CN109358995A - A kind of multifunctional testing backboard and test method - Google Patents

A kind of multifunctional testing backboard and test method Download PDF

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Publication number
CN109358995A
CN109358995A CN201811159088.6A CN201811159088A CN109358995A CN 109358995 A CN109358995 A CN 109358995A CN 201811159088 A CN201811159088 A CN 201811159088A CN 109358995 A CN109358995 A CN 109358995A
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pin
capacitor
interface
resistance
lrm
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周苗苗
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Tianjin Embedtec Co Ltd
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Tianjin Embedtec Co Ltd
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Priority to CN201811159088.6A priority Critical patent/CN109358995A/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)

Abstract

A kind of multifunctional testing backboard, it is characterised in that it includes: LRM module slot, VPX exchange groove, CPCI-E test trough, global function test interface and power supply module;Its method include module assign, interface connection, function setting, data send and receive, normal operation whether judge;The back board structure is simple, test function is extensive, functional reliability is high, strong applicability, has aerospace connectors interface function, the test line realized convenient for vibration and high/low temperature.

Description

A kind of multifunctional testing backboard and test method
Technical field
The present invention relates to computer card design field, in particular to a kind of multifunctional testing backboard and test method.
Background technique
With the fast development of military project, aerospace computer and the communication technology, in military computer bus architecture not only Be limited to PCI(Peripheral Component Interconnect, external components interconnection standard), PCI-e(Peripheral Component Interconnect express, high-speed peripheral interconnection standard) bus forms such as bus, VPX(VITA46 Standard) bus gradually incorporates military computer with the advantages of its higher signal density and higher transmission rate;In addition, LRM(Line Replaceable Module, line replaceable module) standard with it has the function of standard and interchangeability, only The advantages that vertical independence, high reliability, starts to be applied in military airborne avionics system.It can be in the product of existing market The board of LRM module, VPX bus and PCI-E bus communication function is tested simultaneously, therefore, in terms of computer card test, is needed A kind of multifunctional testing backboard is designed, to realize the board to PCI-E bus form, LRM modular form and VPX bus form Carry out convenient effective global function test.
Summary of the invention
The purpose of the present invention is to provide a kind of multifunctional testing backboard and test methods, it can overcome the prior art Deficiency is that a kind of structure is simple, easy to accomplish, functional reliability is high, the testing backboard of strong applicability and test method.
Technical solution of the present invention: a kind of multifunctional testing backboard, it is characterised in that it includes: LRM module slot, VPX Exchange groove, CPCI-E test trough, global function test interface and power supply module;Wherein, the LRM module slot is handed over VPX respectively It changes between slot and CPCI-E test trough and is connected in two-way;It is in be bi-directionally connected between the VPX exchange groove and CPCI-E test trough;Institute It is in be bi-directionally connected that LRM module slot, which is stated, with global function test interface;The power supply module is exchanged with LRM module slot, VPX respectively Slot, CPCI-E test trough are connected, and provide operating voltage for it.
It is connected between the LRM module slot and VPX exchange groove by the PCIE bus of one group of x1;The LRM module is inserted It is connected between slot and CPCI-E test trough by the PCIE bus of 2 groups of x1;Lead between the VPX exchange groove and CPCI-E test trough The PCIE bus for crossing 9 groups of x1 is connected.
There is LRM standard connector interface in the LRM module slot, realizes the connection with tested LRM module board.
The LRM standard connector is the connector LRM1-A100H6Bb-B110H4Bb-Z1 of 3412 factories.
There is VPX standard connector interface in the VPX exchange groove, realizes the connection with tested VPX power board.
The VPX standard connector is the VPX-21Z8eIJ8-A connector of Air China's photoelectricity.
There is CPCI-E standard connector interface in the CPCI-E test trough, realizes the connection with CPCI-E bus board.
The CPCI-E standard connector is the CPCI-E UPM 254016 and CPCI Express of ERNI company 973027 connectors.
The global function test interface is by 2 aerospace connectors interfaces, 1 VGA standard interface, 4 gigabit Ethernets Standard interface, 2 USB3.0 standard interfaces, 1 PS/2 keyboard and mouse standard interface, 1 RS232 standard serial port and 1 RS422 Standard serial port is constituted, and is realized and is drawn to the Full Featured interface of tested board.
The power supply module is made of power connector and level shifting circuit, realize to LRM module slot provide+ 12V operating voltage, to VPX exchange groove offer+5V operating voltage, to CPCI-E test trough offer+12V operating voltage;Wherein, institute Stating power connector is+12V input power connector, and input terminal receives external power supply and inputs, output end output+12V power supply, Operating voltage is provided for LRM module slot and CPCI-E test trough, output end is also through level shifting circuit output+5V power supply; Output end output+5V the power supply of the level shifting circuit, provides operating voltage for VPX exchange groove.
The power connector is the 2x2P 4.2mm connector of ASTRON company.
The level shifting circuit be by electrical level transferring chip U1, capacitor M1, chip inductor L2, capacitor C2, capacitor C14, Capacitor C13, capacitor C4, resistance R8, resistance R1, resistance R5, capacitor C6, resistance R2, resistance R3, resistance R4, resistance R9, resistance R10, capacitor C1, chip inductor L1, resistance R7, resistance R6, capacitor C3, capacitor C5, capacitor C7 and capacitor M3;The level conversion Chip U1 is the TPS53319 chip of TI company, it have 6 VIN pins, VDD pin, EN pin, VREG pin, MODE pin, TRIP pin, RF pin, ROVP pin, PGOOD pin, VBST pin, 6 LL pins, VFB pin and GND pin;The electricity Hold a termination+12V power supply of M1, other end ground connection;A termination+12V power supply of the chip inductor L2, the other end and short circuit 6 VIN pin connections;The capacitor C2, capacitor C14 and capacitor C13 are parallel with one another, and one end connects chip inductor L2, the other end Ground connection;A termination+12V power supply of the capacitor C4, the other end are connect with VDD pin;The VDD pin and+12V power supply connect It connects;One end+12V power supply of the resistance R8, the other end are connect with EN pin;The VREG pin is connect with+5V power supply;Institute It states MODE pin and is connect through resistance R1 with+5V power supply;The RF pin is connect through resistance R5 with+5V power supply;The ROVP pin It is connect through capacitor C6 with+5V power supply;The resistance R2 is connected across between MODE pin and ROVP pin, and is grounded;The resistance R4 is connected across between RF pin and ROVP pin, and is grounded;One end of the resistance R3 connects TRIP pin, other end ground connection; The PGOOD pin is through resistance R9 output+5V voltage;Resistance R10 and capacitor C1 and patch of the VBST pin through being serially connected One end of piece inductance L1 connects;6 LL pins are connect after being shorted with one end of chip inductor L1;The capacitor C3, capacitor C5, capacitor C7 and capacitor M3 are parallel with one another, and one end connects chip inductor L1, other end ground connection;One end of the chip inductor L1 Output+5V voltage;The resistance R7 and resistance R6 are serially connected, and one end connects chip inductor L1, other end ground connection;The VFB On the series connection point of pin connection and resistance R7 and resistance R6;The GND pin ground connection.
A kind of test method of multifunctional testing backboard, it is characterised in that it the following steps are included:
(1) LRM module motherboard is assigned into LRM module slot, VPX power board is assigned into VPX exchange groove, by CPCI-E Test board assigns into CPCI-E test trough, and ATX power supply+12V power supply line interface is assigned into the power connector of power supply module On;
(2) VGA display is connected using VGA cable with the VGA standard interface of multifunctional testing backboard;By a test pen Remember that this is connected using straight through cable with the gigabit Ethernet standard interface of multifunctional testing backboard;By the mouse of Universal USB interface It is connected respectively with the USB3.0 standard interface with multifunctional testing backboard with keyboard;By the keyboard and MouseAcross of general PS/2 interface PS/2 one drag two cable is crossed to be connected with the PS/2 keyboard and mouse standard interface of multifunctional testing backboard;By general RS232 cable The transmission pin and reception pin of one end DB9 plug are shorted, the RS232 standard interface phase of the other end and multifunctional testing backboard Even;By the positive pin of transmission of one end DB9 plug of general RS422 cable and positive pin short circuit is received, negative pin is sent and receives Negative pin is shorted, and the other end is connected with multifunctional testing backboard RS422 standard interface;By dedicated air plug cable and multifunctional testing Backboard aerospace connectors interface is connected;
(3) system electrification, VGA display, which is normally shown, indicates that LRM mainboard display function is normal;Into after operating system, if USB Keyboard and mouse can normal use then indicate that LRM mainboard USB interface function is normal;Into after operating system, if PS/2 keyboard and mouse It can work normally, indicate that LRM mainboard PS/2 interface function is normal;
(4) serial ports test software is opened in an operating system, sends arbitrary data to RS232 serial ports, checks that serial ports receives data, It is identical as serial ports transmission data to receive data, then proves that the RS232 serial port function of LRM mainboard is normal;It sends and appoints to RS422 serial ports Meaning data check that serial ports receives data, and reception data are identical as serial ports transmission data, then prove LRM mainboard RS422 serial port function Normally;
(5) step (2), (3), (4) operation are subjected to identical test under dedicated air plug cable, if test result and the above knot Fruit is identical, then proves the function normal operation of aerospace connectors interface and LRM mainboard.
Superiority of the invention: can fit standard LRM module, standard VPX Switching Module and CPCI-E bus module, can Realize the validity test to LRM module, VPX Switching Module and CPCI-E bus module;Comprising multiple standards interface, can be realized Tested board covers Full Featured test;Has aerospace connectors interface function, the test realized convenient for vibration and high/low temperature connects Line;The back board structure is simple, test function is extensive, functional reliability is high, strong applicability.
Detailed description of the invention
Fig. 1 is a kind of overall structure schematic block diagram of multifunctional testing backboard involved by the present invention.
Fig. 2 is the structural schematic block diagram of power supply module in a kind of multifunctional testing backboard involved by the present invention.
Fig. 3 is the particular circuit configurations figure of power supply module in a kind of multifunctional testing backboard involved by the present invention.
Specific embodiment
Embodiment: a kind of multifunctional testing backboard, as shown in Figure 1, it is characterised in that it includes: LRM module slot, VPX Exchange groove, CPCI-E test trough, global function test interface and power supply module;Wherein, the LRM module slot is handed over VPX respectively It changes between slot and CPCI-E test trough and is connected in two-way;It is in be bi-directionally connected between the VPX exchange groove and CPCI-E test trough;Institute It is in be bi-directionally connected that LRM module slot, which is stated, with global function test interface;The power supply module is exchanged with LRM module slot, VPX respectively Slot, CPCI-E test trough are connected, and provide operating voltage for it.
It is connected between the LRM module slot and VPX exchange groove by the PCIE bus of one group of x1;The LRM module is inserted It is connected between slot and CPCI-E test trough by the PCIE bus of 2 groups of x1;Lead between the VPX exchange groove and CPCI-E test trough The PCIE bus for crossing 9 groups of x1 is connected, as shown in Figure 1.
There is LRM standard connector interface in the LRM module slot, realizes the connection with tested LRM module board.
The LRM standard connector is the connector LRM1-A100H6Bb-B110H4Bb-Z1 of 3412 factories.
There is VPX standard connector interface in the VPX exchange groove, realizes the connection with tested VPX power board.
The VPX standard connector is the VPX-21Z8eIJ8-A connector of Air China's photoelectricity.
There is CPCI-E standard connector interface in the CPCI-E test trough, realizes the connection with CPCI-E bus board.
The CPCI-E standard connector is the CPCI-E UPM 254016 and CPCI Express of ERNI company 973027 connectors.
The global function test interface is by 2 aerospace connectors interfaces, 1 VGA standard interface, 4 gigabit Ethernets Standard interface, 2 USB3.0 standard interfaces, 1 PS/2 keyboard and mouse standard interface, 1 RS232 standard serial port and 1 RS422 Standard serial port is constituted, and is realized and is drawn to the Full Featured interface of tested board, as shown in Figure 1.
The power supply module is made of power connector and level shifting circuit, as shown in Fig. 2, realizing to LRM module Slot offer+12V operating voltage works CPCI-E test trough offer+12V electric to VPX exchange groove offer+5V operating voltage Pressure;Wherein, the power connector is+12V input power connector, and input terminal receives external power supply input, and output end is defeated + 12V power supply out provides operating voltage for LRM module slot and CPCI-E test trough, and output end is also defeated through level shifting circuit + 5V power supply out;Output end output+5V the power supply of the level shifting circuit, provides operating voltage for VPX exchange groove.
The power connector is the 2x2P 4.2mm connector of ASTRON company.
As shown in figure 3, the level shifting circuit is by electrical level transferring chip U1, capacitor M1, chip inductor L2, capacitor C2, capacitor C14, capacitor C13, capacitor C4, resistance R8, resistance R1, resistance R5, capacitor C6, resistance R2, resistance R3, resistance R4, electricity Hinder R9, resistance R10, capacitor C1, chip inductor L1, resistance R7, resistance R6, capacitor C3, capacitor C5, capacitor C7 and capacitor M3;Institute The TPS53319 chip that electrical level transferring chip U1 is TI company is stated, it has 6 VIN pins, VDD pin, EN pin, VREG pipe Foot, MODE pin, TRIP pin, RF pin, ROVP pin, PGOOD pin, VBST pin, 6 LL pins, VFB pin and GND pin;A termination+12V power supply of the capacitor M1, other end ground connection;A termination+12V power supply of the chip inductor L2, The other end is connect with 6 VIN pins being shorted;The capacitor C2, capacitor C14 and capacitor C13 are parallel with one another, and one end connects patch Inductance L2, other end ground connection;A termination+12V power supply of the capacitor C4, the other end are connect with VDD pin;The VDD pin It is connect with+12V power supply;One end+12V power supply of the resistance R8, the other end are connect with EN pin;The VREG pin and+5V Power supply connection;The MODE pin is connect through resistance R1 with+5V power supply;The RF pin is connect through resistance R5 with+5V power supply;Institute ROVP pipe foot meridian capacitor C6 is stated to connect with+5V power supply;The resistance R2 is connected across between MODE pin and ROVP pin, and is connect Ground;The resistance R4 is connected across between RF pin and ROVP pin, and is grounded;One end of the resistance R3 connects TRIP pin, Other end ground connection;The PGOOD pin is through resistance R9 output+5V voltage;Resistance R10 of the VBST pin through being serially connected and Capacitor C1 is connect with one end of chip inductor L1;6 LL pins are connect after being shorted with one end of chip inductor L1;The electricity It is parallel with one another to hold C3, capacitor C5, capacitor C7 and capacitor M3, one end connects chip inductor L1, other end ground connection;The chip inductor One end output+5V voltage of L1;The resistance R7 and resistance R6 are serially connected, and one end connects chip inductor L1, other end ground connection; On the series connection point of the VFB pin connection and resistance R7 and resistance R6;The GND pin ground connection.
A kind of test method of multifunctional testing backboard, it is characterised in that it the following steps are included:
(1) LRM module motherboard is assigned into LRM module slot, VPX power board is assigned into VPX exchange groove, by CPCI-E Test board assigns into CPCI-E test trough, and ATX power supply+12V power supply line interface is assigned into the power connector of power supply module On;
(2) VGA display is connected using VGA cable with the VGA standard interface of multifunctional testing backboard;By a test pen Remember that this is connected using straight through cable with the gigabit Ethernet standard interface of multifunctional testing backboard;By the mouse of Universal USB interface It is connected respectively with the USB3.0 standard interface with multifunctional testing backboard with keyboard;By the keyboard and MouseAcross of general PS/2 interface PS/2 one drag two cable is crossed to be connected with the PS/2 keyboard and mouse standard interface of multifunctional testing backboard;By general RS232 cable The transmission pin and reception pin of one end DB9 plug are shorted, the RS232 standard interface phase of the other end and multifunctional testing backboard Even;By the positive pin of transmission of one end DB9 plug of general RS422 cable and positive pin short circuit is received, negative pin is sent and receives Negative pin is shorted, and the other end is connected with multifunctional testing backboard RS422 standard interface;By dedicated air plug cable and multifunctional testing Backboard aerospace connectors interface is connected;
(3) system electrification, VGA display, which is normally shown, indicates that LRM mainboard display function is normal;Into after operating system, if USB Keyboard and mouse can normal use then indicate that LRM mainboard USB interface function is normal;Into after operating system, if PS/2 keyboard and mouse It can work normally, indicate that LRM mainboard PS/2 interface function is normal;
(4) serial ports test software is opened in an operating system, sends arbitrary data to RS232 serial ports, checks that serial ports receives data, It is identical as serial ports transmission data to receive data, then proves that the RS232 serial port function of LRM mainboard is normal;It sends and appoints to RS422 serial ports Meaning data check that serial ports receives data, and reception data are identical as serial ports transmission data, then prove LRM mainboard RS422 serial port function Normally;
(5) step (2), (3), (4) operation are subjected to identical test under dedicated air plug cable, if test result and the above knot Fruit is identical, then proves the function normal operation of aerospace connectors interface and LRM mainboard.
Present invention will be further explained below with reference to the attached drawings and examples.
Referring to attached drawing 1, a kind of multifunctional testing backboard includes LRM module slot, VPX exchange groove, CPCI-E test trough, complete Functional test interface and power supply module wherein pass through the PCIE bus phase of one group of x1 between LRM module slot and VPX exchange groove Even, while being connected with CPCI-E test trough by the PCIE bus of 2 groups of x1, VPX exchange groove also passes through 9 groups with CPCI-E test trough The PCIE bus of x1 is connected, meanwhile, LRM module slot is connected with global function test interface, power supply module respectively with LRM mould Block slot, VPX exchange groove, CPCI-E test trough are connected.
The LRM module slot includes LRM standard connector interface, realizes the connection with tested LRM module board, specifically It can be the LRM1-A100H6Bb-B110H4Bb-Z1 connector of 3412 factories.
The VPX exchange groove includes VPX standard connector interface, realize with the connection of tested VPX power board, specifically can be with It is the VPX-21Z8eIJ8-A connector of Air China's photoelectricity.
The CPCI-E test trough includes CPCI-E standard connector interface, realizes the connection with CPCI-E bus board, It specifically can be 973027 connector of CPCI-E UPM 254016 and CPCI Express of ERNI company.
The global function test interface includes: 2 aerospace connectors interface a, a VGA standard interface b, 4 gigabits with Too net standard interface c, 2 USB3.0 standard interface d, 1 PS/2 keyboard and mouse standard interface e, 1 RS232 standard serial port f, 1 A RS422 standard serial port g is realized and is drawn to the Full Featured interface of tested LRM module board.
Referring to attached drawing 2, the power supply module includes power connector and level shifting circuit, specifically comprising+12V input electricity Source connector, electrical level transferring chip, inductance, resistance and capacitor element, wherein power connector can be ASTRON company 2x2P 4.2mm connector specifically can choose the TPS53319 chip of TI company in level shifting circuit, and+12V level is turned Be changed to+5V level, realize+12V power supply to LRM the module slot ,+5V power supply of VPX exchange groove and CPCI-E test trough+ 12V power supply.
The test method of the invention are as follows:
Step 1: LRM module motherboard is assigned into LRM module slot, and VPX power board is assigned into VPX exchange groove, will CPCI-E test board assigns into CPCI-E test trough, and ATX power supply+12V power supply line interface is assigned into the power supply of power supply module On connector.
Step 2: VGA display is connected using VGA cable with multifunctional testing backboard VGA standard interface;One is surveyed Notebook on probation is connected using straight through cable with multifunctional testing backboard gigabit Ethernet standard interface;By Universal USB interface Mouse and keyboard are connected with multifunctional testing backboard USB3.0 standard interface respectively;By the keyboard and mouse of general PS/2 interface It is connected by PS/2 one drag two cable with multifunctional testing backboard PS/2 keyboard and mouse standard interface;By general RS232 cable The transmission pin and reception pin of one end DB9 plug are shorted, and the other end is connected with multifunctional testing backboard RS232 standard interface; By the positive pin of transmission of one end DB9 plug of general RS422 cable and positive pin short circuit is received, negative pin is sent and receives negative draw Foot is shorted, and the other end is connected with multifunctional testing backboard RS422 standard interface;By dedicated air plug cable and multifunctional testing backboard Aerospace connectors interface is connected.
Step 3: system electrification is given, it is normal that VGA display normally goes out aobvious expression LRM mainboard display function;It is into operation After system, USB keyboard mouse can normal use indicate LRM mainboard USB interface function it is normal;Into after operating system, PS/2 keyboard Mouse, which can work normally, indicates that LRM mainboard PS/2 interface function is normal;Serial ports test software is opened in an operating system, to RS232 serial ports sends arbitrary data, checks that serial ports receives data, it is identical as serial ports transmission data to receive data, it was demonstrated that LRM mainboard RS232 serial port function is normal;Serial ports test software is opened in an operating system, is sent arbitrary data to RS422 serial ports, is checked string Mouth receives data, it is identical as serial ports transmission data to receive data, it was demonstrated that LRM mainboard RS422 serial port function is normal;It will test above The identical test of carry out in dedicated air plug cable is operated, test result is identical as result above, it was demonstrated that aerospace connectors interface And LRM mainboard corresponding function is normal.

Claims (10)

1. a kind of multifunctional testing backboard, it is characterised in that it includes: LRM module slot, VPX exchange groove, CPCI-E test trough, Global function test interface and power supply module;Wherein, the LRM module slot respectively with VPX exchange groove and CPCI-E test trough it Between in it is two-way be connected;It is in be bi-directionally connected between the VPX exchange groove and CPCI-E test trough;The LRM module slot and full function Energy test interface is in be bi-directionally connected;The power supply module respectively with LRM module slot, VPX exchange groove, CPCI-E test trough phase Even, operating voltage is provided for it.
2. a kind of multifunctional testing backboard according to claim 1, it is characterised in that the LRM module slot is exchanged with VPX It is connected between slot by the PCIE bus of one group of x1;Pass through 2 groups of x1's between the LRM module slot and CPCI-E test trough PCIE bus is connected;It is connected between the VPX exchange groove and CPCI-E test trough by the PCIE bus of 9 groups of x1.
3. a kind of multifunctional testing backboard according to claim 1, it is characterised in that have LRM mark in the LRM module slot Quasi- connector interface realizes the connection with tested LRM module board;The LRM standard connector is the connector of 3412 factories LRM1-A100H6Bb-B110H4Bb-Z1。
4. a kind of multifunctional testing backboard according to claim 1, it is characterised in that have VPX standard in the VPX exchange groove Connector interface realizes the connection with tested VPX power board;The VPX standard connector is the VPX- of Air China's photoelectricity 21Z8eIJ8-A connector.
5. a kind of multifunctional testing backboard according to claim 1, it is characterised in that have CPCI- in the CPCI-E test trough E standard connector interface realizes the connection with CPCI-E bus board;
The CPCI-E standard connector is that the CPCI-E UPM 254016 and CPCI Express 973027 of ERNI company connect Connect device.
6. a kind of multifunctional testing backboard according to claim 1, it is characterised in that the global function test interface is by 2 Aerospace connectors interface, 1 VGA standard interface, 4 gigabit Ethernet standard interfaces, 2 USB3.0 standard interfaces, 1 PS/2 Keyboard and mouse standard interface, 1 RS232 standard serial port and 1 RS422 standard serial port are constituted, and are realized to tested board global function Interface draw.
7. a kind of multifunctional testing backboard according to claim 1, it is characterised in that the power supply module is connected by power supply Device and level shifting circuit are constituted, and are realized to LRM module slot offer+12V operating voltage, are worked VPX exchange groove offer+5V Voltage, to CPCI-E test trough offer+12V operating voltage;Wherein, the power connector is+12V input power connector, Its input terminal receives external power supply input, and output end output+12V power supply provides work for LRM module slot and CPCI-E test trough Make voltage, output end is also through level shifting circuit output+5V power supply;Output end output+5V the electricity of the level shifting circuit Source provides operating voltage for VPX exchange groove.
8. a kind of multifunctional testing backboard according to claim 7, it is characterised in that the power connector is ASTRON public affairs The 2x2P 4.2mm connector of department.
9. a kind of multifunctional testing backboard according to claim 7, it is characterised in that the level shifting circuit is by level Conversion chip U1, capacitor M1, chip inductor L2, capacitor C2, capacitor C14, capacitor C13, capacitor C4, resistance R8, resistance R1, resistance R5, capacitor C6, resistance R2, resistance R3, resistance R4, resistance R9, resistance R10, capacitor C1, chip inductor L1, resistance R7, resistance R6, capacitor C3, capacitor C5, capacitor C7 and capacitor M3;The electrical level transferring chip U1 is the TPS53319 chip of TI company, it has 6 VIN pins, VDD pin, EN pin, VREG pin, MODE pin, TRIP pin, RF pin, ROVP pin, PGOOD pipe Foot, VBST pin, 6 LL pins, VFB pin and GND pin;A termination+12V power supply of the capacitor M1, other end ground connection; A termination+12V power supply of the chip inductor L2, the other end are connect with 6 VIN pins being shorted;The capacitor C2, capacitor C14 and capacitor C13 are parallel with one another, and one end connects chip inductor L2, other end ground connection;A termination+12V electricity of the capacitor C4 Source, the other end are connect with VDD pin;The VDD pin is connect with+12V power supply;One end+12V power supply of the resistance R8, separately One end is connect with EN pin;The VREG pin is connect with+5V power supply;The MODE pin is connect through resistance R1 with+5V power supply; The RF pin is connect through resistance R5 with+5V power supply;The ROVP pipe foot meridian capacitor C6 is connect with+5V power supply;The resistance R2 It is connected across between MODE pin and ROVP pin, and is grounded;The resistance R4 is connected across between RF pin and ROVP pin, and is connect Ground;One end of the resistance R3 connects TRIP pin, other end ground connection;The PGOOD pin is through resistance R9 output+5V voltage; Resistance R10 and capacitor C1 of the VBST pin through being serially connected are connect with one end of chip inductor L1;6 LL pins are short It connects and is connect afterwards with one end of chip inductor L1;The capacitor C3, capacitor C5, capacitor C7 and capacitor M3 are parallel with one another, one end connection Chip inductor L1, other end ground connection;One end output+5V voltage of the chip inductor L1;The resistance R7 and resistance R6 are mutual Series connection, one end connect chip inductor L1, other end ground connection;On the series connection point of the VFB pin connection and resistance R7 and resistance R6; The GND pin ground connection.
10. a kind of test method of multifunctional testing backboard, it is characterised in that it the following steps are included:
(1) LRM module motherboard is assigned into LRM module slot, VPX power board is assigned into VPX exchange groove, by CPCI-E Test board assigns into CPCI-E test trough, and ATX power supply+12V power supply line interface is assigned into the power connector of power supply module On;
(2) VGA display is connected using VGA cable with the VGA standard interface of multifunctional testing backboard;By a test pen Remember that this is connected using straight through cable with the gigabit Ethernet standard interface of multifunctional testing backboard;By the mouse of Universal USB interface It is connected respectively with the USB3.0 standard interface with multifunctional testing backboard with keyboard;By the keyboard and MouseAcross of general PS/2 interface PS/2 one drag two cable is crossed to be connected with the PS/2 keyboard and mouse standard interface of multifunctional testing backboard;By general RS232 cable The transmission pin and reception pin of one end DB9 plug are shorted, the RS232 standard interface phase of the other end and multifunctional testing backboard Even;By the positive pin of transmission of one end DB9 plug of general RS422 cable and positive pin short circuit is received, negative pin is sent and receives Negative pin is shorted, and the other end is connected with multifunctional testing backboard RS422 standard interface;By dedicated air plug cable and multifunctional testing Backboard aerospace connectors interface is connected;
(3) system electrification, VGA display, which is normally shown, indicates that LRM mainboard display function is normal;Into after operating system, if USB Keyboard and mouse can normal use then indicate that LRM mainboard USB interface function is normal;Into after operating system, if PS/2 keyboard and mouse It can work normally, indicate that LRM mainboard PS/2 interface function is normal;
(4) serial ports test software is opened in an operating system, sends arbitrary data to RS232 serial ports, checks that serial ports receives data, It is identical as serial ports transmission data to receive data, then proves that the RS232 serial port function of LRM mainboard is normal;It sends and appoints to RS422 serial ports Meaning data check that serial ports receives data, and reception data are identical as serial ports transmission data, then prove LRM mainboard RS422 serial port function Normally;
(5) step (2), (3), (4) operation are subjected to identical test under dedicated air plug cable, if test result and the above knot Fruit is identical, then proves the function normal operation of aerospace connectors interface and LRM mainboard.
CN201811159088.6A 2018-09-30 2018-09-30 A kind of multifunctional testing backboard and test method Pending CN109358995A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110542825A (en) * 2019-08-22 2019-12-06 陕西千山航空电子有限责任公司 testing equipment and testing method for wiring integrity of product
CN110703069A (en) * 2019-08-29 2020-01-17 天津市英贝特航天科技有限公司 COMe test bottom plate and test method
CN114362815A (en) * 2022-03-21 2022-04-15 北京新松佳和电子系统股份有限公司 Test method for backboard optical module

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106294049A (en) * 2016-08-26 2017-01-04 天津市英贝特航天科技有限公司 A kind of 6U VPX computer motherboard electric interfaces global function test base plate
CN106326165A (en) * 2016-08-26 2017-01-11 天津市英贝特航天科技有限公司 Portable multibus bottom board
CN206224300U (en) * 2016-08-26 2017-06-06 天津市英贝特航天科技有限公司 A kind of LRM main processing blocks based on COM Express
US20180246796A1 (en) * 2017-02-24 2018-08-30 Intel Corporation Mechanism to provide back-to-back testing of memory controller operation

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106294049A (en) * 2016-08-26 2017-01-04 天津市英贝特航天科技有限公司 A kind of 6U VPX computer motherboard electric interfaces global function test base plate
CN106326165A (en) * 2016-08-26 2017-01-11 天津市英贝特航天科技有限公司 Portable multibus bottom board
CN206224300U (en) * 2016-08-26 2017-06-06 天津市英贝特航天科技有限公司 A kind of LRM main processing blocks based on COM Express
US20180246796A1 (en) * 2017-02-24 2018-08-30 Intel Corporation Mechanism to provide back-to-back testing of memory controller operation

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110542825A (en) * 2019-08-22 2019-12-06 陕西千山航空电子有限责任公司 testing equipment and testing method for wiring integrity of product
CN110703069A (en) * 2019-08-29 2020-01-17 天津市英贝特航天科技有限公司 COMe test bottom plate and test method
CN114362815A (en) * 2022-03-21 2022-04-15 北京新松佳和电子系统股份有限公司 Test method for backboard optical module

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Application publication date: 20190219