KR920001192A - 입도분포측정장치 - Google Patents

입도분포측정장치 Download PDF

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Publication number
KR920001192A
KR920001192A KR1019910011018A KR910011018A KR920001192A KR 920001192 A KR920001192 A KR 920001192A KR 1019910011018 A KR1019910011018 A KR 1019910011018A KR 910011018 A KR910011018 A KR 910011018A KR 920001192 A KR920001192 A KR 920001192A
Authority
KR
South Korea
Prior art keywords
particle size
size distribution
measuring device
distribution measuring
light sensor
Prior art date
Application number
KR1019910011018A
Other languages
English (en)
Inventor
타케시 니와
Original Assignee
원본미기재
카부시키가이샤 시마즈세이사꾸쇼
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 원본미기재, 카부시키가이샤 시마즈세이사꾸쇼 filed Critical 원본미기재
Publication of KR920001192A publication Critical patent/KR920001192A/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

내용 없음

Description

입도분포측정장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명 실시예의 기본구성을 나타내는 개략측면도,
제2도는 제1도에 표시된 실시예에 사용되는 한 세트의 아치형 광센서를 나타내는 도면.

Claims (1)

  1. 레이저비임장치(1)(2), 유동셀(3), 푸리에변환렌즈(4), 한 세트의 아치형광센서(5) 및 컴퓨터(10)로 구성되어 있는 입도분포측정장치에 있어서, 전기한 아치형광센서(5)에는 중심광센서(6)가 설치되어 있는 것을 특징으로 하는 입도분포측정장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019910011018A 1990-06-29 1991-06-29 입도분포측정장치 KR920001192A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2173919A JPH0462455A (ja) 1990-06-29 1990-06-29 粒度分布測定装置
JP2-173919 1990-06-29

Publications (1)

Publication Number Publication Date
KR920001192A true KR920001192A (ko) 1992-01-30

Family

ID=15969510

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910011018A KR920001192A (ko) 1990-06-29 1991-06-29 입도분포측정장치

Country Status (5)

Country Link
EP (1) EP0465205B1 (ko)
JP (1) JPH0462455A (ko)
KR (1) KR920001192A (ko)
CN (1) CN1059792A (ko)
DE (1) DE69128922T2 (ko)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2284050B (en) * 1991-02-05 1995-08-02 Marconi Gec Ltd Gaseous suspension particle size measurement
DE19510034B4 (de) * 1995-03-20 2005-08-11 Sympatec Gmbh System-Partikel-Technik Vorrichtung zur Bestimmung von Partikelgrößen und/oder Partikelgrößenverteilungen mittels Lichtbeugung
JP4374137B2 (ja) 1997-11-28 2009-12-02 コンパニー ゼネラール デ エタブリッスマン ミシュラン−ミシュラン エ コムパニー アルミナ充填剤およびそのような充填剤を含むゴム組成物
US6553849B1 (en) 1998-10-28 2003-04-29 Dillon F. Scofield Electrodynamic particle size analyzer
CN100344956C (zh) * 2002-09-27 2007-10-24 理音株式会社 一种颗粒测量设备
US7916293B2 (en) * 2007-12-04 2011-03-29 Particle Measuring Systems, Inc. Non-orthogonal particle detection systems and methods
KR20140074970A (ko) * 2011-09-30 2014-06-18 쓰리엠 이노베이티브 프로퍼티즈 캄파니 선폭 측정 시스템
CN104897538A (zh) * 2015-06-16 2015-09-09 天津大学 一种基于数字全息术的工地扬尘检测装置
CN106841036B (zh) * 2017-02-14 2019-09-17 天津大学 激光干涉成像系统中样品池的最佳摆放方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3809478A (en) * 1970-11-23 1974-05-07 J Talbot Analysis and representation of the size, shape and orientation characteristics of the components of a system
DE2701523A1 (de) * 1977-01-15 1978-07-20 Strahlen Umweltforsch Gmbh Verfahren und vorrichtung zur zaehlung und klassifizierung von teilchen
US4890920A (en) * 1986-02-12 1990-01-02 Combustion Engineering, Inc. In situ particle size measuring device
JPS63215942A (ja) * 1987-03-04 1988-09-08 Natl Aerospace Lab 粒子径分布計測用光電変換センサ−

Also Published As

Publication number Publication date
JPH0462455A (ja) 1992-02-27
DE69128922D1 (de) 1998-03-26
EP0465205A1 (en) 1992-01-08
EP0465205B1 (en) 1998-02-18
CN1059792A (zh) 1992-03-25
DE69128922T2 (de) 1998-06-25

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E902 Notification of reason for refusal
E601 Decision to refuse application