CN201780320U - Testing system - Google Patents
Testing system Download PDFInfo
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- CN201780320U CN201780320U CN2010202777500U CN201020277750U CN201780320U CN 201780320 U CN201780320 U CN 201780320U CN 2010202777500 U CN2010202777500 U CN 2010202777500U CN 201020277750 U CN201020277750 U CN 201020277750U CN 201780320 U CN201780320 U CN 201780320U
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Abstract
The utility model belongs to the testing field, and provides a testing system, which comprises an external power supply interface connected with an external power supply, a voltage conversion module connected with the external power supply interface, a plurality of voltage source modules connected with the voltage conversion module and a plurality of function testing board modules corresponding to the voltage source modules one to one. Since independent power supply branches with different output voltages are designed for different modules, the operation of the testing system is more reasonable and stable than that of the prior art.
Description
Technical field
The utility model belongs to field tests, relates in particular to a kind of test macro.
Background technology
In a test macro, because the operating voltage difference of the test module of various functions, so just require system that different working powers can be provided.In existing proving installation, exist between the different test modules because power distribution the test result that causes of mutual interference is inaccurate mutually with the problem of usefulness mutually, even situation such as damage test chip.So at different test modules, it is most important to a test macro handling problems such as power supply between disparate modules and work well.
The utility model content
The purpose of this utility model is to provide a kind of test macro, be intended to handle well in the test macro various piece between the power supply and test module for the electricity consumption relation.
The utility model is achieved in that a kind of test macro, and described test macro comprises:
The external power source interface that is connected with external power source;
The voltage transformation module that is connected with described external power source interface;
The a plurality of voltage source modules that are connected with described voltage transformation module;
With a plurality of one to one functional test plate module of described a plurality of voltage source modules.
Further, described a plurality of voltage source module comprises aanalogvoltage source module, digital voltage source module, chip and external circuit voltage source module and interface board voltage source module;
Described aanalogvoltage source module comprises: simulation positive supply module and simulation negative supply module, and described simulation positive supply module and described simulation negative supply module include multichannel independently low pressure difference linear voltage regulator LDO and peripheral circuit thereof;
Described digital voltage source module comprises: multichannel is independently carried out the DC-DC Switching Power Supply conversion chip and the peripheral circuit thereof of level conversion by the mode of gauge tap frequency;
Described chip and external circuit voltage source module comprise: chip and external circuit positive supply module and chip and external circuit negative supply module, and described chip and external circuit positive supply module and chip and external circuit negative supply module include a low pressure difference linear voltage regulator LDO and a peripheral circuit thereof;
Described interface board voltage source module comprises: one carries out the DC-DC Switching Power Supply conversion chip and the peripheral circuit thereof of level conversion by the mode of gauge tap frequency.
Further, the model of low pressure difference linear voltage regulator LDO in described simulation positive supply and chip and the external circuit positive supply is LT1083, and the model of the low pressure difference linear voltage regulator LDO in described simulation negative supply and chip and the external circuit negative supply is LT1033.
Further, described DC-DC Switching Power Supply conversion chip model is LM2596.
Further, described digital voltage source module also comprises: the time delay module that is connected with the Enable Pin of described DC-DC Switching Power Supply conversion chip.
Further, include an overflow protecting element in described a plurality of voltage source module.
Further, described overflow protecting element is for can recover fuse.
The utility model makes the work of test macro reasonable more, stable than prior art by the different and separate power branch at different modular design output voltages.In addition, the utility model has been controlled powering on/the power down order of test macro effectively by add time delay module before particular power source.The utility model is separately independently-powered at every block of functional test plate, thereby has improved the driving force of entire system.
Description of drawings
Fig. 1 is the schematic diagram of the test macro that provides of the utility model embodiment;
Fig. 2 is the structural drawing of the test macro that provides of the utility model embodiment;
Fig. 3 is the circuit diagram of the digital voltage source module that provides of the utility model embodiment.
Embodiment
In order to make the purpose of this utility model, technical scheme and advantage clearer,, the utility model is further elaborated below in conjunction with drawings and Examples.Should be appreciated that specific embodiment described herein only in order to explanation the utility model, and be not used in qualification the utility model.
The utility model makes the work of test macro reasonable more, stable than prior art by the different and separate power branch at different modular design output voltages.
The utility model provides a kind of power supply of test macro, and the power supply of described test macro comprises:
The external power source interface that is connected with external power source;
The voltage transformation module that is connected with described external power source interface;
The a plurality of voltage source modules that are connected with described voltage transformation module;
With a plurality of one to one functional test plate module of described a plurality of voltage source modules.
Embodiment one:
Fig. 1 shows the schematic diagram of the test macro that the utility model embodiment provides, and only shows the part relevant with the utility model for convenience of explanation.
The external power source interface 11 that is connected with external power source;
The voltage transformation module 12 that is connected with external power source interface 11;
The a plurality of voltage source modules that are connected with voltage transformation module 12;
With a plurality of one to one functional test plate module of a plurality of voltage source modules.
In real work, voltage transformation module 12 will be converted to needed voltage of test macro power supply and direct current from the 220V alternating current of external power source interface 11, and, promptly provide needed separately voltage to each voltage source that is on the different branch to a plurality of voltage feds with different voltages.Functional test plate in a plurality of functional test plate module is connected with corresponding voltage source in the voltage source module according to its operating voltage separately, and the voltage that provides with the respective electrical potential source detects.
As one embodiment of the present of invention, the different and separate power branch at different modular design output voltages makes the work of test macro reasonable more, stable than prior art.
Embodiment two:
Fig. 2 shows the structural drawing of the test macro that the utility model embodiment provides, and only shows the part relevant with the utility model for convenience of explanation.
The external power source interface 11 that is connected with external power source;
The voltage transformation module 12 that is connected with external power source interface 11;
The simulation positive supply module 201 that is connected with voltage transformation module 12;
The simulation negative supply module 202 that is connected with voltage transformation module 12;
The digital power module 203 that is connected with voltage transformation module 12;
Chip that is connected with voltage transformation module 12 and external circuit positive supply module 204;
Chip that is connected with voltage transformation module 12 and external circuit negative supply module 205;
The interface board voltage source module 206 that is connected with voltage transformation module 12;
The first functional test plate module 207 that is connected with simulation positive supply module 201;
The second functional test plate module 208 that is connected with simulation negative supply module 202;
The 3rd functional test plate module 209 that is connected with digital power module 203;
The 4th functional test plate module 210 that is connected with external circuit positive supply module 204 with chip;
The five-function test board module 211 that is connected with external circuit negative supply module 205 with chip;
The 6th functional test plate module 212 that is connected with interface board voltage source module 206.
In real work, voltage transformation module 12 will be converted to needed voltage of test macro power supply and direct current from the 220V alternating current of external power source interface 11, and respectively to the simulation positive supply module 201 that is positioned at different branch, simulation negative supply module 202, digital power module 203, chip and external circuit positive supply module 204, chip and external circuit negative supply module 205 and 206 power supplies of interface board voltage source module, each power module is powered to the functional test plate again with after being connected with this module function corresponding test board.
In the present embodiment, the toroidal transformer (power is 150W) of bipolar input 18V is adopted in the input of test macro external power source, enters the steady pressure of system part after full-bridge rectification.
Because it is low that low pressure difference linear voltage regulator LDO has a noise, quiescent current is little, advantages such as peripheral circuit is simple, so, so selecting it is simulation positive supply module 201, simulation negative supply module 202, chip and external circuit positive supply module 204 and chip and external circuit negative supply module 205 provide power supply, wherein simulating positive supply module 201 and chip and external circuit positive supply module 204, to adopt models be the power supply voltage stabilizing chip of LT1083, this chip can provide the electric current of maximum 7.5A, it is the power supply voltage stabilizing chip of LT1033 that simulation negative supply module 202 and chip and external circuit positive supply module 205 adopt model, and this chip can provide the electric current of maximum 3A.At characteristics such as digital power module 203 voltage spans are big, adopting model is the DC-DC Switching Power Supply conversion chip of LM2596, this chip carries out level conversion by the mode of switching frequency, thereby under the bigger environment of pressure reduction, can higher conversion efficiency be arranged than linear power supply, its pressure reduction can not discharge in the mode of thermal losses, and the chip operation temperature can be very not high.In addition, this chip also can provide the drive current of maximum 3A.
Simulation positive supply module and simulation negative supply module provide power supply for various operational amplifiers, analog to digital converter etc., thereby load driving ability that need be bigger, so in the processing of power supply, utilize multichannel independently low pressure difference linear voltage regulator LDO at the separately power supply of every block of functional test plate.In like manner; for digital power; it need offer various digital logic chips (as FPGA, various data BUFFER, level transferring chip) or provide the numerical portion power supply for the digital-to-analogue hybrid chip; so need bigger load driving ability; so independently DC-DC Switching Power Supply conversion chip of multichannel is set, all separately independently-powered at every block of functional test plate.
In the present embodiment,, utilize suitable electric supply installation all separately independently-powered, can improve the driving force of entire system every block of functional test plate at according to different power supply needs.
Embodiment three:
In embodiment of the present utility model.Owing to need multiple level voltage power supply during some chip operation in the test macro, just there is the problem of electric sequence between the different level voltages, in the present embodiment, the order that powers on must be that digital power module 203 voltage lag outputs are in other power source voltage output, so before digital power module 203, add a time delay module, with the correct electric sequence of assurance system.Shown in figure three, it is the Enable Pin of 25V that LM2596 has a permission maximum drive voltage, for effectively low, at RC time delay module of prime adding of this Enable Pin.Make that digital power module 203 Enable Pin behind simulation positive supply module 201 and simulation negative supply module 202 effective output 200mS is effective.
In the present embodiment, by adding time delay module, reasonably distributed the order of each power supply electrifying/power down in the system.
Embodiment four:
As an embodiment of the present utility model, at each bar power branch current limliting being installed is that 1A can recover fuse and carries out overcurrent protection, to improve the stability of system.
Embodiment five:
In the present embodiment, the device on the power panel is few, mainly is various voltage transitions chips and circuit thereof required resistance, electric capacity, inductance and diode etc., and therefore when carrying out the PCB design, signal wire is less, power supply signal is more, adopts the two-ply design.When carrying out the PCB layout; consider that the device on the power panel can be in the working environment of the big electric current of high temperature usually; resistance, electric capacity, inductance and diode should suitably strengthen with respect to other subsystems apart from the putting position of each conversion chip; to guarantee that when the operation irregularity, influence each other is less.In power panel, conversion chip is being undertaken the task that big electric current is provided, and working temperature is higher, and the heat radiator that matches must be installed, and also need do corresponding radiating treatment simultaneously on PCB layout.
The utility model makes the work of multivoltage test macro reasonable more, stable than prior art by the different and separate power branch at different modular design output voltages.In addition, the utility model has been controlled powering on/the power down order of test macro effectively by add time delay module before particular power source.The utility model is separately independently-powered at every block of functional test plate, thereby has improved the driving force of entire system.
The above only is of the present utility model preferable, not in order to restriction the utility model, all any modifications of being done within spirit of the present utility model and principle, is equal to and replaces and improvement etc., all should be included within the protection domain of the present utility model.
Claims (7)
1. a test macro is characterized in that, described test macro comprises:
The external power source interface that is connected with external power source;
The voltage transformation module that is connected with described external power source interface;
The a plurality of voltage source modules that are connected with described voltage transformation module;
With a plurality of one to one functional test plate module of described a plurality of voltage source modules.
2. test macro as claimed in claim 1 is characterized in that, described a plurality of voltage source modules comprise aanalogvoltage source module, digital voltage source module, chip and external circuit voltage source module and interface board voltage source module;
Described aanalogvoltage source module comprises: simulation positive supply module and simulation negative supply module, and described simulation positive supply module and described simulation negative supply module include multichannel independently low pressure difference linear voltage regulator LDO and peripheral circuit thereof;
Described digital voltage source module comprises: multichannel is independently carried out the DC-DC Switching Power Supply conversion chip and the peripheral circuit thereof of level conversion by the mode of gauge tap frequency;
Described chip and external circuit voltage source module comprise: chip and external circuit positive supply module and chip and external circuit negative supply module, and described chip and external circuit positive supply module and chip and external circuit negative supply module include a low pressure difference linear voltage regulator LDO and a peripheral circuit thereof;
Described interface board voltage source module comprises: one carries out the DC-DC Switching Power Supply conversion chip and the peripheral circuit thereof of level conversion by the mode of gauge tap frequency.
3. test macro as claimed in claim 2, it is characterized in that, the model of low pressure difference linear voltage regulator LDO in described simulation positive supply and chip and the external circuit positive supply is LT1083, and the model of the low pressure difference linear voltage regulator LDO in described simulation negative supply and chip and the external circuit negative supply is LT1033.
4. test macro as claimed in claim 2 is characterized in that, described DC-DC Switching Power Supply conversion chip model is LM2596.
5. test macro as claimed in claim 2 is characterized in that, described digital voltage source module also comprises:
The time delay module that is connected with the Enable Pin of described DC-DC Switching Power Supply conversion chip.
6. test macro as claimed in claim 1 is characterized in that, includes an overflow protecting element in described a plurality of voltage source modules.
7. test macro as claimed in claim 6 is characterized in that described overflow protecting element is for can recover fuse.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010202777500U CN201780320U (en) | 2010-07-30 | 2010-07-30 | Testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010202777500U CN201780320U (en) | 2010-07-30 | 2010-07-30 | Testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201780320U true CN201780320U (en) | 2011-03-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010202777500U Expired - Fee Related CN201780320U (en) | 2010-07-30 | 2010-07-30 | Testing system |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103293982A (en) * | 2013-06-06 | 2013-09-11 | 南通大学 | Power source manager |
| CN104914346A (en) * | 2015-05-07 | 2015-09-16 | 中国电子科技集团公司第三十八研究所 | Non-principle test device for general digital plug-ins and test method thereof |
| CN105141132A (en) * | 2015-09-06 | 2015-12-09 | 马建权 | Time-sharing power supply control circuit |
| CN106802378A (en) * | 2017-03-06 | 2017-06-06 | 沈阳航天新光集团有限公司 | Adjustment protection control combination test system |
| CN111490520A (en) * | 2020-05-25 | 2020-08-04 | 上海贝岭股份有限公司 | Intelligent instrument and power supply circuit thereof |
| CN112398328A (en) * | 2020-11-24 | 2021-02-23 | 西安空间无线电技术研究所 | Power supply starting time sequence self-control circuit suitable for complex digital-analog hybrid system |
-
2010
- 2010-07-30 CN CN2010202777500U patent/CN201780320U/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103293982A (en) * | 2013-06-06 | 2013-09-11 | 南通大学 | Power source manager |
| CN104914346A (en) * | 2015-05-07 | 2015-09-16 | 中国电子科技集团公司第三十八研究所 | Non-principle test device for general digital plug-ins and test method thereof |
| CN104914346B (en) * | 2015-05-07 | 2017-11-17 | 中国电子科技集团公司第三十八研究所 | The non-principle system safety testing device and its method of testing of a kind of general digital plug-in unit |
| CN105141132A (en) * | 2015-09-06 | 2015-12-09 | 马建权 | Time-sharing power supply control circuit |
| CN106802378A (en) * | 2017-03-06 | 2017-06-06 | 沈阳航天新光集团有限公司 | Adjustment protection control combination test system |
| CN111490520A (en) * | 2020-05-25 | 2020-08-04 | 上海贝岭股份有限公司 | Intelligent instrument and power supply circuit thereof |
| CN112398328A (en) * | 2020-11-24 | 2021-02-23 | 西安空间无线电技术研究所 | Power supply starting time sequence self-control circuit suitable for complex digital-analog hybrid system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110330 Termination date: 20110730 |