CN204086438U - A kind of chip that utilizes protects diode measurement circuit to open the device of short circuit - Google Patents
A kind of chip that utilizes protects diode measurement circuit to open the device of short circuit Download PDFInfo
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- CN204086438U CN204086438U CN201420233808.XU CN201420233808U CN204086438U CN 204086438 U CN204086438 U CN 204086438U CN 201420233808 U CN201420233808 U CN 201420233808U CN 204086438 U CN204086438 U CN 204086438U
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- Prior art keywords
- open
- short circuit
- chip
- measured
- circuit
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- 238000005259 measurement Methods 0.000 title claims abstract description 11
- 238000012360 testing method Methods 0.000 abstract description 22
- RVCKCEDKBVEEHL-UHFFFAOYSA-N 2,3,4,5,6-pentachlorobenzyl alcohol Chemical compound OCC1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl RVCKCEDKBVEEHL-UHFFFAOYSA-N 0.000 abstract description 4
- 238000000034 method Methods 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 102000007315 Telomeric Repeat Binding Protein 1 Human genes 0.000 description 1
- 108010033711 Telomeric Repeat Binding Protein 1 Proteins 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a kind of chip that utilizes protects diode measurement circuit to open the device of short circuit; comprise measuring instrument and IC to be measured; described tester comprises DC load module, display module, mu balanced circuit, microprocessor and IO interface; described IC to be measured comprises protection diode; described display LED module and IO interface are connected on the corresponding port of microprocessor, and described IO interface connects ICPIN pin to be measured.This apparatus structure simple test efficiency is high; IC test can be carried out separately; The CONN that PCBA board is connected with IC can be tested and weld whether open short circuit.Do not need to be assembled into real machine to test, thus improve testing efficiency.
Description
Technical field
The present invention relates to a kind of chip that utilizes protects diode measurement circuit to open the device of short circuit.
Background technology
After 1958 Texas ,Usa instrument company invention integrated circuit (IC), along with the development of silicon plane technique, nineteen sixties has successively invented the ambipolar integrated circuit important with MOS type two kinds, it indicates the epoch amount of there occurs and the qualitative leap that are manufactured complete electronic set by electron tube and transistor, creates a unprecedented new industry IC industry with extremely strong seepage force and vigorous vitality.
IC, namely integrated circuit adopts semiconductor fabrication process, and the monocrystalline silicon piece of a piece less makes many transistors and the components and parts such as resistor, capacitor, and according to the method for multilayer wiring or tunnel wiring, components and parts are combined into complete electronic circuit.In IC, light emitting diode is all exist with tandem moor, when there being a wherein light emitting diode damage to be short-circuited in tandem, causing high electric current, high voltage is gathered on IC, causing burning out of whole tandem, therefore need to test IC.
Summary of the invention
Technical matters to be solved by this invention provides for deficiency of the prior art the device that a kind of structure is simple, testing efficiency usury chip protection diode measurement circuit opens short circuit.
The present invention is for solving the problems of the technologies described above by the following technical solutions
A kind of chip that utilizes protects diode measurement circuit to open the device of short circuit; comprise measuring instrument and IC to be measured; described tester comprises DC load module, display module, mu balanced circuit, microprocessor and IO interface; described IC to be measured comprises protection diode; described display LED module and IO interface are connected on the corresponding port of microprocessor, and described IO interface connects IC PIN to be measured.
Preferably, described microprocessor is single-chip microcomputer.
Preferably, described display module is LED.
Preferably, described single-chip microcomputer is AT89C52.
The present invention adopts above technical scheme compared with prior art, has following technique effect:
1, structure simple test efficiency is high;
2, IC test can be carried out separately; The CONN that PCBA board is connected with IC can be tested and weld whether open short circuit; Welding effect can be tested out very efficiently by this kind of method.Do not need to be assembled into real machine to test, thus improve testing efficiency.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:
As shown in Figure 1; a kind of chip that utilizes protects diode measurement circuit to open the device of short circuit; comprise measuring instrument and IC to be measured; described tester comprises DC load module, display module, mu balanced circuit, microprocessor and IO interface; described IC to be measured comprises protection diode; described display LED module and IO interface are connected on the corresponding port of microprocessor, and described IO interface connects IC PIN to be measured.Described microprocessor is single-chip microcomputer, and described display module is LED, and described single-chip microcomputer is AT89C52.
Method of testing is: send a signal to IC PIN by tester, and because there is protection diode IC PIN inside, diode itself has pressure drop, thus can test out the correct pressure drop of this PIN, and show whether this PIN opens a way or short circuit; The utility model testing efficiency is high, can carry out IC test separately, also can test the CONN that PCBA board is connected with IC weld whether open, short circuit.Had this kind of method of testing, PCBA after part, just can test out welding effect very efficiently by this kind of method on paster.And do not need to be assembled into real machine and test, thus improve testing efficiency.
Signal testing transport process principles:
A.IC open test: the 1. VDD of IC is set to 0V;
2. the MCU of tester sends the PIN of high level data to IC to be measured;
3.MCU reads the signal of IC PIN, as level does not change then
Open circuit, level is then normal lower than the data sent out.
B.IC short-circuit test: the 1. VDD of IC is set to 0V;
2. the MCU of tester sends the PIN of high level data to IC to be measured;
3.MCU reads the signal drops of IC PIN, if this IC inside is protected
The pressure drop protecting diode is then normal, as lower than IC internal protection diode
Pressure drop then with VDD short circuit.
The adjacent PIN short-circuit test of C.IC:
1. the VDD of IC is set to 0V;
2. the MCU of tester sends the PIN 1 of low-level data to IC to be measured;
3. the MCU of tester sends the PIN 2 of high level data to IC to be measured;
4.MCU reads the signal drops of IC PIN2, and low-level data is then short in this way
Road, high level data is then normal in this way.
Above low and high level data need be different different with the requirement of user according to the model of IC, can compile flexibly, and the diode drop of IC inside is also different because of the model difference of IC, is more than test philosophy.
Claims (4)
1. one kind utilizes chip to protect diode measurement circuit to open the device of short circuit; it is characterized in that: comprise measuring instrument and IC to be measured; described measuring instrument comprises DC load module, display module, mu balanced circuit, microprocessor and IO interface; described IC to be measured comprises protection diode; described display LED module and IO interface are connected on the corresponding port of microprocessor, and described IO interface connects IC PIN to be measured.
2. utilize chip to protect diode measurement circuit to open the device of short circuit according to claim 1, it is characterized in that: described microprocessor is single-chip microcomputer.
3. utilize chip to protect diode measurement circuit to open the device of short circuit according to claim 1, it is characterized in that: described display module is LED.
4. utilize chip to protect diode measurement circuit to open the device of short circuit according to claim 2, it is characterized in that: described single-chip microcomputer is AT89C52.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420233808.XU CN204086438U (en) | 2014-05-08 | 2014-05-08 | A kind of chip that utilizes protects diode measurement circuit to open the device of short circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420233808.XU CN204086438U (en) | 2014-05-08 | 2014-05-08 | A kind of chip that utilizes protects diode measurement circuit to open the device of short circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204086438U true CN204086438U (en) | 2015-01-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420233808.XU Expired - Fee Related CN204086438U (en) | 2014-05-08 | 2014-05-08 | A kind of chip that utilizes protects diode measurement circuit to open the device of short circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204086438U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105891657A (en) * | 2016-04-25 | 2016-08-24 | 万高(杭州)科技有限公司 | Method and apparatus for detecting chip bonding conditions of printed circuit board |
| CN110763983A (en) * | 2019-11-19 | 2020-02-07 | 无锡中微爱芯电子有限公司 | Open short circuit detection circuitry based on special interface chip |
| WO2020087363A1 (en) * | 2018-10-31 | 2020-05-07 | 深圳市汇顶科技股份有限公司 | Test system |
-
2014
- 2014-05-08 CN CN201420233808.XU patent/CN204086438U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105891657A (en) * | 2016-04-25 | 2016-08-24 | 万高(杭州)科技有限公司 | Method and apparatus for detecting chip bonding conditions of printed circuit board |
| WO2020087363A1 (en) * | 2018-10-31 | 2020-05-07 | 深圳市汇顶科技股份有限公司 | Test system |
| US11486955B2 (en) | 2018-10-31 | 2022-11-01 | Shenzhen GOODIX Technology Co., Ltd. | Test system |
| CN110763983A (en) * | 2019-11-19 | 2020-02-07 | 无锡中微爱芯电子有限公司 | Open short circuit detection circuitry based on special interface chip |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150107 Termination date: 20170508 |