CN105474178B - 基于可编程接口的验证和调试 - Google Patents

基于可编程接口的验证和调试 Download PDF

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Publication number
CN105474178B
CN105474178B CN201480046839.7A CN201480046839A CN105474178B CN 105474178 B CN105474178 B CN 105474178B CN 201480046839 A CN201480046839 A CN 201480046839A CN 105474178 B CN105474178 B CN 105474178B
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test
vectors
bus
connector
test vectors
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Chinese (zh)
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CN105474178A (zh
Inventor
安舒尔·高霍尔
拉加万德拉·桑塔纳戈帕尔
普拉德普·库马尔·巴博
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Texas Instruments Inc
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Texas Instruments Inc
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/28—Circuits for simultaneous or sequential presentation of more than one variable
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/32—Circuit design at the digital level
    • G06F30/33—Design verification, e.g. functional simulation or model checking
    • G06F30/3308—Design verification, e.g. functional simulation or model checking using simulation
    • G06F30/331—Design verification, e.g. functional simulation or model checking using simulation with hardware acceleration, e.g. by using field programmable gate array [FPGA] or emulation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/34—Circuit design for reconfigurable circuits, e.g. field programmable gate arrays [FPGA] or programmable logic devices [PLD]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Debugging And Monitoring (AREA)
CN201480046839.7A 2013-09-26 2014-09-26 基于可编程接口的验证和调试 Active CN105474178B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/038,743 2013-09-26
US14/038,743 US9152520B2 (en) 2013-09-26 2013-09-26 Programmable interface-based validation and debug
PCT/US2014/057579 WO2015048366A1 (en) 2013-09-26 2014-09-26 Programmable interface-based validation and debug

Publications (2)

Publication Number Publication Date
CN105474178A CN105474178A (zh) 2016-04-06
CN105474178B true CN105474178B (zh) 2019-11-26

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CN201480046839.7A Active CN105474178B (zh) 2013-09-26 2014-09-26 基于可编程接口的验证和调试

Country Status (5)

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US (2) US9152520B2 (enExample)
EP (1) EP3049934A4 (enExample)
JP (1) JP6557220B2 (enExample)
CN (1) CN105474178B (enExample)
WO (1) WO2015048366A1 (enExample)

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US10481990B2 (en) * 2016-06-13 2019-11-19 Intel Corporation Apparatuses and methods for a multiple master capable debug interface
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US10339036B2 (en) * 2016-12-30 2019-07-02 Accenture Global Solutions Limited Test automation using multiple programming languages
US10976361B2 (en) 2018-12-20 2021-04-13 Advantest Corporation Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
US11178085B2 (en) 2019-02-27 2021-11-16 A Social Company Social media platform for sharing reactions to videos
US11137910B2 (en) * 2019-03-04 2021-10-05 Advantest Corporation Fast address to sector number/offset translation to support odd sector size testing
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US10884847B1 (en) 2019-08-20 2021-01-05 Advantest Corporation Fast parallel CRC determination to support SSD testing
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US11734080B1 (en) * 2020-04-07 2023-08-22 Synopsys, Inc. Memory efficient and scalable approach to stimulus (waveform) reading
KR102380506B1 (ko) * 2020-10-29 2022-03-31 포스필 주식회사 전자기기 자가 진단 장치
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US12135351B2 (en) * 2022-02-03 2024-11-05 Stmicroelectronics S.R.L. DFT architecture for analog circuits
CN116794493A (zh) * 2022-03-18 2023-09-22 英业达科技有限公司 以电路板电路传送指令测试连接接口的装置、系统及方法
US20250307095A1 (en) * 2024-03-28 2025-10-02 Keysight Technologies, Inc. System and method for planning and executing test of electronic device
CN118689765A (zh) * 2024-06-05 2024-09-24 陕西千山航空电子有限责任公司 可编程逻辑器件的动态物理测试方法、系统、设备及介质
CN120353657B (zh) * 2025-06-20 2025-09-09 杭州长川科技股份有限公司 测试机调试中pattern加载方法、系统和装置

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Also Published As

Publication number Publication date
US20150253387A1 (en) 2015-09-10
CN105474178A (zh) 2016-04-06
JP6557220B2 (ja) 2019-08-07
JP2016537619A (ja) 2016-12-01
US9152520B2 (en) 2015-10-06
US20150089289A1 (en) 2015-03-26
EP3049934A4 (en) 2017-04-26
EP3049934A1 (en) 2016-08-03
WO2015048366A1 (en) 2015-04-02

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