CN105783941B - A kind of test method of the Inertial Measurement Unit based on the output of spi bus communication protocol - Google Patents
A kind of test method of the Inertial Measurement Unit based on the output of spi bus communication protocol Download PDFInfo
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- CN105783941B CN105783941B CN201610099803.6A CN201610099803A CN105783941B CN 105783941 B CN105783941 B CN 105783941B CN 201610099803 A CN201610099803 A CN 201610099803A CN 105783941 B CN105783941 B CN 105783941B
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- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
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Abstract
The present invention relates to a kind of test method of Inertial Measurement Unit based on the output of spi bus communication protocol, steps are as follows: connecting test equipment and the Inertial Measurement Unit based on the output of spi bus communication protocol；Serial ports in test equipment is connected with measuring and calculation machine；System electrification, test equipment are acquired the output data of Inertial Measurement Unit by spi bus communication protocol, new data frame are sent to measuring and calculation machine by serial ports；Measuring and calculation machine is acquired data, realizes the test to the Inertial Measurement Unit exported based on spi bus communication protocol.The present invention solves the problems, such as to solve directly test as SPI main equipment using measuring and calculation machine to lead to high bit-error.
Description
Technical field
The present invention relates to a kind of Inertial Measurement Unit test method, more particularly to one kind are defeated based on spi bus communication protocol
The test method of Inertial Measurement Unit out belongs to Inertial Measurement Unit test method field, can be used for testing spi bus communication
The occasion of the Inertial Measurement Unit of agreement output.
Background technique
SPI (Serial Peripheral Interface, Serial Peripheral Interface) is that motorola inc releases
A kind of high speed, full duplex, synchronization communication bus.It is worked with master-slave mode, is mainly used in microprocessor and peripheral hardware
High-speed communication, have the characteristics that speed is fast, communication protocol is simple, it is few to occupy pin.It is a kind of common standard interface, is made
With simple and convenient and saving system resource.Spi bus communication protocol usually has a main equipment and one or more from equipment, needs
4 lines are wanted, they are MISO (main equipment data input, export from device data), MOSI (main equipment data output, from equipment
Data input), SCK (clock signal is generated by main equipment), SS (piece choosing, from equipment enable signal, controlled by main equipment).
Inertial Measurement Unit (Inertial Measurement Unit, IMU) refers to by gyroscope, accelerometer and auxiliary
Help electronic circuit to form, can be measured carrier relative inertness space or regulation navigational coordinate system rotational angle, angular speed and
The device of the information such as linear acceleration.It is the core component of inertial navigation system.
A kind of Inertial Measurement Unit of existing spi bus communication protocol output need when Laboratory Calibration by turning
Platform slip ring, output connection is very long, and electromagnetic environment is complicated.It can if directly being tested measuring and calculation machine as SPI main equipment
Lead to the very high bit error rate, brings big inconvenience to staking-out work.Therefore it needs to study a kind of based on spi bus communication protocol
The test method of the Inertial Measurement Unit of output tests the Inertial Measurement Unit of SPI protocol output.
Summary of the invention
Technical problem solved by the present invention is overcoming the deficiencies of the prior art and provide a kind of based on spi bus communication protocol
The test method of the Inertial Measurement Unit of output solves directly test as SPI main equipment using measuring and calculation machine to lead to height
The problem of bit error rate.
Technical solution of the invention is divided into that steps are as follows:
(1) connecting test equipment and the Inertial Measurement Unit based on the output of spi bus communication protocol；
(2) serial ports in test equipment is connected with measuring and calculation machine；
(3) system electrification of test equipment and Inertial Measurement Unit composition, test equipment are adopted by spi bus communication protocol
Collect the output data of Inertial Measurement Unit；The number structure of chip-select pin is added before each frame Inertial Measurement Unit output data
New data frame is sent to measuring and calculation machine by serial ports by the data frame of Cheng Xin, test equipment；Measuring and calculation machine carries out data
Acquisition.
Test equipment in the step (1) can make different Inertial Measurement Units by different chip-select pins
Can, the corresponding number different from other pins of each chip-select pin, test equipment can connect one or more sets SPI simultaneously
The Inertial Measurement Unit of bus communication protocol output, Inertial Measurement Unit quantity are not more than the reserved chip-select pin number of test equipment
Amount.
In the step (3) after system electrification, test equipment chip selection signal is all high level, acquires some inertia measurement list
The voltage for the chip-select pin that test equipment is connect with Inertial Measurement Unit collected is dragged down before member output, Inertial Measurement Unit is defeated
Out after the completion of data acquisition, the voltage for the chip-select pin that test equipment is connect with Inertial Measurement Unit collected is set as high electricity
It is flat.
The number for the chip-select pin added in the step (3) is test equipment and the Inertial Measurement Unit company of this acquisition
The number of the chip-select pin connect.
Measuring and calculation machine identifies this frame data pair by judging received data frame the first two byte in the step (3)
The Inertial Measurement Unit answered, and data are saved to corresponding file, obtain the test data of Inertial Measurement Unit.
The present invention compared with prior art the advantages of it is as follows:
(1) in the present invention, test equipment acquires the output of Inertial Measurement Unit by spi bus communications protocol, then will adopt
The data of collection are transmitted to measuring and calculation machine by serial communication protocol, solve in the prior art using measuring and calculation machine as SPI
Main equipment carries out the problem of Inertial Measurement Unit test leads to high bit-error.
(2) test equipment can once acquire the test data of more set Inertial Measurement Units in the present invention, substantially increase
Testing efficiency, save the cost.
Detailed description of the invention
Fig. 1 is the schematic diagram that a set of test equipment acquires three sets of Inertial Measurement Units simultaneously in the present invention；
Fig. 2 is the structural schematic diagram of entire test macro when acquiring three sets of Inertial Measurement Units in the present invention simultaneously.
Specific embodiment
A specific embodiment of the method for the present invention is given below.
(1) Inertial Measurement Unit of connecting test equipment and the output of three sets of spi bus communication protocol, as shown in Figure 1；Three sets
The connection of Inertial Measurement Unit and test equipment include MISO (test equipment data input, Inertial Measurement Unit data output),
MOSI (output of test equipment data, the input of Inertial Measurement Unit data), SCK (clock signal is generated by test equipment), SS
(piece choosing, Inertial Measurement Unit enable signal are controlled by test equipment).Test equipment can by different chip-select pin SS1,
SS2, SS3 are enabled to Inertial Measurement Unit 1, Inertial Measurement Unit 2, Inertial Measurement Unit 3 respectively.
(2) serial ports in test equipment is connected with measuring and calculation machine, as shown in Figure 2.
(3) system electrification, test equipment chip selection signal SS1, SS2, SS3 are all high level.
Acquisition Inertial Measurement Unit 1 drags down the voltage of pin SS1 before exporting, 1 output data of Inertial Measurement Unit has acquired
Its chip selection signal SS1 is reverted to high level by Cheng Hou.Two bytes are added before 1 output data of Inertial Measurement Unit
0x0001 constitutes new data frame, and new data frame is sent to measuring and calculation machine by serial ports；Measuring and calculation machine carries out data
Acquisition, by judging that received data frame the first two byte identifies the corresponding Inertial Measurement Unit 1 of this frame data for 0x0001,
And save data to 1 file of Inertial Measurement Unit, obtain the test data of Inertial Measurement Unit 1.
Acquisition Inertial Measurement Unit 2 drags down the voltage of pin SS2 before exporting, 2 output data of Inertial Measurement Unit has acquired
Its chip selection signal SS2 is reverted to high level by Cheng Hou.Two bytes are added before 2 output data of Inertial Measurement Unit
0x0002 constitutes new data frame, and new data frame is sent to measuring and calculation machine by serial ports；Measuring and calculation machine carries out data
Acquisition, by judging that received data frame the first two byte identifies the corresponding Inertial Measurement Unit 2 of this frame data for 0x0002,
And save data to 2 file of Inertial Measurement Unit, obtain the test data of Inertial Measurement Unit 2.
Acquisition Inertial Measurement Unit 3 drags down the voltage of pin SS3 before exporting, 3 output data of Inertial Measurement Unit has acquired
Its chip selection signal SS3 is reverted to high level by Cheng Hou.Two bytes are added before 3 output data of Inertial Measurement Unit
0x0003 constitutes new data frame, and new data frame is sent to measuring and calculation machine by serial ports；Measuring and calculation machine carries out data
Acquisition, by judging that received data frame the first two byte identifies the corresponding Inertial Measurement Unit 3 of this frame data for 0x0003,
And save data to 3 file of Inertial Measurement Unit, obtain the test data of Inertial Measurement Unit 3.
Above to a kind of test side of the Inertial Measurement Unit based on the output of spi bus communication protocol provided by the present invention
Method is described in detail, for those of ordinary skill in the art, specific implementation process and application range according to the present invention
Upper there will be changes, in conclusion the contents of this specification are not to be construed as limiting the invention.The present invention does not retouch in detail
It states content and is known to the skilled person technology.
Claims (3)
1. a kind of test method of the Inertial Measurement Unit based on the output of spi bus communication protocol, it is characterised in that steps are as follows:
(1) connecting test equipment and the Inertial Measurement Unit based on the output of spi bus communication protocol；
(2) serial ports in test equipment is connected with measuring and calculation machine；
(3) system electrification of test equipment and Inertial Measurement Unit composition, test equipment are used by the acquisition of spi bus communication protocol
The output data of property measuring unit；The number that chip-select pin is added before each frame Inertial Measurement Unit output data is constituted newly
Data frame, new data frame is sent to measuring and calculation machine by serial ports by test equipment；Measuring and calculation machine is acquired data；
Test equipment in the step (1) can be enabled to different Inertial Measurement Units by different chip-select pins, often
The corresponding number different from other pins of a chip-select pin, test equipment can connect one or more sets spi bus simultaneously
The Inertial Measurement Unit of communication protocol output, Inertial Measurement Unit quantity are not more than the reserved chip-select pin quantity of test equipment；
In the step (3) after system electrification, test equipment chip selection signal is all high level, and it is defeated to acquire some Inertial Measurement Unit
The voltage for the chip-select pin that test equipment is connect with Inertial Measurement Unit collected is before dragged down out, and Inertial Measurement Unit exports number
After the completion of acquisition, the voltage for the chip-select pin that test equipment is connect with Inertial Measurement Unit collected is set as high level.
2. a kind of test method of Inertial Measurement Unit based on the output of spi bus communication protocol according to claim 1,
It is characterized by: the number for the chip-select pin added in the step (3) is the inertia measurement list of test equipment and this acquisition
The number of the chip-select pin of member connection.
3. a kind of test method of Inertial Measurement Unit based on the output of spi bus communication protocol according to claim 1,
It is characterized by: measuring and calculation machine identifies this frame number by judging received data frame the first two byte in the step (3)
It saves according to corresponding Inertial Measurement Unit, and by data to corresponding file, obtains the test data of Inertial Measurement Unit.
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| CN107037739B (en) * | 2016-12-02 | 2020-02-14 | 上海航天控制技术研究所 | Carrier rocket semi-physical simulation test inertial unit simulation method |
| CN110779523A (en) * | 2019-10-16 | 2020-02-11 | 中国航空工业集团公司洛阳电光设备研究所 | Inertial measurement unit testing platform based on LabWindows/CVI |
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| CN102590556A (en) * | 2012-02-24 | 2012-07-18 | 哈尔滨工业大学 | Zero offset test compensation system of multi-channel capacitor type MEMS (micro-electromechanical system) acceleration sensor |
| CN103196447A (en) * | 2013-03-20 | 2013-07-10 | 哈尔滨工业大学 | Batch MEMS (micro-electromechanical system) sensor based inertial measurement unit and gesture-position information acquisition method |
| US9710413B2 (en) * | 2013-06-28 | 2017-07-18 | Stmicroelectronics S.R.L. | Integrated data concentrator for multi-sensor MEMS systems |
| CN103453904B (en) * | 2013-09-26 | 2015-12-02 | 哈尔滨工程大学 | A kind of redundancy configuration structure of Inertial Measurement Unit |
| CN104359481A (en) * | 2014-11-12 | 2015-02-18 | 中国兵器工业集团第二一四研究所苏州研发中心 | Miniature inertia measurement unit based on FPGA (field programmable gate array) |
| CN204406391U (en) * | 2014-12-19 | 2015-06-17 | 上海亨通光电科技有限公司 | A kind of data of optical fiber gyroscope R-T unit based on SPI |
| CN105183690B (en) * | 2015-09-02 | 2018-03-09 | 北京航天控制仪器研究所 | A kind of double-buffered data transmission method based on spi bus communication protocol |
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