CN104914346B - The non-principle system safety testing device and its method of testing of a kind of general digital plug-in unit - Google Patents
The non-principle system safety testing device and its method of testing of a kind of general digital plug-in unit Download PDFInfo
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- CN104914346B CN104914346B CN201510229128.XA CN201510229128A CN104914346B CN 104914346 B CN104914346 B CN 104914346B CN 201510229128 A CN201510229128 A CN 201510229128A CN 104914346 B CN104914346 B CN 104914346B
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Abstract
The present invention relates to the non-principle system safety testing device of general digital plug-in unit, including the testing and control computer, functional test extension set and boundary scan testing extension set being arranged in integration testing rack, the power input of three connects 220V civil powers by power line, testing and control computer is connected by USB cable with boundary scan testing extension set, testing and control computer is connected by netting twine with functional test extension set, testing and control computer and boundary scan testing extension set both-way communication, testing and control computer and functional test extension set both-way communication.The invention also discloses the method for testing of the non-principle system safety testing device of general digital plug-in unit.The present invention improves the fault detect rate and Percent Isolated of digital card, reduces the technical requirements to maintenance technician, improves digital plug-in unit test, reprocesses efficiency；Present invention auxiliary completes the test of digital plug-in unit in Radar Products, debugging, especially provides a test, debugging platform to the independent plug-in unit that can not build whole system.
Description
Technical field
The present invention relates to the automatic test technology field of digital circuit board, especially a kind of non-principle of general digital plug-in unit
System safety testing device and its method of testing.
Background technology
In industrial circle, electronic equipment become automation, it is intelligentized that design also becomes more complicated simultaneously, due to
A large amount of uses of multi-layered high-density pcb board and bga device so that the test to circuit board becomes extremely difficult, especially
It is embodied on the digital plug-in unit of radar system.However, in order to tackle the increasingly harsher quality requirement of user and device context
Using needs, but have to strengthen the construction of power of test.At present, for radar system digital plug-in unit test, it is necessary to
A whole set of test system is built, the function of measured number plug-in unit quality is positioned by the overall operation principle of system indirectly,
And lack the fault location to component on digital plug-in unit, and the positioning to solder failures such as short circuit, open circuits.
The content of the invention
The primary and foremost purpose of the present invention is that a whole set of test system need not be built by providing one kind, can be directly to monolithic digital
Plug-in unit carries out fault diagnosis, and on the component directly in fault location to digital plug-in unit, or on the trouble point such as short circuit, open circuit,
It is capable of the non-principle system safety testing device of the general digital plug-in unit of compatible Multiple Type Radar Products simultaneously.
To achieve the above object, present invention employs following technical scheme：A kind of non-principle of general digital plug-in unit is surveyed
Trial assembly is put, including testing and control computer, functional test extension set and the boundary scan testing being arranged in integration testing rack
Extension set, the power input of three connect 220V civil powers by power line, and testing and control computer is swept by USB cable and border
Test extension set connection is retouched, testing and control computer is connected by netting twine with functional test extension set, testing and control computer and border
Sweep test extension set both-way communication, testing and control computer and functional test extension set both-way communication.
The boundary scan testing extension set includes first switch power supply, and its power input terminates 220V civil powers, and its power supply is defeated
Go out end by voltage-stablizer with the input of boundary scan testing backboard to be connected, boundary scan backboard is route with boundary scan respectively
Device, digital plug-in unit to be measured and multiple digital I/O mouths both-way communications, boundary scan router respectively with multiple digital I/O mouths, side
Boundary's scanning monitor both-way communication, boundary scan controller communicate with the testing and control computer bidirectional.
The functional test extension set includes second switch power supply, its power input termination 220V civil powers, its power output end
Be connected by switching regulator with the input of functional test backboard, functional test backboard respectively with computer socket, number to be measured
Word plug-in unit both-way communication, computer socket communicate with the testing and control computer bidirectional.
The number of the digital I/O mouths is 3, is connected between the first switch power supply and voltage-stablizer by J18A3Z3HNP
Device connection is connect, is connected between voltage-stablizer and the boundary scan testing backboard by PDS-210KB1 connectors, the multiple number
Connected between word I/O mouths and boundary scan testing backboard by PC104-64 connectors, the boundary scan router and multiple
Connected between digital I/O mouths by 201-2*7GS connectors, between the boundary scan router and boundary scan testing backboard
Connected by 201-2*7GS connectors, connected between boundary scan controller and the boundary scan router by JTAG cables
Connect.
The boundary scan testing backboard is made up of the first PDS210J sockets group and digital I/O sockets group, and first
PDS210J sockets group and digital I/O sockets group both-way communication, the voltage-stablizer is respectively to the first PDS210J sockets group, digital I/
O sockets group is powered, the first PDS210J sockets group and digital plug-in unit both-way communication to be measured, the digital I/O sockets group difference
With digital I/O mouths, boundary scan router both-way communication；The boundary scan controller uses jtag controller.
Connected between the second switch power supply and switching regulator by J18A3Z3HNP connectors, the switch voltage-stabilizing
Connected between device and functional test backboard by PDS-210KB1 connectors, between the functional test backboard and computer socket
Connected by PDS-210KB1 connectors.
The functional test backboard includes the 2nd PDS210J socket groups, and the 2nd PDS210J sockets group is respectively with calculating the machine transplanting of rice
Part, level shifting circuit, FPGA both-way communication, FPGA and D/A translation circuit both-way communications, the switching regulator
Powered respectively to D/A translation circuits, the 2nd PDS210J sockets group, FPGA, level shifting circuit and memory, FPGA battle arrays
Row and memory both-way communication, the 2nd PDS210J sockets group and level shifting circuit both-way communication, level shifting circuit with it is to be measured
Digital plug-in unit both-way communication.
Another object of the present invention is to a kind of method of testing for the non-principle system safety testing device for providing general digital plug-in unit,
This method includes：When carrying out boundary scan testing, control signal is sent to boundary scan testing point by testing and control computer
Machine, boundary scan testing extension set receive the laggard row bound sweep test of control signal, and by the trouble point of positioning, short trouble
Sent with open fault to testing and control computer；When carrying out functional test, control signal is sent by testing and control computer
To functional test extension set, functional test extension set, which receives, carries out functional test after control signal, and by the trouble point of positioning, short circuit
Failure and open fault are sent to testing and control computer.
When carrying out boundary scan testing, the boundary scan controller of boundary scan testing extension set receives control signal
Afterwards, control digital I/O mouths to produce test vector group, then sent caused test vector by the first PDS210J sockets group
To digital plug-in unit to be measured, digital plug-in unit to be measured returns to test vector, test vector that boundary scan controller contrast is sent out and
The test vector fault point of return, and judge open circuit and short trouble, finally by the trouble point of positioning, short trouble and open
Road failure is sent to testing and control computer.
When carrying out functional test, testing and control computer control FPGA produces test vector, then passes through second
Caused test vector is sent to digital plug-in unit to be measured by PDS210J sockets group, level shifting circuit, and digital plug-in unit to be measured returns
Test vector, the FPGA test vector that sends out of contrast and the test vector fault point returned, and judge open circuit and
Short trouble, finally the trouble point of positioning, short trouble and open fault are sent to testing and control computer.
As shown from the above technical solution, advantages of the present invention is as follows：First, the present invention improves the failure of digital card
Verification and measurement ratio and Percent Isolated, the technical requirements to maintenance technician are reduced, alleviate them due to plug-in unit signal stream
Journey, logical relation are unfamiliar with the pressure brought, and improve digital plug-in unit test, reprocess efficiency；Second, present invention auxiliary completes thunder
Test, the debugging of digital plug-in unit up in product, especially to the independent plug-in unit that can not build whole system provide a test,
Debug platform；3rd, the present invention also uses as the supporting test and maintenance equipment of Radar Products with product delivery user, creates
Economic benefit.
Brief description of the drawings
Fig. 1 is the system architecture diagram of the present invention；
Fig. 2 is the structured flowchart of boundary scan testing extension set in Fig. 1；
Fig. 3 is the structured flowchart of functional test extension set in Fig. 1；
Fig. 4 is the structured flowchart of boundary scan testing backboard in Fig. 2；
Fig. 5 is the structured flowchart of functional test backboard in Fig. 3；
Fig. 6,7 are respectively that the present invention carries out boundary scan testing, the method for testing flow chart of functional test.
Embodiment
A kind of non-principle system safety testing device of general digital plug-in unit, including the test control being arranged in integration testing rack 1
Computer 4, functional test extension set 3 and boundary scan testing extension set 2 processed, the power input of three are connect by power line
220V civil powers, testing and control computer 4 are connected by USB cable with boundary scan testing extension set 2, and testing and control computer 4 is logical
Cross netting twine to be connected with functional test extension set 3, testing and control computer 4 and the both-way communication of boundary scan testing extension set 2, testing and control
Computer 4 and the both-way communication of functional test extension set 3, as shown in Figure 1.
As shown in Fig. 2 the boundary scan testing extension set 2 includes first switch power supply, its power input termination 220V cities
Electricity, its power output end are connected by voltage-stablizer with boundary scan testing backboard 2a input, boundary scan backboard respectively with
Boundary scan router, digital plug-in unit to be measured and multiple digital I/O mouths both-way communications, boundary scan router respectively with it is multiple
Digital I/O mouths, boundary scan controller both-way communication, boundary scan controller and the both-way communication of testing and control computer 4.
The number of the digital I/O mouths is 3, is connected between the first switch power supply and voltage-stablizer by J18A3Z3HNP connectors
Connect, connected between voltage-stablizer and boundary scan testing the backboard 2a by PDS-210KB1 connectors, the multiple digital I/O
Connected between mouth and boundary scan testing backboard 2a by PC104-64 connectors, the boundary scan router and multiple numerals
Connected by 201-2*7GS connectors between I/O mouths, led between boundary scan router and boundary scan testing the backboard 2a
The connection of 201-2*7GS connectors is crossed, passes through JTAG cable connections between boundary scan controller and the boundary scan router.
As shown in figure 4, the boundary scan testing backboard 2a is by the first PDS210J sockets group and digital I/O sockets group group
Into the first PDS210J sockets group and digital I/O sockets group both-way communication, the voltage-stablizer is respectively to the first PDS210J sockets
Group, the power supply of digital I/O sockets group, the first PDS210J sockets group and digital plug-in unit both-way communication to be measured, the digital I/O
Socket group respectively with digital I/O mouths, boundary scan router both-way communication；The boundary scan controller is controlled using JTAG
Device.
As shown in figure 3, the functional test extension set 3 includes second switch power supply, its power input terminates 220V civil powers, its
Power output end is connected by switching regulator with functional test backboard 3a input, functional test backboard 3a respectively with calculating
Machine transplanting of rice part, digital plug-in unit both-way communication to be measured, computer socket and the both-way communication of testing and control computer 4.Described second
Connected between Switching Power Supply and switching regulator by J18A3Z3HNP connectors, the switching regulator and functional test backboard
Connected between 3a by PDS-210KB1 connectors, pass through PDS- between the functional test backboard 3a and computer socket
210KB1 connectors connect.
As shown in figure 5, the functional test backboard 3a includes the 2nd PDS210J socket groups, the 2nd PDS210J socket components
Not with computer socket, level shifting circuit, FPGA both-way communication, FPGA and D/A translation circuit both-way communications, institute
Switching regulator is stated respectively to D/A translation circuits, the 2nd PDS210J sockets group, FPGA, level shifting circuit and memory
Power supply, FPGA and memory both-way communication, the 2nd PDS210J sockets group and level shifting circuit both-way communication, level turn
Change circuit and digital plug-in unit both-way communication to be measured.
Below in conjunction with Fig. 1,2,3,4,5,6,7, the present invention is further illustrated.
When in use, according to the species of digital plug-in unit to be measured, boundary scan testing extension set is selected in integration testing rack 1
2 and functional test extension set 3 tested.When carrying out boundary scan testing, control signal is sent extremely by testing and control computer 4
Boundary scan testing extension set 2, boundary scan testing extension set 2 receive the laggard row bound sweep test of control signal, and will positioning
Trouble point, short trouble and open fault send to testing and control computer 4；When carrying out functional test, by testing and control
Computer 4 sends control signal to functional test extension set 3, and functional test extension set 3 carries out functional test after receiving control signal,
And the trouble point of positioning, short trouble and open fault are sent to testing and control computer 4.
When carrying out boundary scan survey, digital plug-in unit to be measured and boundary scan are route by boundary scan testing backboard 2a
Device connects, and digital plug-in unit to be measured is powered by first switch power supply and voltage-stablizer, then digital I/O mouths are in boundary scan
Under the control of controller, boundary scan testing, boundary scan controller and testing and control computer 4 are carried out to digital plug-in unit to be measured
Communication, test vector generation and the collection of test result are carried out to digital plug-in unit to be measured, and ultimately generate test report.Namely
Say, when carrying out boundary scan testing, after the boundary scan controller of boundary scan testing extension set 2 receives control signal, control
Make digital I/O mouths and produce test vector group, be then sent to caused test vector by the first PDS210J sockets group to be measured
Digital plug-in unit, digital plug-in unit to be measured return to test vector, the test vector that boundary scan controller contrast is sent out and return
Test vector fault point, and judge open circuit and short trouble, finally by the trouble point of positioning, short trouble and open fault
Send to testing and control computer 4.
When carrying out functional test, digital plug-in unit to be measured is connected with computer socket by functional test backboard 3a, led to
Cross second switch power supply and switching regulator to be powered digital plug-in unit to be measured, meter is then controlled by testing and control computer 4
Machine transplanting of rice part is calculated to test measured piece.That is, when carrying out functional test, testing and control computer 4 controls FPGA battle arrays
Row produce test vector, are then sent to caused test vector by the 2nd PDS210J sockets group, level shifting circuit and treat
Digital plug-in unit is surveyed, digital plug-in unit to be measured returns to test vector, the test vector and the test of return that FPGA contrast is sent out
Vectorial fault point, and judge open circuit and short trouble, finally the trouble point of positioning, short trouble and open fault are sent
To testing and control computer 4.
In summary, the present invention improves the fault detect rate and Percent Isolated of digital card, reduces to maintenance
The technical requirements of technical staff, them are alleviated due to being unfamiliar with the pressure brought to plug-in unit signal flow, logical relation, is improved
Digital plug-in unit test, reprocess efficiency.
Claims (7)
- A kind of 1. non-principle system safety testing device of general digital plug-in unit, it is characterised in that：Including being arranged in integration testing rack Testing and control computer, functional test extension set and boundary scan testing extension set, the power input of three passes through power supply Line connects 220V civil powers, and testing and control computer is connected by USB cable with boundary scan testing extension set, and testing and control computer leads to Cross netting twine to be connected with functional test extension set, testing and control computer and boundary scan testing extension set both-way communication, testing and control meter Calculation machine and functional test extension set both-way communication；The functional test extension set includes second switch power supply, its power input termination 220V civil powers, and its power output end passes through Switching regulator is connected with the input of functional test backboard, and functional test backboard is inserted with computer socket, numeral to be measured respectively Part both-way communication, computer socket communicate with the testing and control computer bidirectional；The functional test backboard includes the 2nd PDS210J socket groups, the 2nd PDS210J sockets group respectively with computer socket, Level shifting circuit, FPGA both-way communication, FPGA and D/A translation circuit both-way communications, the switching regulator point Do not powered to D/A translation circuits, the 2nd PDS210J sockets group, FPGA, level shifting circuit and memory, FPGA With memory both-way communication, the 2nd PDS210J sockets group and level shifting circuit both-way communication, level shifting circuit and number to be measured Word plug-in unit both-way communication.
- 2. the non-principle system safety testing device of general digital plug-in unit according to claim 1, it is characterised in that：Sweep on the border Retouching test extension set includes first switch power supply, its power input termination 220V civil powers, and its power output end passes through voltage-stablizer and side The input of boundary's sweep test backboard is connected, boundary scan backboard respectively with boundary scan router, digital plug-in unit to be measured and Multiple digital I/O mouths both-way communications, boundary scan router respectively with multiple digital I/O mouths, boundary scan controller two-way News, boundary scan controller communicate with the testing and control computer bidirectional.
- 3. the non-principle system safety testing device of general digital plug-in unit according to claim 2, it is characterised in that：The digital I/ The number of O mouths is 3, is connected between the first switch power supply and voltage-stablizer by J18A3Z3HNP connectors, the voltage stabilizing Connected between device and boundary scan testing backboard by PDS-210KB1 connectors, the multiple digital I/O mouths and boundary scan Connected by PC104-64 connectors between testing backboard, passed through between the boundary scan router and multiple digital I/O mouths 201-2*7GS connectors connect, and are connected between the boundary scan router and boundary scan testing backboard by 201-2*7GS Device connects, and passes through JTAG cable connections between boundary scan controller and the boundary scan router.
- 4. the non-principle system safety testing device of general digital plug-in unit according to claim 2, it is characterised in that：Sweep on the border Retouch testing backboard to be made up of the first PDS210J sockets group and digital I/O sockets group, the first PDS210J sockets group is inserted with digital I/O Seat group both-way communication, the voltage-stablizer are powered to the first PDS210J sockets group, digital I/O sockets group respectively, and described first PDS210J sockets group and digital plug-in unit both-way communication to be measured, the digital I/O sockets group respectively with digital I/O mouths, boundary scan Router both-way communication；The boundary scan controller uses jtag controller.
- 5. the non-principle system safety testing device of general digital plug-in unit according to claim 1, it is characterised in that：Described second opens Connected between powered-down source and switching regulator by J18A3Z3HNP connectors, the switching regulator and functional test backboard it Between connected by PDS-210KB1 connectors, connected between the functional test backboard and computer socket by PDS-210KB1 Device connects.
- 6. a kind of method of testing of the non-principle system safety testing device of general digital plug-in unit, this method include：Carrying out boundary scan During test, control signal to boundary scan testing extension set, boundary scan testing extension set is sent by testing and control computer and received The laggard row bound sweep test of control signal, and the trouble point of positioning, short trouble and open fault are sent to testing and control Computer；When carrying out functional test, control signal is sent to functional test extension set, functional test point by testing and control computer Machine carries out functional test after receiving control signal, and the trouble point of positioning, short trouble and open fault are sent to test Control computer；When carrying out boundary scan testing, after the boundary scan controller of boundary scan testing extension set receives control signal, control Make digital I/O mouths and produce test vector group, be then sent to caused test vector by the first PDS210J sockets group to be measured Digital plug-in unit, digital plug-in unit to be measured return to test vector, the test vector that boundary scan controller contrast is sent out and return Test vector fault point, and judge open circuit and short trouble, finally by the trouble point of positioning, short trouble and open fault Send to testing and control computer.
- 7. method of testing according to claim 6, it is characterised in that：When carrying out functional test, testing and control computer Control FPGA produce test vector, then by the 2nd PDS210J sockets group, level shifting circuit by it is caused test to Amount is sent to digital plug-in unit to be measured, and digital plug-in unit to be measured returns to test vector, test vector that FPGA contrast is sent out and The test vector fault point of return, and judge open circuit and short trouble, finally by the trouble point of positioning, short trouble and open Road failure is sent to testing and control computer.
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| KR102039901B1 (en) * | 2018-05-10 | 2019-11-04 | 파워테크 테크놀로지 인코포레이티드 | Testing device and testing method |
| US11714402B2 (en) | 2021-09-29 | 2023-08-01 | 38Th Research Institute, China Electronics Technology Group Corporation | Universal automatic test system for digital plugboard based on imagine processing |
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