CN104914346A - Non-principle test device for general digital plug-ins and test method thereof - Google Patents
Non-principle test device for general digital plug-ins and test method thereof Download PDFInfo
- Publication number
- CN104914346A CN104914346A CN201510229128.XA CN201510229128A CN104914346A CN 104914346 A CN104914346 A CN 104914346A CN 201510229128 A CN201510229128 A CN 201510229128A CN 104914346 A CN104914346 A CN 104914346A
- Authority
- CN
- China
- Prior art keywords
- testing
- boundary scan
- test
- digital
- plug
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to a non-principle test device for general digital plug-ins, comprising a test control computer, a function test branch computer and a boundary scanning test branch computer which are arranged in an integrated test cabinet. The power input ends of the test control computer, the function test branch computer and the boundary scanning test branch computer are connected with a 220 mains supply through power lines. The test control computer is connected with the boundary scanning test branch computer through a USB cable, and the test control computer is connected with the function test branch computer through a network cable. The test control computer and the boundary scanning test branch computer communicate in a two-way mode, and the test control computer and the function test branch computer communicate in a two-way mode. The invention further discloses a test method of the non-principle test device for general digital plug-ins. The fault detection rate and fault isolation rate of digital plug-in boards are improved, the technical requirement for maintenance technicians is lowered, and the efficiency of digital plug-in test and repair is improved. The non-principle test device can assist in testing and debugging digital plug-ins in radar products, and especially, a testing and debugging platform is provided for separate plug-ins unable to build a whole system.
Description
Technical field
The present invention relates to the automatic test technology field of digital circuit board, especially a kind of non-principle proving installation of general digital plug-in unit and method of testing thereof.
Background technology
At industrial circle, electronic equipment becoming robotization, intelligentized while, design also becomes more complicated, due to a large amount of uses of multi-layered high-density pcb board and bga device, make to become very difficulty to the test of circuit board, be especially embodied on the digital plug-in unit of radar system.But, in order to tackle the more and more harsher quality requirements of user and device context use needs, but the construction of reinforcement power of test of having to.At present, for the test of the digital plug-in unit of radar system, need the test macro building a whole set of, the function quality of measured number plug-in unit is indirectly located by the principle of work of entire system, and the localization of fault lacked components and parts on digital plug-in unit, and the location to the solder failure such as short circuit, open circuit.
Summary of the invention
Primary and foremost purpose of the present invention is to provide a kind of without the need to building a whole set of test macro, directly can carry out fault diagnosis to monolithic digital plug-in unit, and direct localization of fault is on the components and parts on digital plug-in unit, or on the trouble spot such as short circuit, open circuit, simultaneously can the non-principle proving installation of general digital plug-in unit of compatible Multiple Type Radar Products.
For achieving the above object, present invention employs following technical scheme: a kind of non-principle proving installation of general digital plug-in unit, comprise the testing and control computing machine be arranged in integration testing rack, functional test extension set and boundary scan testing extension set, the power input of three all connects 220V civil power by power lead, testing and control computing machine is connected with boundary scan testing extension set by USB cable, testing and control computing machine is connected with functional test extension set by netting twine, testing and control computing machine and boundary scan testing extension set both-way communication, testing and control computing machine and functional test extension set both-way communication.
Described boundary scan testing extension set comprises the first Switching Power Supply, its power input connects 220V civil power, its power output end is connected by the input end of voltage stabilizer with boundary scan testing backboard, boundary scan backboard respectively with boundary scan router, digital plug-in unit to be measured and multiple digital I/O mouth both-way communication, boundary scan router respectively with multiple digital I/O mouth, boundary scan controller both-way communication, boundary scan controller and the communication of described testing and control computer bidirectional.
Described functional test extension set comprises second switch power supply, its power input connects 220V civil power, its power output end is connected by the input end of switching regulator with functional test backboard, functional test backboard respectively with computer socket, digital plug-in unit both-way communication to be measured, computer socket and the communication of described testing and control computer bidirectional.
The number of described digital I/O mouth is 3, connected by J18A3Z3HNP connector between described first Switching Power Supply and voltage stabilizer, connected by PDS-210KB1 connector between described voltage stabilizer and boundary scan testing backboard, connected by PC104-64 connector between described multiple digital I/O mouth and boundary scan testing backboard, connected by 201-2*7GS connector between described boundary scan router and multiple digital I/O mouth, connected by 201-2*7GS connector between described boundary scan router and boundary scan testing backboard, connected by JTAG cable between described boundary scan controller and boundary scan router.
Described boundary scan testing backboard is made up of a PDS210J socket group and digital I/O socket group, one PDS210J socket group and digital I/O socket group both-way communication, described voltage stabilizer is powered respectively to a PDS210J socket group, digital I/O socket group, a described PDS210J socket group and digital plug-in unit both-way communication to be measured, described digital I/O socket group respectively with digital I/O mouth, boundary scan router both-way communication; Described boundary scan controller adopts jtag controller.
Connected by J18A3Z3HNP connector between described second switch power supply and switching regulator, connected by PDS-210KB1 connector between described switching regulator and functional test backboard, connected by PDS-210KB1 connector between described functional test backboard and computer socket.
Described functional test backboard comprises the 2nd PDS210J socket group, 2nd PDS210J socket group respectively with computer socket, level shifting circuit, FPGA both-way communication, FPGA and D/A translation circuit both-way communication, described switching regulator is powered respectively to D/A translation circuit, the 2nd PDS210J socket group, FPGA, level shifting circuit and storer, FPGA and storer both-way communication, 2nd PDS210J socket group and level shifting circuit both-way communication, level shifting circuit and digital plug-in unit both-way communication to be measured.
Another object of the present invention is to the method for testing of the non-principle proving installation that a kind of general digital plug-in unit is provided, the method comprises: when carrying out boundary scan testing, sent by testing and control computing machine and control signal to boundary scan testing extension set, boundary scan testing extension set receives the laggard row bound sweep test of control signal, and the trouble spot of location, short trouble and open fault are sent to testing and control computing machine; When carrying out functional test, being sent control signal to functional test extension set by testing and control computing machine, functional test extension set carries out functional test after receiving control signal, and the trouble spot of location, short trouble and open fault are sent to testing and control computing machine.
When carrying out boundary scan testing, after the boundary scan controller of boundary scan testing extension set receives control signal, control figure I/O mouth produces test vector group, then by a PDS210J socket group, the test vector of generation is sent to digital plug-in unit to be measured, digital plug-in unit to be measured returns test vector, boundary scan controller contrasts the test vector sent out and the test vector fault point returned, and judge open circuit and short trouble, finally the trouble spot of location, short trouble and open fault are sent to testing and control computing machine.
When carrying out functional test, testing and control computing machine controls FPGA and produces test vector, then by the 2nd PDS210J socket group, level shifting circuit, the test vector of generation is sent to digital plug-in unit to be measured, digital plug-in unit to be measured returns test vector, FPGA contrasts the test vector sent out and the test vector fault point returned, and judge open circuit and short trouble, finally the trouble spot of location, short trouble and open fault are sent to testing and control computing machine.
As shown from the above technical solution, advantage of the present invention is as follows: first, invention increases fault detect rate and the Percent Isolated of digital plug-in card, reduce the technical requirement to maintenance technician, alleviate them owing to being unfamiliar with to plug-in unit signal flow, logical relation the pressure brought, improve the test of digital plug-in unit, reprocess efficiency; The second, the present invention has assisted test, the debugging of digital plug-in unit in Radar Products, provides a test, debug platform especially to the independent plug-in unit that cannot build whole system; 3rd, the present invention also pays user's use as the supporting test and maintenance equipment of Radar Products with product, creates economic benefit.
Accompanying drawing explanation
Fig. 1 is system architecture diagram of the present invention;
Fig. 2 is the structured flowchart of boundary scan testing extension set in Fig. 1;
Fig. 3 is the structured flowchart of functional test extension set in Fig. 1;
Fig. 4 is the structured flowchart of boundary scan testing backboard in Fig. 2;
Fig. 5 is the structured flowchart of functional test backboard in Fig. 3;
Fig. 6,7 is respectively the method for testing process flow diagram that the present invention carries out boundary scan testing, functional test.
Embodiment
A kind of non-principle proving installation of general digital plug-in unit, comprise the testing and control computing machine 4 be arranged in integration testing rack 1, functional test extension set 3 and boundary scan testing extension set 2, the power input of three all connects 220V civil power by power lead, testing and control computing machine 4 is connected with boundary scan testing extension set 2 by USB cable, testing and control computing machine 4 is connected with functional test extension set 3 by netting twine, testing and control computing machine 4 and boundary scan testing extension set 2 both-way communication, testing and control computing machine 4 and functional test extension set 3 both-way communication, as shown in Figure 1.
As shown in Figure 2, described boundary scan testing extension set 2 comprises the first Switching Power Supply, its power input connects 220V civil power, its power output end is connected by the input end of voltage stabilizer with boundary scan testing backboard 2a, boundary scan backboard respectively with boundary scan router, digital plug-in unit to be measured and multiple digital I/O mouth both-way communication, boundary scan router respectively with multiple digital I/O mouth, boundary scan controller both-way communication, boundary scan controller and described testing and control computing machine 4 both-way communication.The number of described digital I/O mouth is 3, connected by J18A3Z3HNP connector between described first Switching Power Supply and voltage stabilizer, connected by PDS-210KB1 connector between described voltage stabilizer and boundary scan testing backboard 2a, connected by PC104-64 connector between described multiple digital I/O mouth and boundary scan testing backboard 2a, connected by 201-2*7GS connector between described boundary scan router and multiple digital I/O mouth, connected by 201-2*7GS connector between described boundary scan router and boundary scan testing backboard 2a, connected by JTAG cable between described boundary scan controller and boundary scan router.
As shown in Figure 4, described boundary scan testing backboard 2a is made up of a PDS210J socket group and digital I/O socket group, one PDS210J socket group and digital I/O socket group both-way communication, described voltage stabilizer is powered respectively to a PDS210J socket group, digital I/O socket group, a described PDS210J socket group and digital plug-in unit both-way communication to be measured, described digital I/O socket group respectively with digital I/O mouth, boundary scan router both-way communication; Described boundary scan controller adopts jtag controller.
As shown in Figure 3, described functional test extension set 3 comprises second switch power supply, its power input connects 220V civil power, its power output end is connected by the input end of switching regulator with functional test backboard 3a, functional test backboard 3a respectively with computer socket, digital plug-in unit both-way communication to be measured, computer socket and described testing and control computing machine 4 both-way communication.Connected by J18A3Z3HNP connector between described second switch power supply and switching regulator, connected by PDS-210KB1 connector between described switching regulator and functional test backboard 3a, connected by PDS-210KB1 connector between described functional test backboard 3a and computer socket.
As shown in Figure 5, described functional test backboard 3a comprises the 2nd PDS210J socket group, 2nd PDS210J socket group respectively with computer socket, level shifting circuit, FPGA both-way communication, FPGA and D/A translation circuit both-way communication, described switching regulator is powered respectively to D/A translation circuit, the 2nd PDS210J socket group, FPGA, level shifting circuit and storer, FPGA and storer both-way communication, 2nd PDS210J socket group and level shifting circuit both-way communication, level shifting circuit and digital plug-in unit both-way communication to be measured.
Below in conjunction with Fig. 1,2,3,4,5,6,7 the present invention is further illustrated.
In use, according to the kind of digital plug-in unit to be measured, in integration testing rack 1, boundary scan testing extension set 2 and functional test extension set 3 is selected to test.When carrying out boundary scan testing, sent by testing and control computing machine 4 and control signal to boundary scan testing extension set 2, boundary scan testing extension set 2 receives the laggard row bound sweep test of control signal, and the trouble spot of location, short trouble and open fault are sent to testing and control computing machine 4; When carrying out functional test, sent by testing and control computing machine 4 and control signal to functional test extension set 3, functional test extension set 3 carries out functional test after receiving control signal, and the trouble spot of location, short trouble and open fault are sent to testing and control computing machine 4.
When carrying out boundary scan and surveying, by boundary scan testing backboard 2a, digital plug-in unit to be measured is connected with boundary scan router, by the first Switching Power Supply and voltage stabilizer, digital plug-in unit to be measured is powered, then digital I/O mouth is under the control of boundary scan controller, boundary scan testing is carried out to digital plug-in unit to be measured, boundary scan controller and testing and control computing machine 4 communication, carry out the collection of test vector generation and test result, and finally generate test report to digital plug-in unit to be measured.That is, when carrying out boundary scan testing, after the boundary scan controller of boundary scan testing extension set 2 receives control signal, control figure I/O mouth produces test vector group, then by a PDS210J socket group, the test vector of generation is sent to digital plug-in unit to be measured, digital plug-in unit to be measured returns test vector, boundary scan controller contrasts the test vector sent out and the test vector fault point returned, and judge open circuit and short trouble, finally the trouble spot of location, short trouble and open fault are sent to testing and control computing machine 4.
When carrying out functional test, by functional test backboard 3a, digital plug-in unit to be measured is connected with computer socket, by second switch power supply and switching regulator, digital plug-in unit to be measured is powered, then by testing and control computing machine 4 computer for controlling plug-in unit, measured piece is tested.That is, when carrying out functional test, testing and control computing machine 4 controls FPGA and produces test vector, then by the 2nd PDS210J socket group, level shifting circuit, the test vector of generation is sent to digital plug-in unit to be measured, digital plug-in unit to be measured returns test vector, FPGA contrasts the test vector sent out and the test vector fault point returned, and judge open circuit and short trouble, finally the trouble spot of location, short trouble and open fault are sent to testing and control computing machine 4.
In sum, invention increases fault detect rate and the Percent Isolated of digital plug-in card, reduce the technical requirement to maintenance technician, alleviate them owing to being unfamiliar with to plug-in unit signal flow, logical relation the pressure brought, improve the test of digital plug-in unit, reprocess efficiency.
Claims (10)
1. the non-principle proving installation of a general digital plug-in unit, it is characterized in that: comprise the testing and control computing machine be arranged in integration testing rack, functional test extension set and boundary scan testing extension set, the power input of three all connects 220V civil power by power lead, testing and control computing machine is connected with boundary scan testing extension set by USB cable, testing and control computing machine is connected with functional test extension set by netting twine, testing and control computing machine and boundary scan testing extension set both-way communication, testing and control computing machine and functional test extension set both-way communication.
2. the non-principle proving installation of general digital plug-in unit according to claim 1, it is characterized in that: described boundary scan testing extension set comprises the first Switching Power Supply, its power input connects 220V civil power, its power output end is connected by the input end of voltage stabilizer with boundary scan testing backboard, boundary scan backboard respectively with boundary scan router, digital plug-in unit to be measured and multiple digital I/O mouth both-way communication, boundary scan router respectively with multiple digital I/O mouth, boundary scan controller both-way communication, boundary scan controller and the communication of described testing and control computer bidirectional.
3. the non-principle proving installation of general digital plug-in unit according to claim 1, it is characterized in that: described functional test extension set comprises second switch power supply, its power input connects 220V civil power, its power output end is connected by the input end of switching regulator with functional test backboard, functional test backboard respectively with computer socket, digital plug-in unit both-way communication to be measured, computer socket and the communication of described testing and control computer bidirectional.
4. the non-principle proving installation of general digital plug-in unit according to claim 2, it is characterized in that: the number of described digital I/O mouth is 3, connected by J18A3Z3HNP connector between described first Switching Power Supply and voltage stabilizer, connected by PDS-210KB1 connector between described voltage stabilizer and boundary scan testing backboard, connected by PC104-64 connector between described multiple digital I/O mouth and boundary scan testing backboard, connected by 201-2*7GS connector between described boundary scan router and multiple digital I/O mouth, connected by 201-2*7GS connector between described boundary scan router and boundary scan testing backboard, connected by JTAG cable between described boundary scan controller and boundary scan router.
5. the non-principle proving installation of general digital plug-in unit according to claim 2, it is characterized in that: described boundary scan testing backboard is made up of a PDS210J socket group and digital I/O socket group, one PDS210J socket group and digital I/O socket group both-way communication, described voltage stabilizer is powered respectively to a PDS210J socket group, digital I/O socket group, a described PDS210J socket group and digital plug-in unit both-way communication to be measured, described digital I/O socket group respectively with digital I/O mouth, boundary scan router both-way communication; Described boundary scan controller adopts jtag controller.
6. the non-principle proving installation of general digital plug-in unit according to claim 3, it is characterized in that: connected by J18A3Z3HNP connector between described second switch power supply and switching regulator, connected by PDS-210KB1 connector between described switching regulator and functional test backboard, connected by PDS-210KB1 connector between described functional test backboard and computer socket.
7. the non-principle proving installation of general digital plug-in unit according to claim 3, it is characterized in that: described functional test backboard comprises the 2nd PDS210J socket group, 2nd PDS210J socket group respectively with computer socket, level shifting circuit, FPGA both-way communication, FPGA and D/A translation circuit both-way communication, described switching regulator is respectively to D/A translation circuit, 2nd PDS210J socket group, FPGA, level shifting circuit and storer are powered, FPGA and storer both-way communication, 2nd PDS210J socket group and level shifting circuit both-way communication, level shifting circuit and digital plug-in unit both-way communication to be measured.
8. the method for testing of the non-principle proving installation of a general digital plug-in unit, the method comprises: when carrying out boundary scan testing, sent by testing and control computing machine and control signal to boundary scan testing extension set, boundary scan testing extension set receives the laggard row bound sweep test of control signal, and the trouble spot of location, short trouble and open fault are sent to testing and control computing machine; When carrying out functional test, being sent control signal to functional test extension set by testing and control computing machine, functional test extension set carries out functional test after receiving control signal, and the trouble spot of location, short trouble and open fault are sent to testing and control computing machine.
9. method of testing according to claim 8, it is characterized in that: when carrying out boundary scan testing, after the boundary scan controller of boundary scan testing extension set receives control signal, control figure I/O mouth produces test vector group, then by a PDS210J socket group, the test vector of generation is sent to digital plug-in unit to be measured, digital plug-in unit to be measured returns test vector, boundary scan controller contrasts the test vector sent out and the test vector fault point returned, and judge open circuit and short trouble, finally by the trouble spot of location, short trouble and open fault are sent to testing and control computing machine.
10. method of testing according to claim 8, it is characterized in that: when carrying out functional test, testing and control computing machine controls FPGA and produces test vector, then by the 2nd PDS210J socket group, level shifting circuit, the test vector of generation is sent to digital plug-in unit to be measured, digital plug-in unit to be measured returns test vector, FPGA contrasts the test vector sent out and the test vector fault point returned, and judge open circuit and short trouble, finally the trouble spot of location, short trouble and open fault are sent to testing and control computing machine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510229128.XA CN104914346B (en) | 2015-05-07 | 2015-05-07 | The non-principle system safety testing device and its method of testing of a kind of general digital plug-in unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510229128.XA CN104914346B (en) | 2015-05-07 | 2015-05-07 | The non-principle system safety testing device and its method of testing of a kind of general digital plug-in unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104914346A true CN104914346A (en) | 2015-09-16 |
| CN104914346B CN104914346B (en) | 2017-11-17 |
Family
ID=54083583
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510229128.XA Active CN104914346B (en) | 2015-05-07 | 2015-05-07 | The non-principle system safety testing device and its method of testing of a kind of general digital plug-in unit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104914346B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI697005B (en) * | 2018-05-10 | 2020-06-21 | 力成科技股份有限公司 | Testing device and testing method |
| US11714402B2 (en) | 2021-09-29 | 2023-08-01 | 38Th Research Institute, China Electronics Technology Group Corporation | Universal automatic test system for digital plugboard based on imagine processing |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101937222A (en) * | 2010-08-17 | 2011-01-05 | 北京交通大学 | Board level testing system |
| CN201780320U (en) * | 2010-07-30 | 2011-03-30 | 深圳安博电子有限公司 | Testing system |
| CN102435938A (en) * | 2011-10-28 | 2012-05-02 | 中国电子科技集团公司第三十八研究所 | Function-based digital circuit failure detecting and positioning system and method |
| CN102818986A (en) * | 2012-08-20 | 2012-12-12 | 桂林电子科技大学 | Mixed signal circuit boundary scanning test system and test method |
| CN202735479U (en) * | 2012-09-11 | 2013-02-13 | 中国电子科技集团公司第三十八研究所 | Extensible boundary scan test system |
| CN203519783U (en) * | 2013-11-01 | 2014-04-02 | 中国电子科技集团公司第三十八研究所 | General open-type integration test device based on PXI bus |
| CN103852709A (en) * | 2012-11-28 | 2014-06-11 | 英业达科技有限公司 | Test system and method of circuit board function and electronic component on circuit board |
| CN104133171A (en) * | 2014-07-31 | 2014-11-05 | 中国人民解放军空军预警学院 | Simple boundary scan test system and method based on single-chip microcomputer |
-
2015
- 2015-05-07 CN CN201510229128.XA patent/CN104914346B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201780320U (en) * | 2010-07-30 | 2011-03-30 | 深圳安博电子有限公司 | Testing system |
| CN101937222A (en) * | 2010-08-17 | 2011-01-05 | 北京交通大学 | Board level testing system |
| CN102435938A (en) * | 2011-10-28 | 2012-05-02 | 中国电子科技集团公司第三十八研究所 | Function-based digital circuit failure detecting and positioning system and method |
| CN102818986A (en) * | 2012-08-20 | 2012-12-12 | 桂林电子科技大学 | Mixed signal circuit boundary scanning test system and test method |
| CN202735479U (en) * | 2012-09-11 | 2013-02-13 | 中国电子科技集团公司第三十八研究所 | Extensible boundary scan test system |
| CN103852709A (en) * | 2012-11-28 | 2014-06-11 | 英业达科技有限公司 | Test system and method of circuit board function and electronic component on circuit board |
| CN203519783U (en) * | 2013-11-01 | 2014-04-02 | 中国电子科技集团公司第三十八研究所 | General open-type integration test device based on PXI bus |
| CN104133171A (en) * | 2014-07-31 | 2014-11-05 | 中国人民解放军空军预警学院 | Simple boundary scan test system and method based on single-chip microcomputer |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI697005B (en) * | 2018-05-10 | 2020-06-21 | 力成科技股份有限公司 | Testing device and testing method |
| US11714402B2 (en) | 2021-09-29 | 2023-08-01 | 38Th Research Institute, China Electronics Technology Group Corporation | Universal automatic test system for digital plugboard based on imagine processing |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104914346B (en) | 2017-11-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN204965090U (en) | Integrated multiple fault type's intelligent fault injection system | |
| CN103645399B (en) | A kind of converter valve submodule Auto-Test System and thyristor test circuit thereof | |
| CN101697003A (en) | Short circuit detecting method and short circuit detecting device | |
| CN202004454U (en) | Testing system of direct-current power transmission converter and control protection equipment thereof | |
| CN112564740B (en) | Device for detecting advanced application function of HPLC | |
| CN103616560A (en) | Automatic power consumption parameter testing device and method applied to avionics device | |
| CN104267365A (en) | Portable small current earth-fault line selection closed loop performance tester | |
| CN105510737A (en) | Universal automatic testing system for carrier rocket | |
| WO2015085833A1 (en) | Diesel locomotive controller self-check circuit and method | |
| CN104914346A (en) | Non-principle test device for general digital plug-ins and test method thereof | |
| CN109062099A (en) | DSP chip selection circuit and related equipment | |
| CN203773022U (en) | Universal optical coupler chip testing apparatus | |
| CN201230204Y (en) | Logic test device for microcomputer type protection monitoring module in power supply and distribution system | |
| CN104991211A (en) | High-voltage direct-current power transmission light-controlled converter valve TVM plate automatic test equipment | |
| CN204347211U (en) | A kind of many relay functions proving installation | |
| CN106546833B (en) | A kind of electric energy meter RS-485 communication chip networkings test system | |
| CN104237723A (en) | Low-frequency cable network testing system and method based on boundary scanning | |
| CN204964660U (en) | Circuit board online test platform that walks abreast | |
| CN206804816U (en) | A kind of signal imitation device of thyristor voltage monitoring board detection | |
| CN200941110Y (en) | Multifunctional cable detection device | |
| CN105676051A (en) | Integrated line sequence testing device and method | |
| CN209895331U (en) | BMC remote fault diagnosis and firmware upgrading link multiplexing implementation device | |
| CN103926846A (en) | System for simulating aviation ammunition and generating faults | |
| CN208767005U (en) | A kind of display device and jig | |
| CN209043946U (en) | A kind of any attachment device of JTAG chain |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |