus |
US10666242B1 (en) * | 2017-10-05 | 2020-05-26 | Cadence Design Systems, Inc. | Circuits and methods for reducing asymmetric aging effects of devices |
CN108627760B (zh) * | 2018-05-15 | 2020-07-14 | 中国空间技术研究院 | 一种fpga芯片自激励变频动态老炼电路 |
CN109856525A (zh) * | 2018-11-07 | 2019-06-07 | 宁波大学 | 一种基于查找表的电路老化检测传感器 |
US11545987B1 (en) * | 2018-12-12 | 2023-01-03 | Marvell Asia Pte, Ltd. | Traversing a variable delay line in a deterministic number of clock cycles |
US11402413B1 (en) | 2018-12-12 | 2022-08-02 | Marvell Asia Pte, Ltd. | Droop detection and mitigation |
US11545981B1 (en) | 2018-12-31 | 2023-01-03 | Marvell Asia Pte, Ltd. | DLL-based clocking architecture with programmable delay at phase detector inputs |
CN109766233B (zh) * | 2019-03-08 | 2023-04-07 | 江南大学 | 一种感知处理器nbti效应延时的检测电路及其方法 |
FR3107983B1 (fr) * | 2020-03-05 | 2022-05-27 | St Microelectronics Sa | Dispositif de surveillance d'un circuit digital |
CN112444732B (zh) * | 2020-11-10 | 2023-05-05 | 海光信息技术股份有限公司 | 一种芯片老化状态监测电路、方法、芯片及服务器 |
CN112698181B (zh) * | 2020-12-07 | 2021-09-21 | 电子科技大学 | 一种状态可配置的原位老化传感器系统 |
US11462294B2 (en) | 2020-12-14 | 2022-10-04 | Advanced Micro Devices, Inc. | Mission mode Vmin prediction and calibration |
CN112885387A (zh) * | 2021-01-19 | 2021-06-01 | 长鑫存储技术有限公司 | 保护电路和存储器 |
US11935579B2 (en) | 2021-01-19 | 2024-03-19 | Changxin Memory Technologies, Inc. | Protection circuit and memory |
US11927612B1 (en) | 2022-04-07 | 2024-03-12 | Marvell Asia Pte Ltd | Digital droop detector |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1608342A (zh) * | 2001-11-02 | 2005-04-20 | 摩托罗拉公司 | 级联的延迟锁定环路 |
CN1610835A (zh) * | 2001-07-02 | 2005-04-27 | 英特尔公司 | 改进的集成电路老化方法和设备 |
US6903564B1 (en) * | 2003-11-12 | 2005-06-07 | Transmeta Corporation | Device aging determination circuit |
CN101027766A (zh) * | 2004-09-02 | 2007-08-29 | 松下电器产业株式会社 | 半导体集成电路器件及其检测方法、半导体晶片、以及老化检测设备 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7126365B2 (en) * | 2002-04-16 | 2006-10-24 | Transmeta Corporation | System and method for measuring negative bias thermal instability with a ring oscillator |
US7205854B2 (en) * | 2003-12-23 | 2007-04-17 | Intel Corporation | On-chip transistor degradation monitoring |
US7338817B2 (en) * | 2005-03-31 | 2008-03-04 | Intel Corporation | Body bias compensation for aged transistors |
JP2010087275A (ja) * | 2008-09-30 | 2010-04-15 | Panasonic Corp | 半導体集積回路および電子機器 |
US8299825B2 (en) * | 2009-10-30 | 2012-10-30 | Apple Inc. | Electronic age detection circuit |
US8549363B2 (en) * | 2010-01-08 | 2013-10-01 | International Business Machines Corporation | Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components |
JP2011196855A (ja) * | 2010-03-19 | 2011-10-06 | Toshiba Corp | 半導体集積回路 |
-
2014
- 2014-10-06 US US14/507,679 patent/US20150277393A1/en not_active Abandoned
-
2015
- 2015-03-04 CN CN201580017723.5A patent/CN106133536B/zh not_active Expired - Fee Related
- 2015-03-04 JP JP2016560003A patent/JP2017517873A/ja active Pending
- 2015-03-04 KR KR1020167026935A patent/KR20160140667A/ko unknown
- 2015-03-04 EP EP15713821.5A patent/EP3127239B1/en not_active Not-in-force
- 2015-03-04 WO PCT/US2015/018785 patent/WO2015153048A1/en active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1610835A (zh) * | 2001-07-02 | 2005-04-27 | 英特尔公司 | 改进的集成电路老化方法和设备 |
CN1608342A (zh) * | 2001-11-02 | 2005-04-20 | 摩托罗拉公司 | 级联的延迟锁定环路 |
US6903564B1 (en) * | 2003-11-12 | 2005-06-07 | Transmeta Corporation | Device aging determination circuit |
CN101027766A (zh) * | 2004-09-02 | 2007-08-29 | 松下电器产业株式会社 | 半导体集成电路器件及其检测方法、半导体晶片、以及老化检测设备 |
Also Published As
Publication number | Publication date |
---|---|
EP3127239B1 (en) | 2018-12-05 |
US20150277393A1 (en) | 2015-10-01 |
EP3127239A1 (en) | 2017-02-08 |
WO2015153048A1 (en) | 2015-10-08 |
KR20160140667A (ko) | 2016-12-07 |
CN106133536A (zh) | 2016-11-16 |
JP2017517873A (ja) | 2017-06-29 |
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Legal Events
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190913 Termination date: 20210304 |
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CF01 | Termination of patent right due to non-payment of annual fee |