CN102944852A - Test equipment and test method of test equipment - Google Patents
Test equipment and test method of test equipment Download PDFInfo
- Publication number
- CN102944852A CN102944852A CN2012104376537A CN201210437653A CN102944852A CN 102944852 A CN102944852 A CN 102944852A CN 2012104376537 A CN2012104376537 A CN 2012104376537A CN 201210437653 A CN201210437653 A CN 201210437653A CN 102944852 A CN102944852 A CN 102944852A
- Authority
- CN
- China
- Prior art keywords
- signal
- led lamp
- system control
- lamp matrix
- host computer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Led Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses test equipment, which is used for testing LED (light emitting diode) lamp matrixes. The test equipment comprises a upper computer, a signal conversion device and a signal feedback device, wherein the upper computer is used for generating system control signals, the signal conversion device is connected with the upper computer and is used for receiving the signal control signals from the upper computer and outputting multipath TTL (transistor-transistor logic) level signals according to the system control signals, the multipath TTL level signals are used for testing the LED lamp matrixes, the signal feedback device is connected with the upper computer, and is used for measuring the current value in the LED lamp matrixes and feeding back measuring results to the upper computer, and the upper computer judges whether the LED lamp matrix test is passed or not according the measuring results. The invention also discloses a test method of the test equipment. Through adopting the mode, the test equipment and the test method of the test equipment have the advantages that the test reliability and the accuracy can be improved, and the test efficiency is improved.
Description
Technical field
The present invention relates to technical field of measurement and test, particularly relate to a kind of testing apparatus and method of testing thereof.
Background technology
LED(Light Emitting Diode, light emitting diode) be a kind of can be the solid-state semiconductor devices of visible light with electric energy conversion, because it has long, the characteristics such as light efficiency is high, radiationless and low-power consumption of life-span, often be used in various modern electronic designs and the system, with the function that provides image display and state to show.In a lot of electronic equipments, LED is not single existence usually, but a large amount of regular combination, and for example with the form of matrix, yet this existence form has increased in process of production the difficulty of test to it.
In the prior art, usually adopt the range estimation mode to test to the test of LED lamp matrix, but there is following shortcoming in this test mode:
1. be subject to easily the human factor impacts such as people's kopiopia, cause undetected or the mistake survey;
2. need the special messenger that it is tested, cost is higher and efficient is lower.
Summary of the invention
The technical matters that the present invention mainly solves provides a kind of testing apparatus and method of testing thereof, can improve fiduciary level and the accuracy of test, improves testing efficiency.
For solving the problems of the technologies described above, the technical scheme that the present invention adopts is: a kind of testing apparatus is provided, is used for test LED lamp matrix, this testing apparatus comprises host computer, chromacoder and signal feedback device.Host computer is for generation of system control signal; Chromacoder is connected with host computer, be used for from host computer receiving system control signal, and according to system control signal output multi-channel Transistor-Transistor Logic level signal, this multichannel Transistor-Transistor Logic level signal is used for LED lamp matrix is tested; Signal feedback device is connected with host computer, be used for to measure the current value of LED lamp matrix, and with measurement feedback to host computer, whether wherein, host computer also is used for after getting access to measurement result, judge according to measurement result that LED lamp matrix is tested and pass through.
Wherein, chromacoder comprises signal conversion module and signal driver module.Signal conversion module is connected with host computer by usb bus, is used for from host computer receiving system control signal, and system control signal is converted to I
2The C signal; The signal driver module is passed through I
2The C bus is connected with signal conversion module, is used for receiving I from signal conversion module
2The C signal, and according to I
2C signal output multi-channel Transistor-Transistor Logic level signal.
Wherein, LED lamp matrix and signal driver module form the loop, receive multichannel Transistor-Transistor Logic level signal from the signal driver module, with driving LED lamp matrix.
Wherein, the signal driver module has line output control and row output control, and line output control is used for the row of driving LED lamp matrix, and row output control is used for driving LED lamp matrix column.
Wherein, LED lamp matrix is a plurality of, and the signal driver module is a plurality of, and the signal driver module is corresponding one by one with LED lamp matrix, and a plurality of signal driver modules are parallel to I
2On the C bus.
Wherein, signal conversion module is the usb bus connect chip.
Wherein, the signal driver module is LED lamp matrix driving chip.
Wherein, signal feedback device is programmable power supply, and programmable power supply is connected with host computer by general purpose interface bus.
For solving the problems of the technologies described above, another technical solution used in the present invention is: the method for testing that a kind of testing apparatus is provided.This method of testing comprises: produce system control signal; The receiving system control signal, and according to system control signal output multi-channel Transistor-Transistor Logic level signal; Utilize multichannel Transistor-Transistor Logic level signal that LED lamp matrix is tested; Measure the current value in the LED lamp matrix; Judge according to measurement result whether the test of LED lamp matrix is passed through.
Wherein, the receiving system control signal, and be specially according to the step of system control signal output multi-channel Transistor-Transistor Logic level signal: the receiving system control signal is converted to I with system control signal
2The C signal; Receive I
2The C signal is according to I
2C signal output multi-channel Transistor-Transistor Logic level signal.
Testing apparatus of the present invention and method of testing thereof are converted to multichannel Transistor-Transistor Logic level signal by the system control signal that host computer is sent, multichannel Transistor-Transistor Logic level signal driver LED lamp matrix is to test, current value during according to test in the LED lamp matrix judges whether the test of LED lamp matrix is passed through, adopt the artificial visually examine compared to existing technology, can improve fiduciary level and the accuracy of test, improve testing efficiency.
Description of drawings
In order to be illustrated more clearly in the technical scheme in the embodiment of the invention, the accompanying drawing of required use was done to introduce simply during the below will describe embodiment, apparently, accompanying drawing in the following describes only is some embodiments of the present invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain according to these accompanying drawings other accompanying drawing, wherein:
Fig. 1 is the structural representation of testing apparatus the first embodiment of the present invention;
Fig. 2 is the structural representation of testing apparatus the second embodiment of the present invention;
Fig. 3 is the structural representation of testing apparatus the 3rd embodiment of the present invention;
Fig. 4 is the LED lamp matrix driving chip of testing apparatus shown in Figure 3 and the connection diagram of LED lamp matrix;
Fig. 5 is the schematic flow sheet of the method for testing embodiment of testing apparatus of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is a part of embodiment of the present invention, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that obtains under the creative work prerequisite.
See also Fig. 1, Fig. 1 is the structural representation of testing apparatus the first embodiment of the present invention.This testing apparatus comprises host computer 101, chromacoder 102 and signal feedback device 103.
In the present embodiment, host computer 101 is preferably computing machine, and host computer 101 is for generation of system control signal, and transfers to chromacoder 102; Chromacoder 102 is connected with host computer 101, be used for from host computer 101 receiving system control signals, and according to system control signal output multi-channel Transistor-Transistor Logic level signal, multichannel Transistor-Transistor Logic level signal is used for LED lamp matrix (not shown) is tested; Signal feedback device 103 is connected with host computer 101, be used for to measure the current value of LED lamp matrix, and with result feedback to host computer 101, wherein, host computer 101 also is used for after getting access to measurement result, judges according to measurement result whether the test of LED lamp matrix is passed through.
Particularly, host computer 101 receives tester's input and produces system control signal, chromacoder 102 receiving system control signals, but system control signal is converted to the multichannel Transistor-Transistor Logic level signal of driving LED lamp matrix display, light on and off by the corresponding LED lamp in the 0 or 1 sequential control LED lamp matrix in the multichannel Transistor-Transistor Logic level signal, signal feedback device 103 is measured the current value of the corresponding LED lamp current flowing in the LED lamp matrix, and current value fed back to host computer 101, host computer 101 judges according to the size of current value whether corresponding LED lamp has fault, for example, the tester sends to some LED lamps on host computer 101 and lights order, correspondingly, chromacoder 102 sends high level to this LED lamp, under normal circumstances, this LED lamp is lighted and current flowing, is zero or very little but signal feedback device 103 measures current value at this LED lamp, 101 of host computers judge that according to this current value this LED lamp test does not pass through, and with judgment result displays to the tester.In the LED lamp matrix all LED lamp test complete after, just can judge whether the test of LED lamp matrix is passed through.In the present embodiment, chromacoder 102 can pass through such as serial communication interface or USB(UniversalSerial BUS such as RS-232 USB (universal serial bus) with host computer 101) connect, the present invention is not construed as limiting this.
But the testing apparatus of present embodiment is converted to the multichannel Transistor-Transistor Logic level signal of driving LED lamp matrix so that it is tested by chromacoder 102 with the system control signal that host computer 101 produces, and judge according to the current value of test gained whether LED lamp matrix test is passed through, and do not need artificial judgement, therefore can improve fiduciary level and the accuracy of test, improve testing efficiency.
See also Fig. 2, Fig. 2 is the structural representation of testing apparatus the second embodiment of the present invention.This testing apparatus comprises host computer 201, chromacoder 202 and signal feedback device 203, and wherein, chromacoder 202 comprises signal conversion module 2021 and signal driver module 2022.
Wherein, host computer 201 has identical technical characterictic with signal feedback device 203 with host computer 101 and the signal feedback device 103 of a upper embodiment, repeats no more herein.
I
2C(Inter-Integrated Circuit) bus is a kind of twin wire universal serial bus, be used for connecting controller and peripherals thereof, it is a kind of bus standard that extensively adopt in microelectronics Control on Communication field, it is a kind of special shape of synchronous communication, it is few to have interface line, control is simple, the little and traffic rate advantages of higher of device package form.
In the present embodiment, LED lamp matrix and signal driver module 2022 form the loop, receive multichannel Transistor-Transistor Logic level signal from signal driver module 2022, with driving LED lamp matrix, particularly, signal driver module 2022 has line output control and row output control, line output control is corresponding one by one with the row of LED lamp matrix, the row that is used for driving LED lamp matrix, row output control is corresponding one by one with LED lamp matrix column, is used for driving LED lamp matrix column.When LED lamp matrix when being a plurality of, signal driver module 2022 also is a plurality of, and corresponding one by one with LED lamp matrix, and this moment, a plurality of signal driver modules 2022 were parallel to I
2On the C bus, certainly, when a LED lamp matrix is larger, signal driver module 2022 during all LED lamp, also can a plurality of signal driver modules 2022 in parallel drive respectively so that LED lamp matrix is divided into a plurality of parts in can't driving LED lamp matrix.
Introduce the course of work of the testing apparatus test LED lamp matrix of present embodiment below in conjunction with Fig. 2.
The input that host computer 201 receives the tester produces system control signal, and signal conversion module 2021 is passed through usb communication agreement receiving system control signal, and system control signal is converted to I
2The C signal, signal driver module 2022 is passed through I
2C communication protocol receives I
2C signal and output multi-channel Transistor-Transistor Logic level signal, because LED lamp matrix and signal driver module 2022 form the loop, the line output control of signal driver module 2022 and row output control is the row and column of corresponding control LED lamp matrix respectively, can control the on and off of each LED lamp in the LED lamp matrix with this, signal feedback device 203 is measured the current value that flows through by the corresponding LED lamp in the LED lamp matrix, and with the result feedback of current value to host computer 201, host computer 201 judges according to the size of current value on all LED lamps whether the test of LED lamp matrix is passed through.
The testing apparatus of present embodiment is converted to I by signal conversion module 2021 with the system control signal that host computer 201 sends
2The C signal, signal driver module 2022 is according to I
2C signal output multi-channel Transistor-Transistor Logic level signal is tested with driving LED lamp matrix, and judges according to the size of the current value of testing gained whether the test of LED lamp matrix is passed through.Testing apparatus of the present invention can improve fiduciary level and the accuracy of test, improves testing efficiency.
See also Fig. 3, Fig. 3 is the structural representation of testing apparatus the 3rd embodiment of the present invention.This testing apparatus comprises host computer 301, usb bus connect chip 302, LED lamp matrix driving chip 303 and programmable power supply 304.
Usb bus connect chip 302 is connected with host computer 301 by usb bus, is used for from host computer 301 receiving system control signals, and system control signal is converted to I
2The C signal.Wherein, in the present embodiment, usb bus connect chip 302 is preferably the USB212C chip, and the USB212C chip provides the full speed USB interface to be connected with host computer 301, and the USB212C chip also can provide I
2C interface under the synchronous serial interface communication mode, provides scl line and sda line so that host computer 301 can be easily to I
2The C interface device is read and write.
LED lamp matrix driving chip 303 passes through I
2The C bus is connected with usb bus connect chip 302, is used for receiving I from usb bus connect chip 302
2The C signal, and according to I
2C signal output multi-channel Transistor-Transistor Logic level signal.In the present embodiment, LED lamp matrix driving chip 303 is preferably the SN3730 chip, sees also Fig. 4, and Fig. 4 is the LED lamp matrix driving chip of testing apparatus shown in Figure 3 and the connection diagram of LED lamp matrix.
As shown in the figure, SN3730 chip 41 have SDA port, SCL port, AD port, 8 line output control (R1 ..., R8) and 11 row output control (C1 ..., C11), wherein R6 and C11 are multiplexing, and R7 and C10 are multiplexing, and R8 and C9 are multiplexing.
The acquiescence LED lamp matrix 42 of SN3730 chip 41 is configured to the 8*8 matrix, line output control (R1 ..., the R8) row of driving LED lamp matrix 42, row output control (C1 ..., the C8) row of driving LED lamp matrix 42.Certainly, SN3730 chip 41 also can be configured to the matrix display pattern of single or dual 8*8,7*9,6*10 or 5*11 etc.SN3730 chip 41 is programmed to LED lamp matrix 42 by SDA port and SCL port, and each the LED lamp in the LED lamp matrix 42 can be controlled independently its unlatching by programming or close.SDA port and the SCL port of SN3730 chip 41 are connected to I
2On the C bus.
Host computer 301 can carry out write operation to SN3730 chip 41 by signal conversion module 302.SN3730 chip 41 inside have 8 and (for ease of explanation, represent with A7:A0) that from the address A0 position is read-write position, and often sets to 0, and 41 of expression SN3730 chips are supported write operation.A1 and A2 position are determined that by the line of AD port the output of exporting control is controlled and be listed as in A3-A7 position then corresponding row output.Complete 8 from address such as table 1.
8 of table 1SN3730 chip internal from the address
| The position | A7：A3 | A2：A1 | A0 |
| Setting value | 11000 | AD | 0 |
In the table 1, when the AD port connects ground GND, AD=00; When the AD port connects power vd D, AD=11; When the AD port connects the SCL port, AD=01; When the AD port connects the SDA port, AD=10.In the present embodiment, the AD port connects ground GND.
By at I
2The C bus is to 41 addressing of SN3730 chip, after the addressing success, SDA port and SCL port write data to SN3730 chip 41, produce corresponding setting value at inner 8 from address A0-A7 behind SN3730 chip 41 receive datas, thereby the control of control line output and row output control output Transistor-Transistor Logic level signal, 0 or 1 sequential in these Transistor-Transistor Logic level signals can be used for test LED lamp matrix 42.
Please consult Fig. 3, programmable power supply 304 is a kind of power supplys that can control by software electric current and voltage output again, and it is connected with host computer 301 by general purpose interface bus (GPIB), is used for measuring the current value of LED lamp matrix, and feeds back to host computer 301.
Introduce the course of work of the testing apparatus test LED lamp matrix of present embodiment below in conjunction with Fig. 3 and Fig. 4:
The input that host computer 301 receives the tester produces system control signal, and usb bus connect chip 302 passes through usb communication agreement receiving system control signal, and system control signal is converted to I
2The C signal, LED lamp matrix driving chip 303 passes through I
2C communication protocol receives I
2C signal and according to I
2C signal output multi-channel Transistor-Transistor Logic level signal, LED lamp matrix driving chip 303 is by line output control (R1, R8) and row output control (C1, C8) send the on and off that Transistor-Transistor Logic level signal (i.e. 0 or 1 sequential) is controlled LED lamp in the LED lamp matrix 42, programmable power supply 304 is measured the current value that passes through the corresponding LED lamp current flowing in the LED lamp matrix 42, and with the result feedback of current value to host computer 301;
Host computer 301 judges according to the size of current value whether 42 tests of LED lamp matrix are passed through, if the LED lamp that need to light is not lighted, the current value of measuring so is zero or very little, and then host computer 301 judges that this LED lamp test does not pass through; If the LED lamp that does not need to light is lit, the current value of measuring so is larger, and then host computer judges that also this LED lamp test does not pass through.LED lamp matrix driving chip 303 can be measured the LED lamp of some simultaneously, and these LED lamps just can form LED lamp matrix 42.
If it is a plurality of that LED lamp matrix driving chip 303 has, then a plurality of LED lamp matrix driving chips 303 are connected in parallel on I
2On the C bus, host computer 301 need to carry out first addressing, namely needs to select first a LED lamp matrix driving chip 303, with I
2The C signal sends to this LED lamp matrix driving chip 303.
The testing apparatus of present embodiment is converted to I by usb bus connect chip 302 with the system control signal that host computer 301 sends
2The C signal, LED lamp matrix driving chip 303 is according to I
2C signal output multi-channel Transistor-Transistor Logic level signal is tested with driving LED lamp matrix, and judges according to the size of the current value of testing gained whether the test of LED lamp matrix is passed through.Testing apparatus of the present invention can improve fiduciary level and the accuracy of test, improves testing efficiency.
See also Fig. 5, Fig. 5 is the schematic flow sheet of the method for testing embodiment of testing apparatus of the present invention.This method of testing comprises:
Step S101: produce system control signal.
Wherein, system control signal is produced by host computer, and host computer is preferably computing machine.The tester inputs at host computer, and host computer produces system control signal according to input.
Step S102: the receiving system control signal, according to system control signal output multi-channel Transistor-Transistor Logic level signal.
Wherein, step S102 is specially: the receiving system control signal is converted to I with system control signal
2The C signal; Receive I
2The C signal is according to I
2C signal output multi-channel Transistor-Transistor Logic level signal.
Step S103: utilize multichannel Transistor-Transistor Logic level signal that LED lamp matrix is tested.
Wherein, the light on and off of each LED lamp of 0 or 1 sequential control LED lamp matrix in the multichannel Transistor-Transistor Logic level signal.
Step S104: measure the current value in the LED lamp matrix.
Wherein, particularly, measure the current value that is in each LED lamp of bright or the state that goes out in the LED lamp matrix.
Step S105: judge according to measurement result whether the test of LED lamp matrix is passed through.
For example, the some LED lamps in the LED lamp matrix being lighted, is zero or very little if record its current value that passes through, and then test is not passed through; Otherwise the current value that records is larger, and then test is passed through.
By with upper type, the testing apparatus of the embodiment of the invention and method of testing thereof are by being converted to system control signal multichannel Transistor-Transistor Logic level signal with the light on and off of driving LED lamp matrix, judge by the current value of measuring corresponding LED lamp whether the test of LED lamp matrix is passed through again, can improve fiduciary level and the accuracy of test, improve testing efficiency.
The above only is embodiments of the present invention; be not so limit claim of the present invention; every equivalent structure or equivalent flow process conversion that utilizes instructions of the present invention and accompanying drawing content to do; or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the present invention.
Claims (10)
1. a testing apparatus is used for test LED lamp matrix, it is characterized in that described testing apparatus comprises:
Host computer is for generation of system control signal;
Chromacoder, be connected with described host computer, be used for receiving described system control signal from described host computer, and according to described system control signal output multi-channel Transistor-Transistor Logic level signal, wherein, described multichannel Transistor-Transistor Logic level signal is used for described LED lamp matrix is tested;
Signal feedback device, described signal feedback device is connected with described host computer, is used for measuring the current value of described LED lamp matrix, and with measurement feedback to described host computer;
Wherein, described host computer also is used for after getting access to described measurement result, judges according to described measurement result whether described LED lamp matrix test is passed through.
2. testing apparatus according to claim 1 is characterized in that, described chromacoder comprises:
Signal conversion module is connected with described host computer by usb bus, is used for receiving described system control signal from described host computer, and described system control signal is converted to I
2The C signal;
The signal driver module is passed through I
2The C bus is connected with described signal conversion module, is used for receiving described I from described signal conversion module
2The C signal, and according to described I
2C signal output multi-channel Transistor-Transistor Logic level signal.
3. testing apparatus according to claim 2 is characterized in that, described LED lamp matrix and described signal driver module form the loop, receive described multichannel Transistor-Transistor Logic level signal from described signal driver module, to drive described LED lamp matrix.
4. testing apparatus according to claim 3, it is characterized in that, described signal driver module has line output control and row output control, and described line output control is used for driving the row of described LED lamp matrix, and described row output control is used for driving described LED lamp matrix column.
5. testing apparatus according to claim 3 is characterized in that, described LED lamp matrix is a plurality of, and described signal driver module is a plurality of, and described signal driver module is corresponding one by one with described LED lamp matrix, and described a plurality of signal driver modules are parallel to described I
2On the C bus.
6. testing apparatus according to claim 4 is characterized in that, described signal conversion module is the usb bus connect chip.
7. testing apparatus according to claim 4 is characterized in that, described signal driver module is LED lamp matrix driving chip.
8. testing apparatus according to claim 1 is characterized in that, described signal feedback device is programmable power supply, and described programmable power supply is connected with described host computer by general purpose interface bus.
9. the method for testing of a testing apparatus is characterized in that, described method of testing comprises:
Produce system control signal;
Receive described system control signal, and according to described system control signal output multi-channel Transistor-Transistor Logic level signal;
Utilize described multichannel Transistor-Transistor Logic level signal that LED lamp matrix is tested;
Measure the current value in the described LED lamp matrix;
Judge according to described measurement result whether described LED lamp matrix test is passed through.
10. method of testing according to claim 9 is characterized in that, the described system control signal of described reception, and be specially according to the step of described system control signal output multi-channel Transistor-Transistor Logic level signal:
Receive described system control signal, described system control signal is converted to I
2The C signal;
Receive described I
2The C signal is according to described I
2C signal output multi-channel Transistor-Transistor Logic level signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012104376537A CN102944852A (en) | 2012-11-05 | 2012-11-05 | Test equipment and test method of test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012104376537A CN102944852A (en) | 2012-11-05 | 2012-11-05 | Test equipment and test method of test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102944852A true CN102944852A (en) | 2013-02-27 |
Family
ID=47727813
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012104376537A Pending CN102944852A (en) | 2012-11-05 | 2012-11-05 | Test equipment and test method of test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102944852A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103995765A (en) * | 2013-12-09 | 2014-08-20 | 深圳市立鼎光电技术有限公司 | LED control card testing system and method |
| CN104749514A (en) * | 2015-04-10 | 2015-07-01 | 中国电子科技集团公司第三十八研究所 | Direct connection type testing device for low-power-consumption differential transmission chip |
| CN107677319A (en) * | 2017-11-03 | 2018-02-09 | 广东工业大学 | A kind of LED test system |
| CN108922257A (en) * | 2018-06-29 | 2018-11-30 | 芜湖等莱智能科技有限公司 | A kind of simultaneous display screen for teaching |
| CN110347139A (en) * | 2019-05-22 | 2019-10-18 | 苏州浪潮智能科技有限公司 | A kind of test fixture of I2C bus |
| CN111741566A (en) * | 2019-03-22 | 2020-10-02 | 嘉兴海拉灯具有限公司 | Control method and system for welcoming or cheering mode of vehicle |
| CN114217213A (en) * | 2021-12-15 | 2022-03-22 | 北京芯格诺微电子有限公司 | Test method for active LED matrix panel |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101169462A (en) * | 2007-11-28 | 2008-04-30 | 汇众联合传媒科技有限公司 | Method for blind point detection for display panel composed of multiple LEDs |
| CN201382850Y (en) * | 2009-03-24 | 2010-01-13 | Tcl集团股份有限公司 | Test device for liquid crystal display module |
| CN102003689A (en) * | 2009-09-02 | 2011-04-06 | 联咏科技股份有限公司 | Light-emitting diode device with function of simultaneously detecting open circuit and short circuit and method thereof |
| CN201829168U (en) * | 2010-09-14 | 2011-05-11 | 南京通用电器有限公司 | Detection circuit for dead pixel of light emitting diode (LED) display screen |
| CN102340919A (en) * | 2010-07-23 | 2012-02-01 | 财团法人资讯工业策进会 | System and method for detecting fault of LED illumination equipment |
| US20120248997A1 (en) * | 2011-03-31 | 2012-10-04 | Jung Ilyong | Apparatus and method for driving light emitting diode |
-
2012
- 2012-11-05 CN CN2012104376537A patent/CN102944852A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101169462A (en) * | 2007-11-28 | 2008-04-30 | 汇众联合传媒科技有限公司 | Method for blind point detection for display panel composed of multiple LEDs |
| CN201382850Y (en) * | 2009-03-24 | 2010-01-13 | Tcl集团股份有限公司 | Test device for liquid crystal display module |
| CN102003689A (en) * | 2009-09-02 | 2011-04-06 | 联咏科技股份有限公司 | Light-emitting diode device with function of simultaneously detecting open circuit and short circuit and method thereof |
| CN102340919A (en) * | 2010-07-23 | 2012-02-01 | 财团法人资讯工业策进会 | System and method for detecting fault of LED illumination equipment |
| CN201829168U (en) * | 2010-09-14 | 2011-05-11 | 南京通用电器有限公司 | Detection circuit for dead pixel of light emitting diode (LED) display screen |
| US20120248997A1 (en) * | 2011-03-31 | 2012-10-04 | Jung Ilyong | Apparatus and method for driving light emitting diode |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103995765A (en) * | 2013-12-09 | 2014-08-20 | 深圳市立鼎光电技术有限公司 | LED control card testing system and method |
| CN104749514A (en) * | 2015-04-10 | 2015-07-01 | 中国电子科技集团公司第三十八研究所 | Direct connection type testing device for low-power-consumption differential transmission chip |
| CN107677319A (en) * | 2017-11-03 | 2018-02-09 | 广东工业大学 | A kind of LED test system |
| CN108922257A (en) * | 2018-06-29 | 2018-11-30 | 芜湖等莱智能科技有限公司 | A kind of simultaneous display screen for teaching |
| CN111741566A (en) * | 2019-03-22 | 2020-10-02 | 嘉兴海拉灯具有限公司 | Control method and system for welcoming or cheering mode of vehicle |
| CN110347139A (en) * | 2019-05-22 | 2019-10-18 | 苏州浪潮智能科技有限公司 | A kind of test fixture of I2C bus |
| CN114217213A (en) * | 2021-12-15 | 2022-03-22 | 北京芯格诺微电子有限公司 | Test method for active LED matrix panel |
| CN114217213B (en) * | 2021-12-15 | 2022-05-06 | 北京芯格诺微电子有限公司 | Test method for active LED matrix panel |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102944852A (en) | Test equipment and test method of test equipment | |
| CN104198911B (en) | A kind of chip pin method of testing of DTU and circuit | |
| CN107491148A (en) | A kind of server hard disc attachment structure | |
| CN107577569A (en) | A kind of server hard disc attachment structure and its application process | |
| CN100487468C (en) | Rear-panel testing system | |
| CN203085128U (en) | Ageing test system | |
| CN207851236U (en) | A kind of chip testing plate and chip test system | |
| CN206179483U (en) | LCD module's test keysets | |
| CN102455989A (en) | Hot-plug control system | |
| CN102736014A (en) | Usb interface testing device | |
| CN105372536A (en) | Aviation electronic universal test platform | |
| CN202995451U (en) | A vehicle-mounted controller automatic testing device | |
| CN216901630U (en) | Interface conversion circuit and chip burning device | |
| CN201489794U (en) | LCM testing device | |
| US20020183955A1 (en) | Test device for dynamic memory modules | |
| CN201984469U (en) | Main board basic input / output system (BIOS) fault debugging card | |
| CN207764782U (en) | The detecting system of peripheral component interconnection express standard slots | |
| CN102914981A (en) | Chip burning detection system | |
| CN105319494A (en) | Automatic aging testing device of integrated circuit chip | |
| CN103149468A (en) | Electron component parameter testing device | |
| CN105702187A (en) | Interface circuit and test device | |
| CN115166485A (en) | Integrated circuit chip OS test machine | |
| CN201945657U (en) | Train cabling detection device | |
| CN202994975U (en) | QFP128 packaged chip test board | |
| CN106680635A (en) | Touch screen test system and touch screen test method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20130227 |