CN105445977A - 检测液晶显示面板良率的方法 - Google Patents
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Abstract
本发明提供一种检测液晶显示面板良率的方法,将每一液晶显示面板(11)内功能相同的信号线路均连接至一走线(12),该走线(12)延伸至液晶显示母板(1)的外围,形成一对应于所有液晶显示面板(11)的母板集结走线(13),使用各个母板集结走线(13)驱动液晶显示母板(1),对所有液晶显示面板(11)同时进行检测,相比于现有技术,能够减少检测前的一次切割、薄化、二次切割,以及偏贴工序,从而节省时间,快速反应液晶显示面板的品质及良率状况,提升检测效率。
Description
技术领域
本发明涉及显示技术领域,尤其涉及一种检测液晶显示面板良率的方法。
背景技术
液晶显示器(LiquidCrystalDisplay,LCD)具有机身薄、省电、无辐射等众多优点,得到了广泛的应用,如:液晶电视、移动电话、个人数字助理(PDA)、数字相机、计算机屏幕或笔记本电脑屏幕等,在平板显示领域中占主导地位。
现有市场上的液晶显示器大部分为背光型液晶显示器,其包括液晶显示面板及背光模组(backlightmodule)。液晶显示面板的工作原理是在薄膜晶体管阵列基板(ThinFilmTransistorArraySubstrate,TFTArraySubstrate)与彩色滤光片基板(ColorFilter,CF)之间灌入液晶分子,并在两片基板上施加驱动电压来控制液晶分子的旋转方向,以将背光模组的光线折射出来产生画面。
一液晶显示面板内包括多个呈阵列式排布的像素,每个像素电性连接一个薄膜晶体管(ThinFilmTransistor,TFT),该TFT的栅极(Gate)连接至水平方向的扫描线,漏极(Drain)连接至竖直方向的数据线,源极(Source)则连接至像素电极。在水平扫描线上施加足够的电压,会使得电性连接至该条扫描线上的所有TFT打开,从而数据线上的信号电压能够写入像素,控制液晶的透光度,实现显示效果。
在液晶显示面板的生产过程中,需要对其良率进行检测,及时发现问题并进行修复。随着智能型手机对液晶显示面板分辨率的要求越来越高,以低温多晶硅(LowTemperaturePoly-Silicon,LTPS)为半导体材料来制作TFT阵列基板的技术成为主流,对液晶显示面板的良率检测要求也随之增高。目前,业界公知的检测液晶显示面板良率的方法为逐一驱动独立的液晶显示面板,然而该方法需要先将对应于多个液晶显示面板的大尺寸的TFT阵列基板与彩色滤光片基板进行组立,形成包括多个液晶显示面板的液晶显示母板,再经过一次切割、薄化、二次切割,以及偏贴工艺后才能得到独立的具有特定尺寸的液晶显示面板,工序较多、耗时较长、检测效率较低,无法快速反应液晶显示面板的品质及良率状况。
发明内容
本发明的目的在于一种检测液晶显示面板良率的方法,能够减少工序,节省时间,快速反应液晶显示面板的品质及良率状况,提升检测效率。
为实现上述目的,本发明提供了一种检测液晶显示面板良率的方法,包括如下步骤:
步骤1、提供一液晶显示母板,所述液晶显示母板内排布有多个液晶显示面板,每一液晶显示面板内均包括多个不同功能的信号线路;
步骤2、将每一液晶显示面板内功能相同的信号线路均连接至一走线,该走线延伸至液晶显示母板的外围,形成一对应于所有液晶显示面板的母板集结走线;
步骤3、使用各个母板集结走线驱动液晶显示母板,对所有液晶显示面板同时进行检测。
所述液晶显示母板由对应于所有液晶显示面板的TFT阵列基板与彩色滤光片基板组立构成。
所述TFT阵列基板与彩色滤光片基板之间夹设有液晶层。
所述多个不同功能的信号线路制作于所述TFT阵列基板上。
所述多个不同功能的信号线路包括用于输入数据信号的数据线、与用于输入扫描信号的扫描线。
所述步骤2具体包括:将每一液晶显示面板内功能相同的信号线路集结在一起形成一液晶显示面板集结走线,各个功能相同的液晶显示面板集结走线经由同一走线延伸至液晶显示母板外围形成对应的母板集结走线。
所述多个液晶显示面板阵列排布于液晶显示母板中。
相邻的两液晶显示面板之间相互间隔。
本发明的有益效果:本发明提供的一种检测液晶显示面板良率的方法,将每一液晶显示面板内功能相同的信号线路均连接至一走线,该走线延伸至液晶显示母板的外围,形成一对应于所有液晶显示面板的母板集结走线,使用各个母板集结走线驱动液晶显示母板,对所有液晶显示面板同时进行检测,相比于现有技术,能够减少检测前的一次切割、薄化、二次切割,以及偏贴工序,从而节省时间,快速反应液晶显示面板的品质及良率状况,提升检测效率。
附图说明
为了能更进一步了解本发明的特征以及技术内容,请参阅以下有关本发明的详细说明与附图,然而附图仅提供参考与说明用,并非用来对本发明加以限制。
附图中,
图1为本发明的检测液晶显示面板良率的方法的流程图;
图2为本发明的检测液晶显示面板良率的方法中液晶显示母板的示意图。
具体实施方式
为更进一步阐述本发明所采取的技术手段及其效果,以下结合本发明的优选实施例及其附图进行详细描述。
请同时参阅图1与图2,本发明提供一种检测液晶显示面板良率的方法,包括如下步骤:
步骤1、提供一液晶显示母板1,所述液晶显示母板1内排布有多个液晶显示面板11,每一液晶显示面板11内均包括多个不同功能的信号线路。
具体地,所述多个液晶显示面板11阵列排布于液晶显示母板1中。相邻的两液晶显示面板11之间相互间隔,以便于最终对液晶显示母板1进行切割,得到独立的具有特定尺寸的液晶显示面板。
所述液晶显示母板1由对应于所有液晶显示面板11的TFT阵列基板与彩色滤光片基板组立构成。所述TFT阵列基板与彩色滤光片基板之间夹设有液晶层。
所述多个不同功能的信号线路制作于所述TFT阵列基板上。
所述多个不同功能的信号线路包括用于输入数据信号的数据线、与用于输入扫描信号的扫描线。
步骤2、将每一液晶显示面板11内功能相同的信号线路均连接至一走线12,该走线12延伸至液晶显示母板1的外围,形成一对应于所有液晶显示面板11的母板集结走线13。
该步骤2具体包括:将每一液晶显示面板11内功能相同的信号线路集结在一起形成一液晶显示面板集结走线14,各个功能相同的液晶显示面板集结走线14经由同一走线12延伸至液晶显示母板1外围形成对应的母板集结走线13。例如:将每一液晶显示面板11内的数据线集结在一起形成一液晶显示面板数据线集结走线,再将各个液晶显示面板数据线集结走线连接至同一走线,并经由该走线延伸至液晶显示母板1的外围,形成母板数据线集结走线;将每一液晶显示面板11内的扫描线集结在一起形成一液晶显示面板扫描线集结走线,再将各个液晶显示面板扫描线集结走线连接至同一走线,并经由该走线延伸至液晶显示母板1的外围,形成母板扫描线集结走线。
步骤3、使用各个母板集结走线13驱动液晶显示母板1,对液晶显示母板1内排布的所有液晶显示面板11同时进行测试。
相比于现有的通过逐一驱动独立的液晶显示面板来进行检测,本发明的检测液晶显示面板良率的方法能够减少检测前的一次切割、薄化、二次切割,以及偏贴工序,从而节省时间,快速反应液晶显示面板的品质及良率状况,提升检测效率。
综上所述,本发明的检测液晶显示面板良率的方法,将每一液晶显示面板内功能相同的信号线路均连接至一走线,该走线延伸至液晶显示母板的外围,形成一对应于所有液晶显示面板的母板集结走线,使用各个母板集结走线驱动液晶显示母板,对所有液晶显示面板同时进行检测,相比于现有技术,能够减少检测前的一次切割、薄化、二次切割,以及偏贴工序,从而节省时间,快速反应液晶显示面板的品质及良率状况,提升检测效率。
以上所述,对于本领域的普通技术人员来说,可以根据本发明的技术方案和技术构思作出其他各种相应的改变和变形,而所有这些改变和变形都应属于本发明权利要求的保护范围。
Claims (8)
1.一种检测液晶显示面板良率的方法,其特征在于,包括如下步骤:
步骤1、提供一液晶显示母板(1),所述液晶显示母板(1)内排布有多个液晶显示面板(11),每一液晶显示面板(11)内均包括多个不同功能的信号线路;
步骤2、将每一液晶显示面板(11)内功能相同的信号线路均连接至一走线(12),该走线(12)延伸至液晶显示母板(1)的外围,形成一对应于所有液晶显示面板(11)的母板集结走线(13);
步骤3、使用各个母板集结走线(13)驱动液晶显示母板(1),对所有液晶显示面板(11)同时进行检测。
2.如权利要求1所述的检测液晶显示面板良率的方法,其特征在于,所述液晶显示母板(1)由对应于所有液晶显示面板(11)的TFT阵列基板与彩色滤光片基板组立构成。
3.如权利要求2所述的检测液晶显示面板良率的方法,其特征在于,所述TFT阵列基板与彩色滤光片基板之间夹设有液晶层。
4.如权利要求2所述的检测液晶显示面板良率的方法,其特征在于,所述多个不同功能的信号线路制作于所述TFT阵列基板上。
5.如权利要求4所述的检测液晶显示面板良率的方法,其特征在于,所述多个不同功能的信号线路包括用于输入数据信号的数据线、与用于输入扫描信号的扫描线。
6.如权利要求1所述的检测液晶显示面板良率的方法,其特征在于,所述步骤2具体包括:将每一液晶显示面板(11)内功能相同的信号线路集结在一起形成一液晶显示面板集结走线(14),各个功能相同的液晶显示面板集结走线(14)经由同一走线(12)延伸至液晶显示母板(1)外围形成对应的母板集结走线(13)。
7.如权利要求1所述的检测液晶显示面板良率的方法,其特征在于,所述多个液晶显示面板(11)阵列排布于液晶显示母板(1)中。
8.如权利要求7所述的检测液晶显示面板良率的方法,其特征在于,相邻的两液晶显示面板(11)之间相互间隔。
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CN201610040495.XA CN105445977A (zh) | 2016-01-21 | 2016-01-21 | 检测液晶显示面板良率的方法 |
PCT/CN2016/074614 WO2017124609A1 (zh) | 2016-01-21 | 2016-02-26 | 检测液晶显示面板良率的方法 |
US15/026,246 US20180046049A1 (en) | 2016-01-21 | 2016-02-26 | Method of detecting liquid crystal display panel yield |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN108257540A (zh) * | 2018-01-26 | 2018-07-06 | 鄂尔多斯市源盛光电有限责任公司 | 显示基板、显示基板的测试方法和显示装置 |
CN109031721A (zh) * | 2018-08-22 | 2018-12-18 | 张家港康得新光电材料有限公司 | 液晶面板母板及检测装置和检测方法、液晶面板制备方法 |
CN110112139A (zh) * | 2019-04-11 | 2019-08-09 | 深圳市华星光电半导体显示技术有限公司 | 阵列基板母板 |
CN111652491A (zh) * | 2020-05-28 | 2020-09-11 | Tcl华星光电技术有限公司 | 显示面板的抽检方法、流水线控制装置及存储介质 |
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US5258705A (en) * | 1990-12-21 | 1993-11-02 | Sharp Kabushiki Kaisha | Active matrix substrate inspecting device |
JP3667548B2 (ja) * | 1998-03-27 | 2005-07-06 | シャープ株式会社 | アクティブマトリクス型液晶表示パネル及びその検査方法 |
JP2001021912A (ja) * | 1999-07-06 | 2001-01-26 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタ回路基板及び液晶表示装置の製造方法 |
JP5297668B2 (ja) * | 2008-03-19 | 2013-09-25 | 株式会社ジャパンディスプレイ | 液晶表示装置 |
CN101276083B (zh) * | 2008-05-07 | 2012-01-18 | 友达光电股份有限公司 | 适用激光切割技术的显示面板及其母板 |
CN102681224B (zh) * | 2012-04-25 | 2015-06-17 | 京东方科技集团股份有限公司 | 液晶屏检测装置及方法 |
CN203350556U (zh) * | 2013-08-09 | 2013-12-18 | 合肥京东方光电科技有限公司 | 一种阵列基板母板、阵列基板引线检测装置 |
CN104090404B (zh) * | 2014-06-30 | 2017-02-08 | 成都天马微电子有限公司 | 一种液晶显示母板及液晶显示母板的制造方法 |
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2016
- 2016-01-21 CN CN201610040495.XA patent/CN105445977A/zh active Pending
- 2016-02-26 US US15/026,246 patent/US20180046049A1/en not_active Abandoned
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108257540A (zh) * | 2018-01-26 | 2018-07-06 | 鄂尔多斯市源盛光电有限责任公司 | 显示基板、显示基板的测试方法和显示装置 |
CN109031721A (zh) * | 2018-08-22 | 2018-12-18 | 张家港康得新光电材料有限公司 | 液晶面板母板及检测装置和检测方法、液晶面板制备方法 |
CN110112139A (zh) * | 2019-04-11 | 2019-08-09 | 深圳市华星光电半导体显示技术有限公司 | 阵列基板母板 |
CN111652491A (zh) * | 2020-05-28 | 2020-09-11 | Tcl华星光电技术有限公司 | 显示面板的抽检方法、流水线控制装置及存储介质 |
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US20180046049A1 (en) | 2018-02-15 |
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