CN1059792A - 粒子尺寸分布测量仪 - Google Patents
粒子尺寸分布测量仪 Download PDFInfo
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- CN1059792A CN1059792A CN91105283A CN91105283A CN1059792A CN 1059792 A CN1059792 A CN 1059792A CN 91105283 A CN91105283 A CN 91105283A CN 91105283 A CN91105283 A CN 91105283A CN 1059792 A CN1059792 A CN 1059792A
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- 239000002245 particle Substances 0.000 title claims abstract description 32
- 238000009826 distribution Methods 0.000 title claims abstract description 17
- 238000005259 measurement Methods 0.000 abstract description 7
- 230000009365 direct transmission Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 239000000725 suspension Substances 0.000 description 2
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
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- 239000007788 liquid Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
- G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
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- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
一种在结构上能测量过大尺寸粒子的粒子尺寸
分布测量仪。
Description
本发明涉及一种测量悬浮在流体介质中的粒子尺寸分布的仪器,该仪器通过分析被这些粒子散射或衍射的激光束产生的光线分布强度来测量粒子尺寸分布。
这样的一种测量粒子尺寸分布的仪器主要包括:一个激光束系统,一个液流透明槽,一个傅里叶变换透镜,一组同心布置的普通半圆弧形光检测器和一个计算机。使那些待测尺寸分布的粒子悬浮液流过上述的液流槽。使激光束系统发射的激光束照射液流槽,在液流槽中流动的粒子使激光束沿各个方向散射或衍射。被散射或衍射的某些光线由傅里叶变换透镜聚焦在上述的那些弧形光检测器上,计算机按照由米氏(Mie)散射理论或夫琅和费衍射理论推导出的算法对来自这些光检测器上的输出信号进行处理。在这种粒子尺布分布的测量方法中,大尺寸的粒子引起的散射或衍射线强度分布峰将出现在比较小的角度上。而对比较大的粒子侧的测量极限原则上由那些弧形光检测器中最里面的那个半径(以及根据液流槽和光检测器之间的距离)来确定。在这种情况下,如果所研究的粒子中含有大量过大的粒子时,为了精确地测量粒子尺寸的分布,自然应该采用适当的测量仪器来代替这种测量仪器。可是,这种测量粒子尺寸分布仪器有一个严重的缺点:即使在这些粒子中只含有少量过大尺寸粒子时,其中的这些大尺寸的粒子也基本上被置于测量范围之外。
本发明的目的是要解决通常的光散射/衍射型粒子尺寸分布测量仪器所存在的上述缺点,并提供一种改进的新型测量粒子尺寸分布的仪器,以便能至少检测过大尺寸粒子的存在。
本发明的另一目的是构成一种新型改进的测量粒子分布仪器,而不需采用任何复杂的元器件。
为达到上述目的,本发明的仪器在结构上与通常的仪器的不同点仅在于:在那组同心布置的弧形光检测器的中心处装有一个用于检测直接透射过液流槽、而没有被衍射或散射的激光束分量。
下面参考附图进一步详细说明本发明,其中:
图1为本发明的一个实施例的基本构成的侧面示意图;
图2示出了用于图1中所示实施例中的一组弧形检测器;
图3示出了从装在图2所示的那组弧形光检测器中的中心光检测器上输出的信号曲线图;
图4示出了直接透射过液流槽的激光束分量。
参考图1,该图示出了本发明的一个实施例的总体构成,由激光器1发出的一光束经一光束扩展系统2调整成具有一预定直径的激光束B,然后射入装有流动的样品的粒子悬浮液的液流槽3,当液流槽3受激光束B照射时,那些粒子使激光束13沿着各个方向散射或衍射。某些散射或衍射光线经一个傅里叶变换透镜4聚焦到同心地布置在检测板5a(参考图2)上的那些弧形光检测器5上,来自那些弧形光检测量的输出信号被计算机10根据由米氏散射或夫琅和费衍射理论所导出的公知的算法有目的地处理后由计算机10给出粒子尺寸的分布。
本发明除了能完成上述的已知的测量粒子尺寸分布的功能外,还提供了一种检测用散射或衍射法所不能检测的过大粒子尺寸的功能,参考图2,该图示出了检测器板5a的结构,除上述的那些弧形光检测器5外还装有一个中心光检测器6,该中心光检测器定位在那些弧形光检测器的中心处。中心光检测器检测直接透射过液流槽3的激光束分量,这个激光束分量未受到散射或衍射。如图3所示,每当一个过大的粒子通过直接透射过液流槽3的光束时,中心光检测器的输出就出现一个下凹。
设该光束的横截面为Sb,来自中心光检测量6的满的和下凹输出分别为A和B(图3),其中的A和B的数值通过下面公式
Sp= (A-B)/(A) ×Sb
与通过的大粒子的横截面积Sp相联系。
因此,该粒子的直径Dp由下面的公式给出
其中Db为光束的直径。
尽管在确定激光束B的直径时,需要考虑傅里叶变换透镜4的直径、能检测到的最大散射角或衍射角、以及液流槽3与透镜4之间的距离,但是本发明最好还是要选择尽可能细的光束,这从上面的那两个公式可以容易看出。
Claims (1)
1、一种测量粒子尺寸分布的仪器主要包括:激光束系统(1、2),一个液流槽(3),一个傅里叶变换透镜(4),一组(5a)弧形光检测器(5)和一个计算机(10),其特征在于,除上述那些弧形光检测器(5)外还装有一个中心光检测器(6)。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2173919A JPH0462455A (ja) | 1990-06-29 | 1990-06-29 | 粒度分布測定装置 |
JP173919/90 | 1990-06-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN1059792A true CN1059792A (zh) | 1992-03-25 |
Family
ID=15969510
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN91105283A Pending CN1059792A (zh) | 1990-06-29 | 1991-06-29 | 粒子尺寸分布测量仪 |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0465205B1 (zh) |
JP (1) | JPH0462455A (zh) |
KR (1) | KR920001192A (zh) |
CN (1) | CN1059792A (zh) |
DE (1) | DE69128922T2 (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100344956C (zh) * | 2002-09-27 | 2007-10-24 | 理音株式会社 | 一种颗粒测量设备 |
CN101925809B (zh) * | 2007-12-04 | 2013-03-27 | 粒子监测系统有限公司 | 用于粒子检测的二维光学成像方法和系统 |
CN104040323A (zh) * | 2011-09-30 | 2014-09-10 | 3M创新有限公司 | 线宽测量系统 |
CN104897538A (zh) * | 2015-06-16 | 2015-09-09 | 天津大学 | 一种基于数字全息术的工地扬尘检测装置 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2284050B (en) * | 1991-02-05 | 1995-08-02 | Marconi Gec Ltd | Gaseous suspension particle size measurement |
DE19510034B4 (de) * | 1995-03-20 | 2005-08-11 | Sympatec Gmbh System-Partikel-Technik | Vorrichtung zur Bestimmung von Partikelgrößen und/oder Partikelgrößenverteilungen mittels Lichtbeugung |
JP4374137B2 (ja) | 1997-11-28 | 2009-12-02 | コンパニー ゼネラール デ エタブリッスマン ミシュラン−ミシュラン エ コムパニー | アルミナ充填剤およびそのような充填剤を含むゴム組成物 |
US6553849B1 (en) | 1998-10-28 | 2003-04-29 | Dillon F. Scofield | Electrodynamic particle size analyzer |
CN106841036B (zh) * | 2017-02-14 | 2019-09-17 | 天津大学 | 激光干涉成像系统中样品池的最佳摆放方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3809478A (en) * | 1970-11-23 | 1974-05-07 | J Talbot | Analysis and representation of the size, shape and orientation characteristics of the components of a system |
DE2701523A1 (de) * | 1977-01-15 | 1978-07-20 | Strahlen Umweltforsch Gmbh | Verfahren und vorrichtung zur zaehlung und klassifizierung von teilchen |
US4890920A (en) * | 1986-02-12 | 1990-01-02 | Combustion Engineering, Inc. | In situ particle size measuring device |
JPS63215942A (ja) * | 1987-03-04 | 1988-09-08 | Natl Aerospace Lab | 粒子径分布計測用光電変換センサ− |
-
1990
- 1990-06-29 JP JP2173919A patent/JPH0462455A/ja active Pending
-
1991
- 1991-06-29 CN CN91105283A patent/CN1059792A/zh active Pending
- 1991-06-29 KR KR1019910011018A patent/KR920001192A/ko not_active Application Discontinuation
- 1991-07-01 DE DE69128922T patent/DE69128922T2/de not_active Expired - Fee Related
- 1991-07-01 EP EP91305972A patent/EP0465205B1/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100344956C (zh) * | 2002-09-27 | 2007-10-24 | 理音株式会社 | 一种颗粒测量设备 |
CN101925809B (zh) * | 2007-12-04 | 2013-03-27 | 粒子监测系统有限公司 | 用于粒子检测的二维光学成像方法和系统 |
CN104040323A (zh) * | 2011-09-30 | 2014-09-10 | 3M创新有限公司 | 线宽测量系统 |
CN104897538A (zh) * | 2015-06-16 | 2015-09-09 | 天津大学 | 一种基于数字全息术的工地扬尘检测装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0462455A (ja) | 1992-02-27 |
KR920001192A (ko) | 1992-01-30 |
DE69128922D1 (de) | 1998-03-26 |
EP0465205A1 (en) | 1992-01-08 |
EP0465205B1 (en) | 1998-02-18 |
DE69128922T2 (de) | 1998-06-25 |
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