CN105359412B - 支持高于电源的电压的开关 - Google Patents
支持高于电源的电压的开关 Download PDFInfo
- Publication number
- CN105359412B CN105359412B CN201480038555.3A CN201480038555A CN105359412B CN 105359412 B CN105359412 B CN 105359412B CN 201480038555 A CN201480038555 A CN 201480038555A CN 105359412 B CN105359412 B CN 105359412B
- Authority
- CN
- China
- Prior art keywords
- type metal
- transistor
- semiconductor transistor
- oxide
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/06—Modifications for ensuring a fully conducting state
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
- H03K17/0812—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit
- H03K17/08122—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/06—Modifications for ensuring a fully conducting state
- H03K2017/066—Maximizing the OFF-resistance instead of minimizing the ON-resistance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0054—Gating switches, e.g. pass gates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Electronic Switches (AREA)
- Logic Circuits (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/941,419 | 2013-07-12 | ||
| US13/941,419 US9245886B2 (en) | 2013-07-12 | 2013-07-12 | Switch supporting voltages greater than supply |
| PCT/US2014/046426 WO2015006741A1 (en) | 2013-07-12 | 2014-07-11 | Switch supporting voltages greater than supply |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105359412A CN105359412A (zh) | 2016-02-24 |
| CN105359412B true CN105359412B (zh) | 2017-09-29 |
Family
ID=51230240
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201480038555.3A Active CN105359412B (zh) | 2013-07-12 | 2014-07-11 | 支持高于电源的电压的开关 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9245886B2 (enExample) |
| EP (1) | EP3020132B1 (enExample) |
| JP (1) | JP6239106B2 (enExample) |
| KR (1) | KR102190347B1 (enExample) |
| CN (1) | CN105359412B (enExample) |
| WO (1) | WO2015006741A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10236873B2 (en) * | 2015-03-17 | 2019-03-19 | Xilinx, Inc. | Analog switch having reduced gate-induced drain leakage |
| US10545053B2 (en) * | 2017-06-07 | 2020-01-28 | Xilinx, Inc. | Dynamic element matching in an integrated circuit |
| US10608630B1 (en) | 2018-06-26 | 2020-03-31 | Xilinx, Inc. | Method of increased supply rejection on single-ended complementary metal-oxide-semiconductor (CMOS) switches |
| JP7329411B2 (ja) | 2019-10-18 | 2023-08-18 | エイブリック株式会社 | アナログスイッチ |
| US11190178B1 (en) * | 2020-10-28 | 2021-11-30 | Xilinx, Inc. | Gate induced drain leakage robust bootstrapped switch |
| WO2025072448A2 (en) * | 2023-09-28 | 2025-04-03 | Quantinuum Llc | High-voltage glitch-suppressed semiconductor switch for quantum object confinement apparatus |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101567681A (zh) * | 2008-04-25 | 2009-10-28 | 恩益禧电子股份有限公司 | 模拟多路复用器及其选择信号生成方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5927622A (ja) * | 1982-08-04 | 1984-02-14 | Sanyo Electric Co Ltd | アナログスイツチ回路 |
| JPH09167950A (ja) * | 1995-12-18 | 1997-06-24 | Nissan Motor Co Ltd | アナログスイッチ |
| GB2327544B (en) * | 1997-07-16 | 2001-02-07 | Ericsson Telefon Ab L M | Electronic analogue switch |
| US8289066B2 (en) | 2009-12-30 | 2012-10-16 | Stmicroelectronics Asia Pacific Pte Ltd. | Gate control circuit for high bandwidth switch design |
| US8519771B1 (en) * | 2010-12-22 | 2013-08-27 | Xilinx, Inc. | Methods and apparatus for receiving high and low voltage signals using a low supply voltage technology |
-
2013
- 2013-07-12 US US13/941,419 patent/US9245886B2/en active Active
-
2014
- 2014-07-11 CN CN201480038555.3A patent/CN105359412B/zh active Active
- 2014-07-11 KR KR1020167003527A patent/KR102190347B1/ko active Active
- 2014-07-11 JP JP2016525826A patent/JP6239106B2/ja active Active
- 2014-07-11 EP EP14744738.7A patent/EP3020132B1/en active Active
- 2014-07-11 WO PCT/US2014/046426 patent/WO2015006741A1/en not_active Ceased
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101567681A (zh) * | 2008-04-25 | 2009-10-28 | 恩益禧电子股份有限公司 | 模拟多路复用器及其选择信号生成方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2015006741A1 (en) | 2015-01-15 |
| EP3020132A1 (en) | 2016-05-18 |
| US20150014779A1 (en) | 2015-01-15 |
| JP2016526859A (ja) | 2016-09-05 |
| CN105359412A (zh) | 2016-02-24 |
| EP3020132B1 (en) | 2019-03-27 |
| US9245886B2 (en) | 2016-01-26 |
| KR20160032158A (ko) | 2016-03-23 |
| KR102190347B1 (ko) | 2020-12-11 |
| JP6239106B2 (ja) | 2017-11-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |