CN105190823B - 多x射线束管 - Google Patents
多x射线束管 Download PDFInfo
- Publication number
- CN105190823B CN105190823B CN201480008739.5A CN201480008739A CN105190823B CN 105190823 B CN105190823 B CN 105190823B CN 201480008739 A CN201480008739 A CN 201480008739A CN 105190823 B CN105190823 B CN 105190823B
- Authority
- CN
- China
- Prior art keywords
- ray
- liquid metal
- electron
- ray source
- jet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/112—Non-rotating anodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
- G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/08—Targets (anodes) and X-ray converters
- H01J2235/081—Target material
- H01J2235/082—Fluids, e.g. liquids, gases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/08—Targets (anodes) and X-ray converters
- H01J2235/086—Target geometry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/10—Drive means for anode (target) substrate
Landscapes
- X-Ray Techniques (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361764043P | 2013-02-13 | 2013-02-13 | |
| US61/764,043 | 2013-02-13 | ||
| PCT/IB2014/058627 WO2014125389A1 (en) | 2013-02-13 | 2014-01-29 | Multiple x-ray beam tube |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105190823A CN105190823A (zh) | 2015-12-23 |
| CN105190823B true CN105190823B (zh) | 2017-11-17 |
Family
ID=50156815
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201480008739.5A Expired - Fee Related CN105190823B (zh) | 2013-02-13 | 2014-01-29 | 多x射线束管 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9767982B2 (https=) |
| EP (1) | EP2956954B1 (https=) |
| JP (1) | JP6277204B2 (https=) |
| CN (1) | CN105190823B (https=) |
| WO (1) | WO2014125389A1 (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103171819B (zh) | 2013-04-16 | 2015-11-25 | 葛兰素史克(中国)投资有限公司 | 给液器 |
| JP7171190B2 (ja) * | 2014-11-11 | 2022-11-15 | コーニンクレッカ フィリップス エヌ ヴェ | 線源-検出器装置 |
| US10117629B2 (en) * | 2014-12-03 | 2018-11-06 | Board Of Supervisors Of Louisiana State University And Agricultural And Mechanical College | High energy grating techniques |
| WO2017019782A1 (en) * | 2015-07-27 | 2017-02-02 | Rensselaer Polytechnic Institute | Combination of an x-ray tube and a source grating with electron beam manipulation |
| US10660595B2 (en) | 2016-06-16 | 2020-05-26 | Koninklijke Philips N.V. | Apparatus for x-ray imaging an object |
| WO2018134347A1 (en) * | 2017-01-19 | 2018-07-26 | Koninklijke Philips N.V. | X-ray source arrangement for generating x-ray radiation |
| EP3385976A1 (en) * | 2017-04-05 | 2018-10-10 | Excillum AB | Vapour monitoring |
| ES3023841T3 (en) | 2018-05-25 | 2025-06-03 | Micro X Ltd | A device and method for applying beamforming signal processing to rf modulated x-rays |
| US11237483B2 (en) * | 2020-06-15 | 2022-02-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for controlling droplet in extreme ultraviolet light source |
| EP4075474A1 (en) * | 2021-04-15 | 2022-10-19 | Excillum AB | Liquid jet target x-ray source |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003303764A (ja) * | 2002-04-12 | 2003-10-24 | Gigaphoton Inc | Lpp光源装置 |
| CN1466860A (zh) * | 2000-07-28 | 2004-01-07 | 产生x-光或euv辐射的方法和装置 | |
| US20040159802A1 (en) * | 2003-02-13 | 2004-08-19 | Christian Ziener | Arrangement for the generation of intensive short-wave radiation based on a plasma |
| CN102768931A (zh) * | 2012-07-30 | 2012-11-07 | 深圳大学 | 用于大视场x射线相衬成像的x射线源 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6831963B2 (en) * | 2000-10-20 | 2004-12-14 | University Of Central Florida | EUV, XUV, and X-Ray wavelength sources created from laser plasma produced from liquid metal solutions |
| US6711233B2 (en) * | 2000-07-28 | 2004-03-23 | Jettec Ab | Method and apparatus for generating X-ray or EUV radiation |
| EP1731099A1 (en) | 2005-06-06 | 2006-12-13 | Paul Scherrer Institut | Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source |
| SE530094C2 (sv) * | 2006-05-11 | 2008-02-26 | Jettec Ab | Metod för alstring av röntgenstrålning genom elektronbestrålning av en flytande substans |
| GB2441578A (en) | 2006-09-08 | 2008-03-12 | Ucl Business Plc | Phase Contrast X-Ray Imaging |
| US7693256B2 (en) | 2008-03-19 | 2010-04-06 | C-Rad Innovation Ab | Phase-contrast X-ray imaging |
| US7929667B1 (en) * | 2008-10-02 | 2011-04-19 | Kla-Tencor Corporation | High brightness X-ray metrology |
| CN102651994A (zh) | 2009-12-10 | 2012-08-29 | 皇家飞利浦电子股份有限公司 | 微分相位对比成像系统的校准 |
| JP5944413B2 (ja) | 2011-02-07 | 2016-07-05 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | ダイナミックレンジを増大する微分位相コントラスト撮像装置及び方法 |
-
2014
- 2014-01-29 EP EP14706104.8A patent/EP2956954B1/en not_active Not-in-force
- 2014-01-29 JP JP2015556593A patent/JP6277204B2/ja not_active Expired - Fee Related
- 2014-01-29 CN CN201480008739.5A patent/CN105190823B/zh not_active Expired - Fee Related
- 2014-01-29 US US14/765,391 patent/US9767982B2/en not_active Expired - Fee Related
- 2014-01-29 WO PCT/IB2014/058627 patent/WO2014125389A1/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1466860A (zh) * | 2000-07-28 | 2004-01-07 | 产生x-光或euv辐射的方法和装置 | |
| JP2003303764A (ja) * | 2002-04-12 | 2003-10-24 | Gigaphoton Inc | Lpp光源装置 |
| US20040159802A1 (en) * | 2003-02-13 | 2004-08-19 | Christian Ziener | Arrangement for the generation of intensive short-wave radiation based on a plasma |
| CN102768931A (zh) * | 2012-07-30 | 2012-11-07 | 深圳大学 | 用于大视场x射线相衬成像的x射线源 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2014125389A1 (en) | 2014-08-21 |
| EP2956954B1 (en) | 2017-03-15 |
| CN105190823A (zh) | 2015-12-23 |
| JP2016511924A (ja) | 2016-04-21 |
| US20150380200A1 (en) | 2015-12-31 |
| JP6277204B2 (ja) | 2018-02-07 |
| US9767982B2 (en) | 2017-09-19 |
| EP2956954A1 (en) | 2015-12-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20171117 Termination date: 20200129 |