CN104749514B - A kind of straight-throughization test device of low-power consumption differential transfer chip - Google Patents
A kind of straight-throughization test device of low-power consumption differential transfer chip Download PDFInfo
- Publication number
- CN104749514B CN104749514B CN201510169365.1A CN201510169365A CN104749514B CN 104749514 B CN104749514 B CN 104749514B CN 201510169365 A CN201510169365 A CN 201510169365A CN 104749514 B CN104749514 B CN 104749514B
- Authority
- CN
- China
- Prior art keywords
- circuit
- side interface
- group
- chipset
- matching sub
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Dc Digital Transmission (AREA)
Abstract
The present invention discloses a kind of test device of low-power consumption differential transfer chip, and it is included to plug-in unit side interface, to test system side interface, solution difference chipset and clock circuit；It is described to pass through the directly one-to-one connection of simultaneously walking line and both-way communication to plug-in unit side interface and to test system side interface；The solution difference chipset respectively with to plug-in unit side interface by the one-to-one connection of difference cabling and one-way communication, with passing through to test system side interface and the one-to-one connection of walking line and one-way communication；The clock circuit is connected with solution difference chipset.The advantage of the invention is that：Described device has that simple in construction, wiring is compact, and using ripe chip and electronic component, has extremely low purchase cost and good transplantability.
Description
Technical field
The present invention relates to circuit test field, more particularly to the straight-throughization test device of low-power consumption differential transfer chip.
Background technology
The electronic equipment being widely used in industrial circle become automation, it is intelligentized simultaneously as it is largely adopted
With the chip of low-power consumption differential transfer, such as DS90CR285 and DS90CR286 chips etc., these electronic equipments are caused to occur
It is difficult fault point during transmission fault, when especially the failures such as short circuit occur for thin space pin, if naked eyes can not be found, only
Can be solved by way of the chip more renewed, so as to cause debugging cost to improve, and reduce the reliability of circuit board.
In this case, it is important that can carry out accurately test to the differential transfer chip of low-power consumption.However,
The existing device for being used to test differential transfer is to rely on whole system more, tests logic by designing FPGA, then passes through
LVDS (Low Voltage Differential Signaling) cable connects corresponding chip one by one, then coordinates oscillograph
The failure of chip is checked, this method not only wastes time and energy, and use range is very narrow.In addition, with equipment and electronics
The development of technology, the species of interface is in constantly upgrading improves, therefore the method for simple design FPGA test logics can not be fine
Ground solves the general sex chromosome mosaicism of low-power consumption differential transfer chip testing.Finally, complicated wiring interface and hardware routing model,
It can cause to develop test program difficulty, and then influence to use.
The content of the invention
The technical problems to be solved by the invention be to provide a kind of cost it is relatively low, easy to use, and do not influence completely be
System work, there is the test device of the low-power consumption differential transfer chip of straight-throughization characteristic.
The present invention is that solve above-mentioned technical problem by following technological means：A kind of low-power consumption differential transfer chip it is straight
Tonghua test device, including to plug-in unit side interface, to test system side interface, solution difference chipset and clock circuit；It is described right
Plug-in unit side interface and to test system side interface pass through and walking line directly it is one-to-one connection and both-way communication；The solution difference core
Piece group respectively with to plug-in unit side interface by difference cabling it is one-to-one connection and one-way communication, with passing through to test system side interface
And the one-to-one connection of walking line and one-way communication；The clock circuit is connected with solution difference chipset.
As further preferred scheme, the solution difference chipset be to the unidirectional communication direction of plug-in unit side interface from
To plug-in unit side interface to solution difference chipset；The solution difference chipset with being to the one-way communication direction of test system side interface
From to solving difference chipset to test system side interface.
As further preferred scheme, the solution difference chipset is by 9 groups of solution difference chips and its matching sub-circuit group
Into being followed successively by the 1st group of matching sub-circuit, the 2nd group of matching sub-circuit, the 3rd group of matching sub-circuit, the 4th group of matching sub-circuit, the 5th
Group matching sub-circuit, the 6th group of matching sub-circuit, the 7th group of matching sub-circuit, the 8th group of matching sub-circuit, the 9th group of matching sub-circuit；
Wherein, each group of solution difference chip and its matching sub-circuit are connected with clock circuit.
As further preferred scheme, solution difference chip and its matching the sub-circuit circuit also includes the electric capacity of series connection
Group and inductance L；The capacitance group includes electric capacity C1, electric capacity C2, electric capacity C3, electric capacity C4, electric capacity C5, and capacitance group is by five electric capacity
C1, C2, C3, C4, C5 are in parallel to be formed.
As further preferred scheme, the capacitance of the electric capacity C1 and C4 is 0.1uF, and electric capacity C2 capacitance is 10uF,
Electric capacity C3 and C5 capacitance are 1000pF；Inductance L value is 10uH.
It is an advantage of the current invention that the test device have it is simple in construction, easy-to-use, wiring it is compact, and using into
Ripe chip and electronic component, there is extremely low purchase cost and good transplantability.
The present invention is not that solution difference is simply carried out to difference chip, but to plug-in unit side interface and test system side interface
Straight-through processing is carried out so that, can on not influenceing the test to remaining signal during low-power consumption differential transfer chip testing completely
Testing engineering development is reduced, therefore, there is good portability.
This product disclosure satisfy that the requirement of the 20M-66M needed for differential transfer, and it is steady to work using ripe clock circuit
It is fixed, there is the characteristics of reliability is high.
Therefore, it is adaptable strong using the test device of low-power consumption differential transfer chip provided by the present invention, cost
The characteristics of low, easy-to-use, portable strong.
Brief description of the drawings
Fig. 1 is the structured flowchart of the present invention；
Fig. 2 is the structured flowchart that difference chipset 3 is solved in Fig. 1；
Fig. 3 is to solve difference chip in Fig. 2 and its match the structured flowchart of sub-circuit 31.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further described.It should be appreciated that specific embodiment described herein is not used to limit only to explain the present invention
The fixed present invention.
With reference to figure 1, the test device of low-power consumption differential transfer chip, including to plug-in unit side interface 1, to test system side joint
Mouthfuls 2, solution difference chipset 3 and clock circuit 4, wherein, to plug-in unit side interface 1 and to test system side interface 2 by and walk
The directly one-to-one connection of line and both-way communication；The solution difference chipset 3 to plug-in unit side interface 1 respectively with passing through difference cabling one
Pass through the one-to-one connection of simultaneously walking line and one-way communication to a connection and one-way communication and to test system side interface 2；Solve difference
Chipset 3 is with being to plug-in unit side interface 1 to solution difference chipset 3, solution difference chipset 3 to the communication direction of plug-in unit side interface 1
With being to solving difference chipset 3 to test system side interface 2 to the direction of communication of test system side interface 2；This external clock electricity
Road 4 is connected with solution difference chipset 3.
With reference to figure 2, solution difference chipset 3 is made up of 9 groups of solution difference chips and its matching sub-circuit 31, is followed successively by the 1st group
Match sub-circuit, the 2nd group of matching sub-circuit, the 3rd group of matching sub-circuit, the 4th group of matching sub-circuit, the 5th group of matching sub-circuit, the
6 groups of matching sub-circuits, the 7th group of matching sub-circuit, the 8th group of matching sub-circuit, the 9th group of matching sub-circuit；Wherein, each group of guards escorting prisoners
Chip and its matching sub-circuit 31 is divided to be connected with clock circuit 4.
In Fig. 3, solving difference chip and its matching the circuit of sub-circuit 31 also includes the capacitance group and inductance L of series connection；The electricity
Appearance group include electric capacity C1, electric capacity C2, electric capacity C3, electric capacity C4, electric capacity C5, and capacitance group by five electric capacity C1, C2, C3, C4, C5 simultaneously
Connection is formed.Wherein electric capacity C1 and C4 capacitance is 0.1uF, and electric capacity C2 capacitance is 10uF, and electric capacity C3 and C5 capacitance are
1000pF.Inductance L value is 10uH.
The model DS90CR285 of difference chip is solved, corresponding difference chip model is DS90CR286, clock circuit 4
Model HC14DY-20M.
This product does not change original signal by the way that solution difference chipset 3 is merged between plug-in unit and test system
Straight-through property, with the board design of small-scale, realize the test to commonly using low-power consumption differential transfer chip, and plug-in unit side joint
Mouthful type can the diversified forms such as compatible PDS210, CPCI and PXI, there is very strong transplantability.This product not shadow when in use
Ring the transmission characteristic of original signal, it is only necessary to it is directly coupled between plug-in unit and test system, therefore using simple.
Finally, solution difference chip and its match circuit 31 and clock circuit 4 etc. are ripe used by this product
Chip and electronic component, it ensure that the reliability of test.In cost, compared to more existing test equipment, this infrastructure product
It is cheap.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
All any modification, equivalent and improvement made within refreshing and principle etc., should be included in the scope of the protection.
Claims (4)
- A kind of 1. straight-throughization test device of low-power consumption differential transfer chip, it is characterised in that：It is included to plug-in unit side interface (1), to test system side interface (2), solution difference chipset (3) and clock circuit (4)；It is described to plug-in unit side interface (1) and right Test system side interface (2) passes through the directly one-to-one connection of simultaneously walking line and both-way communication；The solution difference chipset (3) is respectively With to plug-in unit side interface (1) by difference cabling it is one-to-one connection and one-way communication, with to test system side interface (2) by simultaneously The one-to-one connection of walking line and one-way communication；The clock circuit (4) is connected with solution difference chipset (3)；The solution difference chipset (3) is mainly made up of 9 groups of solution difference chips and its matching sub-circuit (31), is followed successively by the 1st group Match sub-circuit, the 2nd group of matching sub-circuit, the 3rd group of matching sub-circuit, the 4th group of matching sub-circuit, the 5th group of matching sub-circuit, the 6 groups of matching sub-circuits, the 7th group of matching sub-circuit, the 8th group of matching sub-circuit, the 9th group of matching sub-circuit；Wherein, each group of guards escorting prisoners Chip and its matching sub-circuit (31) is divided to be connected with clock circuit (4).
- 2. the straight-throughization test device of low-power consumption differential transfer chip as claimed in claim 1, it is characterised in that：The guards escorting prisoners Divide chipset (3) with being to plug-in unit side interface (1) to solution difference chipset to the unidirectional communication direction of plug-in unit side interface (1) (3)；The solution difference chipset (3) is with being to solving difference chipset to the one-way communication direction of test system side interface (2) (3) arrive to test system side interface (2).
- 3. the straight-throughization test device of low-power consumption differential transfer chip as claimed in claim 1, it is characterised in that：The guards escorting prisoners Dividing chip and its matching sub-circuit (31) circuit also includes the capacitance group and inductance L of series connection；The capacitance group includes electric capacity C1, electricity Hold C2, electric capacity C3, electric capacity C4, electric capacity C5, and capacitance group is formed by five electric capacity C1, C2, C3, C4, C5 are in parallel.
- 4. the straight-throughization test device of low-power consumption differential transfer chip as claimed in claim 3, it is characterised in that：The electric capacity C1 and C4 capacitance is 0.1uF, and electric capacity C2 capacitance is 10uF, and electric capacity C3 and C5 capacitance are 1000pF；Inductance L value is 10uH。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510169365.1A CN104749514B (en) | 2015-04-10 | 2015-04-10 | A kind of straight-throughization test device of low-power consumption differential transfer chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510169365.1A CN104749514B (en) | 2015-04-10 | 2015-04-10 | A kind of straight-throughization test device of low-power consumption differential transfer chip |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104749514A CN104749514A (en) | 2015-07-01 |
| CN104749514B true CN104749514B (en) | 2017-12-19 |
Family
ID=53589493
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510169365.1A Active CN104749514B (en) | 2015-04-10 | 2015-04-10 | A kind of straight-throughization test device of low-power consumption differential transfer chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104749514B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110376430B (en) * | 2019-07-17 | 2020-05-22 | 广州市伟粤通讯设备有限公司 | Communication components and parts test evaluation system based on big data |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2284963Y (en) * | 1996-11-12 | 1998-06-24 | 满都拉 | Portable multi-functional and expandable digital circuit tester |
| CN201577167U (en) * | 2010-01-04 | 2010-09-08 | 青岛海信电器股份有限公司 | Circuit board selectively-cutting testing circuit and a television testing circuit |
| CN102891660A (en) * | 2012-10-15 | 2013-01-23 | 中国科学院微电子研究所 | Radio frequency impedance matcher |
| CN102944852A (en) * | 2012-11-05 | 2013-02-27 | 惠州Tcl移动通信有限公司 | Test equipment and test method of test equipment |
| CN103559110A (en) * | 2013-11-01 | 2014-02-05 | 珠海全志科技股份有限公司 | Testing method and device of LVDS (low voltage differential signaling) interface of SOC (system on chip) |
| CN104198910B (en) * | 2014-05-21 | 2016-10-05 | 广州民航职业技术学院 | A kind of integrated circuit automatic testing system and method for testing |
| CN204495966U (en) * | 2015-04-10 | 2015-07-22 | 中国电子科技集团公司第三十八研究所 | A kind of straight-throughization proving installation of low-power consumption differential transfer chip |
-
2015
- 2015-04-10 CN CN201510169365.1A patent/CN104749514B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN104749514A (en) | 2015-07-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102854877A (en) | Function test system and test method of automobile body control module | |
| CN103412810A (en) | System packaging chip capable of testing internal signals and test method | |
| CN105372536A (en) | Aviation electronic universal test platform | |
| CN109828872A (en) | Signal-testing apparatus and method | |
| CN204065308U (en) | A kind of polycore cable is to line and fault detection system | |
| CN104749514B (en) | A kind of straight-throughization test device of low-power consumption differential transfer chip | |
| CN109358995A (en) | A kind of multifunctional testing backboard and test method | |
| CN106546833B (en) | A kind of electric energy meter RS-485 communication chip networkings test system | |
| CN209281378U (en) | Chip commissioning device | |
| CN103675585A (en) | Electronic apparatus and method of controlling the same | |
| CN204086438U (en) | A kind of chip that utilizes protects diode measurement circuit to open the device of short circuit | |
| CN204495966U (en) | A kind of straight-throughization proving installation of low-power consumption differential transfer chip | |
| CN204405814U (en) | A kind of electronic load tester with power meter function | |
| CN202854605U (en) | Function test system of automotive body control model | |
| CN205545720U (en) | Signal connection and transmission device | |
| CN104994040A (en) | Ethernet switch and port multiplexing method applied to Ethernet switch | |
| CN104331065A (en) | Board card function combination detection circuit integrated into launching control equipment | |
| CN204215261U (en) | A kind of board function combine detection circuit being integrated in launching control equipment | |
| CN204008993U (en) | The multiplexing automatic testing equipment of the non-principle of a kind of miniaturization | |
| CN109254891A (en) | A kind of debugging board | |
| CN203012061U (en) | An automatic switching apparatus used for multiple paths of direct-current circuits | |
| CN206311695U (en) | A kind of cable detecting system | |
| CN201335867Y (en) | Connection test platform | |
| CN104793089A (en) | Onboard height indicator and preselector testing device based on redundancy management | |
| CN103969545A (en) | Device for testing open circuit and short circuit by means of chip protection diode |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |