CN104677225A - 一种检测芯片封装后外观尺寸的夹具及其检测方法 - Google Patents
一种检测芯片封装后外观尺寸的夹具及其检测方法 Download PDFInfo
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- CN104677225A CN104677225A CN201510019879.9A CN201510019879A CN104677225A CN 104677225 A CN104677225 A CN 104677225A CN 201510019879 A CN201510019879 A CN 201510019879A CN 104677225 A CN104677225 A CN 104677225A
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Cited By (3)
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CN105973094A (zh) * | 2016-05-30 | 2016-09-28 | 北京首钢微电子有限公司 | 封装料盒检查治具 |
CN109239098A (zh) * | 2016-08-23 | 2019-01-18 | 王永超 | 一种集成电路板的外观检测机构 |
CN109443143A (zh) * | 2018-11-09 | 2019-03-08 | 中国电子科技集团公司第五十五研究所 | 用于检验封装外壳引线高度的金属模具及使用方法 |
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CN201093984Y (zh) * | 2007-09-28 | 2008-07-30 | 比亚迪股份有限公司 | 一种尺寸检测装置 |
JP2008209169A (ja) * | 2007-02-23 | 2008-09-11 | Tokai Rubber Ind Ltd | 曲りホースの形状検査用具 |
CN202361936U (zh) * | 2011-12-06 | 2012-08-01 | 华孚精密金属科技(常熟)有限公司 | 卷轴的轮廓度检测装置 |
CN102927879A (zh) * | 2012-11-26 | 2013-02-13 | 成都航天模塑股份有限公司 | 一种用于检测不规则结构形位公差的检测装置 |
CN203083474U (zh) * | 2012-12-17 | 2013-07-24 | 湖南航天磁电有限责任公司 | 一种铁氧体磁瓦自动过通规装置 |
CN203586990U (zh) * | 2013-12-09 | 2014-05-07 | 湖南航天磁电有限责任公司 | 一种永磁铁氧体磁瓦通规工装 |
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- 2015-01-15 CN CN201510019879.9A patent/CN104677225B/zh active Active
Patent Citations (6)
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JP2008209169A (ja) * | 2007-02-23 | 2008-09-11 | Tokai Rubber Ind Ltd | 曲りホースの形状検査用具 |
CN201093984Y (zh) * | 2007-09-28 | 2008-07-30 | 比亚迪股份有限公司 | 一种尺寸检测装置 |
CN202361936U (zh) * | 2011-12-06 | 2012-08-01 | 华孚精密金属科技(常熟)有限公司 | 卷轴的轮廓度检测装置 |
CN102927879A (zh) * | 2012-11-26 | 2013-02-13 | 成都航天模塑股份有限公司 | 一种用于检测不规则结构形位公差的检测装置 |
CN203083474U (zh) * | 2012-12-17 | 2013-07-24 | 湖南航天磁电有限责任公司 | 一种铁氧体磁瓦自动过通规装置 |
CN203586990U (zh) * | 2013-12-09 | 2014-05-07 | 湖南航天磁电有限责任公司 | 一种永磁铁氧体磁瓦通规工装 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105973094A (zh) * | 2016-05-30 | 2016-09-28 | 北京首钢微电子有限公司 | 封装料盒检查治具 |
CN109239098A (zh) * | 2016-08-23 | 2019-01-18 | 王永超 | 一种集成电路板的外观检测机构 |
CN109239098B (zh) * | 2016-08-23 | 2020-12-01 | 苏州鱼得水电气科技有限公司 | 一种集成电路板的外观检测机构 |
CN109443143A (zh) * | 2018-11-09 | 2019-03-08 | 中国电子科技集团公司第五十五研究所 | 用于检验封装外壳引线高度的金属模具及使用方法 |
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Denomination of invention: Clamp for detecting external dimension of packaged chip and detection method of clamp Effective date of registration: 20190507 Granted publication date: 20170825 Pledgee: China Postal Savings Bank Limited by Share Ltd Suining Sui branch Pledgor: Sichuan Ming Tai Electronic Science and Technology Co., Ltd. Registration number: 2019510000053 |
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Address after: 629000 No.11, Dequan road Microelectronics Industrial Park, Suining Economic Development Zone, Sichuan Province Patentee after: Sichuan Mingtai Microelectronics Technology Co.,Ltd. Address before: 629000 No.11, Dequan road Microelectronics Industrial Park, Suining Economic Development Zone, Sichuan Province Patentee before: SICHUAN MOUNTEK ELECTRONIC TECHNOLOGY CO.,LTD. |
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Date of cancellation: 20220328 Granted publication date: 20170825 Pledgee: China Postal Savings Bank Limited by Share Ltd. Suining Sui branch Pledgor: SICHUAN MOUNTEK ELECTRONIC TECHNOLOGY CO.,LTD. Registration number: 2019510000053 |