CN106093483A - 芯片测试夹具及芯片测试系统 - Google Patents
芯片测试夹具及芯片测试系统 Download PDFInfo
- Publication number
- CN106093483A CN106093483A CN201610603129.0A CN201610603129A CN106093483A CN 106093483 A CN106093483 A CN 106093483A CN 201610603129 A CN201610603129 A CN 201610603129A CN 106093483 A CN106093483 A CN 106093483A
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- 238000012360 testing method Methods 0.000 title claims abstract description 71
- 230000001105 regulatory effect Effects 0.000 claims abstract description 7
- 238000003466 welding Methods 0.000 claims abstract description 4
- 230000001276 controlling effect Effects 0.000 claims description 4
- 206010044565 Tremor Diseases 0.000 abstract description 4
- 230000000694 effects Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 230000035479 physiological effects, processes and functions Effects 0.000 description 1
- 238000004064 recycling Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (10)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610603129.0A CN106093483B (zh) | 2016-07-27 | 2016-07-27 | 芯片测试夹具及芯片测试系统 |
PCT/CN2017/092833 WO2018019132A1 (zh) | 2016-07-27 | 2017-07-13 | 芯片测试夹具及芯片测试系统 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610603129.0A CN106093483B (zh) | 2016-07-27 | 2016-07-27 | 芯片测试夹具及芯片测试系统 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106093483A true CN106093483A (zh) | 2016-11-09 |
CN106093483B CN106093483B (zh) | 2020-01-10 |
Family
ID=57450019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201610603129.0A Active CN106093483B (zh) | 2016-07-27 | 2016-07-27 | 芯片测试夹具及芯片测试系统 |
Country Status (2)
Country | Link |
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CN (1) | CN106093483B (zh) |
WO (1) | WO2018019132A1 (zh) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106841709A (zh) * | 2017-04-17 | 2017-06-13 | 武汉特视电光技术有限公司 | 一种mmic通用测试夹具 |
CN107121569A (zh) * | 2017-03-24 | 2017-09-01 | 南京航空航天大学 | 可调节微波电路测试夹具 |
WO2018019132A1 (zh) * | 2016-07-27 | 2018-02-01 | 深圳市华讯方舟微电子科技有限公司 | 芯片测试夹具及芯片测试系统 |
CN108427018A (zh) * | 2018-02-02 | 2018-08-21 | 江苏艾科半导体有限公司 | 一种微调式半导体测试支架 |
CN109669118A (zh) * | 2019-01-29 | 2019-04-23 | 中国科学院上海微系统与信息技术研究所 | 一种可调节微波电路测试夹具 |
CN110727262A (zh) * | 2019-10-31 | 2020-01-24 | 长春工大检测技术有限责任公司 | 一种汽车发动机电子控制单元测试用上下传输机构 |
CN111123080A (zh) * | 2020-03-03 | 2020-05-08 | 天台卫冕智能科技有限公司 | 一种扩音器芯片质量检测设备 |
CN112782217A (zh) * | 2020-12-29 | 2021-05-11 | 中国电子科技集团公司第五十八研究所 | 一种倒装焊芯片热阻测试夹具 |
CN113567470A (zh) * | 2021-07-13 | 2021-10-29 | 安徽科惠微电子有限公司 | 一种光学芯片测试装置 |
CN113985246A (zh) * | 2021-10-21 | 2022-01-28 | 武汉光谷信息光电子创新中心有限公司 | 一种芯片的测试与封装工装及系统 |
CN114200174A (zh) * | 2021-12-10 | 2022-03-18 | 珠海城市职业技术学院 | 一种芯片测试用自动化测试装置 |
CN115877047A (zh) * | 2023-01-18 | 2023-03-31 | 南京燧锐科技有限公司 | 一种微波芯片测试夹具装置 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108663550B (zh) * | 2018-07-04 | 2024-04-09 | 安徽凯尔通讯科技有限公司 | 指纹芯片导通性测试用装夹治具 |
CN109702669B (zh) * | 2019-02-18 | 2024-03-01 | 中国电子科技集团公司第二十六研究所 | 一种传感器测试夹具 |
CN111673648A (zh) * | 2020-06-30 | 2020-09-18 | 深圳振华富电子有限公司 | 一种用于制作压电驱动器的夹具 |
CN111876745A (zh) * | 2020-08-19 | 2020-11-03 | 桂林芯隆科技有限公司 | 一种红外探测器的表面镀膜夹具 |
TWI800098B (zh) * | 2021-11-15 | 2023-04-21 | 貿聯國際股份有限公司 | 測試板 |
CN117590203B (zh) * | 2024-01-18 | 2024-04-19 | 宁波吉品科技有限公司 | 一种芯片射频测试平台 |
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CN2060488U (zh) * | 1989-09-30 | 1990-08-15 | 张宁 | 一种固取方便的新型连接装置 |
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CN101900749A (zh) * | 2010-07-07 | 2010-12-01 | 重庆邮电大学 | 一种bga封装芯片测试支座 |
CN102565462A (zh) * | 2011-12-26 | 2012-07-11 | 北京中微普业科技有限公司 | 一种自校准高精度微波测量夹具及校准方法 |
US20130321012A1 (en) * | 2012-06-01 | 2013-12-05 | Jayesh Nath | Methods and Apparatus for Testing Small Form Factor Antenna Tuning Elements |
WO2014058350A1 (en) * | 2012-10-12 | 2014-04-17 | Yazykov Andrey Yurievich | Check valve |
JP2014217979A (ja) * | 2013-05-07 | 2014-11-20 | パナソニック株式会社 | ペースト転写ユニット及び部品実装装置 |
CN204989229U (zh) * | 2015-02-15 | 2016-01-20 | 上海唯捷创芯电子技术有限公司 | 一种芯片测试夹具及测试系统 |
CN205861729U (zh) * | 2016-07-27 | 2017-01-04 | 深圳市华讯方舟微电子科技有限公司 | 芯片测试夹具及芯片测试系统 |
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CN106093483B (zh) * | 2016-07-27 | 2020-01-10 | 深圳市华讯方舟微电子科技有限公司 | 芯片测试夹具及芯片测试系统 |
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US20070247179A1 (en) * | 2006-04-25 | 2007-10-25 | M/A Com, Inc. | Surface mount component RF test fixture |
CN201084676Y (zh) * | 2007-09-12 | 2008-07-09 | 广东格兰仕集团有限公司 | 装压磁控管天线帽的生产设备及其专用磁控管芯管 |
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Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018019132A1 (zh) * | 2016-07-27 | 2018-02-01 | 深圳市华讯方舟微电子科技有限公司 | 芯片测试夹具及芯片测试系统 |
CN107121569A (zh) * | 2017-03-24 | 2017-09-01 | 南京航空航天大学 | 可调节微波电路测试夹具 |
CN106841709A (zh) * | 2017-04-17 | 2017-06-13 | 武汉特视电光技术有限公司 | 一种mmic通用测试夹具 |
CN106841709B (zh) * | 2017-04-17 | 2019-08-02 | 武汉特视电光技术有限公司 | 一种mmic通用测试夹具 |
CN108427018A (zh) * | 2018-02-02 | 2018-08-21 | 江苏艾科半导体有限公司 | 一种微调式半导体测试支架 |
CN109669118A (zh) * | 2019-01-29 | 2019-04-23 | 中国科学院上海微系统与信息技术研究所 | 一种可调节微波电路测试夹具 |
CN109669118B (zh) * | 2019-01-29 | 2021-09-03 | 中国科学院上海微系统与信息技术研究所 | 一种可调节微波电路测试夹具 |
CN110727262A (zh) * | 2019-10-31 | 2020-01-24 | 长春工大检测技术有限责任公司 | 一种汽车发动机电子控制单元测试用上下传输机构 |
CN111123080B (zh) * | 2020-03-03 | 2020-11-03 | 深圳市克拉尼声学科技有限公司 | 一种扩音器芯片质量检测设备 |
CN111123080A (zh) * | 2020-03-03 | 2020-05-08 | 天台卫冕智能科技有限公司 | 一种扩音器芯片质量检测设备 |
CN112782217A (zh) * | 2020-12-29 | 2021-05-11 | 中国电子科技集团公司第五十八研究所 | 一种倒装焊芯片热阻测试夹具 |
CN113567470A (zh) * | 2021-07-13 | 2021-10-29 | 安徽科惠微电子有限公司 | 一种光学芯片测试装置 |
CN113567470B (zh) * | 2021-07-13 | 2022-03-11 | 安徽科惠微电子有限公司 | 一种光学芯片测试装置 |
CN113985246A (zh) * | 2021-10-21 | 2022-01-28 | 武汉光谷信息光电子创新中心有限公司 | 一种芯片的测试与封装工装及系统 |
CN114200174A (zh) * | 2021-12-10 | 2022-03-18 | 珠海城市职业技术学院 | 一种芯片测试用自动化测试装置 |
CN115877047A (zh) * | 2023-01-18 | 2023-03-31 | 南京燧锐科技有限公司 | 一种微波芯片测试夹具装置 |
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Publication number | Publication date |
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WO2018019132A1 (zh) | 2018-02-01 |
CN106093483B (zh) | 2020-01-10 |
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