CN105992557B - X射线Talbot干涉仪和X射线Talbot干涉仪系统 - Google Patents

X射线Talbot干涉仪和X射线Talbot干涉仪系统 Download PDF

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CN105992557B
CN105992557B CN201580008324.2A CN201580008324A CN105992557B CN 105992557 B CN105992557 B CN 105992557B CN 201580008324 A CN201580008324 A CN 201580008324A CN 105992557 B CN105992557 B CN 105992557B
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ray
grating
talbot interferometer
source
beam splitter
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CN105992557A (zh
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半田宗一郎
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Canon Inc
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Canon Inc
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/067—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Animal Behavior & Ethology (AREA)
  • Surgery (AREA)
  • Molecular Biology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biomedical Technology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Optics & Photonics (AREA)
  • Biophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201580008324.2A 2014-02-14 2015-02-12 X射线Talbot干涉仪和X射线Talbot干涉仪系统 Active CN105992557B (zh)

Priority Applications (1)

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CN201811127026.7A CN109115816A (zh) 2014-02-14 2015-02-12 X射线Talbot干涉仪和X射线Talbot干涉仪系统

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014026677 2014-02-14
JP2014-026677 2014-02-14
PCT/JP2015/054503 WO2015122542A1 (en) 2014-02-14 2015-02-12 X-ray talbot interferometer and x-ray talbot interferometer system

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US (1) US10393681B2 (enExample)
EP (1) EP3105763B1 (enExample)
JP (1) JP6537293B2 (enExample)
CN (2) CN109115816A (enExample)
WO (1) WO2015122542A1 (enExample)

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JP6626578B2 (ja) * 2016-07-28 2019-12-25 株式会社島津製作所 Ｘ線位相差撮像装置
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびｘ線検査装置
EP3391821B1 (en) * 2017-04-20 2024-05-08 Shimadzu Corporation X-ray phase contrast imaging system
JP6743983B2 (ja) * 2017-10-31 2020-08-19 株式会社島津製作所 Ｘ線位相差撮像システム
JP6987345B2 (ja) * 2018-01-18 2021-12-22 富士フイルムヘルスケア株式会社 放射線撮像装置
CN112189134B (zh) * 2018-06-15 2023-09-19 株式会社岛津制作所 X射线成像装置
EP3922180A1 (en) * 2020-06-09 2021-12-15 Koninklijke Philips N.V. Apparatus for processing data acquired by a dark-field and/or phase contrast x-ray imaging system

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CN101495853A (zh) * 2006-07-12 2009-07-29 保罗·谢勒学院 用于相衬成像的x射线干涉仪
CN101873828A (zh) * 2007-11-26 2010-10-27 皇家飞利浦电子股份有限公司 用于x射线相位对比成像的探测装置
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CN103068310A (zh) * 2010-07-09 2013-04-24 富士胶片株式会社 放射线摄影系统及其图像处理方法
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CN103460251A (zh) * 2010-12-13 2013-12-18 保罗·谢勒学院 利用对具有光栅布置的相衬成像的约束优化的图像积分的方法和系统

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CN101495853A (zh) * 2006-07-12 2009-07-29 保罗·谢勒学院 用于相衬成像的x射线干涉仪
CN101873828A (zh) * 2007-11-26 2010-10-27 皇家飞利浦电子股份有限公司 用于x射线相位对比成像的探测装置
CN102197302A (zh) * 2008-10-29 2011-09-21 佳能株式会社 分析方法、使用其的放射线成像装置和执行其的分析程序
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CN102413767A (zh) * 2009-03-02 2012-04-11 罗切斯特大学 用于微分相位对比扇形线束ct、锥形线束ct以及混合锥形线束ct的方法和装置
CN103068310A (zh) * 2010-07-09 2013-04-24 富士胶片株式会社 放射线摄影系统及其图像处理方法
CN103460251A (zh) * 2010-12-13 2013-12-18 保罗·谢勒学院 利用对具有光栅布置的相衬成像的约束优化的图像积分的方法和系统
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JP6537293B2 (ja) 2019-07-03
CN105992557A (zh) 2016-10-05
WO2015122542A1 (en) 2015-08-20
JP2015166735A (ja) 2015-09-24
US20160356730A1 (en) 2016-12-08
CN109115816A (zh) 2019-01-01
US10393681B2 (en) 2019-08-27
EP3105763A1 (en) 2016-12-21
EP3105763B1 (en) 2019-09-11

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